WO2005111639A1 - 発振検出装置、及び試験装置 - Google Patents
発振検出装置、及び試験装置 Download PDFInfo
- Publication number
- WO2005111639A1 WO2005111639A1 PCT/JP2005/008768 JP2005008768W WO2005111639A1 WO 2005111639 A1 WO2005111639 A1 WO 2005111639A1 JP 2005008768 W JP2005008768 W JP 2005008768W WO 2005111639 A1 WO2005111639 A1 WO 2005111639A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- signal
- power supply
- oscillation
- circuit
- supply voltage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0007—Frequency selective voltage or current level measuring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
- G01R19/1658—AC voltage or recurrent signals
Definitions
- the present invention relates to an oscillation detection device that detects signal oscillation and a test device that tests an electronic device.
- an oscillation detection device that detects signal oscillation
- a test device that tests an electronic device.
- the power supply voltage or the like may oscillate depending on the characteristics of the electronic device connected as the load of the test apparatus.
- the power supply voltage or the like oscillates, a failure may occur in the test apparatus or the electronic device. Therefore, it is preferable to detect the oscillation of the power supply voltage or the like.
- a conventional oscillation detection device includes a filter that removes a DC component of a given signal, an absolute value circuit that rectifies the signal, an integration circuit that integrates a waveform of the rectified signal, and an integration circuit that integrates the rectified signal. And a determination circuit for determining whether the signal oscillates.
- the integrated value is large, and therefore, the signal may be detected as oscillating.
- an object of the present invention is to provide an oscillation detection device and a test device that can solve the above problems. This object is achieved by the features described in the independent claims. Is achieved by a combination of The dependent claims define further advantageous embodiments of the present invention.
- a first embodiment of the present invention relates to an oscillation detection device that detects signal oscillation, comprising: a high-pass filter that generates an AC signal from which a DC component of a signal has been removed; A slice circuit that generates a limit signal in which the amplitude level of the AC signal is limited to a given level or less, an integration circuit that integrates a waveform of the limit signal during a predetermined period, and a value integrated by the integration circuit. And a comparator for detecting whether or not the signal is oscillating based on the following.
- the oscillation detection device may further include an absolute value circuit that converts a negative signal component of the AC signal into a positive signal component. Further, the oscillation detection device may further include an absolute value circuit that converts a negative signal component of the limit signal into a positive signal component.
- a test apparatus for testing an electronic device comprising: a power supply unit for supplying a power supply voltage to the electronic device; and an oscillation detection apparatus for detecting oscillation of the power supply voltage. And a warning unit that issues a warning when the power supply voltage is oscillating.
- the oscillation detection device includes a high-pass filter that generates an AC signal from which the DC component of the power supply voltage has been removed, and an amplitude level of the AC signal.
- a power supply voltage oscillates based on a value obtained by integrating a slice circuit that generates a limit signal limited to a predetermined limit level or less, an integration circuit that integrates a waveform of the limit signal during a predetermined period, and a value that is integrated by the integration circuit.
- a test apparatus having a comparator for detecting whether or not the test is performed.
- the test apparatus may further include an absolute value circuit that converts a negative signal component of the AC signal into a positive signal component.
- the test apparatus may further include an absolute value circuit that converts a negative signal component of the limit signal into a positive signal component.
- the high-pass filter passes a signal component in a natural oscillation frequency band of the power supply unit.
- the slice circuit is larger than the oscillation amplitude level allowed in the power supply section.
- V preferably given a restriction level.
- the warning unit may stop the operation of the power supply unit when the comparator detects the oscillation of the power supply voltage.
- the comparator is provided with a plurality of different reference values, and is provided with a plurality of reference values. By comparing this with the value integrated by the integrating circuit, the risk of oscillation of the power supply voltage may be determined.
- erroneous detection of signal oscillation can be reduced, and signal oscillation can be detected efficiently.
- FIG. 1 is a diagram showing an example of a configuration of a test apparatus 100 working on an embodiment of the present invention.
- FIG. 2 is a diagram showing an example of a configuration of an oscillation detection device 50.
- FIG. 3 is a diagram showing an example of a waveform of an AC component of a rectified power supply voltage.
- FIG. 4 is a diagram showing an example of a configuration of a slice circuit 60.
- FIG. 1 is a diagram showing an example of a configuration of a test apparatus 100 working on an embodiment of the present invention.
- the test apparatus 100 is an apparatus for testing an electronic device 200 such as a semiconductor circuit, and includes a control unit 10, a logic unit 20, a power supply unit 30, a warning unit 40, and an oscillation detection device 50.
- the logic unit 20 stores a test pattern for testing the electronic device 200
- the electronic device 200 determines whether the electronic device is good or not based on an output signal output from the electronic device 200.
- the power supply unit 30 supplies a power supply voltage and a power supply current for driving the electronic device 200 to the electronic device 200.
- the test apparatus 100 performs a logic test of the electronic device 200.
- the test apparatus 100 performs a DC test for measuring a power supply voltage and a power supply supplied to the electronic device 200. It may be something.
- the oscillation detection device 50 detects the oscillation of a given signal.
- the oscillation detection device 50 detects the oscillation of the power supply voltage supplied from the power supply unit 30 to the electronic device 200.
- the warning unit 40 issues a warning to the control unit 10 when the power supply voltage is oscillating.
- the warning unit 40 may stop the operation of the power supply unit 30 when the oscillation of the power supply voltage is detected. In this case, it is preferable that the warning unit 40 notifies the control unit 10 that the operation of the power supply unit 30 has been stopped because the power supply voltage is oscillating.
- FIG. 2 is a diagram showing an example of the configuration of the oscillation detection device 50.
- the oscillation detection device 50 includes a high-pass filter 52, an absolute value circuit 54, a slice circuit 60, an integration circuit 56, and a comparator 58.
- the high-pass filter 52 generates an AC signal from which a DC component of a power supply voltage supplied from the power supply unit 30 to the electronic device 200 has been removed.
- the high-pass filter 52 preferably allows the signal component in the inherent oscillation frequency band of the power supply unit 30 to pass.
- the natural oscillation frequency is an oscillation frequency of the circuit which is determined by, for example, the characteristics of the elements of the circuit constituting the power supply unit 30.
- the absolute value circuit 54 rectifies the AC signal. That is, the absolute value circuit 54 converts a negative signal component of the AC signal into a positive signal component.
- the slicing circuit 60 generates a limit signal in which the amplitude level of the AC signal is limited to a predetermined limit level or less. That is, the slice circuit 60 replaces a signal component that is larger than the limit level of the AC signal with a signal component of the limit level.
- the slice circuit 60 is given a limit level larger than the oscillation amplitude level permitted in the power supply section 30 as the limit level! /.
- the absolute value circuit 54 is arranged upstream of the slice circuit 60, but in other examples, the absolute value circuit 54 may be arranged downstream of the slice circuit 60.
- the slice circuit 60 converts a negative signal component of the limit signal output from the slice circuit 60 into a positive signal component.
- the integration circuit 56 integrates the waveform of the limit signal in a predetermined period. And The comparator 58 detects whether or not the power supply voltage is oscillating based on the value integrated by the integration circuit 56.
- FIG. 3 is a diagram illustrating an example of a waveform of an AC component of a rectified power supply voltage.
- the integrating circuit 56 controls the power supply voltage during a predetermined period from T to T.
- a waveform such as the power supply voltage a in FIG. 3 is given to the slice circuit 60.
- the oscillation detection device 50 integrates the waveform by removing a signal component larger than the limit level as described above.
- Comparator 58 includes an amplitude of the oscillation signal to be detected and a base value corresponding to the integration time (T to T).
- a quasi-value is given. For example, when it is desired to detect an oscillation signal having an amplitude that causes the power supply unit 30 to fail, an oscillation signal having a lower limit amplitude that causes the power supply unit 30 to fail is integrated for an integration time ( ⁇ to ⁇ ).
- the comparator 58 determines that the power supply voltage is oscillating when the integrated value output from the integrating circuit 56 is larger than the given reference value. With such an operation, when the power supply voltage oscillates at an amplitude greater than the allowable oscillation amplitude of the power supply unit 30, the oscillation can be detected. For this reason, the failure of the power supply unit 30 can be prevented. In addition, it is possible to prevent erroneous detection of oscillation in the case where oscillation having a small amplitude allowed in the power supply unit 30 or fluctuation in the amplitude of the power supply voltage due to noise or the like occurs.
- the comparator 58 is provided with a plurality of different reference values, and compares the plurality of reference values with the value integrated by the integration circuit 56 to determine the risk of oscillation of the power supply voltage. You may. It is preferable that the warning unit 40 notifies the control unit 10 and stops the operation of the power supply unit 30 according to the degree of risk determined by the comparator 58.
- the comparator 58 includes a first reference value indicating a value obtained by integrating the waveform when the amplitude of the power supply voltage is substantially the same as the limit level, and a second reference value smaller than the first reference value.
- the control unit 10 is notified.
- the power supply unit Stop the operation of 30!
- a noise waveform such as the power supply voltage b in FIG. Slice circuit 60 is provided.
- the integrated value in the integrating circuit 56 is smaller than the reference value given to the comparator 58. Therefore, the oscillation detection circuit 50 determines that the power supply voltage is not oscillating.
- the waveform power having a signal component of a large amplitude in the phase of the fluctuation is applied to the S-slice circuit 60.
- the integrated value becomes larger than the reference value given to the comparator 58, and the oscillation may be erroneously detected.
- the oscillation detection device 50 in the present example limits the amplitude level by the slice circuit 60 and cuts the amplitude of the large amplitude signal component. It is possible to prevent erroneous detection, and to perform measurement in a short time.
- the limit level given to slice circuit 60 is set to a value larger than the amplitude level of the oscillation signal that can be detected by the reference value given to comparator 58. By setting such a limit level, erroneous detection can be reduced while maintaining the detection sensitivity of the oscillation signal.
- the detection sensitivity indicating the amplitude of oscillation to be detected can be controlled by adjusting the reference value given to the comparator 58, but in other examples, Alternatively, the detection sensitivity may be controlled by fixing the reference value given to the filter 58 and adjusting the amplitude gain or the like of the high-pass filter.
- FIG. 4 is a diagram showing an example of the configuration of the slice circuit 60.
- the absolute value circuit 54 (see FIG. 2) is provided downstream of the slice circuit 60.
- the slice circuit 60 has a resistor 62, a diode 66, a diode 68, and a differential amplifier 64.
- the positive and negative amplitudes of the AC signal provided through the resistor 62 are limited by the two diodes (66, 68), and the differential amplifier 64 outputs an AC signal whose amplitude is limited.
- the absolute value circuit 54 When the absolute value circuit 54 is provided upstream of the slice circuit 60, the AC signal supplied to the slice circuit 60 has only a positive amplitude. Therefore, one slice circuit 60 is required. Can limit the amplitude of the AC signal. In this case, the circuit scale of the slice circuit 60 can be reduced.
- slice circuit 60 is not limited to the configuration described in FIG. A circuit having various other configurations can be used as the slice circuit 60.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006513564A JPWO2005111639A1 (ja) | 2004-05-19 | 2005-05-13 | 発振検出装置、及び試験装置 |
DE112005001161T DE112005001161T5 (de) | 2004-05-19 | 2005-05-13 | Oszillationserfassungsvorrichtung und Prüfvorrichtung |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/848,895 US7034562B2 (en) | 2004-05-19 | 2004-05-19 | Oscillation detecting apparatus and test apparatus |
US10/848,895 | 2004-05-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005111639A1 true WO2005111639A1 (ja) | 2005-11-24 |
Family
ID=35374609
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/008768 WO2005111639A1 (ja) | 2004-05-19 | 2005-05-13 | 発振検出装置、及び試験装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7034562B2 (ja) |
JP (1) | JPWO2005111639A1 (ja) |
KR (1) | KR20070026596A (ja) |
CN (1) | CN100562758C (ja) |
DE (1) | DE112005001161T5 (ja) |
WO (1) | WO2005111639A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008123156A1 (ja) * | 2007-03-29 | 2008-10-16 | Advantest Corporation | 試験装置及び電子デバイス |
JP2009115647A (ja) * | 2007-11-07 | 2009-05-28 | Yokogawa Electric Corp | 直流試験装置及び半導体試験装置 |
JP2014139567A (ja) * | 2012-12-17 | 2014-07-31 | Denso Corp | Fmcwレーダ装置 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4645768B1 (ja) * | 2009-11-02 | 2011-03-09 | パナソニック株式会社 | 電子機器 |
JP2012042338A (ja) * | 2010-08-19 | 2012-03-01 | Ntn Corp | 転がり軸受の異常診断装置および歯車の異常診断装置 |
EP2579445A1 (en) * | 2011-10-07 | 2013-04-10 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Peak detector for switched ac/dc converter |
EP2764372B1 (en) * | 2011-10-07 | 2018-08-15 | Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V. | Peak detector with false peak rejection |
EP4266525A1 (en) * | 2022-04-21 | 2023-10-25 | Vestas Wind Systems A/S | A method for detecting power oscillation in an electric power grid |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5852571A (ja) * | 1981-09-24 | 1983-03-28 | Fujitsu Ltd | キャリア検出回路 |
JPS602347U (ja) * | 1983-06-15 | 1985-01-09 | 富士通機電株式会社 | 停電検出回路 |
JPS63168866U (ja) * | 1987-04-24 | 1988-11-02 | ||
JP2000304815A (ja) * | 1999-04-16 | 2000-11-02 | Advantest Corp | 半導体試験装置のデバイス電源供給装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3806905A (en) * | 1971-09-08 | 1974-04-23 | Sperry Rand Corp | Transducer and condition monitor |
US3801799A (en) * | 1972-08-14 | 1974-04-02 | Wagner Electric Corp | Capacitance and resistance-responsive control circuits |
US3976940A (en) * | 1975-02-25 | 1976-08-24 | Fairchild Camera And Instrument Corporation | Testing circuit |
JPS602347A (ja) | 1983-06-21 | 1985-01-08 | Toppan Printing Co Ltd | 凹部を有するカ−ドの製造方法 |
JPS63168866A (ja) | 1987-01-07 | 1988-07-12 | Hitachi Ltd | 磁気記録再生装置のテンシヨンア−ム制動機構 |
JPS63274873A (ja) * | 1987-05-06 | 1988-11-11 | Nec Ic Microcomput Syst Ltd | 発振検知回路 |
US5049838A (en) * | 1989-09-19 | 1991-09-17 | The Boeing Company | Minimum intrusion search oscillator for use in feedback loops |
US5170135A (en) * | 1990-07-24 | 1992-12-08 | Nec Corporation | Phase and frequency-locked loop circuit having expanded pull-in range and reduced lock-in time |
JP3221128B2 (ja) * | 1993-02-02 | 2001-10-22 | 日新電機株式会社 | 電流検出装置 |
JP3937888B2 (ja) * | 2002-03-27 | 2007-06-27 | ヤマハ株式会社 | 発振検知回路 |
US6819196B2 (en) * | 2003-02-13 | 2004-11-16 | Standard Microsystems Corporation | Crystal oscillator with control feedback to maintain oscillation |
-
2004
- 2004-05-19 US US10/848,895 patent/US7034562B2/en not_active Expired - Fee Related
-
2005
- 2005-05-13 DE DE112005001161T patent/DE112005001161T5/de not_active Withdrawn
- 2005-05-13 KR KR1020067026404A patent/KR20070026596A/ko not_active Application Discontinuation
- 2005-05-13 JP JP2006513564A patent/JPWO2005111639A1/ja active Pending
- 2005-05-13 WO PCT/JP2005/008768 patent/WO2005111639A1/ja active Application Filing
- 2005-05-13 CN CNB200580015920XA patent/CN100562758C/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5852571A (ja) * | 1981-09-24 | 1983-03-28 | Fujitsu Ltd | キャリア検出回路 |
JPS602347U (ja) * | 1983-06-15 | 1985-01-09 | 富士通機電株式会社 | 停電検出回路 |
JPS63168866U (ja) * | 1987-04-24 | 1988-11-02 | ||
JP2000304815A (ja) * | 1999-04-16 | 2000-11-02 | Advantest Corp | 半導体試験装置のデバイス電源供給装置 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008123156A1 (ja) * | 2007-03-29 | 2008-10-16 | Advantest Corporation | 試験装置及び電子デバイス |
US8299810B2 (en) | 2007-03-29 | 2012-10-30 | Advantest Corporation | Test apparatus and electronic device |
JP5186485B2 (ja) * | 2007-03-29 | 2013-04-17 | 株式会社アドバンテスト | 試験装置 |
JP2009115647A (ja) * | 2007-11-07 | 2009-05-28 | Yokogawa Electric Corp | 直流試験装置及び半導体試験装置 |
JP2014139567A (ja) * | 2012-12-17 | 2014-07-31 | Denso Corp | Fmcwレーダ装置 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2005111639A1 (ja) | 2008-03-27 |
KR20070026596A (ko) | 2007-03-08 |
US7034562B2 (en) | 2006-04-25 |
US20050258855A1 (en) | 2005-11-24 |
DE112005001161T5 (de) | 2007-06-28 |
CN1954226A (zh) | 2007-04-25 |
CN100562758C (zh) | 2009-11-25 |
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