WO2003075408A1 - Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit - Google Patents

Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit Download PDF

Info

Publication number
WO2003075408A1
WO2003075408A1 PCT/JP2003/002205 JP0302205W WO03075408A1 WO 2003075408 A1 WO2003075408 A1 WO 2003075408A1 JP 0302205 W JP0302205 W JP 0302205W WO 03075408 A1 WO03075408 A1 WO 03075408A1
Authority
WO
WIPO (PCT)
Prior art keywords
anisotropic conductive
elastic
conductive connector
production method
circuit device
Prior art date
Application number
PCT/JP2003/002205
Other languages
English (en)
French (fr)
Inventor
Daisuke Yamada
Kazuaki Mayumi
Kiyoshi Kimura
Original Assignee
Jsr Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jsr Corporation filed Critical Jsr Corporation
Priority to EP03743513.8A priority Critical patent/EP1482593B1/en
Priority to US10/504,421 priority patent/US7160123B2/en
Priority to KR1020047011290A priority patent/KR100588029B1/ko
Priority to AU2003211368A priority patent/AU2003211368A1/en
Publication of WO2003075408A1 publication Critical patent/WO2003075408A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/04—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation using electrically conductive adhesives
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/007—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for elastomeric connecting elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00—Electrical connectors
    • Y10S439/923—Separation or disconnection aid

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Non-Insulated Conductors (AREA)
PCT/JP2003/002205 2002-03-07 2003-02-27 Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit WO2003075408A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP03743513.8A EP1482593B1 (en) 2002-03-07 2003-02-27 Anisotropic conductive connector and its production method, and circuit device test instrument
US10/504,421 US7160123B2 (en) 2002-03-07 2003-02-27 Plural layer anisotropic conductive connector and its production method
KR1020047011290A KR100588029B1 (ko) 2002-03-07 2003-02-27 이방 도전성 커넥터 및 그 제조 방법 및 회로 장치의 검사장치
AU2003211368A AU2003211368A1 (en) 2002-03-07 2003-02-27 Anisotropic conductive connector and its production method, and circuit device test instrument

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2002062666 2002-03-07
JP2002/62666 2002-03-07
JP2002/152316 2002-05-27
JP2002152316 2002-05-27

Publications (1)

Publication Number Publication Date
WO2003075408A1 true WO2003075408A1 (fr) 2003-09-12

Family

ID=27791004

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2003/002205 WO2003075408A1 (fr) 2002-03-07 2003-02-27 Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit

Country Status (7)

Country Link
US (1) US7160123B2 (ja)
EP (1) EP1482593B1 (ja)
KR (1) KR100588029B1 (ja)
CN (1) CN100539304C (ja)
AU (1) AU2003211368A1 (ja)
TW (1) TWI281546B (ja)
WO (1) WO2003075408A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005050782A (ja) * 2003-06-12 2005-02-24 Jsr Corp 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
EP1696241A1 (en) * 2003-12-18 2006-08-30 JSR Corporation Anisotropic conductive connector and circuit device inspection method
CN105891558A (zh) * 2016-06-18 2016-08-24 国网辽宁省电力有限公司盘锦供电公司 绝缘杆批量试验接地极
US11136597B2 (en) 2016-02-16 2021-10-05 Yale University Compositions for enhancing targeted gene editing and methods of use thereof

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100539304C (zh) 2002-03-07 2009-09-09 Jsr株式会社 各向异性导电连接器及生产工艺和电路器件的检验设备
US7190180B2 (en) * 2003-01-17 2007-03-13 Jsr Corporation Anisotropic conductive connector and production method therefor and inspection unit for circuit device
US7311531B2 (en) * 2003-03-26 2007-12-25 Jsr Corporation Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method
US8518304B1 (en) 2003-03-31 2013-08-27 The Research Foundation Of State University Of New York Nano-structure enhancements for anisotropic conductive material and thermal interposers
TWI239684B (en) * 2003-04-16 2005-09-11 Jsr Corp Anisotropic conductive connector and electric inspection device for circuit device
JP2005019393A (ja) * 2003-06-05 2005-01-20 Sharp Corp 異方性導電物、表示装置、表示装置の製造方法および導電部材
CN1806368B (zh) * 2003-06-12 2010-09-01 Jsr株式会社 各向异性导电连接器装置及其制造方法以及电路装置的检查装置
JP3999759B2 (ja) * 2004-04-02 2007-10-31 富士通株式会社 基板及び電子機器
JP2006194620A (ja) * 2005-01-11 2006-07-27 Tokyo Electron Ltd プローブカード及び検査用接触構造体
JP4179620B2 (ja) * 2005-04-28 2008-11-12 日本航空電子工業株式会社 コネクタ
JP2007005246A (ja) * 2005-06-27 2007-01-11 Sumitomo Electric Ind Ltd 多孔質樹脂基材及び多層基板
EP1936387A4 (en) * 2005-10-11 2011-10-05 Jsr Corp ANISOTROPIC CONDUCTOR CONNECTOR AND CIRCUIT DEVICE INSPECTION EQUIPMENT
DE102005059375A1 (de) * 2005-12-09 2007-06-14 Biotronik Crm Patent Ag Vorrichtung und Verfahren zur Herstellung von Elektroden für Batterien
TWI403723B (zh) * 2005-12-21 2013-08-01 Jsr Corp Manufacturing method of foreign - shaped conductive connector
CN101449426B (zh) 2006-04-11 2012-05-16 Jsr株式会社 各向异性导电连接器及各向异性导电连接器装置
KR100882735B1 (ko) * 2007-03-19 2009-02-06 도레이새한 주식회사 이방성 전도필름 및 이의 접착방법
JP5081533B2 (ja) * 2007-08-21 2012-11-28 ポリマテック株式会社 異方導電性コネクタおよび異方導電性コネクタの接続構造
EP2325948B1 (en) * 2008-09-16 2013-04-17 Fuji Polymer Industries Co., Ltd. Electroconductive rubber component, method of using it and portable telephone comprising it
KR101054251B1 (ko) * 2009-05-18 2011-08-08 두성산업 주식회사 기판 표면 실장용 도전성 접촉 단자
JP2011086880A (ja) * 2009-10-19 2011-04-28 Advantest Corp 電子部品実装装置および電子部品の実装方法
WO2011140469A1 (en) * 2010-05-06 2011-11-10 Zakaryae Fathi Adhesive bonding composition and method of use
JP2012078222A (ja) * 2010-10-01 2012-04-19 Fujifilm Corp 回路基板接続構造体および回路基板の接続方法
CN103094737A (zh) * 2011-11-05 2013-05-08 宝宸（厦门）光学科技有限公司 引脚结构与引脚连接结构
KR101266124B1 (ko) * 2012-04-03 2013-05-27 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓 및 그 제조방법
CN103454794B (zh) * 2013-09-06 2016-06-08 深圳市华星光电技术有限公司 点灯测试治具以及液晶面板测试方法
CN104153192A (zh) * 2014-08-06 2014-11-19 江南大学 一种织物磁化学镀铁镍合金的制备方法
JP6506653B2 (ja) * 2015-07-30 2019-04-24 日本メクトロン株式会社 伸縮性配線基板
JP6405334B2 (ja) 2016-04-18 2018-10-17 日本メクトロン株式会社 伸縮性配線基板、及び、伸縮性配線基板の製造方法
JP2018073577A (ja) * 2016-10-27 2018-05-10 株式会社エンプラス 異方導電性シート及びその製造方法
JP6670276B2 (ja) * 2016-11-30 2020-03-18 富士高分子工業株式会社 積層タイプコネクタ及びその製造方法
CN110140184A (zh) * 2016-12-07 2019-08-16 韦弗有限责任公司 低损耗电传输机构和使用其的天线
US10283476B2 (en) 2017-03-15 2019-05-07 Immunolight, Llc. Adhesive bonding composition and electronic components prepared from the same
CN110582895B (zh) * 2017-05-18 2022-01-14 信越聚合物株式会社 电连接器及其制造方法
CN109341909B (zh) * 2018-11-20 2020-11-10 郑州大学 一种多功能柔性应力传感器
KR102193528B1 (ko) * 2019-04-17 2020-12-23 주식회사 아이에스시 극저온에서 적용 가능한 검사용 커넥터
KR102220172B1 (ko) * 2020-03-03 2021-02-25 (주)티에스이 신호 전송 커넥터
CN112666450B (zh) * 2021-01-13 2022-11-01 深圳市兔拉检测科技有限公司 一种智能芯片检测仪及其检测方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4571542A (en) 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
US4729809A (en) 1985-03-14 1988-03-08 Amp Incorporated Anisotropically conductive adhesive composition
JPH06215633A (ja) * 1993-01-14 1994-08-05 Hitachi Chem Co Ltd 接続部材
JPH0730019A (ja) * 1993-07-13 1995-01-31 Seiko Epson Corp Ｉｃソケット
EP0641038A2 (en) 1993-08-27 1995-03-01 Nitto Denko Corporation Methods for connecting flexible circuit substrates to contact objects and structures thereof
JP2001067942A (ja) * 1999-08-31 2001-03-16 Jsr Corp 異方導電性シート
JP3256175B2 (ja) * 1997-12-22 2002-02-12 株式会社ヨコオ Ｉｃパッケージ測定用ソケット
JP2002279830A (ja) * 2001-03-19 2002-09-27 Nitto Denko Corp 異方導電性フィルム
JP7073067B2 (ja) * 2016-10-03 2022-05-23 リンカーン グローバル，インコーポレイテッド パラメータ設定のリアルタイム絵文字表現を備えたユーザインターフェース

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5740874A (en) * 1980-08-22 1982-03-06 Shinetsu Polymer Co Pressure contact holding type connector
JP2643789B2 (ja) 1993-09-01 1997-08-20 日本電気株式会社 スキャンパス回路
JPH1140224A (ja) * 1997-07-11 1999-02-12 Jsr Corp 異方導電性シート
JP3865019B2 (ja) 1998-03-23 2007-01-10 Ｊｓｒ株式会社 異方導電性シートおよびその製造方法
JP4240724B2 (ja) 2000-01-26 2009-03-18 Ｊｓｒ株式会社 異方導電性シートおよびコネクター
CN100539304C (zh) 2002-03-07 2009-09-09 Jsr株式会社 各向异性导电连接器及生产工艺和电路器件的检验设备

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4571542A (en) 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
US4729809A (en) 1985-03-14 1988-03-08 Amp Incorporated Anisotropically conductive adhesive composition
JPH06215633A (ja) * 1993-01-14 1994-08-05 Hitachi Chem Co Ltd 接続部材
JPH0730019A (ja) * 1993-07-13 1995-01-31 Seiko Epson Corp Ｉｃソケット
EP0641038A2 (en) 1993-08-27 1995-03-01 Nitto Denko Corporation Methods for connecting flexible circuit substrates to contact objects and structures thereof
JP3256175B2 (ja) * 1997-12-22 2002-02-12 株式会社ヨコオ Ｉｃパッケージ測定用ソケット
JP2001067942A (ja) * 1999-08-31 2001-03-16 Jsr Corp 異方導電性シート
JP2002279830A (ja) * 2001-03-19 2002-09-27 Nitto Denko Corp 異方導電性フィルム
JP7073067B2 (ja) * 2016-10-03 2022-05-23 リンカーン グローバル，インコーポレイテッド パラメータ設定のリアルタイム絵文字表現を備えたユーザインターフェース

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005050782A (ja) * 2003-06-12 2005-02-24 Jsr Corp 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
JP4507644B2 (ja) * 2003-06-12 2010-07-21 Ｊｓｒ株式会社 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
EP1696241A1 (en) * 2003-12-18 2006-08-30 JSR Corporation Anisotropic conductive connector and circuit device inspection method
EP1696241A4 (en) * 2003-12-18 2012-04-04 Jsr Corp ANISOTROPIC CONDUCTIVE CONNECTOR AND METHOD OF CONTROLLING A CIRCUIT DEVICE
US11136597B2 (en) 2016-02-16 2021-10-05 Yale University Compositions for enhancing targeted gene editing and methods of use thereof
CN105891558A (zh) * 2016-06-18 2016-08-24 国网辽宁省电力有限公司盘锦供电公司 绝缘杆批量试验接地极

Also Published As

Publication number Publication date
KR100588029B1 (ko) 2006-06-12
CN100539304C (zh) 2009-09-09
EP1482593A4 (en) 2010-11-03
KR20040087316A (ko) 2004-10-13
TWI281546B (en) 2007-05-21
CN1639919A (zh) 2005-07-13
EP1482593A1 (en) 2004-12-01
TW200303989A (en) 2003-09-16
US7160123B2 (en) 2007-01-09
EP1482593B1 (en) 2014-01-08
AU2003211368A1 (en) 2003-09-16
US20050106907A1 (en) 2005-05-19

Similar Documents

Publication Publication Date Title
WO2003075408A1 (fr) Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit
MX2008001195A (es) Conmutadores y sensores interdigitales de fuerza.
WO2007047762A3 (en) Pressure responsive sensor
WO2007061407A3 (en) Z-axis electrically conducting flow field separator
JPS6032285B2 (ja) 加圧導電性エラストマ−の製造方法
TW200707849A (en) Electrical interconnect system utilizing nonconductive elastomeric elements and continuous conductive elements
MX2007007552A (es) Membrana sensible a la fuerza.
EP2073316A4 (en) ANISOTROPIC CONDUCTIVE ADHESIVE COMPOSITION, ANISOTROPIC CONDUCTIVE FILM, CIRCUIT ELEMENT CONNECTION STRUCTURE, AND METHOD OF MANUFACTURING COATED PARTICLES
EP1067611A4 (en) ELECTRODE FOR CELL, PROCESS FOR PRODUCING THE SAME, AND CELL
TW200644007A (en) Electronic component and electronic apparatus
WO2007001391A3 (en) Metalized elastomeric electrical contacts
TW200628312A (en) Adhesive membrane for force switches and sensors
WO2001081657A3 (de) Elastisches kontakelement
TW200509482A (en) Durable electronic assembly with conductive adhesive
WO2004072334A3 (en) Nanofabric articles and methods of making the same
WO2005033685A3 (en) Sensor platforms utilising nanoporous membranes
US6117539A (en) Conductive elastomer for grafting to an elastic substrate
TW200603486A (en) Mold and method for manufacturing anisotropic conductive sheet
WO2006040781A3 (en) Sensor for measuring phisical quantities based on the detection of the variation of an electrical parameter, and method for its fabrication
JPS6452305A (en) Continuous flexble electric conductor which can function as electric switch
JP2002158051A (ja) 異方導電性シート
WO2001096219A3 (en) Electro-adhesion device
GB2466163A (en) Semiconductor structure comprising an electrically conductive feature and method of forming a semiconductor structure
ATE386341T1 (de) Elektromechanischer wandler mit mindestens einem piezoelektrischen element
TW200733485A (en) Anisotropic conductive sheet, manufacturing method, connecting method, and examinating method

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ OM PH PL PT RO RU SC SD SE SG SK SL TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PT SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
WWE Wipo information: entry into national phase

Ref document number: 1020047011290

Country of ref document: KR

WWE Wipo information: entry into national phase

Ref document number: 2003743513

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 10504421

Country of ref document: US

WWE Wipo information: entry into national phase

Ref document number: 1-2004-501295

Country of ref document: PH

WWE Wipo information: entry into national phase

Ref document number: 20038054930

Country of ref document: CN

WWP Wipo information: published in national office

Ref document number: 2003743513

Country of ref document: EP