WO2009101914A1 - 重合体、これを用いた有機薄膜及び有機薄膜素子 - Google Patents
重合体、これを用いた有機薄膜及び有機薄膜素子 Download PDFInfo
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- WO2009101914A1 WO2009101914A1 PCT/JP2009/052156 JP2009052156W WO2009101914A1 WO 2009101914 A1 WO2009101914 A1 WO 2009101914A1 JP 2009052156 W JP2009052156 W JP 2009052156W WO 2009101914 A1 WO2009101914 A1 WO 2009101914A1
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- thin film
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- organic
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Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G61/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
- C08G61/12—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule
- C08G61/122—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule derived from five- or six-membered heterocyclic compounds, other than imides
- C08G61/123—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule derived from five- or six-membered heterocyclic compounds, other than imides derived from five-membered heterocyclic compounds
- C08G61/126—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule derived from five- or six-membered heterocyclic compounds, other than imides derived from five-membered heterocyclic compounds with a five-membered ring containing one sulfur atom in the ring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
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Definitions
- the present invention relates to a polymer, an organic thin film using the polymer, and an organic thin film element.
- Thin films containing an organic material having charge (electron or hole) transport properties are expected to be applied to organic thin film elements such as organic thin film transistors, organic solar cells, and optical sensors, and organic p-type semiconductors (showing hole transport properties) ) And organic n-type semiconductors (showing electron transport properties) have been studied in various ways.
- a compound having a thiophene ring such as oligothiophene or polythiophene is expected to exhibit a high hole transport property because it can take a stable radical cation state.
- oligothiophenes with long chain lengths are expected to have a longer conjugation length and more effective hole transport, but linear molecules have poor molecular ordering in the solid state, so intermolecular interactions Is not enough, and its potential is still not fully utilized.
- dendrimers and hyperbranched polymers have attracted attention. Unlike linear compounds, dendrimers and hyperbranched polymers have characteristics such as low viscosity, good solubility in organic solvents, and functional expression by introduction of functional groups. In addition, various oligothiophenes having a branched structure have been reported (see Patent Document 1). Patent No. 3074277
- an object of the present invention is to provide a polymer that is excellent in charge transportability and solubility in a solvent and can be used as an organic p-type semiconductor capable of forming a thin film almost uniformly.
- Another object of the present invention is to provide an organic thin film containing the polymer and an organic thin film element comprising the organic thin film.
- the present invention includes a repeating structure represented by the following general formula (1), and L and X are each independently composed of a plurality of conjugate forming structures conjugated by themselves.
- a polymer comprising at least one thienylene structure as the conjugate forming structure is provided.
- X represents a monovalent organic group which may have a substituent
- L represents a divalent organic group which may have a substituent
- T has a substituent.
- the trivalent organic group which may be carried out is shown.
- X, L, and T in the formulas each represent the same group.
- the polymer of the present invention has a thiophene ring structure at least in L or X, the conjugation planarity between the rings becomes good and the interaction between molecules can be strengthened, so that the organic semiconductor excellent in charge transportability Is available as In addition to these, since the polymer of the present invention has excellent solubility in a solvent, an organic thin film element having excellent performance can be produced by forming a substantially homogeneous thin film using a solution.
- X, L and T form a conjugated structure as a whole.
- branched conjugated structure the planarity of the whole molecule is enhanced and the conjugation is enhanced, and the charge transportability when used as an organic semiconductor is remarkably excellent.
- L is preferably a divalent organic group represented by the following general formula (2).
- Ar 1 represents a divalent aromatic hydrocarbon group which may have a substituent or a divalent heterocyclic group which may have a substituent.
- R 1 , R 2 , R 3 and R 4 are each independently a hydrogen atom, an alkyl group, an alkoxy group, an aryl group which may have a substituent, or a monovalent complex which may have a substituent.
- a cyclic group is shown, and some or all of the hydrogen atoms in these groups may be substituted with fluorine atoms.
- R 1 , R 2 , R 3 and R 4 When a plurality of R 1 , R 2 , R 3 and R 4 are present, these (plural R 1 , R 2 , R 3 and R 4 ) may be the same or different.
- M, n and o each independently represent an integer of 0 to 10. However, at least one of m and o is an integer of 1 or more, and m + n + o is an integer of 2 to 20.
- the polymer having such a structure has good conjugation and particularly excellent stability of the compound. Therefore, it is further excellent in charge transportability and exhibits excellent characteristics when applied as an organic p-type semiconductor.
- T is preferably any of the trivalent organic groups represented by the following general formulas (3) to (7), and the trivalent represented by the following formula (4 ′) Particularly preferred is an organic group.
- R 5 represents a hydrogen atom, an alkyl group, an alkoxy group, an aryl group or a cyano group.
- X is particularly preferably a monovalent organic group represented by the following general formula (8).
- Ar 2 represents a divalent aromatic hydrocarbon group which may have a substituent or a divalent heterocyclic group which may have a substituent.
- R 6 , R 7 , R 8 and R 9 are each independently a hydrogen atom, an alkyl group, an alkoxy group, an aryl group which may have a substituent, or a monovalent complex which may have a substituent.
- a cyclic group is shown, and some or all of the hydrogen atoms in these groups may be substituted with fluorine atoms.
- R 6 , R 7 , R 8 and R 9 may be the same or different.
- R 10 represents a hydrogen atom or a monovalent group which may have a substituent.
- P, q and r each independently represent an integer of 0 to 10. However, at least one of p and r is an integer of 1 or more, and p + q + r is an integer of 2 to 20.
- the polymer composed of the structure as described above is further excellent in conjugation, and can be used as an organic p-type semiconductor that is more excellent in charge transportability and stability.
- L is a divalent organic group represented by the general formula (2)
- the uniformity of the whole molecule is excellent, the conjugation property of the whole molecule is increased, and the organic semiconductor is used.
- the charge transport property of the is greatly improved.
- the repeating structure represented by the general formula (1) is preferably a repeating structure represented by the following general formula (9).
- R 11 , R 12 , R 13 and R 14 each independently have a hydrogen atom, an alkyl group, an alkoxy group, an aryl group which may have a substituent, or a substituent.
- a monovalent heterocyclic group may be used, and some or all of the hydrogen atoms in these groups may be substituted with fluorine atoms.
- R 11 , R 12 , R 13 and R 14 when s and / or t is 2 or more and any of R 11 , R 12 , R 13 and R 14 is present, these (plural R 11 , R 12 , R 13 and R 14 are present. ) May be the same or different.
- R 15 represents a hydrogen atom or a monovalent group which may have a substituent.
- s and t each independently represents an integer of 2 to 12.
- R ⁇ 11 >, R ⁇ 12 >, R ⁇ 13 >, R ⁇ 14 >, R ⁇ 14 >, and R ⁇ 15 > as described in Formula (9) show the same group, respectively.
- s and t which are described in Formula (9) are the respectively same integers.
- the polymer having the repeating structure represented by the general formula (9) has excellent uniformity, and therefore has excellent conjugation, and can be used as an organic p-type semiconductor that is more excellent in charge transportability and stability. .
- the polymer of the present invention preferably has at least one repeating structure represented by the general formula (1) and at least one repeating structure represented by the following general formula (10).
- Ar 3 represents a divalent aromatic hydrocarbon group which may have a substituent or a divalent heterocyclic group which may have a substituent.
- the polymer having the above-described structure is preferable in that the range in which solubility, mechanical, thermal, or electronic properties can be changed is widened.
- the present invention also provides an organic thin film containing the polymer of the present invention.
- the present invention further provides an organic thin film element, an organic thin film transistor, an organic solar cell, and an optical sensor comprising the organic thin film.
- the present invention it is possible to provide a novel polymer that is excellent in charge transportability and solubility in a solvent and can be used as an organic p-type semiconductor capable of forming a thin film almost uniformly. Moreover, according to this invention, an organic thin film containing this polymer and an organic thin film element provided with this organic thin film can be provided.
- FIG. 4 is a UV-visible absorption and fluorescence spectrum diagram of polymers A to D.
- 6 is a characteristic diagram of an organic thin film transistor 1 in Example 4.
- FIG. 10 is a characteristic diagram of an organic thin film transistor 2 in Example 5.
- 10 is a characteristic diagram of an organic thin film transistor 3 in Comparative Example 2.
- FIG. 4 is a UV-visible absorption and fluorescence spectrum diagram of polymers A to D.
- 6 is a characteristic diagram of an organic thin film transistor 1 in Example 4.
- FIG. 10 is a characteristic diagram of an organic thin film transistor 2 in Example 5.
- 10 is a characteristic diagram of an organic thin film transistor 3 in Comparative Example 2.
- the polymer of the present invention only needs to contain at least one repeating structure represented by the general formula (1), and may contain two or more repeating structures represented by the general formula (1).
- a polymer means what has two or more monomer structures, and shall include both what is normally classified into an oligomer and a polymer.
- the repeating structure represented by the general formula (1) has a structure in which two identical structural units composed of X, L, and T (one each) are continuous. As described above, by including a structure in which at least two identical structural units are continuous, the polymer of the present invention suppresses the formation of an agglomerated structure observed in a low molecule during thin film formation, and a homogeneous thin film is obtained. And it becomes possible to express the favorable charge transportability stably.
- the polymer of the present invention may include a repeating structure represented by the following general formula (1 ').
- X ′, L ′ and T ′ have the same meanings as X, L and T in the formula (1), respectively, but X ′ and X, L ′ and L, and T ′ and T May be the same or different.
- L and X are each independently composed of a plurality of conjugation-forming structures (conjugate-forming structures that generate conjugation by conjugation), and at least one conjugate-forming structure is formed. Contains thienylene structure.
- X represents a monovalent organic group which may have a substituent
- L represents a divalent organic group which may have a substituent
- T has a substituent. The trivalent organic group which may be carried out is shown.
- L is a structure represented by the above general formula (2) because the conjugation property of the polymer is further improved and the charge transport property is improved.
- Ar 1 represents a divalent aromatic hydrocarbon group which may have a substituent or a divalent heterocyclic group which may have a substituent.
- R 1 , R 2 , R 3 and R 4 are each independently a hydrogen atom, an alkyl group, an alkoxy group, an aryl group which may have a substituent or a monovalent which may have a substituent. It represents a heterocyclic group, and some or all of the hydrogen atoms in these groups may be substituted with fluorine atoms. When there are a plurality of R 1 , R 2 , R 3 and R 4 , these may be the same or different.
- M, n and o each independently represent an integer of 0 to 10. However, at least one of m and o is an integer of 1 or more, m + n + o is an integer of 2 to 20, and m + n + o is preferably an integer of 2 to 12.
- the polymer in which L is a structure represented by the above general formula (2) has high conjugation property and particularly excellent stability of the compound. Therefore, it is further excellent in charge transportability and exhibits excellent characteristics when applied as an organic p-type semiconductor.
- T is preferably any one of the trivalent organic groups represented by the above general formulas (3) to (7), and the trivalent represented by the above formula (4 ′).
- the organic group is particularly preferable.
- R 5 represents a hydrogen atom, an alkyl group, an alkoxy group, an aryl group or a cyano group.
- a monovalent organic group represented by the general formula (8) is particularly preferable as X in the general formula (1).
- Ar 2 represents a divalent aromatic hydrocarbon group which may have a substituent or a divalent heterocyclic group which may have a substituent.
- R 6 , R 7 , R 8 and R 9 are each independently a hydrogen atom, an alkyl group, an alkoxy group, an aryl group which may have a substituent, or a monovalent which may have a substituent. It represents a heterocyclic group, and some or all of the hydrogen atoms in these groups may be substituted with fluorine atoms.
- R ⁇ 6 >, R ⁇ 7> , R ⁇ 8 > and R ⁇ 9 > may be same or different, respectively.
- R 10 represents a hydrogen atom or a monovalent group which may have a substituent.
- P, q and r each independently represent an integer of 0 to 10. However, at least one of p and r is an integer of 1 or more, p + q + r is an integer of 2 to 20, and p + q + r is preferably an integer of 2 to 12.
- the polymer in which X is a monovalent organic group represented by the above general formula (8) is further excellent in conjugation, and is used as an organic p-type semiconductor that is more excellent in charge transportability and stability. It becomes possible.
- X is a monovalent organic group represented by the general formula (8) and L is a divalent organic group represented by the general formula (2)
- the entire molecule is uniform.
- the conjugation property of the molecule as a whole increases, and the charge transport property when used as a p-type organic semiconductor is greatly improved.
- the repeating structure represented by the general formula (1) is preferably a repeating structure represented by the following general formula (9).
- R 11 , R 12 , R 13 and R 14 each independently have a hydrogen atom, an alkyl group, an alkoxy group, an aryl group which may have a substituent, or a substituent.
- the monovalent heterocyclic group which may be sufficient, The one part or all part hydrogen atom in these groups may be substituted by the fluorine atom.
- R 15 represents a hydrogen atom or a monovalent group which may have a substituent.
- S and t each independently represents an integer of 2 to 12. However, each other R 11 in the formula (9), R 12 together, R 13 together, R 14 together and R 15 each other, respectively represent the same group.
- s and t in Formula (9) are the same integers, respectively.
- the polymer of the present invention has at least one repeating structure represented by the above general formula (1) and a repeating structure represented by the following general formula (10) different from the repeating structure represented by the above general formula (1). It is preferred to have at least one of the structures. By adopting such a configuration, the range in which solubility, mechanical, thermal, or electronic properties can be changed is widened.
- Ar 3 represents a divalent aromatic hydrocarbon group which may have a substituent or a divalent heterocyclic group which may have a substituent.
- the ratio of the repeating structure represented by the general formula (1) to the repeating structure represented by the following general formula (10) is preferably 10 to 1000 moles, more preferably 100 moles to the latter. Is 25 to 400 mol of the latter with respect to 100 mol of the former, and more preferably 50 to 200 mol of the latter with respect to 100 mol of the former.
- the divalent aromatic hydrocarbon group represented by Ar 1 , Ar 2, and Ar 3 is a group of two hydrogen atoms from a benzene ring or a condensed ring. It refers to the remaining atomic group, and usually has 6 to 60 carbon atoms, preferably 6 to 20 carbon atoms.
- the condensed ring include a naphthalene ring, an anthracene ring, a tetracene ring, a pentacene ring, a pyrene ring, a perylene ring, a rubrene ring, and a fluorene ring.
- the divalent aromatic hydrocarbon group is particularly preferably an atomic group remaining after removing two hydrogen atoms from a benzene ring and a fluorene ring.
- the carbon number of the divalent aromatic hydrocarbon group does not include the carbon number of the substituent.
- the substituent include a halogen atom, a saturated or unsaturated hydrocarbon group, an aryl group, an alkoxy group, an aryloxy group, a monovalent heterocyclic group, an amino group, a nitro group, and a cyano group.
- the divalent heterocyclic group represented by Ar 1 , Ar 2 and Ar 3 refers to the remaining atomic group obtained by removing two hydrogen atoms from a heterocyclic compound, and the carbon number is usually 4 to 60. , Preferably 4-20.
- the heterocyclic compound is an organic compound having a cyclic structure, and the elements constituting the ring include not only carbon atoms but also heteroatoms such as oxygen, sulfur, nitrogen, phosphorus, boron, and silicon in the ring. The thing included in.
- heterocyclic compound examples include compounds in which 2 to 6 thiophene rings are condensed, such as thiophene, thienothiophene, and dithienothiophene, pyrrole, pyridine, pyrimidine, pyrazine, and triazine.
- the divalent heterocyclic group is particularly preferably an atomic group remaining after removing two hydrogen atoms from thiophene, thienothiophene, or dithienothiophene.
- substituents examples include a halogen atom, a saturated or unsaturated hydrocarbon group, an aryl group, an alkoxy group, an aryloxy group, a monovalent heterocyclic group, an amino group, a nitro group, and a cyano group.
- the structure including the repeating structure represented by the general formula (1) is represented by the following general formula (11) or (12) from the viewpoint of enhancing charge transportability.
- a structure is preferred.
- R 1 to R 10 , Ar 1 to Ar 3 , m, n, o, p, q, and r are as defined above.
- R 1 to R 10 and Ar 1 to Ar 3 may be the same or different.
- k represents an integer of 1 to 10, preferably an integer of 1 to 6, and more preferably an integer of 1 to 3.
- n and q are 0 are particularly preferable.
- terminal groups include a hydrogen atom, a fluorine atom, a hydroxy group, an alkyl group, an alkoxy group, an acyl group, an aminoketo group, an aryl group, and a monovalent complex.
- examples thereof include cyclic groups (some or all of hydrogen atoms bonded to these groups may be substituted with fluorine atoms), groups having an ⁇ -fluoroketone structure, electron donating groups, and electron withdrawing groups.
- An alkyl group, an alkoxy group, and an aryl group are preferable.
- those having a conjugated bond continuous with the conjugated structure of the main chain are also preferable, and examples thereof include a structure bonded to an aryl group or a monovalent heterocyclic group via a carbon-carbon bond.
- the polymer of the present invention has a polymerization active group as the terminal group of the polymer, they can also be used as a precursor of the polymer.
- the polymer preferably has two polymerization active groups in the molecule.
- Polymerization active groups include halogen atoms, alkyl sulfonate groups, aryl sulfonate groups, arylalkyl sulfonate groups, alkylstannyl groups, arylstannyl groups, arylalkylstannyl groups, boric acid ester residues, sulfonium methyl groups, phosphonium methyl groups.
- boric acid residue represents a group (—B (OH) 2 ) in which a hydroxyl group is substituted for boron
- boric acid ester residue represents, for example, the following group.
- the polymer of the present invention when used as an organic thin film, if a polymerization active group remains as it is at the end group, the properties and durability when it is made into a device may be lowered. You may make it do.
- polymers of the present invention particularly preferred polymers are those represented by the following general formulas (1-1) to (1-6).
- R 11 , R 12 , R 13 and R 14 are as defined above.
- R 16 and R 17 represent a terminal group, which may be the same or different, and examples of the terminal group described above are preferable, and a hydrogen atom, a hydroxy group, an alkyl group, an alkoxy group, and an aryl group are preferable.
- R 18 and R 19 each independently represent a hydrogen atom or a substituent, preferably an alkyl group, an alkoxy group or an aryl group, and more preferably an alkyl group. When a plurality of R 11 , R 12 , R 13 , R 14 , R 18 and R 19 are present in the polymer, they may be the same or different.
- g can be suitably selected according to the formation method of the organic thin film using a polymer.
- g is 2 or more, and at least two structural units in which R 11 , R 12 , R 13 , R 14 , R 18 and R 19 are the same must be continuous.
- the polymer has sublimability, it can be formed into an organic thin film by using a vapor phase growth method such as vacuum vapor deposition. In this case, g is preferably 2 to 10, and more preferably 2 to 5.
- g is preferably 3 to 500, more preferably 6 to 300, and further preferably 20 to 200.
- the polystyrene-equivalent number average molecular weight of the polymer is preferably 1 ⁇ 10 3 to 1 ⁇ 10 8, more preferably 1 ⁇ 10 3 to 1 ⁇ 10 6. 5 ⁇ 10 3 to 1 ⁇ 10 5 is more preferable.
- the monovalent group represented by R 10 and R 15 is a linear or branched low molecular chain, a monovalent cyclic group (this cyclic group may be a single ring or a condensed ring). However, it may be carbocyclic or heterocyclic, saturated or unsaturated, and may or may not have a substituent.
- the monovalent group may be an electron donating group or an electron withdrawing group.
- the monovalent group represented by R 10 and R 15 is a linear or branched low molecular chain (having 1 to 20 carbon atoms), having 3 to 60 ring atoms.
- a monovalent cyclic group (this cyclic group may be monocyclic or condensed, carbocyclic or heterocyclic, saturated or unsaturated, may or may not have a substituent), saturated or unsaturated Saturated hydrocarbon group, hydroxy group, alkoxy group, alkanoyloxy group, amino group, oxyamino group, alkylamino group, dialkylamino group, alkanoylamino group, cyano group, nitro group, sulfo group, with one or more halogen atoms
- a substituted alkyl group, an alkoxysulfonyl group (wherein the alkyl group may be substituted with one or more halogen atoms), an alkylsulfonyl group (wherein the alkyl group contains one or more Androgenic may
- examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
- the alkyl group represented by R 1 to R 17 is preferably a linear, branched or cyclic alkyl group having 1 to 20 carbon atoms, such as a methyl group, an ethyl group, or n-propyl.
- Examples of the alkoxy group represented by R 1 to R 17 include an alkoxy group containing the above-described alkyl group in its structure.
- an aryl group having 6 to 60 carbon atoms is preferable, and a phenyl group, a C 1 to C 12 alkoxyphenyl group (C 1 to C 12 has 1 to 12 carbon atoms, and C 1 to C 12 alkylphenyl group, 1-naphthyl group, 2-naphthyl group and the like are exemplified, and aryl groups having 6 to 20 carbon atoms are preferable, phenyl group, A C 1 -C 12 alkoxyphenyl group and a C 1 -C 12 alkylphenyl group are more preferred, and a phenyl group is more preferred.
- the monovalent heterocyclic group represented by R 1 to R 17 is preferably a monovalent heterocyclic group having 4 to 60 carbon atoms, and includes a thienyl group, a C 1 to C 12 alkylthienyl group, a pyrrolyl group, and a furyl group. And a pyridyl group, a C 1 -C 12 alkylpyridyl group, etc., and a heterocyclic group having 4 to 20 carbon atoms is preferred, and a thienyl group, a C 1 -C 12 alkylthienyl group, a pyridyl group, a C 1 -C 12 alkyl A pyridyl group is more preferred.
- Examples of the unsaturated hydrocarbon group represented by R 10 and R 15 include vinyl group, 1-propenyl group, allyl group, propargyl group, isopropenyl group, 1-butenyl group and 2-butenyl group. Groups are preferred.
- alkanoyl group examples include a formyl group, an acetyl group, a propionyl group, an isobutyryl group, a valeryl group and an isovaleryl group. is there. Further, an alkanoyl group having 1 carbon atom means a formyl group, and the same applies to a group containing an alkanoyl group in its structure. Preferable alkanoyl groups include formyl group and acetyl group.
- the polymer of the present invention may be produced by any method, but is preferably produced by the production method described below.
- the polymer represented by the general formula (1) can be produced, for example, by reacting the compounds represented by the following general formulas (a), (b) and (d) as raw materials.
- the precursor (c) is produced by using the starting materials represented by the following general formulas (a) and (b) according to the following scheme. It can be produced by a step of reacting this precursor and the starting material represented by (d). Furthermore, it is preferable to use a production method including a step of introducing a terminal group.
- V 1 to V 4 and W 1 to W 4 each represent a reactive group, and may be the same or different, and are each a halogen atom, an alkyl sulfonate group, an aryl sulfonate group, an arylalkyl sulfonate group, an alkylstannyl group, Nyl group, arylalkylstannyl group, boric acid ester residue, sulfonium methyl group, phosphonium methyl group, phosphonate methyl group, monohalogenated methyl group, boric acid residue, formyl group, or vinyl group.
- V 1 to V 4 and W 1 to W 4 are each independently a halogen atom, an alkyl sulfonate group, an aryl sulfonate group, an aryl alkyl sulfonate group, an alkyl stannyl group, a boron It is preferably an acid ester residue or a boric acid residue.
- V 1 to V 4 and W 1 to W 4 may be appropriately selected depending on the coupling reaction used, and are selected so that only reactive groups represented by V z and W z (z is 1 to 4) react with each other. It is preferable to do.
- the above reaction step in order to protect a highly reactive functional group, it includes a step of converting to an inactive functional group (protecting group) in the subsequent reaction, and a step of removing the protective group after completion of the target reaction. You may go out.
- the protecting group can be appropriately selected depending on the functional group to be protected and the reaction used. For example, trimethylsilyl (TMS), triethylsilyl (TES), tert-butyldimethylsilyl (TBS or TBDMS), Triisopropylsilyl (TIPS) and tert-butyldiphenylsilyl (TBDPS) are preferably used.
- a solvent may be used.
- the solvent to be used is preferably one that does not inhibit the target reaction as much as possible, such as aliphatic hydrocarbons such as hexane, aromatic hydrocarbons such as benzene and toluene, nitriles such as acetonitrile, diethyl ether, tetrahydrofuran, 1,2, and the like.
- -Ethers such as dimethoxyethane, halogenated solvents such as dichloromethane, 1,2-dichloroethane, carbon tetrachloride and the like. These may be used alone or in combination of two or more.
- a suitable solvent includes dichloromethane.
- the polymer of the present invention When the polymer of the present invention is used as a material for an organic thin film device, its purity affects the device characteristics. Therefore, it is preferable to purify the produced compound by methods such as distillation, sublimation purification, and recrystallization.
- reaction conditions, reaction reagents, etc. in the above production method can be appropriately selected in addition to the above examples. Moreover, it is preferable to manufacture the polymer of this invention by the said manufacturing method as above-mentioned.
- reaction method used for producing the polymer of the present invention a method using Wittig reaction, a method using Heck reaction, a method using Horner-Wadsworth-Emmons reaction, a method using Knoevenagel reaction, and a Suzuki coupling reaction are used.
- disassembly of the intermediate compound which has is illustrated.
- a method using a Wittig reaction a method using a Heck reaction, a method using a Horner-Wadsworth-Emmons reaction, a method using a Knoevenagel reaction, a method using a Suzuki coupling reaction, a method using a Grignard reaction, and a Stille reaction are used.
- a method and a method using a Ni (0) catalyst are preferable from the viewpoint of easy structure control.
- a method using a Suzuki coupling reaction, a method using a Grignard reaction, a method using a Stille reaction, and a method using a Ni (0) catalyst are preferable because of easy availability of raw materials and simple reaction operation.
- the starting material (the compound represented by the above general formula (a), (b) or (d)) for producing the polymer of the present invention is dissolved in an organic solvent, if necessary, and an alkali or an appropriate catalyst.
- the reaction can be carried out at a melting point of the organic solvent or higher and a boiling point or lower.
- the organic solvent varies depending on the compound and reaction to be used, it is generally preferable that the solvent to be used is sufficiently deoxygenated and the reaction proceeds in an inert atmosphere in order to suppress side reactions. Similarly, it is preferable to perform a dehydration treatment (however, this is not the case in the case of a two-phase reaction with water such as the Suzuki coupling reaction).
- an alkali or a suitable catalyst can be added as appropriate for the reaction. These may be selected according to the reaction used. This alkali or catalyst is preferably one that is sufficiently dissolved in the solvent used in the reaction.
- the purity affects the device characteristics. Therefore, the monomer before the reaction may be polymerized after being purified by a method such as distillation, sublimation purification, or recrystallization. preferable. Further, after the synthesis of the polymer, it is preferable to carry out a purification treatment such as reprecipitation purification and fractionation by chromatography.
- Solvents used in the reaction include saturated hydrocarbons such as pentane, hexane, heptane, octane and cyclohexane, unsaturated hydrocarbons such as benzene, toluene, ethylbenzene and xylene, carbon tetrachloride, chloroform, dichloromethane, chlorobutane, bromobutane, chloro Halogenated saturated hydrocarbons such as pentane, bromopentane, chlorohexane, bromohexane, chlorocyclohexane and bromocyclohexane, halogenated unsaturated hydrocarbons such as chlorobenzene, dichlorobenzene and trichlorobenzene, methanol, ethanol, propanol, isopropanol, butanol, alcohols such as t-butyl alcohol, carboxylic acids such as formic acid, acetic acid and prop
- the product can be obtained by usual post-treatment such as quenching with water and then extracting with an organic solvent and distilling off the solvent.
- the isolation and purification of the product can be performed by a method such as fractionation by chromatography or recrystallization.
- the organic thin film of the present invention contains the polymer of the present invention.
- the film thickness of the organic thin film is usually about 1 nm to 100 ⁇ m, preferably 2 nm to 1000 nm, more preferably 5 nm to 500 nm, and particularly preferably 20 nm to 200 nm.
- the organic thin film may contain one type of the above polymer alone, or may contain two or more types of the above polymer. Moreover, in order to improve the electron transport property or hole transport property of an organic thin film, the low molecular compound or high molecular compound which has electron transport property or hole transport property other than the said polymer can also be mixed and used.
- hole transporting material known materials can be used, such as pyrazoline derivatives, arylamine derivatives, stilbene derivatives, triaryldiamine derivatives, oligothiophenes and derivatives thereof, polyvinylcarbazole and derivatives thereof, polysilanes and derivatives thereof, side chains or main chains.
- pyrazoline derivatives such as pyrazoline derivatives, arylamine derivatives, stilbene derivatives, triaryldiamine derivatives, oligothiophenes and derivatives thereof, polyvinylcarbazole and derivatives thereof, polysilanes and derivatives thereof, side chains or main chains.
- examples include polysiloxane derivatives having an aromatic amine in the chain, polyaniline and derivatives thereof, polythiophene and derivatives thereof, polypyrrole and derivatives thereof, polyarylene vinylene and derivatives thereof, polythienylene vinylene and derivatives thereof, and the like.
- Known materials can be used as electron transporting materials, such as oxadiazole derivatives, anthraquinodimethane and its derivatives, benzoquinone and its derivatives, naphthoquinone and its derivatives, anthraquinone and its derivatives, tetracyanoanthraquinodimethane and its derivatives.
- fluorenone derivatives, diphenyldicyanoethylene and derivatives thereof, diphenoquinone derivatives, 8-hydroxyquinoline and metal complexes of derivatives thereof, polyquinoline and derivatives thereof, polyquinoxaline and derivatives thereof, polyfluorene and derivatives thereof, fullerenes such as C 60 and a Examples include derivatives.
- the organic thin film of the present invention may contain a charge generating material in order to generate a charge by light absorbed in the organic thin film.
- a charge generation material such as azo compounds and derivatives thereof, diazo compounds and derivatives thereof, metal-free phthalocyanine compounds and derivatives thereof, metal phthalocyanine compounds and derivatives thereof, perylene compounds and derivatives thereof, and polycyclic quinone compounds. and derivatives thereof, squarylium compounds and their derivatives, azulenium compounds and their derivatives, thiapyrylium compounds and their derivatives, fullerenes and derivatives thereof such as C 60 is illustrated.
- the organic thin film of the present invention may contain materials necessary for developing various functions.
- this material include a sensitizer for sensitizing the function of generating charge by absorbed light, a stabilizer for increasing stability, a UV absorber for absorbing UV light, and the like. .
- the organic thin film of the present invention may contain a polymer compound material other than the above polymer as a polymer binder in order to enhance mechanical properties.
- a polymer binder those not extremely disturbing the electron transport property or hole transport property and those not strongly absorbing visible light are preferable.
- Such polymer binders include poly (N-vinylcarbazole), polyaniline and derivatives thereof, polythiophene and derivatives thereof, poly (p-phenylene vinylene) and derivatives thereof, poly (2,5-thienylene vinylene) and derivatives thereof.
- Derivatives, polycarbonate, polyacrylate, polymethyl acrylate, polymethyl methacrylate, polystyrene, polyvinyl chloride, polysiloxane and the like are exemplified.
- Examples of the method for producing an organic thin film of the present invention include a method by film formation from a solution containing the polymer, an electron transporting material or hole transporting material mixed as necessary, and a polymer binder.
- the polymer of the present invention can also be formed into a thin film by a vacuum deposition method.
- any solvent that dissolves a polymer, an electron transporting material or a hole transporting material to be mixed, and a polymer binder may be used.
- Solvents used when the organic thin film of the present invention is formed from solution include unsaturated carbonization such as toluene, xylene, mesitylene, tetralin, decalin, bicyclohexyl, n-butylbenzene, sec-butylbenzene, tert-butylbenzene, etc.
- Hydrogenated solvents carbon tetrachloride, chloroform, dichloromethane, dichloroethane, chlorobutane, bromobutane, chloropentane, bromopentane, chlorohexane, bromohexane, chlorocyclohexane, bromocyclohexane, and other halogenated saturated hydrocarbon solvents, chlorobenzene, dichlorobenzene, Examples thereof include halogenated unsaturated hydrocarbon solvents such as trichlorobenzene and ether solvents such as tetrahydrofuran and tetrahydropyran. Although depending on the structure and molecular weight of the polymer, it can usually be dissolved in these solvents in an amount of 0.1% by mass or more.
- spin coating method For film formation from solution, spin coating method, casting method, micro gravure coating method, gravure coating method, bar coating method, roll coating method, wire bar coating method, dip coating method, spray coating method, screen printing method, flexographic method Coating methods such as a printing method, an offset printing method, an ink jet printing method, and a dispenser printing method can be used, and a spin coating method, a flexographic printing method, an ink jet printing method, and a dispenser printing method are preferably used.
- the organic thin film of the present invention has an electron transporting property or a hole transporting property, by controlling the transport of electrons or holes injected from the electrode or charges generated by light absorption, an organic thin film transistor, an organic solar cell, light It can be used for various organic thin film elements such as sensors.
- the organic thin film of the present invention has a hole transport property, by controlling the transport of holes injected from an electrode or holes generated by light absorption, an organic electroluminescence element, an organic transistor, an organic solar cell, an optical sensor It can be used for various organic thin film elements.
- the organic thin film transistor has a source electrode and a drain electrode, an organic thin film layer (active layer) containing the polymer of the present invention that serves as a current path between them, and a gate electrode that controls the amount of current passing through the current path.
- a field effect type, an electrostatic induction type, etc. are illustrated.
- the field effect organic thin film transistor includes a source electrode and a drain electrode, an organic thin film layer (active layer) containing the polymer of the present invention which is a current path between them, a gate electrode for controlling the amount of current passing through the current path, and an active It is preferable to provide an insulating layer disposed between the layer and the gate electrode.
- a source electrode and a drain electrode are provided in contact with an organic thin film layer (active layer) containing the polymer of the present invention, and a gate electrode is provided with an insulating layer in contact with the organic thin film layer interposed therebetween. It is preferable.
- the electrostatic induction type organic thin film transistor has a source electrode and a drain electrode, an organic thin film layer containing the polymer of the present invention which becomes a current path between them, and a gate electrode for controlling the amount of current passing through the current path, It is preferable that the gate electrode is provided in the organic thin film layer.
- the source electrode, the drain electrode, and the gate electrode provided in the organic thin film layer are preferably provided in contact with the organic thin film layer containing the polymer of the present invention.
- the structure of the gate electrode may be any structure as long as a current path flowing from the source electrode to the drain electrode is formed and the amount of current flowing through the current path can be controlled by a voltage applied to the gate electrode, and an example is a comb electrode .
- FIG. 1 is a schematic cross-sectional view of an organic thin film transistor (field effect organic thin film transistor) according to a first embodiment.
- An organic thin film transistor 100 shown in FIG. 1 includes a substrate 1, a source electrode 5 and a drain electrode 6 formed on the substrate 1 with a predetermined interval, and a source electrode 5 and a drain electrode 6 so as to cover the substrate 1. Formed on the insulating layer 3 so as to cover the region of the insulating layer 3 between the source electrode 5 and the drain electrode 6, the insulating layer 3 formed on the active layer 2, and the insulating layer 3 formed between the source electrode 5 and the drain electrode 6. And a gate electrode 4.
- FIG. 2 is a schematic cross-sectional view of an organic thin film transistor (field effect organic thin film transistor) according to a second embodiment.
- An organic thin film transistor 110 shown in FIG. 2 includes a substrate 1, a source electrode 5 formed on the substrate 1, an active layer 2 formed on the substrate 1 so as to cover the source electrode 5, a source electrode 5 and a predetermined electrode.
- the drain electrode 6 formed on the active layer 2 with an interval of the insulating layer 3 formed on the active layer 2 and the drain electrode 6, and the insulating layer 3 between the source electrode 5 and the drain electrode 6.
- a gate electrode 4 formed on the insulating layer 3 so as to cover the region.
- FIG. 3 is a schematic cross-sectional view of an organic thin film transistor (field effect organic thin film transistor) according to a third embodiment.
- the organic thin film transistor 120 shown in FIG. 3 includes a substrate 1, an active layer 2 formed on the substrate 1, a source electrode 5 and a drain electrode 6 formed on the active layer 2 with a predetermined interval, and a source electrode. 5 and the drain electrode 6 so as to partially cover the insulating layer 3 formed on the active layer 2, the region of the insulating layer 3 where the source electrode 5 is formed below, and the drain electrode 6 are formed below.
- a gate electrode 4 formed on the insulating layer 3 so as to partially cover the region of the insulating layer 3.
- FIG. 4 is a schematic cross-sectional view of an organic thin film transistor (field effect organic thin film transistor) according to a fourth embodiment.
- 4 includes a substrate 1, a gate electrode 4 formed on the substrate 1, an insulating layer 3 formed on the substrate 1 so as to cover the gate electrode 4, and the gate electrode 4 at the bottom.
- the source electrode 5 and the drain electrode 6 formed on the insulating layer 3 at a predetermined interval so as to partially cover the region of the insulating layer 3 formed on the substrate, and the source electrode 5 and the drain electrode 6 are partially covered.
- the active layer 2 formed on the insulating layer 3 is provided.
- FIG. 6 is a schematic cross-sectional view of an organic thin film transistor (field effect organic thin film transistor) according to a sixth embodiment.
- An organic thin film transistor 150 shown in FIG. 6 includes a substrate 1, a gate electrode 4 formed on the substrate 1, an insulating layer 3 formed on the substrate 1 so as to cover the gate electrode 4, and the gate electrode 4 at the bottom.
- the active layer 2 is formed on the insulating layer 3 so as to partially cover the region of the active layer 2 formed under the active layer 2 and the gate electrode 4 formed below.
- the source electrode 5 and the drain electrode 6 formed on the insulating layer 3 with a predetermined distance from the source electrode 5 so as to partially cover the region of the active layer 2 where the gate electrode 4 is formed below. , Are provided.
- FIG. 7 is a schematic cross-sectional view of an organic thin film transistor (electrostatic induction type organic thin film transistor) according to a seventh embodiment.
- the organic thin film transistor 160 shown in FIG. 7 includes a substrate 1, a source electrode 5 formed on the substrate 1, an active layer 2 formed on the source electrode 5, and a plurality on the active layer 2 with a predetermined interval.
- a drain electrode 6 formed on the active layer 2a.
- the active layer 2 and / or the active layer 2a contains the polymer of the present invention, and a current path (channel) between the source electrode 5 and the drain electrode 6 is obtained.
- the gate electrode 4 controls the amount of current passing through the current path (channel) in the active layer 2 and / or the active layer 2a by applying a voltage.
- Such a field effect organic thin film transistor can be produced by a known method, for example, a method described in JP-A-5-110069.
- the electrostatic induction organic thin film transistor can be produced by a known method, for example, a method described in JP-A-2004-006476.
- the substrate 1 it is sufficient that the characteristics as an organic thin film transistor are not hindered, and a glass substrate, a flexible film substrate, or a plastic substrate can be used.
- the active layer 2 When forming the active layer 2, it is very advantageous and preferable to use an organic solvent-soluble compound, so that the active layer 2 is formed by using the organic thin film manufacturing method of the present invention described above. An organic thin film can be formed.
- a material having high electrical insulation may be used, and a known material can be used.
- this material include SiOx, SiNx, Ta 2 O 5 , polyimide, polyvinyl alcohol, polyvinylphenol, and organic glass. From the viewpoint of lowering the voltage, a material having a high dielectric constant is preferable.
- the surface modification is performed by treating the surface of the insulating layer 3 with a surface treatment agent such as a silane coupling agent in order to improve the interface characteristics between the insulating layer 3 and the active layer 2. It is also possible to form the active layer 2 after finishing.
- a surface treatment agent such as a silane coupling agent
- the surface treating agent include long-chain alkylchlorosilanes, long-chain alkylalkoxysilanes, fluorinated alkylchlorosilanes, fluorinated alkylalkoxysilanes, and silylamine compounds such as hexamethyldisilazane.
- the surface of the insulating layer can be treated with ozone UV or O 2 plasma.
- an organic thin-film transistor is interrupted
- Examples of the method for forming the protective film include a method of covering with a UV curable resin, a thermosetting resin, an inorganic SiONx film, or the like.
- a method of covering with a UV curable resin, a thermosetting resin, an inorganic SiONx film, or the like In order to effectively cut off from the atmosphere, it is preferable to perform the steps from the preparation of the organic thin film transistor to the formation of the protective film without exposure to the atmosphere (for example, in a dry nitrogen atmosphere or in a vacuum).
- FIG. 8 is a schematic cross-sectional view of the solar cell according to the embodiment.
- the solar cell 200 shown in FIG. 8 has an activity comprising a substrate 1, a first electrode 7a formed on the substrate 1, and an organic thin film containing the polymer of the present invention formed on the first electrode 7a.
- the layer 2 and the second electrode 7b formed on the active layer 2 are provided.
- a transparent or translucent electrode is used as one of the first electrode 7a and the second electrode 7b.
- an electrode material metals such as aluminum, gold, silver, copper, alkali metal, alkaline earth metal, and their translucent films and transparent conductive films can be used.
- each electrode is preferably selected so that the difference in work function is large.
- a carrier generating agent, a sensitizer and the like can be added and used in order to increase photosensitivity.
- the substrate 1 a silicon substrate, a glass substrate, a plastic substrate, or the like can be used.
- FIG. 9 is a schematic cross-sectional view of the photosensor according to the first embodiment.
- the optical sensor 300 shown in FIG. 9 includes an active film composed of a substrate 1, a first electrode 7a formed on the substrate 1, and an organic thin film containing the polymer of the present invention formed on the first electrode 7a.
- a layer 2, a charge generation layer 8 formed on the active layer 2, and a second electrode 7 b formed on the charge generation layer 8 are provided.
- FIG. 10 is a schematic cross-sectional view of an optical sensor according to the second embodiment.
- An optical sensor 310 illustrated in FIG. 10 is formed on the substrate 1, the first electrode 7a formed on the substrate 1, the charge generation layer 8 formed on the first electrode 7a, and the charge generation layer 8.
- the active layer 2 made of an organic thin film containing the prepared polymer of the present invention and the second electrode 7b formed on the active layer 2 are provided.
- FIG. 11 is a schematic cross-sectional view of an optical sensor according to the third embodiment.
- An optical sensor 320 shown in FIG. 11 is an active material comprising a substrate 1, a first electrode 7a formed on the substrate 1, and an organic thin film containing the polymer of the present invention formed on the first electrode 7a.
- the layer 2 and the second electrode 7b formed on the active layer 2 are provided.
- a transparent or translucent electrode is used as one of the first electrode 7a and the second electrode 7b.
- the charge generation layer 8 is a layer that absorbs light and generates charges.
- a metal such as aluminum, gold, silver, copper, alkali metal, alkaline earth metal, or a translucent film or a transparent conductive film thereof can be used.
- a carrier generating agent, a sensitizer and the like can be added and used in order to increase photosensitivity.
- the base material 1 a silicon substrate, a glass substrate, a plastic substrate, etc. can be used as the base material 1.
- UV-visible absorption (UV) measurement was performed using a trade name “Shimadzu UV-Visible spectrophotometer (UV-3100PC)” manufactured by Shimadzu Corporation.
- Fluorescence spectroscopy (PL) measurement was performed using a trade name “Fluoromax-2 spectrometer” manufactured by HORIBA, Ltd. In any case, measurement was performed with a solution in which an appropriate amount of the sample was dissolved in chloroform. The band gap was calculated from the rise of the UV-visible absorption spectrum.
- GPC measurement uses Hitachi High-Technologies' product names "Hitachi UV / VIS detector (L-2400), Hitachi pump (L-2130), TOSOH analysis system (GPC-8200 model II ver.
- a polymer A (28 mg, yield 67%) represented by the following formula (18) as a red solid.
- g in Formula (18) is 2 or more.
- the terminal group of the polymer A is a hydrogen atom or a bromine atom.
- a polymer B (97 mg, yield 81%) represented by the following formula (22) as a reddish brown solid.
- g is 2 or more.
- the terminal group of the polymer B is a hydrogen atom or a bromine atom.
- a polymer C (30 mg, yield 67%) represented by the following formula (27) as a red-black solid.
- g is 2 or more.
- the terminal group of the polymer C is a hydrogen atom or a bromine atom.
- a polymer D (42 mg, yield 71%) represented by the following formula (28) as a red solid.
- g is 2 or more.
- the terminal group of the polymer D is a hydrogen atom or a bromine atom.
- Example 3 the polymer C synthesized in Example 3 was added to chloroform so as to have a concentration of 0.5% by mass, and stirred at room temperature to completely dissolve it, thereby preparing a coating solution of the polymer C.
- a coating solution Using this coating solution, a film was formed on a surface-treated substrate by spin coating (1500 rpm), an organic thin film was formed, and an organic thin film transistor 1 was produced.
- the obtained organic thin film transistor 1 was annealed in vacuum at 150 ° C. for 5 minutes. Thereafter, using a semiconductor parameter analyzer (trade name “4200-SCS” manufactured by Keithley Instruments), the gate voltage Vg is changed within the range of 0 to ⁇ 80 V, and the source-drain voltage Vsd is changed within the range of 0 to ⁇ 80 V, thereby organic When the transistor characteristics were measured, good Id-Vg characteristics of the p-type semiconductor were obtained.
- the measurement result of the Id-Vg characteristic of the organic thin film transistor 1 is shown in FIG.
- Example 5 ⁇ Preparation of Organic Thin Film Transistor 2 and Evaluation of Organic Thin Film Transistor Characteristics>
- a coating solution of the polymer B was prepared in the same manner as in the example 4 except that the polymer B synthesized in the example 2 was used instead of the polymer C. During the preparation of this coating solution, the polymer B was completely dissolved in chloroform at room temperature. Using this solution, an organic thin film transistor 2 was produced in the same manner as in Example 4. The organic transistor characteristics of the organic thin film transistor 2 were measured in the same manner as in Example 4. As a result, a good p-type semiconductor Id-Vg characteristic was obtained. The measurement result of the Id-Vg characteristic of the organic thin film transistor 2 is shown in FIG.
- Comparative Example 2 ⁇ Preparation of Organic Thin Film Transistor 3 and Evaluation of Organic Thin Film Transistor Characteristics>
- the polymer D synthesized in Comparative Example 1 was added to chloroform so as to have a concentration of 0.5% by mass, and stirred at room temperature. Next, the mixture was heated to near the boiling point of chloroform and stirred, but could not be completely dissolved. Toluene was used instead of chloroform, and polymer D was adjusted to a concentration of 0.5% by mass in toluene and dissolved completely by heating to the vicinity of the boiling point of toluene. did.
- a toluene solution in which the polymer D was dissolved by heating was dropped on a surface-treated substrate similar to that used in Example 4, and then quickly formed into a film by a spin coat method (1500 rpm) to produce an organic thin film transistor 3. .
- the organic transistor characteristics of the organic thin film transistor 3 were measured in the same manner as in Example 4. As a result, Id-Vg characteristics of a p-type semiconductor were obtained, but the characteristics were lower than those of Examples 4 and 5.
- the measurement result of the Id-Vg characteristic of the organic transistor 3 is shown in FIG.
- the present invention it is possible to provide a novel polymer that is excellent in charge transportability and solubility in a solvent and can be used as an organic p-type semiconductor capable of forming a thin film almost uniformly. Moreover, according to this invention, an organic thin film containing this polymer and an organic thin film element provided with this organic thin film can be provided.
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Abstract
Description
紫外可視吸収(UV)測定は、島津製作所社製の商品名「Shimadzu UV-Visible spectrophotometer (UV-3100PC)」を用いて行った。蛍光分光(PL)測定は、堀場製作所社製の商品名「Fluoromax-2 spectrometer」を用いて行った。いずれもサンプル適量をクロロホルムに溶かした溶液にて測定した。バンドギャップは紫外可視吸収スペクトルの立ち上がりから計算により求めた。GPC測定は、日立ハイテクノロジーズ社製の商品名「Hitachi UV/VIS detector (L-2400), Hitachi pump (L-2130), TOSOH 分析システム (GPC-8200 model II ver. 6.0)」を使用し、カラムは商品名「Shodex column (L805)」を用いて行った。分子量はポリスチレン換算にて求めた。溶媒にはクロロホルムを使用し、流量を1mL毎分として測定した。カラムクロマトグラフィー分離におけるシリカゲルは、関東化学株式会社製の商品名「Silicagel 60N」(40~50μm)を用いた。また、アルミナは、Merck社製の商品名「aluminum oxide 90 standardized」を用いた。全ての化学物質は、試薬級であり、和光純薬工業株式会社、東京化成工業株式会社、関東化学株式会社、ナカライテスク株式会社、又は、シグマアルドリッチジャパン株式会社より購入した。
<化合物Aの合成>
窒素置換した100mLフラスコに、3,3’-ジヘキシル-ビチオフェン(1.24g,3.71mmol)、テトラヒドロフラン(THF)(30mL)を入れた後、0℃に冷却し、N-ブロモスクシンイミド(NBS)(692mg,3.89mmol)を加え、3時間攪拌した。その後、反応溶液に水(2mL)を加え、反応を停止させた。有機層を水20mLを用い2回洗浄した後、無水硫酸マグネシウムで乾燥した。有機層を減圧濃縮した後、カラムクロマトグラフィー(シリカゲル、ヘキサン)で精製することにより、下記式(13)で表される化合物A(1.38g,収率90%)を黄色オイルとして得た。
窒素置換した50mL三つ口フラスコに、無水エーテル(5mL)、フェニルマグネシウムブロミド(788mg,4.35mmol)を入れ、ニッケルジフェニルホスフィノプロパンジクロライド(8mg,0.0145mmol)を入れた後、化合物A(0.6g,1.45mmol)のエーテル溶液(15mL)を滴下した。50℃に加温し、3時間反応後、室温に戻して蒸留水を加え、反応を停止させた。ヘキサン(20mL)による抽出を行い、有機層を水20mLを用い2回洗浄した後、無水硫酸マグネシウムで乾燥した。有機層を減圧濃縮した後、カラムクロマトグラフィー(シリカゲル、ヘキサン)で精製することにより、下記式(14)で表される化合物B(0.48g,収率80%)を黄色オイルとして得た。
加熱乾燥し窒素置換した30mL二つ口フラスコに、化合物B(200mg,0.487mmol)を入れ、乾燥THF(3mL)を加えた後、-78℃まで冷却し、1.6M n-ブチルリチウム/ヘキサン(0.6mL,0.97mmol)を滴下した。30分間撹拌した後、塩化トリブチルスズ(0.4mL,1.46mmol)を一度に加えた。室温まで反応系を昇温し、3時間撹拌した後、反応溶液に水(20mL)とヘキサン(20mL)を加えた。有機層を水(20mL)を用い2回洗浄した後、無水硫酸ナトリウムで乾燥した。有機層を減圧濃縮した後、カラムクロマトグラフィー(アルミナ、ヘキサン)で精製することにより、下記式(15)で表される化合物C(276mg,収率81%)を黄色オイルとして得た。
窒素置換した30mLフラスコに、化合物C(98mg,0.14mmol)、3,5-ジブロモヨードベンゼン(76mg,0.21mmol)を入れた後、乾燥トルエン(1mL)を加えた。脱気後、テトラキストリフェニルホスフィンパラジウム(0)(7mg,0.007mmol)を加え、12時間加熱還流した。有機層を減圧濃縮した後、カラムクロマトグラフィー(シリカゲル、ヘキサン/クロロホルム=9/1)で精製することにより、下記式(16)で表される化合物D(62mg,収率69%)を黄色固体として得た。
加熱乾燥し窒素置換した30mL二つ口フラスコに、5,5’’’-ジブロモ-3,3’’’-ジヘキシル-クォータチオフェン(230mg,0.35mmol)を入れ、乾燥THF(3mL)を加えた後、-78℃まで冷却し、1.6M n-ブチルリチウム/ヘキサン(0.66mL,1.05mmol)を滴下した。30分間撹拌した後、塩化トリブチルスズ(0.25mL,1.4mmol)を一度に加えた。室温まで反応系を昇温し、3時間撹拌した後、反応溶液に水(1mL)とヘキサン(20mL)を加えた。有機層を水(20mL)を用い2回洗浄した後、無水硫酸ナトリウムで乾燥した。有機層を減圧濃縮した後、カラムクロマトグラフィー(アルミナ、ヘキサン)で精製することにより、下記式(17)で表される化合物E(360mg,収率96%)を黄色オイルとして得た。
窒素置換したスクリューキャップ付き試験管に化合物E(46mg,0.043mmol)、化合物D(27.5mg,0.043mmol)を入れた後、窒素気流下にて乾燥トルエン(0.5mL)、テトラキストリフェニルホスフィンパラジウム(0)(4.4mg,0.43μmol)を加え、3日間加熱攪拌した。こうして得られた反応溶液をメンブランフィルターで濾過し、減圧濃縮した後、少量のクロロホルムに溶解させ、メタノールに注いで沈殿させた。その後、遠心分離により沈殿を回収し、メタノール洗浄及びヘキサン洗浄をそれぞれ行うことにより、下記式(18)で表される重合体A(28mg,収率67%)を赤色固体として得た。なお、式(18)中のgは2以上である。また、重合体Aの末端基は、水素原子又は臭素原子である。
<化合物Iの合成>
窒素置換した100mLフラスコに、3,3’’’-ジヘキシル-クォータチオフェン(1.37g,2.75mmol)、THF(20mL)を入れた後、0℃に冷却し、NBS(514mg,2.88mmol)を加え、3時間攪拌した。その後、反応溶液に水(2mL)を加え、反応を停止させた。有機層を水20mLを用い2回洗浄した後、無水硫酸ナトリウムで乾燥した。有機層を減圧濃縮した後、カラムクロマトグラフィー(シリカゲル、ヘキサン)で精製することにより、下記式(23)で表される化合物I(915mg,収率57%)を黄色オイルとして得た。
窒素置換した50mL三つ口フラスコに、無水エーテル(5mL)、フェニルマグネシウムブロミド(658mg,3.63mmol)を入れ、ニッケルジフェニルホスフィノプロパンジクロライド(6.5mg,0.0121mmol)を入れた後、化合物I(0.7g,1.21mmol)のエーテル溶液(15mL)を滴下した。50℃に加温し、3時間反応後、室温に戻して蒸留水を加え、反応を停止させた。ヘキサン(20mL)による抽出を行い、有機層を水20mLを用い2回洗浄した後、無水硫酸マグネシウムで乾燥した。有機層を減圧濃縮した後、カラムクロマトグラフィー(シリカゲル、ヘキサン)で精製することにより、下記式(19)で表される化合物F(0.6g,収率87%)を黄色オイルとして得た。
加熱乾燥し窒素置換した50mL二つ口フラスコに、化合物F(150mg,0.26mmol)を入れた。乾燥THF(3mL)を加えた後、-78℃まで冷却し、1.6M n-ブチルリチウム/ヘキサン(0.3mL,0.52mmol)を滴下した。30分間撹拌した後、塩化トリブチルスズ(0.14mL,0.78mmol)を一度に加えた。室温まで反応系を昇温し、3時間撹拌した後、反応溶液に水(2mL)を加え、ヘキサン(20mL)で抽出した。有機層を水(20mL)を用い2回洗浄した後、無水硫酸ナトリウムで乾燥した。有機層を減圧濃縮した後、カラムクロマトグラフィー(アルミナ、ヘキサン)で精製することにより、下記式(20)で表される化合物G(230mg,収率100%)を黄色オイルとして得た。
窒素置換した50mL二つ口フラスコに、化合物G(100mg,0.116mmol)、3,5-ジブロモヨードベンゼン(63mg,0.174mmol)を入れた後、乾燥トルエン(1mL)を加えた。脱気後、テトラキストリフェニルホスフィンパラジウム(0)(6mg,0.0059mmol)を加え、12時間加熱還流した。有機層を減圧濃縮した後、カラムクロマトグラフィー(シリカゲル、ヘキサン/クロロホルム=9/1)で精製することにより、下記式(21)で表される化合物H(81mg,収率87%)を黄赤色固体として得た。
窒素置換したスクリューキャップ付き試験管に化合物E(111.7mg,0.103mmol)、化合物H(84mg,0.103mmol)を入れた後、窒素気流下にて乾燥トルエン(0.4mL)、テトラキストリフェニルホスフィンパラジウム(0)(10.7mg,1.03μmol)を加え、3日間加熱攪拌した。こうして得られた反応溶液をメンブランフィルターで濾過し、減圧濃縮した後、少量のクロロホルムに溶解させ、メタノールに注いで沈殿させた。その後、遠心分離により沈殿を回収し、メタノール洗浄及びヘキサン洗浄をそれぞれ行うことにより、下記式(22)で表される重合体B(97mg,収率81%)を赤褐色固体として得た。なお、式(22)中のgは2以上である。また、重合体Bの末端基は、水素原子又は臭素原子である。
<化合物Jの合成>
窒素置換した30mLフラスコに、化合物G(300mg,0.347mmoL)、化合物I(300mg,0.52mmol)を入れた後、乾燥トルエン(5mL)を加えた。脱気後、テトラキストリフェニルホスフィンパラジウム(0)(18mg,0.017mmol)を加え、12時間加熱還流した。その後、反応を停止させ、得られた有機層を減圧濃縮した後、カラムクロマトグラフィー(シリカゲル、ヘキサン)で精製することにより、下記式(24)で表される化合物J(301mg,収率81%)を赤色オイルとして得た。
加熱乾燥し窒素置換した30mL二つ口フラスコに、化合物J(131mg,0.123mmol)を入れ、乾燥THF(14mL)を加えた後、-78℃まで冷却し、1.6M n-ブチルリチウム/ヘキサン(0.23mL,0.37mmol)を滴下した。30分間撹拌した後、塩化トリブチルスズ(0.13mL,0.49mmol)を一度に加えた。室温まで反応系を昇温し、3時間撹拌した後、反応溶液に水(20mL)とヘキサン(20mL)を加えた。有機層を水(20mL)を用い2回洗浄した後、下記式(25)で表される化合物K(155mg,収率93%)を黄色オイルとして得た。
窒素置換した30mLフラスコに、化合物K(155mg,114mmol)、3,5-ジブロモヨードベンゼン(66mg,0.185mmol)を入れた後、乾燥トルエン(3mL)を加えた。脱気後、テトラキストリフェニルホスフィンパラジウム(0)(6mg,0.006mmol)を加え、12時間加熱還流した。その後、反応を停止させ、得られた有機層を減圧濃縮した後、カラムクロマトグラフィー(シリカゲル、ヘキサン)で精製することにより、下記式(26)で表される化合物L(88mg,収率55%,2段階)を黄色固体として得た。
窒素置換したスクリューキャップ付き試験管に化合物E(29.4mg,0.027mmol)、化合物L(35.7mg,0.027mmol)を入れた後、窒素気流下にて乾燥トルエン(0.7mL)、テトラキストリフェニルホスフィンパラジウム(0)(2.8mg,0.27μmol)を加え、3日間加熱攪拌した。こうして得られた反応溶液をメンブランフィルターで濾過し、減圧濃縮した後、少量のクロロホルムに溶解させ、メタノールに注いで沈殿させた。その後、遠心分離により沈殿を回収し、メタノール洗浄及びヘキサン洗浄をそれぞれ行うことにより、下記式(27)で表される重合体C(30mg,収率67%)を赤黒色固体として得た。なお、式(27)中のgは2以上である。また、重合体Cの末端基は、水素原子又は臭素原子である。
<重合体Dの合成>
窒素置換したスクリューキャップ付き試験管に化合物E(111.3mg,0.103mmol)、1,3-ジブロモベンゼン(24.4mg,0.103mmol)を入れた後、窒素気流下にて乾燥トルエン(0.5mL)、テトラキストリフェニルホスフィンパラジウム(0)(10.6mg,1.03μmol)を加え、3日間加熱攪拌した。こうして得られた反応溶液を、熱トルエンに溶解させた状態でメタノールに注いで沈殿させた。その後、遠心分離により沈殿を回収し、メタノール洗浄及びヘキサン洗浄をそれぞれ行うことにより、下記式(28)で表される重合体D(42mg,収率71%)を赤色固体として得た。なお、式(28)中のgは2以上である。また、重合体Dの末端基は、水素原子又は臭素原子である。
実施例1~3及び比較例1で合成した重合体A~Dの紫外可視吸収(UV)測定、蛍光分光(PL)測定、およびGPC測定を行った。また、重合体A~Dのクロロホルムへの溶解性を評価し、さらに、そのクロロホルム溶液を用いて成膜した薄膜の形状観察を行った。薄膜形状は、均質なフィルム状であると良好であり、不均質なフィルム状であると不良である。それらの結果を下記表に示す。また、重合体A~Dの紫外可視吸収スペクトル及び蛍光分光スペクトルを図12に示す。
<有機薄膜トランジスタ1の作製及び有機薄膜トランジスタ特性の評価>
熱酸化膜(シリコン酸化膜、膜厚300nm)上にくし型のソース電極及びドレイン電極(Cr(3nm)/Au(50nm)、チャネル長/チャネル幅=5μm/295mm)を形成させたシリコンウエハーを、エタノール、蒸留水、アセトンの順でそれぞれに浸漬し、各30分間の超音波洗浄を行った。その後、このシリコンウエハーをUV-オゾン洗浄して、表面が親水性である基板を得た。この基板を、ヘキサメチルジシラザン:クロロホルム(体積比1:9)に室温で1時間浸漬した後、クロロホルムで超音波洗浄し、表面処理された基板を得た。
<有機薄膜トランジスタ2の作製及び有機薄膜トランジスタ特性の評価>
実施例2で合成した重合体Bを重合体Cの代わりに用いた以外は実施例4と同様にして、重合体Bの塗布溶液を調製した。この塗布溶液の調製時に、重合体Bはクロロホルムに室温で完全に溶解した。この溶液を用いて実施例4と同様にして、有機薄膜トランジスタ2を作製した。有機薄膜トランジスタ2について、実施例4と同様にして有機トランジスタ特性を測定したところ、良好なp型半導体のId-Vg特性が得られた。なお、有機薄膜トランジスタ2のId-Vg特性の測定結果を図14に示す。また、Vsd=-80Vでの電界効果移動度は3×10-5cm2/Vs、しきい値電圧Vt=-7V、On/Off比=1×105であった。
<有機薄膜トランジスタ3の作製及び有機薄膜トランジスタ特性の評価>
比較例1で合成した重合体Dをクロロホルムに0.5質量%の濃度となるように調整して加え、室温で攪拌したところ溶解せずに懸濁液であった。次に、クロロホルムの沸点近くまで加熱し攪拌したが完全には溶解できなかった。クロロホルムに代えてトルエンを用い、重合体Dをトルエンに0.5質量%の濃度となるように調整して加え、トルエンの沸点付近まで加熱することにより完全に溶解したが、冷却するとポリマーが析出した。
Claims (10)
- X、L及びTが全体として共役している、請求項1記載の重合体。
- Lが、下記一般式(2)で表される2価の有機基である、請求項1又は2記載の重合体。
[式中、Ar1は、置換基を有していてもよい2価の芳香族炭化水素基又は置換基を有していてもよい2価の複素環基を示す。R1、R2、R3及びR4はそれぞれ独立に、水素原子、アルキル基、アルコキシ基、置換基を有していてもよいアリール基又は置換基を有していてもよい1価の複素環基を示し、これらの基における一部又は全部の水素原子はフッ素原子で置換されていてもよい。なお、R1、R2、R3及びR4が複数存在するときは、これらはそれぞれ同一でも異なっていてもよい。また、m、n及びoはそれぞれ独立に、0~10の整数を示す。ただし、m及びoの少なくとも一方は1以上の整数であり、m+n+oは2~20の整数である。] - Xが、下記一般式(8)で表される1価の有機基である、請求項1~4のいずれか一項に記載の重合体。
[式中、Ar2は、置換基を有していてもよい2価の芳香族炭化水素基又は置換基を有していてもよい2価の複素環基を示す。R6、R7、R8及びR9はそれぞれ独立に、水素原子、アルキル基、アルコキシ基、置換基を有していてもよいアリール基又は置換基を有していてもよい1価の複素環基を示し、これらの基における一部又は全部の水素原子はフッ素原子で置換されていてもよい。なお、R6、R7、R8及びR9が複数存在するときは、これらはそれぞれ同一でも異なっていてもよい。R10は、水素原子、又は置換基を有していてもよい1価の基を示す。また、p、q及びrはそれぞれ独立に、0~10の整数を示す。ただし、p及びrの少なくとも一方は1以上の整数であり、p+q+rは2~20の整数である。] - 前記一般式(1)で表される繰り返し構造が、下記一般式(9)で表される繰り返し構造である、請求項1~5のいずれか一項に記載の重合体。
[式中、R11、R12、R13及びR14はそれぞれ独立に、水素原子、アルキル基、アルコキシ基、置換基を有していてもよいアリール基又は置換基を有していてもよい1価の複素環基を示し、これらの基における一部又は全部の水素原子はフッ素原子で置換されていてもよい。なお、R11、R12、R13及びR14が複数存在するときは、これらはそれぞれ同一でも異なっていてもよい。R15は、水素原子、又は置換基を有していてもよい1価の基を示す。s及びtはそれぞれ独立に、2~12の整数を示す。ただし、式中のR11同士、R12同士、R13同士、R14同士及びR15同士は、それぞれ同一の基を示す。また、式中のs同士及びt同士は、それぞれ同じ整数である。] - 請求項1~7のいずれか一項に記載の重合体を含む有機薄膜。
- 請求項8記載の有機薄膜を備える有機薄膜素子。
- 請求項8記載の有機薄膜を備える有機薄膜トランジスタ。
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Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05110069A (ja) | 1991-10-14 | 1993-04-30 | Mitsubishi Electric Corp | 電界効果トランジスタの製造方法 |
JP3074277B2 (ja) | 1995-08-29 | 2000-08-07 | 工業技術院長 | 多分岐重合体及びその製造方法 |
WO2003010778A1 (en) * | 2001-07-24 | 2003-02-06 | Northwestern University | n-TYPE THIOPHENE SEMICONDUCTORS |
JP2004006476A (ja) | 2002-05-31 | 2004-01-08 | Ricoh Co Ltd | 縦型有機トランジスタ |
JP2004099874A (ja) * | 2002-07-18 | 2004-04-02 | Sharp Corp | デンドリマー及びこれを用いた電子デバイス素子 |
JP2004149514A (ja) * | 2002-09-13 | 2004-05-27 | Hc Starck Gmbh | コアシェル構造を有する有機化合物、その製造方法、その使用およびその化合物を含む電子部品 |
JP2004339516A (ja) * | 2003-05-16 | 2004-12-02 | Merck Patent Gmbh | フルオレンおよびアリール基を含むモノマー、オリゴマーおよびポリマー |
JP2005240021A (ja) * | 2004-01-27 | 2005-09-08 | Canon Inc | π共役化合物およびそれを含む導電性有機薄膜、それを利用した電界効果型有機トランジスタ |
JP2006037098A (ja) * | 2004-07-08 | 2006-02-09 | Samsung Electronics Co Ltd | ポリ(オリゴチオフェン−アリーレン)誘導体、有機半導体共重合体、半導体多層構造、およびポリ(オリゴチオフェン−アリーレン)誘導体の製造方法 |
JP2006117672A (ja) * | 2004-10-19 | 2006-05-11 | Samsung Electronics Co Ltd | (オリゴチオフェン−アリーレン)誘導体およびこれを用いた有機薄膜トランジスタ |
JP2006225428A (ja) * | 2005-02-15 | 2006-08-31 | Tokyo Institute Of Technology | 1,3,5−トリアジン環を有する共重合体、その製造法およびその使用 |
JP2007016227A (ja) * | 2005-06-10 | 2007-01-25 | Sumitomo Chemical Co Ltd | 芳香族グラフト重合体 |
JP2007281475A (ja) * | 2006-04-06 | 2007-10-25 | Xerox Corp | ポリ(アルキニルチオフェン)類およびそれから作製された電子デバイス |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100643589B1 (ko) * | 2002-07-18 | 2006-11-10 | 샤프 가부시키가이샤 | 덴드리틱 고분자 및 이를 사용한 전자 디바이스 소자 |
WO2005070992A2 (en) * | 2004-01-27 | 2005-08-04 | Canon Kabushiki Kaisha | Conjugated thiophene compound, conprising perfluorinated and alkylated sidechains, conductive organic thin film containing the compound, and field-effect type organic transistor employing the thin film |
KR100914383B1 (ko) * | 2006-06-20 | 2009-08-28 | 주식회사 엘지화학 | 폴리헤테로고리 화합물, 이를 이용한 유기 전자 소자 및 이유기 전자 소자를 포함하는 전자 장치 |
US20070292681A1 (en) * | 2006-06-20 | 2007-12-20 | Fuji Xerox Co., Ltd | Organic electroluminescence device |
-
2009
- 2009-02-09 WO PCT/JP2009/052156 patent/WO2009101914A1/ja active Application Filing
- 2009-02-09 US US12/867,234 patent/US20110024730A1/en not_active Abandoned
- 2009-02-09 KR KR1020107017969A patent/KR20100131980A/ko not_active Application Discontinuation
- 2009-02-09 CN CN200980104946XA patent/CN101952345A/zh active Pending
- 2009-02-09 JP JP2009027538A patent/JP2009215543A/ja not_active Withdrawn
- 2009-02-09 EP EP09711231A patent/EP2243796A4/en not_active Withdrawn
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05110069A (ja) | 1991-10-14 | 1993-04-30 | Mitsubishi Electric Corp | 電界効果トランジスタの製造方法 |
JP3074277B2 (ja) | 1995-08-29 | 2000-08-07 | 工業技術院長 | 多分岐重合体及びその製造方法 |
WO2003010778A1 (en) * | 2001-07-24 | 2003-02-06 | Northwestern University | n-TYPE THIOPHENE SEMICONDUCTORS |
JP2004006476A (ja) | 2002-05-31 | 2004-01-08 | Ricoh Co Ltd | 縦型有機トランジスタ |
JP2004099874A (ja) * | 2002-07-18 | 2004-04-02 | Sharp Corp | デンドリマー及びこれを用いた電子デバイス素子 |
JP2004149514A (ja) * | 2002-09-13 | 2004-05-27 | Hc Starck Gmbh | コアシェル構造を有する有機化合物、その製造方法、その使用およびその化合物を含む電子部品 |
JP2004339516A (ja) * | 2003-05-16 | 2004-12-02 | Merck Patent Gmbh | フルオレンおよびアリール基を含むモノマー、オリゴマーおよびポリマー |
JP2005240021A (ja) * | 2004-01-27 | 2005-09-08 | Canon Inc | π共役化合物およびそれを含む導電性有機薄膜、それを利用した電界効果型有機トランジスタ |
JP2006037098A (ja) * | 2004-07-08 | 2006-02-09 | Samsung Electronics Co Ltd | ポリ(オリゴチオフェン−アリーレン)誘導体、有機半導体共重合体、半導体多層構造、およびポリ(オリゴチオフェン−アリーレン)誘導体の製造方法 |
JP2006117672A (ja) * | 2004-10-19 | 2006-05-11 | Samsung Electronics Co Ltd | (オリゴチオフェン−アリーレン)誘導体およびこれを用いた有機薄膜トランジスタ |
JP2006225428A (ja) * | 2005-02-15 | 2006-08-31 | Tokyo Institute Of Technology | 1,3,5−トリアジン環を有する共重合体、その製造法およびその使用 |
JP2007016227A (ja) * | 2005-06-10 | 2007-01-25 | Sumitomo Chemical Co Ltd | 芳香族グラフト重合体 |
JP2007281475A (ja) * | 2006-04-06 | 2007-10-25 | Xerox Corp | ポリ(アルキニルチオフェン)類およびそれから作製された電子デバイス |
Non-Patent Citations (1)
Title |
---|
See also references of EP2243796A4 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012018663A1 (en) | 2010-08-06 | 2012-02-09 | Corning Incorporated | Di-tin fused thiophene compounds and polymers and methods of making |
US8278346B2 (en) | 2010-08-06 | 2012-10-02 | Corning Incorporated | Di-tin fused thiophene compounds and polymers and methods of making |
Also Published As
Publication number | Publication date |
---|---|
CN101952345A (zh) | 2011-01-19 |
JP2009215543A (ja) | 2009-09-24 |
EP2243796A4 (en) | 2012-04-25 |
US20110024730A1 (en) | 2011-02-03 |
KR20100131980A (ko) | 2010-12-16 |
EP2243796A1 (en) | 2010-10-27 |
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