KR20220106744A - 장척 광학 적층체의 검사 방법 및 검사 시스템 - Google Patents

장척 광학 적층체의 검사 방법 및 검사 시스템 Download PDF

Info

Publication number
KR20220106744A
KR20220106744A KR1020227016040A KR20227016040A KR20220106744A KR 20220106744 A KR20220106744 A KR 20220106744A KR 1020227016040 A KR1020227016040 A KR 1020227016040A KR 20227016040 A KR20227016040 A KR 20227016040A KR 20220106744 A KR20220106744 A KR 20220106744A
Authority
KR
South Korea
Prior art keywords
long optical
identification information
optical film
film
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020227016040A
Other languages
English (en)
Korean (ko)
Inventor
야스유키 미카사
쿄헤이 마츠바야시
히로카즈 타츠보
요스케 무라카미
츠요시 코마루
Original Assignee
닛토덴코 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 닛토덴코 가부시키가이샤 filed Critical 닛토덴코 가부시키가이샤
Publication of KR20220106744A publication Critical patent/KR20220106744A/ko
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
KR1020227016040A 2019-12-10 2020-12-07 장척 광학 적층체의 검사 방법 및 검사 시스템 Pending KR20220106744A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019222918 2019-12-10
JPJP-P-2019-222918 2019-12-10
PCT/JP2020/045454 WO2021117670A1 (ja) 2019-12-10 2020-12-07 長尺光学積層体の検査方法及び検査システム

Publications (1)

Publication Number Publication Date
KR20220106744A true KR20220106744A (ko) 2022-07-29

Family

ID=76328979

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020227016040A Pending KR20220106744A (ko) 2019-12-10 2020-12-07 장척 광학 적층체의 검사 방법 및 검사 시스템

Country Status (5)

Country Link
JP (1) JP7522763B2 (https=)
KR (1) KR20220106744A (https=)
CN (1) CN114846320A (https=)
TW (2) TWI834897B (https=)
WO (2) WO2021117273A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117944373A (zh) * 2024-03-12 2024-04-30 合肥德瑞格光电科技有限公司 一种偏光片自动光学检测缺陷喷印系统及其喷印方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5925609B2 (ja) 1980-02-14 1984-06-19 椿本興業株式会社 水の除鹿装置
JP5578759B2 (ja) 2007-08-10 2014-08-27 日東電工株式会社 フィルム及びその製造方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3974400B2 (ja) * 2002-01-07 2007-09-12 日東電工株式会社 シート状成形体の検査結果記録方法及び検査結果記録システム及びロール状成形体
US7297969B1 (en) * 2003-06-09 2007-11-20 Cognex Technology And Investment Corporation Web marking and inspection system
KR20050013491A (ko) * 2003-07-28 2005-02-04 닛토덴코 가부시키가이샤 시트형상 제품의 검사 방법 및 검사 시스템
JP2005114624A (ja) * 2003-10-09 2005-04-28 Nitto Denko Corp シート状製品の検査方法及びシート状製品の検査システム及びシート状製品及び枚葉物
JP4960161B2 (ja) * 2006-10-11 2012-06-27 日東電工株式会社 検査データ処理装置及び検査データ処理方法
JP2008175940A (ja) * 2007-01-17 2008-07-31 Sekisui Chem Co Ltd 光学フィルムの欠陥のマーキング方法
JP2008256852A (ja) * 2007-04-03 2008-10-23 Nitto Denko Corp 光学フィルム体および光学フィルム体の製造方法
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
DE102007043408A1 (de) * 2007-09-12 2009-03-19 Leonhard Kurz Gmbh & Co. Kg Verfahren zur Detektion von Trägerfolienresten oder Trägerfehlstellen sowie Applikationsmaschine
JP2009243911A (ja) * 2008-03-28 2009-10-22 Toray Ind Inc 欠陥検査システム
JP2009244064A (ja) * 2008-03-31 2009-10-22 Sumitomo Chemical Co Ltd 偏光フィルムの検査方法
KR101512142B1 (ko) * 2013-12-31 2015-04-14 (주)엔에스 필름 제조 장치
KR20150086633A (ko) * 2014-01-20 2015-07-29 동우 화인켐 주식회사 광학 필름의 검사 장치 및 방법
JP2015225041A (ja) * 2014-05-29 2015-12-14 住友化学株式会社 積層偏光フィルムの欠陥検査方法
JP6641093B2 (ja) * 2015-03-20 2020-02-05 住友化学株式会社 光学フィルム及び積層光学フィルムの欠陥検査方法
JP6749894B2 (ja) * 2015-04-09 2020-09-02 住友化学株式会社 積層光学フィルムの欠陥検査方法、光学フィルムの欠陥検査方法及び積層光学フィルムの製造方法
TWI702415B (zh) * 2015-07-17 2020-08-21 日商大日本印刷股份有限公司 光學構件用積層體及影像顯示裝置
JP7097666B2 (ja) * 2016-02-02 2022-07-08 日東電工株式会社 フィルムの製造方法および真空成膜装置
KR102475056B1 (ko) * 2017-03-03 2022-12-06 스미또모 가가꾸 가부시키가이샤 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트
JP6970550B2 (ja) * 2017-07-24 2021-11-24 住友化学株式会社 欠陥検査システム及び欠陥検査方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5925609B2 (ja) 1980-02-14 1984-06-19 椿本興業株式会社 水の除鹿装置
JP5578759B2 (ja) 2007-08-10 2014-08-27 日東電工株式会社 フィルム及びその製造方法

Also Published As

Publication number Publication date
TW202129264A (zh) 2021-08-01
CN114846320A (zh) 2022-08-02
TW202129265A (zh) 2021-08-01
JP7522763B2 (ja) 2024-07-25
WO2021117670A1 (ja) 2021-06-17
TWI834897B (zh) 2024-03-11
TWI868273B (zh) 2025-01-01
WO2021117273A1 (ja) 2021-06-17
JPWO2021117670A1 (https=) 2021-06-17

Similar Documents

Publication Publication Date Title
KR101394690B1 (ko) 광학 필름을 갖는 시트상 제품의 결점 검사 장치, 그 검사 데이터 처리 장치, 그 절단 장치 및 그 제조 시스템
JP5051874B2 (ja) 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置
CN100491983C (zh) 薄片状制品及其检查方法和检查系统、图像显示装置
JP4869053B2 (ja) 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
JP5671571B2 (ja) 光学フィルムを有するシート状製品の検査データ処理装置および切断装置
US20080193701A1 (en) Optical film products and method for producing optical film products
KR20080033862A (ko) 검사 데이터 처리 장치 및 검사 데이터 처리 방법
JP7628084B2 (ja) 機能フィルムの検査方法、検査システム及び原反ロール
JP5925609B2 (ja) シート状製品の検査システム及びシート状製品の検査方法
JP7288989B1 (ja) 長尺光学フィルムの検査方法
KR20220106744A (ko) 장척 광학 적층체의 검사 방법 및 검사 시스템
JP2009080131A (ja) シート状製品の検査方法及びシート状製品の検査システム及びシート状製品及び枚葉物

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

D21 Rejection of application intended

Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE)

PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11 Amendment of application requested

Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P11-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE)

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000