WO2005098359A1 - 角速度計測装置 - Google Patents
角速度計測装置 Download PDFInfo
- Publication number
- WO2005098359A1 WO2005098359A1 PCT/JP2005/006756 JP2005006756W WO2005098359A1 WO 2005098359 A1 WO2005098359 A1 WO 2005098359A1 JP 2005006756 W JP2005006756 W JP 2005006756W WO 2005098359 A1 WO2005098359 A1 WO 2005098359A1
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- Prior art keywords
- substrate
- electrode
- detection
- electrodes
- angular velocity
- Prior art date
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- 238000001514 detection method Methods 0.000 claims description 360
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- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 229910010293 ceramic material Inorganic materials 0.000 description 4
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- 238000005516 engineering process Methods 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
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- 239000002356 single layer Substances 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5719—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using planar vibrating masses driven in a translation vibration along an axis
- G01C19/5769—Manufacturing; Mounting; Housings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5719—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using planar vibrating masses driven in a translation vibration along an axis
- G01C19/5733—Structural details or topology
- G01C19/574—Structural details or topology the devices having two sensing masses in anti-phase motion
Definitions
- the present invention relates to an angular velocity measuring device preferably used for detecting an angular velocity, for example.
- the angular velocity detecting element includes a vibrating body provided so as to be able to vibrate in the first and second axial directions among the three orthogonal axes, and a drive for vibrating the vibrating body in the first axial direction by a drive signal.
- Means for detecting a displacement of the vibrating body in the second axial direction when an angular velocity is applied around a third axis while the vibrating body vibrates in the first axial direction and outputs a detection signal.
- a displacement detecting means is provided so as to be able to vibrate in the first and second axial directions among the three orthogonal axes.
- the substrate is provided with a driving wiring and a detection wiring connected to the driving means and the displacement detecting means of the angular velocity detecting element, respectively, and the connection between the angular velocity detecting element and the signal processing element is provided through these wirings.
- Patent Document 1 JP-A-10-300475
- a driving unit moves a vibrating body to a first position based on the driving signal. Vibrates in the axial direction of.
- Corioliska acts on the vibrating body in the second axial direction.
- the vibrating body is displaced in the second axial direction according to the angular velocity, so that the displacement detecting means detects the amount of displacement of the vibrating body in the second axial direction as a change in capacitance or the like, Outputs a detection signal corresponding to the angular velocity.
- the signal processing element receives the detection signal of the displacement detecting means through the detection wiring, and performs various arithmetic processing on the detection signal to calculate the angular velocity.
- the detection wire is a high impedance ⁇ ⁇ (X 10 6 ⁇ ) order
- the cross through the coupling capacitance between the detection wire and the drive wiring Talk may occur and the drive signal may be mixed into the detection signal.
- both the drive wiring and the detection wiring according to the conventional technology are provided on the surface of the substrate, a sufficient shield cannot be provided around the high impedance detection wiring. It was not possible to reduce the coupling capacitance between the drive wiring and the detection wiring.
- two drive wirings and two detection wirings are provided according to two drive signals and detection signals having different signs, respectively, and each of these two drive wirings and the detection wirings is provided. The coupling capacitance balance was adjusted between and to offset crosstalk.
- the driving wiring is formed symmetrically with respect to the two detection wirings.
- the routing force S of the wiring is restricted, the mounting area including the wiring and the like becomes large, and the degree of freedom of arrangement of the angular velocity detecting element, the signal processing element, and the like is reduced.
- the present invention has been made in view of the above-described problems of the related art, and an object of the present invention is to efficiently shield a high-impedance detection wiring, remove wiring restrictions and eliminate restrictions on element arrangement, An object of the present invention is to provide an angular velocity measuring device capable of reducing a mounting area.
- the present invention provides a substrate and a substrate provided on the substrate and provided so as to be capable of vibrating in the first and second axial directions among three orthogonal axes.
- the angular velocity detecting element comprises a displacement detecting means for detecting the displacement of the vibrating body in the second axial direction and outputting a detection signal, and a driving means for the angular velocity detecting element provided on the substrate.
- the connected drive wiring, the detection wiring provided on the substrate and connected to the displacement detecting means of the angular velocity detecting element, and the detection wiring provided on the substrate and connected to the drive wiring and the detection wiring The present invention is applied to an angular velocity measuring device including a signal processing unit.
- the feature of the configuration adopted by the present invention is that the substrate is configured by using a multilayer substrate composed of a plurality of insulating layers, and inside the multilayer substrate, between the two insulating layers.
- a wiring for detection is provided, and the multilayer substrate is provided with a low-impedance low-impedance wiring opposed to the wiring for detection at a position different from the wiring for detection in the thickness direction thereof;
- the detecting element includes an element-side driving electrode connected to the driving means and located on the mounting surface side of the multilayer substrate, an element-side detecting electrode connected to the displacement detecting means, An element-side driving electrode and an element-side low-impedance electrode that is positioned between the element-side detection electrode and the element-side drive electrode and the element-side detection electrode.
- the element side connected to the drive wiring A substrate-side drive electrode facing the drive electrode, a substrate-side detection electrode connected to the detection wiring and facing the element-side detection electrode, and between the substrate-side drive electrode and the substrate-side detection electrode And a substrate-side low-impedance electrode that cuts off the coupling between the substrate-side drive electrode and the substrate-side detection electrode, and mounts the angular velocity detection element on the surface of the multilayer substrate using a metal bump. Connecting the element-side drive electrode and the substrate-side drive electrode using the metal bump, and connecting the element-side detection electrode and the substrate-side electrode.
- the detection electrode is connected using the metal bump, the element-side low impedance electrode and the substrate-side low impedance electrode are connected to a low impedance reference potential, and the element-side low impedance electrode and the substrate-side low impedance electrode are connected to each other. Are at least partially opposed to each other.
- the detection wiring is provided inside the multilayer substrate, and the multilayer substrate has a low impedance facing the detection wiring at a position different from the detection wiring in the thickness direction. Since the wiring is provided, the high-impedance detection wiring can be shielded by using the low-impedance wiring. Therefore, it is possible to prevent the drive signal from being mixed into the detection signal between the drive wiring and the detection wiring, to prevent a shift in the output at rest, and to improve the offset temperature drift characteristic.
- the wiring for the driving wiring, the detection wiring, and the like is compared with the case of using a single-layer substrate as in the related art. Can be eliminated, and the degree of freedom of arrangement of elements and the like can be increased. As a result, the mounting area including the wiring and the like can be reduced, and the entire device can be downsized.
- wiring can be freely routed by using a multi-layer substrate
- electrodes for connecting to the angular velocity detecting element can be arranged at a high density on the surface of the multi-layer substrate, and for example, a driving
- the wiring and the detection wiring can be arranged symmetrically.
- the angular velocity detecting element can be flip-chip mounted on the multilayer substrate, and the productivity and the detection sensitivity can be improved as compared with the case of wire bonding mounting.
- the element-side low-impedance electrode is provided on the mounting surface of the angular velocity detecting element between the element-side driving electrode and the element-side detection electrode, the element-side driving is performed by the element-side low-impedance electrode. It is possible to cut off the coupling between the electrode for detection and the electrode for detection on the element side.
- the angular velocity detecting element is flip-chip mounted on the multi-layer substrate using metal bumps, the element-side driving electrode and the substrate-side driving electrode are connected to face each other, and the element-side detecting electrode is connected.
- the substrate-side detection electrodes are also connected to each other while facing each other.
- the element-side low-impedance electrode is located between the substrate-side drive electrode and the substrate-side detection electrode.
- the coupling between the side drive electrode and the substrate side detection electrode can also be cut off.
- crosstalk can be prevented from occurring between these electrodes, and the offset temperature drift characteristics and the like can be improved.
- the substrate-side low-impedance electrode is provided on the surface of the multilayer substrate between the substrate-side drive electrode and the substrate-side detection electrode, the substrate-side drive impedance is provided by the substrate-side low-impedance electrode. It is possible to cut off the connection between the electrode for detection and the electrode for detection on the substrate side.
- the angular velocity detecting element is flip-chip mounted on the multilayer substrate using metal bumps, the element-side driving electrodes and the substrate-side driving electrodes are connected to face each other, and the element-side detecting electrodes are connected to each other.
- the electrodes and the substrate-side detection electrodes are also connected so as to face each other.
- the substrate-side low impedance electrode is disposed between the element-side drive electrode and the element-side detection electrode. Binding can also be blocked. As a result, occurrence of crosstalk between these electrodes can be prevented, and offset temperature drift characteristics and the like can be improved.
- the angular velocity detecting element when the angular velocity detecting element is flip-chip mounted on the multilayer substrate using metal bumps, at least a part of the element-side low impedance electrode and the substrate-side low impedance electrode face each other. did.
- the opposing portion where the element-side low impedance electrode and the substrate-side low impedance electrode face each other is located between the substrate-side drive electrode and the substrate-side detection electrode, and in addition to the element-side drive electrode. It is also located between the element side and the detection electrode.
- the coupling between the substrate-side drive electrode and the element-side detection electrode can be cut off by using the opposing portions of the two low-impedance electrodes, and the connection between the element-side drive electrode and the substrate-side detection electrode can be prevented. Can also be blocked. As a result, crosstalk can be prevented from occurring between the electrode on the substrate side and the electrode on the element side, and the offset temperature drift characteristics and the like can be improved.
- the substrate is formed by using a multilayer substrate including a plurality of insulating layers, and two insulating layers are provided inside the multilayer substrate.
- the detection wiring is disposed between the wirings, and the multilayer substrate has a low-impedance wiring having an impedance facing the detection wiring at a position different from the detection wiring in the thickness direction.
- An element-side drive electrode connected to the driving means and located on the mounting surface side of the multilayer substrate, and an element-side detection electrode connected to the displacement detection means.
- an element-side low-impedance electrode surrounding the element-side drive electrode or the element-side detection electrode and blocking the coupling between the element-side drive electrode and the element-side detection electrode, and provided on the surface of the multilayer substrate.
- a substrate-side drive electrode connected to the drive wiring and facing the element-side drive electrode; a substrate-side detection electrode connected to the detection wire and facing the element-side detection electrode; A substrate-side driving electrode or a substrate-side low-impedance electrode which surrounds the substrate-side driving electrode or the substrate-side detection electrode and interrupts the coupling between the substrate-side driving electrode and the substrate-side detection electrode; Board The device-side drive electrode and the substrate-side drive electrode are connected using the metal bump, and the element-side detection electrode and the substrate-side detection electrode are connected to the metal bump.
- a multilayer substrate is used as a substrate on which the angular velocity detecting element and the like are mounted, the degree of freedom of arrangement of the elements and the like can be increased. As a result, the mounting area including the wiring and the like can be reduced, and the entire device can be downsized.
- An element-side drive electrode or an element-side detection electrode is provided on the mounting surface of the angular velocity detection element. Since the element side low impedance electrode surrounding the element is provided, the coupling between the element side drive electrode and the element side detection electrode can be cut off by the element side low impedance electrode. On the other hand, since the substrate side driving electrode or the substrate side low impedance electrode surrounding the substrate side detection electrode is provided on the surface of the multilayer substrate, the substrate side driving electrode and the substrate side detection electrode are provided by the substrate side low impedance electrode. The coupling with the electrode can be interrupted.
- the angular velocity detecting element when the angular velocity detecting element is flip-chip mounted on the multilayer substrate using metal bumps, at least a part of the element-side low-impedance electrode and the substrate-side low-impedance electrode are used for driving the element-side drive.
- the electrode and the element-side detection electrode are configured to face each other.
- the opposing portions where the element-side low-impedance electrode and the substrate-side low-impedance electrode face each other are located between the element-side drive electrode and the element-side detection electrode, and in addition to the substrate-side drive electrode. It is located between the substrate side detection electrodes.
- the coupling between the substrate-side drive electrode and the element-side detection electrode can be cut off by using the opposing portions of the two low-impedance electrodes, and the connection between the element-side drive electrode and the substrate-side detection electrode can be prevented. Can also be blocked. As a result, crosstalk can be prevented from occurring between the electrode on the substrate side and the electrode on the element side, and the offset temperature drift characteristics and the like can be improved.
- the opposing portions where the element-side low impedance electrode and the substrate-side low impedance electrode face each other include the element-side detection electrode and the substrate-side detection electrode. It may be configured to surround.
- the opposing portions of the two low-impedance electrodes surround the detection electrodes on both the element side and the substrate side, so the coupling between these detection electrodes, the element-side drive electrodes, and the substrate-side drive electrodes Can be reliably shut off. As a result, it is possible to prevent crosstalk from occurring between the drive electrode and the detection electrode, and to improve the offset temperature drift characteristics and the like.
- FIG. 1 is a perspective view showing an angular velocity measuring device according to a first embodiment of the present invention.
- FIG. 2 is a block diagram showing an angular velocity detecting element in FIG. 1.
- FIG. 3 is an enlarged view showing the angular velocity detecting element and the multilayer substrate in FIG. 1 in an exploded state. It is an exploded perspective view.
- FIG. 4 is a bottom view showing the angular velocity detecting element in FIG.
- FIG. 5 is a plan view showing the multilayer substrate in FIG. 3 without a resist film.
- FIG. 6 is an explanatory diagram showing a portion where a ground electrode of the angular velocity detecting element and a ground electrode of the multilayer substrate oppose each other according to the first embodiment.
- FIG. 7 is a cross-sectional view of the angular velocity measuring device as viewed in a direction indicated by arrows VII-VII in FIG. 1.
- FIG. 8 is a cross-sectional view of the angular velocity measuring device as viewed in the direction of arrows VIII-VIII in FIG.
- FIG. 9 is an exploded perspective view showing the multilayer substrate in FIG. 1 in an exploded manner.
- FIG. 10 is a front view showing an angular velocity measuring device according to a second embodiment.
- FIG. 11 is an exploded perspective view showing an angular velocity detecting element and a multilayer substrate according to a third embodiment in an exploded state in an enlarged manner.
- FIG. 12 is a bottom view showing the angular velocity detecting element in FIG.
- FIG. 13 is a plan view showing the multilayer substrate in FIG. 11 with a resist film omitted.
- FIG. 14 is an explanatory diagram showing a portion where a ground electrode of an angular velocity detecting element and a ground electrode of a multilayer substrate face each other according to a third embodiment.
- FIG. 15 is an exploded perspective view showing an exploded multilayer substrate according to a third embodiment.
- FIG. 16 is a bottom view showing an angular velocity detecting element according to a first modification.
- FIG. 17 is an explanatory view showing a portion where a ground electrode of an angular velocity detecting element and a round electrode of a multilayer substrate face each other according to a first modified example.
- FIG. 18 is a bottom view showing an angular velocity detecting element according to a fourth embodiment.
- FIG. 19 is a plan view showing a multilayer substrate according to a fourth embodiment with a resist film omitted.
- FIG. 20 is an explanatory diagram showing a portion where a ground electrode of an angular velocity detecting element and a ground electrode of a multilayer substrate face each other according to a fourth embodiment.
- FIG. 1 to FIG. 9 show the first embodiment.
- reference numeral 1 denotes an angular velocity detecting element which also has a vibrating gyro element mounted on a multilayer substrate 21 described later.
- the angular velocity detecting element 1 includes a vibrating body 3 displaceable in first and second axial directions (X-axis direction and Y-axis direction) parallel to the element substrate 2 among three orthogonal axes.
- 4 and driving units 5A, 5B, 6A, 6B as driving means for vibrating the vibrating bodies 3, 4 in the X-axis direction, and detecting that the vibrating bodies 3, 4 are displaced in the Y-axis direction.
- Detecting sections 7A, 7B, 8A, 8B as displacement detecting means for detecting the displacement.
- the element substrate 2 is formed using, for example, a glass substrate or the like.
- the vibrators 3 and 4, the driving units 5A, 5B, 6A and 6B, and the detecting units 7A, 7B, 8A and 8B perform fine processing such as etching on a silicon substrate that is anodically bonded onto the element substrate 2, for example. It is formed by applying.
- the vibrators 3 and 4 are supported by beams (not shown) or the like so as to be displaceable in the X-axis direction and the Y-axis direction, and the driving units 5A, 5B, 6A, 6B, the detection units 7A, 7B, 8A, 8B Is composed of, for example, comb-shaped electrodes.
- a ground electrode 15 is provided.
- the drive units 5A, 5B, 6A, and 6B are connected to the element-side drive electrodes 9, 10, 11, and 12 using through holes and the like, and the detection units 7A and 8B are used for the element-side detection.
- the detection units 7B and 8A are connected to the electrode 13 and the detection units 7B and 8A are connected to the element-side detection electrode 14.
- the ground electrode 15 is connected to a later-described land electrode 35 on the multilayer substrate 21 side.
- the ground electrode 15 is held at the ground potential as a low impedance reference potential, and the vibrators 3 and 4 are connected to the ground electrode 15.
- the detection units 8A and 8B output voltages and the like according to the capacitance between the vibrating body 4 and the like as the detection signals Vs3 and Vs4.
- the driving units 5A and 6B receive the driving signal Vdl, and the driving units 5B and 6A receive the driving signal Vd2. Therefore, the vibrators 3 and 4 are opposite to each other in the X-axis direction. It is configured to vibrate in the direction. Further, since the vibrators 3 and 4 are formed in substantially the same shape, when the same angular velocity ⁇ acts on these vibrators 3 and 4, the change amounts of the detection signals Vsl and Vs4 of the detection units 7A and 8B have the same value. At the same time, the change amounts of the detection signals Vs2 and Vs3 of the detection units 7B and 8A have the same value.
- the change amounts of the detection signals Vsl and Vs4 of the detection units 7A and 8B have the same value with opposite signs (positive and negative).
- the detection signals Vs2 and Vs3 of the detection units 7B and 8A also have the same value with opposite signs. For this reason, by connecting the detection units 7A and 8B to the element-side detection electrode 13, and connecting the detection units 7B and 8A to the element-side detection electrode 14, the acceleration components are removed from the detection signals Vs1 to Vs4. Then, only the angular velocity component is output.
- the element-side drive electrodes 9 to 12 and the element-side detection electrodes 13 and 14 are each formed in an island shape.
- the element-side drive electrodes 9 and 10 and the element-side drive electrodes 11 and 12 are located on the back side of the element substrate 2 and are separated from each other in the Y-axis direction as shown in FIGS. It is provided in.
- the element-side detection electrodes 13 and 14 are arranged at the center of the element substrate 2.
- the ground electrode 15 is removed from the back surface of the element substrate 2 except for the vicinity (near) of these electrodes 9 to 14 so as to be insulated from the element-side drive electrodes 9 to 12 and the element-side detection electrodes 13 and 14. It is formed in the part.
- the ground electrode 15 is formed on the entire back surface of the element substrate 2.
- openings 16 are formed in the ground electrode 15 at the positions of the device-side drive electrodes 9 and 10 and the device-side drive electrodes 11 and 12, respectively, and at the positions of the device-side detection electrodes 13 and 14.
- An opening 17 is formed.
- the frame-shaped frame portion 18 located around the opening 17 of the ground electrode 15 surrounds the element-side detection electrodes 13 and 14, and the element-side detection electrodes 13 and 14 and the element-side drive electrodes It is located between 9 and 12!
- the electrodes 9 to 15 are configured to be connected to electrodes 29 to 35 on the multilayer substrate 21 described later via the electrode pads 9 A to 15 A, respectively.
- Reference numeral 21 denotes a multilayer substrate on which the angular velocity detecting element 1 and the like are mounted.
- the multilayer substrate 21 is composed of three insulating layers 22 to 24 each having a ceramic material such as alumina, for example, and these insulating layers 22 to 24 are laminated on each other.
- a first electrode layer 25 is formed on the surface 21A of the multilayer substrate 21
- a second electrode layer 26 is formed between the insulating layers 22 and 23
- a third electrode layer 26 is formed between the insulating layers 23 and 24.
- the fourth electrode layer 28 is formed on the back surface 21B of the multilayer substrate 21.
- Reference numerals 29 to 32 denote strip-shaped substrate-side drive electrodes provided on the surface 21A of the multilayer substrate 21 (the surface of the uppermost insulating layer 22).
- the substrate-side drive electrodes 29 to 32 are arranged at positions facing the element-side drive electrodes 9 to 12, and are arranged from the center to the outer periphery of the multilayer substrate 21. Extending towards the part. Then, the substrate-side drive electrodes 29, 30 and the substrate-side drive electrodes 31, 32 are arranged separately in the Y-axis direction, and the substrate-side drive electrodes 29, 32 are connected to a drive wire 41 described later, The substrate-side drive electrodes 30 and 31 are connected to drive wires 42 described later.
- Reference numerals 33 and 34 denote island-shaped substrate-side detection electrodes provided on the surface 21A of the multilayer substrate 21.
- the substrate-side detection electrodes 33, 34 are arranged at positions facing the element-side detection electrodes 13, 14, and are located between the substrate-side drive electrodes 29, 30 and the substrate-side drive electrodes 31, 32. ing.
- the substrate-side detection electrodes 33 and 34 are connected to detection wirings 43 and 44 provided inside the multilayer substrate 21 via through holes 46 and 47 described later.
- Reference numeral 35 denotes a ground electrode provided on the surface 21 A of the multilayer substrate 21 as a substrate-side low impedance electrode.
- the ground electrode 35 is formed on the entire surface of the surface 21A of the multilayer substrate 21 facing the angular velocity detecting element 1.
- the ground electrode 35 is formed so as to be insulated from the substrate-side drive electrodes 29 to 32 and the substrate-side detection electrodes 33 and 34, and is formed in a portion excluding the periphery (near) of these electrodes 29 to 34. Have been. For this reason, the ground electrode 35 has cutouts 36 extending along the electrodes 29 to 32 at the positions of the substrate-side drive electrodes 29 to 32 extending toward the outside of the multilayer substrate 21, respectively.
- Openings 37 are formed at the positions of the detection electrodes 33 and 34.
- a frame-shaped frame portion 38 of the ground electrode 35 that is positioned around the opening 37 surrounds the board-side detection electrodes 33 and 34 and the board-side detection electrodes 33 and 34 and the board-side drive electrodes. It is arranged between the electrodes 29-32.
- the ground electrode 35 on the multilayer substrate 21 faces the ground electrode 15 on the angular velocity detecting element 1 (overlaps), and The portions All and A12 facing the electrodes 15 and 35 (portions surrounded by broken lines in FIG. 6) are formed.
- the portion All facing the ground electrodes 15 and 35 is formed in a frame shape surrounding the element side detection electrodes 13 and 14 and the substrate side detection electrodes 33 and 34. Accordingly, the opposing portions All of the ground electrodes 15 and 35 are disposed between the element-side drive electrodes 9 to 12 and the element-side detection electrodes 13 and 14.
- the opposing portions A12 of the ground electrodes 15 and 35 are located on both sides in the Y-axis direction of the opposing portion All. To form a strip extending in the X-axis direction.
- the opposing portions A12 of the ground electrodes 15 and 35 sandwich the element-side drive electrodes 9 to 12 and the substrate-side detection electrodes 33 and 34 between the opposing portions All.
- the ground electrode 35 is connected to a ground wiring 39 extending toward a signal processing circuit section 52 described later. As a result, the ground electrode 35 is connected to the ground electrode (not shown) of the signal processing circuit section 52, and is held at the ground potential as a low impedance reference potential.
- a resist film 40 is provided on substantially the entire surface of the multilayer substrate 21.
- the resist film 40 covers the electrodes 29 to 35. However, of the electrodes 29 to 35, the electrode pads 29A to 35A are exposed. As a result, the electrodes 29 to 35 are connected to the electrode pads 9A to 15A of the angular velocity detecting element 1 using the metal bumps B formed of conductive metal material such as gold provided on the electrode pads 29A to 35A. In this configuration, the angular velocity detecting element 1 is flip-chip mounted on the multilayer substrate 21.
- Reference numerals 41 and 42 denote drive wirings provided on the surface 21A of the multilayer substrate 21.
- the drive wirings 41 and 42 extend in the Y-axis direction of the multilayer board 21 as shown in FIGS. 1 and 9, and connect between the board-side drive electrodes 29 to 32 and the signal processing circuit section 52. Together, they form the first electrode layer 25 together with the electrodes 29 to 35 and the ground wiring 39.
- the driving wiring 41 is connected to the substrate-side driving electrodes 29 and 32.
- the driving wiring 42 is located on the opposite side of the driving wiring 41 in the X-axis direction with the ground wiring 39 interposed therebetween, and is connected to the substrate-side driving electrodes 30 and 31.
- the drive wirings 41 and 42 supply the drive signals Vdl and Vd2 of opposite phases applied from the signal processing circuit unit 52 to the substrate-side drive electrodes 29 to 32, and the vibration of the angular velocity detecting element 1 It vibrates the bodies 3 and 4 in the X-axis direction.
- Reference numerals 43 and 44 denote detection wires provided inside the multilayer substrate 21.
- the detection wires 43 and 44 are located between the insulating layers 23 and 24 and extend in the Y-axis direction from the angular velocity detection element 1 toward the signal processing circuit 52 in parallel with each other.
- a ground electrode 45 is provided between the insulating layers 23 and 24 as a low impedance wiring surrounding the detection wirings 43 and 44, respectively.
- the ground electrode 45 is connected to a ground electrode (not shown) of the signal processing circuit section 52 via a through hole (not shown) or the like. Then, the detection distribution The lines 43 and 44 are shared with the ground electrode 45 and constitute the third electrode layer 27.
- the detection wires 43 and 44 have one end connected to the board-side detection electrodes 33 and 34 via through holes 46 and 47, and the other end connected via the through holes 48 and 49.
- Signal processing circuit unit 52 The detection wires 43 and 44 have one end connected to the board-side detection electrodes 33 and 34 via through holes 46 and 47, and the other end connected via the through holes 48 and 49.
- Reference numeral 50 denotes a ground electrode provided between the insulating layers 22 and 23 as a low impedance wiring.
- the ground electrode 50 opposes over substantially the entire length of the detection wirings 43 and 44 and covers the surface side of the insulating layer 23 over substantially the entire surface. However, the ground electrode 50 is formed at a position excluding the periphery of the through holes 46 to 49 in order to insulate it from the detection wirings 43, 44 and the like.
- the ground electrode 50 is connected to a ground electrode (not shown) of the signal processing circuit section 52 via a through hole (not shown) or the like, and forms the second electrode layer 26.
- the ground electrode 50 is arranged between the driving wirings 41 and 42 and the detecting wirings 43 and 44 to reduce the coupling capacitance therebetween.
- Reference numeral 51 denotes a ground electrode provided as a low impedance wiring provided on the back surface 21B of the multilayer substrate 21.
- the ground electrode 51 faces the detection wirings 43 and 44 over substantially the entire length, covers the back surface 21B over substantially the entire surface, and has a signal processing circuit section 52 through a through hole (not shown) or the like. And a fourth electrode layer 28.
- the ground electrode 50 reduces the coupling capacitance between the drive wirings 41, 42 and the detection wirings 43, 44, and the noise (noise signal) of external force is applied to the detection wirings 43, 44. Prevents contamination.
- Reference numeral 52 denotes a signal processing circuit section as signal processing means provided on the surface 21A of the multilayer substrate 21.
- the signal processing circuit section 52 is composed of a bare chip IC 52A, various active elements, and circuit elements 52B that also provide passive element power, and the bare chip IC 52A is flip-chip mounted, and the circuit parts 52B are soldered by reflow soldering. Mounted (surface mounted).
- the signal processing circuit section 52 is connected to the drive wirings 41 and 42, the detection wirings 43 and 44, the ground wiring 39, and the ground electrodes 45, 50, and 51, respectively. It is also connected to the ground wiring 53, power supply wiring 54, and output signal wiring 55 provided on 21A.
- the signal processing circuit section 52 is connected to an external ground via a ground wiring 53. At the same time, a driving power supply voltage is supplied via the power supply wiring 54.
- the signal processing circuit unit 52 supplies the driving signals Vdl and Vd2 having opposite phases to the angular velocity detecting element 1 via the driving wirings 41 and 42, and also detects the detection signals Vs 1 to Vs 1 to Vs4 is received via the detection wirings 43 and 44, and subjected to various arithmetic processing to output an output signal Vo corresponding to the angular velocity ⁇ .
- the signal processing circuit section 52 outputs the output signal Vo to the outside via the output signal wiring 55.
- the angular velocity measuring device has the above-described configuration, and its operation will be described next.
- the signal output circuit section 52 outputs drive signals Vdl and Vd2 having opposite phases to the drive wirings 41 and 42, the drive signals Vdl and Vd2 are transmitted through the drive electrodes 9 to 12 and 29 to 32.
- an electrostatic attraction is applied to the vibrators 3 and 4, and the vibrators 3 and 4 vibrate along the X axis in the directions indicated by arrows al and a2 in FIG.
- V Velocity of vibrators 3 and 4 in X-axis direction
- the detecting units 7 ⁇ , 7 ⁇ , 8 ⁇ , and 8 ⁇ change the capacitance between the vibrators 3 and 4 in accordance with the displacement of the vibrators 3 and 4 in the ⁇ -axis direction.
- the detection signals Vsl to Vs4 corresponding to the capacitance change are output.
- These detection signals Vsl to Vs4 are combined with the detection electrodes 13 and 14 to remove the acceleration component, and are transmitted to the signal processing circuit section 52 through the detection electrodes 33 and 34 and the detection wirings 43 and 44. Is entered.
- the signal processing circuit unit 52 performs signal processing such as synchronous detection on the detection signals Vsl to Vs4, thereby detecting the angular velocity ⁇ and outputting it as an output signal Vo to the outside.
- the driving signals Vdl and Vd2 and the detection signals Vsl to Vs4 are all compared at about several tens kHz. While having a very low frequency, the coupling capacitance between the drive wirings 41 and 42 and the detection wirings 43 and 44 is very small (for example, about several fF). For this reason, since the crosstalk between the drive signals Vdl and Vd2 and the detection signals Vsl to Vs4 is very small, the mixing of the signal due to the crosstalk is negligible in cases other than the angular velocity measuring device.
- the detection signals Vsl to Vs4 have smaller values than the drive signals Vdl and Vd2. Further, since the phase of the crosstalk is equal to the phase of the detection, the crosstalk cannot be removed by the detection. For this reason, even when the drive signals Vdl and Vd2 are slightly mixed into the pin detection signals Vsl to Vs4, the deviation of the output at rest and the offset temperature drift characteristic deteriorate.
- the drive wiring and the detection wiring are formed in a symmetric shape so as to cancel the crosstalk between the drive signal and the detection signal.
- the coupling capacitance between the driving wiring and the detecting wiring changes, and the crosstalk can be sufficiently canceled. There was a problem that could not be done.
- the detection wirings 43 and 44 are provided inside the multilayer substrate 21, and the detection wirings 43 and 44 are provided on the multilayer substrate 21 in the thickness direction. Since the ground electrodes 50 and 51 that cover the detection wires 43 and 44 are provided at positions different from the above, the high impedance detection wires 43 and 44 can be shielded using the ground electrodes 50 and 51. For this reason, it is possible to prevent the drive signals Vdl and Vd2 from being mixed into the detection signals Vsl to Vs4 between the drive wirings 41 and 42 and the detection wirings 43 and 44, and to prevent a shift in the output when stationary. Thus, the offset temperature drift characteristics can be improved.
- the driving wirings 41 and 42, the detecting wirings 43 and 44 and the like are different from the case where a single-layer substrate is used as in the related art. Can be eliminated, and the degree of freedom of arrangement of the element 1 and the like can be increased. As a result, the mounting area including the wirings 41 to 44 and the like can be reduced, and the entire device can be reduced in size.
- the wirings 41 to 44 and the like can be freely routed.
- the driving wirings 41 and 42 and the detection wirings 43 and 44 are arranged symmetrically.
- the coupling capacitance between the driving wiring 41 and the detection wiring 43 can be set to substantially the same value as the coupling capacitance between the driving wiring 42 and the detection wiring 44. Therefore, even when coupling occurs between the drive wirings 41 and 42 and the detection wiring 43, crosstalk between the drive signal and the detection signal can be canceled, and the detection sensitivity can be increased.
- the force by which the wirings 41 to 44 and the like can be freely routed by using the multilayer substrate 21 also has electrodes 29 to 35 for connecting to the angular velocity detecting element 1 on the surface 21A of the multilayer substrate 21.
- the substrate side driving electrodes 29 to 32 and the substrate side driving electrodes 9 to 12 and the element side detecting electrodes 13 and 14 are disposed on the surface 21A of the multilayer substrate 21 so as to face the element side driving electrodes 9 to 12.
- the side detection electrodes 33 and 34 can be arranged at any positions. Therefore, the angular velocity detecting element 1 can be flip-chip mounted on the multilayer board 21. As a result, the productivity can be improved as compared with the case where wire bonding is performed, and noise is not mixed in from the wires and the like, and the detection sensitivity can be improved.
- the ground electrode 50 is arranged between the driving wires 41 and 42 and the detecting wires 43 and 44.
- the connection between 42 and the detection wirings 43 and 44 can be cut off, and crosstalk between them can be reliably prevented.
- element-side driving electrodes 9 to 12 and element-side detecting electrodes 13 and 14 are provided on the mounting surface of the angular velocity detecting element 1, and the substrate-side driving electrodes 29 to 12 are provided on the surface 21 A of the multilayer substrate 21. 32 and the substrate-side detection electrodes 33 and 34 are provided.
- the element-side drive electrodes 9 to 12 are connected to the substrate-side drive electrodes 29 to 32, and the element-side detection electrodes 13 and 14 and the substrate-side detection electrodes 33. And 34 are connected to each other, and the angular velocity detecting element 1 is flip-chip mounted on the multilayer substrate 21.
- the angular velocity detecting element 1 is mounted together with the mounting process of the bare chip IC 52 ⁇ / b> A forming the signal processing circuit section 52. , And the productivity can be improved as compared with the case where wire bonding mounting is performed.
- the ground electrode 15 is provided on the mounting surface of the angular velocity detecting element 1 between the element-side driving electrodes 9 to 12 and the element-side detecting electrodes 13 and 14, the ground electrode 15 The coupling between the side drive electrodes 9 to 12 and the element side detection electrodes 13 and 14 can be cut off.
- the angular velocity detecting element 1 is flip-chip mounted on the multilayer substrate 21,
- the element-side drive electrodes 9 to 12 and the substrate-side drive electrodes 29 to 32 are connected in a state of facing each other, and the element-side detection electrodes 13 and 14 and the board-side detection electrodes 33 and 34 also face each other.
- the ground electrode 15 is disposed between the board-side drive electrodes 29 to 32 and the board-side detection electrodes 33 and 34.
- the ground electrode 15 can also cut off the coupling between the board-side drive electrodes 29 to 32 and the board-side detection electrodes 33 and 34. As a result, it is possible to prevent the occurrence of crosstalk between these electrodes 29 to 32 and the electrodes 33 and 34, and to improve the offset temperature drift characteristics and the like.
- the ground electrode 35 is provided on the surface 21 A of the multilayer substrate 21 between the substrate-side drive electrodes 29 to 32 and the substrate-side detection electrodes 33 and 34.
- the coupling between the drive electrodes 29 to 32 and the substrate-side detection electrodes 33 and 34 can be cut off. For this reason, the coupling between the driving electrodes 9 to 12, 29 to 32 and the detecting electrodes 13, 14, 33, and 34 is reliably blocked by the synergistic effect of the angular velocity detecting element 1 and the ground electrode 15. And the crosstalk blocking effect can be enhanced.
- the angular velocity detecting element 1 is Even when mounted with misalignment, it is possible to place the opposing parts All of the ground electrodes 15, 35 between the drive electrodes 9 to 12, 29 to 32 and the detection electrodes 13, 14, 33, 34. it can. As a result, the coupling between the drive electrodes 9 to 12, 29 to 32 and the detection electrodes 13, 14, 33, and 34 is cut off by using the opposing portions All of the ground electrodes 15 and 35, and crosstalk occurs. Can be prevented.
- the substrate side driving electrodes 29 to 32 and the element side driving electrodes 9 to 12 are connected. They are very close and oppose each other with a gap of, for example, about several tens of meters.
- the substrate-side detection electrodes 33 and 34 and the element-side detection electrodes 13 and 14 are opposed to each other in a close state.
- the drive electrodes 9 to 12, 29 to 32 and the detection electrodes 13, 14, 33, 34 are also close to each other. 29-32 and Crosstalk tends to occur between the element-side detection electrodes 13 and 14, and crosstalk also tends to occur between the element-side drive electrodes 9 to 12 and the substrate-side detection electrodes 33 and 34.
- the angular velocity detecting element 1 when the angular velocity detecting element 1 is flip-chip mounted on the multilayer substrate 21, at least a part of the ground electrodes 15 and 35 are at least partially connected to the element-side driving electrodes 9 to 12 and the element-side detecting electrodes.
- the electrodes 13 and 14 were configured to face each other.
- the opposing portions All where the ground electrodes 15 and 35 oppose each other are located between the element-side drive electrodes 9 to 12 and the element-side detection electrodes 13 and 14, and also the substrate-side drive electrodes 29 and 29. 32 and the substrate-side detection electrodes 33 and 34.
- the coupling between the substrate-side drive electrodes 29 to 32 and the element-side detection electrodes 13 and 14 can be cut off by using the all-sites opposed to the ground electrodes 15 and 35, and the element-side drive electrodes 9 to The coupling between 12 and the board-side detection electrodes 33, 34 can also be cut off.
- the opposing portion All of the ground electrodes 15 and 35 surrounds the substrate-side detection electrodes 33 and 34 in addition to the element-side detection electrodes 13 and 14. ing. Therefore, the coupling between the detection electrodes 13, 14, 33, and 34, the element-side drive electrodes 9 to 12, and the substrate-side drive electrodes 29 to 32 can be reliably cut off. As a result, it is possible to reliably prevent the crosstalk force S from being generated between the horse electrodes 9-12, 29-33 and the detection electrodes 13, 14, 33, 34.
- the drive electrodes 9 to 12 and 29 to 32 are sandwiched between the opposite portions All and A12 of the ground electrodes 15 and 35, the drive signals Vdl and Vd2 are applied to the drive electrodes 9 to 12, 29. 32 can be reliably confined to the periphery, and the effect of suppressing crosstalk can be enhanced.
- the multilayer substrate 21 is provided with through holes 46, 47 which are located at positions where the angular velocity detecting elements 1 are mounted and connect the substrate side detection electrodes 33, 34 to the detection wirings 43, 44. .
- the substrate-side detection electrodes 33 and 34 need only be arranged at positions opposed to the element-side detection electrodes 13 and 14 of the angular velocity detecting element 1 and other substrate-side drive electrodes 29 to 32 and the like. The degree of freedom in routing the electrodes can be increased.
- the board-side detection electrodes 33 and 34 are angular velocity Since the portion where the detection element 1 is mounted is connected to the detection wirings 43 and 44 provided inside the multilayer substrate 21, it is compared with the case where the surface 21A of the multilayer substrate 21 is connected to the signal processing circuit section 52. In addition, external noise can be prevented from being mixed, and the detection sensitivity of the angular velocity ⁇ can be increased.
- the length of the substrate-side detection electrodes 33 and 34 (the length between the detection sections 7A, 7B, 8A and 8B and the detection wirings 43 and 44) can be reduced. Further, it is possible to prevent the substrate-side detection electrodes 33, 34 and the like from being coupled to the drive electrodes 29 to 32 and the like.
- the vibrators 3 and 4, the driving units 5A, 5B, 6A and 6B and the detecting units 7A, 7B, 8A and 8B of the angular velocity detecting element 1 were formed by performing fine processing on a silicon material.
- the angular velocity detecting element 1 can be downsized.
- the detection wirings 43 and 44 are provided inside the multilayer substrate 21, the degree of freedom in electrode arrangement on the multilayer substrate 21 side is high, so that the external connection electrodes 9 to 15 of the angular velocity detecting element 1 are reduced by miniaturization. Even when arranged at high density, the angular velocity detecting element 1 can be flip-chip mounted on the multilayer substrate 21.
- the detecting portions 7A, 7B, 8A, 8B of the angular velocity detecting element 1 are configured to detect the capacitance according to the displacement of the vibrating bodies 3, 4, the detecting wires 43, 44 and the driving wires
- the detection signals Vsl to Vs4 tend to be easily degraded by the coupling capacitance between the wirings 41 and 42.
- the detection wirings 43 and 44 are arranged inside the multilayer substrate 21 and the detection wirings 43 and 44 are covered with the ground electrodes 45, 50 and 51. The occurrence of crosstalk can be suppressed by reducing the coupling capacitance between the detection wires 43, 44 and the drive wires 41, 42.
- the insulating layers 22 to 24 of the multilayer substrate 21 are formed using an insulating ceramic material such as alumina, for example, when a glass substrate or the like is used for the element substrate 2 of the angular velocity detecting element 1, Compared with the case where a resin material is used for the insulating layers 22 to 24, the difference in the coefficient of thermal expansion can be reduced, and the change in detection sensitivity and output at rest can be suppressed.
- FIG. 10 shows a second embodiment according to the present invention.
- the feature of the present embodiment is that a bare chip IC and a circuit component constituting a signal processing circuit section should be mounted on a flip chip.
- the chip IC and the like are provided on the front side of the same multilayer substrate as the angular velocity detecting element, and the circuit components mounted on the surface are provided on the back side of the multilayer substrate.
- the same reference numerals are given to the same components as those in the first embodiment, and the description thereof will be omitted.
- Reference numeral 61 denotes a signal processing circuit section as signal processing means provided on the surface 21 A of the multilayer substrate 21.
- the signal processing circuit section 61 includes a bare chip IC 61A, a circuit component 61B, and the like, as in the first embodiment.
- the bare chip IC 61A is flip-chip mounted on the same surface 21A of the multilayer substrate 21 as the angular velocity detecting element 1, and the circuit component 61B is located on the rear surface 21B side of the multilayer substrate 21 different from the angular velocity detecting element 1. SMD mounting (surface mounting) by soldering. Further, the signal processing circuit section 61 is connected to a drive wiring, a detection wiring (neither is shown), or the like.
- the present embodiment configured as described above, substantially the same operation and effect as in the first embodiment can be obtained.
- the bare chip IC 61A to be flip-chip mounted is provided on the surface 21A of the same multilayer substrate 21 as the angular velocity detecting element 1, the bare chip IC 61A and the angular velocity detecting element 1 are connected. Since they can be mounted together on the multilayer board 21, productivity can be improved.
- the circuit component 61B to be mounted on the surface is provided on the back surface 21B side of the multilayer substrate 21 different from the angular velocity detecting element 1, etc.
- the mounting surface (electrode pad, etc.) can be prevented from being contaminated in the reflow process. As a result, it is possible to prevent a bonding failure or the like in flip-chip mounting, and to improve yield and mounting reliability.
- FIGS. 11 to 15 show a third embodiment according to the present invention, which is characterized in that the driving wiring is arranged inside the multilayer substrate and the substrate-side driving electrode is provided.
- the configuration is such that each of the substrate-side detection electrodes is surrounded by a ground electrode. Note that, in the present embodiment, the same components as those in the first embodiment are denoted by the same reference numerals, and description thereof will be omitted.
- Reference numerals 71 to 74 denote island-shaped element-side drive electrodes provided on the back surface (mounting surface) of the element substrate 2.
- the element-side drive electrodes 71 to 74 are connected to the drive units 5A, 5B, 6A, and 6B in substantially the same manner as the element-side drive electrodes 9 to 12 according to the first embodiment.
- the element-side drive electrodes 71 to 74 input the drive signal Vdl to the drive units 5A and 6B, and Drive signal Vd2 is input to B and 6A.
- the element-side drive electrodes 71 and 72 and the element-side drive electrodes 73 and 74 are located on the back side of the element substrate 2 and are separated from each other in the Y-axis direction. It is set in the position where it was set.
- Reference numerals 75 and 76 denote island-shaped element-side detection electrodes provided on the back surface of the element substrate 2.
- the element-side detection electrodes 75 and 76 are located between the element-side drive electrodes 71 and 72 and the element-side drive electrodes 73 and 74, and are disposed on the center side of the element substrate 2.
- the element-side detection electrode 75 is connected to the detection units 7A and 8B, and the element-side detection electrode 76 is connected to the detection units 7B and 8A.
- the element side detection electrodes 75, 76 are configured to remove the acceleration component from the detection signals Vs1 to Vs4 output from the detection units 7A, 7B, 8A, 8B and output only the angular velocity component. .
- Reference numeral 77 denotes a ground electrode provided on the back surface of the element substrate 2 as an element-side low impedance electrode.
- the ground electrode 77 is insulated from the element-side drive electrodes 71 to 74 and the element-side detection electrodes 75 and 76 except for the area around (near) these electrodes 71 to 76 on the back surface of the element substrate 2. It is formed in the part. Therefore, the ground electrode 77 is formed on the entire back surface of the element substrate 2.
- openings 78 are formed in the ground electrode 77 at the positions of the device-side drive electrodes 71, 72 and the device-side drive electrodes 73, 74, respectively, and are formed at the positions of the device-side detection electrodes 75, 76.
- An opening 79 is formed.
- the frame-shaped frame portion 80 located around the opening 79 of the ground electrode 77 surrounds the element-side detection electrodes 75, 76, and the element-side detection electrodes 75, 76 and the element-side drive electrode. 7 It is arranged between 1 and 74.
- the ground electrode 77 is connected to a later-described ground electrode 97 on the multilayer substrate 81 side, and is held at the ground potential as a low impedance reference potential.
- Reference numeral 81 denotes a multilayer board on which the angular velocity detecting element 1 and the like are mounted.
- the multi-layer substrate 81 is composed of four insulating layers 82 to 85 each having a ceramic material such as alumina, for example, and these insulating layers 82 to 85 are laminated on each other.
- a first electrode layer 86 is formed on the surface 81A of the multilayer substrate 81
- a second electrode layer 87 is formed between the insulating layers 82 and 83
- a third electrode layer 87 is formed between the insulating layers 83 and 84.
- An electrode layer 88 is formed, and an insulating layer 84,
- a fourth electrode layer 89 is formed between the layers 85, and a fifth electrode layer 90 is formed on the back surface 81B of the multilayer substrate 81.
- Reference numerals 91 to 94 denote substrate-side driving electrodes provided on the surface 81A of the multilayer substrate 81 (the surface of the uppermost insulating layer 82). As shown in FIGS. 13 and 14, the substrate-side drive electrodes 91 to 94 are formed in an island shape and are arranged at positions facing the element-side drive electrodes 71 to 74. The substrate-side drive electrodes 91 and 92 and the substrate-side drive electrodes 93 and 94 are arranged apart from each other in the Y-axis direction, and the substrate-side drive electrodes 91 and 94 are connected to a drive wiring 102 described later. The substrate-side drive electrodes 92 and 93 are connected to a drive wiring 103 described later.
- Reference numerals 95 and 96 denote substrate-side detection electrodes provided on the surface 81A of the multilayer substrate 81.
- the substrate-side detection electrodes 95, 96 are arranged at positions facing the element-side detection electrodes 75, 76, and are located between the substrate-side drive electrodes 91, 92 and the substrate-side drive electrodes 93, 94. ing .
- the substrate-side detection electrodes 95 and 96 are connected to detection wirings 105 and 106 provided inside the multilayer substrate 81 via through holes 108 and 109 described later.
- Reference numeral 97 denotes a ground electrode provided on the surface 81A of the multilayer substrate 81 as a substrate-side low impedance electrode.
- the ground electrode 97 is formed on the entire surface of the surface 81A of the multilayer substrate 81 facing the angular velocity detecting element 1.
- the ground electrode 97 is formed in a portion excluding (around) these electrodes 91 to 96 so as to be insulated from the substrate side driving electrodes 91 to 94 and the substrate side detection electrodes 95 and 96. ing.
- the ground electrode 97 has openings 98 at the positions of the substrate-side drive electrodes 91 to 94 and the openings 99 at the positions of the substrate-side detection electrodes 95 and 96.
- the frame-shaped frame portion 100 located around the opening 99 among the rounded electrodes 97 surrounds the substrate-side detection electrodes 95, 96, and the substrate-side detection electrodes 95, 96 and the substrate-side drive electrodes. It is arranged between the electrodes 91 to 94.
- the ground electrode 97 on the multilayer substrate 81 side is connected to the ground electrode 77 on the angular velocity detecting element 1 side.
- an opposing portion A31 (a portion surrounded by a broken line in FIG. 14) of the ground electrodes 77 and 97 is formed.
- the opposing portion A31 of the ground electrodes 77, 97 has three openings A31a, A31b, A31c.
- the detection electrodes 75, 76, 95, and 96 are disposed in the opening A31a, the driving electrodes 71, 72, 91, and 92 are disposed in the opening A31b, and the driving electrodes 73 are disposed in the opening A31c. , 74, 93, 94 are arranged. Therefore, the opposing portion A31 of the ground electrodes 77, 97 not only surrounds the element-side detection electrodes 75, 76 and the substrate-side detection electrodes 95, 96, but also surrounds the element-side drive electrodes 71, 72 with the substrate-side electrodes. It surrounds the drive electrodes 91 and 92, and surrounds the element-side drive electrodes 73 and 74 and the substrate-side drive electrodes 93 and 94. Thus, the opposing portion A31 of the ground electrodes 77 and 97 is disposed between the element-side drive electrodes 71 to 74 and the element-side detection electrodes 75 and 76.
- the ground electrode 97 is connected to a later-described ground electrode 104 provided in the multilayer substrate 81 via a through hole.
- the ground electrode 104 is connected to the signal processing circuit section 52 via a through hole. For this reason, the ground electrode 97 is connected to a ground electrode (not shown) of the signal processing circuit section 52, and is held at the ground potential as a low impedance reference potential.
- a resist film 101 is provided on substantially the entire surface of the multilayer substrate 81.
- the resist film 101 covers the electrodes 91 to 97. However, of the electrodes 91 to 97, the electrode pads 91A to 97A are exposed. As a result, the electrodes 91 to 97 are connected to the electrodes 71 to 77 of the angular velocity detecting element 1 using the metal bumps B provided on the electrode pads 91A to 97A and having a conductive metal material such as gold.
- the device 1 is configured to be flip-chip mounted on the multilayer substrate 81.
- Reference numerals 102 and 103 denote driving wirings provided between the insulating layers 82 and 83.
- the drive wires 102 and 103 extend in the Y-axis direction of the multilayer board 81 as shown in FIG. 15, and connect the board-side drive electrodes 91 to 94 and the signal processing circuit section 52. . Further, the driving wires 102 and 103 are formed symmetrically with respect to the X-axis direction.
- the driving wiring 102 is connected to the substrate-side driving electrodes 91 and 94
- the driving wiring 103 is connected to the substrate-side driving electrodes 92 and 93.
- the driving wires 102 and 103 apply the driving signals Vdl and Vd2 of opposite phases applied from the signal processing circuit 52 to the substrate-side driving electrodes 91 To 94 to vibrate the vibrators 3 and 4 of the angular velocity detecting element 1 in the X-axis direction.
- Reference numeral 104 denotes a ground electrode provided between the insulating layers 82 and 83.
- the ground electrode 104 surrounds the driving wires 102 and 103, respectively.
- one end of the ground electrode 104 is connected to the ground electrode 97 of the multilayer substrate 81 through a through hole (not shown), and the other end is connected to a signal processing circuit section through a through hole (not shown). It is connected to 52 Dutch electrodes (not shown).
- the ground electrode 104 forms a second electrode layer 87 together with the drive wirings 102 and 103.
- Reference numerals 105 and 106 denote detection wires provided inside the multilayer substrate 81.
- the detection wires 105 and 106 are located between the insulating layers 84 and 85 and extend in the Y-axis direction from the angular velocity detection element 1 toward the signal processing circuit 52 in parallel with each other.
- a ground electrode 107 is provided between the insulating layers 84 and 85 as a low impedance wiring surrounding the detection wirings 105 and 106, respectively.
- the ground electrode 107 is connected to a ground electrode (not shown) of the signal processing circuit section 52 via a through hole (not shown) or the like.
- the detection wires 105 and 106 together with the ground electrode 107 constitute a fourth electrode layer 89.
- the detection wires 105 and 106 are connected at one end to the board-side detection electrodes 95 and 96 via through holes 108 and 109, and at the other end via the through holes 110 and 111. Connected to the signal processing circuit section 52.
- Reference numeral 112 denotes a ground electrode provided between the insulating layers 83 and 84 as low impedance wiring.
- the ground electrode 112 opposes over substantially the entire length of the detection wirings 105 and 106 and covers the surface side of the insulating layer 84 over substantially the entire surface. However, the ground electrode 112 is formed at a position other than around the through holes 108 to 111 to insulate it from the detection wirings 105 and 106.
- the ground electrode 112 is connected to a ground electrode (not shown) of the signal processing circuit section 52 via a through hole (not shown) or the like, and forms a third electrode layer 88.
- the ground electrode 112 is arranged between the driving wirings 102, 103 and the detecting wirings 105, 106 to reduce the coupling capacitance therebetween.
- Reference numeral 113 denotes a ground as a low impedance wiring provided on the back surface 81B of the multilayer substrate 81.
- the electrodes are shown.
- the ground electrode 113 opposes over substantially the entire length of the detection wirings 105 and 106 and covers the back surface 81B over substantially the entire surface.
- the ground electrode 113 is connected to a ground electrode (not shown) of the signal processing circuit section 52 via a through hole (not shown) or the like, and forms a fifth electrode layer 90.
- the ground electrode 113 reduces the coupling capacitance between the drive wirings 102, 103 and the detection wirings 105, 106, and prevents external noise (noise signal) from entering the detection wirings 105, 106. Has been prevented.
- the driving wirings 102 and 103 are arranged inside the multilayer substrate 81, and the substrate-side driving electrodes 91 to 94 and the substrate-side detecting electrodes 95 and 96 are respectively connected to the ground electrode 97.
- the configuration is to use and surround.
- the device-side drive electrodes 71 to 74 and the device-side detection electrodes 75 and 76 are each surrounded by a ground electrode 77.
- the opposing portion A31 of the ground electrodes 77, 97 not only surrounds the element-side drive electrodes 71-74 and the board-side drive electrodes Electrodes 91 to 94 can be surrounded. From this, the corresponding part A31 of the ground electrodes 77 and 97 cuts off the coupling between the drive electrodes 71 to 74 and 91 to 94 and the detection electrodes 75, 76, 95 and 96, and generates crosstalk. Can be reliably prevented.
- the opposing portion A31 of the ground electrodes 77 and 97 is configured to surround the driving electrodes 71 to 74 and 91 to 94, the other electrodes are not limited to the detection electrodes 75, 76, 95, and 96. Crosstalk between the two can also be prevented. For this reason, when the angular velocity detecting element 1 is provided with a monitor means (not shown) for detecting vibrations in the driving direction (X-axis direction) of the vibrators 3 and 4, for example, as shown in FIGS. As shown by the dotted line, monitor electrodes 114 and 115 connected to the monitoring means can be provided outside the ground electrodes 77 and 97.
- the monitor means is also constituted by comb-shaped electrodes like the displacement detection means, and outputs monitor signals similar to the detection signals Vsl to Vs4. Therefore, the monitor signal is also easily affected by the drive signals Vdl and Vd2.
- the opposing portion A31 of the ground electrodes 77 and 97 surrounds the driving electrodes 71 to 74 and 91 to 94, so that the driving electrodes 71 to 74 and 91 to 94 and the monitor electrode 114, The connection with the 115 can be cut off, and the detection accuracy of the monitor signal can be improved.
- the opposing portion A31 of the ground electrodes 77, 97 surrounds the detection electrodes 75, 76, 95, 96 without interruption over the entire circumference.
- the present invention is not limited to this.
- the ground electrode when the opening 98 ⁇ of the ground electrode 97 ⁇ on the multilayer substrate 81 side is formed large, the ground electrode The partial force S surrounding the detection electrodes 75, 76, 95, 96 in the opposing portion A3iz of 77, 97 'may be partially cut off.
- opposing portions A32 ' where the ground electrodes 77 and 97' oppose each other are formed between the detection electrodes 75, 76, 95 and 96 and the driving electrodes 71 to 74 and 91 to 94. Therefore, the coupling between the detection electrodes 75, 76, 95, 96 and the drive electrodes 71 to 74, 91 to 94 can be cut off by using the facing portion A32 '.
- FIGS. 18 to 20 show a fourth embodiment according to the present invention.
- the feature of this embodiment is that a ground electrode is provided between an element-side drive electrode and an element-side detection electrode.
- a ground electrode is also provided between the substrate-side drive electrode and the substrate-side detection electrode, and at least a part of the element-side ground electrode and the substrate-side ground electrode is opposed to each other. is there. Note that, in the present embodiment, the same components as those in the first embodiment are denoted by the same reference numerals, and description thereof will be omitted.
- Reference numerals 121 to 124 denote island-shaped element-side drive electrodes provided on the back surface (mounting surface) of the element substrate 2.
- the element-side drive electrodes 121 to 124 are connected to the drive units 5A, 5B, 6A, and 6B in substantially the same manner as the element-side drive electrodes 9 to 12 according to the first embodiment.
- the element-side drive electrodes 121 to 124 are for inputting the drive signal Vdl to the drive units 5A and 6B and inputting the drive signal Vd2 to the drive units 5B and 6A.
- the element-side drive electrodes 121 and 122 and the element-side drive electrodes 123 and 124 are located on the back side of the element substrate 2 and are positioned in the Y-axis direction. It is located at a distance from
- Reference numerals 125 and 126 denote island-shaped element-side detection electrodes provided on the back surface of the element substrate 2.
- the element-side detection electrodes 125, 126 are located between the element-side drive electrodes 121, 122 and the element-side drive electrodes 123, 124, and are arranged on the center side of the element substrate 2. Then, the element-side detection electrode 125 is connected to the detection units 7A and 8B, and the element-side detection electrode 126 is Connected to detectors 7B and 8A.
- the element-side detection electrodes 125 and 126 are configured to remove the acceleration component from the detection signals Vsl to Vs4 output from the detection units 7A, 7B, 8A and 8B and output only the angular velocity component. .
- Reference numeral 127 denotes a ground electrode provided on the back surface of the element substrate 2 as two element-side low impedance electrodes.
- one ground electrode 127 is disposed between the element-side drive electrodes 121 and 122 and the element-side detection electrodes 125 and 126, and the other ground electrode 127 is connected to the element-side drive electrodes 123 and 124. It is arranged between the element side detection electrodes 125 and 126.
- These ground electrodes 127 are located around (near) the electrodes 121 to 126 on the back surface of the element substrate 2 so as to be insulated from the element-side drive electrodes 121 to 124 and the element-side detection electrodes 125 and 126. It is formed in the part except for.
- the ground electrode 127 is connected to a ground electrode 135 on the multilayer substrate 128 described later, and is held at the ground potential as a low impedance reference potential! RU
- Reference numeral 128 denotes a multilayer board on which the angular velocity detecting element 1 and the like are mounted.
- the multilayer substrate 128 is constituted of four insulating layers 82 to 85 in substantially the same manner as the multilayer substrate 81 according to the third embodiment, for example, and includes a driving wiring, a detection wiring, and a low impedance wiring therein.
- a ground electrode or the like (V, deviation is not shown) is provided.
- Reference numerals 129 to 132 denote substrate-side drive electrodes provided on the surface 128 A of the multilayer substrate 128. As shown in FIGS. 19 and 20, the substrate-side drive electrodes 129 to 132 are formed in an island shape and are arranged at positions facing the element-side drive electrodes 121 to 124. Further, the substrate-side drive electrodes 129 and 130 and the substrate-side drive electrodes 131 and 132 are arranged apart from each other in the Y-axis direction, and the substrate-side drive electrodes 129 to 132 are connected to the drive wiring (see FIG. (Not shown). Then, the drive signal Vdl is applied to the substrate-side drive electrodes 129 and 132, and the drive signal Vd2 is applied to the substrate-side drive electrodes 130 and 131.
- Reference numerals 133 and 134 denote substrate-side detection electrodes provided on the surface 128 A of the multilayer substrate 128.
- the substrate-side detection electrodes 133 and 134 are arranged at positions facing the element-side detection electrodes 125 and 126, and are located between the substrate-side drive electrodes 129 and 130 and the substrate-side drive electrodes 131 and 132. ing.
- the detection electrodes 133 and 134 on the substrate side are Connection (not shown).
- Reference numeral 135 denotes a ground electrode provided as two substrate-side low-impedance electrodes on the surface 128 A of the multilayer substrate 128.
- one ground electrode 135 is disposed between the board-side drive electrodes 129 and 130 and the board-side detection electrodes 133 and 134, and the other ground electrode 135 is connected to the board-side drive electrodes 131 and 132. And between the substrate-side detection electrodes 133 and 134.
- These ground electrodes 135 are formed around the electrodes 129 to 134 of the surface 128A of the multilayer substrate 128 so as to be insulated from the substrate side drive electrodes 129 to 132 and the substrate side detection electrodes 133 and 134. It is formed in the part except for (near).
- the ground electrode 135 is connected to a ground electrode (not shown) provided in the multilayer substrate 128 via a through hole.
- the ground electrode 135 is connected to the signal processing circuit through the ground electrode in the multilayer substrate 128, and is held at the ground potential as a low impedance reference potential! RU
- the ground electrode 135 on the multilayer substrate 128 side faces the ground electrode 127 on the angular velocity detecting element 1 side (overlap).
- opposing parts A41 (parts surrounded by broken lines in FIG. 20) of the ground electrodes 127 and 135 are formed on both sides in the Y-axis direction of the detection electrodes 125, 126, 133 and 134, respectively.
- the opposing portion A41 of one of the ground electrodes 127, 135 is located between the driving electrodes 121, 122, 129, 130 and the detecting electrodes 125, 126, 133, 134.
- the opposite part A41 of the other ground electrodes 127, 135 is located between the driving electrodes 123, 124, 131, 132 and the detecting electrodes 125, 126, 133, 134! .
- the electrodes 129 to 135 are connected to the electrodes 121 to 127 of the angular velocity detecting element 1 using a metal bump B which also has a conductive metal material such as gold, and the angular velocity detecting element 1 is flipped to the multilayer substrate 128. It is configured to be mounted on a chip.
- the opposing portion A41 of the ground electrodes 127 and 135 is provided between the drive electrodes 121 to 124 and 129 to 132 and the detection electrodes 125, 126, 133 and 134.
- the coupling between the drive electrodes 121-124, 129-132 and the detection electrodes 125, 126, 133, 134 is blocked using the opposing parts A41 of 127, 135. However, occurrence of crosstalk can be prevented.
- the ground electrodes 127 and 135 do not surround the drive electrodes 121 to 124 and 129 to 132 and the detection electrodes 125, 126, 133 and 134 and do not surround the drive electrodes 121 to 124 and 129.
- various wirings can be arranged around the driving electrodes 121 to 124 and 129 to 132, and the back surface of the element substrate 2 and the front surface 128A of the multilayer substrate 128 can be effectively used.
- the configuration is such that the angular velocity detecting element 1 including the two vibrators 3 and 4 is used.
- the present invention is not limited to this, and may employ a configuration that uses an angular velocity detecting element that also generates a single vibrating body force, as in the prior art.
- the ground electrode 50 is provided on the second and fourth electrode layers 26 and 28 with the detection wirings 43 and 44 forming the third electrode layer 27 interposed therebetween. , 51 are provided, but it is not always necessary to provide both ground electrodes 50, 51, and only one of them may be provided. Also in the third embodiment, the force V may be configured to provide the two ground electrodes 112 and 113, or the offset may be configured to provide only one of the ground electrodes.
- the element-side drive electrodes 9 to 12, 71 to 74, 121 to 124, the element-side detection electrodes 13, 14, 75, 76, 125, 126, the ground electrodes 15, 77 and 127 are formed symmetrically with respect to the center in the X-axis direction and the Y-axis direction, and the element-side detection electrodes 13, 75, 125 and the element-side drive electrodes 9-12, 71-
- the coupling capacitance between 74, 121-124 is set to almost the same value as the coupling capacitance between the element-side detection electrodes 14, 76, 126 and the element-side drive electrodes 9-12, 71-74, 121-124.
- the present invention is not limited to this, and a ground electrode is provided between the element-side drive electrodes 9-12, 71-74, 121-124 and the element-side detection electrodes 13, 14, 75, 76, 125, 126. If 15, 77, and 127 are arranged, the above-mentioned coupling capacity may have different values.
- the board-side drive electrodes 29 to 32, 91-94, 129 to 132, the board-side detection electrodes 33, 34, 95, 96, 133, 134, and the ground electrodes 35, 97, 135 are Of the substrate side detection electrodes 33, 95, 133 and the substrate side drive electrodes 29-32, 91-94, 129-132.
- the ground electrodes 15, 35, 7, 7, 97, 127, and 135 are used as the low impedance electrodes, and the ground electrodes 45, 50, 51, and 10 are used as the low impedance lines. 7, 112 and 113 were used.
- the present invention is not limited to this, and the low-impedance electrode and the low-impedance wiring need not always be connected to the ground.
- a low-impedance DC voltage wiring may be used as the low-impedance wiring.
- the multi-layer substrate 21 including the three insulating layers 22 to 24 (four electrode layers 25 to 28) is used, and the third embodiment In the embodiment, the multilayer substrate 81 including four insulating layers 82 to 85 (five electrode layers 86 to 90) is used.
- the present invention is not limited to this.
- a configuration using a multilayer substrate including five or more insulating layers (six or more electrode layers) may be used.
- the insulating layers 22 to 24 and 82 to 85 are formed using alumina (aluminum), but may be formed using other ceramic materials. It may be formed by using another insulating material such as a resin material.
- the driving wires 41, 42, 102, and 103 are located at positions different from the detection wires 43, 44, 105, and 106 in the thickness direction of the multilayer substrates 21 and 81. It was configured to be placed at However, the present invention is not limited to this.
- the drive wiring may be provided at another position (another electrode layer) different from the detection wiring in the thickness direction of the multilayer substrate. It may be configured to be arranged at the same position as the detection wiring in the direction.
- the height of the wiring is different from the position of the detection wiring or the like in the thickness direction of the multilayer substrate.
- another low impedance wiring may be provided between the driving wiring and the detection wiring at the same position as the detection wiring. In this case, it is possible to cut off between the drive wiring and the detection wiring by using another low impedance wiring, and it is possible to reliably prevent the occurrence of crosstalk between them.
- a configuration is adopted in which a wide width facing the detection wirings 43, 44, 105, 106 and the ground electrodes 50, 51, 112, 113 are used as low impedance wirings.
- the present invention is not limited to this, and a configuration may be used in which a narrow (elongated) ground electrode facing the detection wiring is used as the low impedance wiring.
- the ground electrodes 50, 51, 112, and 113 as low impedance wiring are configured to face the detection wirings 43, 44, 105, and 106 over substantially the entire length.
- the detection wiring may be configured to face a part of the entire length of the detection wiring.
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Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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CN200580001892.6A CN1906462B (zh) | 2004-04-07 | 2005-04-06 | 角速度测量设备 |
JP2006512097A JP4386073B2 (ja) | 2004-04-07 | 2005-04-06 | 角速度計測装置 |
US10/597,492 US7555949B2 (en) | 2004-04-07 | 2005-04-06 | Angular velocity measuring device |
EP05728785A EP1734338B1 (en) | 2004-04-07 | 2005-04-06 | Angular speed measuring equipment |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2004113403 | 2004-04-07 | ||
JP2004-113403 | 2004-04-07 |
Publications (1)
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WO2005098359A1 true WO2005098359A1 (ja) | 2005-10-20 |
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ID=35125178
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PCT/JP2005/006756 WO2005098359A1 (ja) | 2004-04-07 | 2005-04-06 | 角速度計測装置 |
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US (1) | US7555949B2 (ja) |
EP (1) | EP1734338B1 (ja) |
JP (1) | JP4386073B2 (ja) |
CN (1) | CN1906462B (ja) |
WO (1) | WO2005098359A1 (ja) |
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JP2009186305A (ja) * | 2008-02-06 | 2009-08-20 | Epson Toyocom Corp | 物理量センサ |
WO2011013508A1 (ja) * | 2009-07-28 | 2011-02-03 | 株式会社 村田製作所 | 電子部品 |
JP2011120118A (ja) * | 2009-12-07 | 2011-06-16 | Murata Mfg Co Ltd | 高周波モジュール |
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JP2007180248A (ja) * | 2005-12-27 | 2007-07-12 | Murata Mfg Co Ltd | 電子部品実装構造 |
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JP2016085181A (ja) * | 2014-10-28 | 2016-05-19 | セイコーエプソン株式会社 | 電子デバイス、電子機器および移動体 |
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WO2023170818A1 (ja) * | 2022-03-09 | 2023-09-14 | 日本電信電話株式会社 | Bga高周波モジュール、bga高周波モジュール用基板、および光通信モジュール |
Also Published As
Publication number | Publication date |
---|---|
JPWO2005098359A1 (ja) | 2008-02-28 |
EP1734338A4 (en) | 2011-12-07 |
EP1734338B1 (en) | 2013-01-02 |
US20080229822A1 (en) | 2008-09-25 |
US7555949B2 (en) | 2009-07-07 |
CN1906462B (zh) | 2010-10-06 |
JP4386073B2 (ja) | 2009-12-16 |
EP1734338A1 (en) | 2006-12-20 |
CN1906462A (zh) | 2007-01-31 |
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