TW201837456A - Defect marking method and defect marking apparatus, manufacturing method of raw material and raw material, and manufacturing method of sheet and sheet - Google Patents

Defect marking method and defect marking apparatus, manufacturing method of raw material and raw material, and manufacturing method of sheet and sheet Download PDF

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TW201837456A
TW201837456A TW107106823A TW107106823A TW201837456A TW 201837456 A TW201837456 A TW 201837456A TW 107106823 A TW107106823 A TW 107106823A TW 107106823 A TW107106823 A TW 107106823A TW 201837456 A TW201837456 A TW 201837456A
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defect
printing
printing pattern
film
aforementioned
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TW107106823A
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TWI766952B (en
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井村圭太
越野哲史
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日商住友化學股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8874Taking dimensions of defect into account
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/888Marking defects

Abstract

An objective of the present invention is to provide a defect marking method suitable for marking the position of a defect. A defect marking method of the present invention performs defect inspection of an object-to-be-inspected, and applies marking to a defect portion of the object-to-be-inspected based on the result of the defect inspection, wherein a first print pattern PT1 and a second print pattern PT2 are printed on a surface of the object-to-be-inspected such that a defect D is positioned between the first print pattern PT1 and the second print pattern PT2 which are adjacent to each other in another in-plane direction intersecting with one in-plan direction of the object-to-be-inspected, thereby marking the position of the defect D.

Description

缺陷標記方法及缺陷標記裝置、原材的製造方法及原材,以及片的製造方法及片    Defect marking method and defect marking device, raw material manufacturing method and raw material, and sheet manufacturing method and sheet   

本發明係有關缺陷標記(marking)方法及缺陷標記裝置、原材的製造方法及原材,以及片(sheet)的製造方法及片。 The present invention relates to a defect marking method and a defect marking device, a manufacturing method and a raw material of a raw material, and a manufacturing method and a sheet of a sheet.

例如,在樹脂膜(film)和紙等長帶狀原材的製造步驟中,係在搬送原材的期間進行原材的缺陷檢查,根據缺陷檢查的結果對原材的缺陷部位施作標記(以下,稱為缺陷標記)(參照例如下述之專利文獻1至4)。 For example, in the manufacturing process of long strip-shaped original materials such as resin films and paper, the original material is inspected for defects during the transportation of the original material, and the defective parts of the original material are marked according to the results of the defect inspection (hereinafter (Referred to as a defect mark) (see, for example, Patent Documents 1 to 4 below).

此外,在液晶顯示面板(panel)所使用的偏光板等光學膜(片)的製造步驟中,係利用印字頭(head),將缺陷的位置和種類、尺寸(size)、檢查方法等與缺陷有關的資訊(以下,稱為缺陷資訊)記錄(印字)在沿著光學膜端緣部之特定區域(以下,稱為記錄區域)。 In addition, in the manufacturing steps of optical films (sheets) such as polarizing plates used in liquid crystal display panels, the position, type, size, inspection method, and the like of the defects are compared with the defects by using a print head. Relevant information (hereinafter, referred to as defect information) is recorded (printed) in a specific area (hereinafter, referred to as a recording area) along the edge of the optical film.

光學膜係在缺陷資訊的記錄完成後捲收於芯材,當捲收量達一定量,便從搬送方向的上游側的光學膜切離,以原材捲(roll)的形式出貨。從原材捲切取依製品規格而裁剪(cut)成預先設定好的大小和方向的片(料片(chip))。此外,關於缺陷部分,係將之排除在製品之外予以作廢。 The optical film is wound on the core material after the defect information is recorded. When the amount of the wound film reaches a certain amount, it is cut off from the optical film on the upstream side in the conveying direction and shipped as a raw material roll. A sheet (chip) is cut from a raw material roll and cut into a predetermined size and direction according to the product specifications. In addition, the defective part is excluded from the product and is invalid.

(先前技術文獻)     (Prior technical literature)     (專利文獻)     (Patent Literature)    

專利文獻1:日本國特開2001-305070號公報 Patent Document 1: Japanese Patent Laid-Open No. 2001-305070

專利文獻2:日本國特開2002-303580號公報 Patent Document 2: Japanese Patent Application Laid-Open No. 2002-303580

專利文獻3:日本國特開2011-102985號公報 Patent Document 3: Japanese Patent Application Laid-Open No. 2011-102985

專利文獻4:日本國特開2014-16217號公報 Patent Document 4: Japanese Patent Application Publication No. 2014-16217

然而,在上述的習知技術的缺陷標記中,將缺陷部分自原材切取下來時是在標記與缺陷之間進行切割,因此,會有缺陷是位於因切割而切取下來之側與因切割而切剩之側的其中哪一側,有時在切割後缺陷的位置變得不明之情形。 However, in the defect mark of the above-mentioned conventional technology, when the defective part is cut from the original material, the cut is performed between the mark and the defect. Therefore, the defect is located on the side cut off due to the cutting and due to the cutting. Which one of the leftover sides is left may be unknown after cutting.

此外,在前述專利文獻2所記載的發明中係藉由附加刮痕記號(mark)來對缺陷部位施作標記。然而,在標示刮痕記號的情形時,無法在缺陷檢查後將刮痕記號消除。此時,依據標記後的目視檢查(品檢),有時缺 陷部分仍會容許被作為製品。然而,一旦標示了刮痕記號,便無法再作為製品使用。 Further, in the invention described in the aforementioned Patent Document 2, a mark is added to a defective portion by adding a scratch mark. However, in the case of marking the scratch marks, it is impossible to eliminate the scratch marks after the defect inspection. At this time, the visual inspection (quality inspection) after marking may allow the defective part to be used as a product. However, once the scratch mark is marked, it can no longer be used as a product.

另一方面,一般而言,在上述的習知技術的缺陷標記中,係藉由對缺陷部位施作標記而僅標示缺陷的位置。因此,在習知技術的缺陷標記中,並未針對前述缺陷資訊進行記錄。因此,例如,當在出貨前再次對原材捲進行品檢時需要缺陷資訊的情形時,係必須預先將缺陷資訊另行記錄在記錄區域等。 On the other hand, in general, in the defect mark of the conventional technique described above, only the position of the defect is marked by marking the defect site. Therefore, in the defect mark of the conventional technology, the foregoing defect information is not recorded. Therefore, for example, when defect information is required when the raw material roll is inspected again before shipment, the defect information must be separately recorded in a recording area in advance.

本發明乃係鑒於如上述的習知情事而提案者,其目的在於提供一種適合標示缺陷的位置之缺陷標記方法及缺陷標記裝置、原材的製造方法及原材,以及片的製造方法及片。 The present invention is proposed in view of the above-mentioned known circumstances, and its object is to provide a defect marking method and a defect marking device suitable for marking the position of a defect, a method for manufacturing a raw material and a raw material, and a method for manufacturing a sheet and a tablet .

就解決課題的手段而言,依據本發明的態樣,提供一種缺陷標記方法,係對被檢查物的缺陷部位施作標記,其中,以使缺陷位於在與前述被檢查物面內的一個方向交叉的另一個方向相鄰的第1印字樣式(pattern)與第2印字樣式之間的方式,將前述第1印字樣式及前述第2印字樣式印字在前述被檢查物的表面。 As a means for solving the problem, according to an aspect of the present invention, a defect marking method is provided for marking a defect part of an inspection object, wherein the defect is located in a direction in a plane with the inspection object. The method of printing between the first printing pattern and the second printing pattern adjacent to each other in the other direction is to print the first printing pattern and the second printing pattern on the surface of the inspection object.

此外,在前述態樣的缺陷標記方法中,亦可為:藉由前述第1印字樣式與前述第2印字樣式中之任一者或兩者的印字樣式,記錄與前述缺陷有關的資訊。 In addition, in the defect marking method of the foregoing aspect, information related to the defect may be recorded by a printing pattern of one or both of the first printing pattern and the second printing pattern.

此外,在前述態樣的缺陷標記方法中,亦可為:將至少一個點(dot)狀的記號做印字或沿前述一個方 向將複數個點狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。 In addition, in the defect marking method of the foregoing aspect, it may also be: printing at least one dot-like mark or arranging a plurality of dot-like marks along one of the directions to print, as any of the foregoing. Either or both print styles.

此外,在前述態樣的缺陷標記方法中,亦可為:將至少一個線狀的記號做印字或沿前述一個方向將複數個線狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。 In addition, in the defect marking method of the foregoing aspect, at least one linear mark may be printed or a plurality of linear marks may be arranged along the one direction to be printed, as any of the foregoing The printing style of both.

此外,在前述態樣的缺陷標記方法中,亦可為:藉由變更前述記號的數目、間隔、尺寸、顏色其中任一者以上,記錄與前述缺陷有關的資訊。 In addition, in the defect marking method of the aspect described above, information related to the defect may be recorded by changing any one or more of the number, interval, size, and color of the symbol.

此外,在前述態樣的缺陷標記方法中,亦可為:藉由變更在前述一個方向排列的複數個記號的至少一部分的間隔之印字樣式,標示前述缺陷於前述一個方向上的位置。 In addition, in the defect marking method of the aspect described above, the position of the defect in the one direction may be marked by changing a printing pattern of at least a part of the plurality of marks arranged in the one direction.

此外,在前述態樣的缺陷標記方法中,亦可為:藉由將沿前述一個方向排列的複數個記號的至少一部分的間隔空出而形成的空白配置在與前述缺陷相鄰的位置,藉此,標示前述缺陷於前述一個方向的位置。 In addition, in the defect marking method of the foregoing aspect, a blank formed by vacating at least a part of a plurality of marks arranged along the one direction may be arranged at a position adjacent to the defect. Therefore, the position of the aforementioned defect in the aforementioned one direction is indicated.

此外,在前述態樣的缺陷標記方法中,亦可為:藉由將在前述另一個方向與前述第1印字樣式和前述第2印字樣式中之任一者或兩者相鄰的第3印字樣式予以印字,以記錄與前述缺陷有關的資訊。 In addition, in the defect marking method of the foregoing aspect, the third printing may be adjacent to one or both of the first printing pattern and the second printing pattern in the other direction. The pattern is printed to record information related to the aforementioned defects.

此外,在前述態樣的缺陷標記方法中,亦可為:藉由前述任一者的印字樣式,記錄與前述缺陷以外有關的資訊。 In addition, in the defect marking method of the foregoing aspect, information related to other than the foregoing defect may be recorded by a printing pattern of any of the foregoing.

此外,在前述態樣的缺陷標記方法中,亦可為:使用能夠消除的墨水(ink)將前述印字樣式做印字。 In addition, in the defect marking method in the foregoing aspect, the foregoing printing pattern may be printed using an erasable ink.

此外,在前述態樣的缺陷標記方法中,亦可為:對作為前述被檢查物而沿前述一個方向搬送的長帶狀原材的缺陷部位施作標記。 In addition, in the defect marking method of the aspect described above, the defect portion of the long strip-shaped raw material conveyed in the one direction as the inspection object may be marked.

此外,在前述態樣的缺陷標記方法中,亦可為:對作為前述被檢查物而藉由切割長帶狀原材而得的片的缺陷部位施作標記。 Moreover, in the defect marking method of the said aspect, you may mark the defect part of the sheet | seat obtained by cutting a long strip | belt-shaped raw material as the said inspection object.

此外,依據本發明的態樣,提供一種原材的製造方法,係包含下列步驟:對沿一個方向搬送的長帶狀原材進行缺陷檢查之步驟;及使用前述任一種缺陷標記方法,在將前述原材朝前述一個方向搬送的期間,根據前述缺陷檢查的結果對前述原材的缺陷部位施作標記之步驟。 In addition, according to an aspect of the present invention, a method for manufacturing a raw material is provided, which includes the following steps: a step of performing defect inspection on a long strip-shaped raw material conveyed in one direction; and using any one of the foregoing defect marking methods, While the raw material is being transported in one of the directions, a step of marking the defective part of the raw material according to a result of the defect inspection.

此外,依據本發明的態樣,提供一種片的製造方法,係包含下列步驟:對藉由切割長帶狀原材而得的片進行缺陷檢查之步驟;及使用前述任一種缺陷標記方法,根據前述缺陷檢查的結果對前述片的缺陷部位施作標記之步驟。 In addition, according to an aspect of the present invention, a method for manufacturing a sheet is provided, which includes the steps of: performing a defect inspection step on a sheet obtained by cutting a long strip-shaped raw material; As a result of the aforementioned defect inspection, a step of marking the defective part of the aforementioned sheet is performed.

此外,依據本發明的態樣,提供一種缺陷標記裝置,係具備對被檢查物的缺陷部位施作標記的印字裝置;前述印字裝置係具有:沿與前述被檢查物面內的一個方向交叉的另一個方向以預定之間隔排列配置,並且對前述被檢查物的表面將印字樣式做印字的複數個印字部; 及控制前述複數個印字部之驅動的控制部;前述控制部係以使缺陷位於在前述另一個方向相鄰的第1印字樣式與第2印字樣式之間的方式,進行用以選擇將前述第1印字樣式及前述第2印字樣式做印字的印字部之控制。 In addition, according to an aspect of the present invention, there is provided a defect marking device including a printing device for marking a defective portion of an object to be inspected; the printing device having: The other direction is arranged at predetermined intervals, and a plurality of printing sections are printed on the surface of the inspection object with a printing pattern; and a control section for controlling the driving of the plurality of printing sections; In a manner between the first printing pattern and the second printing pattern adjacent to each other in the aforementioned direction, control is performed on a printing unit for selecting the first printing pattern and the second printing pattern to be printed.

此外,在前述態樣的缺陷標記裝置中,亦可構成為:前述控制部係對前述所選擇的任一者或兩者的印字部,因應要記錄之與前述缺陷有關的資訊,進行用以變更前述第1印字樣式與前述第2印字樣式其中任一者或兩者的印字樣式之控制。 In addition, in the defect marking device of the foregoing aspect, the control unit may be configured so that the printing unit of either or both of the selections described above is used in accordance with information related to the defects to be recorded. Control of changing one or both of the first printing pattern and the second printing pattern.

此外,在前述態樣的缺陷標記裝置中,亦可構成為:將至少一個點狀的記號做印字或沿前述一個方向將複數個點狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。 In addition, in the defect marking device of the foregoing aspect, it may be configured to print at least one dot-like mark or arrange a plurality of dot-like marks along one of the directions to print, as any of the foregoing. Or both.

此外,在前述態樣的缺陷標記裝置中,亦可構成為:將至少一個線狀的記號做印字或沿前述一個方向將複數個線狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。 In addition, in the defect marking device of the foregoing aspect, it may be configured to print at least one linear mark or arrange a plurality of linear marks along one of the directions to print, as any of the foregoing. Or both.

此外,在前述態樣的缺陷標記裝置中,亦可構成為:變更前述記號的數目、間隔、尺寸、顏色其中任一者以上。 In addition, the defect marking device of the above aspect may be configured to change any one or more of the number, interval, size, and color of the marks.

此外,在前述態樣的缺陷標記裝置中,亦可構成為:前述控制部係對前述所選擇的任一個印字部,進行用以變更沿前述一個方向排列的複數個記號的至少一部分的間隔之控制。 In addition, in the defect marking device of the aspect described above, the control unit may be configured to change the interval of at least a part of the plurality of marks arranged in the one direction to the selected printing unit. control.

此外,在前述態樣的缺陷標記裝置中,亦可構成為:前述控制部係對前述所選擇的任一個印字部,進行將沿前述一個方向排列的複數個記號的至少一部分的間隔空出而形成的空白配置在與前述缺陷相鄰的位置之控制。 In addition, in the defect marking device of the aspect described above, the control unit may be configured so that at least a part of the plurality of marks arranged along the one direction is vacated with respect to any one of the selected printing units. The formed blank is placed in a position adjacent to the aforementioned defect.

此外,在前述態樣的缺陷標記裝置中,亦可構成為:前述控制部係選擇將在前述另一個方向與前述第1印字樣式與前述第2印字樣式其中任一者或兩者相鄰的第3印字樣式予以印字的印字部,對該所選擇的任一者或兩者的印字部,因應要記錄之與前述缺陷有關的資訊,進行變更前述第3印字樣式之控制。 In addition, in the defect marking device of the foregoing aspect, the control unit may be configured to select one of the first printing pattern and the second printing pattern adjacent to the other direction in the other direction. The printing unit for which the third printing style is to be printed controls the change of the third printing style to the printing unit of one or both of the selected printing areas in accordance with the information related to the aforementioned defects.

此外,在前述態樣的缺陷標記裝置中,亦可構成為:前述控制部係對前述所選擇的任一個印字部,因應要記錄之與前述缺陷以外有關的資訊,進行變更前述任一者的印字樣式之控制。 In addition, in the defect marking device of the foregoing aspect, the control unit may be configured to change any one of the selected printing units according to information other than the defect to be recorded. Control of printing style.

此外,依據本發明的態樣,提供一種原材的製造裝置,係具備對沿一個方向搬送的長帶狀原材進行缺陷檢查的缺陷檢查裝置、及前述任一種缺陷標記裝置;在將前述原材沿前述一個方向搬送的期間,根據前述缺陷檢查的結果對前述原材的缺陷部位施作標記。 In addition, according to an aspect of the present invention, a raw material manufacturing apparatus is provided, which is provided with a defect inspection device for performing defect inspection on a long strip-shaped raw material conveyed in one direction, and any one of the foregoing defect marking devices; While the material is being transported in one of the directions, marks are made on the defective parts of the original material based on the results of the defect inspection.

此外,依據本發明的態樣,提供一種片的製造裝置,且具備對藉由切割長帶狀原材而得的片進行缺陷檢查的缺陷檢查裝置、及前述任一種缺陷標記裝置;根據前述缺陷檢查的結果對前述片的缺陷部位施作標記。 In addition, according to an aspect of the present invention, there is provided a sheet manufacturing apparatus including a defect inspection apparatus for performing defect inspection on a sheet obtained by cutting a long strip-shaped raw material, and any one of the foregoing defect marking apparatuses; As a result of the inspection, a defect portion of the aforementioned sheet was marked.

此外,依據本發明的態樣,提供一種原材,係於缺陷部位施作有標記的長帶狀原材;具有藉由前述標記而在表面被印字之在短邊方向相鄰的第1印字樣式及第2印字樣式;藉由使缺陷位於前述第1印字樣式與前述第2印字樣式之間,而標示出前述缺陷的位置。 In addition, according to an aspect of the present invention, there is provided a raw material, which is a long strip-shaped raw material with a mark applied to a defect portion; and has a first print adjacent to the short side by being printed on the surface by the mark Pattern and second printing pattern; the position of the defect is marked by placing the defect between the first printing pattern and the second printing pattern.

此外,在前述態樣的原材中,亦可構成為:藉由前述第1印字樣式與前述第2印字樣式其中任一者或兩者的印字樣式,記錄有與前述缺陷有關的資訊。 In addition, the original material in the aforementioned aspect may be configured to record information related to the defect by a printing pattern of either or both of the first printing pattern and the second printing pattern.

此外,在前述態樣的原材中,亦可構成為:將至少一個點狀的記號做印字或沿長邊方向將複數個點狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。 In addition, in the original material of the foregoing aspect, it may be constituted as: printing at least one dot-like mark or arranging a plurality of dot-like marks along the long side direction for printing, as any of the foregoing or The printing style of both.

此外,在前述態樣的原材中,亦可構成為:將至少一個線狀的記號做印字或沿長邊方向將複數個線狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。 In addition, in the original material of the foregoing aspect, it may be configured as: printing at least one linear mark or arranging multiple linear marks along the long side direction to make a print, as any one of the foregoing or The printing style of both.

此外,在前述態樣的原材中,亦可構成為:變更了前述記號的數目、間隔、尺寸、顏色其中之任一者以上。 Moreover, the raw material of the said aspect may be comprised so that any one or more of the said number of marks, an interval, a size, and a color may be changed.

此外,在前述態樣的原材中,亦可構成為:藉由變更了沿前述長邊方向排列的複數個記號的至少一部分的間隔之印字樣式,標示出前述缺陷於前述長邊方向的位置。 In addition, in the original material of the aspect described above, the position of the defect in the long-side direction may be marked by changing the printing pattern of at least a part of the plurality of marks arranged along the long-side direction. .

此外,在前述態樣的原材中,亦可構成為: 將沿前述長邊方向排列的複數個記號的至少一部分的間隔空出而形成的空白配置在與前述缺陷相鄰的位置,藉此標示出前述缺陷於前述長邊方向的位置。 In addition, in the raw material of the aspect described above, a space formed by vacating at least a part of the plurality of marks arranged along the long-side direction may be arranged at a position adjacent to the defect, thereby The position of the defect in the longitudinal direction is indicated.

此外,在前述態樣的原材中,亦可構成為:具有在前述短邊方向與前述第1印字樣式和前述第2印字樣式其中任一者或兩者相鄰的第3印字樣式,藉由前述第3印字樣式,記錄有與前述缺陷有關的資訊。 In addition, the original material in the aforementioned aspect may be configured to have a third printing pattern adjacent to either or both of the first printing pattern and the second printing pattern in the short-side direction. According to the third printing style, information related to the defect is recorded.

此外,在前述態樣的原材中,亦可構成為:藉由前述其中任一者的印字樣式,記錄有與前述缺陷以外有關的資訊。 In addition, the original material in the aforementioned aspect may be configured to record information related to other than the aforementioned defects by a printing pattern of any of the foregoing.

此外,在前述態樣的原材中,亦可構成為:以能夠消除的墨水印字有前述印字樣式。 In addition, the original material in the aspect described above may be configured to have the aforementioned printing pattern printed with erasable ink.

此外,依據本發明的態樣,提供一種片,係於缺陷部位施作有標記的片;具有藉由前述標記而在表面被印字之在與一個方向交叉的的另一個方向相鄰的第1印字樣式及第2印字樣式,藉由使缺陷位於前述第1印字樣式與前述第2印字樣式之間,而標示出前述缺陷的位置。 In addition, according to an aspect of the present invention, there is provided a sheet that is marked with a mark on a defective portion; The printing pattern and the second printing pattern are positioned between the first printing pattern and the second printing pattern to mark the position of the defect.

此外,在前述態樣的片中,亦可構成為:藉由前述第1印字樣式與前述第2印字樣式其中任一者或兩者的印字樣式,記錄有與前述缺陷有關的資訊。 In addition, in the above-mentioned piece, the information related to the defect may be recorded by the printing pattern of any one or both of the first printing pattern and the second printing pattern.

此外,在前述態樣的片中,亦可構成為:將至少一個點狀的記號做印字或沿前述一個方向將複數個點狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。 In addition, in the aforementioned aspect of the film, at least one dot-shaped mark may be printed or a plurality of dot-shaped marks may be arranged along the aforementioned direction to be printed, as any one or two of the foregoing. Printing style.

此外,在前述態樣的片中,亦可構成為:將至少一個線狀的記號做印字或沿前述一個方向將複數個線狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。 In addition, in the aforementioned aspect of the film, at least one linear mark may be printed or a plurality of linear marks may be arranged along one of the directions to be printed, as any one or two of the foregoing. Printing style.

此外,在前述態樣的片中,亦可構成為:變更了前述記號的數目、間隔、尺寸、顏色其中任一者以上。 In addition, in the aforementioned aspect of the film, any one or more of the number, interval, size, and color of the marks may be changed.

此外,在前述態樣的片中,亦可構成為:藉由變更了沿前述一個方向排列的複數個記號的至少一部分的間隔之印字樣式,標示出前述缺陷於前述一個方向的位置。 In addition, in the aforementioned aspect of the film, the position of the defect in the one direction may be marked by changing the printing pattern of at least a part of the plurality of marks arranged along the one direction.

此外,在前述態樣的片中,亦可構成為:將沿前述一個方向排列的複數個記號的至少一部分的間隔空出而形成的空白配置在與前述缺陷相鄰的位置,藉此標示出前述缺陷於前述一個方向的位置。 In addition, in the aforementioned aspect of the film, the blank formed by vacating at least a part of the plurality of marks arranged along the one direction may be arranged at a position adjacent to the defect, thereby marking the blank. The aforementioned defect is located in the aforementioned one direction.

此外,在前述態樣的片中,亦可構成為:具有在前述另一個方向與前述第1印字樣式和前述第2印字樣式其中任一者或兩者相鄰的第3印字樣式,藉由前述第3印字樣式,記錄有與前述缺陷有關的資訊。 In addition, the piece of the aspect described above may be configured to have a third printing style adjacent to either or both of the first printing style and the second printing style in the other direction, and In the third printing style, information related to the defect is recorded.

此外,在前述態樣的片中,亦可構成為:藉由前述其中任一者的印字樣式,記錄有與前述缺陷以外有關的資訊。 In addition, in the aforementioned aspect of the film, it may be configured such that information related to other than the aforementioned defect is recorded by a printing pattern of any of the foregoing.

此外,在前述態樣的片中,亦可構成為:以能夠消除的墨水印字有前述印字樣式。 In addition, in the above-mentioned sheet, the above-mentioned printing pattern may be configured to be printed with erasable ink.

如以上所述,依據本發明的態樣,能夠提供一種適合標示缺陷的位置之缺陷標記方法及缺陷標記裝置、原材的製造方法及原材,以及片的製造方法及片。 As described above, according to aspects of the present invention, it is possible to provide a defect marking method and a defect marking device suitable for marking the position of a defect, a method for manufacturing a raw material and a raw material, and a method for manufacturing a sheet and a sheet.

10‧‧‧缺陷標記裝置 10‧‧‧ Defect marking device

11‧‧‧第1缺陷檢查裝置 11‧‧‧The first defect inspection device

12‧‧‧第2缺陷檢查裝置 12‧‧‧Second defect inspection device

13‧‧‧記錄裝置(印字裝置) 13‧‧‧Recording device (printing device)

13a‧‧‧印字頭 13a‧‧‧printing head

13b‧‧‧噴嘴部(印字部) 13b‧‧‧Nozzle section (printing section)

14‧‧‧第1測長器 14‧‧‧The first length measuring device

15‧‧‧第2測長器 15‧‧‧The second length measuring device

16‧‧‧控制裝置(控制部) 16‧‧‧control device (control section)

21a至25a‧‧‧照明部 21a to 25a‧‧‧Lighting Department

21b至25b‧‧‧光檢測部 21b to 25b ‧‧‧ Light Detection Department

100‧‧‧膜製造裝置(原材的製造裝置) 100‧‧‧ film manufacturing equipment (raw material manufacturing equipment)

101‧‧‧第1搬送線 101‧‧‧The first transfer line

102‧‧‧第2搬送線 102‧‧‧The second transfer line

103‧‧‧第3搬送線 103‧‧‧ the third transfer line

104‧‧‧第4搬送線 104‧‧‧The fourth transfer line

105‧‧‧第5搬送線 105‧‧‧The fifth transfer line

106‧‧‧捲收部 106‧‧‧Receiving Department

111a、111b‧‧‧第1夾輥 111a, 111b‧‧‧1st pinch roller

112‧‧‧第1蓄料器 112‧‧‧The first accumulator

112a、112b‧‧‧第1擺動輥 112a, 112b‧‧‧1st swinging roller

113‧‧‧第1導輥 113‧‧‧The first guide roller

121a、121b‧‧‧第2夾輥 121a, 121b‧‧‧ 2nd pinch roller

122‧‧‧第2蓄料器 122‧‧‧Second Accumulator

122a、122b‧‧‧第2擺動輥 122a, 122b‧‧‧ 2nd swing roller

123a、123b‧‧‧第2導輥 123a, 123b‧‧‧ 2nd guide roller

131a、131b‧‧‧第3夾輥 131a, 131b‧‧‧3rd pinch roller

141a、141b‧‧‧第4夾輥 141a, 141b ‧‧‧ 4th pinch roller

142‧‧‧第3蓄料器 142‧‧‧3rd accumulator

142a、142b‧‧‧第3擺動輥 142a, 142b‧‧‧3rd swing roller

143a、143b‧‧‧第4導輥 143a, 143b‧‧‧ 4th guide roller

151a、151b‧‧‧第5夾輥 151a, 151b‧‧‧5th pinch roller

151c、151d‧‧‧第6夾輥 151c, 151d‧‧‧6th pinch roller

152‧‧‧第4蓄料器 152‧‧‧4th accumulator

152a、152b‧‧‧第4擺動輥 152a, 152b‧‧‧ 4th swing roller

153a‧‧‧第5導輥 153a‧‧‧5th guide roller

153b‧‧‧第6導輥 153b‧‧‧6th guide roller

153c‧‧‧第7導輥 153c‧‧‧7th guide roller

a至f‧‧‧箭頭 a to f‧‧‧ arrows

D‧‧‧缺陷 D‧‧‧ Defect

DM‧‧‧點狀的記號 DM‧‧‧dot mark

F4‧‧‧基材片 F4‧‧‧ substrate

F4a‧‧‧偏光體 F4a‧‧‧Polarizer

F4b、F4c‧‧‧保護膜 F4b, F4c‧‧‧protective film

F5‧‧‧黏著層 F5‧‧‧Adhesive layer

F6‧‧‧隔離片 F6‧‧‧Isolator

F7‧‧‧表面保護片 F7‧‧‧Surface protection sheet

F8‧‧‧貼合片 F8‧‧‧Fit

F11‧‧‧第1光學膜 F11‧‧‧The first optical film

F12‧‧‧第2光學膜 F12‧‧‧The second optical film

F13‧‧‧第3光學膜 F13‧‧‧The third optical film

F1X‧‧‧光學膜 F1X‧‧‧Optical Film

F10X‧‧‧光學膜 F10X‧‧‧Optical Film

F101‧‧‧第1膜 F101‧‧‧The first film

F102‧‧‧第2膜 F102‧‧‧The second film

F103‧‧‧第3膜 F103‧‧‧The third film

F104‧‧‧單面貼合膜 F104‧‧‧Single-sided laminating film

F105‧‧‧雙面貼合膜(原材) F105‧‧‧Double-sided laminating film (original material)

FX‧‧‧光學片 FX‧‧‧ Optical Sheet

G‧‧‧周緣部 G‧‧‧ Peripheral

K‧‧‧空白 K‧‧‧ blank

L‧‧‧搬送線 L‧‧‧ transport line

LM‧‧‧線狀的記號 LM‧‧‧ Linear Mark

P‧‧‧液晶顯示面板(光學顯示裝置) P‧‧‧LCD panel (optical display device)

P1‧‧‧第1基板 P1‧‧‧The first substrate

P2‧‧‧第2基板 P2‧‧‧The second substrate

P3‧‧‧液晶層 P3‧‧‧LCD layer

P4‧‧‧顯示區域 P4‧‧‧display area

PT1‧‧‧第1印字樣式 PT1‧‧‧The first printing style

PT2‧‧‧第2印字樣式 PT2‧‧‧2nd printing style

PT3‧‧‧第3印字樣式 PT3‧‧‧3rd printing style

R1‧‧‧第1原材捲 R1‧‧‧The first raw material roll

R2‧‧‧第2原材捲 R2‧‧‧The second raw material roll

R3‧‧‧第3原材捲 R3‧‧‧The third raw material roll

T1、T2‧‧‧間隔 T1, T2‧‧‧ intervals

第1圖係顯示液晶顯示面板的一例之俯視圖。 FIG. 1 is a plan view showing an example of a liquid crystal display panel.

第2圖係第1圖中所示液晶顯示面板的剖面圖。 FIG. 2 is a cross-sectional view of the liquid crystal display panel shown in FIG. 1. FIG.

第3圖係顯示光學膜的一例之剖面圖。 Fig. 3 is a cross-sectional view showing an example of an optical film.

第4圖係顯示膜製造裝置及缺陷標記裝置的構成之側視圖。 FIG. 4 is a side view showing the configuration of a film manufacturing apparatus and a defect marking apparatus.

第5圖係顯示第4圖所示之缺陷標記裝置的構成之俯視圖。 Fig. 5 is a plan view showing the structure of the defect marking device shown in Fig. 4.

第6圖係顯示以點狀的記號進行印字的第1印字樣式及第2印字樣式的一例之俯視圖。 FIG. 6 is a plan view showing an example of a first printing pattern and a second printing pattern that are printed with dot marks.

第7圖係顯示以線狀的記號進行印字的第1印字樣式及第2印字樣式的一例之俯視圖。 FIG. 7 is a plan view showing an example of a first printing pattern and a second printing pattern that are printed with linear marks.

第8圖(a)至(c)係顯示追加第3印字樣式的例子之俯視圖。 8 (a) to (c) are plan views showing an example of adding a third printing pattern.

第9圖(a)至(d)係例示缺陷的種類與其印字樣式的不同之俯視圖。 Figures 9 (a) to (d) are plan views illustrating the difference between the types of defects and their printing styles.

第10圖(a)及(b)係顯示在第1製造步驟與第2製造步驟中發生的缺陷之剖面圖。 Figures 10 (a) and (b) are sectional views showing defects occurring in the first manufacturing step and the second manufacturing step.

第11圖(a)至(c)係顯示針對在第1製造步驟與第2製 造步驟中發生的缺陷進行印字的第1印字樣式及第2印字樣式的一例之俯視圖。 Figures 11 (a) to (c) are plan views showing an example of a first printing pattern and a second printing pattern for printing on defects occurring in the first manufacturing step and the second manufacturing step.

第12圖係顯示第1印字樣式及第2印字樣式的變形例之俯視圖。 FIG. 12 is a plan view showing a modified example of the first printing pattern and the second printing pattern.

第13圖(a)至(g)係例示印字樣式的組合之俯視圖。 13 (a) to (g) are plan views illustrating combinations of printing patterns.

以下,針對本發明的實施形態,參照圖式詳細進行說明。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

在本實施形態中,係例如就光學顯示裝置的生產系統(system)而言,針對構成其一部分的膜製造裝置(原材的製造裝置)、及使用該膜製造裝置的膜製造方法(原材的製造方法)進行說明。 In this embodiment, for example, the production system of an optical display device is directed to a film production apparatus (a production apparatus for a raw material) and a film production method (a raw material) using the film production apparatus. Manufacturing method).

膜製造裝置係例如為製造貼合至液晶顯示面板或有機EL(Electro-Luminescence)顯示面板等面板狀光學顯示零件(光學顯示面板)的例如偏光膜、相位差膜、亮度提升膜等膜狀的光學構件(光學膜)之裝置。膜製造裝置係構成生產含有如上述之光學顯示零件和光學構件的光學顯示裝置之生產系統的一部分。 The film manufacturing device is, for example, a film-like device such as a polarizing film, a retardation film, or a brightness enhancement film that is bonded to a panel-shaped optical display component (optical display panel) such as a liquid crystal display panel or an organic EL (Electro-Luminescence) display panel. Optical component (optical film) device. The film production apparatus constitutes a part of a production system for producing an optical display device including the above-mentioned optical display parts and optical members.

在本實施形態中,就光學顯示裝置而言係例示穿透式的液晶顯示裝置。穿透式的液晶顯示裝置概略上係具備液晶顯示面板及背光(backlight)。在該種液晶顯示裝置中,係將自背光射出的照明光從液晶顯示面板的背面側射入、從液晶顯示面板的表面側射出經液晶顯示面板調變過的光,藉此能夠顯示圖像。 In this embodiment, the optical display device is a transmissive liquid crystal display device. The transmissive liquid crystal display device is roughly provided with a liquid crystal display panel and a backlight. In this type of liquid crystal display device, the illumination light emitted from the backlight is incident from the rear side of the liquid crystal display panel, and the light modulated by the liquid crystal display panel is emitted from the front side of the liquid crystal display panel, so that an image can be displayed. .

(光學顯示裝置) (Optical display device)

首先,就光學顯示裝置而言,針對第1圖及第2圖所示的液晶顯示面板P的構成進行說明。另外,第1圖係顯示液晶顯示面板P的構成之俯視圖。第2圖係沿第1圖中所示之剖切線A-A的液晶顯示面板P的剖面圖。另外,在第2圖中係省略表示剖面的剖面線(hatching)的圖示。 First, the configuration of the liquid crystal display panel P shown in FIG. 1 and FIG. 2 will be described for an optical display device. In addition, FIG. 1 is a plan view showing the configuration of the liquid crystal display panel P. FIG. 2 is a cross-sectional view of the liquid crystal display panel P along a cutting line A-A shown in FIG. 1. It should be noted that the hatching showing the cross section is omitted in the second figure.

如第1圖及第2圖所示,液晶顯示面板P概略上係具備:第1基板P1;第2基板P2,係與第1基板P1相對向配置;及液晶層P3,係配置在第1基板P1與第2基板P2之間。 As shown in FIGS. 1 and 2, the liquid crystal display panel P is roughly provided with: a first substrate P1; a second substrate P2 arranged opposite to the first substrate P1; and a liquid crystal layer P3 arranged at the first Between the substrate P1 and the second substrate P2.

第1基板P1係由俯視呈長方形的透明基板所構成。第2基板P2係由比第1基板P1小的呈長方形的透明基板所構成。液晶層P3係配置在以密封(seal)材(未圖示)將第1基板P1與第2基板P2之間的周圍予以密封而由密封材所包圍的俯視呈長方形的區域之內側。在液晶顯示面板P中,係將俯視下局限在液晶層P3外周之內側的區域設為顯示區域P4、將包圍該顯示區域P4的周圍的外側的區域設為周緣部G。 The first substrate P1 is composed of a transparent substrate having a rectangular shape in plan view. The second substrate P2 is composed of a rectangular transparent substrate smaller than the first substrate P1. The liquid crystal layer P3 is disposed inside a region having a rectangular shape in plan view enclosed by a sealing material (not shown) and sealing the periphery between the first substrate P1 and the second substrate P2. In the liquid crystal display panel P, a region limited to the inside of the outer periphery of the liquid crystal layer P3 in a plan view is a display region P4, and a region outside the periphery of the display region P4 is a peripheral portion G.

在液晶顯示面板P的背面(背光側),係依序積層貼合有作為偏光膜的第1光學膜F11、層疊於該第1光學膜F11且作為亮度提升膜的第3光學膜F13。在液晶顯示面板P的表面(顯示面側),係貼合有作為偏光膜的第2光學膜F12。以下,將第1、第2及第3光學膜F11至 F13統稱為光學膜F1X。 On the back (backlight side) of the liquid crystal display panel P, a first optical film F11 as a polarizing film and a third optical film F13 as a brightness enhancement film laminated on the first optical film F11 are sequentially laminated. A second optical film F12 as a polarizing film is bonded to the surface (display surface side) of the liquid crystal display panel P. Hereinafter, the first, second, and third optical films F11 to F13 are collectively referred to as an optical film F1X.

(光學膜) (Optical film)

接著,針對第3圖所示的構成光學膜F1X的光學片FX的一例進行說明。另外,第3圖係顯示光學片FX的構成之剖面圖。另外,在第3圖中係省略了表示剖面的剖面線的圖示。 Next, an example of the optical sheet FX constituting the optical film F1X shown in FIG. 3 will be described. FIG. 3 is a cross-sectional view showing the configuration of the optical sheet FX. In addition, in FIG. 3, the illustration of the hatching which shows a cross section is abbreviate | omitted.

光學膜F1X係藉由從第3圖所示的長帶狀的光學片(原材)FX切取預定之長度的片件(端片)而得。具體而言,該光學片FX係具有:基材片F4;黏著層F5,係設置在基材片F4的一面(第3圖中的頂面);隔離(separator)片F6,係隔介黏著層F5而設置在基材片F4的一面;及表面保護片F7,係設置在基材片F4的另一面(第3圖中的底面)。 The optical film F1X is obtained by cutting a sheet member (end sheet) of a predetermined length from the long strip-shaped optical sheet (original material) FX shown in FIG. 3. Specifically, the optical sheet FX has: a base material sheet F4; an adhesive layer F5, which is provided on one side of the base material sheet F4 (the top surface in FIG. 3); and a separator sheet F6, which is an adhesive layer. The layer F5 is provided on one side of the base material sheet F4, and the surface protection sheet F7 is provided on the other side (bottom surface in FIG. 3) of the base material sheet F4.

關於基材片F4,當例如為偏光膜時,係具有由一對保護膜F4b、F4c包夾偏光體F4a的構造。黏著層F5乃係使片件(光學膜F1X)黏貼至液晶顯示面板P之層。隔離片F6乃係保護黏著層F5之片,且於將片件(光學膜F1X)貼合至液晶顯示面板P之前從黏著層F5剝離下來。另外,將隔離片F6從光學膜F1X移除後之部分係成為貼合片F8。 When the base material sheet F4 is, for example, a polarizing film, it has a structure in which the polarizer F4a is sandwiched by a pair of protective films F4b and F4c. The adhesive layer F5 is a layer for attaching a sheet (optical film F1X) to the liquid crystal display panel P. The release sheet F6 is a sheet for protecting the adhesive layer F5, and is peeled off from the adhesive layer F5 before the sheet member (optical film F1X) is attached to the liquid crystal display panel P. In addition, the part after removing the separator F6 from the optical film F1X becomes a bonding sheet F8.

表面保護片F7係保護基材片F4的表面之片。表面保護片F7係在將片件(光學膜F1X)黏貼至液晶顯示面板P後從片件(光學膜F1X)的表面剝離下來。 The surface protection sheet F7 is a sheet that protects the surface of the base material sheet F4. The surface protection sheet F7 is peeled off from the surface of the sheet member (optical film F1X) after the sheet member (optical film F1X) is adhered to the liquid crystal display panel P.

另外,關於基材片F4,係亦可採用將一對保護膜F4b、F4c中之任一者予以省略的構成。例如,能夠採用將黏著層F5側的保護膜F4b予以省略而將黏著層F5直接設置在偏光體F4a的構成。此外,在表面保護片F7側的保護膜F4c係例如亦可施作保護液晶顯示面板P之最外面的硬塗(hard coat)處理、可獲得防眩效果的抗眩(anti-glare)處理等表面處理。此外,關於基材片F4,並不限於上述的積層構造者,亦可為單層構造。此外,關於表面保護片F7,亦能夠予以省略。 The base material sheet F4 may have a configuration in which any one of the pair of protective films F4b and F4c is omitted. For example, a configuration in which the protective film F4b on the side of the adhesive layer F5 is omitted and the adhesive layer F5 is directly provided on the polarizer F4a can be adopted. In addition, the protective film F4c on the surface protective sheet F7 side can also be subjected to, for example, a hard coat treatment to protect the outermost portion of the liquid crystal display panel P, an anti-glare treatment to obtain an anti-glare effect, and the like. Surface treatment. The base material sheet F4 is not limited to the above-mentioned laminated structure, and may be a single-layer structure. The surface protection sheet F7 can also be omitted.

(膜製造裝置及膜製造方法) (Film manufacturing apparatus and method)

接著,針對第4圖所示的膜製造裝置100進行說明。另外,第4圖係顯示膜製造裝置100的構成之側視圖。 Next, the film manufacturing apparatus 100 shown in FIG. 4 is demonstrated. FIG. 4 is a side view showing a configuration of the film manufacturing apparatus 100.

如第4圖所示,膜製造裝置100係例如為將作為表面保護膜的長帶狀的第2膜F102貼合至作為偏光膜的長帶狀的第1膜F101的一面後,將作為表面保護膜的長帶狀的第3膜F103貼合至第1膜F101的另一面,藉此製造在第1膜F101的兩面貼合有第2膜F102及第3膜F103的光學膜F10X。 As shown in FIG. 4, the film manufacturing apparatus 100 is, for example, a surface of the long-belt-shaped second film F102 that is a surface protective film, and is bonded to one side of the long-belt-shaped first film F101 that is a polarizing film. The long strip-shaped third film F103 of the protective film is bonded to the other surface of the first film F101, thereby manufacturing an optical film F10X in which the second film F102 and the third film F103 are bonded to both sides of the first film F101.

具體而言,該膜製造裝置100概略上係具備:第1搬送線(line)101、第2搬送線102、第3搬送線103、第4搬送線104、第5搬送線105、及捲收部106。 Specifically, the film manufacturing apparatus 100 is roughly provided with a first transfer line 101, a second transfer line 102, a third transfer line 103, a fourth transfer line 104, a fifth transfer line 105, and a take-up Department 106.

其中,第1搬送線101係形成將第1膜F101進行搬送的搬送路徑;第2搬送線102係形成將從第1原 材捲R1捲送出的第2膜F102進行搬送的搬送路徑;第3搬送線103係形成將在第1膜F101的一面貼合有第2膜F102而成的單面貼合膜F104進行搬送的之搬送路徑;第4搬送線104係形成將從第2原材捲R2捲送出的第3膜F103進行搬送的搬送路徑;第5搬送線105係形成將在單面貼合膜F104的第1膜F101側之面(第1膜F101的另一面)貼合有第3膜F103而成的雙面貼合膜F105(光學膜F10X)進行搬送的搬送路徑。此外,所製造出的光學膜F10X係在捲收部106中捲收於芯材成為第3原材捲R3。 Among them, the first conveying line 101 forms a conveying path for conveying the first film F101; the second conveying line 102 forms a conveying path for conveying the second film F102 from the first raw material roll R1; the third The conveying line 103 forms a conveying path for conveying the single-sided laminating film F104 formed by laminating the second film F102 on one side of the first film F101; the fourth conveying line 104 forms a conveying line from the second raw material roll The third film F103 from the R2 roll is a conveying path for conveying; the fifth conveying line 105 forms a surface on the first film F101 side (the other surface of the first film F101) of the single-sided lamination film F104, and the first film F101 is bonded to the first film F101. A conveying path for conveying a double-sided laminated film F105 (optical film F10X) composed of three films F103. In addition, the manufactured optical film F10X is rolled up by the core material in the winding portion 106 to become the third raw material roll R3.

第1搬送線101乃係例如令藉由對PVA(Polyvinyl Alcohol;聚乙烯醇)等作為偏光體之基材的膜施作染色處理、交聯處理、延伸處理等處理後在其兩面貼合TAC(Triacetylcellulose(三乙酸纖維素))等保護膜而得的長帶狀的第1膜F101搬送往第3搬送線103。 The first transfer line 101 is, for example, applying a treatment such as dyeing treatment, cross-linking treatment, or extension treatment to a film that is a substrate of a polarizer such as PVA (Polyvinyl Alcohol; polyvinyl alcohol), and attaching TAC to both sides thereof. The long film-like first film F101 obtained from a protective film such as (Triacetylcellulose) is transferred to a third transfer line 103.

具體而言,在該第1搬送線101,係從隔著第3搬送線103上游側之一方側往第3搬送線103沿水平方向依序配置有:一對第1夾輥(nip roller)111a、111b、含有複數個第1擺動輥(dancer roller)112a、112b的第1蓄料器(accumulator)112、及第1導輥113。 Specifically, in the first transfer line 101, a pair of first nip rollers are arranged in the horizontal direction from one side of the upstream side of the third transfer line 103 to the third transfer line 103 in the horizontal direction. 111a and 111b, a first accumulator 112 and a first guide roller 113 including a plurality of first dancer rollers 112a and 112b.

一對第1夾輥111a、111b乃係一邊將第1膜F101包夾於其間,一邊互往相反的方向旋轉,藉此往第4圖中所示箭頭a的方向(右方向)拉出第1膜F101。 The pair of first pinch rollers 111a and 111b are sandwiched between the first film F101 and rotate in opposite directions, thereby pulling the first film F101 in the direction of the arrow a (right direction) shown in FIG. 4. 1 film F101.

第1蓄料器112乃係用於吸收因第1膜F101的饋送量的變動所產生之差並且減輕施加在第1膜F101 的張力的變動。具體而言,該第1蓄料器112係具有:在第1夾輥111a、111b與第1導輥113之間,以交替排列的方式配置有位於上部側的複數個擺動輥112a、與位於下部側的複數個擺動輥112b之構成。 The first accumulator 112 is used to absorb a difference caused by a change in the feed amount of the first film F101 and to reduce a change in tension applied to the first film F101. Specifically, the first accumulator 112 includes a plurality of swing rollers 112a positioned on the upper side and alternately arranged between the first nip rollers 111a and 111b and the first guide roller 113, and The lower side includes a plurality of swing rollers 112b.

在第1蓄料器112中,係於將第1膜F101交錯掛繞在上部側的擺動輥112a與下部側的擺動輥112b之狀態下,一邊令第1膜F101搬送,一邊令上部側的擺動輥112a與下部側的擺動輥112b沿上下方向相對地進行升降動作。藉此,能夠在不用停止第1搬送線101之情形下蓄積第1膜F101。例如,在第1蓄料器112中,能夠藉由擴大上部側的擺動輥112a與下部側的擺動輥112b之間的距離來增加第1膜F101的蓄積,相反地能夠藉由縮減上部側的擺動輥112a與下部側的擺動輥112b之間的距離來減少第1膜F101的蓄積。第1蓄料器112係例如在更換原材捲R1至R3的芯材之後的接紙等作業時運轉。 In the first accumulator 112, the first film F101 is staggered and wound around the upper swing roller 112a and the lower swing roller 112b, and the first film F101 is conveyed while the upper film is conveyed. The swing roller 112a and the swing roller 112b on the lower side are opposed to each other in a vertical direction. This makes it possible to accumulate the first film F101 without stopping the first transfer line 101. For example, in the first accumulator 112, the accumulation of the first film F101 can be increased by increasing the distance between the upper-side swing roller 112a and the lower-side swing roller 112b, and conversely, it is possible to reduce the upper side The distance between the swing roller 112a and the swing roller 112b on the lower side reduces the accumulation of the first film F101. The first accumulator 112 is operated during, for example, a paper receiving operation after replacing the core material of the raw material rolls R1 to R3.

第1導輥113乃係一邊旋轉一邊將由第1夾輥111a、111b拉出的第1膜F101導引往第3搬送線103的上游側。另外,關於第1導輥113,並不限於僅配置有一個之構成,亦可為配置有複數個之構成。 The first guide roller 113 guides the first film F101 pulled out by the first nip rollers 111 a and 111 b toward the upstream side of the third conveyance line 103 while rotating. In addition, the first guide roller 113 is not limited to a configuration in which only one is arranged, and a configuration in which a plurality of first guide rollers 113 are arranged may be used.

第2搬送線102乃係例如一邊令PET(Polyethylene terephthalate;聚對苯二甲酸乙二酯)等作為表面保護膜的長帶狀的第2膜F102從第1原材捲R1捲送出,一邊搬送往第3搬送線103。 The second transfer line 102 is for example a PET (Polyethylene terephthalate; polyethylene terephthalate) or the like, and a long strip-shaped second film F102 is sent from the first raw material roll R1 while being conveyed. To the third transfer line 103.

具體而言,在該第2搬送線102,係從隔著 第3搬送線103上游側之另一方側往第3搬送線103沿水平方向依序配置有:一對第2夾輥121a、121b、含有複數個第2擺動輥122a、122b的第2蓄料器122、及複數個第2導輥123a、123b。 Specifically, in the second transfer line 102, a pair of second pinch rollers 121a, 121b are arranged in the horizontal direction from the other side across the upstream side of the third transfer line 103 to the third transfer line 103 in the horizontal direction. , A second accumulator 122 including a plurality of second swing rollers 122a, 122b, and a plurality of second guide rollers 123a, 123b.

一對第2夾輥121a、121b乃係一邊將第2膜F102包夾於其間,一邊互往相反的方向旋轉,藉此往第4圖中所示之箭頭b的方向(左方向)拉出第2膜F102。 The pair of second pinch rollers 121a and 121b are rotated in opposite directions while sandwiching the second film F102 therebetween, thereby pulling out in the direction of the arrow b (left direction) shown in FIG. 4. The second film F102.

第2蓄料器122乃係用於吸收因第2膜F102的饋送量的變動所產生之差並且減輕施加在第2膜F102的張力的變動。具體而言,該第2蓄料器122係具有在第2夾輥121a、121b與第2導輥123a、123b之間,以交替排列的方式配置有位於上部側的複數個擺動輥122a、與位於下部側的複數個擺動輥122b之構成。 The second accumulator 122 is used to absorb a difference caused by a change in the feeding amount of the second film F102 and to reduce a change in tension applied to the second film F102. Specifically, the second accumulator 122 includes a plurality of swing rollers 122a disposed on the upper side between the second nip rollers 121a and 121b and the second guide rollers 123a and 123b in an alternate arrangement, and A plurality of swing rollers 122b located on the lower side are configured.

在第2蓄料器122中,係於將第2膜F102交錯掛繞在上部側的擺動輥122a與下部側的擺動輥122b之狀態下,一邊令第2膜F102搬送,一邊令上部側的擺動輥122a與下部側的擺動輥122b沿上下方向相對地進行升降動作。藉此,能夠在不用停止第2搬送線102之情形下蓄積第2膜F102。例如,在第2蓄料器122中,能夠藉由擴大上部側的擺動輥122a與下部側的擺動輥122b之間的距離來增加第2膜F102的蓄積,相反地,能夠藉由縮減上部側的擺動輥122a與下部側的擺動輥122b之間的距離來減少第2膜F102的蓄積。第2蓄料器122係例如在更換原材捲R1至R3的芯材之後的接紙等作業時運轉。 In the second accumulator 122, the second film F102 is alternately wound around the upper swing roller 122a and the lower swing roller 122b, and the second film F102 is conveyed while the second film F102 is conveyed. The swinging roller 122a and the swinging roller 122b on the lower side are opposed to each other in a vertical direction. This makes it possible to accumulate the second film F102 without stopping the second transfer line 102. For example, in the second accumulator 122, the accumulation of the second film F102 can be increased by increasing the distance between the upper-side swing roller 122a and the lower-side swing roller 122b, and conversely, it is possible to reduce the upper side The distance between the swing roller 122a and the swing roller 122b on the lower side reduces the accumulation of the second film F102. The second accumulator 122 is operated during, for example, a paper receiving operation after replacing the core materials of the raw material rolls R1 to R3.

複數個第2導輥123a、123b乃係一邊分別旋轉一邊將由第2夾輥121a、121b拉出的第2膜F102導引往第3搬送線103的上游側。另外,關於第2導輥123a、123b,並不限於配置有複數個之構成,亦可為僅配置有一個之構成。 The plurality of second guide rollers 123 a and 123 b guide the second film F102 pulled out by the second pinch rollers 121 a and 121 b to the upstream side of the third transfer line 103 while rotating respectively. The second guide rollers 123a and 123b are not limited to a configuration in which a plurality of second guide rollers 123a and 123b are disposed, and may be a configuration in which only one is disposed.

第3搬送線103乃係令在第1膜F101的一面貼合第2膜F102而成的長帶狀的單面貼合膜F104搬送往第5搬送線105。 The third transfer line 103 is a long-belt-shaped single-sided bonding film F104 in which the second film F102 is bonded to one side of the first film F101 and is transferred to the fifth transfer line 105.

具體而言,在該第3搬送線103係配置有一對第3夾輥131a、131b。一對第3夾輥131a、131b乃係位於第1搬送線101的下游側與第2搬送線102的下游側之合流點,一邊將第1膜F101及第2膜F102包夾於其間一邊互往相反的方向旋轉,藉此往第4圖中所示之箭頭c的方向(下方向)拉出將第1膜F101與第2膜F102貼合在一起而成的單面貼合膜F104。 Specifically, a pair of third pinch rollers 131 a and 131 b are arranged on the third transfer line 103. A pair of third pinch rollers 131a and 131b are located at the confluence point of the downstream side of the first conveying line 101 and the downstream side of the second conveying line 102, and sandwich the first film F101 and the second film F102 therebetween By rotating in the opposite direction, the single-sided bonding film F104 formed by bonding the first film F101 and the second film F102 together is pulled out in the direction of the arrow c (downward direction) shown in FIG. 4.

第4搬送線104乃係例如一邊令PET(Polyethylene terephthalate)等作為表面保護膜的長帶狀的第3膜F103從第2原材捲R2捲送出,一邊搬送往第5搬送線105。 The fourth conveying line 104 is, for example, a long strip-shaped third film F103 that is a surface protective film such as PET (Polyethylene terephthalate) and is conveyed from the second raw material roll R2 to the fifth conveying line 105.

具體而言,在該第4搬送線104,係從隔著第3搬送線103下游側之一方側往第3搬送線103沿水平方向依序配置有:一對第4夾輥141a、141b、含有複數個第3擺動輥142a、142b的第3蓄料器142、及複數個第4導輥143a、143b。 Specifically, a pair of fourth nip rollers 141a, 141b, and 4th nip rollers 141a, 141b, A third accumulator 142 including a plurality of third swing rollers 142a, 142b, and a plurality of fourth guide rollers 143a, 143b.

一對第4夾輥141a、141b乃係一邊將第3膜F103包夾於其間,一邊互往相反的方向旋轉,藉此往第4圖中所示之箭頭d的方向(右方向)拉出第3膜F103。 A pair of fourth pinch rollers 141a and 141b rotate the opposite directions while sandwiching the third film F103 therebetween, thereby pulling out in the direction of the arrow d (right direction) shown in FIG. 4 Third film F103.

第3蓄料器142乃係用於吸收因第3膜F103的饋送量的變動所產生之差並且減輕施加在第3膜F103的張力的變動。具體而言,該第3蓄料器142係具有在第4夾輥141a、141b與第4導輥143a、143b之間,以交替排列的方式配置有位於上部側的複數個擺動輥142a、與位於下部側的複數個擺動輥142b之構成。 The third accumulator 142 is used to absorb the difference caused by the variation in the feed amount of the third film F103 and reduce the variation in the tension applied to the third film F103. Specifically, the third accumulator 142 includes a plurality of oscillating rollers 142a located on the upper side between the fourth nip rollers 141a and 141b and the fourth guide rollers 143a and 143b in an alternate arrangement, and A plurality of swing rollers 142b located on the lower side are configured.

在第3蓄料器142中,係於將第3膜F103交錯掛繞在上部側的擺動輥142a與下部側的擺動輥142b之狀態下,一邊令第3膜F103搬送,一邊令上部側的擺動輥142a與下部側的擺動輥142b沿上下方向相對地進行升降動作。藉此,能夠在不用停止第4搬送線104之情形下蓄積第3膜F103。例如,在第3蓄料器142中,能夠藉由擴大上部側的擺動輥142a與下部側的擺動輥142b之間的距離來增加第3膜F103的蓄積,相反地能夠藉由縮減上部側的擺動輥142a與下部側的擺動輥142b之間的距離來減少第3膜F103的蓄積。第3蓄料器142係例如在更換原材捲R1至R3的芯材之後的接紙等作業時運轉。 In the third accumulator 142, the third film F103 is alternately wound around the upper swing roller 142a and the lower swing roller 142b, and the third film F103 is conveyed while the upper film The swinging roller 142a and the swinging roller 142b on the lower side are opposed to each other in a vertical direction. Thereby, the third film F103 can be accumulated without stopping the fourth conveyance line 104. For example, in the third accumulator 142, the accumulation of the third film F103 can be increased by increasing the distance between the swing roller 142a on the upper side and the swing roller 142b on the lower side, and conversely, it is possible to reduce the The distance between the swing roller 142a and the swing roller 142b on the lower side reduces the accumulation of the third film F103. The third accumulator 142 is operated during, for example, a paper receiving operation after replacing the core materials of the raw material rolls R1 to R3.

複數個第4導輥143a、143b乃係一邊分別旋轉,一邊將由第4夾輥141a、141b拉出的第3膜F103導引往第3搬送線103的下游側(第5搬送線105的上游側)。另外,關於第4導輥143a、143b,並不限於配置有 複數個之構成,亦可為僅配置有一個之構成。 The plurality of fourth guide rollers 143a and 143b are respectively rotated while guiding the third film F103 pulled out by the fourth pinch rollers 141a and 141b to the downstream side of the third transfer line 103 (upstream of the fifth transfer line 105). side). The fourth guide rollers 143a and 143b are not limited to a configuration in which a plurality of the fourth guide rollers 143a and 143b are disposed, and may be a configuration in which only one is disposed.

第5搬送線105乃係令在單面貼合膜F104的第1膜F101側之面(第1膜F101的另一面)貼合第3膜F103而成的長帶狀的雙面貼合膜F105(光學膜F10X)搬送往第3原材捲R3。 The fifth conveying line 105 is a long-belt double-sided bonding film formed by bonding the third film F103 to the first film F101 side of the single-sided bonding film F104 (the other side of the first film F101). F105 (optical film F10X) is transported to the third raw material roll R3.

具體而言,在該第5搬送線105中,係從隔著第3搬送線103下游側之另一方側往第3原材捲R3沿水平方向依序配置有:一對第5夾輥151a、151b、第5導輥153a、一對第6夾輥151c、151d、含有複數個第4擺動輥152a、152b的第4蓄料器152、及第6導輥153b。 Specifically, in the fifth transfer line 105, a pair of fifth pinch rollers 151a are arranged in the horizontal direction from the other side across the downstream side of the third transfer line 103 to the third raw material roll R3 in the horizontal direction. 151b, a fifth guide roller 153a, a pair of sixth pinch rollers 151c, 151d, a fourth accumulator 152 including a plurality of fourth swing rollers 152a, 152b, and a sixth guide roller 153b.

一對第5夾輥151a、151b乃係位於第3搬送線103的下游側與第5搬送線105的上游側之合流點,一邊將單面貼合膜F104及第3膜F103包夾於其間,一邊互往相反的方向旋轉,藉此往第4圖中所示之箭頭e的方向(下方向)拉出將單面貼合膜F104與第3膜F103貼合在一起而成的雙面貼合膜F105。 The pair of fifth pinch rollers 151a and 151b are located at the confluence point of the downstream side of the third conveying line 103 and the upstream side of the fifth conveying line 105, and sandwich the single-sided laminating film F104 and the third film F103 therebetween. , While rotating in opposite directions to each other, thereby pulling out the double-sided surface formed by bonding the single-sided bonding film F104 and the third film F103 to the direction (downward direction) of the arrow e shown in FIG. 4. Lamination film F105.

第5導輥153a乃係一邊旋轉,一邊將由第5夾輥151a、151b拉出的雙面貼合膜F105導引往第4蓄料器152。另外,關於第5導輥153a並不限於僅配置有一個之構成,亦可為配置有複數個之構成。 The fifth guide roller 153a guides the double-sided bonding film F105 pulled out by the fifth pinch rollers 151a and 151b to the fourth accumulator 152 while rotating. The fifth guide roller 153a is not limited to a configuration in which only one is arranged, and a configuration in which a plurality of fifth guide rollers 153a are arranged may be used.

一對第6夾輥151c、151d乃係一邊將雙面貼合膜F105包夾於其間,一邊互往相反的方向旋轉,藉此往第4圖中所示之箭頭f的方向(右方向)拉出雙面貼合膜F105。 The pair of sixth pinch rollers 151c and 151d rotates in opposite directions while sandwiching the double-sided bonding film F105 therebetween, thereby moving in the direction of the arrow f (right direction) shown in FIG. 4. Pull out the double-sided bonding film F105.

在第4蓄料器152中,係於將雙面貼合膜F105交錯掛繞在上部側的擺動輥152a與下部側的擺動輥152b之狀態下,一邊令雙面貼合膜F105搬送,一邊令上部側的擺動輥152a與下部側的擺動輥152b沿上下方向相對地進行升降動作。藉此,能夠在不用停止第5搬送線105之情形下蓄積雙面貼合膜F105。例如,在第4蓄料器152中,能夠藉由擴大上部側的擺動輥152a與下部側的擺動輥152b之間的距離來增加雙面貼合膜F105的蓄積,相反地能夠藉由縮減上部側的擺動輥152a與下部側的擺動輥152b之間的距離來減少雙面貼合膜F105的蓄積。第4蓄料器152係例如在更換原材捲R1至R3的芯材之後的接紙等作業時運轉。 In the fourth accumulator 152, the double-sided bonding film F105 is staggered and wound around the upper-side swing roller 152a and the lower-side swing roller 152b. The swinging roller 152a on the upper side and the swinging roller 152b on the lower side are caused to relatively move up and down in the vertical direction. Thereby, the double-sided bonding film F105 can be accumulated without stopping the fifth conveyance line 105. For example, in the fourth accumulator 152, the accumulation of the double-sided bonding film F105 can be increased by increasing the distance between the upper-side swing roller 152a and the lower-side swing roller 152b, and conversely, the upper portion can be reduced by reducing The distance between the swing roller 152a on the side and the swing roller 152b on the lower side reduces the accumulation of the double-sided bonding film F105. The fourth accumulator 152 is operated during, for example, a paper receiving operation after replacing the core materials of the raw material rolls R1 to R3.

第6導輥153b乃係將雙面貼合膜F105導引往第3原材捲R3。另外,關於第6導輥153b,並不限於僅配置有一個之構成,亦可為配置有複數個之構成。 The sixth guide roller 153b guides the double-sided bonding film F105 to the third raw material roll R3. In addition, the sixth guide roller 153b is not limited to a configuration in which only one is arranged, and may be a configuration in which a plurality of the sixth guide rollers 153b are arranged.

雙面貼合膜F105係在捲收部106捲收於芯材而成為光學膜F10X的第3原材捲R3後送到下個步驟。 The double-sided bonding film F105 is wound into the core material at the winding unit 106 to become the third raw material roll R3 of the optical film F10X, and then is sent to the next step.

(缺陷標記裝置及缺陷標記方法) (Defect marking device and defect marking method)

接著,針對前述膜製造裝置100所具備的缺陷標記裝置10、及使用該缺陷標記裝置10的缺陷標記方法進行說明。 Next, a defect marking device 10 provided in the film manufacturing apparatus 100 and a defect marking method using the defect marking device 10 will be described.

如第4圖所示,缺陷標記裝置10乃係構成前述膜製造裝置100的一部分,概略上係構成為具備:搬 送線L、第1缺陷檢查裝置11及第2缺陷檢查裝置12、記錄裝置13、第1測長器14及第2測長器15、及控制裝置16。 As shown in FIG. 4, the defect marking device 10 constitutes a part of the film manufacturing device 100, and is roughly configured to include a transfer line L, a first defect inspection device 11, a second defect inspection device 12, and a recording device 13. , The first length measuring device 14 and the second length measuring device 15, and the control device 16.

搬送線L乃係形成將作為檢查對象的膜進行搬送的搬送路徑,在本實施形態中係由前述第1搬送線101、第3搬送線103及第5搬送線105構成搬送線L。 The transfer line L forms a transfer path for transferring the film to be inspected. In the present embodiment, the transfer line L is constituted by the aforementioned first transfer line 101, third transfer line 103, and fifth transfer line 105.

第1缺陷檢查裝置11乃係進行貼合第2膜F102及第3膜F103前的第1膜F101的缺陷檢查。具體而言,該第1缺陷檢查裝置11係檢測在製造第1膜F101時和搬送第1膜F101時產生的異物缺陷、凹凸缺陷、亮點缺陷等各種缺陷。第1缺陷檢查裝置11係藉由對以第1搬送線101搬送的第1膜F101,例如執行反射檢查、穿透檢查、斜穿透檢查、正交偏光(crossed Nicols)穿透檢查等檢查處理,而檢測出第1膜F101的缺陷。 The first defect inspection device 11 performs a defect inspection of the first film F101 before bonding the second film F102 and the third film F103. Specifically, the first defect inspection device 11 detects various defects such as a foreign object defect, a concave-convex defect, and a bright-spot defect that occur when the first film F101 is manufactured and when the first film F101 is transported. The first defect inspection device 11 performs inspection processing such as reflection inspection, penetration inspection, oblique penetration inspection, and crossed Nicols penetration inspection on the first film F101 transported by the first transport line 101. , And a defect of the first film F101 is detected.

第1缺陷檢查裝置11係在第1搬送線101中比第1夾輥111a、111b更上游側之處具有:複數個照明部21a至23a,係對第1膜F101照射照明光;及複數個光檢測部21b至23b,係檢測穿透第1膜F101的光(穿透光)或由第1膜F101所反射的光(反射光)。 The first defect inspection device 11 includes a plurality of illumination sections 21a to 23a on the first conveying line 101 upstream of the first pinch rollers 111a and 111b, and irradiates illumination light to the first film F101; and The light detecting sections 21b to 23b detect light (transmitted light) that has passed through the first film F101 or light (reflected light) that has been reflected by the first film F101.

在本實施形態中係構成為檢測穿透光,故沿第1膜F101的搬送方向排列的複數個照明部21a至23a與光檢測部21b至23b係分別隔著第1膜F101相對向配置。此外,在第1缺陷檢查裝置11中並不限於檢測該穿透光之構成,亦可構成為檢測反射光、或檢測穿透光及反射 光之構成。當是檢測出反射光時,只要將光檢測部21b至23b配置在照明部21a至23a側即可。 In this embodiment, since it is configured to detect transmitted light, the plurality of illumination portions 21a to 23a and the light detection portions 21b to 23b arranged along the conveyance direction of the first film F101 are disposed opposite to each other with the first film F101 interposed therebetween. In addition, the first defect inspection device 11 is not limited to a configuration for detecting the transmitted light, and may be configured to detect reflected light, or detect transmitted light and reflected light. When the reflected light is detected, the light detection sections 21b to 23b may be disposed on the illumination sections 21a to 23a.

照明部21a至23a係將相應於缺陷檢查的種類而調整光強度、波長、偏光狀態等之照明光照射至第1膜F101。光檢測部21b至23b係使用CCD(Charge Coupled Device;電荷耦合元件)等攝像元件,來拍攝第1膜F101受照明光照射之位置的圖像。以光檢測部21b至23b拍攝的圖像(缺陷檢查的結果)係輸出給控制裝置16。 The illuminating sections 21a to 23a irradiate the first film F101 with illumination light whose light intensity, wavelength, and polarization state are adjusted according to the type of defect inspection. The light detecting sections 21b to 23b use an imaging element such as a CCD (Charge Coupled Device) to capture an image of a position where the first film F101 is illuminated by the illumination light. The images (results of defect inspection) captured by the light detection sections 21 b to 23 b are output to the control device 16.

第2缺陷檢查裝置12乃係進行貼合第2膜F102及第3膜F103後的第1膜F101、亦即雙面貼合膜F105的缺陷檢查。具體而言,該第2缺陷檢查裝置12係檢測在將第2膜F102及第3膜F103貼合至第1膜F101時、及搬送單面貼合膜F104及雙面貼合膜F105時產生的異物缺陷、凹凸缺陷、亮點缺陷等各種缺陷。第2缺陷檢查裝置12係藉由對以第5搬送線105搬送的雙面貼合膜F105,例如執行反射檢查、穿透檢查、斜穿透檢查、正交偏光穿透檢查等檢查處理,而檢測出雙面貼合膜F105的缺陷。 The second defect inspection device 12 performs a defect inspection of the first film F101 after bonding the second film F102 and the third film F103, that is, the double-sided bonding film F105. Specifically, the second defect inspection device 12 detects when the second film F102 and the third film F103 are bonded to the first film F101, and when the single-sided bonding film F104 and the double-sided bonding film F105 are transported. Various defects such as foreign object defects, bump defects, bright spot defects. The second defect inspection device 12 performs inspection processing such as reflection inspection, penetration inspection, oblique penetration inspection, and orthogonal polarization penetration inspection on the double-sided bonding film F105 transported by the fifth transport line 105, and Defects in the double-sided bonding film F105 were detected.

第2缺陷檢查裝置12係在第5搬送線105中比第5夾輥151a、151b更下游側之處具有:複數個照明部24a、25a,係對雙面貼合膜F105照射照明光;及複數個光檢測部24b、25b,係檢測穿透雙面貼合膜F105的光(穿透光)或由雙面貼合膜F105所反射的光(反射光)。 The second defect inspection device 12 includes a plurality of illumination portions 24a and 25a on the fifth conveying line 105 further downstream than the fifth pinch rollers 151a and 151b, and irradiates the double-sided bonding film F105 with illumination light; and The plurality of light detecting sections 24b and 25b detect light (penetrated light) transmitted through the double-sided bonding film F105 or light (reflected light) reflected by the double-sided bonded film F105.

在本實施形態中係構成為檢測穿透光,故沿雙面貼合膜F105的搬送方向排列的複數個照明部24a、 25a與光檢測部24b、25b係分別隔著雙面貼合膜F105相對向配置。此外,在第2缺陷檢查裝置12中並不限於檢測該穿透光之構成為,亦可為檢測反射光、或檢測穿透光及反射光之構成。當是檢測反射光時,只要將光檢測部24b、25b配置在照明部24a、25a側即可。 In the present embodiment, since it is configured to detect transmitted light, the plurality of illumination portions 24a, 25a and the light detection portions 24b, 25b arranged along the conveying direction of the double-sided bonding film F105 are respectively disposed through the double-sided bonding film F105. Relative configuration. In addition, the second defect inspection device 12 is not limited to a configuration that detects the transmitted light, and may be a configuration that detects reflected light, or detects transmitted light and reflected light. In the case of detecting the reflected light, the light detection sections 24b and 25b may be disposed on the side of the illumination sections 24a and 25a.

照明部24a、25a係將相應於缺陷檢查的種類而調整光強度、波長、偏光狀態等之照明光照射至雙面貼合膜F105。光檢測部24b、25b係使用CCD等攝像元件,拍攝雙面貼合膜F105受照明光照射之位置的圖像。以光檢測部24b、25b拍攝的圖像(缺陷檢查的結果)係輸出給控制裝置16。 The illuminating sections 24 a and 25 a irradiate the double-sided bonding film F105 with illumination light whose light intensity, wavelength, and polarization state are adjusted according to the type of defect inspection. The light detection sections 24b and 25b use an imaging element such as a CCD to capture an image of a position where the double-sided bonding film F105 is illuminated by the illumination light. The images (results of defect inspection) captured by the light detection units 24 b and 25 b are output to the control device 16.

記錄裝置13乃係根據第1缺陷檢查裝置11及第2缺陷檢查裝置12的缺陷檢查的結果對缺陷部位施作標記的印字裝置。記錄裝置13係設置在第5搬送線105中比第2缺陷檢查裝置12更下游側之處。記錄裝置13係例如具有採用噴墨(inkjet)方式的複數個印字頭13a。另外,關於印字頭13a,亦可為採用雷射(laser)方式者。 The recording device 13 is a printing device for marking a defective part based on the results of the defect inspection by the first defect inspection device 11 and the second defect inspection device 12. The recording device 13 is provided on the fifth transfer line 105 further downstream than the second defect inspection device 12. The recording device 13 includes, for example, a plurality of print heads 13 a using an inkjet method. The print head 13a may be a laser type.

如第5圖所示,複數個印字頭13a係沿與雙面貼合膜F105的搬送方向交叉的方向(寬度方向)排列配置。此外,在各印字頭13a中,係沿與雙面貼合膜F105的搬送方向交叉的方向(寬度方向)以預定之間隔排列配置有噴出墨水的噴嘴(nozzle)部(印字部)13b。各印字頭13a的噴嘴部13b係相對向於雙面貼合膜F105,從雙面貼合膜F105的寬度方向的一端側等間隔地排列配置到另一端側。 As shown in FIG. 5, the plurality of printing heads 13 a are arranged in a direction (width direction) that intersects the conveying direction of the double-sided bonding film F105. In addition, in each of the print heads 13a, nozzle portions (printing portions) 13b that eject ink are arranged at predetermined intervals in a direction (width direction) that intersects the conveying direction of the double-sided bonding film F105. The nozzle portions 13b of the print heads 13a are arranged at equal intervals from the one end side in the width direction of the double-sided bonding film F105 to the other end side with respect to the double-sided bonding film F105.

此外,在與複數個印字頭13a相對向的位置係配置有與雙面貼合膜F105相接的第7導輥153c。此外,各印字頭13a的噴嘴部13b係從雙面貼合膜F105之與第7導輥153c相接之位置的相反側,朝雙面貼合膜F105的表面噴出墨水。藉此,便能夠在雙面貼合膜F105的表面印字(標記)點狀的記號。 In addition, a seventh guide roller 153c that is in contact with the double-sided bonding film F105 is disposed at a position facing the plurality of print heads 13a. In addition, the nozzle portion 13b of each print head 13a ejects ink toward the surface of the double-sided bonding film F105 from the opposite side of the position where the double-sided bonding film F105 is in contact with the seventh guide roller 153c. Thereby, a dot-shaped mark can be printed (marked) on the surface of the double-sided bonding film F105.

第1測長器14及第2測長器15乃係測量第1膜F101的搬送量。具體而言,在本實施形態中,係在第1搬送線101中位於比第1蓄料器112更上游側之處的第1夾輥111a配置有構成第1測長器14的旋轉編碼器(rotary encoder)、及在位於比第1蓄料器112更下游側的第3夾輥131a配置有構成第2測長器15的旋轉編碼器。 The first length measuring device 14 and the second length measuring device 15 measure the conveyance amount of the first film F101. Specifically, in this embodiment, the first nip roller 111a located on the first conveying line 101 on the upstream side of the first accumulator 112 is provided with a rotary encoder constituting the first length measuring device 14. (rotary encoder) and the third nip roller 131 a located further downstream than the first accumulator 112 are provided with a rotary encoder constituting the second length measuring device 15.

關於第1測長器14及第2測長器15,係相應於與第1膜F101相接而旋轉的第1夾輥111a及第3夾輥131a的旋轉變位量,由旋轉編碼器來測量第1膜F101的搬送量。第1測長器14及第2測長器15的測量結果係輸出給控制裝置16。 Regarding the first length measuring device 14 and the second length measuring device 15, the amount of rotation displacement of the first pinch roller 111a and the third pinch roller 131a that rotates in contact with the first film F101 is determined by a rotary encoder. The conveyance amount of the first film F101 was measured. The measurement results of the first length measuring device 14 and the second length measuring device 15 are output to the control device 16.

另外,在本實施形態中,在第1缺陷檢查裝置11與記錄裝置13之間只存在一個蓄料器,故成為在該蓄料器的上游側與下游側各配置有一個測長器之構成。另一方面,當在第1缺陷檢查裝置11與記錄裝置13之間存在有複數個蓄料器時,只要構成為在其中位於最上游側的蓄料器的上游側與其中位於最下游側的蓄料器的下游側各配置有一個測長器即可。 In addition, in this embodiment, since there is only one accumulator between the first defect inspection device 11 and the recording device 13, a configuration is provided in which one length measuring device is disposed on each of the upstream side and the downstream side of the accumulator. . On the other hand, when there are a plurality of accumulators between the first defect inspection device 11 and the recording device 13, it is only necessary to configure an upstream side of the accumulator located on the most upstream side and a downstream side of the accumulator located on the most downstream side. One length measuring device may be arranged on each of the downstream sides of the accumulator.

控制裝置16乃係統籌控制膜製造裝置100之各部。具體而言,該控制裝置16係具備作為電子控制裝置的電腦系統(computer system)。電腦系統概略上係具備:CPU(Central Processing Unit;中央處理器)等運算處理部、及記憶體(memory)和硬碟(hard disc)等資訊記憶部。 The control device 16 is a part of the system control film manufacturing device 100. Specifically, the control device 16 includes a computer system as an electronic control device. The computer system is roughly equipped with an arithmetic processing unit such as a CPU (Central Processing Unit), and an information storage unit such as a memory and a hard disc.

在控制裝置16的資訊記憶部係記錄有控制電腦系統之作業系統(OS;Operation System)、及令運算處理部執行膜製造裝置100各部中的各種處理之程式(program)等。此外,控制裝置16係亦可含有執行膜製造裝置100各部的控制所需的各種處理之ASIC(Application Specific Integrated Circuit;特定應用積體電路)等邏輯電路。此外,控制裝置16係含有供進行電腦系統與外部裝置間的輸入輸出用的介面(interface)。在該介面係例如能夠連接有鍵盤(keyboard)和滑鼠(mouse)等輸入裝置、液晶顯示器等顯示裝置、通信裝置等。 An information storage unit of the control device 16 stores an operating system (OS) that controls a computer system, and a program that causes an arithmetic processing unit to execute various processes in each unit of the film manufacturing apparatus 100. In addition, the control device 16 may include a logic circuit such as an ASIC (Application Specific Integrated Circuit) that executes various processes required for controlling each part of the film manufacturing device 100. The control device 16 includes an interface for inputting and outputting between a computer system and an external device. An input device such as a keyboard and a mouse, a display device such as a liquid crystal display, and a communication device can be connected to the interface.

控制裝置16係作為根據前述第1缺陷檢查裝置11及第2缺陷檢查裝置12的缺陷檢查的結果對複數個印字頭13a的噴嘴部13b之驅動進行控制的控制部發揮功能。亦即,該控制裝置16係解析以光檢測部21b至23b及光檢測部24b、25b所拍攝的圖像,判別缺陷的有無(位置)和種類等。接著,當判定為在第1膜F101和雙面貼合膜F105存在缺陷時,進行對符合條件的噴嘴部13b之驅動進行控制而對雙面貼合膜F105的缺陷部位施作標記的缺陷標記。 The control device 16 functions as a control unit that controls the driving of the nozzle portions 13 b of the plurality of print heads 13 a based on the results of the defect inspection by the first defect inspection device 11 and the second defect inspection device 12. That is, the control device 16 analyzes the images captured by the light detection sections 21b to 23b and the light detection sections 24b and 25b, and determines the presence (position), type, and the like of defects. Next, when it is determined that there is a defect in the first film F101 and the double-sided bonding film F105, the driving of the nozzle portion 13b that meets the conditions is controlled to mark a defective portion of the defective portion of the double-sided bonding film F105. .

此外,在缺陷標記裝置10中,係以避免雙面貼合膜F105的缺陷檢查位置與缺陷部位的標記位置之間產生位差的方式,在缺陷檢查後於預定之時序(timing)進行缺陷標記。例如,在本實施形態中,係計算在以第1缺陷檢查裝置11或第2缺陷檢查裝置12所進行的缺陷檢查的時刻以後,在搬送線L上搬送的膜的搬送量,當所算出的搬送量與偏置(offset)距離一致時,以記錄裝置13進行缺陷標記。 In addition, in the defect marking device 10, a method of avoiding generation of a step difference between the defect inspection position of the double-sided bonding film F105 and the mark position of the defect portion is performed, and the defect marking is performed at a predetermined timing after the defect inspection. . For example, in the present embodiment, the amount of film transported on the transport line L after the time of the defect inspection by the first defect inspection apparatus 11 or the second defect inspection apparatus 12 is calculated. When the conveyance amount and the offset distance match, the defect marking is performed by the recording device 13.

此處,偏置距離係指第1缺陷檢查裝置11及第2缺陷檢查裝置12、與記錄裝置13之間的膜的搬送距離。精確地說,偏置距離係定義為:以第1缺陷檢查裝置11及第2缺陷檢查裝置12進行缺陷檢查的位置(缺陷檢查位置)、與以記錄裝置13施作標記的位置(標記位置)之間之膜的搬送距離。此外,偏置距離係一旦令第1蓄料器112運轉便變動。 Here, the offset distance means a transport distance of the film between the first defect inspection device 11 and the second defect inspection device 12 and the recording device 13. Specifically, the offset distance is defined as a position (defect inspection position) where the defect inspection is performed by the first defect inspection device 11 and the second defect inspection device 12 and a position (mark position) where the recording device 13 marks Transport distance between films. The offset distance varies when the first accumulator 112 is operated.

第1蓄料器112非運轉時的偏置距離(以下,稱為第1偏置距離)係已預先記憶在控制裝置16的資訊記憶部。具體而言,在第1缺陷檢查裝置11及第2缺陷檢查裝置12係存在有複數個光檢測部21b至23b及光檢測部24b、25b,就每個光檢測部21b至25b進行缺陷檢查。因此,在控制裝置16的資訊記憶部中,係就每個光檢測部21b至25b記憶第1偏置距離。 The offset distance (hereinafter referred to as the first offset distance) when the first accumulator 112 is not in operation is stored in the information storage section of the control device 16 in advance. Specifically, the first defect inspection device 11 and the second defect inspection device 12 include a plurality of light detection sections 21b to 23b and light detection sections 24b and 25b, and defect inspection is performed for each of the light detection sections 21b to 25b. Therefore, the information storage section of the control device 16 stores the first offset distance for each of the light detection sections 21b to 25b.

當因第1蓄料器112的運轉使偏置距離發生變動時,係根據第1蓄料器112的上游側與下游側之間的 第1膜F101的搬送量之差,算出偏置距離的補正值。亦即,在控制裝置16中,係從第1測長器14及第2測長器15的測量結果算出藉由第1蓄料器112而蓄積的第1膜F101之蓄積量,並根據該第1膜F101之蓄積量,算出偏置距離的補正值。 When the offset distance is changed due to the operation of the first accumulator 112, the offset distance is calculated based on the difference between the conveyance amount of the first film F101 between the upstream side and the downstream side of the first accumulator 112. Correction value. That is, the control device 16 calculates the accumulation amount of the first film F101 accumulated by the first accumulator 112 from the measurement results of the first length measuring device 14 and the second length measuring device 15, and based on the The accumulated amount of the first film F101 is used to calculate a correction value for the offset distance.

在缺陷標記裝置10中,於第1蓄料器112的運轉時,根據偏置距離的補正值,對記錄裝置13施作標記的時序進行補正。例如,在本實施形態中,係根據第1測長器14及第2測長器15的測量結果,算出偏置距離的補正值。控制裝置16係根據該補正值及第1偏置距離,算出第1蓄料器112運轉時的偏置距離(以下,稱為第2偏置距離)。 In the defect marking device 10, when the first accumulator 112 is in operation, the timing of marking the recording device 13 is corrected based on the correction value of the offset distance. For example, in this embodiment, the correction value of the offset distance is calculated based on the measurement results of the first length measuring device 14 and the second length measuring device 15. The control device 16 calculates an offset distance (hereinafter, referred to as a second offset distance) when the first accumulator 112 is operated based on the correction value and the first offset distance.

在本實施形態中,係根據第1測長器14或第2測長器15的測量結果,計算在以第1缺陷檢查裝置11及第2缺陷檢查裝置12所進行的缺陷檢查的時刻以後,在搬送線L上搬送的膜的搬送量,當所算出的搬送量與第2偏置距離一致時,以記錄裝置13進行缺陷標記。 In this embodiment, based on the measurement results of the first length measuring device 14 or the second length measuring device 15, calculation is performed after the time of the defect inspection by the first defect inspection device 11 and the second defect inspection device 12, When the transport amount of the film transported on the transport line L is consistent with the second offset distance, the defect marking is performed by the recording device 13.

此外,在本實施形態中,於第1蓄料器112的運轉時,亦可將表示第1蓄料器112運轉過的資訊(以下,稱為蓄料器運轉資訊)有別於缺陷標記另外記錄在雙面貼合膜F105。當記錄有蓄料器運轉資訊時,能夠藉由操作人員(operator)仔細地檢查附加有蓄料器運轉資訊之部分的缺陷部位而檢測出標記位置的位差等。藉此,將良品部分誤判定為缺陷部位的可能性會減少,以謀求良率的提升。 In addition, in the present embodiment, during the operation of the first accumulator 112, the information indicating that the first accumulator 112 has been operated (hereinafter referred to as the accumulator operation information) may be distinguished from the defect mark. Recorded on the double-sided bonding film F105. When the operation information of the accumulator is recorded, the operator can carefully check the defect position of the part to which the operation information of the accumulator is added to detect the position difference of the mark position and the like. Thereby, the possibility of erroneously determining a good part as a defective part is reduced, so as to improve the yield.

此外,在本實施形態的缺陷標記裝置10中,例如,如第6圖所示,係以使缺陷D位於在雙面貼合膜F105的寬度方向相鄰的第1印字樣式PT1與第2印字樣式PT2之間的方式,將第1印字樣式PT1及第2印字樣式PT2印字在雙面貼合膜F105的表面。 In addition, in the defect marking device 10 of this embodiment, for example, as shown in FIG. 6, the defect D is located in the first printing pattern PT1 and the second printing adjacent to each other in the width direction of the double-sided bonding film F105. In the method between the patterns PT2, the first printing pattern PT1 and the second printing pattern PT2 are printed on the surface of the double-sided bonding film F105.

在本實施形態中,就第1印字樣式PT1及第2印字樣式PT2而言,係沿雙面貼合膜F105的搬送方向(長邊方向)排列印字複數個點狀的記號DM。記號DM乃係能夠藉由目視觀察而看到之程度的大小,具體而言,其直徑為5mm(millimeter;毫米)以下(更佳為1mm以上且3mm以下)。 In this embodiment, the first printing pattern PT1 and the second printing pattern PT2 are printed with a plurality of dot-shaped marks DM along the conveying direction (long-side direction) of the double-sided bonding film F105. The symbol DM is a size that can be seen by visual observation, and specifically, its diameter is 5 mm (millimeter; millimeter) or less (more preferably, 1 mm or more and 3 mm or less).

控制裝置16係從沿雙面貼合膜F105的寬度方向排列的複數個噴嘴部13b之中,選擇印字第1印字樣式PT1及第2印字樣式PT2的兩個噴嘴部13b。接著,該等被選擇到的兩個噴嘴部13b係在隔著缺陷D的雙面貼合膜F105的寬度方向(短邊方向)的兩側,印字第1印字樣式PT1與第2印字樣式PT2。 The control device 16 selects two nozzle portions 13b for printing the first printing pattern PT1 and the second printing pattern PT2 from the plurality of nozzle portions 13b arranged in the width direction of the double-sided bonding film F105. Next, the two selected nozzle portions 13b are on both sides of the width direction (short side direction) of the double-sided bonding film F105 with the defect D, and the first printing pattern PT1 and the second printing pattern PT2 are printed. .

此時,藉由使缺陷D位於第1印字樣式PT1與第2印字樣式PT2之間,即能夠標示位於其間的缺陷D的位置。藉此,在標記後的目視檢查(品檢)中,即能夠容易地掌握缺陷D的位置。 At this time, by positioning the defect D between the first printing pattern PT1 and the second printing pattern PT2, the position of the defect D located therebetween can be marked. Thereby, in the visual inspection (quality inspection) after marking, the position of the defect D can be easily grasped.

此外,藉由第1印字樣式PT1與第2印字樣式PT2之間隔,即能夠辨識到位於其間的缺陷D的大小。因此,針對所選擇的兩個噴嘴部13b,未必限於選擇 沿著雙面貼合膜F105的寬度方向排列的複數個噴嘴部13b中之相鄰的噴嘴部13b,只要配合缺陷D的位置及大小適當地選擇兩個噴嘴部13b即可。 In addition, the distance between the first printing pattern PT1 and the second printing pattern PT2 can recognize the size of the defect D located therebetween. Therefore, the selected two nozzle portions 13b are not necessarily limited to the selection of adjacent nozzle portions 13b of the plurality of nozzle portions 13b arranged along the width direction of the double-sided bonding film F105, as long as the position and size of the defect D are matched. The two nozzle portions 13b may be appropriately selected.

此外,藉由使缺陷D位於第1印字樣式PT1與第2印字樣式PT2之間,在將缺陷部分自雙面貼合膜F105切取下來時,便在第1印字樣式PT1與第2印字樣式PT2其中任一者與缺陷D之間進行切割。 In addition, since the defect D is located between the first printing pattern PT1 and the second printing pattern PT2, when the defect portion is cut from the double-sided bonding film F105, the first printing pattern PT1 and the second printing pattern PT2 are cut. Cutting is performed between any of them and the defect D.

此時,便在因切割而切取下來之側與因切割而切剩之側殘留有第1印字樣式PT1與第2印字樣式PT2其中任一者。藉此,缺陷D是位於因切割而切取下來之側與因切割而切剩之側的其中的哪一側,即能夠藉由切割後殘留的第1印字樣式PT1或第2印字樣式PT2而容易地確認缺陷的位置。 At this time, any one of the first printing pattern PT1 and the second printing pattern PT2 remains on the side cut off by cutting and the side left by cutting. By this, the defect D is located on which of the side cut off due to cutting and the side left over due to cutting, that is, the first printing pattern PT1 or the second printing pattern PT2 remaining after cutting can be easily made. Confirm the location of the defect.

此外,針對第1印字樣式PT1及第2印字樣式PT2,係能夠使用能夠消除的墨水進行印字。如前所述,標記後的目視檢查(品檢)有時仍會容許缺陷部分作為製品。此時,藉由消除第1印字樣式PT1及第2印字樣式PT2,即能夠將該部分作為製品使用,能夠謀求產率的提升。 The first printing pattern PT1 and the second printing pattern PT2 can be printed using erasable ink. As described above, the visual inspection (quality inspection) after marking sometimes allows defective parts to be used as products. At this time, by eliminating the first printing pattern PT1 and the second printing pattern PT2, the portion can be used as a product, and productivity can be improved.

針對能夠消除的墨水,能夠使用對從酮(ketone)類(甲基乙基酮(methyl ethyl ketone)、丙酮(acetone)等)、酯(ester)類(乙酸乙酯(ethyl acetate)、乙酸丙酯(propyl acetate)等)、醇(alcohol)類(乙醇(ethanol)、2-丙醇(propanol)等)中適當地選擇出的溶劑添加著色劑及製膜用樹脂等而 成的油性墨水。此外,亦可視需要而添加硬化劑和界面活性劑等。另一方面,就用以消除墨水的溶劑而言,能夠使用與上述溶劑相同的溶劑。另外,就使用甲苯(toluene)和二甲苯(xylene)等芳香族烴類而言,因會侵蝕光學膜(偏光板)的材質,故不宜使用。 For erasable inks, ketones (methyl ethyl ketone, acetone, etc.), esters (ethyl acetate, acetic acid acetate) can be used. An oil-based ink obtained by adding a coloring agent, a film-forming resin, or the like to a solvent appropriately selected from propyl acetate and the like (alcohol) (ethanol, 2-propanol, and the like). In addition, hardeners and surfactants can be added as needed. On the other hand, as the solvent for erasing the ink, the same solvent as that described above can be used. In addition, the use of aromatic hydrocarbons such as toluene and xylene is not suitable because the material of the optical film (polarizing plate) is eroded.

此外,在本實施形態的缺陷標記裝置10中,係藉由第1印字樣式PT1與第2印字樣式PT2其中任一者或兩者的印字樣式來記錄與缺陷D有關的資訊。 In addition, in the defect marking device 10 according to the present embodiment, information related to the defect D is recorded by using one or both of the first printing pattern PT1 and the second printing pattern PT2.

具體而言,控制裝置16係在印字第1印字樣式PT1及第2印字樣式PT2時,對所選擇的噴嘴部13b,依據要記錄的與缺陷D有關的資訊(缺陷資訊),進行變更第1印字樣式PT1與第2印字樣式PT2其中任一者或兩者的印字樣式(在本實施形態中為第1印字樣式PT1及第2印字樣式PT2)之控制。 Specifically, when the control device 16 prints the first print pattern PT1 and the second print pattern PT2, the selected nozzle portion 13b changes the first nozzle pattern 13b in accordance with the information (defect information) related to the defect D to be recorded. Either or both of the printing pattern PT1 and the second printing pattern PT2 (in this embodiment, the first printing pattern PT1 and the second printing pattern PT2) are controlled.

例如,在本實施形態中,係依據要記錄的缺陷資訊,變更構成第1印字樣式PT1及第2印字樣式PT2的記號DM的數目與間隔。藉此,能夠在對缺陷部位施作標記的同時記錄缺陷資訊。 For example, in this embodiment, the number and interval of the marks DM constituting the first printing pattern PT1 and the second printing pattern PT2 are changed according to the defect information to be recorded. Thereby, it is possible to record defect information while marking a defective portion.

缺陷資訊乃係缺陷D的位置和種類、尺寸、檢查方法(缺陷檢查的種類)等與缺陷D有關的資訊。對第1印字樣式PT1及第2印字樣式PT2係以能夠識別出該等缺陷資訊的方式預先設定記號DM的數目與間隔。 Defect information is information related to defect D, such as the position and type, size, and inspection method (type of defect inspection) of defect D. The first printing pattern PT1 and the second printing pattern PT2 are set in advance in the number and interval of the marks DM so that the defect information can be identified.

例如,第6圖中所示的第1印字樣式PT1及第2印字樣式PT2分別係沿雙面貼合膜F105的一個方 向、亦即搬送方向(長邊方向)排列印字五個記號DM。其中,分別在上游側配置兩個記號DM及在下游側配置三個記號DM。此外,在上游側的記號DM與下游側的記號DM之間設置有一個記號範圍的空白(空出間隔而形成的部分)K。 For example, the first printing pattern PT1 and the second printing pattern PT2 shown in FIG. 6 are arranged in such a manner that five marks DM are printed along one direction of the double-sided bonding film F105, that is, the conveying direction (long-side direction). Among them, two symbols DM are arranged on the upstream side and three symbols DM are arranged on the downstream side, respectively. In addition, a blank (a portion formed by leaving a gap) K in a range of a mark is provided between the mark DM on the upstream side and the mark DM on the downstream side.

空白K係配置成在雙面貼合膜F105的另一個方向、亦即寬度方向(短邊方向)與缺陷D大致同列。亦即,該空白K係標示缺陷D於雙面貼合膜F105的搬送方向(長邊方向)的位置。另外,當缺陷D比空白K大時,較佳為將空白K配置在與缺陷D的中心相鄰的位置。 The blank K series is arranged in the other direction of the double-sided bonding film F105, that is, in the width direction (short-side direction), and is substantially in the same row as the defect D. That is, the blank K indicates the position of the defect D in the conveying direction (long-side direction) of the double-sided bonding film F105. When the defect D is larger than the blank K, it is preferable to arrange the blank K at a position adjacent to the center of the defect D.

此時,不僅能夠標示缺陷D位於第1印字樣式PT1與第2印字樣式PT2之間,還能夠藉由空白K標示缺陷D位於上游側的記號DM與下游側的記號DM之間。藉此,能夠更容易地掌握缺陷D的位置。此外,在跨越缺陷D將料片切取下來時,藉由檢視殘留的記號DM,即能夠判別在該料片是否存在有缺陷D。藉此,能夠使雙面貼合膜F105的利用效率提升。 At this time, not only can the defect D be located between the first printing pattern PT1 and the second printing pattern PT2, but also the blank D can be used to indicate that the defect D is located between the mark DM on the upstream side and the mark DM on the downstream side. Thereby, the position of the defect D can be grasped more easily. In addition, when cutting a piece of material across the defect D, by examining the remaining mark DM, it is possible to determine whether there is a defect D in the piece of material. Thereby, the utilization efficiency of the double-sided bonding film F105 can be improved.

此外,由於上游側與下游側的記號DM的數目不同,因此即使是在自雙面貼合膜F105切取下來之後仍然能夠容易地掌握雙面貼合膜F105的搬送方向(第6圖中箭頭所示之方向)。 In addition, since the number of marks DM on the upstream side and the downstream side are different, the conveyance direction of the double-sided laminated film F105 can be easily grasped even after being cut off from the double-sided laminated film F105 (indicated by the arrow in FIG. Show direction).

此外,從缺陷D與空白K於雙面貼合膜F105的搬送方向(長邊方向)的位差量,能夠掌握缺陷檢查位置與標記位置之間的時序的時差量。此外,根據該時差 量,能夠容易地調整以記錄裝置13進行標記的時序。 In addition, the amount of time difference between the defect inspection position and the mark position can be grasped from the amount of disparity between the defect D and the blank K in the conveying direction (long-side direction) of the double-sided bonding film F105. In addition, based on the time difference, the timing of marking by the recording device 13 can be easily adjusted.

關於空白K的大小,較佳為將隔著空白K之兩側的記號DM的間隔(中心間距離)T2設為比沿搬送方向以一定之間隔排列的記號DM的間隔(中心間距離)T1更大。更具體言之,較佳為採用1.2≦T2/T1≦3.0的範圍,更佳為採用1.5≦T2/T1≦2.5的範圍。 Regarding the size of the blank K, it is preferable to set the interval (distance between centers) T2 of the marks DM across the two sides of the blank K to be longer than the interval (distance between centers) T1 of the marks DM arranged at a certain interval along the conveying direction. Bigger. More specifically, a range of 1.2 ≦ T2 / T1 ≦ 3.0 is preferably used, and a range of 1.5 ≦ T2 / T1 ≦ 2.5 is more preferably used.

如以上所述,依據本實施形態,藉由上述的第1印字樣式PT1及第2印字樣式PT2,能夠標示缺陷D的位置並且記錄缺陷資訊。 As described above, according to this embodiment, the position of the defect D and the defect information can be recorded by the first printing pattern PT1 and the second printing pattern PT2 described above.

另外,本發明並不限於上述實施形態,在不脫離本發明主旨的範圍內,能夠施行各種變更。 The present invention is not limited to the embodiments described above, and various changes can be made without departing from the spirit of the present invention.

例如,針對第1印字樣式PT1及第2印字樣式PT2,並不限於變更前述記號DM的數目和間隔,其他例如還能夠變更尺寸(直徑)和顏色(紅、藍、黑等。較佳為黑)等。亦即,只要變更點狀的記號DM的數目、間隔、尺寸(直徑)、顏色其中任一者以上即可。藉此,可更加細微地設定該些印字樣式PT1、PT2,即能夠記錄更多的資訊。 For example, the first printing pattern PT1 and the second printing pattern PT2 are not limited to changing the number and interval of the aforementioned marks DM. For example, the size (diameter) and color (red, blue, black, etc.) can be changed. Black is preferred. )Wait. That is, it is only necessary to change the number, interval, size (diameter), and color of the dot-shaped marks DM. Thereby, the printing patterns PT1 and PT2 can be set more finely, that is, more information can be recorded.

此外,例如,如第7圖所示,針對第1印字樣式PT1及第2印字樣式PT2,並不限於前述點狀的記號DM,亦可為沿雙面貼合膜F105的搬送方向(長邊方向)印字線狀的記號LM。 In addition, for example, as shown in FIG. 7, the first printing pattern PT1 and the second printing pattern PT2 are not limited to the aforementioned dot-shaped mark DM, and may be along the conveying direction (long side) of the double-sided bonding film F105. (Direction) Printed line-shaped mark LM.

此時,不僅能夠使用前述噴墨方式的印字頭13a,例如還能夠使用沿與雙面貼合膜F105的搬送方向交叉的方向(寬度方向)排列的複數個標記器(marker)(印字 部)。關於標記器,並無特別限定,例如有記號筆(pen marker)和雷射刻印器(laser rmarker)等。 In this case, not only the inkjet printing head 13a can be used, but also, for example, a plurality of markers (printing sections) arranged in a direction (width direction) intersecting with the conveying direction of the double-sided bonding film F105 can be used. . The marker is not particularly limited, and examples thereof include a pen marker and a laser rmarker.

在印字線狀的記號LM來記錄缺陷資訊的情形時,係依據要記錄的缺陷資訊,沿雙面貼合膜F105的搬送方向(長邊方向)排列配置至少一個或複數個記號LM,且變更線狀的記號LM的數目、間隔、尺寸(長度、粗細)、顏色其中任一者以上。藉此,與印字點狀的記號DM印字的情形同樣地,能夠記錄缺陷資訊。此外,當在線狀的記號LM設置空白K時,較佳為將該空白K的間隔設為3mm至5mm程度。 When the line-shaped mark LM is printed to record defect information, at least one or a plurality of marks LM are arranged along the conveying direction (long side direction) of the double-sided bonding film F105 according to the defect information to be recorded, and the change is changed. Any one or more of the number, interval, size (length, thickness), and color of the linear marks LM. Thereby, defect information can be recorded in the same manner as in the case of printing the dot-shaped mark DM. When a blank K is provided on the linear mark LM, the interval between the blank K is preferably about 3 mm to 5 mm.

此外,例如如第8圖(a)至(c)所示,亦可印字在雙面貼合膜F105的寬度方向(短邊方向)與第1印字樣式PT1與第2印字樣式PT2其中任一者或兩者相鄰的第3印字樣式PT3。 In addition, for example, as shown in Figs. 8 (a) to (c), it is possible to print on any of the width direction (short side direction) of the double-sided bonding film F105 and the first printing pattern PT1 and the second printing pattern PT2. Or the third printing pattern PT3 adjacent to each other.

此時,控制裝置16係有別於印字前述第1印字樣式PT1及第2印字樣式PT2的兩個噴嘴部13b而另外選擇印字第3印字樣式PT3的噴嘴部13b。針對印字第3印字樣式PT3的噴嘴部13b,係能夠依據要記錄的缺陷資訊,選擇至少一個或複數個噴嘴部13b。 At this time, the control device 16 selects the nozzle portion 13b for printing the third printing pattern PT3 separately from the two nozzle portions 13b for printing the first printing pattern PT1 and the second printing pattern PT2. For the nozzle portion 13b of the third printing pattern PT3, at least one or a plurality of nozzle portions 13b can be selected according to the defect information to be recorded.

亦即,針對第3印字樣式PT3,係能夠相應於要記錄的缺陷資訊適當地選擇下述等樣式:如第8圖(a)所示相鄰於第1印字樣式PT1與第2印字樣式PT2其中任一者進行印字;如第8圖(b)所示相鄰於第1印字樣式PT1及第2印字樣式PT2之兩側進行印字;如第8圖(c)所示沿 雙面貼合膜F105的寬度方向(短邊方向)排列印字複數個。 That is, for the third printing pattern PT3, the following patterns can be appropriately selected according to the defect information to be recorded: as shown in FIG. 8 (a), adjacent to the first printing pattern PT1 and the second printing pattern PT2 Either is used for printing; as shown in Fig. 8 (b), adjacent to the two sides of the first printing pattern PT1 and the second printing pattern PT2; printing is performed on both sides as shown in Fig. 8 (c) A plurality of prints are arranged in the width direction (short side direction) of the film F105.

此外,針對第3印字樣式PT3,係亦能夠印字在第1印字樣式PT1與第2印字樣式PT2之間。此時,能夠在隔著缺陷D的雙面貼合膜F105的搬送方向(長邊方向)的上游側或下游側、或兩側進行印字。 In addition, the third printing pattern PT3 can also be printed between the first printing pattern PT1 and the second printing pattern PT2. At this time, printing can be performed on the upstream side, the downstream side, or both sides of the conveyance direction (long-side direction) of the double-sided bonding film F105 with the defect D therebetween.

此外,針對第3印字樣式PT3,係與第1印字樣式PT1及第2印字樣式PT2同樣地,能夠以點狀的記號DM或線狀的記號LM進行印字。變更第3印字樣式PT3的方法亦與變更第1印字樣式PT1及第2印字樣式PT2的情形相同。 The third print pattern PT3 can be printed with a dot mark DM or a line mark LM in the same manner as the first print pattern PT1 and the second print pattern PT2. The method of changing the third printing pattern PT3 is also the same as when changing the first printing pattern PT1 and the second printing pattern PT2.

因此,針對缺陷資訊,藉由上述的第1印字樣式PT1、第2印字樣式PT2及第3印字樣式PT3的組合,能夠記錄更多的資訊。 Therefore, for the defect information, more information can be recorded by the combination of the first printing pattern PT1, the second printing pattern PT2, and the third printing pattern PT3 described above.

針對藉由上述第1、第2及第3印字樣式PT1至PT3其中任一者而記錄的缺陷資訊,係例如只要依據缺陷D的種類等而預先設定要變更哪個印字樣式及要變更構成該進行變更的印字樣式的記號DM(LM)的數目和間隔、尺寸(直徑、長度、粗細)、顏色中的何者。藉此,能夠按照預先設定的規則(rule)辨別出缺陷D的種類等。 Regarding the defect information recorded by any of the first, second, and third printing patterns PT1 to PT3, for example, it is necessary to set in advance which printing pattern to be changed and the composition to be changed according to the type of the defect D and the like. Which of the number and interval, the size (diameter, length, thickness), and color of the mark DM (LM) of the changed printing style. This makes it possible to discriminate the type of the defect D and the like according to a predetermined rule.

例如,針對缺陷D的種類,係例如能夠列舉第9圖(a)所示的異物類、第9圖(b)所示的氣泡類、第9圖(c)所示的亮點類、第9圖(d)所示的皺褶類等。其中,第9圖(a)所示的異物類乃係因異物混入雙面貼合膜F105而形成的缺陷D。另一方面,第9圖(b)所示的氣泡類乃係因 在雙面貼合膜F105產生氣泡所形成的缺陷D。該氣泡有時會於有異物混入時將異物咬入至中心。另一方面,第9圖(c)所示的亮點類乃係在作為偏光膜的第1膜F101所產生的缺陷D,且為對偏光膜將檢偏器採用正交偏光配置時以亮點(漏光)的形式觀察到的缺陷D。另一方面,第9圖(d)所示的皺褶類的缺陷D乃係因在雙面貼合膜F105產生皺褶所形成的缺陷D。 For example, the type of the defect D can be, for example, a foreign substance type shown in FIG. 9 (a), a bubble type shown in FIG. 9 (b), a bright point type shown in FIG. 9 (c), and a ninth type. Wrinkles and the like shown in Figure (d). Among them, the foreign matter shown in FIG. 9 (a) is a defect D formed by foreign matter mixed into the double-sided bonding film F105. On the other hand, the bubbles shown in Fig. 9 (b) are defects D caused by the occurrence of bubbles in the double-sided bonding film F105. The bubbles sometimes bite the foreign matter into the center when foreign matter is mixed in. On the other hand, the bright spot type shown in FIG. 9 (c) is the defect D generated by the first film F101 as a polarizing film, and the bright spot ( Defect D was observed in the form of light leakage). On the other hand, the wrinkle-type defect D shown in FIG. 9 (d) is a defect D caused by wrinkles generated in the double-sided bonding film F105.

在本實施形態中,係依據缺陷D的種類使隔著空白K的上游側的記號DM與下游側的記號DM中配置在上游側的記號DM的數目相異。例如,配置在上游側的記號DM的數目係在第9圖(a)所示的異物類時為三個,在第9圖(b)所示的氣泡類時為一個,在第9圖(c)所示的亮點類時為兩個,在第9圖(d)所示的皺褶類時為四個。藉此,能夠從配置在上游側的記號DM的數目容易地辨別缺陷D的種類。 In this embodiment, the number of the marks DM arranged on the upstream side and the number of the marks DM arranged on the upstream side among the marks DM on the downstream side are separated from each other depending on the type of the defect D. For example, the number of the marks DM arranged on the upstream side is three in the case of a foreign object shown in FIG. 9 (a), one in the case of a bubble shown in FIG. 9 (b), and one in FIG. 9 ( The number of bright spots shown in c) is two, and the number of bright spots shown in FIG. 9 (d) is four. This makes it possible to easily identify the type of the defect D from the number of the marks DM arranged on the upstream side.

此外,在本發明中,亦能夠藉由變更上述第1、第2及第3印字樣式PT1至PT3其中任一印字樣式來記錄與缺陷D以外有關的資訊。 In addition, in the present invention, it is also possible to record information related to other than the defect D by changing any of the first, second, and third printing patterns PT1 to PT3.

例如,就與缺陷D以外有關的資訊而言,能夠記錄製造條件、製造場所、同一種缺陷的發生頻度及其週期性的有無等製造資訊。此外,能夠藉由組合該等製造資訊來查出缺陷D的發生原因和場所、步驟等。藉此,能夠藉由進行缺陷D的肇因設備的維護(maintenance)等處置來減少缺陷D的發生。 For example, with regard to information other than the defect D, it is possible to record manufacturing information such as manufacturing conditions, manufacturing locations, the frequency of occurrence of the same defect, and the presence or absence of periodicity. In addition, by combining such manufacturing information, it is possible to find out the cause, place, procedure, etc. of the defect D. This makes it possible to reduce the occurrence of defect D by performing maintenance such as maintenance of the cause of defect D.

此處,於第10圖(a)顯示在前述偏光膜的製造步驟中,在將保護膜(TAC)貼合到偏光體(PVA)兩面的步驟(第1步驟)中產生缺陷D1時的情形。此外,於第10圖(b)顯示在第1步驟之後,在將黏著劑與隔離膜(separator)貼合到其中一方保護膜(TAC)面上的步驟(第2步驟)中發生缺陷D2時的情形。 Here, Fig. 10 (a) shows a situation where a defect D1 is generated in the step (first step) of attaching the protective film (TAC) to both sides of the polarizer (PVA) in the aforementioned polarizing film manufacturing step. . In addition, FIG. 10 (b) shows that after the first step, the defect D2 occurs in the step (second step) of bonding the adhesive and the separator to one of the protective film (TAC) surfaces. Situation.

此外,對於在第1步驟中產生的缺陷D1,係印字例如第11圖(a)所示的第1印字樣式PT1及第2印字樣式PT2。另一方面,對於在第2步驟中產生的缺陷D2,係印字例如第11圖(b)所示的第1印字樣式PT1及第2印字樣式PT2。 The defect D1 generated in the first step is a first printing pattern PT1 and a second printing pattern PT2 shown in FIG. 11 (a). On the other hand, for the defect D2 generated in the second step, the printing is, for example, the first printing pattern PT1 and the second printing pattern PT2 shown in FIG. 11 (b).

此時,關於第11圖(a)及(b)所示的缺陷D1、D2的位置,係在隔著各自缺陷D1、D2的兩側印字第1印字樣式PT1與第2印字樣式PT2,並且在以一定之間隔排列的記號DM之間設置空白K,藉此能夠標示缺陷D1、D2的位置。 At this time, regarding the positions of the defects D1 and D2 shown in FIGS. 11 (a) and (b), the first printing pattern PT1 and the second printing pattern PT2 are printed on both sides of the respective defects D1 and D2, and A blank K is provided between the marks DM arranged at a certain interval, so that the positions of the defects D1 and D2 can be marked.

此外,針對記錄為缺陷D1、D2的資訊,係藉由第1印字樣式PT1與第2印字樣式PT2而記錄有缺陷D1、D2的種類(缺陷資訊)、及是否為在第1步驟與第2步驟中之任一步驟產生的缺陷D1、D2之資訊(製造資訊)。 In addition, for the information recorded as defects D1 and D2, the types (defect information) of the defects D1 and D2 are recorded by the first printing pattern PT1 and the second printing pattern PT2, and whether they are in the first step and the second Information on manufacturing defects D1 and D2 (manufacturing information).

具體而言,針對缺陷D1、D2的種類,係藉由構成第1及第2印字樣式PT1、PT2的記號DM的顏色進行區別。例如,能夠藉由例如穿透缺陷(藍)、正交偏光缺陷(紅)、反射缺陷(綠)之類記號DM的顏色的不同來識別 缺陷D1、D2的種類。 Specifically, the types of the defects D1 and D2 are distinguished by the colors of the marks DM constituting the first and second printing patterns PT1 and PT2. For example, the types of the defects D1 and D2 can be identified by the difference in the colors of the marks DM such as the transmission defect (blue), the cross polarization defect (red), and the reflection defect (green).

另一方面,在第1及第2印字樣式PT1、PT2,係藉由比空白K更上游側(記號DM的數目較少之側)的記號DM的數目,記錄是否為在第1步驟與第2步驟中之任一步驟產生的缺陷D1、D2之資訊。例如,當第1及第2印字樣式PT1、PT2的上游側的記號DM的數目為一個時,代表是在第1步驟中產生的缺陷D1;當為兩個時,代表是在第2步驟中產生的缺陷D2。 On the other hand, in the first and second printing patterns PT1 and PT2, it is recorded whether or not it is recorded in the first step and the second by the number of the marks DM on the upstream side (the side where the number of marks DM is smaller) than the blank K. Information on defects D1 and D2 generated by any of the steps. For example, when the number of the marks DM on the upstream side of the first and second printing patterns PT1 and PT2 is one, the defect is D1 generated in the first step; when it is two, the defect is in the second step. The resulting defect D2.

此外,除了第11圖(b)所示的第1及第2印字樣式PT1、PT2之外,亦可印字如第11圖(c)所示的第3印字樣式PT3。關於第3印字樣式PT3,係藉由記號DM的數目,記錄缺陷D2存在於積層而成的偏光膜中的第幾層之資訊(缺陷資訊)。例如,關於第11圖(c)所示的第3印字樣式PT3,係由三個記號DM所構成,故能夠辨別出缺陷D2存在於積層順序第三的層(TAC)。 In addition to the first and second print patterns PT1 and PT2 shown in FIG. 11 (b), a third print pattern PT3 shown in FIG. 11 (c) can be printed. Regarding the third printing pattern PT3, the number of marks DM is used to record information (defect information) of the several layers of the polarizing film in which the defect D2 exists. For example, the third printing pattern PT3 shown in FIG. 11 (c) is composed of three marks DM. Therefore, it can be discerned that the defect D2 exists in the third layer (TAC) of the stacking order.

如以上所述,在本發明中,係對偏光膜印字前述第1、第2及第3印字樣式PT3,藉此能夠標示缺陷D1、D2的位置並且記錄與該缺陷D1、D2有關的資訊等。 As described above, in the present invention, the aforementioned first, second, and third printing patterns PT3 are printed on the polarizing film, so that the positions of the defects D1 and D2 can be marked and information related to the defects D1 and D2 can be recorded. .

此外,在本發明中,例如,亦可如第12圖所示的第1印字樣式PT1及第2印字樣式PT2所示,將藉由設置前述空白K改為藉由縮小記號DM的間隔來標示缺陷D於雙面貼合膜F105的搬送方向(長邊方向)的位置。 In addition, in the present invention, for example, as shown in the first printing pattern PT1 and the second printing pattern PT2 shown in FIG. 12, it may be indicated by setting the aforementioned blank K instead by reducing the interval between the marks DM. Defect D is a position in the conveyance direction (long-side direction) of the double-sided bonding film F105.

此外,在本發明中,亦能夠將為了標示缺 陷D於雙面貼合膜F105的搬送方向(長邊方向)的位置而設置前述空白K(改變記號DM的間隔)改為改變記號DM的大小或使用第3印字樣式PT3來標示缺陷D的位置。 In addition, in the present invention, in order to mark the position of the defect D in the conveying direction (long-side direction) of the double-sided bonding film F105, the blank K (change the interval of the mark DM) can be changed to change the size of the mark DM. Alternatively, the third printing pattern PT3 is used to mark the position of the defect D.

在本發明中,藉由前述第1、第2及第3印字樣式PT1至PT3中之任一印字樣式的組合,例如能夠如第13圖(a)至(g)所示在缺陷D的周圍印字各式各樣的印字樣式。 In the present invention, the combination of any one of the first, second, and third printing patterns PT1 to PT3 can surround the defect D as shown in FIGS. 13 (a) to (g), for example. A variety of printing styles.

其中,在第13圖(a)所示的印字樣式中,係由四個記號DM以四方包圍缺陷D的周圍的方式印字第1、第2及第3印字樣式PT1至PT3。另一方面,在第13圖(b)所示的印字樣式中,係由四個記號DM以三方包圍缺陷D的周圍的方式印字第1、第2及第3印字樣式PT1至PT3。另一方面,在第13圖(c)所示的印字樣式中,係由五個記號DM以鄰接的兩個邊包圍缺陷D的周圍的方式印字第1、第2及第3印字樣式PT1至PT3。另一方面,在第13圖(d)所示的印字樣式中,係由六個記號DM以鄰接的三個邊包圍缺陷D的周圍的方式印字第1、第2及第3印字樣式PT1至PT3。另一方面,在第13圖(e)所示的印字樣式中,係由十四個記號DM以四個邊包圍缺陷D的周圍的方式印字第1、第2及第3印字樣式PT1至PT3。另一方面,在第13圖(f)所示的印字樣式中,係由六個記號DM以相對向的兩個斜邊包圍缺陷D的周圍的方式印字第1、第2及第3印字樣式PT1至PT3。另一方面,在第13圖(g)所示的印字樣式中,係由八個記號DM以四方包圍缺陷D 的周圍的方式印字第1、第2及第3印字樣式PT1至PT3。 Among the printing patterns shown in FIG. 13 (a), four marks DM are used to print the first, second, and third printing patterns PT1 to PT3 so as to surround the periphery of the defect D in four directions. On the other hand, in the printing pattern shown in FIG. 13 (b), four marks DM are used to print the first, second, and third printing patterns PT1 to PT3 so as to surround the defect D in three directions. On the other hand, in the printing pattern shown in FIG. 13 (c), the first, second, and third printing patterns PT1 to PT1 are printed so that five marks DM surround the periphery of the defect D with two adjacent edges. PT3. On the other hand, in the printing pattern shown in FIG. 13 (d), six marks DM are used to print the first, second, and third printing patterns PT1 to PT1 so that three adjacent sides surround the periphery of the defect D. PT3. On the other hand, in the printing pattern shown in FIG. 13 (e), fourteen marks DM are used to print around the defect D with four sides. The first, second, and third printing patterns PT1 to PT3 are printed. . On the other hand, in the printing pattern shown in FIG. 13 (f), the first, second, and third printing patterns are printed so that six marks DM surround the periphery of the defect D with two opposite oblique edges. PT1 to PT3. On the other hand, in the printing pattern shown in FIG. 13 (g), the first, second, and third printing patterns PT1 to PT3 are printed so that the periphery of the defect D is surrounded by eight marks DM.

另外,前述記錄裝置13雖係構成為配置在第2缺陷檢查裝置12的下游側,但亦能夠配置在第1缺陷檢查裝置11的下游側。此時,能夠在進行以第1缺陷檢查裝置11所做的缺陷檢查後,進行以記錄裝置13所做的缺陷資訊的記錄。 Although the recording device 13 is configured to be disposed downstream of the second defect inspection device 12, the recording device 13 may be disposed downstream of the first defect inspection device 11. In this case, after the defect inspection by the first defect inspection device 11 is performed, the defect information by the recording device 13 can be recorded.

此外,關於前述記錄裝置13,並不限於在上述缺陷檢查後記錄缺陷資訊。例如有下述之情形:在長距離的搬送線中配置複數個記錄裝置,每隔一定距離進行距離資訊的記錄,且根據該所記錄的距離資訊進行距離的補正。關於如上述進行距離資訊之記錄的記錄裝置,例如將之配置在第1缺陷檢查裝置11的上游側等。 The recording device 13 is not limited to recording defect information after the defect inspection. For example, there are cases where a plurality of recording devices are arranged in a long-distance transport line, distance information is recorded at a certain distance, and distance is corrected based on the recorded distance information. The recording device that records the distance information as described above is arranged, for example, on the upstream side of the first defect inspection device 11.

此外,關於前述記錄裝置13,並不限於構成為前述具備排列配置有複數個噴嘴部13b的複數個印字頭13a,例如當使用的是橫動(traverse)式的印字頭時,藉由對該印字頭進行移動操作,便能夠無關於膜的形狀和搬送方向地對缺陷部位施作標記。 The recording device 13 is not limited to the printing head 13a having the plurality of nozzle portions 13b arranged in an array. For example, when a traverse printing head is used, When the print head is moved, it is possible to mark defective parts regardless of the shape of the film and the conveying direction.

另外,缺陷標記裝置10並不限於構成前述膜製造裝置100的一部分者,亦能夠採用從前述膜製造裝置100獨立出來的缺陷標記裝置。具體而言,係能夠構成為在搬送從第3原材捲R3捲送出的雙面貼合膜F105的期間,進行雙面貼合膜F105的缺陷檢查,並根據缺陷檢查的結果對雙面貼合膜F105的缺陷部位施作標記後再次捲收於芯材。 In addition, the defect marking device 10 is not limited to those constituting a part of the film manufacturing device 100, and a defect marking device that is separate from the film manufacturing device 100 can also be used. Specifically, the double-sided bonding film F105 can be configured to carry out a defect inspection of the double-sided bonding film F105 while the double-sided bonding film F105 sent from the third raw material roll R3 is being conveyed, and the double-sided bonding film can be bonded according to the result of the defect inspection. After marking the defective part of the composite film F105, it is wound up on the core material again.

此外,亦可為在前述膜製造裝置100中不對缺陷部位施作標記,而是在追加的加工步驟中對缺陷部位施作標記。具體而言,亦可為在搬送從第3原材捲R3捲送出的雙面貼合膜F105的期間,在對雙面貼合膜F105的一面或兩面貼合其他膜後進行缺陷檢查,合併前述膜製造裝置100的缺陷檢查的結果對缺陷部位施作標記。 In addition, in the film manufacturing apparatus 100, the defect portion may not be marked, but the defect portion may be marked in an additional processing step. Specifically, during the conveyance of the double-sided bonding film F105 from the third raw material roll R3 roll, the defect inspection may be performed after one or both sides of the double-sided bonding film F105 are bonded to each other and combined. As a result of the defect inspection of the film manufacturing apparatus 100, the defect site is marked.

另外,針對作為本發明的檢查對象(被檢查物)之原材,未必限於前述偏光膜、相位差膜、亮度提升膜之類的光學膜,只要為對缺陷部位施作標記的膜和紙等長帶狀原材即可。 In addition, the raw materials to be inspected (inspected objects) of the present invention are not necessarily limited to optical films such as the aforementioned polarizing film, retardation film, and brightness-improving film, as long as the film and paper are marked on the defect site. A strip-shaped raw material is sufficient.

此外,就本發明的檢查對象(被檢查物)而言,亦可為藉由切割長帶狀原材而得的片(料片)。亦即,在本發明中,並不限於在搬送前述原材的期間進行原材的缺陷檢查而根據該缺陷檢查的結果對原材的缺陷部位施作標記,亦可為在切割後進行片的缺陷檢查,並根據該缺陷檢查的結果對片的缺陷部位施作標記。此外,亦可為在實施片的缺陷檢查與對片的缺陷部位之標記的期間,對片施行加工處理(例如,其他膜的貼合、片的表面處理等)。藉此,與被檢查物為原材的情形同樣地,對屬於被檢查物之片使用本發明的缺陷標記方法(裝置)而能夠標示缺陷的位置,並且記錄與該缺陷有關的資訊等。此外,本發明係除了適用於前述原材和片,還能夠廣泛地適用於能夠適用本發明者。 In addition, the inspection object (object to be inspected) of the present invention may be a sheet (batch) obtained by cutting a long strip-shaped raw material. That is, in the present invention, it is not limited to performing a defect inspection of the original material while the aforementioned original material is being transported, and marking a defective portion of the original material based on the result of the defect inspection, and may also be a method of performing a sheet after cutting. Defect inspection, and mark the defect part of the sheet according to the result of the defect inspection. In addition, the sheet may be subjected to processing (for example, bonding of another film, surface treatment of the sheet, etc.) while the defect inspection of the sheet and marking of the defective part of the sheet are performed. Thereby, similarly to the case where the object to be inspected is the original material, the defect marking method (apparatus) of the present invention can be used to mark the position of the defect, and information related to the defect can be recorded. In addition, the present invention is applicable not only to the aforementioned raw materials and sheets, but also to those who can apply the present invention widely.

Claims (20)

一種缺陷標記方法,係對被檢查物的缺陷部位施作標記,其中,以使缺陷位於在與前述被檢查物面內的一個方向交叉的另一個方向相鄰的第1印字樣式與第2印字樣式之間的方式,將前述第1印字樣式及前述第2印字樣式印字在前述被檢查物的表面,藉此標示前述缺陷的位置。     A defect marking method for marking a defective part of an object to be inspected, wherein the first printing pattern and the second printing are adjacent to each other in a direction that intersects with another direction in the plane of the object to be inspected. In the method between patterns, the first printing pattern and the second printing pattern are printed on the surface of the object to be inspected, thereby marking the position of the defect.     如申請專利範圍第1項所述之缺陷標記方法,其中,藉由前述第1印字樣式與前述第2印字樣式其中任一者或兩者的印字樣式,記錄與前述缺陷有關的資訊。     The defect marking method according to item 1 of the scope of the patent application, wherein the information related to the aforementioned defect is recorded by using one or both of the aforementioned first printing pattern and the aforementioned second printing pattern.     如申請專利範圍第2項所述之缺陷標記方法,其中,將至少一個點狀的記號做印字或沿前述一個方向將複數個點狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。     The defect marking method according to item 2 of the scope of patent application, wherein at least one dot-shaped mark is printed or a plurality of dot-shaped marks are arranged along the aforementioned direction to be printed, as any of the foregoing or The printing style of both.     如申請專利範圍第2項或第3項所述之缺陷標記方法,其中,將至少一個線狀的記號做印字或沿前述一個方向將複數個線狀的記號排列而做印字,做為前述其中任一者或兩者的印字樣式。     The defect marking method according to item 2 or item 3 of the scope of patent application, wherein at least one linear mark is printed or a plurality of linear marks are arranged in a direction along the aforementioned direction to be printed, as one of the foregoing Either or both.     如申請專利範圍第3項或第4項所述之缺陷標記方法,其中,藉由變更了前述記號的數目、間隔、尺寸、顏色其中任一者以上之印字樣式,記錄與前述缺陷有關的資訊。     The defect marking method as described in item 3 or 4 of the scope of patent application, wherein the printing style of any one or more of the number, interval, size, and color of the foregoing marks is changed to record information related to the foregoing defects .     如申請專利範圍第3至5項中任一項所述之缺陷標記方 法,其中,藉由變更了沿前述一個方向排列的複數個記號的至少一部分的間隔之印字樣式,標示前述缺陷於前述一個方向的位置。     The defect marking method according to any one of claims 3 to 5 of the scope of the patent application, wherein a printing pattern of at least a part of a plurality of marks arranged along the aforementioned direction is changed to indicate that the aforementioned defect is in the aforementioned one Direction of position.     如申請專利範圍第6項所述之缺陷標記方法,其中,將沿前述一個方向排列的複數個記號的至少一部分的間隔空出而形成的空白配置在與前述缺陷相鄰的位置,藉此標示前述缺陷於前述一個方向的位置。     The defect marking method according to item 6 of the scope of patent application, wherein a space formed by vacating at least a part of a plurality of marks arranged along the aforementioned one direction is arranged at a position adjacent to the aforementioned defect, thereby marking The aforementioned defect is located in the aforementioned one direction.     如申請專利範圍第1至7項中任一項所述之缺陷標記方法,其中,將在前述另一個方向與前述第1印字樣式和前述第2印字樣式其中任一者或兩者相鄰的第3印字樣式予以印字,藉此記錄與前述缺陷有關的資訊。     The defect marking method according to any one of claims 1 to 7 of the scope of patent application, wherein one or both of the first printing pattern and the second printing pattern are adjacent to each other in the other direction. The third printing pattern is printed to record information related to the aforementioned defects.     如申請專利範圍第1至8項中任一項所述之缺陷標記方法,其中,藉由前述任一者的印字樣式,記錄與前述缺陷以外有關的資訊。     The defect marking method according to any one of claims 1 to 8 of the scope of application for a patent, wherein, in addition to the printing style of any one of the foregoing, information related to other than the foregoing defect is recorded.     如申請專利範圍第1至9項中任一項所述之缺陷標記方法,其中,使用能夠消除的墨水將前述印字樣式做印字。     The defect marking method according to any one of claims 1 to 9 of the scope of application for a patent, wherein the aforementioned printing pattern is printed using erasable ink.     如申請專利範圍第1至10項中任一項所述之缺陷標記方法,其中,對作為前述被檢查物而沿前述一個方向搬送的長帶狀原材的缺陷部位施作標記。     The defect marking method according to any one of claims 1 to 10 of the scope of patent application, wherein a defect portion of a long strip-shaped raw material that is transported in the one direction as the inspection object is marked.     如申請專利範圍第1至10項中任一項所述之缺陷標記方法,其中,對作為前述被檢查物而藉由切割長帶狀原材而得的片的缺陷部位施作標記。     The defect marking method according to any one of claims 1 to 10 of the scope of patent application, wherein a defect portion of a sheet obtained by cutting a long strip-shaped raw material as the object to be inspected is marked.     一種原材的製造方法,係包含下列步驟:對沿一個方向搬送的長帶狀原材進行缺陷檢查之 步驟;及使用申請專利範圍第11項所述之缺陷標記方法對前述原材的缺陷部位施作標記之步驟。     A method for manufacturing a raw material, comprising the steps of: inspecting a defect of a long strip-shaped raw material conveyed in one direction; and using the defect marking method described in the scope of patent application No. 11 to detect a defect portion of the raw material Steps for marking.     一種片的製造方法,係包含下列步驟:對藉由切割長帶狀原材而得的片進行缺陷檢查之步驟;及使用申請專利範圍第12項所述之缺陷標記方法對前述片的缺陷部位施作標記之步驟。     A sheet manufacturing method includes the following steps: a step of inspecting a defect obtained by cutting a long strip-shaped raw material; and using the defect marking method described in claim 12 of the patent application for a defect portion of the foregoing sheet Steps for marking.     一種缺陷標記裝置,係具備對被檢查物的缺陷部位施作標記的印字裝置;前述印字裝置係具有:沿與前述被檢查物面內的一個方向交叉的另一個方向以預定之間隔排列配置,並且對前述被檢查物的表面將印字樣式做印字的複數個印字部;及控制前述複數個印字部之驅動的控制部;前述控制部係以使缺陷位於在前述另一個方向相鄰的第1印字樣式與第2印字樣式之間的方式,進行用以選擇將前述第1印字樣式及前述第2印字樣式做印字的印字部之控制。     A defect marking device is provided with a printing device for marking a defective part of an object to be inspected; the printing device is arranged to be arranged at predetermined intervals along another direction intersecting with one direction in the surface of the object to be inspected, And a plurality of printing sections for printing a printing pattern on the surface of the inspection object; and a control section for controlling the driving of the plurality of printing sections; the control section is such that the defect is located in the first adjacent to the other direction. The method between the printing style and the second printing style controls the printing unit for selecting the first printing style and the second printing style to be printed.     如申請專利範圍第15項所述之缺陷標記裝置,其中,前述控制部係對前述所選擇的任一者或兩者的印字部,因應要記錄的與前述缺陷有關的資訊,進行用以變更前述第1印字樣式與前述第2印字樣式其中任一者或兩者的印字樣式之控制。     The defect marking device according to item 15 of the scope of patent application, wherein the aforementioned control unit is to change the printing unit of one or both of the aforementioned selections in accordance with the information related to the aforementioned defects to be recorded and used to change Either or both of the first printing pattern and the second printing pattern are controlled.     一種原材,係於缺陷部位施作有標記的長帶狀原材; 前述原材係具有藉由前述標記而在表面被印字之在短邊方向相鄰的第1印字樣式及第2印字樣式,藉由使缺陷位於前述第1印字樣式與前述第2印字樣式之間,而標示出前述缺陷的位置。     An original material is a long strip-shaped original material with a mark applied to a defect part; the original material has a first printing pattern and a second printing pattern that are printed on the surface by the marks and are adjacent in the short side direction; The position of the defect is marked by placing the defect between the first printing pattern and the second printing pattern.     如申請專利範圍第17項所述之原材,其中,藉由前述第1印字樣式與前述第2印字樣式其中任一者或兩者的印字樣式,記錄有與前述缺陷有關的資訊。     According to the original material described in item 17 of the scope of patent application, in which the information related to the aforementioned defect is recorded by the printing pattern of any one or both of the first printing pattern and the second printing pattern.     一種片,係於缺陷部位施作有標記;前述片係具有藉由前述標記而在表面被印字之在與一個方向交叉的的另一個方向相鄰的第1印字樣式及第2印字樣式,藉由使缺陷位於前述第1印字樣式與前述第2印字樣式之間,而標示出前述缺陷的位置。     A sheet is provided with a mark on a defective part; the sheet has a first printing pattern and a second printing pattern adjacent to the other direction which intersects with one direction by being printed on the surface by the foregoing mark. Since the defect is located between the first printing pattern and the second printing pattern, the position of the defect is marked.     如申請專利範圍第19項所述之片,其中,藉由前述第1印字樣式與前述第2印字樣式其中任一者或兩者的印字樣式,記錄有與前述缺陷有關的資訊。     According to the film described in item 19 of the scope of patent application, the information related to the aforementioned defect is recorded by the printing pattern of any one or both of the first printing pattern and the second printing pattern.    
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