TWI834897B - 長條光學積層體之檢查方法及檢查系統 - Google Patents
長條光學積層體之檢查方法及檢查系統 Download PDFInfo
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- TWI834897B TWI834897B TW109124438A TW109124438A TWI834897B TW I834897 B TWI834897 B TW I834897B TW 109124438 A TW109124438 A TW 109124438A TW 109124438 A TW109124438 A TW 109124438A TW I834897 B TWI834897 B TW I834897B
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects
Landscapes
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Mathematical Physics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Polarising Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019222918 | 2019-12-10 | ||
| JP2019-222918 | 2019-12-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202129264A TW202129264A (zh) | 2021-08-01 |
| TWI834897B true TWI834897B (zh) | 2024-03-11 |
Family
ID=76328979
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109124438A TWI834897B (zh) | 2019-12-10 | 2020-07-20 | 長條光學積層體之檢查方法及檢查系統 |
| TW109143559A TWI868273B (zh) | 2019-12-10 | 2020-12-10 | 長條光學積層體之檢查方法及檢查系統 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109143559A TWI868273B (zh) | 2019-12-10 | 2020-12-10 | 長條光學積層體之檢查方法及檢查系統 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP7522763B2 (https=) |
| KR (1) | KR20220106744A (https=) |
| CN (1) | CN114846320A (https=) |
| TW (2) | TWI834897B (https=) |
| WO (2) | WO2021117273A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117944373A (zh) * | 2024-03-12 | 2024-04-30 | 合肥德瑞格光电科技有限公司 | 一种偏光片自动光学检测缺陷喷印系统及其喷印方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201706627A (zh) * | 2015-07-17 | 2017-02-16 | Dainippon Printing Co Ltd | 光學構件用積層體及影像顯示裝置 |
| JP2018146580A (ja) * | 2017-03-03 | 2018-09-20 | 住友化学株式会社 | 欠陥マーキング方法及び欠陥マーキング装置、原反の製造方法及び原反、並びにシートの製造方法及びシート |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5925609B2 (ja) | 1980-02-14 | 1984-06-19 | 椿本興業株式会社 | 水の除鹿装置 |
| JP3974400B2 (ja) * | 2002-01-07 | 2007-09-12 | 日東電工株式会社 | シート状成形体の検査結果記録方法及び検査結果記録システム及びロール状成形体 |
| US7297969B1 (en) * | 2003-06-09 | 2007-11-20 | Cognex Technology And Investment Corporation | Web marking and inspection system |
| KR20050013491A (ko) * | 2003-07-28 | 2005-02-04 | 닛토덴코 가부시키가이샤 | 시트형상 제품의 검사 방법 및 검사 시스템 |
| JP2005114624A (ja) * | 2003-10-09 | 2005-04-28 | Nitto Denko Corp | シート状製品の検査方法及びシート状製品の検査システム及びシート状製品及び枚葉物 |
| JP4960161B2 (ja) * | 2006-10-11 | 2012-06-27 | 日東電工株式会社 | 検査データ処理装置及び検査データ処理方法 |
| JP2008175940A (ja) * | 2007-01-17 | 2008-07-31 | Sekisui Chem Co Ltd | 光学フィルムの欠陥のマーキング方法 |
| JP2008256852A (ja) * | 2007-04-03 | 2008-10-23 | Nitto Denko Corp | 光学フィルム体および光学フィルム体の製造方法 |
| US7542821B2 (en) * | 2007-07-26 | 2009-06-02 | 3M Innovative Properties Company | Multi-unit process spatial synchronization of image inspection systems |
| JP5578759B2 (ja) | 2007-08-10 | 2014-08-27 | 日東電工株式会社 | フィルム及びその製造方法 |
| DE102007043408A1 (de) * | 2007-09-12 | 2009-03-19 | Leonhard Kurz Gmbh & Co. Kg | Verfahren zur Detektion von Trägerfolienresten oder Trägerfehlstellen sowie Applikationsmaschine |
| JP2009243911A (ja) * | 2008-03-28 | 2009-10-22 | Toray Ind Inc | 欠陥検査システム |
| JP2009244064A (ja) * | 2008-03-31 | 2009-10-22 | Sumitomo Chemical Co Ltd | 偏光フィルムの検査方法 |
| KR101512142B1 (ko) * | 2013-12-31 | 2015-04-14 | (주)엔에스 | 필름 제조 장치 |
| KR20150086633A (ko) * | 2014-01-20 | 2015-07-29 | 동우 화인켐 주식회사 | 광학 필름의 검사 장치 및 방법 |
| JP2015225041A (ja) * | 2014-05-29 | 2015-12-14 | 住友化学株式会社 | 積層偏光フィルムの欠陥検査方法 |
| JP6641093B2 (ja) * | 2015-03-20 | 2020-02-05 | 住友化学株式会社 | 光学フィルム及び積層光学フィルムの欠陥検査方法 |
| JP6749894B2 (ja) * | 2015-04-09 | 2020-09-02 | 住友化学株式会社 | 積層光学フィルムの欠陥検査方法、光学フィルムの欠陥検査方法及び積層光学フィルムの製造方法 |
| JP7097666B2 (ja) * | 2016-02-02 | 2022-07-08 | 日東電工株式会社 | フィルムの製造方法および真空成膜装置 |
| JP6970550B2 (ja) * | 2017-07-24 | 2021-11-24 | 住友化学株式会社 | 欠陥検査システム及び欠陥検査方法 |
-
2020
- 2020-06-24 WO PCT/JP2020/024847 patent/WO2021117273A1/ja not_active Ceased
- 2020-07-20 TW TW109124438A patent/TWI834897B/zh active
- 2020-12-07 KR KR1020227016040A patent/KR20220106744A/ko active Pending
- 2020-12-07 JP JP2021563945A patent/JP7522763B2/ja active Active
- 2020-12-07 CN CN202080085745.6A patent/CN114846320A/zh active Pending
- 2020-12-07 WO PCT/JP2020/045454 patent/WO2021117670A1/ja not_active Ceased
- 2020-12-10 TW TW109143559A patent/TWI868273B/zh active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201706627A (zh) * | 2015-07-17 | 2017-02-16 | Dainippon Printing Co Ltd | 光學構件用積層體及影像顯示裝置 |
| JP2018146580A (ja) * | 2017-03-03 | 2018-09-20 | 住友化学株式会社 | 欠陥マーキング方法及び欠陥マーキング装置、原反の製造方法及び原反、並びにシートの製造方法及びシート |
| TW201837456A (zh) * | 2017-03-03 | 2018-10-16 | 日商住友化學股份有限公司 | 缺陷標記方法及缺陷標記裝置、原材的製造方法及原材，以及片的製造方法及片 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20220106744A (ko) | 2022-07-29 |
| TW202129264A (zh) | 2021-08-01 |
| CN114846320A (zh) | 2022-08-02 |
| TW202129265A (zh) | 2021-08-01 |
| JP7522763B2 (ja) | 2024-07-25 |
| WO2021117670A1 (ja) | 2021-06-17 |
| TWI868273B (zh) | 2025-01-01 |
| WO2021117273A1 (ja) | 2021-06-17 |
| JPWO2021117670A1 (https=) | 2021-06-17 |
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