WO2007142112A1 - 多層セラミック基板およびその製造方法ならびに電子部品 - Google Patents
多層セラミック基板およびその製造方法ならびに電子部品 Download PDFInfo
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- WO2007142112A1 WO2007142112A1 PCT/JP2007/061069 JP2007061069W WO2007142112A1 WO 2007142112 A1 WO2007142112 A1 WO 2007142112A1 JP 2007061069 W JP2007061069 W JP 2007061069W WO 2007142112 A1 WO2007142112 A1 WO 2007142112A1
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- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4688—Composite multilayer circuits, i.e. comprising insulating layers having different properties
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- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B18/00—Layered products essentially comprising ceramics, e.g. refractory products
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- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
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- C03C3/00—Glass compositions
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- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
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- C03C3/00—Glass compositions
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- C03C3/076—Glass compositions containing silica with 40% to 90% silica, by weight
- C03C3/089—Glass compositions containing silica with 40% to 90% silica, by weight containing boron
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- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/02—Frit compositions, i.e. in a powdered or comminuted form
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- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
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- C04B35/626—Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/622—Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/626—Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B
- C04B35/63—Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B using additives specially adapted for forming the products, e.g.. binder binders
- C04B35/632—Organic additives
- C04B35/634—Polymers
- C04B35/63404—Polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/05—Insulated conductive substrates, e.g. insulated metal substrate
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4611—Manufacturing multilayer circuits by laminating two or more circuit boards
- H05K3/4626—Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials
- H05K3/4629—Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials laminating inorganic sheets comprising printed circuits, e.g. green ceramic sheets
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- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/65—Aspects relating to heat treatments of ceramic bodies such as green ceramics or pre-sintered ceramics, e.g. burning, sintering or melting processes
- C04B2235/656—Aspects relating to heat treatments of ceramic bodies such as green ceramics or pre-sintered ceramics, e.g. burning, sintering or melting processes characterised by specific heating conditions during heat treatment
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- C04B2235/65—Aspects relating to heat treatments of ceramic bodies such as green ceramics or pre-sintered ceramics, e.g. burning, sintering or melting processes
- C04B2235/656—Aspects relating to heat treatments of ceramic bodies such as green ceramics or pre-sintered ceramics, e.g. burning, sintering or melting processes characterised by specific heating conditions during heat treatment
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- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
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- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
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- C04B2237/58—Forming a gradient in composition or in properties across the laminate or the joined articles
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- C04B2237/50—Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
- C04B2237/66—Forming laminates or joined articles showing high dimensional accuracy, e.g. indicated by the warpage
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- C04B2237/70—Forming laminates or joined articles comprising layers of a specific, unusual thickness
- C04B2237/704—Forming laminates or joined articles comprising layers of a specific, unusual thickness of one or more of the ceramic layers or articles
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
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- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
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- H05K2201/06—Thermal details
- H05K2201/068—Thermal details wherein the coefficient of thermal expansion is important
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10T428/00—Stock material or miscellaneous articles
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Definitions
- Multilayer ceramic substrate method for manufacturing the same, and electronic component
- the present invention relates to a multilayer ceramic substrate, a manufacturing method thereof, and an electronic component including the multilayer ceramic substrate, and particularly relates to an improvement for improving the strength of the multilayer ceramic substrate.
- Patent Document 1 discloses a low-temperature fired multilayer ceramic substrate made of glass and the balance being crystalline.
- the outermost layer has a thermal expansion coefficient smaller than that of the inner layer and the thickness of the outermost layers on the front and back sides. The total is smaller than the thickness of the inner layer.
- Patent Document 1 shows an example in which the difference in thermal expansion coefficient is 0. AppmK- 1 and an example in which 0. SppmK- 1 is used. According to the combination of the difference between the composition and the thermal expansion coefficient of these examples, the effect claimed in Patent Document 1 can be obtained.
- Patent Document 1 there is a restriction that is particularly described in regard to the restriction on the difference in thermal expansion coefficient.
- the force S that increases the stress at the boundary between the outermost layer and the inner layer is surely increased when the difference in the thermal expansion coefficient is increased while adopting the configuration described in Patent Document 1. If the bonding force at the boundary is not sufficient, it may not be able to withstand the stress sufficiently, and if it peels off at the boundary, defects such as voids may occur. [0006] In addition, it is preferable that the multilayer ceramic substrate has a small amount of warpage in order to proceed with high reliability processes such as component mounting on the substrate surface and mounting on the parent substrate. In addition, when mounting components or resin coating on the board surface, the multilayer ceramic board may be warped by being pulled by shrinkage of the solder, adhesive or coating resin. . However, the difference in the thermal expansion coefficient between the outermost layer and the inner layer shown in the example described in Patent Document 1 is significant in terms of the amount of warpage compared to the case where such a difference is not provided. There is no difference.
- Patent Document 1 JP-A-6-29664
- an object of the present invention is to provide a multilayer ceramic substrate that solves the above-described problems, has higher strength, and is less warped.
- Another object of the present invention is to provide a preferable method for producing the above-mentioned multilayer ceramic substrate.
- Still another object of the present invention is to provide an electronic component including the multilayer ceramic substrate described above.
- the present invention is first directed to a multilayer ceramic substrate having a laminated structure composed of a surface layer portion and an inner layer portion.
- the coefficient of thermal expansion of the surface layer portion is Is smaller than the coefficient of thermal expansion of the inner layer part and the difference from the coefficient of thermal expansion of the inner layer part is 1.
- Op pmK- 1 or more, common between the material constituting the surface layer part and the material constituting the inner layer part It is characterized in that the weight ratio of each component is 75% by weight or more.
- the difference between the thermal expansion coefficient of the surface layer portion and the thermal expansion coefficient of the inner layer portion is preferably 4. SppmK- 1 or less.
- the material constituting the surface layer is SiO and MO (where MO is CaO, MgO, SrO
- the material constituting the inner layer portion includes glass containing SiO and MO, and SiO:
- SiO contained in the glass contained in the material constituting the surface layer portion is 34 to 73.
- the SiO contained in the glass contained in the material constituting the inner layer is 22-60% by weight.
- the glass included in the material constituting the surface layer portion is composed of 34 to 73 wt% SiO, 14 to
- the glass contained in the material constituting the part consists of 22-60% SiO and 22-60% by weight
- MO 0 to 20% by weight of 80, and 0 to 30% by weight of A10.
- the material constituting the surface layer portion includes 30 to 60% by weight of Al 2 O as a filler,
- the material constituting the layer contains 40 to 70% by weight of AlO as a filler.
- the present invention is also directed to a method of manufacturing a multilayer ceramic substrate as described above.
- the method for producing a multilayer ceramic substrate according to the present invention first, sintering is performed at a temperature at which the ceramic multilayer sheet for the surface layer, the ceramic green sheet for the inner layer, and the ceramic green sheet for the surface layer and the ceramic green sheet for the inner layer are sintered.
- a ceramic green sheet for restraint containing an inorganic material that is not used is prepared.
- At least one surface layer ceramic green sheet is disposed so as to sandwich at least one inner layer ceramic green sheet in the laminating direction, and at least one restraining ceramic green sheet is disposed on the outer side thereof.
- a step of producing a composite laminated body is performed.
- the composite laminate is fired at a temperature at which the ceramic green sheet for the surface layer and the ceramic liner sheet for the inner layer are sintered but the ceramic green sheet for restraint is not sintered.
- the thermal expansion coefficient of the surface layer part derived from the ceramic green sheet for surface layer is smaller than the thermal expansion coefficient of the inner layer part derived from the ceramic green sheet for inner layer, and the difference from the thermal expansion coefficient of the inner layer part is 1.
- OppmK- 1 or more and a composite laminate after firing is obtained in which the weight ratio of components common between the material constituting the surface layer part and the material constituting the inner layer part is 75% by weight or more. It is done.
- the present invention is further directed to an electronic component including the multilayer ceramic substrate as described above.
- the thermal expansion coefficient of the surface layer portion is smaller than the thermal expansion coefficient of the inner layer portion, the compressive stress is applied to the surface layer portion in the cooling process after firing as in Patent Document 1. As a result, the bending strength of the multilayer ceramic substrate can be increased.
- the difference between the thermal expansion coefficient of the surface layer portion and the thermal expansion coefficient of the inner layer portion is 1 ⁇ OppmK- 1 or more, warpage can be suppressed. . This is because when the difference in thermal expansion coefficient is increased to 1 ⁇ OppmK- 1 or more, in-plane stress acting to warp the multilayer ceramic substrate is caused by the difference in thermal expansion coefficient between the front and back surfaces. It is presumed that the warpage is corrected as a result of being relatively smaller than the stress acting in the inward direction.
- the weight ratio of the components common between the material constituting the surface layer portion and the material constituting the inner layer portion is 75% by weight or more. A sufficient bonding force can be obtained between the inner layer portion and the inner layer portion. Therefore, as described above, even if the difference in thermal expansion coefficient between the surface layer portion and the inner layer portion is as large as 1. OppmK- 1 or more, defects such as voids can be suppressed. .
- the difference in thermal expansion coefficient between the surface layer portion and the inner layer portion is 4.
- a defect such as a void is caused due to the difference in thermal expansion coefficient. Can be more reliably suppressed.
- the ceramic green for the surface layer is fired. Shrinkage in the direction of each principal surface during firing of the sheet and the ceramic green sheet for the inner layer can be suppressed. For this reason, undesired deformation of the multilayer ceramic substrate can be suppressed and dimensional accuracy can be increased, and in the case of firing with force, peeling between the surface layer portion and the inner layer portion can be made less likely to occur. .
- FIG. 1 is a front view showing an electronic component 2 including a multilayer ceramic substrate 1 according to an embodiment of the present invention.
- FIG. 3 is a plan view showing a cross-sectional view of the multilayer ceramic substrate 1.
- FIG. 2 is a cross-sectional view showing a composite laminate 21 produced during the production of the multilayer ceramic substrate 1 shown in FIG.
- FIG. 1 is a front view showing an electronic component 2 including a multilayer ceramic substrate 1 according to an embodiment of the present invention.
- the electronic component 2 is shown in a cross-sectional view.
- the multilayer ceramic substrate 1 has a laminated structure including an inner layer portion 3 and first and second surface layer portions 4 and 5 positioned so as to sandwich the inner layer portion 3 in the laminating direction.
- the inner layer portion 3 is constituted by at least one inner layer portion ceramic layer 6, and the first and second surface layer portions 4 and 5 are constituted by at least one surface layer portion ceramic layers 7 and 8, respectively.
- the multilayer ceramic substrate 1 is provided with a wiring conductor.
- the wiring conductor is used to form a passive element such as a capacitor or an inductor, or to perform connection wiring such as an electrical connection between the elements.
- the conductor films 9 to 11 and several via-hole conductors 12 are included.
- the conductive film 9 is formed inside the multilayer ceramic substrate 1.
- Conductive films 10 and 11 are formed on one main surface and the other main surface of multilayer ceramic substrate 1, respectively.
- Biaho The wire conductor 12 is provided so as to be electrically connected to any of the forces of the conductor films 9 to 11 and to penetrate through the ceramic layer 6 to 8 in the thickness direction.
- chip components 13 and 14 are mounted in a state of being electrically connected to the external conductor film 10.
- the electronic component 2 including the multilayer ceramic substrate 1 is configured.
- the external conductor film 11 formed on the other main surface of the multilayer ceramic substrate 1 is used as an electrical connection means when the electronic component 2 is mounted on a mother board (not shown).
- the thermal expansion coefficients of the surface layer parts 4 and 5 are smaller than the thermal expansion coefficient of the inner layer part 3, and the difference from the thermal expansion coefficient of the inner layer part 3 1. OppmK— 1 or more. Further, the weight ratio of the components common between the material constituting the surface layer parts 4 and 5 and the material constituting the inner layer part 3 is 75% by weight or more.
- the thermal expansion coefficients of the surface layers 4 and 5 and the inner layer 3 are used. It was found that the warpage of the multilayer ceramic substrate 1 can be greatly reduced by making the difference from the thermal expansion coefficient of 1. OppmK- 1 or more. That is, relationships with warpage amount and the thermal expansion coefficient difference, where the difference of thermal expansion coefficient of less than 1. OppmK- 1 is warpage almost takes a constant value, 1. near OppmK- 1, warpage Changed significantly to near zero, and 1. ( ⁇ !!!! ⁇ After this, it was found to be almost constant.
- the stress in the in-plane direction acting to warp the multilayer ceramic substrate 1 is relatively smaller than the stress acting in the in-plane direction on the front and back surfaces due to the difference in thermal expansion coefficient. It is presumed that the warpage is corrected.
- the difference between the thermal expansion coefficients of the surface layer portions 4 and 5 and the thermal expansion coefficient of the inner layer portion 3 is preferably 4.3 ppm K- 1 or less. As a result, defects such as delamination voids at the boundary between the surface layer portions 4 and 5 and the inner layer portion 3 due to the difference in thermal expansion coefficient can be more reliably prevented.
- the materials constituting the surface layers 4 and 5 are SiO and MO (where MO is CaO, Mg).
- the material constituting the inner layer 3 is made of glass containing SiO and MO.
- SiO: M0 19: 11 to 11:19.
- the preferred composition and the content thereof are as follows. Using a borosilicate glass-based material, the difference in thermal expansion coefficient between the surface layer parts 4 and 5 and the inner layer part 3 is 1. OppmK- 1 or more. It is suitable for the weight ratio of common ingredients to be 75% by weight or more.
- the SiO component contained in the glass contributes to lowering the thermal expansion coefficient, and the MO component is
- the glass composition is preferably close to the precipitated crystal composition.
- the ratio of SiO and MO so as to be close to this crystal composition.
- the glass composition of the surface layers 4 and 5 reduces the coefficient of thermal expansion.
- the glass composition of the inner layer part 3 whose ratio should be close to 2 is better.
- the ratio with MO should be close to 1.
- the glass composition of the inner layer part 3 is higher in M0 ratio than the surface layer parts 4 and 5, and is not exposed to the surface part because it is susceptible to erosion in the staking treatment after firing. It has a structure that is less susceptible to fatal damage.
- the ratio of SiO and MO in the glass is determined by the surface layer portions 4 and 5 and the inner layer portion.
- the glass contained in the material constituting the surface layer portions 4 and 5 is composed of 34 to 73% by weight of SiO, 1
- the glass contained in the material constituting the inner layer part 3 is composed of 22 to 60% by weight of SiO and 22 to 60
- B 2 O gives a suitable viscosity to the glass so that the sintering proceeds smoothly during firing.
- Al 2 O is a component constituting the precipitated crystal. This Al O
- A1O improves the chemical stability of glass, so M0 is relatively high.
- the material constituting the surface layers 4 and 5 contains 30 to 60% by weight of AlO as a filler.
- the material constituting the inner layer 3 should contain 40 to 70% by weight of AlO as a filler.
- the Al 2 O filler contributes to improving the mechanical strength. Less Al O filler
- the inner layer part 3 contains more A10 filler than the surface layer parts 4 and 5, and by increasing the strength, a larger difference in thermal expansion coefficient can be obtained.
- the Al O filler is composed of glass in the surface layers 4 and 5 and the inner layer 3
- each of the surface layer portions 4 and 5 is preferably 5 to 150 ⁇ . The reason is as follows.
- a compressive stress acts on the surface layers 4 and 5 side, and this compressive stress decreases as the distance from the interface increases.
- tensile stress acts on the inner layer portion 3 side, and this tensile stress decreases as the distance from the interface increases. This is because the stress force S is relaxed according to the distance. When this distance exceeds 150 ⁇ , compressive stress almost does not act on the surface, and the effect is hardly seen. Therefore, the thickness of each of the surface layers 4 and 5 is preferably 150 ⁇ m or less. Les.
- the thickness of each of the surface layer parts 4 and 5 is less than 5 zm, the inner layer part 3 whose strength has decreased due to the acting of tensile stress exists in the vicinity of the surface less than 5 ⁇ m from the surface. It will be. For this reason, the inner layer part 3 near the surface is likely to break down, and the effect strengthened by forming compressive stress on the surface layer parts 4 and 5 cannot be seen. Therefore, the thickness of each of the surface layer parts 4 and 5 is It is preferable that it is 5 ⁇ m or more.
- the multilayer ceramic substrate 1 as described above is preferably manufactured as follows.
- FIG. 2 is a cross-sectional view showing a composite laminate 21 produced during the production of the multilayer ceramic substrate 1.
- the composite laminate 21 includes an inner layer ceramic green sheet 22 to be the inner layer ceramic layer 6 in the multilayer ceramic substrate 1, and a surface layer ceramic green sheet 23 and 24 to be the surface layer ceramic layers 7 and 8, respectively.
- restraint ceramic green sheets 25 and 26 are provided.
- conductor films 9 to 11 and via-hole conductors 12 as wiring conductors provided in the multilayer ceramic substrate 1 are provided.
- an inner layer ceramic green sheet 22, a surface layer ceramic green sheet 23 and 24, and a restraining ceramic green sheet 25 and 26 are prepared.
- the thermal expansion coefficient of the sintered body of the ceramic green sheets 23 and 24 for the surface layer is smaller than the thermal expansion coefficient of the sintered body of the inner ceramic green sheet 22 and the thermal expansion coefficient of the sintered body of the inner ceramic green sheet 22 The difference of 1.
- OppmK is 1 or more, and the weight of the common component between the material constituting the sintered body of the ceramic ceramic sheets 23 and 24 for the surface layer and the material constituting the sintered body of the inner ceramic layer 22
- Each composition of these green sheets 22 to 24 is selected so that the amount ratio is 75% by weight or more, and the ceramic green sheets 25 and 26 for restraint are ceramic green sheets 23 and 24 for the surface layer and ceramic green for the inner layer.
- the sheet 22 does not sinter at the temperature at which the sheet 22 is sintered, and the composition includes an inorganic material.
- surface ceramic green sheets 23 and 24 are arranged so as to sandwich at least one inner layer ceramic green sheet 22 in the stacking direction, respectively, and further, constraining ceramic green sheets 25 and 26 are arranged outside thereof. By arranging each of these, a composite laminate 21 as shown in FIG. 2 is produced.
- the composite laminate 21 is fired at a temperature at which the surface-constrained ceramic green sheets 23 and 24 and the inner-layer ceramic green sheets 22 are not sintered.
- the thermal expansion coefficients of the surface layer parts 4 and 5 (see Fig. 1) derived from the surface ceramic green sheets 23 and 24 are reduced.
- the difference from the coefficient of thermal expansion of 3 is 1. OppmK— 1 or more, and the weight ratio of the components common to the materials constituting the surface layer parts 4 and 5 and the material constituting the inner layer part 3 is 75% by weight or more. Thus, the fired composite laminate 21 is obtained.
- the part derived from 26 is removed. Thereby, the multilayer ceramic substrate 1 is obtained.
- a ceramic green sheet for surface layer and a ceramic green sheet for inner layer according to each sample were prepared.
- Table 1 shows the content of ceramic powder (filled with Al 2 O powder in this experimental example) as filler contained in the ceramic green sheet for surface layer, and the composition and content of glass powder.
- Table 2 shows the content of the ceramic powder (Al 2 O powder) as a filler contained in the ceramic green sheet for the inner layer and the composition and content of the glass powder.
- the numerical value indicating the content of the ceramic powder indicates a weight ratio when the total of the ceramic powder and the glass powder is 100 parts by weight. Therefore, the content of the glass powder is the balance of the ceramic powder.
- the numerical value indicating the content of each component of the glass powder is in units of “% by weight”.
- SiO: MO means SiO and MO contained in the glass powder (however, MO is a force of at least one selected from CaO MgO, SrO and BaO forces. This indicates the ratio of at least one of MgO), but it is calculated so that the total of the numerical values indicating the ratio is 30.
- alumina powder and an organic solvent are mixed. Furthermore, for 100 parts by weight of alumina powder, 10 parts by weight of a butyral binder, 1 part by weight of a plasticizer, and 1 part by weight of a spherical cell port are obtained. And wet-mixing under predetermined conditions to obtain a slurry. Next, the obtained slurry was formed into a sheet by a doctor blade method to obtain a constraining ceramic green sheet having a thickness of 50 ⁇ m.
- Table 3 shows the weight ratios of the common components between the material constituting the surface layer portion and the material constituting the inner layer portion in the laminated sintered body for evaluation shown in Table 1 and Table 2. Calculated from the content of each component.
- the warp of the obtained laminated sintered body was measured as it is, and this is shown in the column “A”. Also, on one main surface of the laminated sintered body, an adhesive resin used for surface mounting of chip parts was applied, and after this was cured by heating, the warpage was measured, and this was shown in the column “B”.
- the thermal expansion coefficient (ct l) of the surface layer portion is the thermal expansion of the inner layer portion.
- the coefficient ( ⁇ 2) is smaller than the coefficient ( ⁇ 2) and the difference ( ⁇ 2- ⁇ ⁇ ) from the coefficient of thermal expansion of the inner layer is 1.
- OppmK- 1 or more, and the weight ratio of common components in the surface layer and inner layer is The condition of 75% by weight or more is satisfied. According to these samples 7 to 18 and 20, it is possible to obtain a multi-layer ceramic substrate having a high bending strength and a small amount of warp.
- a ceramic green sheet for the surface layer and a ceramic green sheet for the inner layer were prepared.
- Table 4 shows the composition and content of the ceramic raw material powder contained in the surface layer ceramic green sheet
- Table 5 shows the composition and content of the ceramic raw material powder contained in the inner layer ceramic green sheet. It has been done.
- Sample 2 In order to obtain the ceramic green sheet for the surface layer and the ceramic green sheet for the inner layer according to each of! To 31, the above ceramic raw material powder and water were sufficiently mixed and dried. , Heat treatment at a temperature of 900 ° C for 60 minutes, add the organic solvent after the heat treatment, and further add 10 parts by weight of petital binder and 1 part by weight of plasticizer to 100 parts by weight of the ceramic raw material powder. The mixture was wet-mixed under predetermined conditions to obtain a slurry. Next, the obtained slurry was formed into a sheet shape by a doctor blade method to obtain a ceramic green sheet for surface layer and a ceramic green sheet for inner layer, each having a thickness of 50 zm.
- the thermal expansion coefficient (ct 1) force of the layer part is smaller than the thermal expansion coefficient ( ⁇ 2) of the inner layer part and the difference ( ⁇ 2 a 1) from the thermal expansion coefficient of the inner layer part is 1.
- OppmK- 1 or more the condition that the weight ratio of common components in the surface layer portion and the inner layer portion is 75% by weight or more is satisfied. According to these samples 27 to 31, it is possible to obtain a multilayer ceramic substrate having a high bending strength with less delamination and less warping.
- the common component in the surface layer portion and the inner layer portion was less than 75% by weight of the weight ratio, and the common component was remarkably small, so delamination occurred in the multilayer ceramic substrate.
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Abstract
Description
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EP07744477.6A EP2026642B1 (en) | 2006-06-02 | 2007-05-31 | Multilayer ceramic substrate, method for producing the same and electronic component |
CN2007800125062A CN101416570B (zh) | 2006-06-02 | 2007-05-31 | 多层陶瓷基板及其制造方法以及电子器件 |
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US20090011249A1 (en) | 2009-01-08 |
KR101073873B1 (ko) | 2011-10-14 |
JP4957723B2 (ja) | 2012-06-20 |
EP2026642B1 (en) | 2017-12-27 |
EP2026642A4 (en) | 2009-08-26 |
JPWO2007142112A1 (ja) | 2009-10-22 |
EP2026642A1 (en) | 2009-02-18 |
US7883765B2 (en) | 2011-02-08 |
KR20080098528A (ko) | 2008-11-10 |
CN101416570B (zh) | 2012-05-09 |
CN101416570A (zh) | 2009-04-22 |
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