WO2009122836A1 - 薄膜積層体の製造装置および方法 - Google Patents
薄膜積層体の製造装置および方法 Download PDFInfo
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- WO2009122836A1 WO2009122836A1 PCT/JP2009/053876 JP2009053876W WO2009122836A1 WO 2009122836 A1 WO2009122836 A1 WO 2009122836A1 JP 2009053876 W JP2009053876 W JP 2009053876W WO 2009122836 A1 WO2009122836 A1 WO 2009122836A1
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Images
Classifications
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
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- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
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- H—ELECTRICITY
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- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
- H01L31/03926—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate comprising a flexible substrate
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- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1876—Particular processes or apparatus for batch treatment of the devices
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- B65H2301/32—Orientation of handled material
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to an apparatus and method for manufacturing a thin film laminate such as a thin film photoelectric conversion element by forming a plurality of thin films on a strip-like flexible substrate.
- a high-rigidity substrate is usually used as a substrate for a thin film laminate such as a semiconductor thin film.
- a flexible substrate such as a resin is also used for a substrate of a photoelectric conversion element used for, for example, a solar cell for convenience such as light weight and easy handling and cost reduction due to mass production. .
- a strip-shaped flexible substrate is passed through a plurality of continuously arranged film forming chambers and stopped in each film forming chamber.
- a film forming apparatus has been developed in which a film is formed on the surface of the substrate, and then the operation of transporting the substrate to the position of the next film forming chamber is repeated to stack a plurality of thin films having different properties on the substrate.
- Japanese Patent Laid-Open No. 2005-72408 Japanese Patent Laid-Open No. 2005-72408
- the width direction of the strip-shaped flexible substrate is held in the horizontal direction, the substrate is transported in the horizontal direction, and the film is formed in the horizontal direction, and the width direction of the strip-shaped flexible substrate is set in the vertical direction.
- the substrate is transported in the horizontal direction to form a film.
- the latter type has advantages such as less contamination of the substrate surface compared to the former type, but when the number of film forming chambers increases, wrinkles occur on the surface of the substrate due to gravity and substrate elongation, There is a problem that the substrate meanders in the width direction or hangs downward.
- an intermediate chamber is disposed between two film forming chambers located at the center of a plurality of film forming chambers, and the substrate surface is spread over the entire surface in the width direction of the substrate.
- EPC side edge position control
- the EPC roller in the intermediate chamber is eliminated and the end portion of the substrate is held by the grip roller and conveyed.
- the substrate since the substrate is not restrained by the EPC roller in the intermediate chamber, it becomes more susceptible to variations in the initial properties of the substrate itself. This problem becomes apparent when the number of film forming chambers in the line is increased and the line length is increased in order to increase the production efficiency of the line, and the amount of meandering in the substrate height direction during transportation increases, and the film formation of the substrate increases. The position variation becomes large.
- the substrate portion located from the first film formation chamber to the last film formation chamber cannot form a predetermined thin film in all layers. Therefore, until the substrate portion formed in the first film formation chamber reaches the take-up core (that is, for all the film passes), the substrate has a property different from the substrate on which all the predetermined thin films are formed. change. Therefore, the substrate having a length from the unwinding position to the winding position at the initial stage of film formation rises or falls in the width direction from a predetermined target height. It is also necessary to transport the substrate for a longer time until the substrate converges to a predetermined height.
- the present invention increases the process length in order to increase the production efficiency when the substrate is transported over a long distance in the horizontal direction while the width direction of the belt-like flexible substrate is directed in the vertical direction.
- Manufacture of a thin film stack that can prevent the substrate from meandering in the width direction and hanging down even if the substrate that has not been formed is transported for a long time even if it is long.
- an apparatus for manufacturing a thin film laminate by laminating a plurality of thin films on the surface of a strip-like flexible substrate wherein the width direction of the substrate is A substrate transport means for transporting the substrate in a horizontal direction so as to be in a vertical direction, and a plurality of film forming chambers that are continuously arranged along the transport direction of the substrate and perform film formation on the surface of the substrate; And at least one pair of grip rollers disposed between at least one of the plurality of film forming chambers and sandwiching an upper end portion in the vertical direction of the substrate, and the rotation direction of the grip rollers is the transport direction of the substrate.
- a grip roller installed obliquely upward with respect to a direction; and a control unit that controls a height of the substrate by changing a force of sandwiching the substrate between the at least one pair of grip rollers.
- the present invention provides an apparatus for manufacturing a thin film laminate by laminating a plurality of thin films on the surface of a strip-shaped flexible substrate, the width direction of the substrate being a vertical direction.
- a substrate transfer means for transferring the substrate in the horizontal direction, a plurality of film forming chambers that are continuously arranged along the transfer direction of the substrate, and for forming a film on the surface of the substrate, and the plurality of film forming chambers Between the plurality of pairs of grip rollers sandwiching the upper end in the vertical direction of the substrate and at least one of the plurality of film forming chambers.
- An apparatus for manufacturing a thin film laminate according to the present invention includes an actuator that changes a force sandwiching a substrate of the grip roller, a power unit for inputting energy to the actuator, and a load cell that detects energy input to the actuator.
- the control device calculates a target value of energy input to the actuator in order to set a force sandwiching the substrate of the grip roller to a target value, and uses the target value of the input energy as the power.
- the detected value of the input energy detected by the load cell is compared with the target value of the input energy, and the target value of the energy input to the actuator is changed.
- the apparatus for manufacturing a thin film laminate according to the present invention further includes a sensor for detecting the height of the substrate, and the control device is configured so that the height of the substrate is not within a predetermined range by the sensor.
- the determination it is preferable to change the target value of the force sandwiching the grip roller substrate.
- Another aspect of the present invention is a method of manufacturing a thin film laminate by laminating a plurality of thin films on the surface of a strip-like flexible substrate, the width direction of the substrate being a vertical direction, A step of transporting the substrate in a horizontal direction, a step of performing film deposition on the surface of the substrate by a plurality of film deposition chambers arranged continuously along the transport direction of the substrate, and the plurality of film deposition chambers And at least one pair of grip rollers disposed between at least one of the gaps and sandwiching the upper end in the vertical direction of the substrate, the rotation direction of the grip rollers being obliquely upward with respect to the transport direction of the substrate And a step of controlling the height of the substrate by changing a force sandwiching the substrate with respect to the installed grip roller.
- the present invention is a method for producing a thin film laminate by laminating a plurality of thin films on the surface of a strip-like flexible substrate, the width direction of the substrate being a vertical direction, A step of transporting the substrate in a horizontal direction, a step of performing film deposition on the surface of the substrate by a plurality of film deposition chambers arranged continuously along the transport direction of the substrate, and the plurality of film deposition chambers At least one pair of grip rollers disposed between at least one of the upper and lower ends of the substrate, wherein the rotation direction of the upper pair of grip rollers is the substrate.
- the grip rollers in which the rotation direction of the pair of lower grip rollers is installed obliquely downward with respect to the transport direction of the substrate are arranged above and below the grip rollers.
- by changing the force sandwiching the substrate of at least one of the gripping rollers characterized in that it comprises a step of controlling the height of the substrate.
- the step of controlling the height of the substrate is a step of calculating a target value of energy input to the actuator that changes the force of sandwiching the substrate of the grip roller in order to set the force of sandwiching the substrate of the grip roller to a target value.
- a step of changing a target value of energy input to the actuator is a step of calculating a target value of energy input to the actuator that changes the force of sandwiching the substrate of the grip roller in order to set the force of sandwiching the substrate of the grip roller to a target value.
- the step of controlling the height of the substrate includes a step of detecting the height of the substrate by a sensor and determining whether or not the height of the substrate is within a predetermined range; It is preferable that the method further includes a step of changing a target value of a force for sandwiching the substrate of the grip roller when it is determined that it is not within the predetermined range.
- the grip roller disposed between the film forming chambers and sandwiching the vertical end of the substrate is installed so that the rotation direction is oblique with respect to the substrate transport direction, and the substrate is sandwiched. Since the height of the substrate can be controlled by changing the force, even if the belt-like flexible substrate is transported over a long distance between a plurality of film forming chambers, the substrate can meander in the width direction, It is possible to prevent the sagging downward.
- FIG. 6 is a plan view schematically showing an experimental apparatus used in a test of Example 2.
- FIG. It is a graph which shows the test result of the experimental apparatus of FIG.
- a thin film laminate manufacturing apparatus according to the present invention will be described with reference to the accompanying drawings.
- this invention is applied to manufacture of thin film laminated bodies, such as a semiconductor thin film, such as a photoelectric conversion element for solar cells, and organic EL, for example. be able to.
- FIG. 1 is a plan view schematically showing one embodiment of a thin film laminate manufacturing apparatus according to the present invention. The drawings are deformed and are not drawn to scale.
- the thin film laminate manufacturing apparatus includes an unwinding unit 10 that feeds the strip-shaped flexible substrate 1 and an unwinding unit that transports the strip-shaped flexible substrate 1 from the unwinding unit to the film forming unit.
- Side driving unit 20 film forming unit 30 for laminating a plurality of thin films on strip-shaped flexible substrate 1, and winding-side driving unit 60 for transporting strip-shaped flexible substrate 1 from the film forming unit to the winding unit
- a winding portion 70 for winding the belt-like flexible substrate 1 on which the thin film laminate is formed.
- substrate 1 is conveyed to a horizontal direction, while the width direction faces a perpendicular direction.
- the unwinding unit 10 includes an unwinding core 11 that feeds the band-shaped flexible substrate 1 from an original fabric on which the band-shaped flexible substrate is wound in a roll shape, and a band-shaped flexible substrate that is fed from the unwinding core 11.
- a tension detection roller 13 for detecting the tension of 1 and a free roller 12 positioned between them are provided.
- the unwinding core 11, the free roller 12, and the tension detection roller 13 are installed such that the axial direction is the vertical direction.
- Each roller described below is also installed so that the axial direction is the vertical direction unless otherwise specified.
- the unwinding side driving unit 20 includes an unwinding side film driving roller 21 that is rotationally driven to convey the band-shaped flexible substrate 1 from the unwinding unit 10 to the film forming unit 40, and the band-shaped flexibility at the time of driving.
- a tension detection roller 22 for detecting the tension of the conductive substrate 1
- a free roller 23 for changing the advancing direction of the belt-like flexible substrate 1 by 90 degrees and sending it to the film forming unit 40.
- the film forming unit 30 is provided with a preheating chamber 38 and a plurality of film forming chambers 40a to 40p for sequentially laminating thin films on the surface of the strip-shaped flexible substrate 1.
- the film formation chamber 40 is provided with a film formation apparatus such as CVD or sputtering according to the type of thin film to be formed.
- a CVD film forming apparatus is provided in the first 14 film forming chambers 40a to 40n arranged in a straight line, and the film forming chambers 40o and 40p in the last two chambers are sputtered.
- a device is provided. Between the CVD film forming chamber and the sputter film forming chamber, two free rollers 31 and 32 that change the traveling direction by 90 degrees are arranged.
- Each film forming chamber 40 is provided with a movable wall (not shown) for making the film forming chamber airtight.
- Each film forming chamber 40 is provided with a pair of grip rollers 44 and 52 sandwiching the strip-shaped flexible substrate 1 on the substrate entrance side of the film forming chamber.
- the grip rollers include a fixed grip roller 44 having a constant force for pressing the substrate 1 and a variable grip roller 52 capable of controlling the force for pressing the substrate 1.
- the variable grip roller 52 is installed in the fourth, sixth, eighth, tenth, and sixteenth film forming chambers 40d, 40f, 40h, 40j, and 40p, and the fixed grip roller 44 is installed in the remaining film forming chambers. Yes.
- Each film forming chamber in which the variable grip roller 52 is installed is provided with an end surface sensor 42 for detecting the upper end surface of the strip-shaped flexible substrate 1 as will be described in detail later.
- the take-up drive unit 60 includes a take-up film drive roller 62 that rotates to convey the belt-like flexible substrate 1 from the film forming unit 40 to the take-up unit 70, and a free roller positioned before and after this 61 and 63 are provided.
- the winding unit 70 has a belt-like belt formed with a tension detection roller 72 for controlling the tension of the belt-like flexible substrate 1 at the time of winding, free rollers 71 and 73 positioned before and after this, and a thin film laminate.
- a winding core 75 for winding the flexible substrate 1 in a roll shape and a free roller 74 positioned in front of the winding core 75 are provided.
- FIG. 2 is an enlarged front view showing the belt-like flexible substrate 1 and the fixed grip roller 44 in the manufacturing apparatus of FIG.
- FIG. 3 is an enlarged front view showing the belt-like flexible substrate 1 and the variable grip roller 52 in the manufacturing apparatus of FIG.
- both grip rollers 44 and 52 are arranged at both the upper end and the lower end of the belt-like flexible substrate 1 in the vertical direction.
- each grip roller is installed obliquely at an angle ⁇ with respect to the horizontal that is the transport direction.
- the upper fixed grip roller 44 ⁇ / b> U is installed such that the rotation direction of the roller is inclined upward with respect to the transport direction (that is, the horizontal direction) of the belt-like flexible substrate 1.
- the angle ⁇ U between the rotation direction of the upper fixed grip roller 44U and the transport direction of the strip-shaped flexible substrate 1
- the strip-shaped flexible substrate 1 is transported in the horizontal direction.
- a force F U that raises the substrate 1 upward is generated.
- certain types grip roller 44L of the lower likewise at an angle theta U, is installed to be inclined downward, the force F D pulling the substrate 1 downward is generated.
- the vertical angles ⁇ U and ⁇ L are preferably equal, and preferably 0.1 to 6 °.
- the upper variable grip roller 52U is similarly installed at an angle ⁇ U and inclined upward, and the lower variable grip roller 52L is similarly positioned at an angle ⁇ L below. It is installed at an angle.
- the difference obtained by subtracting the force F D that pulls the substrate 1 downward from the force F U that pulls the substrate 1 upward is the force F X that actually increases the height of the substrate 1. is there.
- the force F U raising the substrate 1, when the angle theta U grip rollers is constant, as the pressure F P sandwiching the substrate 1 of the grip roller increases, increases.
- the angles ⁇ U and ⁇ L of the grip roller are larger, the forces F U and F D for pulling the substrate 1 are larger, but the angles ⁇ U and ⁇ L exceed 6 ° or the static frictional force of the roller itself is increased. If exceeded, the forces F U and F D for pulling the substrate 1 hardly improve. Therefore, the angles ⁇ U and ⁇ L are preferably 0.1 to 6 °. It is preferable to make the vertical angles ⁇ U and ⁇ L equal.
- the variable grip roller 52 has been described as being installed on the upper side and the lower side, but of course, by installing only the upper variable gripping rollers 52U, by changing the pressurizing force F P, likewise the substrate 1 The height can be controlled.
- FIG. 4 is a cutaway side view schematically showing an example of the upper variable grip roller 52 and its attached device.
- the pair of grip rollers 52 are rotatably mounted in roller housings 91 and 92 opened on the substrate 1 side.
- One roller housing 91 is fixed to one end of an arm 98 having an L-shaped cross section, and this arm 98 is fixed to the lower surface of the wall surface 110 of the film forming chamber via a suspension member 103.
- the other roller housing 92 is fixed to one end of a plate-like pressure lever 90, and this pressure lever 90 is rotatably attached to the other end of the arm 98 via a hinge 96 at the center portion thereof. It has been.
- the arm 98 and the pressure lever 90 are connected by a pressure spring 93, and the pair of grip rollers 52 sandwich the substrate 1 in the horizontal direction with the initial tension F 0 of the pressure spring 93. ing.
- an adjustment lever 95 having an L-shaped cross section is in contact with the other end of the pressure lever 90.
- the adjustment lever 95 is rotatably attached to a fixing member (not shown) via a hinge 97 at the corner portion.
- One end of an adjustment spring 94 is connected to the other end of the adjustment lever 95.
- the adjustment spring 94 the other end of the adjusting lever 95, when pulled vertically with a force F.alpha X, the hinge 97 as a fulcrum adjusting lever 95 is rotated, one end of the adjusting lever 95 is at the other end of the pressing lever 90 and it is configured to push the horizontal direction with a force F.alpha L.
- the other end of the adjustment spring 94 is connected to the tip of the movable rod 105.
- the opposite end of the movable rod 105 is connected to the linear drive motor 100, and the movable rod 105 moves forward and backward in the vertical direction L X by the rotation of the linear drive motor 100.
- the linear drive motor 100 is provided with a brake 104 that locks the linear drive motor 100 at a desired position.
- the linear drive motor 100 is provided with a motor position sensor 101 that detects the position M S of the current rotational speed of the linear drive motor 100. As the motor position sensor 101, an absolute encoder is preferable.
- the movable rod 105 is provided with a load cell 99 for measuring a force F ⁇ X at which the adjustment spring 94 pulls the adjustment lever 95.
- the linear drive motor 100, the motor brake 104, the motor position sensor 101, and the load cell 99 are fixed on the wall surface 110 of the film forming chamber by a flange 102.
- the movable rod 105 is configured to pass through the inside of the flange 102 and the wall surface 110 of the film forming chamber.
- the wall surface 110 of the film formation chamber and the flange 102 are fixed via an O-ring seal or magnetic seal 106, and the flange 102 and the movable rod 105 are in contact via an O-ring seal or magnetic seal 107. As a result, the film formation chamber is kept airtight.
- the contact surface with the substrate is preferably made of heat-resistant rubber such as silicon rubber or fluorine rubber, or synthetic resin such as PTFE or polyimide. Moreover, even if it is the raw material which gave chromium plating to stainless steel or iron, a predetermined performance is obtained.
- FIG. 5 is a block diagram showing a grip roller attachment device and its control means.
- the controller 120 includes a digital signal input interface 122, an analog signal output interface 123, an analog signal input interface 124, and a computer calculation unit 125 that can transmit and receive these interfaces.
- the controller 120 includes a display operation unit 126 for operating the control.
- the digital signal input interface 122 is connected to the motor position sensor 101 so as to be receivable.
- the analog signal output interface 123 is connected to the motor brake 104 and the AC 100V brake drive power supply 128 via the relay 127 so as to be able to transmit.
- the analog signal output interface 123 is connected to the linear drive motor 100 via a motor amplifier 129 so as to be able to transmit.
- the analog signal input interface 124 is connected to the load cell 99 via the load cell amplifier 130 so as to be receivable.
- two end surface sensors 42 for detecting the end surface of the substrate 1 are arranged vertically in the vertical direction.
- the upper end surface sensor 42a is attached at a position where the substrate end surface is detected when the substrate 1 rises beyond a predetermined range, and the lower end surface sensor 42b descends beyond the predetermined range. In this case, it is attached at a position where the end face of the substrate is not detected.
- the end face detection range of the end face sensor 42 can be set to ⁇ 5 mm, for example.
- a digital signal input interface 122 is connected to the upper and lower end surface sensors 42a and 42b through the sensor amplifiers 131a and 131b so as to be receivable.
- FIG. 5 shows only the attachment device for one upper variable grip roller, but each of the attachment devices for all the upper and lower variable grip rollers 52a to 52f is connected to this one controller. 120.
- two end surface sensors 42 are arranged on the upper and lower sides.
- the present invention is not limited to this, and three or more end surface sensors can be arranged.
- the strip-shaped flexible substrate 1 passing through the plurality of film forming chambers 40 a to 40 p is wound from the unwinding core 11 by the unwinding side and winding side drive units 20 and 60. It is conveyed horizontally in the direction toward the core 75.
- the rotation of the driving rollers 21 and 62 is stopped so that the belt-like flexible substrate 1 is stopped, and the walls (not shown) of the film formation chambers 40a to 40p are moved until they are in close contact with the substrate 1.
- the film formation chamber is made airtight.
- a thin film is formed on the surface of the strip-shaped flexible substrate 1 in each film forming chamber.
- a thin film laminated body can be manufactured on the surface of the strip
- the belt-like flexible substrate 1 moves a long distance from the first film formation chamber 40a to the fourteenth film formation chamber 40n, but the belt-like flexible substrate 1 is free rollers 23 and 31 located at both ends of this section. If it can only be supported, there is a problem that it hangs down due to gravity or elongation of the substrate, or meanders in the width direction of the substrate. Therefore, in this embodiment, as described above, by changing the pressurizing force F P sandwiching the substrate 1 of the variable grip roller 52, controls the force F to increase the height of the substrate 1, thereby, The height of the substrate 1 can be maintained within a predetermined range.
- the target value F PX of the pressing force of the variable grip roller 52 can be obtained by the following formula 1.
- F PX F 0 -R 0 ⁇ R 1 ⁇ F ⁇ X (Formula 1)
- F 0 Initial tension of the pressure spring.
- F ⁇ X Force that the adjustment spring pulls the adjustment lever.
- R 0 Lever ratio of the pressure lever.
- R 1 Lever ratio of the adjustment lever.
- the target value F PX of the pressure applied to the variable grip roller can be controlled by changing only the tension F ⁇ X of the adjustment spring 94.
- the target position L X of the movable rod 105 for achieving the target tension F ⁇ X of the adjustment spring 94 can be obtained by the following equation 2.
- the target position L X of the movable rod 105 is the rotational speed M of the linear drive motor 100.
- the screw lead G 0 is a rod feed amount per rotation of the motor by a ball screw.
- the position M S of the current rotational speed of the linear drive motor 100 can be detected by the motor position sensor 101. Therefore, when rotating the linear drive motor 100 to the position M X of the rotational speed of the target, only a difference obtained by subtracting the current rotational speed M S, may be rotationally drives the linear motor 100.
- a block diagram of an algorithm for controlling the linear drive motor 100 is shown in FIG.
- the tension F ⁇ X of the adjustment spring 94 can be controlled more accurately.
- the target value F ⁇ X of the tension of the adjustment spring 94 is obtained from the target value F PX of the applied pressure of the variable grip roller 52 by Formula 1, and then the target position of the movable rod 105 is calculated by Formula 2.
- L X is obtained, and the linear drive motor 100 is rotationally driven to the target rotational position M X.
- the load cell 99 measures the current value F ⁇ S of the tension of the adjustment spring 94.
- the moving distance ⁇ L X of the movable rod 105 for achieving the target tension F ⁇ X of the adjustment spring 94 can be obtained by the following equation 3.
- the height of the substrate 1 can be more accurately maintained within a predetermined range.
- the upper end surface sensor 42 a does not detect the end surface of the substrate 1 (OFF)
- the lower end surface sensor 42 b is the end surface of the substrate 1. Is detected (ON).
- both the upper and lower end surface sensors 42a, 120b detect the end surface of the substrate 1 (ON, ON).
- the upper and lower end surface sensors 42a and 120b do not detect the end surface of the substrate 1 (OFF, OFF).
- the ON / OFF signals transmitted from the end face sensors 42 are amplified by the amplifier 131 and then received by the digital signal input interface 122 of the controller 120. Then, the computer calculation unit 125 determines whether the height of the substrate 1 is within a predetermined range, above it, or below it.
- the algorithm shown in FIG. 6 is controlled.
- the control for setting the re-target value F ⁇ XR is repeated until the height of the substrate 1 falls within a predetermined range and the upper end face sensor 42a is turned off.
- an operation signal is sent from the analog signal output interface 123 of the controller 120 to the relay 127 to operate the motor brake 104, and the tension F ⁇ X of the adjustment spring 94 varies.
- the linear drive motor 100 is fixed so that it does not occur.
- the pressure F PX of the upper variable grip roller 52U is increased.
- the re-target value F PXR is set by adding a predetermined change amount ⁇ F PX from the current target value F PX of the pressing force of the upper variable grip roller 52U.
- a re-target value F ⁇ XR of the tension of the adjustment spring 94 is calculated.
- F PXR F PX + ⁇ F P (Formula 6)
- F PXR F 0 -R 0 ⁇ R 1 ⁇ F ⁇ XR (Expression 7)
- the algorithm shown in FIG. 6 is controlled.
- the control for setting the re-target value F ⁇ XR is repeated until the height of the substrate 1 rises within a predetermined range and the lower end face sensor 42b is turned on. Then, when the lower end face sensor 42b is turned ON, an operation signal is sent from the analog signal output interface 123 to the relay 127, the motor brake 104 is operated, and the linear drive motor 100 is fixed.
- the target value F PX of the pressing force for sandwiching the substrate 1 of the variable grip roller 52 varies depending on the properties of the substrate, the transport distance, and the interval between the film forming chambers. A range is preferred.
- the height of the substrate is converged within a predetermined range by changing only the pressing force of the upper variable grip roller, but if the substrate rises beyond the predetermined range, It is possible to lower the substrate within a predetermined range by increasing the pressing force of the variable gripping roller on the side, and when the substrate is lowered beyond the predetermined range, the pressing force of the lower variable gripping roller
- the substrate can be raised within a predetermined range by lowering.
- the height of the substrate can be converged within a predetermined range by changing both the applied pressures of the upper and lower variable grip rollers to increase or decrease the difference.
- the pressing force sandwiching the substrate 1 of the fixed-type grip roller 44 varies depending on the properties of the substrate, the transport distance, and the distance between the film forming chambers, but is preferably in the range of 2 to 40 N, for example, 4 to 17 N. A range is preferred.
- the pressure applied by the upper and lower constant-type grip rollers 44 is preferably the same in order to prevent wrinkles from occurring on the surface of the substrate 1.
- the present invention transports the substrate in a horizontal direction over a long distance while directing the width direction of the strip-shaped flexible substrate in the vertical direction. If it is an apparatus which does, it can apply not only to a stepping roll system but widely.
- Example 1 The change of the force which supports the film produced when a film was pinched
- the result is shown in FIG.
- the vertical axis in FIG. 7 is the difference obtained by subtracting the force F UX for supporting the film being transported from the force F U0 for supporting the substrate before the film is transported, and the film lifting force F U (N).
- Example 2 Using the experimental apparatus shown in FIG. 8, a test for quantitatively measuring the variation in the height of the film was performed.
- the experimental apparatus shown in FIG. 8 has basically the same configuration as the apparatus shown in FIG. 1 except that there is no film forming chamber.
- 10 sets of fixed-type grip rollers are installed up and down, and 5 sets of variable-type grip rollers are installed only on the upper side.
- variable grip rollers were arranged at the fifth, seventh, ninth, eleventh and thirteenth positions.
- three sets of fixed-type grip rollers were installed up and down.
- the length of each section of the experimental equipment is as shown in the figure.
- the total transport distance of the film was about 40 m.
- a roller made of silicon rubber was used for each grip roller.
- the set angle ⁇ of the grip roller was all fixed at 1 °.
- a Kapton film was used as the film.
- the vertical axis of the graph in FIG. 9 indicates the amount of displacement (mm), which is the difference in height that has relatively changed from the initial height of the film.
- the horizontal axis represents the film transport distance (m).
- the thick line in the graph indicates the control target of the film displacement amount.
- the film was transported for about 16 m, stopped, the grip roller pressure was changed manually, and then the film was transported again.
- One film transport operation is defined as one step, and in FIG. 9, the displacement amount of the film measured at the positions of the sixth to thirteenth grip rollers is plotted for each step.
- the film was transported for 12 steps, and the film was transported by about 200 m. During that time, the amount of film displacement changed almost in the same way as the thick line as the control target, according to the change in the pressure applied to the grip roller. Therefore, it was confirmed that the amount of film displacement can be controlled as desired by changing the pressing force of the grip roller.
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Abstract
Description
F0:加圧バネの初期張力。
FαX:調整バネが調整レバーを引っ張る力。
R0:加圧レバーのレバー比。
R1:調整レバーのレバー比。
Fα0:調整バネの初期張力。
K:調整バネのバネ定数。
FαX:調整バネの張力の目標値。
FαS:調整バネの張力の実測値。
K:調整バネのバネ定数。
FPXR=FPX-ΔFPX ・・・(式4)
FPXR=F0-R0・R1・FαXR ・・・(式5)
FPXR=FPX+ΔFP ・・・(式6)
FPXR=F0-R0・R1・FαXR ・・・(式7)
上側の一対の可変型グリップローラにフィルムを挟み、フィルムを搬送させた際に生じたフィルムを支持する力の変化を測定した。グリップローラの設定角度θUを0°から7°まで1°ずつ変化させたとともに、各設定角度θUにおいて、グリップローラのフィルムを挟む加圧力を、4.4N、8.9N、16.3Nと増加させた。その結果を図7に示す。なお、図7の縦軸は、フィルムを搬送する前の基板を支持する力FU0から、搬送中のフィルムを支持する力FUXを減算した差分で、フィルムの引き上げ力FU(N)を表す。
図8に示す実験装置を用いて、フィルムの高さの変動を定量的に測定する試験を行った。図8に示す実験装置は、成膜室がない点を除いて、図1に示す装置と基本的に同じ構成である。図8に示す実験装置には、CVD成膜室を設ける区間において、一定型のグリップローラを上下にそれぞれ10セット設置するとともに、可変型のグリップローラを上のみに5セット設置した。なお、合計15セットのグリップローラのうち、可変型のグリップローラを第5、7、9、11、13番目に配置した。また、スパッタ成膜室を設ける区間には、一定型のグリップローラを上下にそれぞれ3セット設置した。
Claims (8)
- 帯状可撓性基板の表面に複数の薄膜を積層して薄膜積層体を製造する装置であって、
前記基板の幅方向が鉛直方向になるようにして、前記基板を水平方向に搬送する基板搬送手段と、
前記基板の搬送方向に沿って連続して配列され、前記基板の表面に成膜を行う複数の成膜室と、
前記複数の成膜室の間のうち少なくとも1つの間に配置され、前記基板の鉛直方向上側の端部を挟む少なくとも一対のグリップローラであって、このグリップローラの回転方向が前記基板の搬送方向に対して上方斜めに設置されているグリップローラと、
前記少なくとも一対のグリップローラの前記基板を挟む力を変化させることで、前記基板の高さを制御する制御手段と
を備えた薄膜積層体の製造装置。 - 帯状可撓性基板の表面に複数の薄膜を積層して薄膜積層体を製造する装置であって、
前記基板の幅方向が鉛直方向になるようにして、前記基板を水平方向に搬送する基板搬送手段と、
前記基板の搬送方向に沿って連続して配列され、前記基板の表面に成膜を行う複数の成膜室と、
前記複数の成膜室のそれぞれの間に配置され、前記基板の鉛直方向上側の端部を挟む複数対のグリップローラと、
前記複数の成膜室の間のうち少なくとも1つの間に配置され、前記基板の鉛直方向上側および下側の各端部を挟む少なくとも二対のグリップローラであって、前記上側の一対のグリップローラの回転方向が前記基板の搬送方向に対して上方斜めに設置されており、前記下側の一対のグリップローラの回転方向が前記基板の搬送方向に対して下方斜めに設置されているグリップローラと、
前記上側および下側の二対のグリップローラのうち、少なくとも一方のグリップローラの前記基板を挟む力を変化させることで、前記基板の高さを制御する制御手段と
を備えた薄膜積層体の製造装置。 - 前記グリップローラの基板を挟む力を変化させるアクチュエータと、
前記アクチュエータにエネルギーを入力するための動力手段と、
前記アクチュエータに入力したエネルギーを検出するロードセルと
を更に備え、前記制御装置が、前記グリップローラの基板を挟む力を目標値にするために、前記アクチュエータに入力するエネルギーの目標値を算出し、この入力エネルギーの目標値を前記動力手段で前記アクチュエータに入力した後、前記ロードセルで検出した入力エネルギーの検出値を、前記入力エネルギーの目標値と比較して、前記アクチュエータに入力するエネルギーの目標値を変更する請求項1又は2に記載の薄膜積層体の製造装置。 - 前記基板の高さを検出するセンサを更に備え、前記制御装置が、前記センサにより前記基板の高さが所定の範囲内でないと判定された場合に、前記グリップローラの基板を挟む力の目標値を変更する請求項3に記載の薄膜積層体の製造装置。
- 帯状可撓性基板の表面に複数の薄膜を積層して薄膜積層体を製造する方法であって、
前記基板の幅方向が鉛直方向になるようにして、前記基板を水平方向に搬送するステップと、
前記基板の搬送方向に沿って連続して配列された複数の成膜室により、前記基板の表面に成膜を行うステップと、
前記複数の成膜室の間のうち少なくとも1つの間に配置され、前記基板の鉛直方向上側の端部を挟む少なくとも一対のグリップローラであって、このグリップローラの回転方向が前記基板の搬送方向に対して上方斜めに設置されているグリップローラについて、その前記基板を挟む力を変化させることで、前記基板の高さを制御するステップと
を含む薄膜積層体の製造方法。 - 帯状可撓性基板の表面に複数の薄膜を積層して薄膜積層体を製造する方法であって、
前記基板の幅方向が鉛直方向になるようにして、前記基板を水平方向に搬送するステップと、
前記基板の搬送方向に沿って連続して配列された複数の成膜室により、前記基板の表面に成膜を行うステップと、
前記複数の成膜室の間のうち少なくとも1つの間に配置され、前記基板の鉛直方向上側および下側の各端部を挟む少なくとも二対のグリップローラであって、前記上側の一対のグリップローラの回転方向が前記基板の搬送方向に対して上方斜めに設置されており、前記下側の一対のグリップローラの回転方向が前記基板の搬送方向に対して下方斜めに設置されているグリップローラについて、これら上側および下側の二対のグリップローラのうち、少なくとも一方のグリップローラの前記基板を挟む力を変化させることで、前記基板の高さを制御するステップと
を含む薄膜積層体の製造方法。 - 前記基板の高さを制御するステップが、
前記グリップローラの基板を挟む力を目標値にするために、前記グリップローラの基板を挟む力を変化させるアクチュエータに入力するエネルギーの目標値を算出するステップと、
このエネルギーの目標値を、動力手段により前記アクチュエータに入力するステップと、
前記アクチュエータに入力したエネルギーをロードセルで検出し、この入力エネルギーの検出値を、前記入力エネルギーの目標値と比較して、前記アクチュエータに入力するエネルギーの目標値を変更するステップと
を更に含む請求項5又は6に記載の薄膜積層体の製造方法。 - 前記基板の高さを制御するステップが、
センサにより前記基板の高さを検出し、前記基板の高さが所定の範囲内であるかどうかを判定するステップと、
前記基板の高さが所定の範囲内でないと判定された場合に、前記グリップローラの基板を挟む力の目標値を変更するステップと
を更に含む請求項7に記載の薄膜積層体の製造方法。
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CN2009801003023A CN101796216B (zh) | 2008-03-31 | 2009-03-02 | 薄膜叠层体的制造装置和方法 |
JP2010505483A JP4840712B2 (ja) | 2008-03-31 | 2009-03-02 | 薄膜積層体の製造装置および方法 |
US12/676,103 US8431439B2 (en) | 2008-03-31 | 2009-03-02 | Thin film laminated body manufacturing apparatus and method |
EP09726802.3A EP2261394A4 (en) | 2008-03-31 | 2009-03-02 | EQUIPMENT AND METHOD FOR PRODUCING THIN FILM LAMINATES |
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WO2009122836A1 true WO2009122836A1 (ja) | 2009-10-08 |
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PCT/JP2009/053876 WO2009122836A1 (ja) | 2008-03-31 | 2009-03-02 | 薄膜積層体の製造装置および方法 |
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US (1) | US8431439B2 (ja) |
EP (1) | EP2261394A4 (ja) |
JP (1) | JP4840712B2 (ja) |
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WO (1) | WO2009122836A1 (ja) |
Cited By (9)
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WO2010073955A1 (ja) * | 2008-12-24 | 2010-07-01 | 富士電機ホールディングス株式会社 | 可撓性基板の処理装置 |
WO2011070960A1 (ja) * | 2009-12-11 | 2011-06-16 | 富士電機ホールディングス株式会社 | 可撓性基板の搬送装置 |
WO2011074438A1 (ja) * | 2009-12-16 | 2011-06-23 | 富士電機ホールディングス株式会社 | 可撓性基板の位置制御装置 |
WO2011126132A1 (ja) * | 2010-04-09 | 2011-10-13 | 株式会社ニコン | 基板処理装置 |
JP2012001768A (ja) * | 2010-06-17 | 2012-01-05 | Fuji Electric Co Ltd | 薄膜積層体製造装置の基板位置制御装置 |
JP2012026031A (ja) * | 2010-06-24 | 2012-02-09 | Fuji Electric Co Ltd | 薄膜積層体製造装置およびその運転方法 |
US20120031565A1 (en) * | 2009-01-28 | 2012-02-09 | Fuji Electric Co., Ltd. | Flexible substrate position control device |
CN102575342A (zh) * | 2010-02-09 | 2012-07-11 | 富士电机株式会社 | 用于柔性基板的位置控制器 |
EP2514852A1 (en) * | 2009-12-14 | 2012-10-24 | Fuji Electric Co., Ltd. | Conveyance device for film substrate |
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JP5201490B2 (ja) * | 2008-12-24 | 2013-06-05 | 富士電機株式会社 | 可撓性基板の処理装置および薄膜積層体の製造装置 |
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Also Published As
Publication number | Publication date |
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JP4840712B2 (ja) | 2011-12-21 |
US20110086457A1 (en) | 2011-04-14 |
EP2261394A4 (en) | 2013-05-01 |
CN101796216B (zh) | 2012-01-25 |
CN101796216A (zh) | 2010-08-04 |
EP2261394A1 (en) | 2010-12-15 |
US8431439B2 (en) | 2013-04-30 |
JPWO2009122836A1 (ja) | 2011-07-28 |
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