WO2011104982A1 - Cu-Mg-P系銅合金条材及びその製造方法 - Google Patents
Cu-Mg-P系銅合金条材及びその製造方法 Download PDFInfo
- Publication number
- WO2011104982A1 WO2011104982A1 PCT/JP2010/072808 JP2010072808W WO2011104982A1 WO 2011104982 A1 WO2011104982 A1 WO 2011104982A1 JP 2010072808 W JP2010072808 W JP 2010072808W WO 2011104982 A1 WO2011104982 A1 WO 2011104982A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- copper alloy
- average
- pixels
- alloy strip
- stress relaxation
- Prior art date
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/02—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
- H01B1/026—Alloys based on copper
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C9/00—Alloys based on copper
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D6/00—Heat treatment of ferrous alloys
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D9/00—Heat treatment, e.g. annealing, hardening, quenching or tempering, adapted for particular articles; Furnaces therefor
- C21D9/46—Heat treatment, e.g. annealing, hardening, quenching or tempering, adapted for particular articles; Furnaces therefor for sheet metals
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/04—Ferrous alloys, e.g. steel alloys containing manganese
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/06—Ferrous alloys, e.g. steel alloys containing aluminium
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/12—Ferrous alloys, e.g. steel alloys containing tungsten, tantalum, molybdenum, vanadium, or niobium
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/08—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of copper or alloys based thereon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/02—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
- H01B5/02—Single bars, rods, wires, or strips
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D2211/00—Microstructure comprising significant phases
- C21D2211/001—Austenite
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D2211/00—Microstructure comprising significant phases
- C21D2211/005—Ferrite
Definitions
- the present invention is a Cu-Mg-P copper alloy strip suitable for electrical and electronic parts such as connectors, lead frames, relays, switches, etc., and has particularly high tensile strength, spring limit value and stress relaxation rate.
- the present invention relates to a balanced Cu—Mg—P-based copper alloy strip and a method for producing the same. This application claims priority based on Japanese Patent Application No. 2010-038516 for which it applied on February 24, 2010, and uses the content here.
- brass and phosphor bronze that have been widely used conventionally have a problem in that they cannot sufficiently meet the requirements for the connector material described above. That is, brass lacks strength, springiness, and conductivity, and therefore cannot cope with downsizing of the connector and increase in energization current.
- Phosphor bronze has higher strength and higher springiness, but cannot cope with an increase in energization current because its conductivity is as low as about 20% IACS.
- phosphor bronze has a disadvantage that it is inferior in migration resistance. Migration is a phenomenon in which Cu on the anode side is ionized and deposited on the cathode side when condensation occurs between the electrodes, eventually leading to a short circuit between the electrodes. It is used in a high humidity environment like an automobile.
- Patent Document 1 it is a strip material containing Mg: 0.1 to 1.0% and P: 0.001 to 0.02% by weight, with the balance being Cu and inevitable impurities,
- the oval crystal grains have an average minor axis of 5 to 20 ⁇ m and an average major axis / average minor axis value of 1.5 to 6.0.
- the average crystal grain size is adjusted to be in the range of 5 to 20 ⁇ m in the final annealing immediately before the final cold rolling, and then the rolling rate is in the range of 30 to 85% in the final cold rolling process.
- a copper alloy strip material is disclosed in which the stamping mold is less worn during stamping.
- Mg is contained in 0.3 to 2% by weight
- P is contained in 0.001 to 0.1% by weight
- the remaining copper alloy thin plate having a composition composed of Cu and inevitable impurities contains P.
- the amount By regulating the amount to 0.001 to 0.02% by weight, further adjusting the oxygen content to 0.0002 to 0.001% by weight and the C content to 0.0002 to 0.0013% by weight
- the particle size of the oxide particles containing Mg dispersed therein to 3 ⁇ m or less, there is less decrease in the spring limit value after bending than the conventional copper alloy sheet, and the connector can be removed from this copper alloy sheet.
- the connector obtained has a connection strength superior to that of the conventional one, and it is disclosed that it does not come off even when used in a high-vibration environment such as around an automobile engine.
- Patent Document 1 and Patent Document 2 described above a copper alloy having excellent strength, conductivity, and the like has been obtained.
- the functionality of electric / electronic devices becomes more and more remarkable, the performance improvement of these copper alloys has been strongly demanded.
- copper alloys used for connectors and the like it is important to be able to use with high stress without causing settling under long-term use conditions at high temperatures.
- a Cu—Mg—P-based copper alloy strip having a high level of balance with the stress relaxation rate.
- the copper alloy composition and the shape of the surface crystal grains are defined, the relationship between the tensile strength and the spring limit value characteristics in the analysis of the fine structure of the crystal grains is touched. It is not done.
- the present invention provides a Cu-Mg-P-based copper alloy strip having a high balance between the tensile strength, the spring limit value, and the stress relaxation rate when used for a long time at a high temperature, and its A manufacturing method is provided.
- EBSD backscattered electron diffraction
- This EBSD method is a means for obtaining a crystal orientation from a diffraction image (Kikuchi line) of an electron beam obtained from a sample surface by placing a test piece in a scanning electron microscope (SEM). If there is, direction can be measured easily.
- SEM scanning electron microscope
- crystal orientation data is associated with each part (actually a pixel) of the image
- crystal orientation data corresponding to the image of the selected part can be extracted from the file.
- the present inventors have observed the surface of a Cu—Mg—P-based copper alloy using an EBSD method with a scanning electron microscope with a backscattered electron diffraction image system.
- the boundary where the orientation difference between adjacent pixels is 5 ° or more is regarded as the crystal grain boundary
- the average value of the average orientation difference between all the pixels in the crystal grain is 3.8 °.
- the angle is in the range of -4.2 °
- the tensile strength of the Cu-Mg-P-based copper alloy, the spring limit value characteristics, and the stress relaxation rate when used for a long time at high temperature can be balanced at a high level. I found.
- the copper alloy strip of the present invention is a copper alloy strip having a composition of Mg: 0.3-2%, P: 0.001-0.1%, the balance being Cu and inevitable impurities.
- the orientation of all pixels within the measurement area of the surface of the copper alloy strip is measured at a step size of 0.5 ⁇ m, and adjacent pixels
- the average value of the average orientation difference between all the pixels in the crystal grains is 3.8 to 4.2 ° when the boundary where the orientation difference between them is 5 ° or more is regarded as the grain boundary.
- tensile strength is 641 ⁇ 708N / mm 2
- a stress relaxation rate after heat treatment for 1000 hours at 200 ° C. is 12 to 19% To do.
- the tensile strength, spring limit value, stress relaxation after high temperature heat treatment rate is Kitaichi lowering all, if it is 3.8 ⁇ 4.2 ° of appropriate value, a tensile strength of 641 ⁇ 708N / mm 2, a spring limit value 472 ⁇ 503N / mm 2, at 200 ° C. 1000
- the stress relaxation rate after heat treatment for 12 hours is 12 to 19%, and the tensile strength, the spring limit value, and the stress relaxation rate after high temperature heat treatment are balanced at a high level.
- the copper alloy strip of the present invention may contain 0.001 to 0.03% of Zr by mass%. Addition of 0.001 to 0.03% of Zr contributes to improvement of tensile strength and spring limit value and reduction of stress relaxation rate after heat treatment at 200 ° C. for 1000 hours.
- the method for producing a copper alloy strip according to the present invention has a hot rolling start temperature of 720 ° C. or more when producing a copper alloy in a process including hot rolling, solution treatment, finish cold rolling, and low temperature annealing in this order.
- the total hot rolling rate is 90% or more
- the average rolling reduction per pass is 10% to 35%
- the hot rolling is performed
- the Vickers hardness of the copper alloy sheet after the solution treatment Is adjusted to 80 to 100 Hv
- the low temperature annealing is performed at 250 to 350 ° C. for 120 seconds to 240 seconds.
- the Vickers hardness of the copper alloy sheet after solution treatment is It is necessary to appropriately adjust various conditions of hot rolling, solution treatment, and cold rolling so that the thickness becomes 80 to 100 Hv. Further, the EBSD method using a scanning electron microscope with a backscattered electron diffraction image system is used. Then, the orientation of all the pixels within the measurement area of the surface of the copper alloy strip is measured, and the boundary where the orientation difference between adjacent pixels is 5 ° or more is regarded as the grain boundary.
- the average orientation difference between all the pixels in the crystal grains is 3.8 to 4.2 °
- the tensile strength is 641 to 708 N / mm 2
- the spring limit value is 472 to 503 N / mm 2 .
- heat at 1000C for 1000 hours The stress relaxation rate after physical is 12 to 19%, should be performed at 120 to 240 seconds to low-temperature annealing at 250 ⁇ 350 ° C..
- hot rolling it is important to perform hot rolling at a rolling start temperature of 720 ° C. to 820 ° C., a total rolling rate of 90% or more, and an average rolling reduction per pass of 10% to 35%. is there. If the average rolling reduction per pass is less than 10%, the workability in the subsequent process is deteriorated, and if it exceeds 35%, material cracking tends to occur. If the total rolling ratio is less than 90%, the additive elements are not uniformly dispersed and material cracking is likely to occur. If the rolling start temperature is less than 720 ° C, the additive elements are difficult to disperse uniformly, and cracks are likely to occur. If it exceeds 820 ° C, the heat cost increases and it is economically wasteful.
- the improvement of the spring limit value characteristic is not seen, and when it exceeds 350 ° C., a brittle and coarse Mg compound is formed and the tensile strength and after heat treatment at 200 ° C. for 1000 hours
- the stress relaxation rate is adversely affected.
- the improvement of the spring limit value characteristic is not observed, and when it exceeds 240 seconds, a brittle and coarse Mg compound is formed, and the tensile strength and 1000 hours at 200 ° C. It adversely affects the stress relaxation rate after heat treatment.
- the present invention it is possible to obtain a Cu—Mg—P based copper alloy strip in which the tensile strength, the spring limit value, and the stress relaxation rate after heat treatment at 200 ° C. for 1000 hours are balanced at a high level.
- the azimuth of all the pixels within the measurement area of the surface of the copper alloy strip is measured by an EBSD method using a scanning electron microscope with a backscattered electron diffraction image system, and the azimuth difference between adjacent pixels is 5 ° or more. It is a graph which shows the relationship between the average value of the average orientation difference between all the pixels in the crystal grain in all the crystal grains, and a spring limit value (Kb) at the time of considering a certain boundary as a crystal grain boundary.
- Kb spring limit value
- the azimuth of all the pixels within the measurement area of the surface of the copper alloy strip is measured by an EBSD method using a scanning electron microscope with a backscattered electron diffraction image system, and the azimuth difference between adjacent pixels is 5 ° or more.
- the azimuth of all the pixels within the measurement area of the surface of the copper alloy strip is measured by an EBSD method using a scanning electron microscope with a backscattered electron diffraction image system, and the azimuth difference between adjacent pixels is 5 ° or more.
- a graph showing the relationship between the average value of the average misorientation between all pixels in a crystal grain and the stress relaxation rate after heat treatment at 200 ° C. for 1000 hours when a certain boundary is regarded as a grain boundary. is there.
- the copper alloy strip according to the present invention has a composition by mass: Mg: 0.3-2%, P: 0.001-0.1%, the balance being Cu and inevitable impurities.
- Mg improves the strength without being dissolved in the Cu substrate and impairing conductivity.
- P has a deoxidizing action at the time of melt casting, and improves the strength in the state of coexisting with the Mg component.
- Zr may be contained in an amount of 0.001 to 0.03% by mass, and the addition of Zr within this range improves the tensile strength and spring limit value and reduces the stress after heat treatment at 200 ° C. for 1000 hours. It is effective in reducing the rate.
- This copper alloy strip is measured by the EBSD method using a scanning electron microscope with a backscattered electron diffraction image system to measure the orientation of all the pixels within the measurement area of the surface of the copper alloy strip, and between adjacent pixels.
- a boundary having an orientation difference of 5 ° or more is regarded as a crystal grain boundary
- the average value of the average orientation difference between all the pixels in the crystal grains in all the crystal grains is 3.8 to 4.2 °.
- a spring limit value 472 ⁇ 503N / mm 2 the stress relaxation rate after heat treatment for 1000 hours at 200 ° C. is 12% to 19%.
- the average value of the average orientation difference between all the pixels in the crystal grains in all the crystal grains was obtained as follows.
- a 10 mm ⁇ 10 mm sample was immersed in 10% sulfuric acid for 10 minutes, washed with water and sprinkled with air blow, and the sprinkled sample was accelerating with a flat milling (ion milling) device manufactured by Hitachi High-Technologies Corporation at an acceleration voltage of 5 kV.
- the surface treatment was performed at an incident angle of 5 ° and an irradiation time of 1 hour.
- the surface of the sample was observed with a scanning electron microscope S-3400N manufactured by Hitachi High-Technologies Corporation equipped with an EBSD system manufactured by TSL.
- the observation conditions were an acceleration voltage of 25 kV and a measurement area of 150 ⁇ m ⁇ 150 ⁇ m. From the observation results, the average value of the average orientation difference between all the pixels in the crystal grains in all the crystal grains was obtained under the following conditions. At a step size of 0.5 ⁇ m, the orientation of all pixels within the measurement area range was measured, and a boundary where the orientation difference between adjacent pixels was 5 ° or more was regarded as a crystal grain boundary.
- the average value of orientation difference (GOS: Grain Orientation Spread) between all the pixels in the crystal grain is calculated by the formula 1, and all of them are calculated.
- the average value of the values was defined as the average orientation difference between all the pixels in the crystal grains. In addition, what connected 2 pixels or more was made into the crystal grain.
- i and j indicate the numbers of pixels in the crystal grains.
- n indicates the number of pixels in the crystal grains.
- ⁇ ij represents the difference in orientation between pixels i and j.
- the copper alloy strip of the present invention in which the average value of the average orientation difference between all the pixels in the crystal grains in the thus obtained all crystal grains is 3.8 to 4.2 ° has a tensile strength of 641 to a 708n / mm 2, a spring limit value 472 ⁇ 503N / mm 2, the stress relaxation rate after heat treatment for 1000 hours at 200 ° C. is 12 to 19% to that strain in the crystal grains is hardly accumulated It is difficult to generate cracks, and the tensile strength, spring limit value, and stress relaxation rate after heat treatment at high temperature balance at a high level.
- the copper alloy strip having such a configuration can be manufactured, for example, by the following manufacturing process. “Melting / Casting ⁇ Hot Rolling ⁇ Cold Rolling ⁇ Solution Treatment ⁇ Intermediate Cold Rolling ⁇ Finish Cold Rolling ⁇ Low Temperature Annealing” Although not described in the above process, chamfering may be performed as necessary after hot rolling, and pickling, polishing, or further degreasing may be performed as necessary after each heat treatment. .
- main steps will be described in detail.
- Hot rolling / cold rolling / solution treatment In order to stabilize the copper alloy structure and balance the tensile strength, spring limit value, and stress relaxation rate after heat treatment at 200 ° C. for 1000 hours at a high level, the Vickers hardness of the copper alloy plate after solution treatment It is necessary to appropriately adjust various conditions for hot rolling, cold rolling, and solution treatment so that is 80 to 100 Hv.
- hot rolling is performed at a rolling start temperature of 720 ° C. to 820 ° C., a total rolling rate of 90% or more, and an average rolling reduction per pass of 10% to 35%. is important. If the average rolling reduction per pass is less than 10%, the workability in the subsequent process is deteriorated, and if it exceeds 35%, material cracking tends to occur.
- the additive elements are not uniformly dispersed and material cracking is likely to occur.
- the rolling start temperature is less than 720 ° C.
- the additive elements are not uniformly dispersed, and cracks are likely to occur.
- the rolling start temperature is higher than 820 ° C., the heat cost increases, resulting in economical waste.
- Intermediate cold rolling / finishing cold rolling each have a rolling rate of 50 to 95%.
- Low temperature annealing After the finish cold rolling, low temperature annealing at 250 to 350 ° C. for 120 to 240 seconds is performed to further stabilize the copper alloy structure, and after the heat treatment at 1000 ° C. for 1000 hours at the tensile strength and spring limit value. The stress relaxation rate is balanced at a high level, and the orientation of all pixels within the measurement area of the surface of the copper alloy strip is measured by the EBSD method using a scanning electron microscope with a backscattered electron diffraction image system.
- the average value of the average misorientation between all the pixels in the crystal grains in all crystal grains when the boundary where the misorientation between the pixels is 5 ° or more is regarded as the grain boundary is 3.8 to 4.2 °.
- the low-temperature annealing temperature is less than 250 ° C.
- the improvement of the spring limit value characteristic is not observed, and when it exceeds 350 ° C., a brittle and coarse Mg compound is formed, resulting in a decrease in tensile strength, and at 200 ° C. for 1000 hours. It adversely affects the stress relaxation rate after heat treatment.
- the low-temperature annealing time is less than 120 seconds, the improvement of the spring limit value characteristics is not observed, and when it exceeds 240 seconds, a brittle and coarse Mg compound is formed, resulting in a decrease in tensile strength and at 200 ° C. It adversely affects the stress relaxation rate after heat treatment for 1000 hours.
- the copper alloy having the composition shown in Table 1 was melted in a reducing atmosphere with an electric furnace to produce an ingot having a thickness of 150 mm, a width of 500 mm, and a length of 3000 mm.
- the melted ingot was hot-rolled at the rolling start temperature, the total rolling rate, and the average reduction rate shown in Table 1 to obtain a copper alloy plate having a thickness of 7.5 mm to 15 mm.
- cold rolling with a rolling rate of 85% to 95% was performed, and solution treatment was performed at 750 ° C., and the rolling rate was 70%.
- a cold rolled thin sheet having a thickness of 0.2 mm is prepared by performing finish rolling of ⁇ 85%, followed by low temperature annealing shown in Table 1, and shown in Examples 1 to 8 and Comparative Examples 1 to 10 in Table 1.
- a Cu—Mg—P-based copper alloy sheet was prepared. Further, the Vickers hardness of the copper alloy plate after the solution treatment shown in Table 1 was measured based on JIS-Z2244.
- Table 2 summarizes the results of the following various tests performed on the thin plates in Table 1.
- Average value of average heading difference As a pretreatment, a 10 mm ⁇ 10 mm sample was immersed in 10% sulfuric acid for 10 minutes, washed with water and sprinkled with air blow, and the sprinkled sample was accelerating with a flat milling (ion milling) device manufactured by Hitachi High-Technologies Corporation at an acceleration voltage of 5 kV. The surface treatment was performed at an incident angle of 5 ° and an irradiation time of 1 hour. Next, the sample surface was observed with a scanning electron microscope S-3400N manufactured by Hitachi High-Technologies Corporation equipped with an EBSD system manufactured by TSL.
- the observation conditions were an acceleration voltage of 25 kV and a measurement area of 150 ⁇ m ⁇ 150 ⁇ m (including 5000 or more crystal grains). From the observation results, the average value of the average orientation difference between all the pixels in the crystal grains in all the crystal grains was obtained under the following conditions. At a step size of 0.5 ⁇ m, the orientation of all pixels within the measurement area range was measured, and a boundary where the orientation difference between adjacent pixels was 5 ° or more was regarded as a crystal grain boundary. Next, with respect to all of the individual crystal grains surrounded by the crystal grain boundary, the average value of the orientation difference between all the pixels in the crystal grains (GOS: Grain Orientation Spread) is calculated by the above-described equation (1).
- GOS Grain Orientation Spread
- the average value of all the values was defined as the average orientation difference between all the pixels in the crystal grains in all the crystal grains at the measurement location. In addition, what connected 2 pixels or more was made into the crystal grain. The measurement location was changed by this method and the measurement was performed 5 times, and all average values of the average orientation difference at each measurement location were defined as the average value of the average orientation difference. In Table 2, it is shown as “average value of GOS”.
- the orientation of all the pixels within the measurement area of the surface of the copper alloy strip is measured, and between adjacent pixels
- the graph shows the relationship between the average value of the average orientation difference between all the pixels in the crystal grains and the spring limit value (Kb) when the boundary where the orientation difference is 5 ° or more is regarded as the grain boundary.
- FIG. 1 is plotted, and when the average value is 3.8 to 4.2 °, a high spring limit value (472 to 503 N / mm 2 in Table 2 ) is shown.
- the azimuth of all pixels within the measurement area of the surface of the copper alloy strip was measured by an EBSD method using a scanning electron microscope with a backscattered electron diffraction image system, and between adjacent pixels.
- the graph plots the relationship between the average value of the average orientation difference between all the pixels in the crystal grains and the tensile strength when the boundary where the orientation difference is 5 ° or more is regarded as the grain boundary.
- FIG. 2 shows that when the average value is 3.8 to 4.2 °, high tensile strength (641 to 708 N / mm 2 in Table 2 ) is shown.
- FIG. 3 shows that when the average value is 3.8 to 4.2 °, a low stress relaxation rate (12 to 19% in Table 2) is shown.
- the Cu—Mg—P-based copper alloy of the present invention has a tensile strength, a spring limit value, and stress after heat treatment at 200 ° C. for 1000 hours. It is clear that the relaxation rate is balanced at a high level, especially for use in electrical and electronic parts such as connectors, lead frames, relays, switches, etc. where spring limit value characteristics and stress relaxation characteristics are important. It turns out that it is suitable.
- the one added with Zr has a spring limit value of 483 to 503 N / mm 2 , an improved tensile strength of 657 to 708, a stress relaxation rate of 12 to 14%, and further has mechanical properties, It can be seen that the stress relaxation characteristics are excellent.
- the Cu—Mg—P-based copper alloy of the present invention has a high balance between tensile strength, spring limit value, and stress relaxation rate after heat treatment at 200 ° C. for 1000 hours. Suitable for use in electrical and electronic parts such as connectors, lead frames, relays, and switches where stress relaxation properties are important.
Abstract
Description
本願は、2010年2月24日に出願された特願2010-038516号に基づき優先権を主張し、その内容をここに援用する。
一方、機器の高機能化に伴う電極数の増加や通電電流の増加によって、発生するジュール熱も多大なものになりつつあり、従来以上に導電率が高い材料への要求が強まっている。こうした高導電率材は、通電電流の増加が急速に進んでいる自動車向けの端子・コネクタ材で強く求められている。従来、こうした端子・コネクタ用の材料としては黄銅やりん青銅が一般的に使用されている。
更に、りん青銅は耐マイグレーション性に劣るという欠点もある。マイグレーションとは電極間に結露などが生じた際、陽極側のCuがイオン化して陰極側に析出し、最終的に電極間の短絡に至る現象であり、自動車のように高湿環境で使用されるコネクタで問題となるとともに、小型化により電極間ピッチが狭くなっているコネクタでも注意を要する問題である。
この様な黄銅やりん青銅の持つ問題を改善する材料として、例えば、出願人は特許文献1~2に示されるようなCu-Mg-Pを主成分とする銅合金を提案している。
また、上記の各特許文献では、銅合金組成及び表面結晶粒の形状を規定はしているものの、結晶粒の微細組織の解析に踏み込んでの引張強さとばね限界値特性との関係については触れられていない。
これらを利用して、本発明者らは、鋭意研究の結果、Cu-Mg-P系銅合金の表面を後方散乱電子回折像システム付の走査型電子顕微鏡にてEBSD法を使用して観察したところ、隣接するピクセル間の方位差が5°以上である境界を結晶粒界としたみなした場合の、結晶粒内の全ピクセル間の平均方位差の全結晶粒における平均値が3.8°~4.2°の範囲であると、Cu-Mg-P系銅合金の引張強さと、ばね限界値特性と、高温での長時間使用時の応力緩和率とが高レベルでバランスが取れることを見出した。
Zrの0.001~0.03%添加は、引張強さ及びばね限界値の向上及び200℃で1000時間の熱処理後の応力緩和率の低下に寄与する。
低温焼鈍温度が250℃未満では、ばね限界値特性の向上が見られず、350℃を超えると、脆い粗大なMg化合物が形成されて引張強さ、及び、200℃で1000時間の熱処理後の応力緩和率に悪影響を及ぼす。同様に、低温焼鈍時間が120秒未満では、ばね限界値特性の向上が見られず、240秒を超えると、脆い粗大なMg化合物が形成されて引張強さ、及び、200℃で1000時間の熱処理後の応力緩和率に悪影響を及ぼす。
本発明の銅合金条材は、質量%で、Mg:0.3~2%、P:0.001~0.1%、残部がCuおよび不可避的不純物である組成を有する。
Mgは、Cuの素地に固溶して導電性を損なうことなく、強度を向上させる。また、Pは、溶解鋳造時に脱酸作用があり、Mg成分と共存した状態で強度を向上させる。これらMg、Pは上記範囲で含有することにより、その特性を有効に発揮することができる。
また、質量%でZrを0.001~0.03%含有するものとしてもよく、この範囲のZrの添加は引張強さ及びばね限界値の向上及び200℃で1000時間の熱処理後の応力緩和率の低下に有効である。
前処理として、10mm×10mmの試料を10%硫酸に10分間浸漬した後、水洗、エアブローにより散水した後に、散水後の試料を日立ハイテクノロジーズ社製フラットミリング(イオンミリング)装置で、加速電圧5kV、入射角5°、照射時間1時間にて表面処理を施した。
次に、TSL社製EBSDシステム付きの日立ハイテクノロジーズ社製走査型電子顕微鏡S-3400Nでその試料表面を観察した。観察条件は、加速電圧25kV、測定面積150μm×150μmとした。
観察結果より、全結晶粒における結晶粒内の全ピクセル間の平均方位差の平均値は次の条件にて求めた。
ステップサイズ0.5μmにて、測定面積範囲内の全ピクセルの方位を測定し、隣接するピクセル間の方位差が5°以上である境界を結晶粒界とみなした。
nは結晶粒内のピクセル数を示す。
αijはピクセルiとjの方位差を示す。
このようにして求めた全結晶粒における結晶粒内の全ピクセル間の平均方位差の平均値が3.8~4.2°である本発明の銅合金条材は、引張強さが641~708N/mm2であり、ばね限界値が472~503N/mm2であり、200℃で1000時間の熱処理後の応力緩和率が12~19%であり、結晶粒に歪みが蓄積されにくいものとなっており、クラックも発生し難く、引張強さとばね限界値と高温での熱処理後の応力緩和率が高レベルでバランスする。
「溶解・鋳造→熱間圧延→冷間圧延→溶体化処理→中間冷間圧延→仕上げ冷間圧延→低温焼鈍」
なお、上記工程中には記載していないが、熱間圧延後には必要に応じて面削が行われ、各熱処理後には必要に応じて酸洗、研磨、あるいはさらに脱脂が行われても良い。
以下、主要な工程について詳述する。
銅合金組織を安定化させ、引張強さとばね限界値と200℃で1000時間の熱処理後の応力緩和率をハイレベルでバランスを取るためには、溶体化処理後の銅合金板のビッカース硬さが80~100Hvとなるように、熱間圧延、冷間圧延、溶体化処理の諸条件を適宜調整する必要がある。
なかでも、熱間圧延にて、圧延開始温度を720℃~820℃とし、総圧延率を90%以上とし、1パス当りの平均圧下率が10%~35%である熱間圧延を行うことが重要である。1パス当りの平均圧下率が10%未満では、後工程での加工性が悪くなり、35%を超えると、材料割れが発生し易くなる。総圧延率が90%未満では、添加元素が均一に分散せず、また、材料割れが発生し易くなる。圧延開始温度が720℃未満では、添加元素が均一に分散せず、また、クラックが発生し易くなり、820℃を超えると、熱コストが増加して経済的に無駄となる。
中間、仕上げ冷間圧延は、各々、50~95%の圧延率とする。
〔低温焼鈍〕
仕上げ冷間圧延後に、250~350℃、120~240秒の低温焼鈍を実施することにより、更に、銅合金組織を安定化させ、引張り強さとばね限界値と200℃で1000時間の熱処理後の応力緩和率とが高レベルでバランスし、後方散乱電子回折像システム付の走査型電子顕微鏡によるEBSD法にて、前記銅合金条材の表面の測定面積内の全ピクセルの方位を測定し、隣接するピクセル間の方位差が5°以上である境界を結晶粒界とみなした場合の、全結晶粒における結晶粒内の全ピクセル間の平均方位差)の平均値が3.8~4.2°となる。
低温焼鈍温度が250℃未満では、ばね限界値特性の向上が見られず、350℃を超えると、脆い粗大なMg化合物が形成されて引張強さの低下を来たすとともに、200℃で1000時間の熱処理後の応力緩和率に悪影響を及ぼす。同様に、低温焼鈍時間が120秒未満では、ばね限界値特性の向上が見られず、240秒を超えると、脆い粗大なMg化合物が形成されて引張強さの低下を来たすとともに、200℃で1000時間の熱処理後の応力緩和率に悪影響を及ぼす。
表1に示す組成の銅合金を、電気炉により還元性雰囲気下で溶解し、厚さが150mm、幅が500mm、長さが3000mmの鋳塊を溶製した。この溶製した鋳塊を、表1に示す、圧延開始温度、総圧延率、平均圧下率にて熱間圧延を行い、厚さが7.5mm~15mmの銅合金板とした。この銅合金板の両表面の酸化スケールをフライスで0.5mm除去した後、圧延率が85%~95%の冷間圧延を施し、750℃にて溶体化処理を行い、圧延率が70%~85%の仕上げ圧延を行って0.2mmの冷間圧延薄板を作成し、その後、表1に示す低温焼鈍を実施して、表1の実施例1~8及び比較例1~10に示すCu-Mg-P系銅合金薄板を作製した。
また、表1に示す溶体化処理後の銅合金板のビッカース硬さをJIS-Z2244に基づいて測定した。
(平均方位差の平均値)
前処理として、10mm×10mmの試料を10%硫酸に10分間浸漬した後、水洗、エアブローにより散水した後に、散水後の試料を日立ハイテクノロジーズ社製フラットミリング(イオンミリング)装置で、加速電圧5kV、入射角5°、照射時間1時間にて表面処理を施した。
次に、TSL社製EBSDシステム付の日立ハイテクノロジーズ社製走査型電子顕微鏡S-3400Nで試料表面を観察した。観察条件は、加速電圧25kV、測定面積150μm×150μm(結晶粒を5000個以上含む)とした。
観察結果より、全結晶粒における結晶粒内の全ピクセル間の平均方位差の平均値は次の条件にて求めた。
ステップサイズ0.5μmにて、測定面積範囲内の全ピクセルの方位を測定し、隣接するピクセル間の方位差が5°以上である境界を結晶粒界とみなした。
次に、結晶粒界で囲まれた個々の結晶粒の全てについて、結晶粒内の全ピクセル間の方位差の平均値(GOS:Grain Orientation Spread)を前述の数1の式にて計算し、その全ての値の平均値を当該測定箇所での全結晶粒における結晶粒内の全ピクセル間の平均方位差とした。なお、2ピクセル以上が連結しているものを結晶粒とした。
この方法にて測定箇所を変更して5回測定を行い、それぞれの測定箇所での平均方位差の全ての平均値を平均方位差の平均値とした。表2には「GOSの平均値」として示した。
JIS5号試験片にて測定した。
(ばね限界値)
JIS-H3130に基づき、モーメント式試験により永久たわみ量を測定し、R.T.におけるKb0.1(永久たわみ量0.1mmに対応する固定端における表面最大応力値)を算出した。
(導電率)
JIS-H0505に基づいて測定した。
(応力緩和率)
幅12.7mm、長さ120mm(以下、この長さ120mmをL0とする)の寸法を持った試験片を使用し、この試験片を長さ:110mm、深さ:3mmの水平縦長溝を有する治具に前記試験片の中央部が上方に膨出するように湾曲セットし(この時の試験片の両端部の距離:110mmをL1とする)、この状態で温度:200℃にて1000時間保持し、加熱後、前記治具から取り外した状態における前記試験片の両端部間の距離(以下、L2とする)を測定し、計算式:(L0-L2)/(L0-L1)×100%によって算出することにより求めた。
更に、これらの結果から、後方散乱電子回折像システム付の走査型電子顕微鏡によるEBSD法にて、前記銅合金条材の表面の測定面積内の全ピクセルの方位を測定し、隣接するピクセル間の方位差が5°以上である境界を結晶粒界とみなした場合の、全結晶粒における結晶粒内の全ピクセル間の平均方位差の平均値と引張り強さとの関係をグラフにプロットしたのが図2であり、その平均値が3.8~4.2°であると、高い引張強さ(表2では641~708N/mm2)を示していることがわかる。
また、前述のようにして求めた全結晶粒における結晶粒内の全ピクセル間の平均方位差の平均値と200℃で1000時間の熱処理後の応力緩和率との関係をグラフにプロットしたのが図3であり、その平均値が3.8~4.2°であると、低い応力緩和率(表2では12~19%)を示していることがわかる。
その中でも、Zrを添加したものは、ばね限界値が483~503N/mm2、引張強度が657~708と向上し、応力緩和率が12~14%と低下しており、さらに機械的特性、応力緩和特性に優れることがわかる。
例えば、「溶解・鋳造→熱間圧延→冷間圧延→溶体化処理→中間冷間圧延→仕上げ冷間圧延→低温焼鈍」の順序での製造工程を示したが、熱間圧延、溶体化処理、仕上げ冷間圧延、低温焼鈍がこの順序でなされるものであればよく、その場合、熱間圧延の圧延開始温度、総圧延率、1パス当りの平均圧下率、及び低温焼鈍の温度、時間など以外の条件は、一般的な製造条件を適用すればよい。
Claims (3)
- 質量%で、Mg:0.3~2%、P:0.001~0.1%、残部がCuおよび不可避的不純物である組成を有する銅合金条材であり、後方散乱電子回折像システム付の走査型電子顕微鏡によるEBSD法にて、ステップサイズ0.5μmにて前記銅合金条材の表面の測定面積内の全ピクセルの方位を測定し、隣接するピクセル間の方位差が5°以上である境界を結晶粒界とみなした場合の、全結晶粒における結晶粒内の全ピクセル間の平均方位差の平均値が3.8~4.2°であり、引張強さが641~708N/mm2であり、ばね限界値が472~503N/mm2であり、200℃で1000時間の熱処理後の応力緩和率が12~19%であることを特徴とする銅合金条材。
- 質量%でZrを0.001~0.03%含有することを特徴とする請求項1に記載の銅合金条材。
- 請求項1に記載の銅合金条材の製造方法であって、熱間圧延、溶体化処理、仕上げ冷間圧延、低温焼鈍をこの順序で含む工程で銅合金を製造するに際して、熱間圧延開始温度が720℃~820℃で、総熱間圧延率が90%以上であり、1パス当りの平均圧下率が10%~35%として前記熱間圧延を行い、前記溶体化処理後の銅合金板のビッカース硬さを80~100Hvに調整し、前記低温焼鈍を250~350℃にて120秒~240秒にて実施することを特徴とする銅合金条材の製造方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020127023850A KR101724561B1 (ko) | 2010-02-24 | 2010-12-17 | Cu-Mg-P계 동합금봉 및 그 제조 방법 |
CN201080063568.8A CN102753712B (zh) | 2010-02-24 | 2010-12-17 | Cu-Mg-P系铜合金条材及其制造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010038516A JP4563508B1 (ja) | 2010-02-24 | 2010-02-24 | Cu−Mg−P系銅合金条材及びその製造方法 |
JP2010-038516 | 2010-02-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2011104982A1 true WO2011104982A1 (ja) | 2011-09-01 |
Family
ID=43048784
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2010/072808 WO2011104982A1 (ja) | 2010-02-24 | 2010-12-17 | Cu-Mg-P系銅合金条材及びその製造方法 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP4563508B1 (ja) |
KR (1) | KR101724561B1 (ja) |
CN (1) | CN102753712B (ja) |
TW (1) | TWI480394B (ja) |
WO (1) | WO2011104982A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013069687A1 (ja) * | 2011-11-07 | 2013-05-16 | 三菱マテリアル株式会社 | 電子機器用銅合金、電子機器用銅合金の製造方法、電子機器用銅合金塑性加工材及び電子機器用部品 |
US9587299B2 (en) | 2011-10-28 | 2017-03-07 | Mitsubishi Materials Corporation | Copper alloy for electronic equipment, method for producing copper alloy for electronic equipment, rolled copper alloy material for electronic equipment, and part for electronic equipment |
US10032536B2 (en) | 2010-05-14 | 2018-07-24 | Mitsubishi Materials Corporation | Copper alloy for electronic device, method for producing copper alloy for electronic device, and copper alloy rolled material for electronic device |
US10458003B2 (en) | 2011-11-14 | 2019-10-29 | Mitsubishi Materials Corporation | Copper alloy and copper alloy forming material |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5054160B2 (ja) * | 2010-06-28 | 2012-10-24 | 三菱伸銅株式会社 | Cu−Mg−P系銅合金条材及びその製造方法 |
WO2013150627A1 (ja) * | 2012-04-04 | 2013-10-10 | 三菱伸銅株式会社 | 優れた耐疲労特性を有するCu-Mg-P系銅合金板及びその製造方法 |
JP5908796B2 (ja) * | 2012-06-05 | 2016-04-26 | 三菱伸銅株式会社 | 機械的な成形性に優れたCu−Mg−P系銅合金板及びその製造方法 |
JP6370692B2 (ja) * | 2013-11-26 | 2018-08-08 | 三菱伸銅株式会社 | Cu−Zr系銅合金板及びその製造方法 |
KR102052879B1 (ko) * | 2014-08-25 | 2019-12-06 | 가부시키가이샤 고베 세이코쇼 | 내미세접동마모성이 우수한 접속 부품용 도전 재료 |
JP5910790B1 (ja) * | 2015-12-01 | 2016-04-27 | 三菱マテリアル株式会社 | 電子・電気機器用銅合金、電子・電気機器用銅合金塑性加工材、電子・電気機器用部品、端子、及び、バスバー |
MX2017009888A (es) * | 2015-09-09 | 2017-11-15 | Mitsubishi Materials Corp | Aleacion de cobre para dispositivo electronico/electrico, material de aleacion de cobre maquinado plasticamente para dispositivo electronico/electrico, componente para dispositivo electronico/electrico, terminal y barra colectora. |
KR102473001B1 (ko) * | 2015-09-09 | 2022-11-30 | 미쓰비시 마테리알 가부시키가이샤 | 전자·전기 기기용 구리 합금, 전자·전기 기기용 구리 합금 소성 가공재, 전자·전기 기기용 부품, 단자, 및 버스 바 |
US10676803B2 (en) | 2015-09-09 | 2020-06-09 | Mitsubishi Materials Corporation | Copper alloy for electronic/electrical device, copper alloy plastically-worked material for electronic/electrical device, component for electronic/electrical device, terminal, and busbar |
WO2017170699A1 (ja) | 2016-03-30 | 2017-10-05 | 三菱マテリアル株式会社 | 電子・電気機器用銅合金、電子・電気機器用銅合金板条材、電子・電気機器用部品、端子、バスバー、及び、リレー用可動片 |
WO2017170733A1 (ja) | 2016-03-30 | 2017-10-05 | 三菱マテリアル株式会社 | 電子・電気機器用銅合金、電子・電気機器用銅合金板条材、電子・電気機器用部品、端子、バスバー、及び、リレー用可動片 |
JP6226097B2 (ja) * | 2016-03-30 | 2017-11-08 | 三菱マテリアル株式会社 | 電子・電気機器用銅合金、電子・電気機器用銅合金板条材、電子・電気機器用部品、端子、バスバー、及び、リレー用可動片 |
JP6780187B2 (ja) | 2018-03-30 | 2020-11-04 | 三菱マテリアル株式会社 | 電子・電気機器用銅合金、電子・電気機器用銅合金板条材、電子・電気機器用部品、端子、及び、バスバー |
MX2020009869A (es) | 2018-03-30 | 2020-10-12 | Mitsubishi Materials Corp | Aleacion de cobre para dispositivo electronico/electrico, material en lamina/tira de aleacion de cobre para dispositivo electronico/electrico, componente para dispositivo electronico/electrico, terminal, y barra colectora. |
WO2022004791A1 (ja) * | 2020-06-30 | 2022-01-06 | 三菱マテリアル株式会社 | 銅合金、銅合金塑性加工材、電子・電気機器用部品、端子、バスバー、リードフレーム、放熱基板 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62227051A (ja) * | 1986-03-28 | 1987-10-06 | Mitsubishi Shindo Kk | Cu合金製電気機器用コネクタ |
JPS63203738A (ja) * | 1987-02-18 | 1988-08-23 | Mitsubishi Shindo Kk | Cu合金製電気機器用リレー材 |
JPH01180930A (ja) * | 1988-01-12 | 1989-07-18 | Mitsubishi Shindo Kk | 電子電気機器のCu合金製コネクタ材 |
JPH01309219A (ja) * | 1989-04-04 | 1989-12-13 | Mitsubishi Shindoh Co Ltd | Cu合金製電気機器用端子 |
JPH0582203A (ja) * | 1991-09-20 | 1993-04-02 | Mitsubishi Shindoh Co Ltd | Cu合金製電気ソケツト構造部品 |
JPH06340938A (ja) * | 1992-02-10 | 1994-12-13 | Mitsubishi Shindoh Co Ltd | スタンピング金型を摩耗させることの少ない伸銅合金条材およびその製造法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3796784B2 (ja) | 1995-12-01 | 2006-07-12 | 三菱伸銅株式会社 | コネクタ製造用銅合金薄板およびその薄板で製造したコネクタ |
JP4087307B2 (ja) * | 2003-07-09 | 2008-05-21 | 日鉱金属株式会社 | 延性に優れた高力高導電性銅合金 |
JP5260992B2 (ja) * | 2008-03-19 | 2013-08-14 | Dowaメタルテック株式会社 | 銅合金板材およびその製造方法 |
JP4516154B1 (ja) * | 2009-12-23 | 2010-08-04 | 三菱伸銅株式会社 | Cu−Mg−P系銅合金条材及びその製造方法 |
-
2010
- 2010-02-24 JP JP2010038516A patent/JP4563508B1/ja active Active
- 2010-12-17 WO PCT/JP2010/072808 patent/WO2011104982A1/ja active Application Filing
- 2010-12-17 KR KR1020127023850A patent/KR101724561B1/ko active IP Right Grant
- 2010-12-17 CN CN201080063568.8A patent/CN102753712B/zh active Active
- 2010-12-21 TW TW099144991A patent/TWI480394B/zh active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62227051A (ja) * | 1986-03-28 | 1987-10-06 | Mitsubishi Shindo Kk | Cu合金製電気機器用コネクタ |
JPS63203738A (ja) * | 1987-02-18 | 1988-08-23 | Mitsubishi Shindo Kk | Cu合金製電気機器用リレー材 |
JPH01180930A (ja) * | 1988-01-12 | 1989-07-18 | Mitsubishi Shindo Kk | 電子電気機器のCu合金製コネクタ材 |
JPH01309219A (ja) * | 1989-04-04 | 1989-12-13 | Mitsubishi Shindoh Co Ltd | Cu合金製電気機器用端子 |
JPH0582203A (ja) * | 1991-09-20 | 1993-04-02 | Mitsubishi Shindoh Co Ltd | Cu合金製電気ソケツト構造部品 |
JPH06340938A (ja) * | 1992-02-10 | 1994-12-13 | Mitsubishi Shindoh Co Ltd | スタンピング金型を摩耗させることの少ない伸銅合金条材およびその製造法 |
Non-Patent Citations (1)
Title |
---|
YOSHIHIRO KAMEYAMA ET AL.: "Cu-Mg-P-kei Gokin no Saishu Teion Shodon Kotei ni Okeru Bane Tokusei no Kaizen", DO OYOBI DO GOKIN GIJUTSU KENKYUKAI DAI 49 KAI KOEN TAIKAI GAIYOSHU, 11 November 2009 (2009-11-11), pages 145 - 146 * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10032536B2 (en) | 2010-05-14 | 2018-07-24 | Mitsubishi Materials Corporation | Copper alloy for electronic device, method for producing copper alloy for electronic device, and copper alloy rolled material for electronic device |
US10056165B2 (en) | 2010-05-14 | 2018-08-21 | Mitsubishi Materials Corporation | Copper alloy for electronic device, method for producing copper alloy for electronic device, and copper alloy rolled material for electronic device |
US9587299B2 (en) | 2011-10-28 | 2017-03-07 | Mitsubishi Materials Corporation | Copper alloy for electronic equipment, method for producing copper alloy for electronic equipment, rolled copper alloy material for electronic equipment, and part for electronic equipment |
WO2013069687A1 (ja) * | 2011-11-07 | 2013-05-16 | 三菱マテリアル株式会社 | 電子機器用銅合金、電子機器用銅合金の製造方法、電子機器用銅合金塑性加工材及び電子機器用部品 |
CN103842531A (zh) * | 2011-11-07 | 2014-06-04 | 三菱综合材料株式会社 | 电子设备用铜合金、电子设备用铜合金的制造方法、电子设备用铜合金塑性加工材料及电子设备用组件 |
US10153063B2 (en) | 2011-11-07 | 2018-12-11 | Mitsubishi Materials Corporation | Copper alloy for electronic devices, method of manufacturing copper alloy for electronic devices, copper alloy plastic working material for electronic devices, and component for electronic devices |
US10458003B2 (en) | 2011-11-14 | 2019-10-29 | Mitsubishi Materials Corporation | Copper alloy and copper alloy forming material |
Also Published As
Publication number | Publication date |
---|---|
CN102753712A (zh) | 2012-10-24 |
KR101724561B1 (ko) | 2017-04-07 |
JP2011174127A (ja) | 2011-09-08 |
JP4563508B1 (ja) | 2010-10-13 |
TW201132768A (en) | 2011-10-01 |
KR20120121402A (ko) | 2012-11-05 |
TWI480394B (zh) | 2015-04-11 |
CN102753712B (zh) | 2014-07-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4516154B1 (ja) | Cu−Mg−P系銅合金条材及びその製造方法 | |
JP4563508B1 (ja) | Cu−Mg−P系銅合金条材及びその製造方法 | |
JP5054160B2 (ja) | Cu−Mg−P系銅合金条材及びその製造方法 | |
JP4655834B2 (ja) | 電気部品用銅合金材とその製造方法 | |
JP5320642B2 (ja) | 銅合金の製造方法及び銅合金 | |
JP4830048B1 (ja) | 深絞り加工性に優れたCu−Ni−Si系銅合金板及びその製造方法 | |
JP5466879B2 (ja) | 銅合金板材およびその製造方法 | |
JP2004149874A (ja) | 易加工高力高導電性銅合金 | |
JP6749121B2 (ja) | 強度及び導電性に優れる銅合金板 | |
JP2010031379A (ja) | 曲げ加工性に優れた銅合金板からなる電子部品 | |
JP4556841B2 (ja) | 曲げ加工性に優れる高強度銅合金材およびその製造方法 | |
JP6927844B2 (ja) | 銅合金板材およびその製造方法 | |
JP2006200042A (ja) | 曲げ加工性に優れた銅合金板からなる電子部品 | |
JP4020881B2 (ja) | Cu−Ni−Si−Mg系銅合金条 | |
WO2012160726A1 (ja) | 深絞り加工性に優れたCu-Ni-Si系銅合金板及びその製造方法 | |
JP2016141878A (ja) | 銅合金条およびそれを備える大電流用電子部品及び放熱用電子部品 | |
JP5180283B2 (ja) | 曲げ加工後の耐疲労特性及びばね特性に優れたCu−Ni−Si系銅合金板及びその製造方法 | |
TWI529255B (zh) | Cu-Ni-Si合金及其製造方法 | |
JP2020143376A (ja) | 強度及び導電性に優れる銅合金板 | |
JP2010209379A (ja) | 端子・コネクタ用銅合金材及びその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 201080063568.8 Country of ref document: CN |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 10846645 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
ENP | Entry into the national phase |
Ref document number: 20127023850 Country of ref document: KR Kind code of ref document: A |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 10846645 Country of ref document: EP Kind code of ref document: A1 |