JP6204697B2 - Defect inspection system - Google Patents

Description

  The present invention relates to a defect inspection system.

  A film such as a polarizing plate is wound around a core material after performing a defect inspection such as a foreign matter defect or an uneven defect. Information on the position and type of the defect (hereinafter referred to as defect information) is recorded on the film by printing a barcode on the edge of the film or marking the defective part. When the winding amount reaches a certain amount, the film wound around the core is separated from the upstream film and shipped as a raw roll. For example, Patent Document 1 discloses a defect inspection system that includes a defect inspection device and a recording device that records defect information on a film on a film conveyance line.

JP 2011-7779 A

  In such a defect inspection system, the defect inspection apparatus and the recording apparatus are arranged separately on the upstream side and the downstream side of the transport line. Therefore, the recording apparatus performs recording at a predetermined timing after the defect inspection so that there is no deviation between the defect location of the film and the recording position of the defect information. The time from defect inspection to recording is determined by the film transport distance (hereinafter referred to as offset distance) between the defect inspection apparatus and the recording apparatus.

  However, if a speed adjusting mechanism called an accumulator is provided between the defect inspection apparatus and the recording apparatus, the offset distance is extended. Therefore, if recording is performed at the same timing, the defect location and the recording position of the defect information are not detected. Deviation occurs. The accumulator accumulates the film conveyed from the upstream side, and decelerates or stops the film flow on the downstream side without interrupting the film flow on the upstream side. The accumulator is operated during operations such as paper splicing after core material replacement.

  In order to prevent the deviation of the recording position, it is conceivable that the defect inspection apparatus and the recording apparatus are all installed upstream of the accumulator so that the offset distance does not fluctuate due to the operation of the accumulator. However, in this configuration, since the defect inspection apparatuses and recording apparatuses are densely arranged upstream of the accumulator, the line layout is limited.

  Patent Document 1 discloses a defect inspection system in which an accumulator is installed between a defect inspection apparatus and a recording apparatus. However, the accumulator of Patent Document 1 stops the flow of the film at the time of recording defect information, and does not stop the flow of the film at the time of work such as switching of the original roll. The recording timing is determined by the offset distance, and the recording timing is not changed according to the amount of film accumulated by the accumulator.

  The object of the present invention is that even when the transport distance (offset distance) of the film between the defect inspection apparatus and the recording apparatus varies due to the operation of the accumulator, it is between the defect location and the defect information recording position. An object of the present invention is to provide a defect inspection system in which deviation is unlikely to occur.

  The defect inspection system of the present invention includes a transport line for transporting a belt-shaped film, an accumulator provided in the transport line, a defect inspection apparatus provided in the transport line upstream of the accumulator, A recording device that is provided in the conveyance line downstream of the accumulator and records defect information on the defect detected by the defect inspection device on the film; and an upstream side and a downstream side of the accumulator A correction value of an offset distance between the defect inspection apparatus and the recording apparatus is calculated based on a difference in conveyance amount, and the recording timing of the defect information on the film by the recording apparatus is calculated based on the correction value. And a control device for correcting.

  The defect inspection system of the present invention includes a first length measuring device provided on the upstream side of the accumulator, a second length measuring device provided on the downstream side of the accumulator, and when the accumulator is not in operation. A storage device that stores a first offset distance between the defect inspection device and the recording device, and the control device is based on the measurement results of the first length measuring device and the second length measuring device. A first calculation unit for calculating the correction value, and a second offset distance for calculating the second offset distance between the defect inspection apparatus and the recording apparatus when the accumulator is operating based on the correction value and the first offset distance. 2 upstream and downstream of the accumulator after the time when the defect inspection apparatus performs the defect inspection based on the measurement results of the two arithmetic units and the first length measuring device or the second length measuring device A recording control unit that detects a conveyance amount of the film, controls the recording apparatus at a timing when the conveyance amount coincides with the second offset distance, and records the defect information on the film. Also good.

  When the accumulator is activated between the time when the defect is detected by the defect inspection device and the time when defect information relating to the defect is recorded by the recording device, the accumulator is activated. May be recorded on the film together with the defect information.

  According to the present invention, even when the film transport distance (offset distance) between the defect inspection apparatus and the recording apparatus varies due to the operation of the accumulator, it is between the defect location and the defect information recording position. It is possible to provide a defect inspection system in which deviation is unlikely to occur.

It is the schematic of the manufacturing apparatus of a film. It is the schematic of a defect inspection system. It is a figure explaining the control method of the recording timing of the defect information at the time of operation of an accumulator.

  Hereinafter, an embodiment of the present invention will be described with reference to the drawings, but the present invention is not limited to the embodiment. In all the following drawings, the dimensions and ratios of the respective components are appropriately changed in order to clarify the embodiments. In the following description and drawings, the same or corresponding elements are denoted by the same reference numerals, and redundant description is omitted.

  FIG. 1 is a schematic view of a film production apparatus 1 according to an embodiment of the present invention.

  The manufacturing apparatus 1 manufactures the 2nd film F5 by bonding protection film (surface protection film) F2, F3 to the 1st film F1. The first film F1, the protection films F2, F3, and the second film F5 are not particularly limited as long as they are flexible belt-like films.

  As shown in FIG. 1, the manufacturing apparatus 1 includes a first line 2, a second line 3, a third line 4, a fourth line 5, and a fifth line 6. The second line 3 and the fourth line 5 form a transport line for the protection films F2 and F3, and the first line 2, the third line 4 and the fifth line 6 form the band-shaped film FX including the first film F1. A conveyance line L (corresponding to “a conveyance line for conveying a belt-like film” in the present invention) is formed. The film FX is a first film F1, a single-sided bonding film F4 in which the protection film F2 is bonded to one side of the first film F1, and a double-sided bonding film in which the protection films F2, F3 are bonded to both sides of the first film F1 The second film F5).

  In each of the lines 2 to 6, a plurality of rolls (for example, in this embodiment, a guide roll 31, nip rolls 32, 33, 34, 35, 36, dancer rolls 10a, 11a, 12a, 13a). Each part of the manufacturing apparatus 1 is comprehensively controlled by a control device 15 as an electronic control device.

  The first line 2 manufactures and transports the first film F1. In the present embodiment, the first film F1 is a polarizing film, but the first film F1 is not limited to this. In the first line 2, the PVA (Polyvinyl Alcohol) film, which is the base material of the polarizer, is dyed, crosslinked, stretched, etc., and a polarizer protective film made of TAC (Triacetylcellulose) or the like is pasted on both sides. The first film F1 is manufactured by combining. The first film F1 is not limited to the polarizing film, but may be other films such as a retardation film, a light diffusion film, a light reflection film, a lens film, a conductive film, an insulating film, and a photosensitive film.

  An accumulator 10 is provided in the first line 2. The accumulator 10 includes a plurality of dancer rolls 10a. The dancer roll 10a can be moved up and down while supporting the first film F1. The accumulator 10 accumulates the first film F1 conveyed from the upstream side by raising the dancer roll 10a from the origin position (non-operating position), and lowering the dancer roll 10a raised, Release the accumulation of the first film F1. The accumulator 10 is operated at the time of work such as paper splicing after the core material replacement of the raw fabric rolls R1 to R3.

  In the first line 2, a first defect inspection device 7 is provided on the upstream side of the accumulator 10. The 1st defect inspection apparatus 7 detects various defects, such as a foreign material defect, an unevenness | corrugation defect, and a bright spot defect which arose when manufacturing the 1st film F1 and conveying the 1st film F1 after manufacture. The first defect inspection apparatus 7 performs inspection processing such as reflection inspection, transmission inspection, oblique transmission inspection, and crossed Nicol transmission inspection on the first film F1 being conveyed, thereby removing defects in the first film F1. To detect.

  The first defect inspection apparatus 7 is irradiated from the illumination units 21a, 22a, and 23a that irradiate light to the first film F1 and the illumination units 21a, 22a, and 23a and passes through the first film F1 (one of reflection and transmission or And (2) light detectors 21b, 22b, and 23b capable of detecting changes due to the presence or absence of defects in the first film F1. The first defect inspection apparatus 7 includes an illumination unit and a photodetector for each type of defect to be inspected.

  The illumination units 21 a, 22 a, and 23 a irradiate light whose light intensity, wavelength, polarization state, and the like are adjusted according to the type of inspection performed by the first defect inspection apparatus 7. The photodetectors 21b, 22b, and 23b are configured by an image sensor such as a CCD, and image the portion of the first film F1 that is irradiated with light by the illumination units 21a, 22a, and 23a. The detection results (imaging results) of the photodetectors 21b, 22b, and 23b are output to the control device 15.

  The 2nd line 3 unwinds and conveys the 1st protection film F2 from 1st original fabric roll R1. In the present embodiment, the first protection film F2 is a PET (Polyethylene terephthalate) film, but the first protection film F2 is not limited to this.

  An accumulator 11 is provided on the second line 3. The accumulator 11 includes a plurality of dancer rolls 11a. The dancer roll 11a can be moved up and down while supporting the first protection film F2. The accumulator 11 raises the dancer roll 11a from the origin position (non-operating position), thereby accumulating the first protection film F2 conveyed from the upstream side, and lowering the dancer roll 11a raised. The accumulation of the first protection film F2 is canceled. The accumulator 11 is operated at the time of work such as paper splicing after the core material replacement of the raw fabric rolls R1 to R3.

  The 3rd line 4 bonds the 1st protection film F2 to one side of the 1st film F1, and conveys it. The single-sided bonding film F4 is manufactured by bonding the first protection film F2 to one surface of the first film F1.

  The third line 4 includes a pair of nip rolls 33 and 34 that are arranged with their axial directions parallel to each other. A predetermined gap is formed between the pair of nip rolls 33 and 34, and the inside of the gap is a bonding position between the first film F1 and the first protection film F2. The first film F1 and the first protection film F2 are overlapped and introduced into the gap. The first film F <b> 1 and the first protection film F <b> 2 are sent downstream while being pinched by the nip rolls 33 and 34. Thereby, the 1st protection film F2 is bonded by one side of the 1st film F1.

  The 4th line 5 unwinds and conveys the 2nd protection film F3 from the 2nd original fabric roll R2. In the present embodiment, the second protection film F3 is a PET (Polyethylene terephthalate) film, but the second protection film F3 is not limited to this.

  The fourth line 5 is provided with an accumulator 12. The accumulator 12 includes a plurality of dancer rolls 12a. The dancer roll 12a can be moved up and down while supporting the second protection film F3. The accumulator 12 raises the dancer roll 12a from the origin position (non-operating position), thereby accumulating the second protection film F3 conveyed from the upstream side, and lowering the dancer roll 12a raised. The accumulation of the second protection film F3 is canceled. The accumulator 12 is operated at the time of work such as paper splicing after the core material replacement of the raw fabric rolls R1 to R3.

  The 5th line 6 bonds the 2nd protection film F3 to the other surface (surface on the opposite side to the surface where the 1st protection film F2 was bonded) of the 1st film F1, and conveys it. The 2nd film F5 is manufactured by bonding the 1st protection film F2 and the 2nd protection film F3 to one side and the other side of the 1st film F1. When the second film F5 is wound around the core material, the raw roll R3 of the second film F5 is manufactured.

  The fifth line 6 has a pair of nip rolls 35 and 36 that are arranged with their axial directions parallel to each other. A predetermined gap is formed between the pair of nip rolls 35 and 36, and the inside of the gap is a bonding position between the first film F1 and the second protection film F3. The first film F1 and the second protection film F3 are overlapped and introduced into the gap. The first film F <b> 1 and the second protection film F <b> 3 are sent downstream while being pinched by the nip rolls 35 and 36. Thereby, the 2nd protection film F3 is bonded by the other side of the 1st film F1.

  The fifth line 6 is provided with an accumulator 13. The accumulator 13 includes a plurality of dancer rolls 13a. The dancer roll 13a can be moved up and down while supporting the second film F5. The accumulator 13 accumulates the second film F5 conveyed from the upstream side by raising the dancer roll 13a from the origin position (non-operating position), and lowering the dancer roll 13a raised, Release the accumulation of the second film F5. The accumulator 13 is operated at the time of work such as paper splicing after the core material replacement of the raw fabric rolls R1 to R3.

  In the fifth line 6, a second defect inspection device 8 and a recording device 9 are provided upstream of the accumulator 13. The 2nd defect inspection apparatus 8 is various defects, such as a foreign material defect, an unevenness | corrugation defect, and a bright spot defect which occurred when bonding protection film F2, F3 to the 1st film F1, or conveying the film after bonding. Is detected. The second defect inspection device 8 performs inspection processing such as reflection inspection, transmission inspection, oblique transmission inspection, and crossed Nicol transmission inspection on the second film F5 being conveyed, thereby removing defects in the second film F5. To detect.

  The second defect inspection device 8 illuminates the second film F5 with light 24a, 25a, and the light irradiated from the illumination units 24a, 25a and passed through the second film F5 (one or both of reflection and transmission). Photo detectors 24b and 25b capable of detecting changes due to the presence or absence of defects in the second film F5. The second defect inspection apparatus 8 includes an illumination unit and a photodetector for each type of defect to be inspected.

  The illumination units 24a and 25a irradiate light whose light intensity, wavelength, polarization state, and the like are adjusted according to the type of inspection performed by the second defect inspection apparatus 8. The photodetectors 24b and 25b are constituted by an image sensor such as a CCD, and image the portion of the second film F5 irradiated with light by the illumination units 24a and 25a. The detection results (imaging results) of the photodetectors 24 b and 25 b are output to the control device 15.

  The recording device 9 is provided downstream of the second defect inspection device 8 in the fifth line 6. The recording device 9 records defect information relating to defects detected by the first defect inspection device 7 and the second defect inspection device 8 on the second film F5 (first protection film F2). The defect information includes information on the position and type of the defect.

  For example, the recording device 9 records defect information in the width direction end of the second film F5 in the form of an identification code (one-dimensional barcode, two-dimensional barcode, QR code (registered trademark), etc.). In the identification code, for example, the defect detected by the first defect inspection device 7 and the second defect inspection device 8 is located at a distance from the position where the barcode is attached along the film width direction. Information indicating whether it exists (information on the position of the defect) is included. The identification code may include information regarding the type of detected defect.

  The recording device 9 directly displays the position of the defect on the second film F5 by attaching a dot-shaped, line-shaped or frame-shaped mark that includes the defect to the defective portion of the second film F5. (Marking) may be used. At this time, information on the type of defect may be recorded by attaching a symbol or pattern indicating the type of defect together with the mark to the defective part.

  A first length measuring device 41 and a second length measuring device 42 for measuring the transport amount of the film FX are provided in the transport line L of the film FX. The first length measuring device 41 and the second length measuring device 42 are, for example, rotary encoders that output a pulse train according to the amount of rotational displacement of the rotating shaft of a rotating body that rotates in contact with the film FX. The first length measuring device 41 is provided on the upstream side of the accumulator 10, and the second length measuring device 42 is provided on the downstream side of the accumulator 10.

  In the case of this embodiment, the first length measuring device 41 is provided on the nip roll 32, and the second length measuring device 42 is provided on the nip roll 33. Based on the rotation angle of the encoder (the first length measuring device 41 and the second length measuring device 42) measured by the first length measuring device 41 and the second length measuring device 42 and the length of the outer periphery of the first film F1. The carry amount is detected. The measurement results of the first length measuring device 41 and the second length measuring device 42 are output to the control device 15. The control device 15 detects the accumulation amount of the first film F1 by the accumulator 10 based on the measurement results of the first length measuring device 41 and the second length measuring device 42. For example, the control device 15 detects the accumulation of the first film F1 as the offset distance correction value.

  In the present embodiment, since there is only one accumulator 10 between the first defect inspection device 7 and the recording device 9, the first length measuring device 41 and the second length measuring device 42 are the accumulator 10. One on the upstream side and one on the downstream side. When there are a plurality of accumulators between the first defect inspection apparatus 7 and the recording apparatus 9, the length is measured one by one on the upstream side of the most upstream accumulator and on the downstream side of the most downstream accumulator. A vessel is provided.

  The control device 15 analyzes the images captured by the photodetectors 21b, 22b, 23b, 24b, and 25b, and determines the position and type of the defect. When the control device 15 determines that the first film F1 and the second film F5 have a defect, the control device 15 controls the recording device 9 to record defect information on the second film F5.

  The control device 15 records the defect information at a predetermined timing after the defect inspection so that there is no deviation between the defect portion of the film FX and the recording position of the defect information. For example, the control device 15 is transported on the transport line L after the time when the defect inspection is performed by the first defect inspection device 7 or the second defect inspection device 8 based on the measurement result of the second length measuring device 42. The transport amount of the film FX is detected, and recording is performed by the recording device 9 when the detected transport amount matches the offset distance.

  The offset distance refers to the transport distance of the film FX between the defect inspection devices 7 and 8 and the recording device 9. Strictly speaking, the offset distance is a film between a position where defect inspection is performed in the defect inspection apparatuses 7 and 8 (defect inspection position) and a position where recording of defect information is performed in the recording apparatus 9 (recording execution position). It is defined as the conveyance distance of FX. The offset distance varies when the accumulator 10 is operated. The offset distance when the accumulator is not operating (hereinafter referred to as the first offset distance) is stored in the storage device 16. The defect inspection apparatuses 7 and 8 include a plurality of photodetectors 21b, 22b, 23b, 24b, and 25b, and defect inspection is performed for each photodetector. Therefore, the storage device 16 stores a first offset distance for each of the photodetectors 21b, 22b, 23b, 24b, and 25b.

  When the offset distance fluctuates due to the operation of the accumulator 10, the control device 15 determines whether the defect inspection device and the recording device 9 are based on the difference in the transport amount of the film FX between the upstream side and the downstream side of the accumulator 10. A correction value of the offset distance is calculated, and the recording timing of the defect information on the second film F5 by the recording device 9 is corrected based on this correction value.

  For example, the control device 15 calculates a correction value based on the measurement results of the first length measuring device 41 and the second length measuring device 42. Based on the correction value and the first offset distance, the control device 15 calculates an offset distance when the accumulator is in operation (hereinafter referred to as a second offset distance). Based on the measurement result of the first length measuring device 41 or the second length measuring device 42, the control device 15 is upstream or downstream of the accumulator 10 after the time when the defect inspection is performed by the first defect inspection device 7. The conveyance amount of the film FX is detected, and at the timing when the conveyance amount coincides with the second offset distance, the recording device 9 is controlled to record defect information on the second film F5.

  The control device 15 controls the recording device 9 when the accumulator 10 is activated between the time when the defect is detected by the first defect inspection device 7 and the time when the recording device 9 records the defect information regarding the defect. Then, information indicating that the accumulator 10 has been operated (hereinafter referred to as accumulator operation information) is recorded on the second film F5 together with the defect information. The accumulator operation information is recorded, for example, by attaching a specific character (for example, “AL”) or a pattern to the second film F5.

  When the accumulator is in operation, the recording timing by the recording device 9 is corrected based on the measurement results of the first length measuring device 41 and the second length measuring device 42. However, when the measurement results of the first length measuring device 41 and the second length measuring device 42 include an error, the recording position on the second film F5 is displaced, and a defect-free portion (non-defective portion) is erroneously detected. There is a risk that it will be determined as a defective part. If the accumulator operation information is recorded on the second film F5, the operator can inspect the defective portion of the portion to which the accumulator operation information is attached, thereby detecting a recording position shift or the like. Therefore, there is less possibility that a non-defective part is erroneously determined as a defective part, and the yield is improved.

  In addition, the control apparatus 15 of this embodiment is comprised including the computer system. This computer system includes an arithmetic processing unit such as a CPU and a storage unit such as a memory and a hard disk. The control device 15 of the present embodiment includes an interface capable of executing communication with a device external to the computer system. An input device capable of inputting an input signal may be connected to the control device 15. The input device includes an input device such as a keyboard and a mouse, or a communication device that can input data from a device external to the computer system. The control device 15 may include a display device such as a liquid crystal display that indicates the operation status of each part of the manufacturing apparatus 1 or may be connected to the display device.

  An operating system (OS) that controls the computer system is installed in the storage unit of the control device 15. The storage unit of the control device 15 stores a program that causes each unit of the manufacturing apparatus 1 to execute various processes by causing the arithmetic processing unit to control each unit of the manufacturing apparatus 1. Various types of information including programs recorded in the storage unit can be read by the arithmetic processing unit of the control device 15. The control device 15 may include a logic circuit such as an ASIC that executes various processes required for controlling each part of the manufacturing apparatus 1.

  FIG. 2 is a schematic view showing an embodiment of the defect inspection system 100 including the first defect inspection apparatus 7. FIG. 3 is a diagram illustrating a method for controlling the recording timing of defect information and accumulator operation information.

  The upper part of FIG. 3 shows the AL origin signal, and the lower part of FIG. 3 shows the first transport amount A and the second transport amount B after the time when the AL origin signal becomes OFF (after the accumulator is activated). The measurement results are shown. The horizontal axis in FIG. 3 is time. In FIG. 3, “AL” means an accumulator. “ALS” indicates the AL origin signal, “AL front line” indicates the transport line L upstream of the accumulator 10, and “AL post line” indicates the transport line L downstream of the accumulator 10. Show.

  As shown in FIG. 2, the defect inspection system 100 of this embodiment includes a transport line L, an accumulator 10, a first defect inspection device 7, a recording device 9, a first length measuring device 41, and a second length measuring device 41. A length measuring device 42, a control device 15, and a storage device 16 are provided.

  The conveyance line L is a conveyance line in which the strip | belt-shaped film FX is conveyed. The transport line L is composed of a first line 2, a third line 4, and a fifth line 6. The film FX is a strip-shaped bonding film in which a protection film is bonded to one surface or both surfaces of the first film F1 or the first film F1.

  In the transport line L, an accumulator 10 is provided. The accumulator 10 supplies an ALS origin signal to the host system 60, and the control device 15 acquires the AL origin signal ALS from the host system 60. The host system 60 is a computer system higher than the control device 15, and is, for example, a DCS (Distributed Control System) or a PLC (Programmable Logic Controller). The AL origin signal ALS is “ON” when the dancer roll 10a is arranged at the origin position OP (position when the accumulator is not in operation), and when the dancer roll 10a is arranged at a position different from the origin position OP. Is a signal to turn OFF.

  In the present embodiment, the AL origin signal ALS is supplied to the control device 15 via the host system 60, but the supply form of the AL origin signal ALS is not limited to this. The AL origin signal ALS may be directly supplied from the accumulator 10 to the control device 15 without going through the host system 60.

  Note that the terms “ON” and “OFF” are used for convenience to distinguish the state of the accumulator, and the terms “ON” and “OFF” do not have any meaning. Therefore, the case where the dancer roll 10a is disposed at the origin position OP may be referred to as “OFF”, and the case where the dancer roll 10a is disposed at a position different from the origin position OP may be referred to as “ON”.

  A first length measuring device 41 and a second length measuring device 42 are respectively provided on the upstream conveying line L (line before AL) and the downstream conveying line L (line after AL) of the accumulator 10. In the case of this embodiment, the first length measuring device 41 and the second length measuring device 42 use rotary encoders having the same specifications with the same number of pulses output per rotation (for example, 100 pulses / rotation). It is done. The first length measuring device 41 and the second length measuring device 42 are not necessarily the same specification rotary encoder, but if the first length measuring device 41 and the second length measuring device 42 are the same specification rotary encoder, The difference in the film conveyance amount between the pre-AL line and the post-AL line is preferable because it can be simply calculated as the difference in the rotation speed of the rotary encoder (difference in the number of pulses).

  The control device 15 includes a first calculation unit 51, a second calculation unit 52, and a recording control unit 53. In addition, the 1st calculating part 51, the 2nd calculating part 52, and the recording control part 53 described the function of arithmetic processing parts, such as CPU, as each independent functional part, and each functional part is not necessarily in an arithmetic processing part. Does not mean that there is an independent circuit corresponding to.

  An AL origin signal ALS is supplied from the accumulator 10 to the first arithmetic unit 51 via the host system 60. The first calculation unit 51 determines whether or not the accumulator 10 is operating based on the AL origin signal ALS supplied from the accumulator 10. The first computing unit 51 determines that the accumulator 10 is inactive when the AL origin signal ALS is “ON”, and the accumulator 10 is in operation when the AL origin signal ALS is “OFF”. Is determined. The first calculation unit 51 constantly monitors the AL origin signal ALS.

  The first length measurement data CL <b> 1 is input from the first length measuring device 41 to the first calculation unit 51. The first length measurement data CL1 is, for example, a pulse train output from the first length measuring device 41 in accordance with the rotational displacement amount of the nip roll 32. The first calculation unit 51 detects the first transport amount A of the film FX on the line before AL based on the first length measurement data CL1. The first transport amount A is detected as the number of pulses output from the first length measuring device 41.

  The first length measurement data CL <b> 2 is input to the first calculation unit 51 from the second length measuring device 42. The second length measurement data CL <b> 2 is a pulse train output from the second length measuring device 42 according to the rotational displacement amount of the nip roll 33. The first calculator 51 detects the second transport amount B of the film FX on the post-AL line based on the second length measurement data CL2. The second transport amount B is detected as the number of pulses output from the second length measuring device 42.

  The first calculation unit 51 determines whether or not the accumulator 10 is operating based on the AL origin signal ALS. When it is determined that the accumulator 10 is operating, the first calculation unit 51 accumulates the film FX in the accumulator 10 based on the measurement results of the first length measuring device 41 and the second length measuring device 42. The quantity C is calculated. The accumulated amount C is calculated as, for example, the difference (B−A) between the first transport amount A and the second transport amount B. For example, the first calculation unit 51 determines the accumulation amount C as the offset distance correction value.

  Based on the correction value C detected by the first calculation unit 51 and the first offset distance C0 stored in the storage device 16 when the accumulator is not in operation, the second calculation unit 52 performs the first operation when the accumulator is in operation. 2 Offset distance C1 is calculated. The first offset distance C0 is stored in the storage unit 16 as the number of pulses output from the second length measuring device 42, for example. The second offset distance C1 is calculated as, for example, the sum (C0 + C) of the first offset distance C0 and the correction value C.

  The recording control unit 53 detects defects included in the first film F1 based on the image D of the first film F1 imaged by the first defect inspection apparatus 7, and defect information (to be recorded on the second film F5) ( Information on the location and type of the defect).

  The recording control unit 53 determines the recording timing of the defect information based on the second offset distance C1 calculated by the second calculation unit 52. For example, the recording control unit 53 detects the upstream of the accumulator 10 after the time when the defect inspection is performed by the first defect inspection device 7 based on the measurement result of the first length measuring device 41 or the second length measuring device 42. The conveyance amount of the film FX on the side or downstream side is detected, and at the timing when the conveyance amount coincides with the second offset distance C1, the recording device 9 is controlled to record defect information and accumulator operation information on the film FX.

  As shown in FIG. 3, when the accumulator is in operation (when the AL origin signal ALS is “OFF”), the post-AL line decelerates as the dancer roller 10 a rises. The post-AL line decelerates immediately after the AL origin signal ALS becomes “OFF”, and the conveyance speed becomes zero after a certain period. Maintenance such as paper splicing is performed when the conveyance speed of the post-AL line becomes zero, and the post-AL line is accelerated after the maintenance is completed. On the pre-AL line, transport is performed at a constant speed even when the accumulator is in operation.

  The correction value C and the second offset distance C1 change with time. The recording control unit 53 constantly monitors the first transport amount A, the second transport amount B, and the second offset distance C1 while the accumulator is operating.

  For example, the time when the defect detection is performed in the first defect inspection apparatus 7 is t0, and any time after the time t0 is t. For example, the recording control unit 53 counts the number of pulses output from the first length measuring device 41 or the second length measuring device 42 between time t0 and time t, so that the time between time t0 and time t is counted. The first conveyance amount A or the second conveyance amount B of the film FX conveyed on the pre-AL line or the post-AL line is detected. The recording control unit 53 compares the second offset distance C1 at the time t with the value of the first transport amount A or the second transport amount B of the film FX from the time t0 to the time t. The apparatus 9 is controlled to record defect information and accumulator operation information on the second film F5.

  According to the manufacturing apparatus 1 and the defect inspection system 100 of the present embodiment described above, the first defect inspection apparatus 7 and the recording apparatus 9 are based on the difference in the transport amount of the film FX between the upstream side and the downstream side of the accumulator 10. The correction value of the offset distance between is calculated. Based on the correction value, the recording timing of the defect information on the film FX by the recording device 9 is corrected. Therefore, even when the offset distance between the first defect inspection apparatus 7 and the recording apparatus 9 varies due to the operation of the accumulator 10, the manufacturing is unlikely to cause a deviation between the defect location and the defect information recording position. The apparatus 1 and the defect inspection system 100 can be provided.

DESCRIPTION OF SYMBOLS 7 ... 1st defect inspection apparatus, 9 ... Recording apparatus, 10 ... Accumulator, 15 ... Control apparatus, 16 ... Memory | storage device, 41 ... 1st length measuring device, 42 ... 2nd length measuring device, 51 ... 1st calculating part , 52 ... 2nd calculation part, 53 ... Recording control part, 100 ... Defect inspection system, A ... Amount of film transport on the upstream side of the accumulator, B ... Amount of film transport on the downstream side of the accumulator, C ... Correction value , C0: first offset distance, C1: second offset distance, FX: film, L: transport line

Claims (3)

A transport line for transporting a belt-shaped film;
An accumulator provided in the transfer line;
A defect inspection apparatus provided in the transport line upstream of the accumulator;
A recording apparatus that is provided in the transport line downstream of the accumulator and records defect information on the defect detected by the defect inspection apparatus on the film;
Based on the difference in the transport amount of the film between the upstream side and the downstream side of the accumulator, a correction value for the offset distance between the defect inspection apparatus and the recording apparatus is calculated, and based on the correction value, A control device for correcting the recording timing of the defect information on the film by the recording device ;
A first length measuring device provided upstream of the accumulator;
A second length measuring device provided downstream of the accumulator;
A storage device for storing a first offset distance between the defect inspection device and the recording device when the accumulator is not in operation;
The controller is
A first calculation unit that calculates the correction value based on measurement results of the first length measuring device and the second length measuring device;
A second calculator that calculates a second offset distance between the defect inspection apparatus and the recording apparatus when the accumulator is operating based on the correction value and the first offset distance;
Based on the measurement results of the first length measuring device or the second length measuring device, the transport amount of the film on the upstream side or downstream side of the accumulator after the time when the defect inspection is performed by the defect inspection device. A defect inspection system comprising: a recording control unit that detects and records the defect information on the film by controlling the recording apparatus at a timing when the conveyance amount coincides with the second offset distance . When the accumulator is activated between the time when the defect is detected by the defect inspection device and the time when defect information relating to the defect is recorded by the recording device, the accumulator is activated. The defect inspection system according to claim 1 , wherein accumulator operation information indicating ??? is recorded on the film together with the defect information.   A transport line for transporting a belt-shaped film;
  An accumulator provided in the transfer line;
  A defect inspection apparatus provided in the transport line upstream of the accumulator;
  A recording apparatus that is provided in the transport line downstream of the accumulator and records defect information on the defect detected by the defect inspection apparatus on the film;
  Based on the difference in the transport amount of the film between the upstream side and the downstream side of the accumulator, a correction value for the offset distance between the defect inspection apparatus and the recording apparatus is calculated, and based on the correction value, A control device for correcting the recording timing of the defect information on the film by the recording device,
  When the accumulator is activated between the time when the defect is detected by the defect inspection device and the time when defect information relating to the defect is recorded by the recording device, the accumulator is activated. A defect inspection system that records accumulator operation information indicating the defect information together with the defect information on the film.

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