WO2012037133A1 - Multiplexed amplifier with reduced glitching - Google Patents

Multiplexed amplifier with reduced glitching Download PDF

Info

Publication number
WO2012037133A1
WO2012037133A1 PCT/US2011/051411 US2011051411W WO2012037133A1 WO 2012037133 A1 WO2012037133 A1 WO 2012037133A1 US 2011051411 W US2011051411 W US 2011051411W WO 2012037133 A1 WO2012037133 A1 WO 2012037133A1
Authority
WO
WIPO (PCT)
Prior art keywords
coupled
multiplexer
transistor
amplifier
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2011/051411
Other languages
English (en)
French (fr)
Inventor
Robert F. Payne
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Japan Ltd
Texas Instruments Inc
Original Assignee
Texas Instruments Japan Ltd
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Japan Ltd, Texas Instruments Inc filed Critical Texas Instruments Japan Ltd
Priority to JP2013529266A priority Critical patent/JP2013538535A/ja
Priority to CN201180043704.1A priority patent/CN103098369B/zh
Publication of WO2012037133A1 publication Critical patent/WO2012037133A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0863Continuously compensating for, or preventing, undesired influence of physical parameters of noise of switching transients, e.g. glitches
    • H03M1/0872Continuously compensating for, or preventing, undesired influence of physical parameters of noise of switching transients, e.g. glitches by disabling changes in the output during the transitions, e.g. by holding or latching
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/1205Multiplexed conversion systems
    • H03M1/121Interleaved, i.e. using multiple converters or converter parts for one channel
    • H03M1/1215Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/1205Multiplexed conversion systems
    • H03M1/122Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages
    • H03M1/1225Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages using time-division multiplexing
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/14Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/16Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
    • H03M1/164Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/38Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/44Sequential comparisons in series-connected stages with change in value of analogue signal

Definitions

  • the invention relates generally to amplifiers and, more particularly, to residue amplifiers.
  • reference numeral 100 generally designates a conventional analog-to-digital converter (ADC) 100.
  • ADC 100 generally comprises several stages 102-1 to 102-N, an ADC 106 (which is typically a flash ADC), and a digital output circuit 104.
  • the stages 102-1 to 102-N are generally coupled in series with one another in a sequence, where the first stage 102-1 receives the analog input signal and where each of the subsequent stages 102-2 to 102-N receives a residue signal from the previous stage 102-1 to 102-(N-1), respectively.
  • ADC 106 is coupled to the last stage 102-N (receiving its residue signal).
  • stages 102-1 to 102-N and ADC 106 are able to resolve a portion of the analog input signal, which is provided to digital output circuit 104.
  • Digital output circuit 104 can then perform error correction or other digital processing to generate the digital output signal DOUT.
  • Stage 102 generally comprises a track-and-hold (T/H) circuit 108 (i.e., T/H amplifier), ADC 110, digital-to- analog converter (DAC) 112, adder 114, and a residue amplifier 116.
  • T/H track-and-hold
  • the T/H circuit 110 enters a track phase T during the logic high state of the clock signal CLK and a hold phase H during the logic low state of the clock signal CLK.
  • the T/H circuit samples its analog input signal SIN (which may be the analog input signal AIN or the residue signal from the previous stage).
  • the sampled signal is provided to ADC 110 and adder 114.
  • the ADC 110 resolves a portion of the signal SIN, providing the resolved bits to digital output circuit 104 and DAC 112.
  • DAC 112 converts the resolved bits to an analog signal which is provided to adder 114.
  • Adder 114 determines the difference between the sampled signal and the analog signal from DAC, which is amplified by amplifier 1 16 and output as a residue signal ROUT.
  • the residue amplifiers 116 for each stage 102-1 to 102-N are operating at less than 50% duty cycle, which consumes an excess amount of power. Therefore, it is desirable to have a reside amplifier that consumes less power.
  • An example embodiment of the invention accordingly, provides an apparatus.
  • the apparatus comprises an amplifier having a first input terminal, a second input terminal, a first output terminal, and a second input terminal; a first multiplexer that is coupled to the first input terminal of the amplifier; a second multiplexer that is coupled to the second input terminal of the amplifier; a switch that is coupled between the first and second output terminals of the amplifier; a pulse generator that is coupled to the switch so as to control the switch; and a controller that is coupled to the first multiplexer, the second multiplexer, and pulse generator, wherein the controller provides a select signal to each of the first and second multiplexers, and wherein the controller activates the pulse generator when the first and second multiplexers are switched.
  • the pulse generator further comprises: a logic circuit that is coupled to the controller so as to receive the select signal and that is coupled to the switch; and a delay circuit that is coupled to the controller so as to receive the select signal and that is coupled to the switch.
  • the logic circuit further comprises a XOR gate.
  • the amplifier further comprises: a first transistor having a first passive electrode, a second passive electrode, and a control electrode, wherein the control electrode of the first transistor is coupled to the first multiplexer; a second transistor having a first passive electrode, a second passive electrode, and a control electrode, wherein the control electrode of the second transistor is coupled to the second multiplexer, and wherein the first passive electrode of the second transistor is coupled to the first passive electrode of the first transistor; a first current source that is coupled to the second passive electrode of the first transistor; a second current source that is coupled to the second passive electrode of the second transistor; a first bias transistor that is coupled between the first currents source and the first output terminal; and a second bias transistor that is coupled between the second current source and the second output terminal.
  • the first and second transistors are NPN transistors.
  • an apparatus comprises data converter circuitry; a first multiplexer that is coupled to the data converter circuitry; a second multiplexer that is coupled to the data converter circuitry; an amplifier having a first input terminal, a second input terminal, a first output terminal, and a second input terminal, wherein the first multiplexer that is coupled to the first input terminal of the amplifier, and wherein the second multiplexer that is coupled to the second input terminal of the amplifier; a switch that is coupled between the first and second output terminals of the amplifier; a pulse generator that is coupled to the switch so as to control the switch; and a controller that is coupled to the first multiplexer, the second multiplexer, and pulse generator, wherein the controller provides a select signal to each of the first and second multiplexers, and wherein the controller activates the pulse generator when the first and second multiplexers are switched.
  • the data converter circuitry further comprises: a first track-and-hold (T/H) circuit; a second T/H circuit; a first analog-to-digital converter (ADC) that is coupled to the first T/H circuit; a second ADC that is coupled to the second T/H circuit; a first digital-to-analog converter (DAC) that is coupled to the first ADC; a second DAC that is coupled to the second ADC; a first adder that is coupled to the first DAC, the first T/H circuit, and the first multiplexer, wherein the first adder determines the difference between the outputs of the first T/H circuit and the first DAC; and a second adder that is coupled to the second DAC, the second T/H circuit, and the second multiplexer, wherein the second adder determines the difference between the outputs of the second T/H circuit and the second DAC.
  • T/H track-and-hold
  • ADC analog-to-digital converter
  • DAC digital-to-analog converter
  • an apparatus comprising a plurality of stages that are coupled in series with one another in a sequence, wherein each stage receives an analog input signal or a residue signal from the previous stage, and wherein each stage includes: data converter circuitry; a first multiplexer that is coupled to the data converter circuitry; a second multiplexer that is coupled to the data converter circuitry; an amplifier having a first input terminal, a second input terminal, a first output terminal, and a second input terminal, wherein the first multiplexer that is coupled to the first input terminal of the amplifier, and wherein the second multiplexer that is coupled to the second input terminal of the amplifier; a switch that is coupled between the first and second output terminals of the amplifier; a pulse generator that is coupled to the switch so as to control the switch; and a controller that is coupled to the first multiplexer, the second multiplexer, and pulse generator, wherein the controller provides a select signal to each of the first and second multiplexers, and wherein
  • FIGS. 1A and IB are circuit diagrams for an example of a conventional ADC
  • FIG. 1C is a timing diagram for the ADC of FIGS. 1A and IB;
  • FIGS. 2A and 2B are circuit diagrams for an example of an ADC in accordance with an example embodiment of the invention.
  • FIG. 2C is a circuit diagram of an example of a residue amplifier of FIG. 2B.
  • FIG. 2 A illustrates an example ADC 200 in accordance with principles of the invention.
  • ADC 200 has the same general functionality as ADC 100. However, a difference exists in the pipeline; namely, stages 102-1 to 102-N have been replaced by stages 202-1 to 202- N.
  • stages 202-1 to 203-N (hereinafter 202) can be seen in greater detail.
  • T/H circuit 203-1 and 203-2 are coupled to receive an analog input signal IN (which is either the analog input signal AIN or a residue signal from the previous stage). Since these T/H circuits 203-1 and 203-2 are arranged in parallel with one another, T/H circuits 203-1 and 203-2 can be timed so as to sample on generally non-overlapping logic stages or phases of a clock signal. T/H circuits 203-1 and 203-2 are respectively coupled to ADC 204-1 and 204-2, and ADCs 204-1 and 204-2, DACs 206-1 and 206-2, adders 208-1 and 208-2, and residue amplifier 210 can then perform analog processing to resolve sampled signals for digital output circuit 104 and to generate a residue signal ROUT.
  • ADC 204-1 and 204-2 ADCs 204-1 and 204-2
  • DACs 206-1 and 206-2 adders 208-1 and 208-2
  • residue amplifier 210 can then perform analog processing to resolve sampled signals for digital output circuit 104 and to generate a residue signal R
  • each of the data converter circuits (which respectively include ADCs 204-1 or 204-2, DAC 206-1 or 206-2, and adder 208-1 or 208-2) benefit from the use of a single amplifier.
  • a reason is that duty cycle of an amplifier (for each data converter circuit) would be less than 50%, which would consume an excessive amount of power. Therefore, amplifier 210 can be time multiplexed by controller 214 to process signals from each of the data converter circuits or data paths.
  • residue amplifier 210 can be seen in greater detail.
  • a folded cascode differential amplifier (which generally comprises NPN transistors Ql through Q4 and current sources 222, 224, 226, and 228) that is biased by a bias voltage BIAS is employed. Coupled to the input terminals of this amplifier are multiplexers 216-1 and 216-2. The switching between differential input signals INP1/INM1 and INP2/INM2 (which are provided by adders 208-1 and 208-2, respectively) are controlled through the select signal SELECT (which is provided by the controller 214). Additionally, multiplexers (not shown) that are coupled to the output terminals of this amplifier (so as to receive output signals OUTP and OUTM) to direct the correct input and output signals to the amplifier at the correct instants in time for processing.
  • the amplifier which generally comprises NPN transistors Ql through Q4 and current sources 222, 224, 226, and 228, exhibits erratic behavior at the switching instant. This erratic behavior is referred to as a glitch, and if not addressed, the glitch can consume significant amounts of the amplifier's available settling time or even lead to the amplifier output or interior nodes operating at voltages outside their desired ranges. In other words, this glitch can degrade performance.
  • a reset mechanism is provided at the output terminals of the amplifier.
  • the resent mechanism generally comprises a switch Q5 that is coupled between the output terminals of the amplifier and controlled by a pulse generator (which generally comprises an XOR gate and a delay circuit).

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Amplifiers (AREA)
PCT/US2011/051411 2010-09-13 2011-09-13 Multiplexed amplifier with reduced glitching Ceased WO2012037133A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013529266A JP2013538535A (ja) 2010-09-13 2011-09-13 グリッチングが低減された多重化された増幅器
CN201180043704.1A CN103098369B (zh) 2010-09-13 2011-09-13 毛刺减少的多路复用放大器

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/880,311 US8248290B2 (en) 2010-09-13 2010-09-13 Multiplexed amplifier with reduced glitching
US12/880,311 2010-09-13

Publications (1)

Publication Number Publication Date
WO2012037133A1 true WO2012037133A1 (en) 2012-03-22

Family

ID=45806145

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2011/051411 Ceased WO2012037133A1 (en) 2010-09-13 2011-09-13 Multiplexed amplifier with reduced glitching

Country Status (4)

Country Link
US (2) US8248290B2 (enExample)
JP (1) JP2013538535A (enExample)
CN (1) CN103098369B (enExample)
WO (1) WO2012037133A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105075125A (zh) * 2013-03-15 2015-11-18 高通股份有限公司 减小用于低功率宽带高分辨率dac的阻抗衰减器的谐波失真的技术

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8248290B2 (en) * 2010-09-13 2012-08-21 Texas Instruments Incorporated Multiplexed amplifier with reduced glitching
KR101809542B1 (ko) * 2011-12-26 2017-12-18 삼성전자주식회사 스위칭 회로, 이를 포함하는 전하량 검출 증폭기 및 광자 계수 검출 장치
US9311867B2 (en) 2012-11-13 2016-04-12 Apple Inc. Devices and methods for reducing power consumption of a demultiplexer
US9065470B2 (en) 2012-12-19 2015-06-23 Intel Corporation Low power analog to digital converter
EP3174210B1 (en) * 2015-11-24 2022-05-18 Nxp B.V. A data processor
US9755595B1 (en) 2016-04-15 2017-09-05 Avago Technologies General Ip (Singapore) Pte. Ltd. Settling time reduction for low noise amplifier
CN112532250B (zh) * 2019-09-19 2024-10-25 亚德诺半导体国际无限责任公司 用于差分信号的模块化模拟信号多路复用器
US12445141B2 (en) * 2023-10-31 2025-10-14 Texas Instruments Incorporated Voltage-to-delay converter

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5530444A (en) * 1995-01-05 1996-06-25 Analog Devices, Inc. Differential amplifiers which can form a residue amplifier in sub-ranging A/D converters
US5867053A (en) * 1997-03-21 1999-02-02 Motorola Inc. Multiplexed output circuit and method of operation thereof
US6323791B1 (en) * 1999-10-13 2001-11-27 Analog Devices, Inc. Control systems and methods for reducing residue signal offset in subranging analog-to-digital converters
US20090243907A1 (en) * 2006-02-02 2009-10-01 Ali Nazemi Analog-to-digital converter

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3877023A (en) 1973-05-21 1975-04-08 Texas Instruments Inc Antiglitch digital to analog converter system
US5180932A (en) 1990-03-15 1993-01-19 Bengel David W Current mode multiplexed sample and hold circuit
JPH06164339A (ja) * 1992-11-17 1994-06-10 Nippondenso Co Ltd デジタル制御遅延装置及びデジタル制御発振装置
JPH088458B2 (ja) * 1993-07-13 1996-01-29 日本電気株式会社 演算増幅回路
US6218887B1 (en) 1996-09-13 2001-04-17 Lockheed Martin Corporation Method of and apparatus for multiplexing multiple input signals
JP3816240B2 (ja) * 1998-06-19 2006-08-30 旭化成マイクロシステム株式会社 パイプライン型a/dコンバータ
US6489845B1 (en) 2000-04-04 2002-12-03 Goodrich Corporation Multiplexing amplifier
US7868665B2 (en) * 2002-03-05 2011-01-11 Nova R&D, Inc. Integrated circuit and sensor for imaging
US6583747B1 (en) * 2002-05-24 2003-06-24 Broadcom Corporation Subranging analog to digital converter with multi-phase clock timing
US6573853B1 (en) * 2002-05-24 2003-06-03 Broadcom Corporation High speed analog to digital converter
JP3918777B2 (ja) * 2003-05-15 2007-05-23 富士電機デバイステクノロジー株式会社 パルス幅変調回路
JP4529007B2 (ja) * 2004-09-02 2010-08-25 ルネサスエレクトロニクス株式会社 半導体集積回路装置
JP4821333B2 (ja) * 2006-01-23 2011-11-24 セイコーエプソン株式会社 パイプラインa/d変換器
TWI333335B (en) * 2006-12-18 2010-11-11 Ind Tech Res Inst Analog to digital converting system
JP4925192B2 (ja) * 2007-03-16 2012-04-25 ルネサスエレクトロニクス株式会社 パイプライン型a/d変換器およびそれを内蔵した半導体集積回路
JP4854695B2 (ja) * 2008-03-14 2012-01-18 オンセミコンダクター・トレーディング・リミテッド 差動コンパレータ及びパイプライン型a/d変換器
US7990185B2 (en) * 2008-05-12 2011-08-02 Menara Networks Analog finite impulse response filter
JP4977115B2 (ja) * 2008-12-02 2012-07-18 旭化成エレクトロニクス株式会社 パイプライン型a/dコンバータ
US8248290B2 (en) * 2010-09-13 2012-08-21 Texas Instruments Incorporated Multiplexed amplifier with reduced glitching

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5530444A (en) * 1995-01-05 1996-06-25 Analog Devices, Inc. Differential amplifiers which can form a residue amplifier in sub-ranging A/D converters
US5867053A (en) * 1997-03-21 1999-02-02 Motorola Inc. Multiplexed output circuit and method of operation thereof
US6323791B1 (en) * 1999-10-13 2001-11-27 Analog Devices, Inc. Control systems and methods for reducing residue signal offset in subranging analog-to-digital converters
US20090243907A1 (en) * 2006-02-02 2009-10-01 Ali Nazemi Analog-to-digital converter

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
B.M. ET AL.: "A 12-bit 75-MS/s Pipelined ADC Using Open-Loop Residue Amplific ation", IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 38, no. 12, December 2003 (2003-12-01), pages 2040 - 2050 *
B.S.P. ET AL.: "A 10b 100MS/s 25.2mW 0.18 um CMOS ADC with various circuit sharing techniques", 2009 INTERNATIONAL SOC DESIGN CONFERENCE, 22 November 2009 (2009-11-22) - 24 November 2009 (2009-11-24), pages 329 - 332 *
J.H. ET AL.: "A 9.4-bit, 50-MS/s, 1.44-mW Pipelined ADC Using Dynamic Source Follower Residue Amplification", IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 44, no. 4, April 2009 (2009-04-01), pages 1057 - 1066 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105075125A (zh) * 2013-03-15 2015-11-18 高通股份有限公司 减小用于低功率宽带高分辨率dac的阻抗衰减器的谐波失真的技术
CN105075125B (zh) * 2013-03-15 2017-03-22 高通股份有限公司 减小用于低功率宽带高分辨率dac的阻抗衰减器的谐波失真的技术

Also Published As

Publication number Publication date
CN103098369A (zh) 2013-05-08
JP2013538535A (ja) 2013-10-10
US20130021188A1 (en) 2013-01-24
US20120062402A1 (en) 2012-03-15
CN103098369B (zh) 2016-01-06
US8248290B2 (en) 2012-08-21

Similar Documents

Publication Publication Date Title
WO2012037133A1 (en) Multiplexed amplifier with reduced glitching
Ramkaj et al. A 1.25-GS/s 7-b SAR ADC with 36.4-dB SNDR at 5 GHz using switch-bootstrapping, USPC DAC and triple-tail comparator in 28-nm CMOS
US5710563A (en) Pipeline analog to digital converter architecture with reduced mismatch error
US7324038B2 (en) Subranging analog to digital converter with multi-phase clock timing
US6784824B1 (en) Analog-to-digital converter which is substantially independent of capacitor mismatch
US10484000B2 (en) Analog-to-digital converters
US8248289B2 (en) Power and area efficient interleaved ADC
Chen et al. A 0.95-mW 6-b 700-MS/s single-channel loop-unrolled SAR ADC in 40-nm CMOS
US9654126B2 (en) Systems and methods for providing a pipelined analog-to-digital converter
KR20100073009A (ko) 다단 듀얼 연속 근사 레지스터 아날로그 디지털 변환기 및 이를 이용한 아날로그 디지털 변환 방법
US7847720B2 (en) Pipelined analog-to-digital converter
KR101287097B1 (ko) 채널 간 부정합 문제를 최소화한 4채널 파이프라인 sar adc
US20100039305A1 (en) Comparator circuit and analog digital converter having the same
EP2888817A2 (en) Methods and apparatus for calibrating stages in pipeline analog-to-digital converters
Oh et al. A 6-bit 10-GS/s 63-mW 4x TI time-domain interpolating flash ADC in 65-nm CMOS
Tang et al. A 10-b 750µW 200MS/s fully dynamic single-channel SAR ADC in 40nm CMOS
Tai et al. A 6-bit 1-GS/s two-step SAR ADC in 40-nm CMOS
KR102123270B1 (ko) 디지털 후면 교정을 가지는 시간 인터리브 파이프라인 아날로그 디지털 변환 장치 및 그 방법
US8400343B1 (en) Pipeline analog to digital converter with split-path level shifting technique
US7573417B2 (en) Multi-bit per stage pipelined analog to digital converters
Chung et al. A 16-mW 8-bit 1-GS/s subranging ADC in 55nm CMOS
Wang et al. An 8-bit 20-MS/s ZCBC time-domain analog-to-digital data converter
Kilic et al. A DAC assisted speed enhancement technique for high resolution SAR ADC
El-Sankary et al. 10-b 100-MS/s two-channel time-interleaved pipelined ADC
US7948410B2 (en) Multibit recyclic pipelined ADC architecture

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 201180043704.1

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 11825797

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2013529266

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 11825797

Country of ref document: EP

Kind code of ref document: A1