WO2004055249A1 - 化合物半導体単結晶の製造方法および結晶成長装置 - Google Patents
化合物半導体単結晶の製造方法および結晶成長装置 Download PDFInfo
- Publication number
- WO2004055249A1 WO2004055249A1 PCT/JP2003/012695 JP0312695W WO2004055249A1 WO 2004055249 A1 WO2004055249 A1 WO 2004055249A1 JP 0312695 W JP0312695 W JP 0312695W WO 2004055249 A1 WO2004055249 A1 WO 2004055249A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- crystal
- crucible
- pulling shaft
- compound semiconductor
- plate
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B27/00—Single-crystal growth under a protective fluid
- C30B27/02—Single-crystal growth under a protective fluid by pulling from a melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
- C30B15/12—Double crucible methods
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/46—Sulfur-, selenium- or tellurium-containing compounds
- C30B29/48—AIIBVI compounds wherein A is Zn, Cd or Hg, and B is S, Se or Te
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1068—Seed pulling including heating or cooling details [e.g., shield configuration]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1072—Seed pulling including details of means providing product movement [e.g., shaft guides, servo means]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1076—Apparatus for crystallization from liquid or supercritical state having means for producing a moving solid-liquid-solid zone
- Y10T117/1088—Apparatus for crystallization from liquid or supercritical state having means for producing a moving solid-liquid-solid zone including heating or cooling details
Definitions
- the present invention relates to a method for producing a compound semiconductor single crystal and a crystal growth apparatus, and in particular, to a method for producing, for example, a ZnTe-based compound semiconductor single crystal by a liquid-sealed Cyokralski (LEC) method and a crystal growth device Related to useful technology.
- LEC liquid-sealed Cyokralski
- ZnTe compound semiconductor single crystals are expected as crystals that can be used for pure green light emitting devices.
- it has been devised to increase the conductivity of the crystal, and as a method therefor, a method of adding an impurity such as phosphorus or arsenic to the crystal is performed.
- a growth method capable of adding impurities during crystal growth such as a vertical Bridgman (VB) method or a vertical temperature gradient annealing (VGF) method, is used.
- VB vertical Bridgman
- VVF vertical temperature gradient annealing
- the present inventors have used a liquid sealed Chyokralski method (LEC method) capable of adding impurities during crystal growth to form a large-sized Z nTe A technology for growing a compound semiconductor single crystal was proposed (Japanese Patent Application No. 2002-2 49963).
- LOC method liquid sealed Chyokralski method
- the above-mentioned prior application technique is to grow crystals by LEC method using a double crucible structure crystal growth apparatus, and keep the surface of the grown crystal covered with the sealant until the crystal growth is completed. While trying to grow crystals. As a result, evaporation of constituents from the surface of the growth crystal is suppressed, and the crystallinity of the growth crystal is degraded. Can prevent single crystals from growing in quality.
- the prior application technology by growing the crystal along the inner wall of the inner light pipe, the surface of the growing crystal can be covered with the sealing agent until the crystal growth is completed without using a large amount of the sealing agent. It is like that.
- the decomposition of the component of the grown crystal can not be sufficiently suppressed, and the component of the grown crystal may be evaporated.
- the present invention is a technology that can be applied to a crystal growth method using the LEC method, which easily prevents the constituents of the grown crystal from evaporating, thereby making it possible to use a large Z n T e compound semiconductor single crystal. It is an object of the present invention to provide a method for producing a compound semiconductor single crystal which can be grown with excellent crystal quality and a crystal growth apparatus. Disclosure of the invention
- a first bottomed cylindrical lupo, and a second lube which is disposed inside the first lupo and has a communication hole with the first lupo at its bottom.
- a semiconductor melt and a sealing agent are contained in a raw material melt storage unit made up of a crucible, and a through hole is provided to enable introduction of a crystal pulling shaft having a seed crystal holding unit at the tip to the second crucible.
- the second luspo is covered with a plate-like member so that the atmosphere in the second luspo hardly changes, the raw material storage portion is heated to melt the raw material, and the crystal pulling shaft is
- the method is a method for producing a compound semiconductor single crystal, in which a seed crystal is brought into contact with the surface of the raw material melt and the crystal is grown while raising the crystal pulling axis (so-called LEC method).
- condition in which the atmosphere in the second crucible hardly changes means a completely sealed condition or a condition considered to be almost sealed although there is a slight gap, and the components in the atmosphere and the vapor thereof. It means that the pressure hardly changes.
- the grown crystal is pulled up in the second lupo, and as the growth proceeds, the crystal surface is exposed from the sealing agent, but since the interior of the second lupo has a substantially sealed structure, It is possible to effectively suppress the evaporation of constituents from the crystal surface Ru.
- a high quality compound semiconductor single crystal without decomposition on the crystal surface can be manufactured.
- the impurity can be easily added during crystal growth by the LEC method, a semiconductor element such as a light emitting element having desired characteristics can be manufactured using the manufactured single crystal as a substrate.
- the plate-like member is attached to the crystal pulling shaft so as not to come off in a state where the crystal pulling shaft is inserted, and the plate-like member is lowered to the side wall upper end of the second light pipe as the crystal pulling shaft is lowered. It was supported and made a lid.
- the crystal pulling shaft can be introduced into the second crucible through the plate-like member reliably and easily, and the grown crystal can be easily taken out from the second bottom.
- a plate-like member provided with a through hole is fixed in advance to the top of the second light port as a lid, and the crystal pulling shaft is lowered from the top of the plate-like member.
- the crystal pulling axis collides with the plate-like member, and both are broken.
- the lid is fixed to the second root, it is necessary to remove the lid when taking out the grown crystal, so the productivity of the single crystal decreases.
- the second lusp can be easily made into a semi-closed structure.
- the plate-like member is also removed from the inner light port as the crystal pulling shaft rises, the grown crystal can be easily taken out.
- a sealable outer container a first cylindrical bottomed cylindrical lupo disposed inside the outer container, and a state disposed inside the first lusppo.
- a second crucible having a communication hole with the first lusppo at the bottom, and a seed crystal at the tip Crystal bow having holding portion [Pick-up shaft, Through-hole for enabling penetration of the crystal bow I into the second light pipe, and a plate-like member serving as a lid of the second crucible It is intended to have at least.
- the second crucible is substantially sealed during crystal growth, evaporation of components from the surface of the grown crystal can be effectively suppressed, and high quality with few crystal defects. Single crystals can be produced.
- the plate-like member is inserted through the crystal pulling shaft in advance, and the crystal pulling-up shaft is provided with a drop-off preventing member for preventing the plate-like member from falling off.
- the seed crystal holding portion attached to the tip of the crystal pulling shaft can also function as a falling prevention member.
- the plate member is a quartz glass plate. This reduces the possibility of deterioration of the quality of the grown crystal due to evaporation of the constituent elements of the plate-like member.
- the second crucible can be effectively made into a semi-sealed structure. it can.
- FIG. 1 is a schematic block diagram of a crystal growth apparatus used in an embodiment of the present invention.
- FIG. 2 is an explanatory view showing the growth process of the Z n T e compound semiconductor single crystal.
- FIG. 1 is a schematic block diagram of a crystal growth apparatus according to the present embodiment.
- the crystal growth apparatus 100 includes: a high pressure vessel 1, a heat insulating material 2 and a heater 3 disposed on the same circle as the high pressure vessel therein, and a central portion of the high pressure vessel 1.
- a rotary shaft 4 disposed at the upper end of the rotary shaft 4, and a bottomed cylindrical p BN outer crucible (first lusp) 5 fitted at the upper end of the rotary shaft 4.
- the inner lusp 6 has a communication hole 6 a communicating with the outer lupo 5 at the bottom, and the raw material melt 12 can be moved from the outer lusp 5 to the inner crucible 6 through the communication hole.
- the inner lusppo 6 is fixed to the outer lusppo 5 or other jig by an appropriate holder (not shown).
- the rotating and pulling shaft 7 is connected to a drive unit (not shown) disposed outside the high pressure vessel 1 to constitute a rotating and pulling mechanism.
- the rotary shaft 4 is connected to a drive unit (not shown) disposed outside the high pressure vessel 1 to constitute a crucible rotation mechanism and to constitute a susceptor elevating mechanism.
- the rotation and vertical movement of the rotary pull-up shaft 7 and crucible rotary shaft 4 are set and controlled independently of each other.
- a through hole slightly larger than the diameter of the rotating and pulling shaft 7 is provided, and the rotating and pulling shaft 7 is inserted through the through hole.
- the difference between the diameter of the through hole and the diameter of the rotating and pulling shaft 7 be l mm or less. This is because if the diameter of the through hole is too large, the gap between the rotary pull-up shaft 7 and the glass plate 10 made of quartz becomes large, so that the function of sealing the inner crucible 6 is deteriorated. .
- a single crystal ingot grown from a seed crystal can be rotated and pulled up by a liquid-sealed Chyoclarski method, and a high purity single crystal can be grown at the lower end thereof.
- FIG. 2 is an explanatory view showing the growth process of the Z n Te compound semiconductor single crystal.
- a crucible made of p BN with an inner diameter of 10 0 ⁇ X ⁇ X height 1 0 O mm and a wall thickness of 1 mm is used as the outer lusp 5, and an inner diameter 5 4 mm ⁇ X height 1 0 is used as the inner crucible 6.
- Mm ⁇ l mm made of O mm x thickness l mm was used.
- a communication hole 6a having a diameter of 10 mm is formed at the center of the bottom of the inner lusppo 6.
- the diameter of the rotating pulling shaft 7 is 12 mm in diameter, and it is provided on a quartz glass plate 10 The diameter of the through hole was 13 mm.
- the raw material melt gradually decreases with crystal growth, but the immersion state of the inner lusppo 6 was controlled by raising the susceptor 13 (the outer crucible 5) by the elevation drive of the rotary shaft 4.
- the inner light pipe 6 is 1 Omn! From the surface of the raw material melt. It was made to hold
- the material was heated at a predetermined temperature using the heater 2 while suppressing the surface of the raw material with a sealant, Z n and T e were melted and directly synthesized, and the raw material was held in a melted state for a certain period of time.
- the rotary pulling shaft 7 holding the seed crystal 9 was lowered.
- the quartz glass plate 10 is only supported by the seed crystal holder 8, it descends together with the rotating pulling shaft.
- a Z nT e crystal with a crystal orientation (100) was used as the seed crystal.
- the seed crystal was covered with a molybdenum cover (not shown).
- the seed crystal is brought into contact with the surface of the raw material melt, and then the rotating pull-up shaft 7 is rotated at a rotation speed of 1 to 2 rpm to pull up the shoulder of the crystal while pulling at a speed of 2.5 mm / h. It formed. Furthermore, after the shoulder of the crystal was formed, the crucible rotation axis was rotated at 1 to 5 rpm, and the body was formed while pulling up at a speed of 2.5 mm Zh. At this time, as shown in Fig. 2 (c), the diameter of the body of the grown crystal 10 is substantially the same as the inner diameter of the inner lusppo 6, so that it depends on the pulling speed and the rotation speed of the crucible and pulling axis.
- the size of the grown crystal is 54 mm in diameter ⁇ 6 O mm in length, and it was possible to realize upsizing of the Z n T e-based compound semiconductor single crystal which has been considered to be difficult conventionally.
- the crystal is grown along the inner diameter of the inner crucible 6 so that the surface of the grown crystal is covered with the sealing agent, and when the grown crystal is pulled up.
- the present invention can also be applied to the general LEC method in which the surface of the grown crystal is exposed from the sealing agent, and evaporation of constituents of the grown crystal can be suppressed, so that high quality single crystals with few crystal defects it can.
- the size of the connection hole of the second crucible is the second crucible.
- a first bottomed cylindrical lupo and a second lupo having a communication hole with the first luppo at the bottom in the state of being disposed inside the first lupo.
- the semiconductor material and the sealing agent are accommodated in the formed raw material melt accommodation unit, and the seed crystal holding unit is placed at the tip.
- the second luspo is covered with a plate-like member provided with a through hole enabling introduction of the crystal pulling shaft having the above into the second crucible, so that the atmosphere in the second luspo hardly changes.
- the raw material storage portion is heated to melt the raw material, and the crystal pulling axis is lowered to bring the seed crystal into contact with the surface of the raw material melt, and the crystal is grown while raising the crystal bow I raising axis.
- the second rubbo in which crystal growth is performed has a semi-sealed structure, and evaporation of components from the surface of the growing crystal can be effectively suppressed.
- the present invention is effective not only in the production of Z nTe compounds semiconductor single crystals but also in the production of ternary or higher Z nTe compound semiconductor single crystals containing Z nTe and other compound semiconductor single crystals. By applying it, a large, high quality compound semiconductor single crystal can be obtained.
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/497,916 US6989059B2 (en) | 2002-12-18 | 2003-10-03 | Process for producing single crystal of compound semiconductor and crystal growing apparatus |
EP03748696A EP1574602B1 (en) | 2002-12-18 | 2003-10-03 | Process for producing single crystal of compound semiconductor and crystal growing apparatus |
DE60332392T DE60332392D1 (de) | 2002-12-18 | 2003-10-03 | Verfahren zur herstellung von verbindungshalbleiter-einkristallen und kristallziehvorrichtung |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002367188A JP4252300B2 (ja) | 2002-12-18 | 2002-12-18 | 化合物半導体単結晶の製造方法および結晶成長装置 |
JP2002-367188 | 2002-12-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004055249A1 true WO2004055249A1 (ja) | 2004-07-01 |
Family
ID=32588338
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2003/012695 WO2004055249A1 (ja) | 2002-12-18 | 2003-10-03 | 化合物半導体単結晶の製造方法および結晶成長装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6989059B2 (ja) |
EP (1) | EP1574602B1 (ja) |
JP (1) | JP4252300B2 (ja) |
CN (1) | CN1320173C (ja) |
DE (1) | DE60332392D1 (ja) |
TW (1) | TWI272321B (ja) |
WO (1) | WO2004055249A1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008099839A1 (ja) * | 2007-02-14 | 2008-08-21 | Nippon Mining & Metals Co., Ltd. | 化合物半導体単結晶の製造方法および結晶成長装置 |
KR100847264B1 (ko) | 2007-04-18 | 2008-07-18 | 엑스탈테크놀로지 주식회사 | Lec법에 의한 열차단장치 |
CN101649486B (zh) * | 2008-08-11 | 2013-03-20 | 元亮科技有限公司 | 提拉法生长铽镓石榴石(tgg)晶体的装置及其方法 |
CN102586858A (zh) * | 2012-04-01 | 2012-07-18 | 北京华进创威电子有限公司 | 一种双坩埚感应加热物理气相传输生长单晶的装置 |
KR101466061B1 (ko) | 2013-06-14 | 2014-11-28 | 한국생산기술연구원 | 분리형 씨드 투입 장치 |
JP5942931B2 (ja) * | 2013-06-27 | 2016-06-29 | 信越半導体株式会社 | 単結晶製造装置及び単結晶製造方法 |
TWM478690U (zh) * | 2014-01-13 | 2014-05-21 | Global Wafers Co Ltd | 長晶系統及石英蓋板 |
CN110820043A (zh) * | 2018-08-09 | 2020-02-21 | 广东先导稀材股份有限公司 | 晶体生长装置及生长方法 |
US11866848B1 (en) | 2019-06-21 | 2024-01-09 | Drs Network & Imaging Systems, Llc | Method and system for liquid encapsulated growth of cadmium zinc telluride crystals |
CN113308739B (zh) * | 2021-06-01 | 2022-08-19 | 中国电子科技集团公司第十三研究所 | 注入合成后连续lec与vgf结合制备化合物半导体晶体的系统 |
CN114197040A (zh) * | 2021-12-21 | 2022-03-18 | 安徽科瑞思创晶体材料有限责任公司 | 一种离子掺杂晶体生产设备及其生产工艺 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0148396A2 (en) * | 1983-11-30 | 1985-07-17 | Sumitomo Electric Industries Limited | Apparatus for producing gallium arsenide single crystal and gallium arsenide single crystal produced by said apparatus |
JPS6259598A (ja) * | 1985-09-09 | 1987-03-16 | Showa Denko Kk | リン化インジウム単結晶およびその製造方法 |
JPH06271395A (ja) * | 1993-03-17 | 1994-09-27 | Hitachi Cable Ltd | 化合物半導体結晶の製造方法 |
Family Cites Families (11)
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JPS6027693A (ja) * | 1983-07-21 | 1985-02-12 | Toshiba Corp | 化合物半導体単結晶の製造方法 |
JPS6126590A (ja) * | 1984-07-17 | 1986-02-05 | Sumitomo Electric Ind Ltd | 化合物半導体単結晶の引上方法及び装置 |
JPS6271395A (ja) * | 1985-09-25 | 1987-04-02 | Yazaki Corp | 立体映像表示装置 |
JPS63195188A (ja) * | 1987-02-06 | 1988-08-12 | Sumitomo Electric Ind Ltd | 化合物半導体単結晶の製造方法および製造装置 |
JPH03183688A (ja) * | 1989-12-11 | 1991-08-09 | Kawasaki Steel Corp | 単結晶連続引上げ装置 |
US5047112A (en) * | 1990-08-14 | 1991-09-10 | The United States Of America As Represented By The United States Department Of Energy | Method for preparing homogeneous single crystal ternary III-V alloys |
GB9412629D0 (en) * | 1994-06-23 | 1994-08-10 | Secr Defence | Improvements in crystal growth |
TW430699B (en) * | 1995-12-27 | 2001-04-21 | Mitsubishi Material Silicon Co | Single crystal pulling apparatus |
JP3840683B2 (ja) * | 1996-01-12 | 2006-11-01 | 株式会社Sumco | 単結晶引上方法 |
GB9810207D0 (en) * | 1998-05-14 | 1998-07-08 | Secr Defence | Crystal growth apparatus and method |
JP4778188B2 (ja) | 2002-02-13 | 2011-09-21 | Jx日鉱日石金属株式会社 | 化合物半導体単結晶の製造方法 |
-
2002
- 2002-12-18 JP JP2002367188A patent/JP4252300B2/ja not_active Expired - Lifetime
-
2003
- 2003-10-03 WO PCT/JP2003/012695 patent/WO2004055249A1/ja active Application Filing
- 2003-10-03 EP EP03748696A patent/EP1574602B1/en not_active Expired - Lifetime
- 2003-10-03 DE DE60332392T patent/DE60332392D1/de not_active Expired - Lifetime
- 2003-10-03 CN CNB2003801002432A patent/CN1320173C/zh not_active Expired - Lifetime
- 2003-10-03 US US10/497,916 patent/US6989059B2/en not_active Expired - Lifetime
- 2003-12-10 TW TW092134902A patent/TWI272321B/zh not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0148396A2 (en) * | 1983-11-30 | 1985-07-17 | Sumitomo Electric Industries Limited | Apparatus for producing gallium arsenide single crystal and gallium arsenide single crystal produced by said apparatus |
JPS6259598A (ja) * | 1985-09-09 | 1987-03-16 | Showa Denko Kk | リン化インジウム単結晶およびその製造方法 |
JPH06271395A (ja) * | 1993-03-17 | 1994-09-27 | Hitachi Cable Ltd | 化合物半導体結晶の製造方法 |
Non-Patent Citations (1)
Title |
---|
See also references of EP1574602A4 * |
Also Published As
Publication number | Publication date |
---|---|
TW200419015A (en) | 2004-10-01 |
CN1692185A (zh) | 2005-11-02 |
DE60332392D1 (de) | 2010-06-10 |
TWI272321B (en) | 2007-02-01 |
JP4252300B2 (ja) | 2009-04-08 |
EP1574602B1 (en) | 2010-04-28 |
JP2004196591A (ja) | 2004-07-15 |
US20050000403A1 (en) | 2005-01-06 |
US6989059B2 (en) | 2006-01-24 |
CN1320173C (zh) | 2007-06-06 |
EP1574602A1 (en) | 2005-09-14 |
EP1574602A4 (en) | 2009-07-08 |
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