WO2003105145A1 - フォトレジスト原盤の製造方法、光記録媒体製造用スタンパの製造方法、スタンパ、フォトレジスト原盤、スタンパ中間体及び光記録媒体 - Google Patents
フォトレジスト原盤の製造方法、光記録媒体製造用スタンパの製造方法、スタンパ、フォトレジスト原盤、スタンパ中間体及び光記録媒体 Download PDFInfo
- Publication number
- WO2003105145A1 WO2003105145A1 PCT/JP2003/006861 JP0306861W WO03105145A1 WO 2003105145 A1 WO2003105145 A1 WO 2003105145A1 JP 0306861 W JP0306861 W JP 0306861W WO 03105145 A1 WO03105145 A1 WO 03105145A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- stamper
- photoresist
- optical recording
- pattern
- recording medium
- Prior art date
Links
- 229920002120 photoresistant polymer Polymers 0.000 title claims abstract description 107
- 230000003287 optical effect Effects 0.000 title claims abstract description 52
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 47
- 239000002184 metal Substances 0.000 claims abstract description 47
- 229910052751 metal Inorganic materials 0.000 claims abstract description 47
- 239000000758 substrate Substances 0.000 claims abstract description 30
- 239000010409 thin film Substances 0.000 claims abstract description 28
- 239000010408 film Substances 0.000 claims abstract description 21
- 238000000034 method Methods 0.000 claims abstract description 18
- 238000007747 plating Methods 0.000 claims description 10
- 230000001678 irradiating effect Effects 0.000 claims description 8
- 230000005684 electric field Effects 0.000 claims description 7
- 230000015572 biosynthetic process Effects 0.000 claims description 6
- 239000011521 glass Substances 0.000 abstract description 7
- 238000009713 electroplating Methods 0.000 abstract 1
- 239000011248 coating agent Substances 0.000 description 9
- 230000000052 comparative effect Effects 0.000 description 9
- 239000006096 absorbing agent Substances 0.000 description 8
- 238000000576 coating method Methods 0.000 description 8
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 230000031700 light absorption Effects 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 3
- 239000012467 final product Substances 0.000 description 3
- 238000000059 patterning Methods 0.000 description 3
- 238000004080 punching Methods 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 238000001746 injection moulding Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 150000002894 organic compounds Chemical class 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000013557 residual solvent Substances 0.000 description 2
- YDIYEOMDOWUDTJ-UHFFFAOYSA-N 4-(dimethylamino)benzoic acid Chemical compound CN(C)C1=CC=C(C(O)=O)C=C1 YDIYEOMDOWUDTJ-UHFFFAOYSA-N 0.000 description 1
- OFSAUHSCHWRZKM-UHFFFAOYSA-N Padimate A Chemical compound CC(C)CCOC(=O)C1=CC=C(N(C)C)C=C1 OFSAUHSCHWRZKM-UHFFFAOYSA-N 0.000 description 1
- WYWZRNAHINYAEF-UHFFFAOYSA-N Padimate O Chemical compound CCCCC(CC)COC(=O)C1=CC=C(N(C)C)C=C1 WYWZRNAHINYAEF-UHFFFAOYSA-N 0.000 description 1
- XHTJVCVAGSECMN-UHFFFAOYSA-N [2-(ethylamino)phenyl]-phenylmethanone Chemical compound CCNC1=CC=CC=C1C(=O)C1=CC=CC=C1 XHTJVCVAGSECMN-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 125000001931 aliphatic group Chemical group 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- -1 benzophenone compound Chemical class 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000012782 phase change material Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000007665 sagging Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0017—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor for the production of embossing, cutting or similar devices; for the production of casting means
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
- G11B7/261—Preparing a master, e.g. exposing photoresist, electroforming
Definitions
- Manufacturing method of photoresist master manufacturing method of stamper for manufacturing optical recording medium, stamper, photoresist master, stamper intermediate, and optical recording medium
- the present invention relates to a stamper used for manufacturing an optical recording medium having an uneven pattern such as a group or a prepit, a photoresist master for manufacturing the stamper, a stamper intermediate, a method for manufacturing a photoresist master, and the photoresist.
- the present invention relates to a stamper manufacturing method using a master disc and an optical recording medium manufactured using the stamper.
- optical discs there are two types of optical discs, one of optical recording media, an optical recording disc that can be additionally recorded or rewritten, and a read-only disc in which information is recorded in advance.
- a group (guide groove) used for tracking or the like is formed on a disk substrate of the optical recording disk, and a recording layer containing a phase change material or an organic dye material is further laminated on the disk substrate.
- the recording layer undergoes a chemical or physical change to form a recording mark.
- recording marks information pits
- recording marks are formed in advance on the disk substrate of a read-only disk as a part of a concavo-convex pattern.
- a stamper in which a negative pattern of the concavo-convex (also a kind of a round-convex pattern) is formed in advance is used.
- a disk substrate is manufactured by performing injection molding using a mold to which the stamper is fixed, and transferring the negative pattern to the filled resin.
- a stamper having a concavo-convex pattern is usually constituted by a metal plate containing Ni or the like.
- a photoresist master having a negative pattern of the concave and convex pattern of the stamper is prepared in advance, and a metal film is formed on the photoresist master by plating. Thereafter, the metal film is peeled from the photoresist master, and a predetermined process such as surface cleaning is performed to obtain a stamper.
- the manufacturing process of the photoresist master 1 will be described with reference to the conventional photoresist master 1 shown in FIG.
- a photoresist layer 3 is formed on a glass substrate 2.
- the photoresist layer 3 is exposed using a patterning beam such as a laser to form a latent image pattern.
- a photoresist master 1 in which the concavo-convex pattern 4 is formed on the photoresist layer 3 is obtained.
- a metal thin film 6 containing a Ni material or the like is electroless plated on the surface of the concave pattern 4. It is formed by, for example, imparting conductivity to the photo resist master 1.
- the metal thin film 6 is used as a base to be energized to perform plating to form a metal film 7 containing Ni or the like. If the metal thin film 6 and the metal film 7 are peeled off from the photoresist master 1, a stamper 5 on which the concavo-convex pattern 4 is transferred can be obtained.
- the concavo-convex pattern of a group or the like has become finer with the increase in the capacity of an optical recording medium, and its shape error has had a great effect on the recording / reading accuracy. Therefore, it is required to form a sharp concavo-convex pattern on the disk substrate. It is necessary to form the concavo-convex pattern of layer 3 with high precision (sharp).
- the minimum width of the latent image pattern formed on the photoresist layer 3 is limited by the spot diameter of the laser beam reaching the photoresist layer 4.
- k is a constant determined by the aperture shape of the objective lens and the intensity distribution of the incident light beam.
- the photoresist layer 3 is thin, the uneven pattern transferred to the stamper is shallow, or the shape of the convex pattern is round. It is known that the sharpness is insufficient due to the shading (this is called “sagging” of the pattern). This is generally considered to be due to the fact that the thickness of the photoresist layer 3 fluctuates during the exposure and development work (this is referred to as “film loss”). This thickness variation is considered to be caused by the fact that the laser beam is reflected between the photoresist layer 3 and the glass substrate 2, and the reflected light exposes the photoresist layer 3 more than necessary. Had been.
- the present inventor has found that it is effective to form a light absorbing layer between the glass substrate 2 and the photoresist layer 3 (at least not known until the time of this application). I knew. By doing so, the light absorption layer can absorb the laser beam and suppress light reflection, so that exposure and development can be performed more sharply than in the past.
- the spot diameter was limited in the formation of a concavo-convex pattern by exposure and development (so-called photon mode), and there was a limit to the formation of finer concavo-convex patterns. Disclosure of the invention The present invention has been made to form a finer concave-convex pattern, and the laser beam irradiation directly removes the irradiated portion of the photoresist layer, thereby achieving high precision without a developing process. It is an object of the present invention to provide a method of manufacturing a stamper for manufacturing an optical recording medium capable of forming an uneven pattern, a stamper, a photo resist master, a stamper intermediate, and an optical recording medium manufactured using these.
- the present inventor has conducted intensive research on the manufacturing method of the optical recording medium and the like, and has formed an irregularity on the stamper using an active energy ray that is one of an electromagnetic wave including a laser beam, radiation (including a particle beam) and an electron beam.
- an active energy ray that is one of an electromagnetic wave including a laser beam, radiation (including a particle beam) and an electron beam.
- the stamper for manufacturing an optical recording medium has a disk shape, the pitch of the uneven pattern in the radial direction of the disk is less than 0.6 m, the depth of the uneven pattern is t nm, Assuming that the inclination angle of the side wall surface of the uneven pattern at the pattern depth t / 2 is ⁇ °, irradiation is performed so that 0.75 t ⁇ 0 ⁇ 1.4 t by the active energy line. And (3) the method of manufacturing a stamper for manufacturing an optical recording medium according to (2) or (3).
- a stamper for manufacturing an optical recording medium having an uneven pattern formed on the surface in advance characterized by being manufactured by the manufacturing method described in any one of (2) to (4). Stamper to do.
- the uneven pattern has a depth of t nni and an inclination angle of the side wall surface of the uneven pattern at a depth of t 2.
- the stamper is characterized by being 0.75 t and 1.4 t.
- a photoresist master comprising a four-convex pattern formed by directly removing a portion of the photoresist by the method.
- a stamper intermediate comprising: a photoresist layer including a pattern; a metal thin film formed on the uneven pattern; and a metal film formed on the metal thin film by electric field plating.
- FIG. 1 is a schematic cross-sectional view showing a method for manufacturing a stamper for an optical recording medium according to an example of an embodiment of the present invention.
- FIG. 2 is a schematic diagram showing an inclination angle in a concavo-convex pattern of a photoresist master.
- FIG. 3 is a schematic cross-sectional view showing a process of manufacturing a mother board and a child board from the stamper (master board) and an optical recording medium therefrom.
- FIG. 4 is a cross-sectional view showing a conventional photoresist master.
- FIG. 5 is a cross-sectional view showing a state where a stamper is manufactured using a conventional photoresist master.
- Fig. 1 (A) the coupling was performed on a glass substrate 10.
- a coating agent 12 is applied, and a light absorbing layer 14 and a photoresist layer 16 are laminated thereon in this order as shown in FIG. 1 (B).
- the light absorbing layer 14 preferably contains an organic compound having a light absorbing property (hereinafter, also referred to as a light absorbing agent).
- a light absorbing agent As the light absorber, it is preferable to use at least one compound selected from a photoinitiator, a photoinitiator and a dye.
- a photoinitiator is used together with a photocurable resin, and is an organic compound that generates radicals by absorbing light such as ultraviolet light.
- the photoinitiator does not activate itself when irradiated with ultraviolet light, but when used in combination with the photoinitiator, the initiation reaction is accelerated by the use of the photoinitiator alone, and the curing reaction proceeds efficiently.
- the photoinitiator generates radicals and decomposes.
- the photoinitiator is stable, it is more preferable to use the photoinitiator in the present invention.
- Aliphatic or aromatic amines are mainly used as photoinitiating aids.
- 4,4′-bis (dimethylamino) benzophenone, 4,4′-bis (getinoleamino) benzophenone, 4-dimethylaminobenzoic acid, 4-dimethylaminobenzoic acid (n-butoxy) ethyl It is preferable to use at least one of isoamyl 4-dimethylaminobenzoate and 2-ethylhexyl 4-dimethylaminobenzoate, and among them, a benzophenone compound is particularly preferable.
- the light absorbing layer containing the light absorbing agent is preferably formed by the following procedure.
- a light absorbing agent is dissolved in a solvent to prepare a coating solution.
- the coating solution contains, in addition to the light absorber, a heat-crosslinkable compound as required.
- the coating is cured by heating, and then a photoresist layer is formed on the cured coating. Mixing with the photoresist layer 16 can be suppressed.
- various additives such as an adhesion aid, a light absorbing agent, and a surfactant for improving the adhesiveness to the photoresist layer 16 may be added to the coating solution as necessary. It may be added.
- a laser beam for patterning 18 is applied to the photo resist layer 16 via an irradiation optical system 20.
- the photo resist layer 16 At the place where the turning portion is formed, that is, the even portion which becomes a concave portion in the optical recording medium 40 as a final product, or the portion which becomes inverted and becomes a convex portion, the irradiation power of the laser beam is set to a certain value or more to form the concave portion
- the irradiation power of the laser beam is set to zero or less than the threshold value, and a predetermined uneven pattern 22 is directly formed on the photo resist layer 16 as shown in FIG. 1 (D). Formed without development to form a photoresist master 26.
- the laser used is an ultraviolet laser
- the photo-resist layer 16 When the photo-resist layer 16 is irradiated with the above-mentioned patterning laser beam 18 with a certain irradiation power or more, the laser beam is absorbed by the light absorption layer 14 and becomes thermal energy.
- the resist layer 16 is partly blown off by the pyrolyzed and / or generated gas to form a concave portion 24 having a sharp edge. As a result, a photoresist master 26 shown in FIG. 1 (D) is obtained.
- the side wall surface 25 at half the depth t [nm] of the concave portion 24, the bottom surface 25A or the surface of the light absorbing layer 14 and the glass substrate 10 The angle formed with the plane parallel to the surface of the surface (see the dashed line in FIG. 2) is 0 °, and the pitch in the radial direction of the disc of the concavo-convex pattern 22 is less than 0.6111, especially 0. Even when less than 35 ⁇ 5 ⁇ , 0.75 t ⁇ ⁇ .4 t.
- the formation pitch of the concave portions 24 in the concave and convex pattern 22 (for example, 0
- the width in particular, the formation pitch of 0.35 m or less
- a metal thin film 28 is formed on the concavo-convex pattern 22 by electroless plating.
- This metal thin film 28 is, for example, a Ni thin film.
- a current is applied to the surface using the metal thin film 28 as a conductor, and a metal film 30 of, for example, nickel is formed by electric field plating, and a photoresist master is attached as shown in FIG. 1 (F).
- a stamper intermediate 32 is formed.
- a master disk (stamper) 34 composed of the metal thin film 28 and the metal film 30 is peeled off from the stamper intermediate 32.
- the master plate 34 may be used as a stamper by punching the center portion 34A and the outer periphery and polishing the back surface as shown in FIG. 1 (H), but the punching is performed without punching.
- 3 (A) the mother board 36 shown in FIG. 3 (B) is manufactured, and the mother board 36 is used to produce the child board ( (Stamper) It is also possible to duplicate a large number of 38 as stampers.
- the motherboard 36 may be used as a stamper.
- Reference numeral 39 in FIG. 3 indicates a release treatment layer.
- the thickness of the photoresist layer 16 in the above-described embodiment is a pull-laser having a wavelength of about 405 nm. In the case of a system that performs recording and / or reproduction using an objective lens with a numerical aperture of about 0.85, for example, if it is for forming information pits, it is 6011 m. About 30 nm for a group for Set according to the type.
- the thickness of the light-absorbing layer 14 is such that the thicker it is, the more efficiently the irradiated laser beam can be converted into thermal energy, but it is optimal in the range of 1 to 300 nm depending on the type of laser beam. It should just be.
- the inclination angle ⁇ is transferred almost directly from the photoresist master to the child board 38 via the master board 34 or the mother board 36, so that the tilt angle ⁇ ⁇ is manufactured.
- the optical recording medium substrate 40 which is the final product, can have a larger inclination angle on the side walls of the information pits and / or groups as compared with the conventional one, and therefore has a sharp pattern of unevenness.
- the recording capacity can be increased by forming finely.
- the four-convex pattern is formed by a laser beam, but this may be any radiation including an electromagnetic wave such as a laser beam or a particle beam such as an electron beam. That is, any active energy ray may be used.
- a light absorption layer was formed by spin coating.
- SWK-T5D60 Tokyo Ohka Kogyo Co., Ltd.
- 4.4'-bis (ethylamino) benzophenone as a light absorber was used as a coating solution.
- This coating film was cured by baking at 200 ° C. for 15 minutes, and the residual solvent was removed.
- a photo resist DVR100, manufactured by Zeon Corporation
- the residual solvent was evaporated by baking to form a photo resist layer having a thickness of 60 nm. .
- the shape of the formed ⁇ -convex pattern was confirmed using AFM (Atomic Force Microscope), and the tilt angle 6, pit width, and pit depth at the recess obtained from the results are shown in Table 1. Show.
- the pitch of the uneven pattern in the radial direction of the disk was 0.32 m.
- the tip of the AFM is a single Si crystal, and a half cone angle of 10 ° is used.
- Photoresist thickness 60 nm '
- Table 1 shows that the threshold becomes higher as the thickness of the light absorbing layer is smaller, and that the information pit can be formed even when the laser power is lower when the thickness is larger. Also, comparing the thickness of the light absorbing layer with the threshold value in Examples 1 and 4, it can be seen that the threshold value does not decrease even if the light absorbing layer is thicker than about 160 nm.
- Comparative Example 1 a latent image was formed by irradiating a laser (1.5 mj Zm) to a photoresist layer having the same thickness as above without providing a light absorbing layer, and then developing to form an information pit. It was done.
- a photoresist layer having a thickness of 60 nm was formed without providing a light absorbing layer, and in the reference example, the resist layer was thickened to 170 nm without a light absorbing layer. Things. Table 1 in Comparative Example 1 shows that the inclination angle is considerably smaller than those in Examples 1 to 4.
- Comparative Example 2 a pattern (turn) could not be formed even when the laser power was 16.OmjZm.
- a pit could be formed without a light absorbing layer, but the threshold in this case was four times or more as compared with examples 1 to 4, and high power was required.
- the photoresist layer was set to a group thickness of 30 nm, the light absorption layer thickness was set to 144 nm, and the other conditions were the same as in Example 1, and the photoresist layer was 3 O nm.
- Table 2 shows Comparative Example 3 which was the same as Comparative Example 1 except that the above was used.
- Photoresist thickness 3 O n m
- a sharp convex pattern having a large inclination angle can be sharply formed on a photoresist master, a stamper intermediate, a stamper, and a concave / convex pattern on an optical recording medium manufactured by using the stamper.
- it has an excellent effect that it can be formed with high definition without a development step.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Optical Record Carriers And Manufacture Thereof (AREA)
Abstract
Description
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/515,404 US20050232130A1 (en) | 2002-06-05 | 2003-05-30 | Production method for photoresist master, production method for optical recording medium-producing stamper, stamper, phtoresist master, stamper intermediate element and optical recroding medium |
AU2003241662A AU2003241662A1 (en) | 2002-06-05 | 2003-05-30 | Production method for photoresist master, production method for optical recording medium-producing stamper, stamper, phtoresist master, stamper intermediate element and optical recroding medium |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2002164019A JP2004013973A (ja) | 2002-06-05 | 2002-06-05 | フォトレジスト原盤の製造方法、光記録媒体製造用スタンパの製造方法、スタンパ、フォトレジスト原盤、スタンパ中間体及び光記録媒体 |
JP2002-164019 | 2002-06-05 |
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WO2003105145A1 true WO2003105145A1 (ja) | 2003-12-18 |
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PCT/JP2003/006861 WO2003105145A1 (ja) | 2002-06-05 | 2003-05-30 | フォトレジスト原盤の製造方法、光記録媒体製造用スタンパの製造方法、スタンパ、フォトレジスト原盤、スタンパ中間体及び光記録媒体 |
Country Status (4)
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US (1) | US20050232130A1 (ja) |
JP (1) | JP2004013973A (ja) |
AU (1) | AU2003241662A1 (ja) |
WO (1) | WO2003105145A1 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2003085829A (ja) * | 2001-09-06 | 2003-03-20 | Tdk Corp | 光情報媒体用スタンパの製造方法およびこれに用いるフォトレジスト原盤、ならびに、光情報媒体用スタンパおよび光情報媒体 |
TWI228718B (en) * | 2001-11-05 | 2005-03-01 | Tdk Corp | Manufacturing method and device of mold plate for information medium |
TWI258142B (en) * | 2002-01-08 | 2006-07-11 | Tdk Corp | Manufacturing method of stamper for manufacturing data medium, the stamper, and the stamper spacer with template |
WO2003077239A1 (fr) * | 2002-03-11 | 2003-09-18 | Tdk Corporation | Procede de traitement conçu pour une matrice en resine photosensible, procede de production d'une matrice utilisant un support d'enregistrement, procede de production d'un support d'enregistrement, matrice en resine photosensible, matrice utilisant un support d'enregistrment et support d'enregistrement |
EP2026741B1 (de) * | 2006-06-13 | 2015-08-12 | CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement | Pharmazeutische Tabletten mit diffraktiver Mikrostruktur und Presswerkzeuge zur Herstellung solcher Tabletten |
DE102007026958B4 (de) * | 2006-06-13 | 2014-10-09 | Csem Centre Suisse D'electronique Et De Microtechnique S.A. | Presswerkzeug mit diffraktiver Mikrostruktur und Verfahren zur Herstellung eines solchen Werkzeugs sowie Tablettierungspresse |
JP4972015B2 (ja) * | 2008-03-10 | 2012-07-11 | 富士フイルム株式会社 | 金型の加工方法および製造方法 |
JP2009277335A (ja) * | 2008-04-18 | 2009-11-26 | Fujifilm Corp | スタンパの製造方法およびスタンパを用いた光情報記録媒体の製造方法 |
JP2010202497A (ja) * | 2009-02-04 | 2010-09-16 | Fujifilm Corp | 熱線反射膜、並びに熱線反射構造体及びその製造方法 |
WO2019010495A1 (en) * | 2017-07-07 | 2019-01-10 | Arizona Board Of Regents On Behalf Of The University Of Arizona | QUICK MANUFACTURING OF OPTICAL OPTICAL COUPLER IN POLYMER BY GRAY LEVEL LITHOGRAPHY |
Citations (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57172736A (en) * | 1981-03-30 | 1982-10-23 | Yokogawa Hewlett Packard Ltd | Multilayer photoresist processing |
JPS5993448A (ja) * | 1982-09-30 | 1984-05-29 | ブリューワー・サイエンス・インコーポレイテッド | 反射防止コ−テイング |
JPH04263140A (ja) * | 1991-02-07 | 1992-09-18 | Ricoh Co Ltd | 無反射コート付きガラス原盤 |
JPH07147026A (ja) * | 1993-11-22 | 1995-06-06 | Nec Corp | 光ディスクマスタリング用露光原盤 |
JPH0862835A (ja) * | 1994-07-27 | 1996-03-08 | Internatl Business Mach Corp <Ibm> | マイクロリソグラフィ用の反射防止膜組成物と、それを用いたパターン形成方法 |
JPH08315425A (ja) * | 1995-05-18 | 1996-11-29 | Nippondenso Co Ltd | 光情報記録媒体 |
JPH09171952A (ja) * | 1995-12-21 | 1997-06-30 | Toshiba Corp | レジストパターン形成方法及びそのレジストパターン形成方法を用いた半導体装置の製造方法 |
JPH10204328A (ja) * | 1996-06-11 | 1998-08-04 | Shipley Co Llc | 反射防止コーティング組成物 |
JP2000280255A (ja) * | 1999-03-31 | 2000-10-10 | Seiko Epson Corp | 原盤の製造方法 |
JP2001126309A (ja) * | 1999-10-22 | 2001-05-11 | Fuji Photo Film Co Ltd | 光情報記録媒体 |
JP2001148122A (ja) * | 2000-10-10 | 2001-05-29 | Mitsui Chemicals Inc | 光情報記録方法 |
JP2001184734A (ja) * | 1999-12-24 | 2001-07-06 | Hitachi Maxell Ltd | 情報記録媒体用基板を製造するための原盤及びその製造方法 |
JP2001232943A (ja) * | 2000-02-24 | 2001-08-28 | Fuji Photo Film Co Ltd | 光情報記録媒体の製造方法、色素溶液及び光情報記録媒体 |
JP2001357571A (ja) * | 1997-03-25 | 2001-12-26 | Sony Corp | 光学記録媒体の製造方法 |
JP2002050043A (ja) * | 2000-05-26 | 2002-02-15 | Tosoh Corp | 表面再生型光記録媒体 |
JP2002056539A (ja) * | 2000-08-11 | 2002-02-22 | Pioneer Electronic Corp | 光ディスク及びその情報再生装置 |
JP2002072489A (ja) * | 2000-07-31 | 2002-03-12 | Shipley Co Llc | 反射防止組成物 |
JP2002117578A (ja) * | 2000-10-03 | 2002-04-19 | Matsushita Electric Ind Co Ltd | 光記録媒体とその製造方法及び記録再生方法 |
JP2002117588A (ja) * | 2000-10-04 | 2002-04-19 | Nikon Corp | 光ディスク及びスタンパ |
JP2002117579A (ja) * | 2000-10-05 | 2002-04-19 | Matsushita Electric Ind Co Ltd | 光ディスク |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3436843B2 (ja) * | 1996-04-25 | 2003-08-18 | 東京応化工業株式会社 | リソグラフィー用下地材及びそれを用いたリソグラフィー用レジスト材料 |
JP2001357567A (ja) * | 2000-04-14 | 2001-12-26 | Tdk Corp | 光ディスク原盤の製造方法 |
US6616867B2 (en) * | 2001-02-07 | 2003-09-09 | Imation Corp. | Multi-generation stampers |
CN1238852C (zh) * | 2001-02-27 | 2006-01-25 | Tdk株式会社 | 用于生产光学信息介质用光刻胶母模和印模的方法 |
-
2002
- 2002-06-05 JP JP2002164019A patent/JP2004013973A/ja not_active Withdrawn
-
2003
- 2003-05-30 US US10/515,404 patent/US20050232130A1/en not_active Abandoned
- 2003-05-30 AU AU2003241662A patent/AU2003241662A1/en not_active Abandoned
- 2003-05-30 WO PCT/JP2003/006861 patent/WO2003105145A1/ja active Application Filing
Patent Citations (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57172736A (en) * | 1981-03-30 | 1982-10-23 | Yokogawa Hewlett Packard Ltd | Multilayer photoresist processing |
JPS5993448A (ja) * | 1982-09-30 | 1984-05-29 | ブリューワー・サイエンス・インコーポレイテッド | 反射防止コ−テイング |
JPH04263140A (ja) * | 1991-02-07 | 1992-09-18 | Ricoh Co Ltd | 無反射コート付きガラス原盤 |
JPH07147026A (ja) * | 1993-11-22 | 1995-06-06 | Nec Corp | 光ディスクマスタリング用露光原盤 |
JPH0862835A (ja) * | 1994-07-27 | 1996-03-08 | Internatl Business Mach Corp <Ibm> | マイクロリソグラフィ用の反射防止膜組成物と、それを用いたパターン形成方法 |
JPH08315425A (ja) * | 1995-05-18 | 1996-11-29 | Nippondenso Co Ltd | 光情報記録媒体 |
JPH09171952A (ja) * | 1995-12-21 | 1997-06-30 | Toshiba Corp | レジストパターン形成方法及びそのレジストパターン形成方法を用いた半導体装置の製造方法 |
JPH10204328A (ja) * | 1996-06-11 | 1998-08-04 | Shipley Co Llc | 反射防止コーティング組成物 |
JP2001357571A (ja) * | 1997-03-25 | 2001-12-26 | Sony Corp | 光学記録媒体の製造方法 |
JP2000280255A (ja) * | 1999-03-31 | 2000-10-10 | Seiko Epson Corp | 原盤の製造方法 |
JP2001126309A (ja) * | 1999-10-22 | 2001-05-11 | Fuji Photo Film Co Ltd | 光情報記録媒体 |
JP2001184734A (ja) * | 1999-12-24 | 2001-07-06 | Hitachi Maxell Ltd | 情報記録媒体用基板を製造するための原盤及びその製造方法 |
JP2001232943A (ja) * | 2000-02-24 | 2001-08-28 | Fuji Photo Film Co Ltd | 光情報記録媒体の製造方法、色素溶液及び光情報記録媒体 |
JP2002050043A (ja) * | 2000-05-26 | 2002-02-15 | Tosoh Corp | 表面再生型光記録媒体 |
JP2002072489A (ja) * | 2000-07-31 | 2002-03-12 | Shipley Co Llc | 反射防止組成物 |
JP2002056539A (ja) * | 2000-08-11 | 2002-02-22 | Pioneer Electronic Corp | 光ディスク及びその情報再生装置 |
JP2002117578A (ja) * | 2000-10-03 | 2002-04-19 | Matsushita Electric Ind Co Ltd | 光記録媒体とその製造方法及び記録再生方法 |
JP2002117588A (ja) * | 2000-10-04 | 2002-04-19 | Nikon Corp | 光ディスク及びスタンパ |
JP2002117579A (ja) * | 2000-10-05 | 2002-04-19 | Matsushita Electric Ind Co Ltd | 光ディスク |
JP2001148122A (ja) * | 2000-10-10 | 2001-05-29 | Mitsui Chemicals Inc | 光情報記録方法 |
Also Published As
Publication number | Publication date |
---|---|
AU2003241662A1 (en) | 2003-12-22 |
JP2004013973A (ja) | 2004-01-15 |
US20050232130A1 (en) | 2005-10-20 |
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