WO2008020564A1 - Contacteur conducteur et unité contacteur conducteur - Google Patents
Contacteur conducteur et unité contacteur conducteur Download PDFInfo
- Publication number
- WO2008020564A1 WO2008020564A1 PCT/JP2007/065658 JP2007065658W WO2008020564A1 WO 2008020564 A1 WO2008020564 A1 WO 2008020564A1 JP 2007065658 W JP2007065658 W JP 2007065658W WO 2008020564 A1 WO2008020564 A1 WO 2008020564A1
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- WO
- WIPO (PCT)
- Prior art keywords
- contact
- conductive
- conductive contact
- curved
- contact portion
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
Definitions
- the present invention relates to a conductive material that transmits and receives electrical signals by contacting electrodes and terminals of an electronic component when conducting a conduction state inspection or an operation characteristic inspection in an electronic component such as a liquid crystal panel or a semiconductor integrated circuit.
- the present invention relates to a contact and a conductive contact unit configured using the conductive contact.
- a plurality of conductive contacts are provided corresponding to the connection electrodes of the semiconductor integrated circuit, and the conductive contacts are used for connection.
- a technology related to a conductive contact unit having a function of ensuring electrical continuity by making physical contact with an electrode is known! /.
- the conductive contact unit includes a plurality of conductive contacts and a conductive contact holder that holds the plurality of conductive contacts.
- various technologies have been proposed to cope with the narrowing of the arrangement interval of the connection electrodes accompanying the trend toward miniaturization of the semiconductor integrated circuit to be inspected. .
- Patent Document 1 discloses a technique relating to a plate-shaped conductive contact that includes a contact portion that contacts an object to be inspected and an elastic portion that urges and urges against the contact portion. Yes.
- this prior art by arranging a plurality of conductive contacts arranged in the plate thickness direction at a narrow interval, it is possible to cope with a narrow array interval of connection electrodes to be inspected.
- Patent Document 1 Japanese Patent Laid-Open No. 2001-343397
- the tip of the conductive contact strokes in a direction substantially parallel to the elastic body expansion / contraction direction, so that it adheres to the oxide film formed on the surface to be inspected or the surface thereof. Dirt etc. cannot be removed sufficiently and stable electrical contact There was a case that I could not get. In this case, an excessive load may be applied to the conductive contact, and there is a problem with the durability of the conductive contact.
- the conventional conductive contact unit has a lower position when viewed from above. Because the tip of the conductive contact on the side is located inside the side of the conductive contact holder, when observing the contact status with the inspection object near the tip of the conductive contact, the operator himself It was necessary to look around the contact area by bending it, and the burden on the operator increased as the number of observations increased.
- the present invention has been made in view of the above, and is a conductive contact that can cope with the narrowing of the arrangement interval, has excellent durability, and can easily visually check the contact state with the inspection object. And it aims at providing a conductive contact unit.
- one embodiment of the present invention has a plate shape, and electrically connects a circuit structure that outputs a signal for inspection and an inspection target.
- a contact that is positioned at an end of the conductive contact in the longitudinal direction and is in contact with the circuit structure; and a width direction of the conductive contact that is orthogonal to the longitudinal direction.
- a plurality of straight portions extending in a parallel direction and a plurality of curved portions connecting the adjacent straight portions to each other to be curved in an arc shape are located at an intermediate portion in the longitudinal direction, and extend in the longitudinal direction.
- the elastic part which can be expanded and contracted is positioned at an end different from the first contact part in the longitudinal direction, and the tip of the elastic part which is in contact with the inspection object is wider than the edge part in the width direction of the elastic part.
- the outer diameter of the bending portion that protrudes from the side opposite to the protruding side is larger and closer to the tip of the second contact portion.
- the outer diameter of the curved portion that is curved on the side where the second contact portion projects out of the plurality of curved portions connects the tips of the first and second contact portions.
- a straight line is used as the reference straight line, and this reference straight line is used to set the first reference for each curved part.
- the outer diameter of the bending portion that changes linearly according to the amount and curves on the side opposite to the side on which the second contact portion protrudes among the plurality of bending portions is set to each bending portion using the reference straight line. However, it may be linearly changed according to the second reference amount determined.
- the diameter of the linear portion may be farther from the tip of the first contact portion.
- the wire diameter of the straight portion changes linearly according to the distance from the tip of the first contact portion or the tip of the second contact portion to the center of the straight portion. May be.
- the conductive contact is formed by connecting the first connection part that connects the first contact part and the elastic part, the elastic part and the second contact part.
- a second connection part formed with an opening penetrating in the plate thickness direction, wherein the first connection part, the second connection part, and the elastic part respectively have lengths in the width direction, It is good as equal.
- the conductive contact is formed by connecting the first connection portion connecting the first contact portion and the elastic portion, the elastic portion and the second contact portion.
- a second connection part formed with an opening penetrating in the plate thickness direction, the edge part in the width direction of the elastic part, and the side on which the second contact part protrudes!
- the edge portion on the opposite side is the edge portion in the width direction of the first and second connection portions, and the elastic portion is located on the opposite side to the side on which the second contact portion protrudes and the opposite edge portion. It may be retracted in a direction approaching the central axis in the width direction.
- the edge portion in the width direction of the elastic portion on the side where the second contact portion protrudes is the first and second connections. It is also possible to retreat in the direction closer to the central axis in the width direction of the elastic portion than the edge portion on the side where the second contact portion protrudes at the edge portion in the width direction of the portion! /.
- a conductive contact unit is located at an end portion in the longitudinal direction, and a first contact portion that contacts a circuit structure that outputs a detection signal, and the longitudinal direction.
- a plurality of straight portions extending orthogonally and extending in a direction parallel to the width direction of the conductive contact, and a plurality of curved portions connecting the adjacent straight portions to be curved in an arc shape,
- An elastic part that is located in the middle part in the longitudinal direction is located at an end different from the first contact part in the longitudinal direction, and an elastic part that is in contact with the inspection object
- a plurality of conductive contacts having a plate-like shape, and a second connecting portion formed with an opening that penetrates in the thickness direction and connects the elastic portion and the second contact portion; and A plurality of first guide grooves for fitting and holding one edge in the longitudinal direction of the conductive contact on the side from which the second contact portion protrudes, and the plurality of first guides
- the other edge portion of the conductive contact that is positioned opposite to each of the guide grooves and is fitted in the opposite first guide groove is A conductive contact holder having a plurality of second guide grooves to be held together, and the opening formed in the second connection portion of each of the plurality of conductive contacts;
- a cross-sectional area perpendicular to the longitudinal direction of the rod-shaped member may be smaller than an area of the opening formed in the conductive contact.
- the tip of the second contact portion is an outer surface of the conductive contact holder, and is an outer surface of a portion in which the first guide groove is formed on the inner surface. It is better to project in the direction of the normal of the outer surface!
- a first contact portion that contacts a circuit structure that outputs an inspection signal
- a plurality of linear portions that extend in a direction perpendicular to the longitudinal direction and parallel to the width direction, and adjacent to each other.
- An elastic part having a plurality of curved parts that are curved in an arc shape by connecting the straight parts, and an elastic part that can be expanded and contracted in the longitudinal direction, and a tip that contacts the object to be inspected more than an edge part in the width direction of the elastic part
- a second contact portion projecting in a direction away from the central axis in the width direction of the elastic portion, and the bay curved on the side on which the second contact portion projects out of the plurality of curved portions.
- the outer diameter of the curved portion is made smaller as it is closer to the tip of the second contact portion, and the outer diameter of the curved portion that is curved on the side opposite to the side from which the second contact portion projects out of the plurality of curved portions is By increasing the distance to the tip of the second contact part, it is possible to cope with the narrowing of the arrangement interval, and it has excellent durability, and the conductive contact and conductive contact that allows easy visual inspection of the contact status with the inspection object. Child units can be provided.
- FIG. 1 is a perspective view showing a configuration of a conductive contact unit according to an embodiment of the present invention.
- FIG. 2 is a diagram showing a configuration of a conductive contact according to an embodiment of the present invention.
- FIG. 3 is a diagram for explaining an example of setting the outer diameter of the bending portion.
- FIG. 4 is a partially enlarged perspective view of the upper surface portion of the conductive contact holder.
- FIG. 5 is a diagram showing an internal configuration of a conductive contact unit according to one embodiment of the present invention.
- FIG. 6 is a diagram showing a configuration of a conductive contact according to a modification of one embodiment of the present invention.
- FIG. 1 is a perspective view showing a configuration of a conductive contact unit according to an embodiment of the present invention.
- the conductive contact unit 1 shown in the figure performs a conduction state inspection and an operation characteristic inspection of a circuit structure such as a liquid crystal panel to be inspected, and includes a plurality of plate-like conductive contact 2 and A conductive contact holder 3 that accommodates and holds a plurality of conductive contacts 2 and a rod-like member 4 that is fixed to the conductive contact holder 3 and supports the plurality of conductive contacts 2 Mil.
- FIG. 2 is a diagram illustrating a configuration of the conductive contact 2 according to the first embodiment.
- the vertical direction in FIG. 2 is “longitudinal direction of conductive contact 2”
- the horizontal direction in FIG. 2 is “width direction of conductive contact 2”.
- the direction in which the contact is made that is, the direction perpendicular to the paper surface, is referred to as the “plate thickness direction of the conductive contact 2”.
- the conductive contact 2 shown in FIG. 2 is formed in a plate shape using a conductive material, and establishes an electrical connection between a circuit structure that generates a signal for inspection and an inspection target. To do. More specifically, the conductive contact 2 includes a first contact portion 21 that is in physical contact with a predetermined circuit structure including an inspection circuit, and a second contact that is in physical contact with an inspection target such as a liquid crystal panel.
- An elastic part 23 that is interposed between the contact part 22, the first contact part 21 and the second contact part 22 and can be expanded and contracted in the longitudinal direction, and a first connection part 24 that connects the first contact part 21 and the elastic part 23 And a second connection portion 26 that connects the second contact portion 22 and the elastic portion 23 and has an opening 25 penetrating in the thickness (thickness) direction.
- the first contact portion 21 is provided so as to protrude in the longitudinal direction from the central portion in the short direction of the first connection portion 24.
- the protruding position of the first contact portion 21 from the first connection portion 24 is not limited to this, and may be determined according to conditions such as the position of the electrode provided in the circuit structure to be contacted.
- the second contact portion 22 protrudes in the direction of the center axial force in the width direction of the elastic portion 23, away from the edge of the elastic portion 23 in the width direction.
- the shape of the second contact portion 22 is the material of the conductive contact 2, the load to be applied to the conductive contact 2 during inspection, and the conductive contact holder 3 that holds and holds the conductive contact 2. If it protrudes in the width direction from the edge in the width direction of the second connection portion 26, the details of the shape should be determined. Can be appropriately changed.
- the elastic portion 23 includes a plurality of linear portions 23a-1, 23a-2, which extend in a direction perpendicular to the longitudinal direction of the conductive contact 2 and parallel to the width direction of the conductive contact 2. , 23a—n, and a plurality of curved parts 23b-1, 23b-2, ..., 23b-n, 23b-(n + 1) that connect adjacent straight parts and curve in an arc shape And the shape meandering in an S shape along the longitudinal direction There is no.
- the length of the elastic portion 23 in the width direction is the same as the length of the first connecting portion 24 and the second connecting portion 26 in the width direction.
- the number n of the straight portions is an odd number. This is merely an example, and the specific number n is appropriately determined according to the load applied to the conductive contact 2.
- This wire diameter t is the tip P of the first contact portion 21 or the tip of the second contact portion 22.
- a straight line L connecting the tips Q of the contact portions 22 is defined as a reference straight line, and is determined using this reference straight line L.
- FIG. 3 is a diagram showing an example of setting the outer diameter R using the reference straight line L.
- the outer diameter R will be described.
- the outer diameter R in this case is the same plane as the straight line
- a curved portion 23b-j that curves on the side opposite to the side from which the second contact portion 22 protrudes.
- the outer diameter 1 ⁇ is coplanar with at least the straight line L
- the definition of quasi-quantities and the values of ⁇ , 13, ⁇ , and ⁇ can be changed as appropriate.
- the method for determining the second straight line (corresponding to the straight line L and the straight line L described above) is also arbitrary.
- the conductive contact holder 3 As shown in FIG. 1, the conductive contact holder 3 has a substantially rectangular parallelepiped appearance, and passes through the top surface portion 3a and the bottom surface portion (not shown in FIG. 1) to attach a plurality of conductive contact members 2 to each other.
- maintain and the fixing hole part 32 which each is formed in the predetermined position of the side part 3b which mutually opposes via the holding part 31, and fixes the edge part of the rod-shaped member 4 are provided.
- FIG. 4 is a partially enlarged perspective view of the upper surface portion 3 a of the conductive contact holder 3.
- the second contact portion 22 protrudes at one edge in the width direction of the conductive contact 2.
- First linear guide groove 31a that fits and holds the edge portion on the side, and conductive contact 2 that is located opposite to and is fitted in the first guide groove 31a 2
- a straight line that fits and holds the other edge in the width direction A plurality of pairs of second guide grooves 31b are formed.
- the first guide groove 31a and the second guide groove 31b forming a pair have a function of positioning the conductive contact 2 with respect to the plane direction perpendicular to the longitudinal direction, and the expansion and contraction operation of the conductive contact 2 It has a function to guide Further, among the pairs formed by the first guide groove 31a and the second guide groove 31b, the intervals between adjacent pairs are all equal and parallel to each other.
- Each of the first guide groove 31a and the second guide groove 31b has the same groove width (denoted as w) and the same groove depth (denoted as d).
- w groove width
- d groove depth
- the groove depth of the first guide groove 31a is equal to the groove depth of the second guide groove 31b
- the groove depths of the two guide grooves may be different from each other.
- FIG. 5 is a diagram showing an internal configuration of the conductive contact unit 1.
- the cross section of the conductive contact holder 3 shown in the figure corresponds to the cross section along line AA in FIG.
- the first guide groove 31a and the second guide groove 31b have a structure extending in parallel with each other along the z-axis direction (direction perpendicular to the groove width direction) in FIG.
- the length of the first guide groove 31a extending in the z-axis direction in FIG. 5 is shorter than the length of the second guide groove 31b extending in the same z-axis direction.
- the second guide groove 31b is a conductive contact holder 3
- the force reaching the bottom surface portion 3d of the first guide groove 31a reaches only a position vertically above the bottom surface portion 3d! / ,!
- the width direction is parallel to the X-axis direction in the coordinate system (xyz) shown in Figs.
- the direction is parallel to the y-axis direction, and the longitudinal force is held so as to be parallel to the axial direction.
- the plate thickness of the conductive contact 2 is slightly smaller than the groove width (w) of the first guide groove 31a and the second guide groove 31b.
- the conductive contact 2 held by the conductive contact holder 3 has the second contact portion in a state where no load is applied to the first contact portion 21 and the second contact portion 22 (the state shown in FIG. 5).
- the tip Q of 22 protrudes from the side surface portion 3c of the conductive contact holder 3 by a predetermined amount in the positive direction of the X axis (the protrusion amount is ⁇ ).
- the tip Q of the second contact portion 22 is the bottom surface portion of the conductive contact holder 3.
- the operator can confirm the presence or absence of physical contact between the tip of the conductive contact 2 and the inspection object even from an obliquely upper side of the conductive contact unit 1 (see FIG. 1).
- the first The offset amount at the tip of the second contact portion 22 from the axis O that passes through the tip P of the contact portion 21 and is parallel to the z-axis direction is ⁇ .
- 1 1 1 1 is appropriately determined according to conditions such as the size of the conductive contact 2 and the conductive contact holder 3 and the load to be applied to the inspection object.
- the conductive contact holder 3 is preferably formed of an insulating material from the viewpoint of preventing the occurrence of a short circuit by being electrically connected to the conductive contact 2.
- the conductive contact holder 3 is formed using a synthetic resin having low thermal expansion, and the first guide groove 31a and the second guide groove 31b are formed by dicing or the like!
- the conductive contact holder 3 is made of ceramics such as alumina (A1 O), zirconium (ZrO), silica (SiO 2), thermosetting resins such as silicon and epoxy, and engineering plastics such as polycarbonate.
- a base material may be formed, and the first guide groove 31a and the second guide groove 31b may be formed by a processing technique such as etching.
- the base material is formed using another suitable material (whether or not there is an insulating property) and is in contact with the conductive contact 2
- a suitable insulating paint may be applied to the possible portion (the portion including the first guide groove 31a and the second guide groove 31b). In this sense, an insulating paint may be applied to part or all of the surface of the conductive contact 2.
- the rod-shaped member 4 has a plurality of conductive contacts 2 attached to the holding portion 31 and passes through the opening 25 of each conductive contact 2, and then both ends thereof face each other of the conductive contact holder 3. It passes through the fixing holes 32 respectively formed in the side surface portions 3b and is fixed to the conductive contact holder 3.
- the rod-like member 4 functions to prevent the conductive contact 2 from being removed from the holding portion 31 by penetrating through the openings 25 of the plurality of conductive contacts 2 held by the holding portion 31 at the same time. It performs the function of imparting initial deflection to contact 2.
- the cross section perpendicular to the longitudinal direction of the rod-shaped member 4 has a shape in which a rectangular corner is chamfered as shown in FIG. 5, and the area thereof is smaller than the area of the opening 25 of the conductive contact 2 .
- the force S that facilitates processing when forming the fixing hole 32 for the conductive contact 2 is reduced.
- the bar-shaped member 4 penetrates through the openings 25 of a large number of conductive contacts 2, and all of the conductive members 2 are electrically conductive.
- the contact 2 is formed of an insulating material such as ceramics that has low rigidity and low sliding resistance with respect to the conductive contact 2 even when a load is applied. Thereby, the movement of the conductive contact 2 when a load is applied can be made smooth. Therefore, the interval between the rod-like member 4 and the opening 25 can be reduced, and the support stability of the conductive contact 2 by the rod-like member 4 can be ensured.
- the cross-sectional shape perpendicular to the longitudinal direction of the rod-shaped member 4 is not limited to the above-described one, and may be, for example, a polygon, a square, or a circle. Of course, it varies depending on the shape force of the fixing hole 32 and the cross-sectional shape of the rod-like member 4.
- a circuit board 100 that establishes an electrical connection with a signal processing circuit that generates and outputs a test signal is attached above the conductive contact holder 3 having the above configuration.
- the circuit board 100 has a large number of wirings and connection electrodes made of nickel or the like formed on one surface of a sheet-like base material made of polyimide or the like.
- the inspection object 200 such as a liquid crystal panel is brought into contact with the tip Q of the second contact portion 22 by a predetermined driving means (not shown), and is raised until it reaches a predetermined position.
- the tip Q of the second contact portion 22 is equal to ⁇ in the X-axis direction from the tip P of the first contact portion 21 as described above.
- the tip Q of the second contact portion 22 moves while pulling on the inspection object 200 while maintaining the contact state on the surface of the inspection object 200. In this way, the tip of the second contact portion 22 moves on the inspection object 200, thereby removing the oxide film formed on the surface of the inspection object 200 and the dirt adhering to the surface. Stable electricity between Air contact can be obtained.
- the moving speed (rising speed) of the inspection target 200 is appropriately controlled, the tip of the second contact portion 22 does not greatly damage the surface of the inspection target 200, and the conductive contact 2 is excessively damaged. No load is required.
- the elastic portion 23 is elastically deformed by contraction due to a load.
- the stress distribution in the elastic portion 23 becomes uniform, and it is possible to alleviate stress concentration at a specific location.
- the maximum stress value applied to the elastic portion 23 is reduced, the durability of the conductive contact 2 against repeated stress can be improved.
- the deformation of the tip of the second contact portion 22 can be suppressed by reducing the load, the durability of the conductive contact 2 can be improved in this sense.
- the conductive contact unit 1 described above is partially fitted into the first guide groove 31a and the second guide groove 3 lb extending along the expansion / contraction direction of the elastic portion 23 of the conductive contact 2. In this state, the conductive contact 2 is held. This prevents the occurrence of buckling and torsion when the elastic part 23 contracts, which is a problem peculiar to the plate-like conductive contact 2, and causes the spring characteristics of the elastic part 23 to deteriorate due to them. You do n’t have to. Therefore, even if a certain load or more is applied to the conductive contact 2 within an appropriate range, a large stoke can be realized without causing buckling or twisting. It is possible to obtain a contact state.
- the conductive contact unit 1 since the conductive contact 2 is held by the first guide groove 31a and the second guide groove 31b, the conductive contact 2 and the conductive contact holder 3 The sliding area can be reduced by reducing the contact area between the conductive contact 2 and the conductive contact 2 can be smoothly expanded and contracted.
- the conductive contactor unit 1 has a groove width of the first guide groove 31a and the second guide groove 31b.
- the conductive contact 2 is penetrated through the rod-like member 4 to give the conductive contact 2 an initial deflection and prevent it from coming off.
- the protrusion amount h in which the tip Q of the second contact portion 22, that is, the lower end of the conductive contact 2 protrudes vertically downward from the bottom surface portion 3 d of the conductive contact holder 3 can be reduced.
- the second contact portion 22 is made smaller, it is possible to prevent bending near the tip and stably hold the conductive contact 2, and the conductive contact 2 closes the first guide groove 31a near the lower end. It is possible to prevent the second guide groove from being removed from 3 lb. As a result, the positional accuracy of the conductive contact 2 is increased, and the reliability and durability of the conductive contact unit 1 can be improved.
- the step of accommodating the conductive contact 2 in the holding portion 31 is performed by inserting the first contact portion 21 side first into the holding portion 31 and then in the width direction. This is completed by fitting the edge portions of the first guide groove 31a and the second guide groove 31b. Therefore, assembling is easy even when compared with the conventional conductive contact unit, and if the manufacturing cost is reduced, the result can be obtained.
- the first contact portion that comes into contact with the circuit structure that outputs a signal for inspection and extends in a direction perpendicular to the longitudinal direction and parallel to the width direction.
- a plurality of straight portions connected to each other, and a plurality of curved portions that are curved in an arc shape by connecting the adjacent straight portions, and an elastic portion that can be expanded and contracted in the longitudinal direction, and a tip that contacts the object to be inspected are elastic
- the outer diameter of the bending portion that is curved on the side where the second contact portion protrudes is made smaller as it approaches the tip of the second contact portion, and the curved portion on the opposite side to the side on which the second contact portion protrudes is curved.
- the width of the plurality of straight portions constituting the elastic portion and the outside of the curved portion By setting the diameter to change in an inclined manner as described above, the stress distribution in the elastic part becomes uniform when a load is applied by bringing the conductive contact into contact with the object to be inspected, and stress is applied to a specific location. It can prevent concentration and reduce the maximum stress applied to the elastic part. Accordingly, it is possible to improve the durability of the conductive contact against repeated stress. In addition, since the deformation of the tip of the second contact portion can be suppressed by reducing the load, the durability of the conductive contact can also be improved in this sense.
- the contact portion (second contact portion) of the conductive contact with the inspection object protrudes outward in the width direction from the conductive contact holder, so that the operator At the time of inspection, the inspection work can be performed while confirming the physical contact between the tip of the conductive contact and the object to be inspected by observation with a microscope from obliquely above the conductive contact unit. It is no longer necessary to observe the contact state between the conductive contact and the inspection object. Therefore, the workability and reliability of the inspection can be further improved, and the burden on the operator can be reduced.
- FIG. 6 is a diagram illustrating a configuration of a conductive contact according to a modification of the present embodiment.
- the conductive contact 5 shown in the figure includes a first contact part 51, a second contact part 52, an elastic part 53, a first connection part 54, and a second connection part 56 having an opening 55, Is provided.
- the second contact portion 52 is more distant from the central axis in the width direction of the elastic portion 53 than the edge portion in the width direction of the second connection portion 56 (and the edge portion in the width direction of the elastic portion 53). Protrudes in the direction.
- the outer diameter R and wire diameter T of j (j l, 2, ...
- the amount of relief from the edge in the width direction of the continuous portion 54 is r.
- the width of the elastic part 53 ( The length in the width direction) is smaller than the width of the first connection portion 54 and the width of the second connection portion 56 by r + r.
- the clearances r and r must be smaller than the groove depth value d of the conductive contact holder 3.
- the conductive contact 5 By using the conductive contact 5 having such a configuration, the conductive contact 5 can be reliably held without deviating from the first guide groove 31a or the second guide groove 31b.
- the escape amounts r and r may be the same or different. Also, of these
- the conductive contact 5 is accommodated in the conductive contact holder 3 for inspection.
- the edge portion of the elastic portion 53 is less likely to come into contact with the bottom portions of the first guide groove 31a and the second guide groove 31b, and friction between the elastic portion 53 and each guide groove bottom portion can be reduced.
- it is possible to suppress the hooking force and drag of the elastic portion 53 when a load is applied, and to provide a more reliable origin return capability.
- the sliding resistance with the conductive contact holder 3 is reduced, it becomes possible to stabilize by reducing the variation in the inspection load value of the conductive contact 5.
- the conductive contact unit according to the present invention can be applied not only to inspecting a liquid crystal panel but also as a high-density conductive contact unit used for a package substrate mounted with a semiconductor chip or a wafer level inspection. is there.
- the present invention can include various embodiments and the like not described herein, and V, V, within the scope not departing from the technical idea specified by the claims. It is possible to make various design changes.
- the conductive contact and the conductive contact unit according to the present invention are useful when conducting a conduction state inspection and an operation characteristic inspection in an electronic component such as a liquid crystal panel and a semiconductor integrated circuit. .
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Liquid Crystal (AREA)
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200780030708XA CN101506666B (zh) | 2006-08-18 | 2007-08-09 | 导电性接触件及导电性接触件单元 |
TW096130289A TWI359274B (en) | 2006-08-18 | 2007-08-16 | Electrically conductive contactor and electrically |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-223385 | 2006-08-18 | ||
JP2006223385A JP4842733B2 (ja) | 2006-08-18 | 2006-08-18 | 導電性接触子および導電性接触子ユニット |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008020564A1 true WO2008020564A1 (fr) | 2008-02-21 |
Family
ID=39082089
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/065658 WO2008020564A1 (fr) | 2006-08-18 | 2007-08-09 | Contacteur conducteur et unité contacteur conducteur |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP4842733B2 (ja) |
KR (1) | KR101000426B1 (ja) |
CN (1) | CN101506666B (ja) |
TW (1) | TWI359274B (ja) |
WO (1) | WO2008020564A1 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105719730B (zh) * | 2016-02-05 | 2017-09-22 | 燕山大学 | 一种内嵌直线段式马蹄形柔性电子器件交联导体结构 |
KR101887973B1 (ko) * | 2017-04-07 | 2018-08-13 | 이근주 | 프로브핀의 분리가 용이한 엘이디 검사용 홀더블럭 |
WO2019116512A1 (ja) * | 2017-12-14 | 2019-06-20 | オムロン株式会社 | ソケット、検査治具、検査ユニットおよび検査装置 |
CN111033273B (zh) * | 2018-01-11 | 2022-04-26 | 欧姆龙株式会社 | 探针、检查工具、检查单元和检查装置 |
JP6908133B2 (ja) * | 2018-01-11 | 2021-07-21 | オムロン株式会社 | プローブピン、検査治具、検査ユニットおよび検査装置 |
JP2020180889A (ja) * | 2019-04-25 | 2020-11-05 | オムロン株式会社 | プローブピン、検査治具および検査ユニット |
KR102086390B1 (ko) * | 2019-11-05 | 2020-03-09 | 주식회사 플라이업 | 프로브 핀 |
KR102086391B1 (ko) * | 2019-11-05 | 2020-03-09 | 주식회사 플라이업 | 회로 검사장치 |
CN111562412B (zh) * | 2019-11-05 | 2021-03-16 | 起翔有限公司 | 探针及具备此的电路检查装置 |
KR102331204B1 (ko) * | 2020-06-12 | 2021-11-25 | 가오 티엔-싱 | 전기 시험용 전기 전도 장치 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11133060A (ja) * | 1997-10-31 | 1999-05-21 | Tani Denki Kogyo Kk | テスト用端子 |
WO2006088131A1 (ja) * | 2005-02-18 | 2006-08-24 | Nhk Spring Co., Ltd. | 導電性接触子ユニットおよび導電性接触子 |
WO2007060939A1 (ja) * | 2005-11-22 | 2007-05-31 | Nhk Spring Co., Ltd. | 導電性接触子ユニットおよび導電性接触子 |
WO2007094237A1 (ja) * | 2006-02-17 | 2007-08-23 | Nhk Spring Co., Ltd. | 導電性接触子および導電性接触子ユニット |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3410093A1 (de) * | 1984-03-20 | 1985-10-03 | Feinmetall Gmbh, 7033 Herrenberg | Federkontaktstift und verfahren zu seiner herstellung |
JP3773396B2 (ja) | 2000-06-01 | 2006-05-10 | 住友電気工業株式会社 | コンタクトプローブおよびその製造方法 |
JP2004037145A (ja) | 2002-07-01 | 2004-02-05 | Micronics Japan Co Ltd | プローブ及びこれを用いた電気的接続装置 |
-
2006
- 2006-08-18 JP JP2006223385A patent/JP4842733B2/ja not_active Expired - Fee Related
-
2007
- 2007-08-09 CN CN200780030708XA patent/CN101506666B/zh not_active Expired - Fee Related
- 2007-08-09 WO PCT/JP2007/065658 patent/WO2008020564A1/ja active Application Filing
- 2007-08-09 KR KR20097002984A patent/KR101000426B1/ko not_active IP Right Cessation
- 2007-08-16 TW TW096130289A patent/TWI359274B/zh not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11133060A (ja) * | 1997-10-31 | 1999-05-21 | Tani Denki Kogyo Kk | テスト用端子 |
WO2006088131A1 (ja) * | 2005-02-18 | 2006-08-24 | Nhk Spring Co., Ltd. | 導電性接触子ユニットおよび導電性接触子 |
WO2007060939A1 (ja) * | 2005-11-22 | 2007-05-31 | Nhk Spring Co., Ltd. | 導電性接触子ユニットおよび導電性接触子 |
WO2007094237A1 (ja) * | 2006-02-17 | 2007-08-23 | Nhk Spring Co., Ltd. | 導電性接触子および導電性接触子ユニット |
Also Published As
Publication number | Publication date |
---|---|
CN101506666B (zh) | 2012-06-20 |
JP2008046044A (ja) | 2008-02-28 |
TW200821584A (en) | 2008-05-16 |
CN101506666A (zh) | 2009-08-12 |
JP4842733B2 (ja) | 2011-12-21 |
KR20090029838A (ko) | 2009-03-23 |
TWI359274B (en) | 2012-03-01 |
KR101000426B1 (ko) | 2010-12-13 |
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