WO2011071142A1 - A/d変換装置とその補正制御方法 - Google Patents
A/d変換装置とその補正制御方法 Download PDFInfo
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- WO2011071142A1 WO2011071142A1 PCT/JP2010/072214 JP2010072214W WO2011071142A1 WO 2011071142 A1 WO2011071142 A1 WO 2011071142A1 JP 2010072214 W JP2010072214 W JP 2010072214W WO 2011071142 A1 WO2011071142 A1 WO 2011071142A1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0624—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by synchronisation
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
- H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing
Definitions
- the present invention is based on the priority claim of Japanese patent application: Japanese Patent Application No. 2009-281887 (filed on Dec. 11, 2009), the entire description of which is incorporated herein by reference. Shall.
- the present invention relates to an A / D conversion device that converts an analog signal into a digital signal, and more particularly, a time interleaved A / D conversion device that performs analog-digital conversion by operating a plurality of A / D conversion circuits in parallel, and correction thereof. It relates to a control method.
- a / D converters that convert analog signals to digital signals.
- a plurality of A / D conversion circuits (also referred to as “sub-A / D conversion circuits”) are operated cyclically in a predetermined order.
- a time-interleaved A / D converter that realizes high-speed sampling equivalently as a whole of a plurality of sub-A / D converter circuits is used.
- each sub-A / D conversion circuit has a timing (phase) of 1 / (fs) [sec] at a sampling frequency of fs / M [Hz].
- the parallel number (M) times can be increased with respect to the sampling frequency (fs / M [Hz]) of each sub-A / D conversion circuit.
- an A / D conversion apparatus that performs processing by a plurality of sub-A / D conversion circuits has gain (gain) between each sub-A / D conversion circuit and error components (variation) such as offset and frequency characteristics. ) Increases noise and distortion, and degrades the conversion accuracy of the entire A / D converter. For this reason, calibration that corrects each sub-A / D conversion circuit to make the characteristics uniform is important so that the characteristics between the parallel low-speed sub-A / D conversion circuits become uniform.
- Patent Document 2 discloses a high-speed, low-resolution A that operates at the same speed as an equivalent sampling speed obtained during time interleaving, apart from an A / D converter (low-speed, high-resolution A / D converter) that performs time-interleaved operation.
- Parallel A / D equipped with an A / D converter using the output of a high-speed, low-resolution A / D converter as a teacher signal as a conversion error conversion reference, calculating a correction control signal by adaptive signal processing, and performing a time interleave operation A configuration for correcting the output value of the conversion circuit is disclosed.
- M first A / D converters ADC0 to ADC (M ⁇ 1) (low-speed / high-resolution A / D converters) having a sampling rate FS [Hz] and a resolution K1 [bit]
- M A first A / D converter having a FS [Hz] and a second A / D converter ADC (M) (high-speed, low-resolution A / D converter) having a resolution K2 ⁇ K1 [bit]
- ADC0 to ADC (M-1) are connected to analog input terminals in common, and the timing (phase) is A / D by M phase clocks CLK0 to CLK (M-1) delayed by 1 / FS / M [sec], respectively.
- the digital signals SIG0 to SIG (M ⁇ 1) obtained by the conversion are cyclically multiplexed in synchronization with the clock of M ⁇ FS [Hz], the sampling speed M ⁇ FS [Hz], and the resolution K1 [bit] ] Digital signal x [n] .
- a vector signal Xv [n] (x [n], x [n-1],..., x [x] having N signals obtained by delaying x [n] by 0, 1,.
- the second A / D converter ADC (M) is connected so that the input terminals of the first A / D converters ADC0 to ADC
- Residual signal e [n] d [n] ⁇ y [n] between the output signal y [n] and the teacher signal d [n]
- the product of the residual signal e [n] multiplied by the gain vector Kv [n] is added to the current weight vector Wv [n] to obtain a weight vector Wv [n + M] after M samples.
- Wv [n + M] Wv [n] + Kv [n] ⁇ e [n] (3)
- This gain vector Kv [n] is based on the vector signal Xv [n] and is adapted to minimize the mean square value of the residual signal e [n] (in addition to LMS (Least Mean Square)).
- LMS Least Mean Square
- a DC offset, a conversion gain error, a sampling timing error, a frequency characteristic, etc. which are generated using an RLS (Recursive Least Square) algorithm or the like, and have ADC0 to ADC (M-1) are corrected.
- Patent Documents 1 and 2 are incorporated herein by reference. Below, the analysis of the related art based on the examination result of this inventor is given.
- calibration is performed by generating a sine wave as a training signal for calibration.
- it corresponds to a case where circuit characteristics change due to power supply fluctuation, use temperature change, aging change, etc.
- it is necessary to temporarily stop normal A / D conversion processing and provide a period for calibration.
- an A / D conversion apparatus that performs calibration by stopping a normal A / D conversion operation is not suitable for an apparatus that needs to ensure accuracy continuously such as a communication device. . That is, when the A / D conversion device is used for a communication device or the like, it is necessary to implement a means for adaptively calibrating in the background without stopping the original A / D conversion operation.
- Patent Document 2 requires a high-speed A / D conversion circuit (but low resolution) that performs a conversion operation at the same speed as the equivalent sampling speed FS obtained by time interleaving.
- the time interleaving method is adopted because the desired high speed cannot be realized with a single A / D conversion circuit. Therefore, it is often difficult to realize a high-speed A / D conversion circuit that performs a conversion operation at the same speed as the equivalent sampling speed FS obtained by time interleaving.
- an object of the present invention is to provide an A / D conversion apparatus and method which can cope with high speed and does not require operation stop at the time of calibration.
- the present invention also provides an A / D conversion apparatus and method that suppresses an increase in circuit scale and power consumption in achieving the above object.
- the analog input signal is converted into a digital signal in response to M-phase sampling signals that are connected in parallel and divided by M and spaced apart from each other by one cycle of the clock signal.
- a / D conversion circuit (sub-A / D conversion circuit) of 1st to Mth (where M is a predetermined integer of 2 or more);
- a reference A / D conversion circuit for converting an analog input signal into a digital signal in response to a sampling signal (n is a predetermined positive integer) obtained by dividing the clock signal by (n ⁇ M + 1);
- the first to Mth A / D conversion circuits and the reference A / D conversion circuit are connected in common with analog inputs, With respect to the first to Mth A / D conversion circuits, the digital signal from the A / D conversion circuit and the reference signal in a predetermined order at a cycle of (n ⁇ M + 1) cycles of the clock signal
- a control unit that compares the digital signal from the A / D conversion circuit, generates a correction control signal based on the
- first to Mth A / D conversion circuits connected in parallel are configured to divide a clock signal by M and mutually transmit one cycle of the clock signal.
- a correction control method for a time-interleaved A / D converter that converts an analog input signal into a digital signal in response to respective M-phase sampling signals spaced apart at equal intervals, A first to M-th (where M is a predetermined positive integer) A / D conversion circuit and a reference A / D conversion circuit in which an analog input is commonly connected;
- the reference A / D conversion circuit converts an analog input signal into a digital signal in response to a sampling signal (n is a predetermined positive integer) obtained by dividing the clock signal by (n ⁇ M + 1),
- the present invention it is possible to provide an A / D conversion apparatus and method that can cope with speeding up and do not need to be stopped for calibration.
- FIG. 1 It is a figure which shows the structure of one Embodiment of this invention.
- 3 is a timing chart for explaining the operation of FIG. 1.
- the A / D converter includes M-phase sampling signals connected in parallel, divided by M and spaced apart from each other by one cycle of the clock signal (although not particularly limited).
- M 4
- M 4
- M 4
- M 4
- M 4
- M 4
- a sampling signal obtained by dividing the clock signal by (n ⁇ M + 1) (where n is a predetermined positive integer) (CLK5 in FIG. 1).
- a reference A / D conversion circuit (5) for converting an analog input signal into a digital signal.
- the first to Mth A / D conversion circuits (1 to 4) and the reference A / D conversion circuit (5) are connected in common with analog inputs.
- the A / D conversion circuits (1 to 4) are arranged in a predetermined order at a cycle of (n ⁇ M + 1) cycles of the clock signal. )
- a digital signal from the reference A / D conversion circuit (5) a correction control signal is generated based on the comparison result, and the correction control signal is converted into the A / D conversion circuit.
- the reference numbers in parentheses are merely examples of correspondence with the drawings of the embodiments in order to assist the understanding of the present invention, and should not be construed as limiting the present invention. Of course. The same applies to the following.
- first to Mth control units (9 to 12 in FIG. 3) are provided corresponding to the first to Mth A / D conversion circuits (1 to 4), respectively. It is good also as a structure.
- each of the first to Mth control units (9 to 12 in FIG. 3) includes the first to Mth A / D conversion circuits (1 to 4).
- a digital signal output from the A / D conversion circuit corresponding to each control unit and a digital signal output from the reference A / D conversion circuit (5) at a cycle of (n ⁇ M + 1) cycles of the clock signal Are compared with the period of M ⁇ (n ⁇ M + 1) cycles of the clock signal.
- control unit (13 in FIG. 5) inputs the first to M-th digital signals output from the first to M-th A / D conversion circuits in parallel, respectively. It is good also as composition to do.
- control unit includes a digital signal output from one A / D conversion circuit among the first to Mth A / D conversion circuits (1 to 4);
- the period in which the comparison with the digital signal output from the reference A / D conversion circuit (5) is enabled may be a maximum of M cycles of the clock signal.
- M clock cycles of the clock signal (CLK) are separated from the first to Mth A / D conversion circuits (1 to 4) by one cycle of the clock signal.
- a multiplexing circuit (14 in FIG. 7) is provided which cyclically selects and outputs the first to Mth digital signals output in each cycle in the cycle of the clock signal.
- the control unit (15 in FIG. 7) includes a digital signal that is sequentially switched and output in the cycle of the clock signal (CLK) from the multiplexing circuit (14 in FIG. 7), and the reference A / D conversion circuit (5).
- a predetermined first cycle for example, the first cycle of (n ⁇ M + 1) cycles of the clock signal
- the clock signal may be compared at a cycle of (n ⁇ M + 1) cycles.
- control unit includes a digital signal output from each of the A / D conversion circuits (1 to 4) of the first to Mth A / D conversion circuits, and the reference A
- the correction control signal is generated so that the difference from the digital signal output from the / D conversion circuit (5) is minimized.
- a plurality of A / D conversion circuits are cyclically operated in a predetermined order to perform analog-to-digital conversion and perform time-interleaved A / D conversion.
- the reference A / D for each sub-A / D conversion circuit has the same or lower performance in both resolution and sampling speed.
- the sampling frequency of the time-interleaved A / D converter circuit is fs [Hz] and the number of interleaves (the number of parallel sub-A / D converter circuits) is M
- the sampling frequency (conversion frequency) includes a reference A / D conversion circuit of fs / (n ⁇ M + 1) (where n is a predetermined positive integer), and further includes an output of the reference A / D conversion circuit and each sub-A / D conversion.
- a control unit is provided that outputs a correction control signal based on the comparison result with the output between circuits. Based on the correction control signal (correction coefficient) from the control unit, each sub-A / D conversion circuit is corrected (the offset, gain, etc.
- correction is performed by hardware), or the output (digital output signal) of each sub-A / D conversion circuit is corrected based on a correction control signal (correction coefficient).
- FIG. 1 is a diagram showing a configuration of an embodiment of the present invention.
- FIG. 1 shows the configuration of a time interleave type A / D converter.
- FIG. 1 for simplification of description, an example of application to an A / D conversion apparatus that realizes a sampling frequency fs [Hz] with an interleave number (the number of parallel sub-A / D conversion circuits) M being 4 is shown. Indicates.
- the parallel number (interleave number) M of the sub-A / D conversion circuit is not limited to four.
- the A / D conversion apparatus of the present embodiment is 4 parallel sub-A / D conversion circuits (ADC) 1 to 4 having analog inputs connected in common to input terminals of analog input data signals; a digital signal processing unit 6 for processing the outputs of the sub-A / D conversion circuits (ADC) 1 to 4; A reference A / D conversion circuit (ADC) 5; A clock generator (CLK generator) that generates and distributes sampling clock signals CLK1 to CLK4 and CLK5 to the sub-A / D converter circuits (ADC) 1 to 4 and the reference A / D converter circuit (ADC) 5.
- ADC sub-A / D conversion circuits
- the four parallel sub-A / D conversion circuits (ADC) 1 to 4 have the same configuration, and are each (1/4) ⁇ (1 / (fs / 4)) [sec] at a frequency fs / 4 [Hz].
- the sub-A / D conversion circuits (ADC) 1 to 4 may be flash (all parallel) type A / D conversion circuits in which a plurality of comparators are connected in parallel, or a successive approximation type A / D conversion circuit. It may be a D conversion circuit or the like.
- the analog input data signal is also input to the reference A / D conversion circuit (ADC) 5.
- the resolution of the reference A / D conversion circuit (ADC) 5 is equal to or less than the resolution of the sub-A / D conversion circuits (ADC) 1 to 4.
- the clock generation unit 7 is a four-phase clock CLK1 to CLK4 (frequency is fs / 4, which is divided by 1 / fs [sec] from each other at equal intervals), by dividing the clock signal CLK of frequency fs by 4.
- a clock signal CLK5 divided by 5 is generated by dividing the clock signal CLK by (4 ⁇ n + 1).
- the phase of the rising edge of the divided-by-5 clock signal CLK5 is the same as that of CLK1.
- the control unit 8 performs adaptive control so that the difference between the two outputs of the reference A / D conversion circuit (ADC) 5 and the sub-A / D conversion circuit (ADC) to be compared is minimized.
- the correction control signals are supplied to the sub-A / D conversion circuits (ADC) 1 to 4.
- the control unit 8 compares the two output signals of the reference A / D conversion circuit (ADC) 5 and the sub-A / D conversion circuit (ADC) with each other, and the sub ⁇ by adaptive processing based on the comparison result.
- Each of the sub-A / D conversion circuits (ADC) 1 to 4 performs at least one of DC offset adjustment, gain (gain) adjustment, sampling phase adjustment, and the like using the correction control signal from the control unit 8.
- Each of the sub-A / D conversion circuits (ADC) 1 to 4 uses a correction control signal (digital signal), a D / A converter (not shown), and a DC offset of the sub-A / D conversion circuit, You may make it calibrate the parameter (for example, reference voltage at the time of a full scale) which prescribes
- each of the sub-A / D conversion circuits (ADC) 1 to 4 may correct the A / D converted digital signal.
- LMS mean square value
- the weight vector Wv [n] is used as a correction control signal (correction coefficient) supplied from the control unit 8 to each of the sub-A / D conversion circuits (ADC) 1 to 4, and each sub ⁇
- the filter characteristics are adjusted by the output digital signals of the A / D conversion circuits (ADC) 1 to 4 and the weighting coefficient that is subjected to the inner product operation (convolution operation), and the offset, gain, and output of each sub-A / D conversion circuit, The frequency characteristic is adjusted.
- the sub-A / D conversion circuits (ADC) 1 to 4 are sub-A / D so that the error between the output of the reference A / D conversion circuit (ADC) 5 and the output of the reference A / D conversion circuit (ADC) 5 is minimized.
- the adjustment of the characteristics of the conversion circuits (ADC) 1 to 4 is repeated in the background while each of the sub-A / D conversion circuits (ADC) 1 to 4 is operating, so that the sub-A / D conversion circuit (ADC) Even when the characteristics 1 to 4 vary, uniform characteristics can be obtained among the sub-A / D conversion circuits (ADC) 1 to 4.
- the reference A / D conversion circuit (ADC) 5 may have a resolution equal to or lower than that of the sub-A / D conversion circuits (ADC) 1 to 4.
- the sampling speed (A / D conversion speed) of the reference A / D conversion circuit (ADC) 5 is reduced to 4 / (4 ⁇ n + 1) of the sub-A / D conversion circuits (ADC) 1 to 4 It's okay. For this reason, according to this embodiment, simplification of circuit design is realized, and the increase in circuit area and power consumption can be reduced.
- FIG. 2 is a time chart for explaining the operation of the embodiment shown in FIG. FIG. 2A shows an effective operation of the time interleaved A / D converter of FIG. 1, and the sampling frequency is fs [Hz]. That is, FIG. 2A shows a digital signal sequence obtained by analog-digital conversion of an analog input data signal at a sampling frequency fs [Hz] (the analog input data signal is substantially sampled at a sampling frequency fs. It is obtained by cyclically selecting (multiplexing) the outputs (digital signals) of the sub-A / D conversion circuits (ADC) 1 to 4 (corresponding to time-discrete analog signals) that perform time interleaving operation at the frequency fs.
- ADC sub-A / D conversion circuits
- each of the sub-A / D conversion circuits (ADC) 1 to 4 represents a digital signal series obtained by analog-digital conversion of an analog input data signal at a conversion frequency fs / 4.
- the ADC 2 outputs analog / digital conversion results 2A, 2B, 2C, 2D,... In a cycle of 4 / fs in response to the clock CLK2 (frequency fs / 4, phase is delayed by 90 degrees with respect to CLK1).
- the ADC 3 outputs the analog-digital conversion results 3A, 3B, 3C, 3D,... In a cycle of 4 / fs in response to the clock CLK3 (frequency fs / 4, phase is delayed by 180 degrees with respect to CLK1).
- the ADC 4 outputs analog / digital conversion results 4A, 4B, 4C, 4D,...
- each of the ADCs 1 to 4 holds the analog-digital conversion result for 4 / fs.
- the outputs (b) to (e) of the sub-A / D conversion circuits (ADC) 1 to 4 are cyclically output at the frequency fs (in FIG. 2, ADC1, ADC2, ADC3, ADC4, ADC1, ADC2, ADC3, ADC4). ,...)) And obtained by selecting (multiplexing).
- (F) is a reference A / D conversion circuit for sampling at a frequency fs / 5 [Hz] where n is “1” at a frequency fs / (4 ⁇ n + 1) (fs is divided by (4 ⁇ n + 1)).
- the output of (ADC) 5 is shown schematically.
- Output is a reference A / D conversion circuit for sampling at a frequency fs / 5 [Hz] where n is “1” at a frequency fs / (4 ⁇ n + 1) (fs is divided by (4 ⁇ n + 1)).
- the output of (ADC) 5 is shown schematically.
- the ADC 5 performs analog-to-digital conversion of the
- the ADC 5 is a sample value series of 1A, 2A, 3A, 4A, 1B, 2B, 3B, 4B, 1C, 2C, 3C, 4C, 1D, 2D, 3D, 4D,.
- the values 1A, 2B, 3C, 4D,... For every 5 samples are output to the control unit 8.
- the ADC 5 is shown as holding an analog-digital conversion result for a period of 5 / fs.
- the period of the comparison process in the control unit 8 may be as low as 5 / fs [sec].
- ON (High) in (g) corresponds to comparison ON (comparison enable), and OFF (LOW) corresponds to comparison OFF (comparison disabled).
- OFF (LOW) corresponds to comparison OFF (comparison disabled).
- each double-ended arrow solid line between (f) and (b) to (f) and (e) is The control unit 8 compares the output “1A” of the ADC 5 of (f) from the first cycle with the output “1A” of the ADC 1 of (b).
- FIG. 6 schematically shows how the control unit 8 sequentially performs (corresponding relationship).
- the control unit 8 receives the clock signal CLK having the frequency fs and the frequency-divided clock CLK5 from the clock generation unit 7, and for example, for four cycles of CLK from the rise of the frequency-divided clock CLK5 from Low to High for the reference A
- the output (teacher signal) of the / D conversion circuit (ADC) 5 is compared with the output of one ADC of the sub-A / D conversion circuits (ADC) 1 to 4, and the comparison is OFF at the fifth cycle of CLK. Control.
- each sub-A / D conversion circuit (ADC) 1 to 4 outputs the same data during the 4 cycle period of CLK (4 / fs [sec]), but in the 5th cycle of CLK, A / D conversion for reference which outputs an analog-digital conversion result of the next analog input data signal and outputs the same digital signal (analog-digital conversion result) during one cycle 5 / fs of CLK5 (5 cycles of CLK) This is because it is different from the output (teacher signal) of the circuit (ADC) 5. For example, after outputting “1A” of 4 cycle periods (4 / fs [sec]) of CLK (frequency fs) at the output of the sub-A / D conversion circuit (ADC) 1 in FIG.
- the outputs of the sub-A / D conversion circuits (ADC) 1 to 4 are sequentially compared. That is, the period of the comparison process in the control unit 8 may be as low as 9 / fs [sec]. In (i), ON (High) corresponds to comparison ON, and OFF (LOW) corresponds to comparison OFF. Of the period 9 / fs (period of CLK9 cycle), the first four cycles are compared, and the latter five cycles are compared OFF.
- control unit 8 uses, for example, the rising edge of the clock signal CLK5 to output a corresponding output among the outputs of the sub-A / D conversion circuits (ADC) 1 to 4 every 9 cycles of CLK of the frequency fs.
- a configuration may be adopted in which the output of the sub-A / D conversion circuit (ADC) latched internally and the output of the reference A / D conversion circuit (ADC) 5 are compared.
- the sub-A / D conversion circuit (ADC) 1 is analog from the first cycle in the 4 / fs cycle (four cycles of CLK of the frequency fs).
- the digital conversion result 1A is output, and the output 1A is held for 4 cycles.
- the sub-A / D conversion circuit (ADC) 1 does not output the first cycle of the CLK of the frequency fs, but outputs the analog-digital conversion result 1A from the second cycle, followed by two cycles of three and four cycles.
- the output 1A may be held (in this case, the first cycle of the output 1A in FIG. 2B is the second cycle after the start of conversion).
- the reference A / D converter circuit (ADC) 5 does not output the analog-digital conversion result in the first cycle in the 5 / fs cycle (5 cycles of CLK of frequency fs), and the analog-digital from the second cycle.
- the conversion result 1A may be output, and the output 1A may be held for the following three cycles of 3, 4, and 5.
- the comparison ON period is 3 cycles output from the sub-A / D conversion circuit (ADC) among the 5 cycles of the CLK of the frequency fs, and the comparison is OFF during the remaining 2 cycles. .
- the sub-A / D conversion circuit (ADC) 1 does not output the first and second cycles of the CLK of the frequency fs in the conversion period of the 4 / fs cycle (four cycles of the CLK of the frequency fs).
- the analog-digital conversion result 1A may be output from the cycle, and 1A may be held in the subsequent fourth cycle (in this case, the first cycle of the output of 1A in FIG. Cycle).
- the reference A / D conversion circuit (ADC) 5 does not output the analog-digital conversion result in the first and second cycles in the 5 / fs cycle (five cycles of CLK of the frequency fs).
- the analog-digital conversion result 1A may be output from the eye, and the output 1A may be held for three cycles of 3, 4, and 5 following.
- the comparison ON period is two cycles of the period output from the sub-A / D conversion circuit (ADC) out of the five cycles of the CLK of the frequency fs, and the remaining period (three cycles) is the comparison. It becomes OFF.
- the reference A / D conversion circuit (ADC) 5 At the sampling frequency (analog / digital conversion operating frequency) fs / (4 ⁇ n + 1) of the reference A / D conversion circuit (ADC) 5, as the value of n is increased, the reference A / D conversion circuit (ADC) 5 The analog-to-digital conversion operation is slow, and the comparison processing cycle may be low. In this case, however, the time required for calibration becomes longer.
- the sub-A / D conversion circuits ADC1 to ADC4 are suitably applied to a communication apparatus using the main signal A / D conversion circuit.
- FIG. 1 the embodiment shown in FIG. 1 will be described according to some embodiments.
- an example of application to an A / D converter that realizes the sampling frequency fs [Hz] with the number of interleaves (the number of parallel sub-A / D converter circuits) M being 4 will be described for the sake of explanation.
- the interleaving number M is not limited to four.
- FIG. 3 is a diagram showing a configuration of the first exemplary embodiment of the present invention.
- the present embodiment includes controllers 9 to 12 corresponding to ADC1 to ADC4 as the configuration of the controller 8 of FIG.
- the control units 9 to 12 commonly input the output of the ADC 5, input the outputs of the sub-A / D conversion circuits (ADC) 1 to 4, respectively, and compare the output with the output of the ADC 5, and the correction control signal is sub- Output to the A / D conversion circuits (ADC) 1 to 4, respectively.
- the A / D conversion apparatus includes four parallel interleaved sub-A / D conversion circuits (ADC) 1 to 4 and digital signal processing for processing their outputs.
- Unit 6 a reference A / D conversion circuit (ADC) 5, a sub-A / D conversion circuit (ADC) 1 to 4, and a clock for distributing a sampling clock signal to the reference A / D conversion circuit (ADC) 5
- the output of the generation unit 7, sub-A / D conversion circuits (ADC) 1 to 4 and reference A / D conversion circuit (ADC) 5 is compared and corrected to sub-A / D conversion circuits (ADC) 1 to 4
- Control units 9 to 12 for outputting control signals are provided.
- ADC 1 to 4 are four-phase clock signals in which the timing (phase) is shifted by 1 / fs [sec] at fs / 4 [Hz], as in FIG.
- CLK1 to CLK4 the analog input data signal input in common is sampled and converted into a digital signal.
- the analog input data signal is also input to the reference A / D conversion circuit (ADC) 5 in common.
- the control units 9 to 12 use the output signal of the reference A / D conversion circuit (ADC) 5 as a teacher signal and compare it with the outputs of the sub-A / D conversion circuits (ADC) 1 to 4, respectively, and the difference is minimized.
- correction control signals are supplied to the sub-A / D conversion circuits (ADC) 1 to 4, respectively.
- DC offset adjustment, gain adjustment, sampling phase adjustment, etc. are performed in each of the sub-A / D conversion circuits (ADC) 1 to 4.
- the correction control signal is generated in the background based on the outputs of the reference A / D conversion circuit (ADC) 5 and the sub-A / D conversion circuits (ADC) 1 to 4, and each sub-A / D conversion is performed.
- the reference A / D conversion circuit (ADC) 5 may have a resolution equal to or lower than that of the main signal system sub-A / D conversion circuits (ADC) 1 to 4, and the sampling speed is 4 / (4 ⁇ n + 1). To slow down.
- FIG. 4 is a timing chart for explaining the operation of the embodiment shown in FIG.
- FIG. 4A shows an effective operation of the time interleave type A / D converter, and the sampling frequency is fs [Hz] (fs is the frequency of the clock CLK).
- B) to (e) show 4-parallel time interleaving processing at fs / 4 [Hz] of the sub-A / D conversion circuits (ADC) 1 to 4.
- FIG. 4 are diagrams showing comparison timings in the control units 9 to 12 in FIG.
- the control timing signals shown in (g) to (j) of FIG. 4 may be generated from the CLK and the (4 ⁇ n + 1) frequency-divided clock CLK5 in the control units 9 to 12, respectively, or FIG.
- the output CLK5 is divided by 4, 5 / fs phase is shifted from each other, and a high multiphase clock is generated by 4 / fs, and the control enable signals are sent to the control units 9 to 12 as respective comparison enable signals. It is good also as a structure to give.
- the input of CLK and CLK5 to the control units 9 to 11 is omitted for simplification of the drawing.
- the control unit 9 in FIG. 3 outputs 1A and 1F of outputs (1A,... 1F,...) Of the sub-A / D conversion circuit (ADC) 1 in FIG. 1A and 1F of the teacher signals (1A, 2B, 3C, 4D, 1F...) shown in f) are compared at the timing shown in FIG. 4G, and the difference is minimized. A correction control signal is calculated, and the A / D conversion circuit (ADC) 1 is calibrated.
- the control unit 10 in FIG. 3 outputs 2B of the output (2A, 2B,%) Of the sub-A / D conversion circuit (ADC) 2 in FIG. 4C and the teacher signal in FIG. (1A, 2B,...) 2B are compared at the timing shown in FIG. 4 (h), a correction control signal is calculated so as to minimize the difference, and a sub-A / D conversion circuit (ADC) ) 2 is calibrated.
- the sampling frequency of the reference A / D conversion circuit (ADC) 5 may be fs / (4 ⁇ n + 1) [Hz]. As the value of n is increased, the reference A / D conversion circuit (ADC) 5 operates at a low speed, and the period of the comparison process can be shortened. In this case, however, the time required for calibration becomes longer. When calibrating variations in characteristics between sub-A / D conversion circuits that occur due to power supply fluctuations, temperature changes, aging, etc. during system operation, this type of variation is caused by relatively slow fluctuations. Even if the calibration processing speed is low, there is no particular problem.
- FIG. 5 is a diagram showing the configuration of the second exemplary embodiment of the present invention.
- the A / D converter according to the present embodiment includes four parallel interleaved sub-A / D converter circuits (ADC) 1 to 4 and a digital signal processor 6 that processes their outputs.
- ADC sub-A / D converter circuits
- the outputs of the sub-A / D conversion circuits (ADC) 1 to 4 and the reference A / D conversion circuit (ADC) 5 are compared, and a correction control signal is output to the sub-A / D conversion circuits (ADC) 1 to 4.
- a control unit 13 is provided.
- the four parallel sub-A / D conversion circuits (ADC) 1 to 4 are shifted in phase by (1/4) ⁇ (1 / (fs / 4)) [sec] at fs / 4 [Hz].
- the analog input data signal is sampled by the phase clock signals (CLK1 to CLK4) and converted into a digital signal.
- an analog input data signal is further input to a reference A / D conversion circuit (ADC) 5 arranged in parallel.
- the output signal of the reference A / D conversion circuit (ADC) 5 is used as a teacher signal, and the outputs of the sub-A / D conversion circuits (ADC) 1 to 4 are compared in the control unit 13 so that the difference is minimized.
- a correction control signal is supplied to the sub-A / D conversion circuits (ADC) 1 to 4. Using the correction control signal, DC offset adjustment, gain adjustment, sampling phase adjustment and the like provided in each of the sub-A / D conversion circuits (ADC) 1 to 4 are performed. In this way, the sub-A so that the error between the outputs of the sub-A / D conversion circuits (ADC) 1 to 4 and the output of the reference A / D conversion circuit (ADC) 5 is minimized in the background.
- the adjustment of the characteristics of the / D conversion circuits (ADC) 1 to 4 is repeated. As a result of the adjustment, even if the characteristics of the sub-A / D conversion circuits (ADC) 1 to 4 vary, the characteristics of the sub-A / D conversion circuits (ADC) 1 to 4 can be made uniform.
- the reference A / D converter circuit (ADC) 5 may have a resolution equal to or lower than that of the main signal system sub-A / D converter circuits (ADC) 1 to 4, and the sampling speed (conversion speed) is 4 / The speed is reduced to (4 ⁇ n + 1).
- FIG. 6 is a timing chart for explaining the operation of the second embodiment of the present invention.
- 6A to 6E are the same as FIGS. 2A to 2E.
- (F) is a signal sequence obtained by the control unit 13 by sequentially selecting the outputs of the sub-A / D conversion circuits (ADC) 1 to 4 in a cycle of fs / 5.
- (G) is an output of the reference A / D conversion circuit (ADC) 5 that samples at a frequency fs / 5 [Hz], and this is a teacher signal.
- the signal sequence obtained by selecting and outputting the sub-A / D conversion circuits (ADC) 1 to 4 shown in (f) and the teacher signal shown in (g) are compared with the waveform shown in (h).
- the correction control signal (correction coefficient) is calculated so that the difference is minimized, and the correction control signal is supplied to each of the A / D conversion circuits (ADC) 1 to 4 for sub-A / D conversion. Calibrate the circuits (ADC) 1 to 4.
- the comparison timing of (i) is the same as that of (g) in FIG.
- the control unit 13 in FIG. 5 outputs four cycles from the first cycle of the clock CLK (frequency fs), the output 1A from the sub-A / D conversion circuit (ADC) 1. In the fifth cycle, the output 1B from the sub-A / D conversion circuit (ADC) 1 is received. The output of the A / D conversion circuit (ADC) 5 is 1 A from the first cycle to the fourth cycle. Therefore, in the fifth cycle of the clock CLK, the comparison in the control unit 13 is turned off.
- the control unit 13 in FIG. 5 corresponds to the sub-A / D conversion circuit (ADC) 2 for four cycles from the sixth cycle to the ninth cycle of the clock CLK (frequency fs) corresponding to FIG.
- the output 2C from the sub-A / D conversion circuit (ADC) 2 is received.
- the output of the A / D conversion circuit (ADC) 5 is 2B from the sixth cycle to the ninth cycle. Therefore, the comparison in the control unit 13 is turned off at the 10th cycle of the clock CLK.
- the control unit 13 in FIG. 5 corresponds to (d) in FIG. 6, the sub-A / D conversion circuit (ADC) 3 for four cycles from the 11th cycle to the 14th cycle of the clock CLK (frequency fs).
- the output 3C from the sub-A / D conversion circuit (ADC) 3 is received in the 15th cycle.
- the output of the A / D conversion circuit (ADC) 5 is 3C from the 11th cycle to the 14th cycle. Therefore, the comparison in the control unit 13 is turned off at the 15th cycle of the clock CLK.
- the control unit 13 of FIG. 5 corresponds to (e) of FIG. 6, the sub-A / D conversion circuit (ADC) 4 for four cycles from the 16th cycle to the 19th cycle of the clock CLK (frequency fs).
- the output 4D from the sub-A / D conversion circuit (ADC) 4 is received in the 20th cycle.
- the output of the A / D conversion circuit (ADC) 5 is 4D from the 16th cycle to the 19th cycle. Therefore, the comparison in the control unit 13 is turned off at the 20th cycle of the clock CLK.
- the analog-digital conversion frequency of the reference A / D conversion circuit (ADC) 5 may be fs / (4 ⁇ n + 1) [Hz], and the reference A is increased as the value of n is increased.
- the / D conversion circuit is slow.
- the period of the comparison process in the control unit 13 may be low. In this case, although the time required for calibration becomes longer, it is a calibration of characteristic variations between sub-A / D conversion circuits caused by power supply fluctuation, temperature change, aging change, etc. during system operation. Is a relatively slow fluctuation, so there is no problem even if the calibration processing speed is low.
- FIG. 7 is a diagram showing a configuration of the third exemplary embodiment of the present invention.
- a multiplexing circuit multiplexer: MUX
- ADC sub-A / D conversion circuits
- the A / D conversion device includes a digital signal processing unit that performs signal processing on outputs of four parallel interleaved sub-A / D conversion circuits (ADC) 1 to 4 and a multiplexer (MUX) 14. 6 ′, a reference A / D conversion circuit (ADC) 5, a sub-A / D conversion circuit (ADC) 1 to 4, and a clock for distributing the sampling clock signal to the reference A / D conversion circuit (ADC) 5.
- ADC parallel interleaved sub-A / D conversion circuits
- MUX multiplexer
- the output of the generation unit 7, sub-A / D conversion circuits (ADC) 1 to 4 and reference A / D conversion circuit (ADC) 5 is compared and corrected to sub-A / D conversion circuits (ADC) 1 to 4 And a control unit 15 that outputs a control signal.
- four parallel sub-A / D conversion circuits (ADC) 1 to 4 are (1/4) ⁇ (1 / (fs / 4) at fs / 4 [Hz]. ))
- the analog input data signal is sampled by the four-phase clock signals (CLK1 to CLK4) shifted in timing (phase) by [sec] and converted into a digital signal.
- the analog input data signal is also input to the reference A / D conversion circuit (ADC) 5.
- the output signal of the reference A / D conversion circuit (ADC) 5 is used as a teacher signal, and the multiplexed outputs of the sub-A / D conversion circuits (ADC) 1 to 4 are compared in the control unit 15, and the difference is minimized.
- correction control signals (correction coefficients) are given to the sub-A / D conversion circuits (ADC) 1 to 4. Using the correction control signal, DC offset adjustment, gain adjustment, sampling phase adjustment and the like provided in each of the sub-A / D conversion circuits (ADC) 1 to 4 are performed.
- the sub-A so that the error between the outputs of the sub-A / D conversion circuits (ADC) 1 to 4 and the output of the reference A / D conversion circuit (ADC) 5 is minimized in the background.
- the reference A / D conversion circuit (ADC) 5 may have a resolution equal to or lower than that of the main signal system sub-A / D conversion circuits (ADC) 1 to 4, and the sampling speed is 4 / (4 ⁇ n + 1). To slow down.
- FIG. 8 is a timing chart for explaining the operation of the third embodiment of the present invention.
- 8A to 8E are the same as FIGS. 2A to 2E.
- FIG. 8 shows the output of the multiplexer (MUX) 14, and the signal of (a) is converted into a digital signal.
- the multiplexer (MUX) 14 is cyclically switched to the sub-A / D conversion circuit (ADC) 1, 2, 3, 4, 1, 2, 3, 4, 1,... According to the clock CLK having the frequency fs. Output. It is assumed that the characteristic variation among the sub-A / D conversion circuits (ADC) 1 to 4 in (a) is included.
- (G) is an output of the reference A / D conversion circuit (ADC) 5 that samples at a frequency fs / 5 [Hz], and this is a teacher signal.
- (H) is a signal for controlling the comparison between the output of the MUX 14 and the output of the reference A / D conversion circuit (ADC) 5 in the control unit 15, ON being a comparison ON (comparison enable), and OFF being a comparison. Indicates OFF (comparison disabled). Of the period 5 / fs, the period (1 / fs) of the first one cycle is set to comparison ON (comparison enable), and the remaining four cycles (4 / fs) are set to comparison OFF (comparison disabled).
- the control unit 15 in FIG. 7 uses the outputs 1A, 2B, 3C, 4D,... ((F) in FIG. 8) of the MUX 14 in the first 1 / fs period of each cycle of 5 / fs for reference. Compared with the outputs 1A, 2B, 3C, 4D,... Of the A / D conversion circuit (ADC) 5 ((g) in FIG. 8), a correction control signal is calculated so that the difference is minimized, and sub ⁇ A / D converter circuits (ADC) 1 to 4 are calibrated.
- the sampling frequency of the reference A / D conversion circuit (ADC) 5 in FIG. 7 may be fs / (4 ⁇ n + 1) [Hz], and the reference A / D conversion circuit becomes slower as the value of n is increased.
- the operation can be performed and the period of the comparison process may be low.
- the purpose of the present proposal is to calibrate characteristic variations between sub-A / D conversion circuits caused by power supply fluctuation, temperature change, aging change, etc. during system operation. Since such a variation causing factor is a relatively slow fluctuation, there is no problem even if the calibration processing speed is low.
- a plurality of low-speed sub-A / D conversion circuits are sequentially converted into digital signals at different sampling timings to increase the sampling speed equivalently.
- the characteristic error (characteristic variation) between each sub-A / D conversion circuit is adaptively calibrated to reduce the conversion error of the entire A / D conversion device and achieve high accuracy. Is possible.
- the A / D conversion circuit added for the teacher signal only needs to be sampled at a period slower than the sampling period of the sub-A / D conversion circuit, thereby increasing the difficulty of circuit design.
- the A / D converter can be calibrated in the background while suppressing an increase in circuit scale and power consumption.
- the present invention is not limited to the time interleave type A / D conversion device, and the characteristics between the sub-A / D conversion circuits are uniform with respect to all A / D conversion devices including a plurality of sub-A / D conversion circuits. It can be applied as a means for calibrating.
- the calibration procedure in the normal operation of the sub-A / D conversion circuits (ADC 1 to 4) has been described.
- the sub-A / D conversion circuits (ADC) 1 to 4 and Test signal (DC lamp waveform or other converter test waveform or analog test signal such as sine wave or other analog signal) is input to ADC5, which is a reference A / D conversion circuit, from the test signal generator, etc.
- ADC5 is a reference A / D conversion circuit, from the test signal generator, etc.
- ADC5 is a reference A / D conversion circuit, from the test signal generator, etc.
- an application of generating the correction control signal by comparing the output of each of the ADCs 1 to 4 with the output of the ADC 5 may be performed.
- a / D conversion circuit (ADC1 to 4) 5 A / D conversion circuit for reference (ADC5) 6, 6 ′ signal processing unit 7 clock generation unit 8, 9 to 12, 13, 15 control unit 14 multiplexer
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Abstract
Description
本発明は、日本国特許出願:特願2009-281887号(2009年12月11日出願)の優先権主張に基づくものであり、同出願の全記載内容は引用をもって本書に組み込み記載されているものとする。
本発明は、アナログ信号をデジタル信号に変換するA/D変換装置に関し、特に、複数のA/D変換回路を並列動作させてアナログ-デジタル変換するタイムインターリーブ方式のA/D変換装置とその補正制御方法に関する。
y[n]=w(1)x[n] + w(2)x[n-1] + w(3)x[n-2] +… +w(N)x[n-(N-1)] …(1)
あるいは、FIR線形フィルタ演算に定数項w0・x0を加えた非線形フィルタ演算)
y[n]=w0x0 + w(1)x[n] + w(2)x[n-1] + w(3)x[n-2]+… +w(N)x[n-(N-1)] …(2)
によって出力信号y[n]を生成する。そして上記第2のA/D変換器ADC(M)を、上記第1のA/D変換器ADC0~ADC(M-1)と入力端子が共通となるように結線し、教師信号d[n]を得る。
e[n]=d[n]-y[n]
を作り、該残差信号e[n]にゲインベクトルKv[n]を乗じたものを現在の重みベクトルWv[n]に加え,Mサンプル後の重みベクトルWv[n+M]とする。
Wv[n+M] = Wv[n] + Kv[n]×e[n] ・・・(3)
以下に、本発明者の検討結果に基づく関連技術の分析を与える。
前記クロック信号を(n×M+1)分周したサンプリング信号(ただし、nは予め定められた正整数)に応答してアナログ入力信号をデジタル信号に変換する参照用A/D変換回路と、
を備え、前記第1乃至第MのA/D変換回路と前記参照用A/D変換回路は、アナログ入力が共通に接続され、
前記第1乃至第MのA/D変換回路に関して、予め定められた順序で、前記クロック信号の(n×M+1)サイクルの周期で、前記A/D変換回路からのデジタル信号と、前記参照用A/D変換回路からのデジタル信号とを比較し、該比較結果に基づき補正制御信号を生成し、前記補正制御信号を前記A/D変換回路に供給する制御部と、を備えたA/D変換装置が提供される。
前記第1乃至第M(ただし、Mは予め定められた正整数)のA/D変換回路とアナログ入力が共通接続された参照用A/D変換回路を設け、
前記参照用A/D変換回路では、前記クロック信号を(n×M+1)分周したサンプリング信号(ただし、nは予め定められた正整数)に応答してアナログ入力信号をデジタル信号に変換し、
制御部にて、前記第1乃至第MのA/D変換回路に関して、予め定められた順序で、前記クロック信号の(n×M+1)サイクルの周期で、前記A/D変換回路からのデジタル信号と、前記参照用A/D変換回路からのデジタル信号とを比較し、該比較結果に基づき補正制御信号を生成し、前記補正制御信号を前記A/D変換回路に供給する、A/D変換装置の補正制御方法が提供される。
アナログ入力データ信号の入力端子にアナログ入力が共通に接続された4並列のsub-A/D変換回路(ADC)1~4と、
sub-A/D変換回路(ADC)1~4の出力を処理するデジタル信号処理部6と、
参照用A/D変換回路(ADC)5と、
sub-A/D変換回路(ADC)1~4と、参照用A/D変換回路(ADC)5に対して、サンプリングクロック信号CLK1~CLK4、CLK5を生成して分配するクロック生成部(CLK生成部)7と、
sub-A/D変換回路(ADC)1~4の出力と、参照用A/D変換回路(ADC)5の出力とを比較し、比較結果に基づき、sub-A/D変換回路(ADC)1~4に対して、それぞれ補正制御信号(補正係数)を出力する制御部(回路)8と、を備えている。
・1サイクル目からの(f)のADC5の出力「1A」と、(b)のADC1の出力「1A」とを制御部8で比較、
・6サイクル目(=(4×1+1)+1)からの(f)のADC5の出力「2B」と、(c)のADC2の出力「2B」との比較、
・11サイクル目(=2×(4×1+1)+1)からの(f)のADC5の出力「3C」と、(d)のADC3の出力「3C」との比較、
・16サイクル目(=3×(4×1+1)+1)からの(f)のADC5の出力「4D」と、(e)のADC4の出力「4D」との比較、さらに、再び巡回して、
・21サイクル目(=4×(4×1+1)+1)からの(f)のADC5の出力「1F」と、(b)のADC1の出力「1F」との比較、・・・・
が、制御部8で順次行われる様子(対応関係)を模式的に示している。
・1サイクル目からの(f)のADC5の出力「1A」と、(b)のADC1の出力「1A」との比較、
・10サイクル目(=(4×2+1)+1)からの(f)のADC5の出力「2C」と、(b)のADC2の出力「2C」との比較、
・19サイクル目(=2×(4×2+1)+1)からの(f)のADC5の出力「3E」とADC3の出力「3E」との比較、
・28サイクル目(=3×(4×2+1)+1)からの(f)のADC5の出力「4G」とADC4の出力4「G」との比較、・・・
が制御部8で順次行われる様子を模式的に示している。
図3は、本発明の第1の実施形態の構成を示す図である。図3を参照すると、本実施形態は、図1の制御部8の構成として、ADC1~ADC4にそれぞれ対応させて、制御部9~12を備えている。制御部9~12は、ADC5の出力を共通に入力し、sub-A/D変換回路(ADC)1~4の出力をそれぞれ入力してADC5の出力と比較し、補正制御信号を、sub-A/D変換回路(ADC)1~4に対してそれぞれ出力する。
次に、本発明の第2の実施形態を説明する。図5は、本発明の第2の実施形態の構成を示す図である。図5を参照すると、本実施形態のA/D変換装置は、4並列インターリーブのsub-A/D変換回路(ADC)1~4と、それらの出力を処理するデジタル信号処理部6に加え、参照用A/D変換回路(ADC)5、sub-A/D変換回路(ADC)1~4と参照用A/D変換回路(ADC)5へサンプリングクロック信号を分配するクロック生成部7と、sub-A/D変換回路(ADC)1~4と参照用A/D変換回路(ADC)5の出力を比較しsub-A/D変換回路(ADC)1~4へ補正制御信号を出力する制御部13を備える。
次に本発明の第3の実施形態を説明する。図7は、本発明の第3の実施形態の構成を示す図である。図7を参照すると、本実施形態は、図1の構成に対して、4並列インターリーブのsub-A/D変換回路(ADC)1~4の出力を多重化する多重化回路(マルチプレクサ:MUX)14を備え、図1の制御部8のかわりに、マルチプレクサ(MUX)14の出力と参照用A/D変換回路(ADC)5の出力を入力して比較し、補正制御信号を生成し、sub-A/D変換回路(ADC)1~4に供給する制御部15を備えている。信号処理部6’はマルチプレクサ(MUX)14の出力を入力する。
5 参照用A/D変換回路(ADC5)
6、6’ 信号処理部
7 クロック生成部
8、9~12、13、15 制御部
14 マルチプレクサ
Claims (14)
- 並列に接続され、クロック信号をM分周し互いに前記クロック信号1サイクル分等間隔に離間したM相のサンプリング信号にそれぞれ応答してアナログ入力信号をデジタル信号に変換する第1乃至第M(ただし、Mは予め定められた2以上の整数)のA/D変換回路と、
前記クロック信号を(n×M+1)分周したサンプリング信号(ただし、nは予め定められた正整数)に応答してアナログ入力信号をデジタル信号に変換する参照用A/D変換回路と、
を備え、前記第1乃至第MのA/D変換回路と前記参照用A/D変換回路は、アナログ入力が共通に接続され、
前記第1乃至第MのA/D変換回路に関して、予め定められた順序で、前記クロック信号の(n×M+1)サイクルの周期で、前記A/D変換回路からのデジタル信号と、前記参照用A/D変換回路からのデジタル信号とを比較し、該比較結果に基づき補正制御信号を生成し、前記補正制御信号を前記A/D変換回路に供給する制御部と、
を備えたA/D変換装置。 - 前記制御部が、前記第1乃至第MのA/D変換回路に対応して、第1乃至第Mの制御部をそれぞれ備えている、請求項1のA/D変換装置。
- 前記第1乃至第Mの制御部の各々は、前記第1乃至第MのA/D変換回路のうち前記各々の制御部に対応するA/D変換回路から出力されるデジタル信号と、前記参照用A/D変換回路から前記クロック信号の(n×M+1)サイクルの周期で出力されるデジタル信号とを、前記クロック信号のM×(n×M+1)サイクルの周期で比較する、請求項2のA/D変換装置。
- 前記制御部は、前記第1乃至第MのA/D変換回路からそれぞれ出力される前記第1乃至第Mのデジタル信号を並列に入力する、請求項1のA/D変換装置。
- 前記制御部が、前記第1乃至第MのA/D変換回路のうちの一つのA/D変換回路から出力されるデジタル信号と、前記参照用A/D変換回路から出力されるデジタル信号との比較をイネーブルとする期間は、最大、前記クロック信号のMサイクルである、請求項1のA/D変換装置。
- 前記第1乃至第MのA/D変換回路から、前記クロック信号の1サイクル分離間したタイミングにて前記クロック信号のMサイクルの周期でそれぞれ出力される第1乃至第Mのデジタル信号を、巡回的に、前記クロック信号の周期で切換選択して出力する多重化回路を備え、
前記制御部は、前記多重化回路から前記クロック信号の周期で巡回的に順次切換出力されるデジタル信号と、前記参照用A/D変換回路から前記クロック信号の(n×M+1)サイクルの周期で出力されるデジタル信号と、を、前記クロック信号の(n×M+1)サイクルのうち予め定められた所定番目の1サイクルに、前記クロック信号の(n×M+1)サイクルの周期で、比較する、請求項1のA/D変換装置。 - 前記制御部は、前記第1乃至第MのA/D変換回路の各A/D変換回路から出力されるデジタル信号と、前記参照用A/D変換回路から出力されるデジタル信号との差分が最小となるように、前記補正制御信号を生成する、請求項1のA/D変換装置。
- 並列接続された第1乃至第M(ただし、Mは予め定められた2以上の整数)のA/D変換回路が、クロック信号をM分周し互いに前記クロック信号1サイクル分等間隔に離間したM相のサンプリング信号にそれぞれ応答してアナログ入力信号をデジタル信号に変換するタイムインターリーブ方式のA/D変換装置の補正制御方法であって、
前記第1乃至第M(ただし、Mは予め定められた正整数)のA/D変換回路とアナログ入力が共通接続された参照用A/D変換回路を設け、
前記参照用A/D変換回路では、前記クロック信号を(n×M+1)分周したサンプリング信号(ただし、nは予め定められた正整数)に応答してアナログ入力信号をデジタル信号に変換し、
制御部にて、前記第1乃至第MのA/D変換回路に関して、予め定められた順序で、前記クロック信号の(n×M+1)サイクルの周期で、前記A/D変換回路からのデジタル信号と、前記参照用A/D変換回路からのデジタル信号とを比較し、該比較結果に基づき補正制御信号を生成し、前記補正制御信号を前記A/D変換回路に供給する、A/D変換装置の補正制御方法。 - 前記制御部として、前記第1乃至第MのA/D変換回路に対応して、第1乃至第Mの制御部をそれぞれ設けた、請求項8のA/D変換装置の補正制御方法。
- 前記第1乃至第Mの制御部の各々は、前記第1乃至第MのA/D変換回路のうち前記各々の制御部に対応するA/D変換回路から出力されるデジタル信号と、前記参照用A/D変換回路から前記クロック信号の(n×M+1)サイクルの周期で出力されるデジタル信号とを、前記クロック信号のM×(n×M+1)サイクルの周期で比較する、請求項9のA/D変換装置の補正制御方法。
- 前記制御部は、前記第1乃至第MのA/D変換回路からそれぞれ出力される前記第1乃至第Mのデジタル信号を並列に入力する、請求項8のA/D変換装置の補正制御方法。
- 前記制御部が、前記第1乃至第MのA/D変換回路のうちの一つのA/D変換回路から出力されるデジタル信号と、前記参照用A/D変換回路から出力されるデジタル信号との比較をイネーブルとする期間は、最大、前記クロック信号のMサイクルである、請求項8のA/D変換装置の補正制御方法。
- 前記第1乃至第MのA/D変換回路から、前記クロック信号の1サイクル分離間したタイミングにて前記クロック信号のMサイクルの周期でそれぞれ出力される第1乃至第Mのデジタル信号を、多重化回路で、巡回的に、前記クロック信号の周期で切換選択して多重化し、
前記制御部は、前記多重化回路から前記クロック信号の周期で巡回的に順次切換出力されるデジタル信号と、前記参照用A/D変換回路から前記クロック信号の(n×M+1)サイクルの周期で出力されるデジタル信号と、を、前記クロック信号の(n×M+1)サイクルのうち予め定められた所定番目の1サイクルに、前記クロック信号の(n×M+1)サイクルの周期で、比較する、請求項8のA/D変換装置の補正制御方法。 - 前記制御部は、前記第1乃至第MのA/D変換回路の各A/D変換回路から出力されるデジタル信号と、前記参照用A/D変換回路から出力されるデジタル信号との差分が最小となるように、前記補正制御信号を生成する、請求項8のA/D変換装置の補正制御方法。
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012519419A (ja) * | 2009-02-27 | 2012-08-23 | アナログ ディヴァイスィズ インク | アパーチャ遅延不整合によって発生する時間インタリーブのアナログ−デジタル変換器内の誤差を減少させる方法 |
JP2015192397A (ja) * | 2014-03-28 | 2015-11-02 | 株式会社デンソー | A/d変換装置 |
JP2015231239A (ja) * | 2014-06-06 | 2015-12-21 | アイメック・ヴェーゼットウェーImec Vzw | A/d変換器における帯域幅不整合推定のための方法及び回路 |
JP2018520582A (ja) * | 2015-05-29 | 2018-07-26 | テレフオンアクチーボラゲット エルエム エリクソン(パブル) | アナログ−デジタル変換器システム |
JP2021175171A (ja) * | 2020-04-29 | 2021-11-01 | 創意電子股▲ふん▼有限公司 | アナログデジタル変換システム、クロックスキューの校正方法及び関連のコンピュータプログラム製品 |
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Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2555434A4 (en) * | 2010-03-26 | 2013-10-09 | Nec Corp | TIME-INTERLACING A / D CONVERSION DEVICE |
JP5468442B2 (ja) * | 2010-03-31 | 2014-04-09 | 本田技研工業株式会社 | Ad変換回路、及び、誤差補正方法 |
US8564462B2 (en) | 2010-09-08 | 2013-10-22 | Broadcom Corporation | Digital correction techniques for data converters |
US9030341B2 (en) * | 2012-06-27 | 2015-05-12 | Broadcom Corporation | Compensation for lane imbalance in a multi-lane analog-to-digital converter (ADC) |
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US11677409B2 (en) * | 2021-03-19 | 2023-06-13 | Microsoft Technology Licensing, Llc | Cloud assisted calibration of analog-to-digital converters |
JP2022146460A (ja) | 2021-03-22 | 2022-10-05 | キオクシア株式会社 | 半導体回路、受信装置及びメモリシステム |
TWI778590B (zh) * | 2021-04-21 | 2022-09-21 | 創意電子股份有限公司 | 類比數位轉換器裝置與校正電路控制方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001308804A (ja) * | 2000-04-27 | 2001-11-02 | Agilent Technologies Japan Ltd | 冗長性をもったインターリーブ方法と、それを利用したa/d変換器と、d/a変換器、トラック・ホールド回路 |
JP2009130444A (ja) * | 2007-11-20 | 2009-06-11 | Hitachi Ltd | アナログデジタル変換器チップおよびそれを用いたrf−icチップ |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0866562A1 (fr) * | 1997-03-18 | 1998-09-23 | Koninklijke Philips Electronics N.V. | Dispositif de conversion analogique/numérique muni d'un agencement de calibration de gain. |
TW591095B (en) * | 2000-10-25 | 2004-06-11 | Harima Chemical Inc | Electro-conductive metal paste and method for production thereof |
US7336729B2 (en) * | 2001-03-01 | 2008-02-26 | Broadcom Corporation | Digital signal processing based de-serializer |
US6433712B1 (en) * | 2001-07-25 | 2002-08-13 | Texas Instruments Incorporated | Offset error compensation of input signals in analog-to-digital converter |
JP2003133954A (ja) | 2001-10-26 | 2003-05-09 | Agilent Technologies Japan Ltd | インターリーブa/d変換器の校正方法 |
DE102004049481B4 (de) * | 2004-10-11 | 2007-10-18 | Infineon Technologies Ag | Analog-Digital-Wandler |
JP4774953B2 (ja) | 2005-11-28 | 2011-09-21 | 株式会社日立製作所 | 時間インターリーブad変換器 |
TWI355829B (en) * | 2007-12-26 | 2012-01-01 | Ind Tech Res Inst | Circuit and method for calibrating direct current |
EP2555434A4 (en) * | 2010-03-26 | 2013-10-09 | Nec Corp | TIME-INTERLACING A / D CONVERSION DEVICE |
US8446304B2 (en) * | 2010-06-30 | 2013-05-21 | University Of Limerick | Digital background calibration system and method for successive approximation (SAR) analogue to digital converter |
US8325072B2 (en) * | 2011-01-10 | 2012-12-04 | Intel Mobile Communications GmbH | Calibration circuit and method for calibrating capacitive compensation in digital-to-analog converters |
-
2010
- 2010-12-10 US US13/514,775 patent/US8587460B2/en active Active
- 2010-12-10 WO PCT/JP2010/072214 patent/WO2011071142A1/ja active Application Filing
- 2010-12-10 JP JP2011545259A patent/JP5288003B2/ja active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001308804A (ja) * | 2000-04-27 | 2001-11-02 | Agilent Technologies Japan Ltd | 冗長性をもったインターリーブ方法と、それを利用したa/d変換器と、d/a変換器、トラック・ホールド回路 |
JP2009130444A (ja) * | 2007-11-20 | 2009-06-11 | Hitachi Ltd | アナログデジタル変換器チップおよびそれを用いたrf−icチップ |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012519419A (ja) * | 2009-02-27 | 2012-08-23 | アナログ ディヴァイスィズ インク | アパーチャ遅延不整合によって発生する時間インタリーブのアナログ−デジタル変換器内の誤差を減少させる方法 |
JP2015192397A (ja) * | 2014-03-28 | 2015-11-02 | 株式会社デンソー | A/d変換装置 |
JP2015231239A (ja) * | 2014-06-06 | 2015-12-21 | アイメック・ヴェーゼットウェーImec Vzw | A/d変換器における帯域幅不整合推定のための方法及び回路 |
JP2018520582A (ja) * | 2015-05-29 | 2018-07-26 | テレフオンアクチーボラゲット エルエム エリクソン(パブル) | アナログ−デジタル変換器システム |
US11641211B2 (en) | 2019-03-04 | 2023-05-02 | Mitsubishi Electric Corporation | Receiver device and reception method |
JP2021175171A (ja) * | 2020-04-29 | 2021-11-01 | 創意電子股▲ふん▼有限公司 | アナログデジタル変換システム、クロックスキューの校正方法及び関連のコンピュータプログラム製品 |
JP7028920B2 (ja) | 2020-04-29 | 2022-03-02 | 創意電子股▲ふん▼有限公司 | アナログデジタル変換システム、クロックスキューの校正方法及び関連のコンピュータプログラム製品 |
US11258433B1 (en) | 2020-09-16 | 2022-02-22 | Kioxia Corporation | Semiconductor integrated circuit and receiving device |
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