TWI834897B - Inspection method and inspection system for long optical laminates - Google Patents

Inspection method and inspection system for long optical laminates Download PDF

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TWI834897B
TWI834897B TW109124438A TW109124438A TWI834897B TW I834897 B TWI834897 B TW I834897B TW 109124438 A TW109124438 A TW 109124438A TW 109124438 A TW109124438 A TW 109124438A TW I834897 B TWI834897 B TW I834897B
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long optical
mentioned
identification information
optical film
laminated body
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TW202129264A (en
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三笠康之
松林恭平
田壺宏和
村上洋介
神丸剛
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日商日東電工股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/888Marking defects

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  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)

Abstract

本發明之課題在於可於長條光學積層體之狀態下讀取列印於第1長條光學膜之第1識別資訊、及列印於長條光學積層體之第2識別資訊兩者。 本發明之長條光學積層體之檢查方法包括:第1步驟,其係檢查第1長條光學膜F1而獲取第1缺陷資訊;第2步驟,其係將第1識別資訊M列印於第1長條光學膜;第3步驟,其係將第1缺陷資訊與第1識別資訊建立關聯並加以記憶;第4步驟,其係檢查積層第1長條光學膜而成之長條光學積層體F2而獲取第2缺陷資訊;第5步驟,其係將第2識別資訊列印於長條光學積層體;第6步驟,其係將第2缺陷資訊與第2識別資訊建立關聯並加以記憶;藉由噴墨方式列印第1識別資訊及第2識別資訊中之任一者,並利用雷射刻印列印另一者;或者,藉由使用透明墨水之噴墨方式列印任一者,並藉由使用有色墨水之噴墨方式列印另一者。The object of the present invention is to be able to read both the first identification information printed on the first long optical film and the second identification information printed on the long optical laminated body in the state of the long optical laminated body. The inspection method of the long optical laminated body of the present invention includes: a first step, which is to inspect the first long optical film F1 to obtain the first defect information; a second step, which is to print the first identification information M on the first 1 long optical film; the third step is to associate the first defect information with the first identification information and memorize it; the fourth step is to inspect the long optical laminate in which the first long optical film is laminated F2 to obtain the second defect information; the fifth step is to print the second identification information on the long optical laminated body; the sixth step is to associate the second defect information with the second identification information and memorize it; Either one of the first identification information and the second identification information is printed by inkjet method, and the other is printed by laser engraving; or, either one is printed by inkjet method using transparent ink, and print the other by inkjet using colored ink.

Description

長條光學積層體之檢查方法及檢查系統Inspection method and inspection system for long optical laminates

本發明係關於一種長條光學積層體(例如偏光膜)之檢查方法及檢查系統,該長條光學積層體係積層第1長條光學膜(例如保護膜)及第2長條光學膜(例如偏光元件)而成。本發明尤其係關於一種長條光學積層體之檢查方法及檢查系統,該檢查方法及檢查系統可於長條光學積層體之狀態下讀取列印於第1長條光學膜之第1識別資訊、及列印於長條光學積層體之第2識別資訊兩者,藉此可將缺陷資訊與識別資訊適當地建立關聯。The present invention relates to an inspection method and an inspection system for a long optical laminated body (such as a polarizing film). The long optical laminated system is laminated with a first long optical film (such as a protective film) and a second long optical film (such as a polarizing film). components). In particular, the present invention relates to an inspection method and an inspection system for a long optical laminated body. The inspection method and inspection system can read the first identification information printed on the first long optical film in the state of the long optical laminated body. , and the second identification information printed on the long optical laminated body, whereby the defect information and the identification information can be appropriately associated.

作為長條光學積層體,例如已知有用於液晶顯示裝置之偏光膜。由長條偏光膜沖裁出與各種用途相對應之尺寸之偏光膜之步驟例如如下所述。As a long optical laminate, for example, a polarizing film used in a liquid crystal display device is known. The steps for punching out polarizing films of sizes corresponding to various uses from long polarizing films are as follows, for example.

首先,檢查以卷對卷方式搬送之長條偏光膜,檢測出偏光膜所存在之缺陷。於檢測出缺陷之情形時,於缺陷位置標註標記,捲取偏光膜。 作為最終製品之偏光膜(沖裁後之偏光膜)根據使用者之規格不同而有各種尺寸,而長條偏光膜(偏光膜坯膜)往往可共通使用,因此會預先大量製造偏光膜坯膜,日後再視需要由偏光膜坯膜沖裁為所需尺寸之偏光膜製品。於沖裁偏光膜製品時必須避開存在缺陷之位置,或者於沖裁後將存在缺陷之位置標註有標記之偏光膜製品作為不良品去除。 因此,檢查長條偏光膜時,需要檢測出缺陷並將該缺陷位置等作為缺陷資訊加以記憶。First, the long polarizing film transported in a roll-to-roll manner is inspected to detect defects in the polarizing film. When a defect is detected, mark the defect location and roll up the polarizing film. The polarizing film as the final product (polarizing film after punching) comes in various sizes according to the user's specifications. Long polarizing films (polarizing film base films) can often be used in common, so polarizing film base films are manufactured in large quantities in advance. , and then punch out the polarizing film base film into polarizing film products of the required size as needed in the future. When punching polarizing film products, you must avoid the defective locations, or remove the polarizing film products with marks on the defective locations as defective products after punching. Therefore, when inspecting a long polarizing film, it is necessary to detect defects and memorize the defect location as defect information.

為了妥當管理缺陷資訊,提高偏光膜製品之良率,專利文獻1中提出一種偏光膜之檢查方法,該檢查方法將識別資訊(至少特定偏光膜之長邊方向位置的資訊)列印於偏光膜之寬度方向端部,將缺陷資訊與識別資訊建立關聯。 根據專利文獻1中記載之檢查方法,可妥當管理於偏光膜之狀態下所產生之缺陷的缺陷資訊。In order to properly manage defect information and improve the yield of polarizing film products, Patent Document 1 proposes an inspection method for polarizing films. This inspection method prints identification information (at least information on the long-side position of the specific polarizing film) on the polarizing film. The end of the width direction is used to associate the defect information with the identification information. According to the inspection method described in Patent Document 1, defect information of defects generated in the state of the polarizing film can be properly managed.

然而,於偏光膜,不僅存在於積層保護膜及偏光元件而成之偏光膜之狀態下產生之缺陷,亦存在於單獨保護膜(與偏光元件積層前之保護膜)之狀態下產生之缺陷。並且,有時於偏光膜之狀態下進行檢查難以檢測出於單獨保護膜之狀態下產生之缺陷。 因此,雖然亦會對保護膜單獨進行檢查,但先前由該檢查所檢測出之缺陷之缺陷資訊並未得到妥當管理。具體而言,並未將識別資訊列印於單獨保護膜而將其與缺陷資訊建立關聯。However, in polarizing films, there are defects that occur not only in the state of the polarizing film in which a protective film and a polarizing element are laminated, but also in the state of a separate protective film (the protective film before being laminated with the polarizing element). Furthermore, it is sometimes difficult to detect defects occurring in the protective film alone when inspecting the polarizing film. Therefore, although the protective film is also inspected individually, the defect information of defects previously detected by this inspection is not properly managed. Specifically, the identification information is not printed on a separate protective film and associated with the defect information.

再者,為了防止捲取保護膜時產生捲取偏移、捲取鬆弛、結塊、帶狀凸部等,存在實施滾紋加工之情形,該滾紋加工係藉由雷射刻印於保護膜之寬度方向端部形成微小凹凸(例如參照專利文獻2)。 [先前技術文獻] [專利文獻]Furthermore, in order to prevent winding deviation, winding slack, agglomeration, band-shaped protrusions, etc. when rolling the protective film, there are cases where tumble processing is performed. This tumble processing is engraved on the protective film by laser. Microscopic unevenness is formed at the end portion in the width direction (see, for example, Patent Document 2). [Prior technical literature] [Patent Document]

[專利文獻1]日本專利第5925609號公報 [專利文獻2]日本專利第5578759號公報[Patent Document 1] Japanese Patent No. 5925609 [Patent Document 2] Japanese Patent No. 5578759

[發明所欲解決之問題][Problem to be solved by the invention]

本發明係為了解決上述先前技術之問題點而完成者,課題在於提供一種長條光學積層體之檢查方法及檢查系統,該檢查方法及檢查系統可於長條光學積層體之狀態下讀取列印於第1長條光學膜(例如保護膜)之第1識別資訊、及列印於長條光學積層體(例如偏光膜)之第2識別資訊兩者,藉此可將缺陷資訊與識別資訊適當地建立關聯。 [解決問題之技術手段]The present invention was completed in order to solve the above-mentioned problems of the prior art. The subject is to provide an inspection method and an inspection system for a long optical laminated body. The inspection method and the inspection system can read the sequence in the state of the long optical laminated body. Both the first identification information printed on the first long optical film (such as protective film) and the second identification information printed on the long optical laminate (such as polarizing film) can be used to combine defect information and identification information Make connections appropriately. [Technical means to solve problems]

為了解決上述課題,本發明人等進行了銳意研究,結果發現對所要列印於第1長條光學膜上之第1識別資訊與所要列印於長條光學積層體之第2識別資訊,藉由噴墨方式列印其中任一者,並藉由雷射刻印來列印另一者;或者,藉由使用透明墨水之噴墨方式列印其中任一者,並藉由使用有色墨水之噴墨方式列印另一者,藉此,即便第1識別資訊與第2識別資訊重疊,亦可辨別二者加以讀取,從而完成本發明。 即,為了解決上述課題,本發明提供一種長條光學積層體之檢查方法,該檢查方法之特徵在於包括:第1步驟,其係檢查第1長條光學膜而獲取上述第1長條光學膜之缺陷資訊即第1缺陷資訊;第2步驟,其係於上述第1長條光學膜之長邊方向每隔特定間隔,將第1識別資訊列印於上述第1長條光學膜之寬度方向端部;第3步驟,其係使上述第1長條光學膜之上述第1缺陷資訊與上述第1識別資訊建立關聯並加以記憶;第4步驟,其係檢查積層上述第1長條光學膜及第2長條光學膜之長條而成之光學積層體,獲取上述長條光學積層體之缺陷資訊即第2缺陷資訊;第5步驟,其係於上述長條光學積層體之長邊方向每隔特定間隔,將第2識別資訊列印於上述長條光學積層體之寬度方向端部;及第6步驟,其係將上述長條光學積層體之上述第2缺陷資訊與上述第2識別資訊建立關聯並加以記憶;對於上述第2步驟所要列印之上述第1識別資訊及於上述第5步驟所要列印之上述第2識別資訊,噴墨方式列印其中之任一者,並藉由雷射刻印來列印另一者;或者,藉由使用透明墨水之噴墨方式列印其中任一者,並藉由使用有色墨水之噴墨方式列印另一者。In order to solve the above problems, the present inventors conducted intensive research and found that the first identification information to be printed on the first long optical film and the second identification information to be printed on the long optical laminate can be Either by inkjet printing and the other by laser marking; or by inkjet printing using clear ink and printing either by inkjet using colored ink. By printing the other with ink, even if the first identification information and the second identification information overlap, they can be distinguished and read, thereby completing the present invention. That is, in order to solve the above-mentioned problems, the present invention provides an inspection method for a long optical laminated body. The inspection method is characterized by including: a first step of inspecting a first long optical film to obtain the first long optical film. The defect information is the first defect information; the second step is to print the first identification information in the width direction of the above-mentioned first elongated optical film at specific intervals in the longitudinal direction of the above-mentioned first elongated optical film end; the third step is to associate and memorize the first defect information of the first long optical film with the first identification information; the fourth step is to inspect the laminated first long optical film and an optical laminated body made of a long strip of the second long optical film, and obtain the defect information of the above-mentioned long optical laminated body, which is the second defect information; in the fifth step, it is in the long side direction of the above-mentioned long optical laminated body Printing the second identification information on the width direction ends of the above-mentioned long optical laminated body at specific intervals; and the sixth step is to combine the above-mentioned second defect information of the above-mentioned long optical laminated body with the above-mentioned second identification The information is associated and remembered; for the above-mentioned first identification information to be printed in the above-mentioned step 2 and the above-mentioned second identification information to be printed in the above-mentioned step 5, any one of them is printed by inkjet method, and by Print the other by laser marking; or, print either by inkjet using clear ink, and the other by inkjet using colored ink.

本發明中,「缺陷資訊」意為至少包含缺陷位置之資訊。又,「第1識別資訊」意為至少包含特定第1長條光學膜之長邊方向位置之資訊的資訊。進而,「第2識別資訊」意為至少包含特定長條光學積層體之長邊方向位置之資訊的資訊。 根據本發明,於第1步驟獲取第1長條光學膜之第1缺陷資訊,於第2步驟列印第1長條光學膜之第1識別資訊,於第3步驟將第1缺陷資訊與第1識別資訊建立關聯並加以記憶。又,於第4步驟獲取長條光學積層體之第2缺陷資訊,於第5步驟列印長條光學積層體之第2識別資訊,於第6步驟將第2缺陷資訊與第2識別資訊建立關聯並加以記憶。 藉由噴墨方式列印第1識別資訊及第2識別資訊中之任一者,藉由雷射刻印來列印另一者;或者,藉由使用透明墨水之噴墨方式列印任一者,藉由使用有色墨水之噴墨方式列印另一者。透明墨水係藉由照射光而發出螢光之墨水,可例示藉由照射紫外線而發出螢光之UV(UltraViolet,紫外線)墨水。In the present invention, "defect information" means information including at least defect locations. Moreover, "first identification information" means information including at least information specifying the position in the longitudinal direction of the first elongated optical film. Furthermore, "second identification information" means information including at least information on the longitudinal position of a specific long optical laminated body. According to the present invention, the first defect information of the first long optical film is obtained in the first step, the first identification information of the first long optical film is printed in the second step, and the first defect information is combined with the first long optical film in the third step. 1. Recognize information, establish associations and remember it. Furthermore, in the 4th step, the second defect information of the long optical laminated body is obtained, in the 5th step, the second identification information of the long optical laminated body is printed, and in the 6th step, the second defect information and the second identification information are created. associate and remember. Either one of the first identification information and the second identification information is printed by inkjet printing, and the other is printed by laser engraving; or, either one is printed by inkjet printing using transparent ink. , printing the other by inkjet using colored ink. The transparent ink is an ink that emits fluorescence by irradiating light. An example of the transparent ink is UV (UltraViolet, ultraviolet) ink that emits fluorescence by irradiating ultraviolet rays.

即,根據本發明,藉由以下(1)~(6)中之任一方法列印第1識別資訊及第2識別資訊。 (1)第1識別資訊:使用透明墨水之噴墨方式,第2識別資訊:雷射刻印 (2)第1識別資訊:使用有色墨水之噴墨方式,第2識別資訊:雷射刻印 (3)第1識別資訊:雷射刻印,第2識別資訊:使用透明墨水之噴墨方式 (4)第1識別資訊:雷射刻印,第2識別資訊:使用有色墨水之噴墨方式 (5)第1識別資訊:使用透明墨水之噴墨方式,第2識別資訊:使用有色墨水之噴墨方式 (6)第1識別資訊:使用有色墨水之噴墨方式,第2識別資訊:使用透明墨水之噴墨方式 因此,根據本發明人等之見解,即便第1識別資訊與第2識別資訊重疊,亦可辨別二者加以讀取。即,可將缺陷資訊與識別資訊適當地建立關聯(將第1缺陷資訊與第1識別資訊建立關聯,將第2缺陷資訊與第2識別資訊建立關聯)。 因此,例如,藉由讀取第1識別資訊,使用第3步驟中記憶之第1缺陷資訊與第1識別資訊之關聯,可避開於第1長條光學膜之狀態下所產生之缺陷位置而沖裁製品。又,例如,藉由讀取第2識別資訊,使用第6步驟中記憶之第2缺陷資訊與第2識別資訊之關聯,可避開於長條光學積層體之狀態下所產生之缺陷位置而沖裁製品。 再者,本發明中,第1步驟~第6步驟並非必須按照該順序執行,例如,亦可於執行第2步驟後,執行第1步驟。又,亦可於執行第5步驟後,執行第4步驟。That is, according to the present invention, the first identification information and the second identification information are printed by any one of the following methods (1) to (6). (1) The first identification information: inkjet method using transparent ink, the second identification information: laser engraving (2) The first identification information: inkjet method using colored ink, the second identification information: laser engraving (3) The first identification information: laser marking, the second identification information: inkjet method using transparent ink (4) The first identification information: laser marking, the second identification information: inkjet method using colored ink (5) The first identification information: the inkjet method using transparent ink, the second identification information: the inkjet method using colored ink (6) The first identification information: the inkjet method using colored ink, the second identification information: the inkjet method using transparent ink Therefore, according to the findings of the present inventors, even if the first identification information and the second identification information overlap, they can be distinguished and read. That is, the defect information and the identification information can be appropriately associated (the first defect information is associated with the first identification information, and the second defect information is associated with the second identification information). Therefore, for example, by reading the first identification information and using the relationship between the first defect information and the first identification information memorized in the third step, it is possible to avoid the defective position generated in the state of the first long optical film. And blanking products. Furthermore, for example, by reading the second identification information and using the correlation between the second defect information and the second identification information memorized in step 6, it is possible to avoid the defective position generated in the long optical laminated body. Blanking products. Furthermore, in the present invention, the first to sixth steps do not have to be executed in this order. For example, the first step may be executed after the second step is executed. Alternatively, you may perform step 4 after performing step 5.

本發明中,較佳為於上述第2步驟中,藉由使用透明墨水之噴墨方式列印上述第1識別資訊,於上述第5步驟中,藉由雷射刻印來列印上述第2識別資訊。In the present invention, it is preferable that in the above-mentioned second step, the above-mentioned first identification information is printed by an inkjet method using transparent ink, and in the above-mentioned fifth step, the above-mentioned second identification information is printed by laser engraving. information.

如上所述,作為第1識別資訊及第2識別資訊之列印方法,可使用(1)~(6)中之任一方法。然而,根據本發明人等研究出之結果,最容易辨別第1識別資訊與第2識別資訊來加以讀取之方法係藉由使用透明墨水之噴墨方式列印第1識別資訊,藉由雷射刻印列印第2識別資訊。 因此,根據上述較佳之方法,可將缺陷資訊與識別資訊更適當地建立關聯(將第1缺陷資訊與第1識別資訊建立關聯,將第2缺陷資訊與第2識別資訊建立關聯)。As described above, as a method of printing the first identification information and the second identification information, any one of the methods (1) to (6) can be used. However, according to the research results of the present inventors, the easiest way to distinguish and read the first identification information and the second identification information is to print the first identification information using an inkjet method using transparent ink. The second identification information is printed by laser engraving. Therefore, according to the above-mentioned preferred method, the defect information and the identification information can be more appropriately associated (the first defect information is associated with the first identification information, the second defect information is associated with the second identification information).

本發明中,較佳為進而包括第7步驟,該第7步驟係將上述第1長條光學膜之上述第1缺陷資訊與上述長條光學積層體之上述第2識別資訊建立關聯並加以記憶。In the present invention, it is preferable to further include a seventh step of associating and memorizing the first defect information of the first long optical film with the second identification information of the long optical laminated body. .

根據上述較佳之方法,記憶長條光學積層體之第2缺陷資訊時不僅與長條光學積層體之第2識別資訊建立關聯,而且亦與第1長條光學膜之第1缺陷資訊建立關聯。換言之,可基於長條光學積層體之第2識別資訊,統籌管理第1缺陷資訊及第2缺陷資訊。 因此,於執行第7步驟後,切斷(例如切斷保護膜之滾紋加工部)構成長條光學積層體之第1長條光學膜之寬度方向端部,藉此,即便去除第1識別資訊,亦可將缺陷資訊與識別資訊適當地建立關聯(將第1缺陷資訊及第2缺陷資訊與第2識別資訊建立關聯)。 又,例如,讀取第2識別資訊,使用第6步驟中記憶之第2缺陷資訊與第2識別資訊之關聯,並且使用第7步驟中記憶之第1缺陷資訊與第2識別資訊之關聯,藉此可避開於第1長條光學膜之狀態下所產生之缺陷位置及於長條光學積層體之狀態下所產生之缺陷位置而沖裁製品。即,可省去沖裁製品時讀取第1識別資訊之工時。According to the above preferred method, when memorizing the second defect information of the long optical laminated body, it is not only associated with the second identification information of the long optical laminated body, but also associated with the first defect information of the first long optical film. In other words, the first defect information and the second defect information can be managed in an integrated manner based on the second identification information of the long optical laminated body. Therefore, after performing the seventh step, the width direction end portion of the first long optical film constituting the long optical laminate is cut (for example, the knurled portion of the protective film is cut), thereby removing the first identification information, and can also appropriately associate defect information with identification information (associate the first defect information and the second defect information with the second identification information). Also, for example, when reading the second identification information, the correlation between the second defect information and the second identification information memorized in step 6 is used, and the correlation between the first defect information and the second identification information memorized in step 7 is used. This allows the product to be punched out while avoiding the defective locations that occur in the first long optical film and the long optical laminated body. That is, the man-hour of reading the first identification information when punching products can be saved.

本發明中,較佳為進而包括第8步驟,該第8步驟基於上述第1長條光學膜之上述第1識別資訊及上述第1缺陷資訊、以及上述長條光學積層體之上述第2識別資訊及上述第2缺陷資訊,於上述長條光學積層體之缺陷位置標註標記。In the present invention, it is preferable to further include an eighth step based on the first identification information and the first defect information of the first long optical film, and the second identification of the long optical laminated body. Information and the above-mentioned second defect information, mark the defective position of the above-mentioned long optical laminate.

根據上述較佳之方法,由於缺陷位置標註有標記,因此目視便可特定出缺陷位置。According to the above-mentioned preferred method, since the defective position is marked with a mark, the defective position can be identified visually.

本發明可適宜地用於上述第1長條光學膜為保護膜、上述第2長條光學膜為偏光元件、上述長條光學積層體為偏光膜之情形。 又,本發明亦可用於上述第1長條光學膜為相位差膜、上述第2長條光學膜為偏光膜之情形。 進而,本發明亦可用於上述第1長條光學膜為反射型偏光元件、上述第2長條光學膜為偏光膜之情形。The present invention can be suitably used when the first elongated optical film is a protective film, the second elongated optical film is a polarizing element, and the elongated optical laminated body is a polarizing film. Moreover, the present invention can also be used in the case where the above-mentioned first elongated optical film is a retardation film and the above-mentioned second elongated optical film is a polarizing film. Furthermore, the present invention is also applicable to the case where the first elongated optical film is a reflective polarizing element and the second elongated optical film is a polarizing film.

根據本發明人等之見解,於在第1長條光學膜之寬度方向端部形成有滾紋加工部之情形時,即便藉由噴墨方式將第1識別資訊列印於與滾紋加工部相對應之部位(形成有滾紋加工部之部位或預定形成滾紋加工部之部位),亦可辨別第1識別資訊與滾紋加工部之凹凸來加以讀取。另一方面,若藉由雷射刻印將第2識別資訊列印於與滾紋加工部相對應之部位,則存在難以辨別第2識別資訊與滾紋加工部之凹凸來加以讀取之情形。 因此,本發明中,較佳為於上述第1長條光學膜之寬度方向端部形成有滾紋加工部之情形時,於上述第2步驟中,藉由噴墨方式將上述第1識別資訊列印於上述第1長條光學膜之與上述與滾紋加工部相對應之部位。藉此,第1長條光學膜之有效寬度不會因列印第1識別資訊而變窄,從而可提高良率。 又,本發明中,較佳為於上述第1長條光學膜之寬度方向端部形成有滾紋加工部,於上述第5步驟中,將上述第2識別資訊列印於上述第1長條光學膜之位於較滾紋加工部更靠寬度方向內側之上述長條光學積層體之部位。藉此,可確實地辨別第2識別資訊與滾紋加工部之凹凸來加以讀取。According to the findings of the present inventors, when a knurled portion is formed on the width direction end of the first long optical film, even if the first identification information is printed on the knurled portion by an inkjet method, The corresponding portion (the portion where the knurled portion is formed or the portion where the knurled portion is scheduled to be formed) can also be read by distinguishing the first identification information from the concavities and convexities of the knurled portion. On the other hand, if the second identification information is printed on a portion corresponding to the knurled portion by laser marking, it may be difficult to distinguish the second identification information from the unevenness of the knurled portion and read it. Therefore, in the present invention, when the knurled portion is formed on the end portion of the first elongated optical film in the width direction, it is preferable that the first identification information is printed by an inkjet method in the second step. Printing is performed on the portion of the first elongated optical film corresponding to the knurled portion. Thereby, the effective width of the first long optical film will not be narrowed due to printing of the first identification information, thereby improving the yield rate. Furthermore, in the present invention, it is preferable that a knurled portion is formed on the width direction end of the first long optical film, and in the fifth step, the second identification information is printed on the first long optical film. The optical film is located at a portion of the long optical laminate located inward in the width direction from the knurled portion. Thereby, the second identification information and the unevenness of the knurled portion can be reliably distinguished and read.

又,為了解決上述課題,本發明亦提供一種長條光學積層體之檢查系統,該檢查系統之特徵在於具備:第1檢查裝置,其檢查第1長條光學膜,獲取上述第1長條光學膜之缺陷資訊即第1缺陷資訊;第1列印裝置,其於上述第1長條光學膜之長邊方向每隔特定間隔,將第1識別資訊列印於上述第1長條光學膜之寬度方向端部;第1運算記憶裝置,其將上述第1長條光學膜之上述第1缺陷資訊與上述第1識別資訊建立關聯並加以記憶;第2檢查裝置,其檢查積層有上述第1長條光學膜及第2長條光學膜之長條光學積層體,獲取上述長條光學積層體之缺陷資訊即第2缺陷資訊;第2列印裝置,其於上述長條光學積層體之長邊方向每隔特定間隔,將第2識別資訊列印於上述長條光學積層體之寬度方向端部;第2運算記憶裝置,其將上述長條光學積層體之上述第2缺陷資訊與上述第2識別資訊建立關聯並加以記憶;對於上述第1列印裝置所要列印之上述第1識別資訊、及上述第2列印裝置所要列印之上述第2識別資訊,藉由噴墨方式列印其中任一者,並藉由雷射刻印來列印另一者;或者,藉由使用透明墨水之噴墨方式列印其中任一者,並藉由使用有色墨水之噴墨方式列印另一者。 [發明之效果]In addition, in order to solve the above problems, the present invention also provides an inspection system for a long optical laminated body. The inspection system is characterized by including: a first inspection device that inspects the first long optical film to obtain the first long optical film. The defect information of the film is the first defect information; the first printing device prints the first identification information on the first long optical film at specific intervals in the longitudinal direction of the first long optical film. Width direction end portion; a first operation memory device that associates and memorizes the first defect information of the first long optical film with the first identification information; a second inspection device that inspects the first inspection layer The long optical laminate of the long optical film and the second long optical film obtains the defect information of the above long optical laminate, which is the second defect information; the second printing device is located on the length of the above long optical laminate. The second identification information is printed on the end of the width direction of the above-mentioned long optical laminated body at specific intervals in the edge direction; the second operation memory device combines the above-mentioned second defect information of the above-mentioned long optical laminated body with the above-mentioned second defect information. 2. The identification information is associated and memorized; the above-mentioned first identification information to be printed by the above-mentioned first printing device and the above-mentioned second identification information to be printed by the above-mentioned second printing device are printed by inkjet method Either of them, and print the other by laser engraving; or, print either of them by inkjet using transparent ink, and print the other by inkjet using colored ink. By. [Effects of the invention]

根據本發明,可於長條光學積層體之狀態下讀取列印於第1長條光學膜之第1識別資訊、及列印於長條光學積層體之第2識別資訊兩者,藉此可將缺陷資訊與識別資訊適當地建立關聯。According to the present invention, both the first identification information printed on the first long optical film and the second identification information printed on the long optical laminated body can be read in the state of the long optical laminated body. Defect information and identification information can be appropriately associated.

以下,適當參照隨附圖式,對本發明之一實施方式之長條光學積層體之檢查方法(以下適當簡稱為「檢查方法」)及長條光學積層體之檢查系統(以下適當簡稱為「檢查系統」)進行說明。 本實施方式之檢查方法之檢查對象即長條光學積層體係積層有第1長條光學膜及第2長條光學膜之膜。本實施方式中,以第1長條光學膜為保護膜、第2長條光學膜為偏光元件、長條光學積層體為偏光膜之情形為例進行說明。首先對長條光學積層體(偏光膜)之具體例進行說明。Hereinafter, with appropriate reference to the accompanying drawings, an inspection method for a long optical laminated body (hereinafter appropriately referred to as the "inspection method") and an inspection system for a long optical laminated body (hereinafter appropriately referred to as the "inspection method") according to one embodiment of the present invention will be described. System") for explanation. The inspection object of the inspection method of this embodiment is a film in which a first elongated optical film and a second elongated optical film are laminated in a elongated optical laminate system. In this embodiment, description will be given as an example in which the first elongated optical film is a protective film, the second elongated optical film is a polarizing element, and the elongated optical laminated body is a polarizing film. First, a specific example of the long optical laminated body (polarizing film) will be described.

<長條光學積層體> 作為長條光學積層體之偏光膜由包括以下步驟之製造方法製造而成:(A)將實施了染色處理、交聯處理及延伸處理之聚乙烯醇系膜乾燥,製造作為第2長條光學膜之偏光元件;(B)於第2長條光學膜(偏光元件)之單側或雙側貼合作為第1長條光學膜之保護膜;及(C)貼合後進行加熱處理。<Long optical laminate> The polarizing film as a long optical laminated body is produced by a manufacturing method including the following steps: (A) The polyvinyl alcohol-based film that has been dyed, cross-linked, and stretched is dried to produce a second long optical laminated body. The polarizing element of the film; (B) laminating on one or both sides of the second long optical film (polarizing element) as a protective film for the first long optical film; and (C) performing heat treatment after lamination.

聚乙烯醇系膜之染色處理、交聯處理、延伸處理等各種處理並非必須分別實施,亦可同時實施,又,各處理之順序亦可為任意順序。再者,作為聚乙烯醇系膜,亦可使用實施了膨潤處理之聚乙烯醇系膜。通常,將聚乙烯醇系膜浸漬於包含碘或二色性色素之溶液中,於使其吸附碘或二色性色素而染色後將其洗淨,於包含硼酸或硼砂等之溶液中以延伸倍率3倍~7倍進行單軸延伸後,使其乾燥。於包含碘或二色性色素之溶液中進行延伸後,於包含硼酸或硼砂等之溶液中進一步進行延伸(二級延伸)後,使其乾燥,藉此碘之配向變高,偏光度特性變好,故而特佳。The various treatments such as dyeing treatment, cross-linking treatment, and stretching treatment of the polyvinyl alcohol-based film do not have to be carried out separately, but can also be carried out at the same time, and the order of each treatment can also be arbitrary. Furthermore, as the polyvinyl alcohol-based film, a polyvinyl alcohol-based film subjected to swelling treatment can also be used. Usually, the polyvinyl alcohol-based film is immersed in a solution containing iodine or a dichroic dye, allowed to absorb the iodine or dichroic dye and dyed, then washed, and then stretched in a solution containing boric acid, borax, etc. After uniaxial stretching at a magnification of 3 to 7 times, it is dried. After extending in a solution containing iodine or a dichroic dye, further extending in a solution containing boric acid or borax (secondary extension), and then drying, the orientation of the iodine becomes higher and the polarization characteristics change. Good, so it is particularly good.

作為構成上述聚乙烯醇系膜之聚乙烯醇系聚合物,例如可列舉:使乙酸乙烯酯聚合後皂化而成者;或使乙酸乙烯酯與少量不飽和羧酸、不飽和磺酸、陽離子性單體等可共聚之單體進行共聚而成者等。聚乙烯醇系聚合物之平均聚合度並無限制,可任意使用,較佳為1000以上,更佳為2000~5000。又,聚乙烯醇系聚合物之皂化度較佳為85莫耳%以上,更佳為98~100莫耳%。Examples of the polyvinyl alcohol-based polymer constituting the polyvinyl alcohol-based film include vinyl acetate polymerized and then saponified; or vinyl acetate mixed with a small amount of unsaturated carboxylic acid, unsaturated sulfonic acid, cationic Monomers and other copolymerizable monomers are copolymerized. The average degree of polymerization of the polyvinyl alcohol-based polymer is not limited and can be used arbitrarily, but is preferably 1,000 or more, more preferably 2,000 to 5,000. Moreover, the degree of saponification of the polyvinyl alcohol-based polymer is preferably 85 mol% or more, more preferably 98 to 100 mol%.

製造之第2長條光學膜(偏光元件)之厚度通常為5~80 μm,但並不限定於此,又,對於調整第2長條光學膜(偏光元件)之厚度之方法亦並無特別限定,可使用拉幅機、輥延伸或壓延等通常之方法。The thickness of the second elongated optical film (polarizing element) produced is usually 5 to 80 μm, but is not limited thereto, and there is no particular method for adjusting the thickness of the second elongated optical film (polarizing element). If limited, common methods such as tenter, roll stretching or calendering can be used.

對於第2長條光學膜(偏光元件)與第1長條光學膜(保護膜)之貼合並無特別限定,例如,可經由包含乙烯醇系聚合物之接著劑、或者至少包含硼酸或硼砂、戊二醛或三聚氰胺、草酸等乙烯醇系聚合物之水溶性交聯劑的接著劑等進行。貼合第2長條光學膜(偏光元件)與第1長條光學膜(保護膜)之接著層係作為水溶液之塗佈乾燥層等形成,製備該水溶液時可視需要亦調配其他添加劑或酸等觸媒。The bonding of the second elongated optical film (polarizing element) and the first elongated optical film (protective film) is not particularly limited. For example, an adhesive containing a vinyl alcohol-based polymer, or an adhesive containing at least boric acid or borax, can be used. Adhesives such as glutaraldehyde, water-soluble cross-linking agents of vinyl alcohol polymers such as melamine and oxalic acid are used. The adhesive layer for bonding the second long optical film (polarizing element) and the first long optical film (protective film) is formed as a coating dry layer of an aqueous solution. When preparing the aqueous solution, other additives or acids may also be prepared as needed. Catalyst.

貼合於第2長條光學膜(偏光元件)之單側或雙側之第1長條光學膜(保護膜)可使用適當之透明膜。其中,較佳為使用包含透明性、機械強度、熱穩定性、防水性等優異之聚合物之膜。作為該聚合物,可列舉:三乙醯纖維素等乙酸系樹脂、聚碳酸酯系樹脂、聚芳酯、聚對苯二甲酸乙二酯等聚酯系樹脂、聚醯亞胺系樹脂、聚碸系樹脂、聚醚碸系樹脂、聚苯乙烯系樹脂、聚乙烯、聚丙烯等聚烯烴系樹脂、聚乙烯醇系樹脂、聚氯乙烯系樹脂、聚降𦯉烯系樹脂、(甲基)丙烯酸系樹脂、聚甲基丙烯酸甲酯系樹脂、液晶聚合物等。膜可為藉由流延法、壓光法、擠出法中之任一方法製造而成者。An appropriate transparent film can be used for the first long optical film (protective film) attached to one or both sides of the second long optical film (polarizing element). Among them, it is preferable to use a film containing a polymer excellent in transparency, mechanical strength, thermal stability, water resistance, etc. Examples of the polymer include acetate-based resins such as triacetyl cellulose, polycarbonate-based resins, polyarylates, polyester-based resins such as polyethylene terephthalate, polyimide-based resins, polyimide-based resins, and polyester-based resins. Polyolefin-based resins, polyether-based resins, polystyrene-based resins, polyolefin-based resins such as polyethylene and polypropylene, polyvinyl alcohol-based resins, polyvinyl chloride-based resins, polynorphenyl-based resins, (methyl) Acrylic resin, polymethyl methacrylate resin, liquid crystal polymer, etc. The film can be produced by any method among casting method, calendering method, and extrusion method.

又,亦可列舉日本專利特開2001-343529號公報(WO01/37007)中所記載之聚合物膜、例如含有(A)於側鏈具有經取代及/或未經取代之亞胺基之熱塑性樹脂、及(B)於側鏈具有經取代及/或未經取代之苯基以及腈基之熱塑性樹脂的樹脂組合物。作為具體例,可列舉含有由異丁烯與N-甲基順丁烯二醯亞胺所構成之交替共聚物、及丙烯腈-苯乙烯共聚物之樹脂組合物之膜。作為膜,可使用包含樹脂組合物之混合擠出品等之膜。該等膜由於相位差較小且光彈性係數較小,故可消除由長條光學積層體(偏光膜)之應變所導致之不均等不良情況,又由於透濕度較小,故加濕耐久性優異。Furthermore, polymer films described in Japanese Patent Application Laid-Open No. 2001-343529 (WO01/37007), for example, include thermoplastic films containing (A) a substituted and/or unsubstituted imine group in the side chain. Resin, and (B) a resin composition of a thermoplastic resin having a substituted and/or unsubstituted phenyl group and a nitrile group in the side chain. Specific examples include a film containing a resin composition composed of an alternating copolymer of isobutylene and N-methylmaleimide and an acrylonitrile-styrene copolymer. As the film, a film containing a mixed extruded product of the resin composition or the like can be used. Since these films have a small phase difference and a small photoelastic coefficient, they can eliminate uneven defects caused by the strain of the long optical laminate (polarizing film), and because the moisture permeability is small, they have excellent humidification durability. Excellent.

又,第1長條光學膜(保護膜)較佳為儘可能無色。因此,較佳為使用Rth=[(nx+ny)/2‒nz]・d(其中,nx、ny為膜平面內之主折射率,nz為膜厚方向之折射率,d為膜厚)所示之膜厚方向之相位差值為-90 nm~+75 nm之第1長條光學膜(保護膜)。藉由使用厚度方向之相位差值(Rth)為-90 nm~+75 nm者,可基本消除由第1長條光學膜(保護膜)引起之長條光學積層體(偏光膜)之著色(光學性著色)。厚度方向之相位差值(Rth)進而較佳為-80 nm~+60 nm,特佳為-70 nm~+45 nm。Moreover, it is preferable that the 1st long optical film (protective film) is as colorless as possible. Therefore, it is better to use Rth=[(nx+ny)/2‒nz]·d (where nx and ny are the principal refractive index in the film plane, nz is the refractive index in the film thickness direction, and d is the film thickness). The first long optical film (protective film) with a phase difference value in the film thickness direction of -90 nm to +75 nm. By using a phase difference value (Rth) in the thickness direction of -90 nm to +75 nm, the coloring of the long optical laminate (polarizing film) caused by the first long optical film (protective film) can be basically eliminated ( optical coloring). The phase difference value (Rth) in the thickness direction is preferably -80 nm to +60 nm, and particularly preferably -70 nm to +45 nm.

作為第1長條光學膜(保護膜),就偏光特性或耐久性等方面而言,較佳為(甲基)丙烯酸系樹脂。又,較佳為三乙醯纖維素等乙酸酯系樹脂,特佳為表面用鹼等進行了皂化處理之三乙醯纖維素膜。再者,於在第2長條光學膜(偏光元件)之兩側貼合第1長條光學膜(保護膜)之情形時,於其正背亦可使用包含不同聚合物之第1長條光學膜(保護膜)。As the first long optical film (protective film), a (meth)acrylic resin is preferred in terms of polarization characteristics, durability, and the like. In addition, an acetate resin such as triacetyl cellulose is preferred, and a triacetyl cellulose film whose surface has been saponified with an alkali or the like is particularly preferred. Furthermore, when the first long optical film (protective film) is bonded to both sides of the second long optical film (polarizing element), the first long strip containing different polymers can also be used on the front and back. Optical film (protective film).

第1長條光學膜(保護膜)之厚度為任意厚度,通常為了實現長條光學積層體(偏光膜)之薄型化等而為500 μm以下,較佳為1~300 μm,特佳為5~200 μm。The thickness of the first long optical film (protective film) is arbitrary, but is usually 500 μm or less, preferably 1 to 300 μm, particularly preferably 5 μm, in order to achieve thinning of the long optical laminated body (polarizing film). ~200 μm.

第1長條光學膜(保護膜)只要不妨礙本發明之目的,亦可實施硬塗處理及防反射處理、以抗沾黏、擴散及防眩等為目的之處理等。硬塗處理係為了防止長條光學積層體(偏光膜)之表面之損傷等而實施者,例如可藉由將硬化皮膜附加於第1長條光學膜(保護膜)之表面之方式等形成,該硬化皮膜係藉由矽酮系等適當之紫外線硬化型樹脂而獲得優異之硬度或滑動性等。As long as the first long optical film (protective film) does not interfere with the purpose of the present invention, it may also be subjected to hard coating treatment, anti-reflection treatment, anti-sticking, diffusion and anti-glare treatment, etc. The hard coating treatment is performed to prevent damage to the surface of the long optical laminate (polarizing film). For example, it can be formed by attaching a hardened film to the surface of the first long optical film (protective film). The cured film is made of an appropriate ultraviolet curable resin such as silicone to obtain excellent hardness, sliding properties, etc.

另一方面,防反射處理係為了防止外界光於長條光學積層體(偏光膜)之表面發生反射而實施者,可藉由依據先前方法形成防反射膜等來達成。又,抗沾黏係為了防止與鄰接層之密接而實施者,防眩處理係為了防止外界光於長條光學積層體(偏光膜)之表面發生反射而妨礙長條光學積層體(偏光膜)透射光之視認而實施者,例如可藉由以下方法形成:以藉由噴砂方式或壓紋加工方式等之表面粗糙化方式或調配透明微粒子之方式等適當方式對第1長條光學膜(保護膜)之表面賦予微細凹凸結構。On the other hand, the anti-reflection treatment is performed to prevent external light from being reflected on the surface of the long optical laminate (polarizing film), and can be achieved by forming an anti-reflection film according to a conventional method. In addition, the anti-adhesive treatment is performed to prevent close contact with the adjacent layer, and the anti-glare treatment is performed to prevent external light from being reflected on the surface of the long optical laminated body (polarizing film) and thus hindering the long optical laminated body (polarizing film). Visibility of transmitted light can be achieved, for example, by the following method: surface roughening by sandblasting or embossing, or mixing of transparent fine particles, or other appropriate methods. The surface of the film) is given a fine uneven structure.

上述透明微粒子例如可列舉平均粒徑為0.5~20 μm之氧化矽及氧化鋁、二氧化鈦及氧化鋯、氧化錫及氧化銦、氧化鎘及氧化銻等,可使用具有導電性之無機系微粒子,又,可使用包含交聯或未交聯之聚合物粒狀物等之有機系微粒子等。通常透明微粒子之使用量為每100質量份之透明樹脂為2~70質量份,尤其是5~50質量份。Examples of the above-mentioned transparent fine particles include silicon oxide and aluminum oxide, titanium dioxide and zirconium oxide, tin oxide and indium oxide, cadmium oxide and antimony oxide with an average particle diameter of 0.5 to 20 μm. Inorganic fine particles with conductivity can be used. , organic microparticles including crosslinked or uncrosslinked polymer granules, etc. can be used. Usually, the usage amount of transparent microparticles is 2 to 70 parts by mass, especially 5 to 50 parts by mass per 100 parts by mass of transparent resin.

進而,調配透明微粒子之防眩層可作為透明保護層本身或對透明保護層表面之塗佈層等而設置。防眩層亦可兼作用以使長條光學積層體(偏光膜)透射光擴散而擴大視角之擴散層(視角補償功能等)。再者,上述防反射層及抗沾黏層、擴散層及防眩層等亦可作為包含設置有該等層之片材等之光學層與透明保護層分開設置。Furthermore, the anti-glare layer containing transparent fine particles may be provided as the transparent protective layer itself or as a coating layer on the surface of the transparent protective layer. The anti-glare layer can also serve as a diffusion layer (viewing angle compensation function, etc.) that diffuses the light transmitted through the long optical laminate (polarizing film) and expands the viewing angle. Furthermore, the above-mentioned anti-reflection layer, anti-adhesion layer, diffusion layer, anti-glare layer, etc. can also be provided separately as an optical layer and a transparent protective layer including a sheet provided with these layers.

<本實施方式之檢查方法> 以下,對本實施方式之檢查方法進行說明。 圖1係表示本實施方式之檢查方法之概略步驟之流程圖。如圖1所示,本實施方式之檢查方法包括:於第1長條光學膜(保護膜)之製造步驟中執行之步驟S1~S4、及於長條光學積層體(偏光膜)之製造步驟中執行之步驟S5~S12。以下,依序對各步驟進行說明。<Inspection method of this embodiment> Hereinafter, the inspection method of this embodiment will be described. FIG. 1 is a flowchart showing the schematic steps of the inspection method according to this embodiment. As shown in FIG. 1 , the inspection method of this embodiment includes: steps S1 to S4 performed in the manufacturing step of the first long optical film (protective film), and the manufacturing step of the long optical laminated body (polarizing film). Steps S5 to S12 are executed in the process. Below, each step is explained in order.

[於第1長條光學膜之製造步驟中執行之步驟] 於第1長條光學膜之製造步驟中執行第1步驟S2~第3步驟S4。又,本實施方式中,執行滾紋加工步驟S1。[Steps performed in the manufacturing step of the first long optical film] In the manufacturing step of the first elongated optical film, the first step S2 to the third step S4 are performed. Furthermore, in this embodiment, the knurl processing step S1 is performed.

(滾紋加工步驟S1) 滾紋加工步驟S1中,於第1長條光學膜之寬度方向端部實施滾紋加工而形成滾紋加工部。滾紋加工之具體內容例如如專利文獻2所記載,已眾所周知,故此處省略詳細說明。(Rolling processing step S1) In the knurl processing step S1, knurl processing is performed on the width direction end portion of the first elongated optical film to form a knurled portion. The specific details of knurl processing are as described in Patent Document 2, for example, and are well known, so the detailed description is omitted here.

(第1步驟S2) 圖2係模式性地表示用以執行第1步驟S2~第3步驟S4之檢查系統之概略構成的立體圖。 如圖2所示,第1步驟S2中,檢查系統100所具備之第1檢查裝置1檢查由搬送捲筒R以卷對卷方式搬送(朝向圖2中粗實線箭頭所示之方向搬送)之第1長條光學膜F1,獲取第1長條光學膜F1之缺陷資訊即第1缺陷資訊。 第1檢查裝置1具備:攝像機構1a,其與第1長條光學膜F1之正面對向配置;及圖像處理機構1b,其與攝像機構1a電性連接,對攝像機構1a所獲取之第1長條光學膜F1之正面之拍攝圖像實施適當之圖像處理。作為攝像機構1a,可使用沿著第1長條光學膜F1之寬度方向呈直線狀地配置攝像元件之線感測器、或呈矩陣狀地配置攝像元件之區域傳感器。攝像機構1a之視野為第1長條光學膜F1之有效寬度(用於製品之寬度)以上。圖像處理機構1b藉由對拍攝圖像實施二值化等公知之圖像處理,提取與第1長條光學膜F1所存在之缺陷相對應之像素區域。並且,圖像處理機構1b特定出拍攝圖像中之缺陷位置(與缺陷相對應之像素區域之座標),獲取至少包含特定出之缺陷位置之資訊作為第1缺陷資訊。將獲取之第1缺陷資訊輸入至檢查系統100所具備之第1運算記憶裝置4。(Step 1 S2) FIG. 2 is a perspective view schematically showing the schematic configuration of the inspection system for executing the first step S2 to the third step S4. As shown in FIG. 2 , in the first step S2 , the first inspection device 1 provided in the inspection system 100 inspects the conveyance by the conveyance drum R in a roll-to-roll manner (conveyance in the direction indicated by the thick solid line arrow in FIG. 2 ). The first long optical film F1 is used to obtain the defect information of the first long optical film F1, which is the first defect information. The first inspection device 1 is provided with: a camera mechanism 1a, which is arranged to face the front surface of the first elongated optical film F1; and an image processing mechanism 1b, which is electrically connected to the camera mechanism 1a. 1. Perform appropriate image processing on the photographed image of the front side of the long optical film F1. As the imaging mechanism 1a, a line sensor in which imaging elements are arranged linearly along the width direction of the first elongated optical film F1, or an area sensor in which imaging elements are arranged in a matrix can be used. The field of view of the imaging mechanism 1a is equal to or larger than the effective width of the first long optical film F1 (the width used for the product). The image processing unit 1b performs known image processing such as binarization on the captured image, thereby extracting the pixel area corresponding to the defect present in the first long optical film F1. Furthermore, the image processing mechanism 1b specifies the defect position (coordinates of the pixel area corresponding to the defect) in the captured image, and acquires information including at least the specified defect position as the first defect information. The acquired first defect information is input to the first operation memory device 4 provided in the inspection system 100 .

(第2步驟S3) 第2步驟S3中,檢查系統100所具備之第1列印裝置2於第1長條光學膜F1之長邊方向每隔特定間隔(例如1 m之等間隔),將第1識別資訊M列印於第1長條光學膜F1之寬度方向端部(較佳為滾紋加工部)。圖2中圖示出從第1長條光學膜F1之前端側(搬送方向下游側)依序列印有第1識別資訊M1~M3之例。 第1識別資訊M為至少包含特定第1長條光學膜F1之長邊方向位置的資訊之資訊。第1識別資訊M例如係藉由二維碼或條碼表示從第1長條光學膜F1之前端側依序增加或減少之數值(利用該數值特定第1長條光學膜F1之長邊方向位置)。第1識別資訊M中,除特定第1長條光學膜F1之長邊方向位置的資訊之外,亦可包含列印之日期時間、第1長條光學膜F1之製造編號、列印之步驟之類別等各種附帶資訊。(Step 2 S3) In the second step S3, the first printing device 2 provided in the inspection system 100 prints the first identification information M in columns at specific intervals (for example, equal intervals of 1 m) in the longitudinal direction of the first long optical film F1. Printed on the width direction end portion (preferably the knurled portion) of the first long optical film F1. FIG. 2 illustrates an example in which the first identification information M1 to M3 are printed in sequence from the front end side (downstream side in the conveyance direction) of the first long optical film F1. The first identification information M is information including at least information specifying the position in the longitudinal direction of the first long optical film F1. The first identification information M is, for example, a QR code or a barcode that represents a numerical value that increases or decreases sequentially from the front end side of the first long optical film F1 (the numerical value is used to specify the longitudinal position of the first long optical film F1 ). In addition to the information specifying the longitudinal position of the first long optical film F1, the first identification information M may also include the date and time of printing, the manufacturing number of the first long optical film F1, and the printing steps. categories and other accompanying information.

本實施方式中,利用第1列印裝置2進行之第1識別資訊M之列印受第1運算記憶裝置4控制。具體而言,藉由使用旋轉編碼器等之測距器3,測定第1長條光學膜F1之朝向搬送方向之移動量,並輸入至第1運算記憶裝置4。第1運算記憶裝置4基於從測距器3所輸入之移動量,每隔特定間隔對第1列印裝置2發送控制信號,從而使第1列印裝置2每隔特定間隔列印第1識別資訊M。 再者,本實施方式中,以第1運算記憶裝置4亦具有控制第1列印裝置2之功能之情形為例進行了說明,但本發明並不限定於此,亦可採用由第1運算記憶裝置4以外之其他控制裝置控制第1列印裝置2之構成。In this embodiment, the printing of the first identification information M by the first printing device 2 is controlled by the first operation and memory device 4 . Specifically, the movement amount of the first elongated optical film F1 in the conveyance direction is measured using a distance meter 3 such as a rotary encoder, and is input to the first calculation memory device 4 . The first operation memory device 4 sends a control signal to the first printing device 2 at specific intervals based on the movement amount input from the distance meter 3, so that the first printing device 2 prints the first identification at specific intervals. InformationM. Furthermore, in this embodiment, the case where the first operation memory device 4 also has the function of controlling the first printing device 2 is taken as an example. However, the present invention is not limited to this, and the first operation memory device 4 may also be used. A control device other than the memory device 4 controls the configuration of the first printing device 2 .

本實施方式之第1列印裝置2藉由噴墨方式列印第1識別資訊M。作為較佳之形態,本實施方式之第1列印裝置2係藉由使用透明墨水之噴墨方式列印第1識別資訊M。具體而言,本實施方式中藉由使用UV墨水作為透明墨水之噴墨方式列印第1識別資訊M,該UV墨水藉由照射紫外線而發出螢光。 作為第1列印裝置2,例如可使用Videojet公司製造之噴墨印表機「VJ1000系列」或日立產機公司製造之噴墨印表機「Gravis UX系列」。The first printing device 2 of this embodiment prints the first identification information M by using an inkjet method. As a preferred form, the first printing device 2 of this embodiment prints the first identification information M by using an inkjet method using transparent ink. Specifically, in this embodiment, the first identification information M is printed by an inkjet method using UV ink as a transparent ink, and the UV ink emits fluorescence by irradiating ultraviolet rays. As the first printing device 2, for example, an inkjet printer "VJ1000 series" manufactured by Videojet Corporation or an inkjet printer "Gravis UX series" manufactured by Hitachi Industrial Machinery Co., Ltd. can be used.

(第3步驟S4) 第3步驟S4中,第1運算記憶裝置4將第1長條光學膜F1之第1缺陷資訊與第1識別資訊M建立關聯並加以記憶。具體如下所述。 例如,第1檢查裝置1檢測出圖2所示之缺陷D1,並特定出拍攝圖像中缺陷D1之位置(與缺陷D1相對應之像素區域之座標),將其作為第1缺陷資訊輸入至第1運算記憶裝置4。因已從測距器3對第1運算記憶裝置4輸入有第1長條光學膜F1之朝向搬送方向之移動量,故第1運算記憶裝置4可掌握檢測出缺陷D1之時點(特定出拍攝圖像中與缺陷D1相對應之像素區域之座標的時點)與利用第1列印裝置2列印第1識別資訊M之時點之間,第1長條光學膜F1於搬送方向上移動之距離。基於第1長條光學膜F1於該兩時點間之移動量及拍攝圖像中與缺陷D1相對應之像素區域之座標,第1運算記憶裝置4可計算出從特定之第1識別資訊M(圖2所示之例中為第1識別資訊M3)至缺陷D1之距離(沿著第1長條光學膜F1之長邊方向之距離)X1。又,第1運算記憶裝置4基於拍攝圖像中與缺陷D1相對應之像素區域之座標,可計算出從第1長條光學膜F1之寬度方向之邊緣至缺陷D1之距離(沿著第1長條光學膜F1之寬度方向之距離)Y1。第1運算記憶裝置4將至少該第1識別資訊M(M3)與以第1識別資訊M(M3)為基準之缺陷D1之座標(X1,Y1)建立關聯並加以記憶。(Step 3 S4) In the third step S4, the first operation and memory device 4 associates the first defect information of the first elongated optical film F1 with the first identification information M and stores them. Details are as follows. For example, the first inspection device 1 detects the defect D1 shown in Figure 2, specifies the position of the defect D1 in the captured image (the coordinates of the pixel area corresponding to the defect D1), and inputs this as the first defect information to The first operation memory device 4. Since the amount of movement of the first long optical film F1 in the conveyance direction has been input to the first arithmetic memory device 4 from the rangefinder 3, the first arithmetic memory device 4 can grasp the time when the defect D1 is detected (specified photographing). The distance between the coordinates of the pixel area corresponding to the defect D1 in the image) and the time when the first identification information M is printed by the first printing device 2, the distance that the first long optical film F1 moves in the conveying direction . Based on the movement amount of the first long optical film F1 between the two points in time and the coordinates of the pixel area corresponding to the defect D1 in the captured image, the first operation memory device 4 can calculate the specific first identification information M ( In the example shown in FIG. 2 , it is the distance X1 from the first identification information M3) to the defect D1 (the distance along the long side direction of the first long optical film F1). Furthermore, the first arithmetic memory device 4 can calculate the distance from the edge of the first elongated optical film F1 in the width direction to the defect D1 (along the first elongated optical film F1) based on the coordinates of the pixel area corresponding to the defect D1 in the captured image. The distance in the width direction of the long optical film F1) Y1. The first operation memory device 4 associates and memorizes at least the first identification information M (M3) with the coordinates (X1, Y1) of the defect D1 based on the first identification information M (M3).

[於長條光學積層體之製造步驟中執行之步驟] 將於上述製造步驟中製造之第1長條光學膜(第1識別資訊M以噴墨方式列印於滾紋加工部之第1長條光學膜)F1捲繞為卷狀,製成素材捲筒。將已製成素材捲筒之第1長條光學膜F1搬運至長條光學積層體之製造步驟。於長條光學積層體之製造步驟使用被搬運來之第1長條光學膜F1之素材捲筒。 如圖1所示,本實施方式之長條光學積層體之製造步驟包括No.1步驟及No.2步驟。本實施方式之長條光學積層體之製造步驟中,於No.1步驟中執行第4步驟S6~第7步驟S9後,再於No.2步驟中執行第4步驟S11及第6步驟S12。又,本實施方式之長條光學積層體之製造步驟中,於No.1步驟中執行貼合步驟S5,於No.2步驟中執行讀取步驟S10。[Steps performed in the manufacturing process of the long optical laminated body] The first long optical film F1 produced in the above manufacturing steps (the first identification information M is printed on the first long optical film in the rolling processing section by inkjet method) is rolled into a roll to form a material roll. cylinder. The first long optical film F1 that has been produced as a material roll is conveyed to the manufacturing step of the long optical laminated body. In the manufacturing step of the long optical laminated body, the transported material roll of the first long optical film F1 is used. As shown in FIG. 1 , the manufacturing steps of the long optical laminated body of this embodiment include step No. 1 and step No. 2. In the manufacturing process of the long optical laminated body of this embodiment, after performing the 4th step S6 to the 7th step S9 in step No. 1, the 4th step S11 and the 6th step S12 are performed in step No. 2. Moreover, in the manufacturing process of the long optical laminated body of this embodiment, the bonding step S5 is performed in step No. 1, and the reading step S10 is performed in step No. 2.

(貼合步驟S5) 於No.1步驟中,將第1長條光學膜(保護膜)F1之素材捲筒捲出,並將第2長條光學膜(偏光元件)之素材捲筒捲出。之後,於貼合步驟S5中,如上所述經由接著劑等將第1長條光學膜F1貼合於第2長條光學膜之單側或雙側,從而獲得積層第1長條光學膜F1及第2長條光學膜而成之長條光學積層體(偏光膜)F2。(Laying step S5) In step No. 1, the material roll of the first long optical film (protective film) F1 is rolled out, and the material roll of the second long optical film (polarizing element) is rolled out. Thereafter, in the bonding step S5, the first elongated optical film F1 is bonded to one or both sides of the second elongated optical film via an adhesive or the like as described above, thereby obtaining the laminated first elongated optical film F1 and a long optical laminate (polarizing film) F2 made of a second long optical film.

(第4步驟S6) 圖3係模式性地表示用以執行第4步驟S6~第6步驟S8之檢查系統之概略構成的立體圖。 如圖3所示,第4步驟S6中,檢查系統100所具備之第2檢查裝置5檢查藉由搬送捲筒R以卷對卷方式搬送(朝向圖3中粗實線箭頭所示之方向搬送)之長條光學積層體F2,獲取長條光學積層體F2之缺陷資訊即第2缺陷資訊。 第2檢查裝置5與圖2所示之第1檢查裝置1同樣地具備攝像機構5a及圖像處理機構5b,且具有與第1檢查裝置1同樣之功能,故此處省略詳細說明。第2檢查裝置5特定出拍攝圖像中之缺陷位置(與缺陷相對應之像素區域之座標),從而獲取至少包含特定出之缺陷位置之資訊作為第2缺陷資訊。將所獲取之第2缺陷資訊輸入至檢查系統100所具備之第2運算記憶裝置8。(Step 4 S6) FIG. 3 is a perspective view schematically showing the schematic configuration of the inspection system for executing the fourth step S6 to the sixth step S8. As shown in FIG. 3 , in the fourth step S6 , the second inspection device 5 provided in the inspection system 100 inspects the conveyance by the conveyance roll R in a roll-to-roll manner (conveyance in the direction indicated by the thick solid line arrow in FIG. 3 ) of the long optical laminated body F2, the defect information of the long optical laminated body F2, which is the second defect information, is obtained. The second inspection device 5 is equipped with a camera mechanism 5 a and an image processing mechanism 5 b like the first inspection device 1 shown in FIG. 2 , and has the same functions as the first inspection device 1 , so detailed description is omitted here. The second inspection device 5 specifies the defect position (coordinates of the pixel area corresponding to the defect) in the captured image, thereby acquiring information including at least the specified defect position as second defect information. The acquired second defect information is input to the second operation memory device 8 provided in the inspection system 100 .

(第5步驟S7) 第5步驟S7中,檢查系統100所具備之第2列印裝置6於長條光學積層體F2之長邊方向每隔特定間隔(例如1 m之等間隔),將第2識別資訊N列印於長條光學積層體F2之寬度方向端部(較佳為第1長條光學膜F1之位於較滾紋加工部更靠寬度方向內側之長條光學積層體F2之部位)。圖3圖示出從長條光學積層體F2之前端側(搬送方向下游側)依序列印有第2識別資訊N1~N3之例。再者,實際上,第1識別資訊M係列印於構成長條光學積層體F2之第1長條光學膜F1,圖3中為了方便起見省略了第1識別資訊M之圖示。 第2識別資訊N至少包含特定長條光學積層體F2之長邊方向位置之資訊,而第1識別資訊M至少包含特定第1長條光學膜F1之長邊方向位置之資訊,第2識別資訊N與第1識別資訊M除此以外並無不同,故此處省略詳細說明。(Step 5 S7) In the fifth step S7, the second printing device 6 provided in the inspection system 100 prints the second identification information N at specific intervals (for example, equal intervals of 1 m) in the longitudinal direction of the long optical laminated body F2. At the width direction end portion of the long optical laminated body F2 (preferably, the portion of the first long optical film F1 located inside the long optical laminated body F2 in the width direction than the knurled portion). FIG. 3 illustrates an example in which the second identification information N1 to N3 are sequentially printed from the front end side (downstream side in the conveyance direction) of the long optical laminated body F2. Furthermore, in fact, the first identification information M series is printed on the first long optical film F1 constituting the long optical laminate F2, and the illustration of the first identification information M is omitted in FIG. 3 for the sake of convenience. The second identification information N at least includes information on the longitudinal position of the specific long optical laminate F2, and the first identification information M at least includes information on the specific longitudinal position of the first long optical film F1. The second identification information N is the same as the first identification information M except for this, so the detailed description is omitted here.

再者,本實施方式中,列印於長條光學積層體F2之第2識別資訊N被列印於同樣列印有第1識別資訊M之第1長條光學膜F1,但本發明並不限定於此。 例如,於在第2長條光學膜(偏光元件)之雙側貼合第1長條光學膜(保護膜)F1而形成長條光學積層體(偏光膜)F2之情形時,亦可將第1識別資訊M列印於其中一個第1長條光學膜(保護膜)F1,而將第2識別資訊N列印於未列印第1識別資訊M之另一個第1長條光學膜F1(保護膜,亦可兼作相位差膜)。 又,例如,於第2長條光學膜(偏光元件)之雙側貼合第1長條光學膜(保護膜)F1,進而於其中一個第1長條光學膜貼合相位差膜而形成長條光學積層體(附相位差功能之偏光膜)F2之情形時,亦可將第1識別資訊M列印於另一個第1長條光學膜(保護膜)F1,將第2識別資訊N列印於相位差膜。Furthermore, in this embodiment, the second identification information N printed on the long optical laminated body F2 is printed on the first long optical film F1 on which the first identification information M is also printed. However, the present invention does not Limited to this. For example, when the first elongated optical film (protective film) F1 is bonded to both sides of the second elongated optical film (polarizing element) to form a elongated optical laminated body (polarizing film) F2, the second elongated optical film (polarizing element) may be 1. The identification information M is printed on one of the first long optical films (protective films) F1, and the second identification information N is printed on the other first long optical film F1 (which does not print the first identification information M). Protective film, can also double as retardation film). Also, for example, the first elongated optical film (protective film) F1 is bonded to both sides of the second elongated optical film (polarizing element), and a retardation film is further bonded to one of the first elongated optical films to form a long optical film. In the case of a strip of optical laminate (polarizing film with phase difference function) F2, the first identification information M can also be printed on another first strip of optical film (protective film) F1, and the second identification information N can be printed Printed on phase difference film.

利用第1列印裝置2進行之第1識別資訊M之列印係藉由第1運算記憶裝置4控制,同樣地,利用第2列印裝置6進行之第2識別資訊N之列印係藉由第2運算記憶裝置8控制。具體之控制內容與藉由第1列印裝置2進行之對第1識別資訊M之列印之控制相同,故此處省略詳細說明。The printing of the first identification information M using the first printing device 2 is controlled by the first operation memory device 4. Similarly, the printing of the second identification information N using the second printing device 6 is controlled by It is controlled by the second operation memory device 8 . The specific control content is the same as the control of printing the first identification information M by the first printing device 2, so the detailed description is omitted here.

本實施方式之第2列印裝置6與第1列印裝置2不同,係藉由雷射刻印列印第2識別資訊N。作為第2列印裝置6,例如可應用各種公知之列印裝置,該等列印裝置具有使用CO2 雷射藉由雷射刻印來進行列印之功能,故此處省略詳細說明。The second printing device 6 of this embodiment is different from the first printing device 2 in that it prints the second identification information N by laser marking. As the second printing device 6, for example, various known printing devices can be applied. These printing devices have the function of printing by laser marking using CO2 laser, so detailed description is omitted here.

(第6步驟S8) 第6步驟S8中,第2運算記憶裝置8將長條光學積層體F2之第2缺陷資訊與第2識別資訊N建立關聯並加以記憶。具體而言,與第1運算記憶裝置4將第1長條光學膜F1之第1缺陷資訊與第1識別資訊M建立關聯並加以記憶時之順序相同,故省略詳細說明,而第2運算記憶裝置8係使用從具有與測距器3相同構成之測距器7所輸入之長條光學積層體F2之朝向搬送方向之移動量,將至少第2識別資訊N(圖3所示之例中為第2識別資訊N3)與以第2識別資訊N(N3)為基準之缺陷D2之座標(X2,Y2)建立關聯並加以記憶。(Step 6 S8) In step 6 S8, the second computing memory device 8 associates the second defect information of the long optical laminate F2 with the second identification information N and stores it. Specifically, the first operation and memory device 4 associates and memorizes the first defect information of the first strip optical film F1 with the first identification information M in the same order, so detailed description is omitted. The second operation and memory device 8 uses the movement amount of the strip optical laminate F2 in the conveying direction input from the rangefinder 7 having the same structure as the rangefinder 3 to associate and memorize at least the second identification information N (the second identification information N3 in the example shown in Figure 3) with the coordinates (X2, Y2) of the defect D2 based on the second identification information N (N3).

(第7步驟S9) 圖4係模式性地表示用以執行第7步驟S9之檢查系統之概略構成的立體圖。 第7步驟S9中,第2運算記憶裝置8將第1長條光學膜F1之第1缺陷資訊與長條光學積層體F2之第2識別資訊建立關聯並加以記憶。具體而言,配置有用以讀取第1識別資訊M(圖4中圖示出第1識別資訊M1~M3)之第1讀取裝置9、及用以讀取第2識別資訊N(圖4中圖示出第2識別資訊N1~N3)之第2讀取裝置10,將第1讀取裝置9所讀取之第1識別資訊M、及第2讀取裝置10所讀取之第2識別資訊N輸入至第2運算記憶裝置8。此處,於第2運算記憶裝置8中已經預先輸入並記憶有第1運算記憶裝置4中記憶之第1長條光學膜F1之第1缺陷資訊與第1識別資訊M之關聯(第1識別資訊M與以第1識別資訊M為基準之缺陷之座標的關係)。輸入第1缺陷資訊與第1識別資訊M之關聯時,可將第1運算記憶裝置4與第2運算記憶裝置8電性連接,從第1運算記憶裝置4發送至第2運算記憶裝置8,亦可從第1運算記憶裝置4下載並手動輸入至第2運算記憶裝置8。又,從具有與測距器3相同構成之測距器11對第2運算記憶裝置8輸入長條光學積層體F2之朝向搬送方向之移動量。(Step 7 S9) FIG. 4 is a perspective view schematically showing the schematic structure of the inspection system for executing the seventh step S9. In the seventh step S9, the second operation memory device 8 associates the first defect information of the first long optical film F1 with the second identification information of the long optical laminated body F2 and stores them. Specifically, a first reading device 9 for reading the first identification information M (the first identification information M1 to M3 is shown in FIG. 4 ) and a first reading device 9 for reading the second identification information N (FIG. 4 The middle figure shows the second reading device 10 of the second identification information N1-N3), which combines the first identification information M read by the first reading device 9 and the second reading device 10. The identification information N is input to the second operation storage device 8 . Here, the correlation between the first defect information of the first long optical film F1 stored in the first operation memory device 4 and the first identification information M (first identification information) has been input and stored in the second operation memory device 8 in advance. The relationship between the information M and the coordinates of the defect based on the first identification information M). When the correlation between the first defect information and the first identification information M is input, the first operational memory device 4 and the second operational memory device 8 can be electrically connected, and the first operational memory device 4 can be sent to the second operational memory device 8. It can also be downloaded from the first operation storage device 4 and manually input to the second operation storage device 8 . Furthermore, the amount of movement of the long optical laminated body F2 in the conveyance direction is input to the second arithmetic storage device 8 from the rangefinder 11 having the same configuration as the rangefinder 3 .

第2運算記憶裝置8基於從測距器11所輸入之長條光學積層體F2之朝向搬送方向之移動量,可掌握第1讀取裝置9讀取第1識別資訊M之時點(第1識別資訊M被輸入至第2運算記憶裝置8之時點)與第2讀取裝置10讀取第2識別資訊N之時點(第2識別資訊N被輸入至第2運算記憶裝置8之時點)之間,長條光學積層體F2於搬送方向上移動之距離。基於長條光學積層體F2於該兩時點間之移動量,第2運算記憶裝置8可計算出第1識別資訊M與第2識別資訊N沿著長條光學積層體F2之長邊方向之位置偏移(圖4所示之例中為第1識別資訊M3與第2識別資訊N3之位置偏移dX)。 因此,第2運算記憶裝置8可基於預先記憶之第1長條光學膜F1之第1缺陷資訊與第1識別資訊M之關聯、以及所計算出第1識別資訊M及第2識別資訊N之位置偏移,將第1長條光學膜F1之第1缺陷資訊與長條光學積層體F2之第2識別資訊N建立關聯並加以記憶。換言之,可將第2識別資訊N與以第2識別資訊N為基準之缺陷之座標建立關聯並加以記憶。如此,藉由執行第7步驟S9,可基於長條光學積層體F2之第2識別資訊N,統籌管理第1缺陷資訊及第2缺陷資訊。 將執行第7步驟S9後之長條光學積層體F2捲繞為卷狀並搬運至No.2步驟。The second operation memory device 8 can grasp the time when the first reading device 9 reads the first identification information M (first identification Between the time when the information M is input into the second operation memory device 8) and the time when the second reading device 10 reads the second identification information N (the time when the second identification information N is input into the second operation memory device 8) , the distance that the long optical laminated body F2 moves in the conveyance direction. Based on the movement amount of the long optical laminated body F2 between the two points in time, the second operation memory device 8 can calculate the positions of the first identification information M and the second identification information N along the long side direction of the long optical laminated body F2 Offset (in the example shown in FIG. 4, it is the position offset dX between the first identification information M3 and the second identification information N3). Therefore, the second operation memory device 8 can calculate the relationship between the first defect information and the first identification information M of the first long optical film F1 based on the pre-memorized relationship between the first identification information M and the second identification information N. Positional shift associates the first defect information of the first long optical film F1 with the second identification information N of the long optical laminated body F2 and memorizes it. In other words, the second identification information N and the coordinates of the defect based on the second identification information N can be associated and memorized. In this way, by executing the seventh step S9, the first defect information and the second defect information can be managed comprehensively based on the second identification information N of the long optical laminated body F2. The long optical laminated body F2 after performing the seventh step S9 is wound into a roll shape and transferred to the No. 2 step.

圖5係模式性地表示第1讀取裝置9及第2讀取裝置10之概略構成例之側視圖(從長條光學積層體F2之寬度方向觀察之側視圖)。圖5(a)表示第1讀取裝置9之概略構成例,圖5(b)表示第2讀取裝置10之概略構成例。 如圖5(a)所示,第1讀取裝置9具備出射紫外線之UV照明91及攝像機構(區域傳感器)92。藉由將從UV照明91出射之紫外線照射於長條光學積層體F2之正面,藉由透明墨水(UV墨水)列印之第1識別資訊M會發出螢光。藉此,相對於長條光學積層體F2之正面配置於與UV照明91相同側(圖5(a)所示之例中為上側)之攝像機構92所獲取之拍攝圖像中,與第1識別資訊M相對應之像素區域變亮(與第2識別資訊N相對應之像素區域與背景同樣地變暗),從而可辨別第1識別資訊M與第2識別資訊N來加以讀取。 再者,作為UV照明91,例如可使用出射波長200~400 nm左右之紫外線,較佳為使用出射波長365 nm左右之紫外線者。又,作為攝像機構92,例如可使用快門速度(曝光時間)為30~150 μsec左右之附高速快門之區域傳感器。FIG. 5 is a side view schematically showing an example of the schematic configuration of the first reading device 9 and the second reading device 10 (a side view viewed from the width direction of the elongated optical laminate F2). FIG. 5( a ) shows a schematic configuration example of the first reading device 9 , and FIG. 5( b ) shows a schematic configuration example of the second reading device 10 . As shown in FIG. 5(a) , the first reading device 9 includes a UV illumination 91 that emits ultraviolet rays and an imaging mechanism (area sensor) 92 . By irradiating the front surface of the long optical laminated body F2 with ultraviolet rays emitted from the UV illumination 91, the first identification information M printed with the transparent ink (UV ink) emits fluorescence. Thereby, in the photographed image acquired by the imaging mechanism 92 disposed on the same side as the UV illumination 91 (the upper side in the example shown in FIG. 5(a) ) with respect to the front surface of the long optical laminated body F2 , the image captured by the first The pixel area corresponding to the identification information M becomes brighter (the pixel area corresponding to the second identification information N becomes darker in the same manner as the background), so that the first identification information M and the second identification information N can be distinguished and read. Furthermore, as the UV illumination 91, for example, ultraviolet rays with an emission wavelength of about 200 to 400 nm can be used, and preferably, ultraviolet rays with an emission wavelength of about 365 nm can be used. Furthermore, as the imaging mechanism 92, for example, an area sensor with a high-speed shutter having a shutter speed (exposure time) of about 30 to 150 μsec can be used.

如圖5(b)所示,第2讀取裝置10具備:照明101,其配置於相對於長條光學積層體F2之正面之一側(圖5(b)所示之例中為下側),出射平行光束;及攝像機構(區域傳感器)102,其配置於相對於長條光學積層體F2之正面之另一側(圖5(b)所示之例中為上側),接收透過長條光學積層體F2之光。從照明101出射而照射至長條光學積層體F2之正面之平行光束因藉由雷射刻印所列印之第2識別資訊N而發生散射。藉此,攝像機構102所獲取之拍攝圖像中,與第2識別資訊N相對應之像素區域變暗(與第1識別資訊M相對應之像素區域與背景同樣地變亮),從而可辨別第2識別資訊N與第1識別資訊M來加以讀取。As shown in FIG. 5(b) , the second reading device 10 is provided with an illumination 101 disposed on one side (the lower side in the example shown in FIG. 5(b) ) with respect to the front of the long optical laminated body F2 ), emitting parallel light beams; and a camera mechanism (area sensor) 102, which is disposed on the other side (the upper side in the example shown in FIG. 5(b)) relative to the front of the long optical laminated body F2, to receive the long The light of strip optical laminated body F2. The parallel light beam emitted from the illumination 101 and irradiated to the front surface of the long optical laminated body F2 is scattered by the second identification information N printed by laser marking. Thereby, in the captured image acquired by the camera 102, the pixel area corresponding to the second identification information N becomes dark (the pixel area corresponding to the first identification information M becomes bright in the same manner as the background), so that it can be distinguished The second identification information N and the first identification information M are read.

再者,雖然省略詳細說明,但於使用普通有色墨水列印第1識別資訊M之情形時,作為用以讀取第1識別資訊M之讀取裝置,使用將圖5(b)所示之照明101替換為照射擴散光之照明之讀取裝置,藉此攝像機構102所獲取之拍攝圖像中,與第1識別資訊M相對應之像素區域變暗(與第2識別資訊N相對應之像素區域與背景同樣地變亮),從而可辨別第1識別資訊M與第2識別資訊N來加以讀取。Furthermore, although detailed description is omitted, when the first identification information M is printed using ordinary colored ink, as a reading device for reading the first identification information M, the one shown in FIG. 5(b) is used. The illumination 101 is replaced with a reading device that emits diffuse light, so that in the captured image acquired by the camera 102, the pixel area corresponding to the first identification information M becomes dark (the pixel area corresponding to the second identification information N The pixel area becomes brighter like the background), so that the first identification information M and the second identification information N can be distinguished and read.

(讀取步驟S10) 於No.2步驟中,將捲繞為卷狀之長條光學積層體F2捲出。之後,首先執行讀取步驟S10。 圖6係模式性地表示用以執行讀取步驟S10、第2次第4步驟S11及第6步驟S12(執行第7步驟S9後之第4步驟及第6步驟)之檢查系統之概略構成的立體圖。再者,實際上,第1識別資訊M列印於構成長條光學積層體F2之第1長條光學膜F1,圖6中為了方便省略了第1識別資訊M之圖示。 如圖6所示,讀取步驟S10中,藉由具有與檢查系統100所具備之第2讀取裝置10(參照圖4、圖5(b))相同構成之第2讀取裝置12讀取第2識別資訊N。所讀取之第2識別資訊N被輸入至第2記憶裝置8。(Reading step S10) In step No. 2, the long optical laminated body F2 rolled into a roll is rolled out. After that, the reading step S10 is first performed. 6 is a perspective view schematically showing the schematic configuration of the inspection system for executing the reading step S10, the second fourth step S11, and the sixth step S12 (the fourth step and the sixth step after executing the seventh step S9). . Furthermore, in fact, the first identification information M is printed on the first long optical film F1 constituting the long optical laminate F2, and the illustration of the first identification information M is omitted in FIG. 6 for convenience. As shown in FIG. 6 , in the reading step S10 , the reading is performed by the second reading device 12 having the same configuration as the second reading device 10 (refer to FIGS. 4 and 5(b) ) included in the inspection system 100 . Second identification information N. The read second identification information N is input to the second memory device 8 .

(第4步驟(第2次)S11) 第2次第4步驟S11中,具有與檢查系統100所具備之第2檢查裝置5相同構成之第2檢查裝置13(攝像機構13a及圖像處理機構13b)檢查藉由搬送捲筒R以卷對卷方式搬送(朝向圖6中粗實線箭頭所示之方向搬送)之長條光學積層體F2,獲取長條光學積層體F2之缺陷資訊即第2缺陷資訊。所獲取之第2缺陷資訊被輸入至第2運算記憶裝置8。(Step 4 (2nd time) S11) In the second fourth step S11, the second inspection device 13 (camera mechanism 13a and image processing mechanism 13b) having the same configuration as the second inspection device 5 included in the inspection system 100 inspects the roll pair by conveying the roll R. The long optical laminated body F2 is conveyed in a roll (carried in the direction indicated by the thick solid line arrow in FIG. 6 ), and the defect information of the long optical laminated body F2, which is the second defect information, is acquired. The acquired second defect information is input to the second operation memory device 8 .

(第6步驟(第2次)S12) 第2次第6步驟S12中,第2運算記憶裝置8將第2檢查裝置13所獲取之長條光學積層體F2之第2缺陷資訊與第2讀取裝置12所讀取之第2識別資訊N建立關聯並加以記憶。具體而言,第2運算記憶裝置8使用從具有與測距器3相同構成之測距器14輸入之長條光學積層體F2之朝向搬送方向之移動量,掌握第2讀取裝置12讀取第2識別資訊N之時點與第2檢查裝置13檢測出缺陷之時點(特定出拍攝圖像中與缺陷相對應之像素區域之座標的時點)之間長條光學積層體F2於搬送方向上移動之距離,從而將至少第2識別資訊N與以第2識別資訊N為基準之缺陷之座標建立關聯並加以記憶。(Step 6 (2nd time) S12) In the second sixth step S12, the second operation memory device 8 combines the second defect information of the long optical laminated body F2 acquired by the second inspection device 13 and the second identification information N read by the second reading device 12. Make connections and remember them. Specifically, the second arithmetic storage device 8 uses the movement amount of the elongated optical laminated body F2 in the conveying direction input from the rangefinder 14 having the same configuration as the rangefinder 3 to grasp the information read by the second reading device 12 The long optical laminated body F2 moves in the conveyance direction between the time when the second identification information N and the time when the second inspection device 13 detects the defect (the time when the coordinates of the pixel area corresponding to the defect in the captured image are specified). distance, thereby associating and memorizing at least the second identification information N with the coordinates of the defect based on the second identification information N.

本實施方式中,以於長條光學積層體F2之製造步驟中執行2次檢查(利用第2檢查裝置5進行之檢查、利用第2檢查裝置13進行之檢查)之情形為例進行了說明,於檢查3次以上之情形時,第2次以後之檢查中,反覆執行讀取步驟S10、第4步驟S11及第6步驟S12即可。In this embodiment, the case where two inspections (the inspection using the second inspection device 5 and the inspection using the second inspection device 13) are performed in the manufacturing step of the long optical laminated body F2 is explained as an example. When the inspection is performed three times or more, in the second and subsequent inspections, the reading step S10, the fourth step S11, and the sixth step S12 can be repeatedly performed.

根據以上所說明之本實施方式之檢查方法,由於藉由噴墨方式列印第1識別資訊M,藉由雷射刻印列印第2識別資訊N,故根據本發明人等之見解,即便第1識別資訊M與第2識別資訊N重疊,亦可辨別二者來加以讀取。即,可將缺陷資訊與識別資訊適當地建立關聯(將第1缺陷資訊與第1識別資訊M(甚至第2識別資訊N)建立關聯,將第2缺陷資訊與第2識別資訊N建立關聯)。 又,例如,藉由讀取第2識別資訊N,使用於第6步驟S8、S12中記憶之第2缺陷資訊與第2識別資訊N之關聯、及於第7步驟S9中記憶之第1缺陷資訊與第2識別資訊N之關聯,可避開於第1長條光學膜F1之狀態下產生之缺陷位置及於長條光學積層體F2之狀態下所產生之缺陷位置,從而沖裁製品。According to the inspection method of this embodiment described above, since the first identification information M is printed by inkjet printing and the second identification information N is printed by laser engraving, according to the knowledge of the present inventors, even if the first identification information M is printed, The 1 identification information M overlaps with the 2nd identification information N, and the two can also be read by distinguishing them. That is, the defect information and the identification information can be appropriately associated (the first defect information is associated with the first identification information M (or even the second identification information N), and the second defect information is associated with the second identification information N). . Also, for example, by reading the second identification information N, the correlation between the second defect information memorized in the sixth steps S8 and S12 and the second identification information N, and the first defect memorized in the seventh step S9 are used. The association of the information with the second identification information N can avoid the defective positions produced in the state of the first long optical film F1 and the defective positions produced in the state of the long optical laminated body F2, thereby punching out the product.

但,本發明之檢查方法並不限定於藉由噴墨方式列印第1識別資訊M、藉由雷射刻印來列印第2識別資訊N之形態。藉由噴墨方式列印第1識別資訊M及第2識別資訊N中之任一者,並藉由雷射刻印來列印另一者,或者藉由使用透明墨水之噴墨方式列印任一者,並藉由使用有色墨水之噴墨方式列印另一者,均可辨別第1識別資訊M與第2識別資訊N來加以讀取。However, the inspection method of the present invention is not limited to the form in which the first identification information M is printed by inkjet printing and the second identification information N is printed by laser marking. Either one of the first identification information M and the second identification information N is printed by inkjet printing, and the other is printed by laser engraving, or any one of the first identification information M and the second identification information N is printed by inkjet printing using transparent ink. One, and the other is printed by an inkjet method using colored ink, so that the first identification information M and the second identification information N can be distinguished and read.

再者,作為較佳之形態,本實施方式之檢查方法亦可包括第8步驟(圖1中省略了圖示),該步驟基於第1長條光學膜F1之第1識別資訊M(甚至長條光學積層體F2之第2識別資訊N)與第1缺陷資訊之關聯、及長條光學積層體F2之第2識別資訊N與第2缺陷資訊之關聯,於長條光學積層體F2之缺陷位置標註標記。具體而言,亦可讀取第2識別資訊N,於第1缺陷資訊及第2缺陷資訊中所包含之缺陷位置,藉由噴墨方式標註標記、或使用與專利文獻1之記載相同之標記油墨標註標記。藉由包括標註標記之第8步驟,於缺陷位置標註標記,故目視亦可特定出缺陷位置。Furthermore, as a preferred form, the inspection method of this embodiment may also include an eighth step (not shown in FIG. 1 ), which step is based on the first identification information M of the first long optical film F1 (even the long strip The correlation between the second identification information N) of the optical laminated body F2 and the first defect information, and the correlation between the second identification information N and the second defect information of the long optical laminated body F2, at the defect position of the long optical laminated body F2 Callout mark. Specifically, the second identification information N can also be read, and a mark can be placed on the defect position included in the first defect information and the second defect information by inkjet method, or the same mark as described in Patent Document 1 can be used. Ink callout markers. By including the eighth step of marking, marking is placed on the defect location, so the location of the defect can also be specified visually.

圖7係表示本實施方式之檢查方法之第1識別資訊M及第2識別資訊N之列印例的圖。圖7所示之例係如下之長條光學積層體(偏光膜)F2:其係使用三乙醯纖維素(TAC)製保護膜及丙烯酸樹脂製保護膜作為第1長條光學膜F1,於作為第2長條光學膜之偏光元件之雙側貼合該等第1長條光學膜F1而形成。圖7所示之例中,於藉由使用透明墨水(UV墨水)之噴墨方式將第1識別資訊M列印於丙烯酸樹脂製保護膜後,將該丙烯酸樹脂製保護膜與TAC製保護膜分別貼合於偏光元件之雙側,之後,藉由雷射刻印將第2識別資訊N列印於TAC製保護膜側。圖7所示之圓形凹凸為形成於丙烯酸樹脂製保護膜之寬度方向端部之滾紋加工部,菱形凹凸為形成於TAC製保護膜之寬度方向端部之滾紋加工部。 再者,圖7所示之拍攝圖像為同時使用第1讀取裝置9所具備之UV照明91及第2讀取裝置10所具備之照明101兩者來對長條光學積層體F2進行照明之情形時所得之拍攝圖像。FIG. 7 is a diagram showing a printing example of the first identification information M and the second identification information N in the inspection method of this embodiment. The example shown in Figure 7 is a long optical laminated body (polarizing film) F2 in which a protective film made of triacetyl cellulose (TAC) and a protective film made of an acrylic resin are used as the first long optical film F1. The polarizing element as the second elongated optical film is formed by laminating the first elongated optical films F1 on both sides. In the example shown in Figure 7, after the first identification information M is printed on an acrylic resin protective film by an inkjet method using transparent ink (UV ink), the acrylic resin protective film and the TAC protective film are They are bonded to both sides of the polarizing element respectively, and then the second identification information N is printed on the TAC protective film side by laser marking. The circular unevenness shown in Figure 7 is a knurled portion formed on the widthwise end of the acrylic resin protective film, and the diamond-shaped unevenness is a knurled portion formed on the widthwise end of the TAC protective film. In addition, the photographed image shown in FIG. 7 shows the UV illumination 91 provided in the first reading device 9 and the illumination 101 provided in the second reading device 10 used simultaneously to illuminate the long optical laminated body F2 The photographed image obtained during the situation.

圖8係表示藉由第1讀取裝置9讀取圖7所示之長條光學積層體F2之第1識別資訊M之結果的一例。如圖8所示,可知第1讀取裝置9所獲取之拍攝圖像中,與第1識別資訊M相對應之像素區域變亮(與第2識別資訊N相對應之像素區域與背景同樣地變暗),從而可辨別第1識別資訊M與第2識別資訊N來加以讀取。FIG. 8 shows an example of the result of reading the first identification information M of the long optical laminated body F2 shown in FIG. 7 by the first reading device 9 . As shown in FIG. 8 , it can be seen that in the captured image acquired by the first reading device 9 , the pixel area corresponding to the first identification information M becomes brighter (the pixel area corresponding to the second identification information N is the same as the background). darkens), so that the first identification information M and the second identification information N can be distinguished and read.

圖9係表示藉由第2讀取裝置10讀取圖7所示之長條光學積層體F2之第2識別資訊N之結果的一例。如圖9所示,可知第2讀取裝置10所獲取之拍攝圖像中,與第2識別資訊N相對應之像素區域變暗(與第1識別資訊M相對應之像素區域與背景同樣地變亮),從而可辨別第2識別資訊N與第1識別資訊M來加以讀取。FIG. 9 shows an example of the result of reading the second identification information N of the long optical laminated body F2 shown in FIG. 7 by the second reading device 10 . As shown in FIG. 9 , it can be seen that in the captured image acquired by the second reading device 10 , the pixel area corresponding to the second identification information N becomes dark (the pixel area corresponding to the first identification information M is the same as the background). becomes bright), so that the second identification information N and the first identification information M can be distinguished and read.

再者,本實施方式中,對執行滾紋加工步驟S1之後(於第1長條光學膜F1形成滾紋加工部之後)於第2步驟S2中將第1識別資訊M列印於第1長條光學膜F1之例進行了說明,但本發明並不限定於此。亦可於形成滾紋加工部之前,將第1識別資訊M列印於預定形成滾紋加工部之部位(即,於列印第1識別資訊M之後形成滾紋加工部)。Furthermore, in this embodiment, after the knurl processing step S1 is performed (after the knurl processing portion is formed on the first long optical film F1), the first identification information M is printed on the first long optical film F1 in the second step S2. An example of the strip optical film F1 has been described, but the present invention is not limited to this. The first identification information M may also be printed on the location where the knurled portion is intended to be formed before the knurled portion is formed (that is, the knurled portion is formed after the first identification information M is printed).

又,本實施方式中,以執行複數次長條光學積層體F2之檢查之情形為例進行了說明,但本發明並不限定於此,亦可僅執行1次長條光學積層體F2之檢查。於此情形時,無需圖1所示之讀取步驟S10、第4步驟(第2次)S11及第6步驟(第2次)S12。但,於避開在第1長條光學膜F1之狀態下所產生之缺陷位置及在長條光學積層體F2之狀態下所產生之缺陷位置而沖裁製品時、或執行於長條光學積層體F2之缺陷位置標註標記之第8步驟之情形時,需要讀取步驟S10。Furthermore, in this embodiment, the case where the elongated optical laminated body F2 is inspected a plurality of times has been described as an example. However, the present invention is not limited to this, and the inspection of the elongated optical laminated body F2 may be performed only once. In this case, the reading step S10, the fourth step (second time) S11, and the sixth step (second time) S12 shown in FIG. 1 are not required. However, when the product is punched while avoiding the defective position produced in the state of the first elongated optical film F1 and the defective position produced in the elongated optical laminate F2, or when the elongated optical laminate is executed In the case of step 8 of marking the defect position of body F2, step S10 needs to be read.

又,本實施方式中,以僅執行1次第1長條光學膜F1之檢查之情形為例進行了說明,但本發明並不限定於此,亦可與長條積層體F2之檢查同樣地執行複數次。於此情形時,第2次以後之檢查中,需要於圖1所示之第3步驟S4之後,重複執行讀取第1識別資訊M之讀取步驟、與第1步驟S2同樣地獲取第1缺陷資訊之步驟、及與第3步驟S4同樣地將第1缺陷資訊與第1識別資訊M建立關聯並加以記憶之步驟。Furthermore, in this embodiment, the case where the inspection of the first elongated optical film F1 is performed only once has been described as an example. However, the present invention is not limited to this, and the inspection of the elongated laminated body F2 can also be performed in the same manner. Plural times. In this case, in the second and subsequent inspections, it is necessary to repeat the reading step of reading the first identification information M after the third step S4 shown in Figure 1, and obtain the first identification information M in the same way as the first step S2. The defect information step, and the step of associating the first defect information with the first identification information M and memorizing them similarly to the third step S4.

又,本實施方式中,以藉由執行第7步驟S9,基於長條光學積層體F2之第2識別資訊N而統籌管理第1缺陷資訊及第2缺陷資訊之情形為例進行了說明,但本發明並不限定於此。亦可不執行第7步驟S9,而基於第1識別資訊M管理第1缺陷資訊,基於第2識別資訊N管理第2缺陷資訊。具體而言,例如亦可藉由讀取第1識別資訊M,使用於第3步驟S4中記憶之第1缺陷資訊與第1識別資訊M之關聯,從而避開於第1長條光學膜F1之狀態下所產生之缺陷位置而沖裁製品,亦可藉由讀取第2識別資訊N,使用於第6步驟S8中記憶之第2缺陷資訊與第2識別資訊N之關聯,從而避開於長條光學積層體F2之狀態下所產生之缺陷位置而沖裁製品。Moreover, in this embodiment, the case where the 1st defect information and the 2nd defect information are collectively managed based on the 2nd identification information N of the long optical laminated body F2 was demonstrated as an example by executing the 7th step S9. However, The present invention is not limited to this. Alternatively, the seventh step S9 may not be executed, but the first defect information may be managed based on the first identification information M, and the second defect information may be managed based on the second identification information N. Specifically, for example, the first long optical film F1 can be avoided by reading the first identification information M and using the correlation between the first defect information memorized in the third step S4 and the first identification information M. When punching products at defective locations generated under such conditions, the second identification information N can also be read and the association between the second defect information memorized in step S8 and the second identification information N can be used to avoid the problem. The product is punched out at the defective position produced in the long optical laminated body F2.

又,本實施方式中,以第1長條光學膜F1為保護膜、第2長條光學膜為偏光元件、長條光學積層體F2為偏光膜之情形為例進行了說明,但本發明並不限定於此。例如,第1長條光學膜F1亦可為相位差膜,第2長條光學膜亦為偏光元件。又,第1長條光學膜F1亦可為相位差膜、反射型偏光元件、防反射膜、ITO(Indium Tin Oxides,氧化銦錫)膜等導電性膜、及例如由聚醯亞胺等製造之窗膜等,第2長條光學膜亦可為偏光膜(偏光元件與保護膜之積層體)。Moreover, in this embodiment, the case where the 1st elongated optical film F1 is a protective film, the 2nd elongated optical film is a polarizing element, and the elongated optical laminated body F2 is a polarizing film is demonstrated as an example, However, this invention does not apply. It is not limited to this. For example, the first elongated optical film F1 may also be a retardation film, and the second elongated optical film may also be a polarizing element. In addition, the first long optical film F1 may be a conductive film such as a retardation film, a reflective polarizing element, an anti-reflection film, an ITO (Indium Tin Oxides) film, or may be made of, for example, polyimide. Window film, etc., the second long optical film may also be a polarizing film (a laminate of a polarizing element and a protective film).

1:第1檢查裝置 1a:攝像機構 1b:圖像處理機構 2:第1列印裝置 3:測距器 4:第1運算記憶裝置 5:第2檢查裝置 5a:攝像機構 5b:圖像處理機構 6:第2列印裝置 7:測距器 8:第2運算記憶裝置 9:第1讀取裝置 10:第2讀取裝置 11:測距器 12:第2讀取裝置 13:第2檢查裝置 13a:攝像機構 13b:圖像處理機構 14:測距器 91:UV照明 92:攝像機構 100:檢查系統 101:照明 102:攝像機構 D1:缺陷 D2:缺陷 F1:第1長條光學膜 F2:長條光學積層體 M:第1識別資訊 M1,M2,M3:第1識別資訊 N:第2識別資訊 N1,N2,N3:第2識別資訊 R:搬送捲筒1: 1st inspection device 1a:Camera mechanism 1b:Image processing mechanism 2: 1st printing device 3: Rangefinder 4: The first operation memory device 5: Second inspection device 5a:Camera mechanism 5b:Image processing mechanism 6: 2nd printing device 7: Rangefinder 8: Second operation memory device 9: First reading device 10: 2nd reading device 11: Rangefinder 12: Second reading device 13: Second inspection device 13a:Camera mechanism 13b:Image processing mechanism 14:Range finder 91:UV lighting 92:Camera mechanism 100: Check system 101:Lighting 102:Camera mechanism D1: Defect D2: Defects F1: The first long optical film F2: Long optical laminate M: First identification information M1, M2, M3: first identification information N: Second identification information N1, N2, N3: second identification information R: Transport reel

圖1係表示本發明之一實施方式之長條光學積層體之檢查方法之概略步驟的流程圖。 圖2係模式性地表示用以執行圖1所示之第1步驟S2~第3步驟S4之檢查系統之概略構成的立體圖。 圖3係模式性地表示用以執行圖1所示之第4步驟S6~第6步驟S8之檢查系統之概略構成的立體圖。 圖4係模式性地表示用以執行圖1所示之第7步驟S9之檢查系統之概略構成的立體圖。 圖5(a)、(b)係模式性地表示圖4所示之第1讀取裝置9及第2讀取裝置10之概略構成例的側視圖(從長條光學積層體F2之寬度方向觀察之側視圖)。 圖6係模式性地表示用以執行圖1所示之讀取步驟S10、第2次第4步驟S11及第6步驟S12(執行第7步驟S9後之第4步驟及第6步驟)之檢查系統之概略構成的立體圖。 圖7係表示本發明之一實施方式之長條光學積層體之檢查方法之第1識別資訊M及第2識別資訊N之列印例的圖。 圖8表示利用第1讀取裝置9讀取圖7所示之長條光學積層體F2之第1識別資訊M之結果的一例。 圖9表示利用第2讀取裝置10讀取圖7所示之長條光學積層體F2之第2識別資訊N所得之結果的一例。FIG. 1 is a flowchart showing the schematic steps of an inspection method for a long optical laminated body according to one embodiment of the present invention. FIG. 2 is a perspective view schematically showing the schematic configuration of the inspection system for executing the first step S2 to the third step S4 shown in FIG. 1 . FIG. 3 is a perspective view schematically showing the schematic configuration of the inspection system for executing the fourth step S6 to the sixth step S8 shown in FIG. 1 . FIG. 4 is a perspective view schematically showing the schematic configuration of the inspection system for executing the seventh step S9 shown in FIG. 1 . 5(a) and (b) are side views schematically showing an example of the schematic configuration of the first reading device 9 and the second reading device 10 shown in FIG. 4 (from the width direction of the long optical laminated body F2 Observation side view). FIG. 6 schematically shows an inspection system for executing the reading step S10, the second fourth step S11, and the sixth step S12 (the fourth step and the sixth step after executing the seventh step S9) shown in FIG. 1 A schematic three-dimensional view of the structure. FIG. 7 is a diagram showing a printing example of the first identification information M and the second identification information N in the inspection method of the long optical laminated body according to one embodiment of the present invention. FIG. 8 shows an example of the result of reading the first identification information M of the long optical laminated body F2 shown in FIG. 7 using the first reading device 9 . FIG. 9 shows an example of a result obtained by using the second reading device 10 to read the second identification information N of the long optical laminated body F2 shown in FIG. 7 .

Claims (10)

一種長條光學積層體之檢查方法,其特徵在於包括: 第1步驟,其係檢查第1長條光學膜而獲取上述第1長條光學膜之缺陷資訊即第1缺陷資訊; 第2步驟,其係於上述第1長條光學膜之長邊方向每隔特定間隔,將第1識別資訊列印於上述第1長條光學膜之寬度方向端部; 第3步驟,其係將上述第1長條光學膜之上述第1缺陷資訊與上述第1識別資訊建立關聯並加以記憶; 第4步驟,其係檢查積層上述第1長條光學膜及第2長條光學膜而成之長條光學積層體,獲取上述長條光學積層體之缺陷資訊即第2缺陷資訊; 第5步驟,其係於上述長條光學積層體之長邊方向每隔特定間隔,將第2識別資訊列印於上述長條光學積層體之寬度方向端部; 第6步驟,其係將上述長條光學積層體之上述第2缺陷資訊與上述第2識別資訊建立關聯並加以記憶; 對於上述第2步驟所要列印之上述第1識別資訊及於上述第5步驟所要列印之上述第2識別資訊,藉由噴墨方式列印其中之任一者,並藉由雷射刻印來列印另一者;或者,藉由使用透明墨水之噴墨方式列印其中之任一者,並藉由使用有色墨水之噴墨方式列印另一者。An inspection method for long optical laminated bodies, which is characterized by including: The first step is to inspect the first long optical film to obtain the defect information of the first long optical film, that is, the first defect information; The second step is to print the first identification information on the width direction ends of the above-mentioned first elongated optical film at specific intervals in the longitudinal direction of the above-mentioned first elongated optical film; The third step is to associate and memorize the first defect information of the first long optical film with the first identification information; The fourth step is to inspect the long optical laminated body formed by laminating the above-mentioned first long optical film and the second long optical film, and obtain the defect information of the above-mentioned long optical laminated body, that is, the second defect information; The fifth step is to print the second identification information on the width direction ends of the above-mentioned long optical laminated body at specific intervals in the longitudinal direction of the above-mentioned long optical laminated body; The sixth step is to associate and memorize the second defect information of the long optical laminated body with the second identification information; For the above-mentioned first identification information to be printed in the above-mentioned step 2 and the above-mentioned second identification information to be printed in the above-mentioned step 5, any one of them is printed by inkjet and laser engraving. Print the other; alternatively, print either by inkjet using clear ink and the other by inkjet using colored ink. 如請求項1之長條光學積層體之檢查方法,其中 上述第2步驟中,藉由使用透明墨水之噴墨方式列印上述第1識別資訊, 上述第5步驟中,藉由雷射刻印來列印上述第2識別資訊。The inspection method of the long optical laminated body as claimed in claim 1, wherein In the above-mentioned second step, the above-mentioned first identification information is printed by inkjet using transparent ink, In the above-mentioned fifth step, the above-mentioned second identification information is printed by laser marking. 如請求項1或2之長條光學積層體之檢查方法,其進而包括第7步驟, 上述第7步驟係將上述第1長條光學膜之上述第1缺陷資訊與上述長條光學積層體之上述第2識別資訊建立關聯並加以記憶。For example, the inspection method of the long optical laminated body of claim 1 or 2 further includes step 7, The above-mentioned seventh step is to associate and memorize the first defect information of the above-mentioned first long optical film and the above-mentioned second identification information of the above-mentioned long optical laminated body. 如請求項1或2之長條光學積層體之檢查方法,其進而包括第8步驟, 上述第8步驟基於上述第1長條光學膜之上述第1識別資訊及上述第1缺陷資訊、以及上述長條光學積層體之上述第2識別資訊及上述第2缺陷資訊,於上述長條光學積層體之缺陷位置標註標記。For example, the inspection method of the long optical laminated body of claim 1 or 2 further includes step 8, The above-mentioned step 8 is based on the above-mentioned first identification information and the above-mentioned first defect information of the above-mentioned first long optical film, and the above-mentioned second identification information and the above-mentioned second defect information of the above-mentioned long optical laminate, in the above-mentioned long optical film Mark the defective locations of the laminate. 如請求項1或2之長條光學積層體之檢查方法,其中 上述第1長條光學膜為保護膜, 上述第2長條光學膜為偏光元件, 上述長條光學積層體為偏光膜。For example, the inspection method of the long optical laminated body of claim 1 or 2, wherein The above-mentioned first long optical film is a protective film. The above-mentioned second long optical film is a polarizing element. The long optical laminated body is a polarizing film. 如請求項1或2之長條光學積層體之檢查方法,其中 上述第1長條光學膜為相位差膜, 上述第2長條光學膜為偏光膜。For example, the inspection method of the long optical laminated body of claim 1 or 2, wherein The above-mentioned first long optical film is a retardation film. The above-mentioned second long optical film is a polarizing film. 如請求項1或2之長條光學積層體之檢查方法,其中 上述第1長條光學膜為反射型偏光元件, 上述第2長條光學膜為偏光膜。For example, the inspection method of the long optical laminated body of claim 1 or 2, wherein The above-mentioned first long optical film is a reflective polarizing element. The above-mentioned second long optical film is a polarizing film. 如請求項5之長條光學積層體之檢查方法,其中 於上述第1長條光學膜之寬度方向端部形成有滾紋加工部, 上述第2步驟中,藉由噴墨方式將上述第1識別資訊列印於上述第1長條光學膜之與上述滾紋加工部相應之部位。For example, the inspection method of the long optical laminated body of claim 5, wherein A knurled portion is formed on the end portion of the first elongated optical film in the width direction, In the above-mentioned second step, the above-mentioned first identification information is printed on the above-mentioned first elongated optical film at a position corresponding to the above-mentioned knurled processing part by an inkjet method. 如請求項5之長條光學積層體之檢查方法,其中 於上述第1長條光學膜之寬度方向端部形成有滾紋加工部, 上述第5步驟中,將上述第2識別資訊列印於上述第1長條光學膜之位於較滾紋加工部更靠寬度方向內側的上述長條光學積層體之部位。For example, the inspection method of the long optical laminated body of claim 5, wherein A knurled portion is formed on the end portion of the first elongated optical film in the width direction, In the above-mentioned fifth step, the above-mentioned second identification information is printed on the portion of the above-mentioned first elongated optical film located on the inside of the width direction of the above-mentioned elongated optical laminate relative to the knurled portion. 一種長條光學積層體之檢查系統,其特徵在於具備: 第1檢查裝置,其檢查第1長條光學膜而獲取上述第1長條光學膜之缺陷資訊即第1缺陷資訊; 第1列印裝置,其於上述第1長條光學膜之長邊方向每隔特定間隔,將第1識別資訊列印於上述第1長條光學膜之寬度方向端部; 第1運算記憶裝置,其將上述第1長條光學膜之上述第1缺陷資訊與上述第1識別資訊建立關聯並加以記憶; 第2檢查裝置,其檢查積層上述第1長條光學膜及第2長條光學膜而成之長條光學積層體,獲取上述長條光學積層體之缺陷資訊即第2缺陷資訊; 第2列印裝置,其於上述長條光學積層體之長邊方向每隔特定間隔,將第2識別資訊列印於上述長條光學積層體之寬度方向端部; 第2運算記憶裝置,其將上述長條光學積層體之上述第2缺陷資訊與上述第2識別資訊建立關聯並加以記憶; 對於上述第1列印裝置所要列印之上述第1識別資訊、及上述第2列印裝置所要列印之上述第2識別資訊,藉由噴墨方式列印其中之任一者,並藉由雷射刻印來列印另一者;或者,藉由使用透明墨水之噴墨方式列印其中之任一者,並藉由使用有色墨水之噴墨方式列印另一者。An inspection system for long optical laminated bodies, which is characterized by: a first inspection device that inspects the first long optical film to obtain the defect information of the first long optical film, that is, the first defect information; A first printing device that prints the first identification information on the width direction ends of the above-mentioned first elongated optical film at specific intervals in the longitudinal direction of the above-mentioned first elongated optical film; a first operational memory device that associates and memorizes the first defect information of the first long optical film with the first identification information; a second inspection device that inspects the long optical laminated body formed by laminating the above-mentioned first long optical film and the second long optical film, and obtains the defect information of the above-mentioned long optical laminated body, that is, the second defect information; a second printing device that prints the second identification information on the width direction ends of the above-mentioned long optical laminated body at specific intervals in the longitudinal direction of the above-mentioned long optical laminated body; a second operational memory device that associates and memorizes the second defect information of the long optical laminated body with the second identification information; For the above-mentioned first identification information to be printed by the above-mentioned first printing device and the above-mentioned second identification information to be printed by the above-mentioned second printing device, any one of them is printed by an inkjet method, and by Print the other by laser marking; or, print either by inkjet printing using clear ink and the other by inkjet printing using colored ink.
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