TWI816846B - Polarizing plate manufacturing system, marking method, polarizing plate manufacturing method and polarizing plate - Google Patents

Polarizing plate manufacturing system, marking method, polarizing plate manufacturing method and polarizing plate Download PDF

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TWI816846B
TWI816846B TW108126703A TW108126703A TWI816846B TW I816846 B TWI816846 B TW I816846B TW 108126703 A TW108126703 A TW 108126703A TW 108126703 A TW108126703 A TW 108126703A TW I816846 B TWI816846 B TW I816846B
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polarizing plate
film
polarizing
visible light
marking
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TW202014739A (en
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霜越雅範
塚田龍太
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日商日本化藥股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/04Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of organic materials, e.g. plastics
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/888Marking defects

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  • General Health & Medical Sciences (AREA)
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  • Life Sciences & Earth Sciences (AREA)
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  • Computer Vision & Pattern Recognition (AREA)
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  • Polarising Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
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Abstract

本發明將可見光雷射照射至偏光板(100),並使偏光素膜(10)吸收可見光雷射,藉此使被照射到可見光雷射的部分的偏光素膜(10)變質,且使變質的部分的光學特性產生變化來進行標記。藉此,在包含有使可見光偏光的偏光素膜之偏光板中,對缺陷施加標記。 The present invention irradiates visible light laser to the polarizing plate (100), and causes the polarizer film (10) to absorb the visible light laser, thereby degrading the part of the polarizer film (10) that is irradiated with the visible light laser, and causing the deterioration of the polarizer film (10). Marking occurs by changes in the optical properties of the part. Thereby, defects are marked in a polarizing plate including a polarizer film that polarizes visible light.

Description

偏光板製造系統、標記方法、偏光板的製造方法及偏光板 Polarizing plate manufacturing system, marking method, polarizing plate manufacturing method and polarizing plate

本發明關於針對液晶裝置等之中所使用的偏光板的缺陷標記。 The present invention relates to defect marking for polarizing plates used in liquid crystal devices and the like.

液晶顯示裝置等之中所使用的偏光板,一般是將包含碘或染料(二色性色素)之聚乙烯醇(PVA)樹脂延伸而得到偏光素膜(偏光原片),然後一邊搬送偏光素膜一邊自兩側積層由可見光透過性的樹脂所構成的支持膜等,來加以製造出來。 The polarizing plate used in liquid crystal display devices, etc. is generally made by stretching a polyvinyl alcohol (PVA) resin containing iodine or a dye (dichroic dye) to obtain a polarizing film (polarizing original sheet), and then transporting the polarizing film The film is manufactured by laminating support films made of visible light-transmissive resin from both sides.

這樣的偏光板的製造產線中,一般具備有缺陷檢測裝置,其檢測製造中所發生的傷痕或由於混入的異物等所造成的缺陷。該缺陷檢測裝置由光源部、攝影系統及電腦所構成,該光源部通常是LED(發光二極體),該攝影系統具有CCD(電荷耦合元件)相機等的受光部並藉由光的透過或反射來運作,該電腦對所獲得的資料進行處理。 Such a polarizing plate manufacturing line is generally equipped with a defect detection device that detects defects caused by flaws that occur during manufacturing or foreign matter that is mixed in, or the like. The defect detection device is composed of a light source part, a photography system and a computer. The light source part is usually an LED (light emitting diode). The photography system has a light receiving part such as a CCD (charge coupled device) camera and uses light transmission or Working through reflection, the computer processes the data it obtains.

在製造產線的下游側具備標記裝置,該標記裝置基於由缺陷檢測裝置所檢測到的缺陷的資料,來對缺陷部施加標記。藉由對偏光板的缺陷附加上標記,能夠在製品的檢查步驟中將包含缺陷之部分去除、或是在偏光板的使用時藉由使用者的目視等來確認標記並將包含缺陷之部分去除而使用。A marking device is provided on the downstream side of the manufacturing line. The marking device marks the defective portion based on the data of the defect detected by the defect detection device. By adding a mark to the defect of the polarizing plate, the part containing the defect can be removed during the inspection step of the product, or the mark can be confirmed by the user's visual inspection and the part containing the defect can be removed when using the polarizing plate. And use.

此處,作為標記的方式,可舉出:藉由噴墨或麥克筆來塗布墨水的方法、在膜(薄膜)的端部貼上膠帶作為標示的方法、藉由雷射照射來進行的方法等。Here, examples of marking methods include a method of applying ink with an inkjet or a marker pen, a method of marking with a tape on an end of a film (thin film), and a method of laser irradiation. wait.

在使用墨水的標記的情況中,由於墨水包含稀釋溶劑等所以需要乾燥時間,或者在之後的生產步驟中墨水有時會剝落或轉印至輥上。因此,會有剝落的墨水污染製造產線、以及缺陷部的位置變得無法辨識的風險。又,在對端部使用膠帶的標記方法中,有時會因為之後的生產步驟,例如狹縫加工等而使得標記位置被除去,而使缺陷部的位置變得無法辨識的情形。因此,該等標記方法雖然容易進行,但卻不能說是足夠好的方法。In the case of marking using ink, drying time is required because the ink contains a diluting solvent or the like, or the ink may peel off or be transferred to a roller in a subsequent production step. Therefore, there is a risk that peeling ink will contaminate the manufacturing line and the location of the defective part will become unrecognizable. In addition, in the marking method using tape for the end portion, the marking position may be removed due to subsequent production steps, such as slit processing, and the position of the defective part may become unrecognizable. Therefore, although these labeling methods are easy to perform, they cannot be said to be good enough.

另一方面,藉由雷射照射來進行的標記方法,因為能夠直接加熱樹脂等的薄膜來加以標記,所以能夠消除前述的問題。標記用的雷射光源,作為代表性的可舉出使用紅外光雷射的光源,使用CO2 (二氧化碳)的波長10.6μm的雷射、或是使用YAG(釔鋁石榴石)結晶的波長1064nm的雷射等。On the other hand, the marking method by laser irradiation can eliminate the above-mentioned problems because a thin film such as resin can be directly heated for marking. Typical laser light sources for marking include those using infrared lasers, lasers with a wavelength of 10.6 μm using CO 2 (carbon dioxide), or lasers with a wavelength of 1064 nm using YAG (yttrium aluminum garnet) crystals. of laser, etc.

例如,在專利文獻1中,揭示有藉由YAG雷射來燒去線柵偏光板上的鋁。又,記載有若使用CO2 雷射,則會在成為偏光板100基材的樹脂上穿出孔洞。For example, Patent Document 1 discloses burning aluminum on a wire grid polarizing plate using a YAG laser. Furthermore, it is described that if a CO 2 laser is used, holes will be punched in the resin that is the base material of the polarizing plate 100 .

[先前技術文獻] (專利文獻) 專利文獻1:日本特開2011-257343號公報。[Prior technical literature] (patent document) Patent Document 1: Japanese Patent Application Publication No. 2011-257343.

(發明所欲解決的問題) 此處,在專利文獻1中,記載了以集塵機等來捕捉因為在薄膜上進行標記而發生的塵埃。亦即,該藉由雷射照射來進行的標記會使標記過的部分受到損傷。(The problem that the invention aims to solve) Here, Patent Document 1 describes using a dust collector or the like to capture dust generated by marking on a film. That is, the marking by laser irradiation will cause damage to the marked portion.

又,用於標記的雷射照射,一般為了提高標記的視認性以及縮短雷射照射時間,會要求想要提高雷射照射的輸出。因此,認為會因為標記時所發生的熱能,而使得在標記部及其周邊出現伴隨凹凸或扭曲等變形之局部性的厚度變化。因此,當施加有這樣的標記之製品薄膜一片一片地重疊、或是連續捲繞成滾筒狀時,該凹凸或扭曲的形狀會在上下重疊的薄膜間轉印,成為壓痕缺陷等二次缺陷的原因,而有降低製品良率的問題。又,因雷射照射的熱而自標記部發煙或發塵,可能會污染製造產線的環境。In addition, when laser irradiation is used for marking, it is generally required to increase the output of the laser irradiation in order to improve the visibility of the mark and shorten the laser irradiation time. Therefore, it is considered that local thickness changes accompanied by deformation such as unevenness or distortion occur in the marked portion and its surroundings due to thermal energy generated during marking. Therefore, when product films with such markings are stacked one by one or are continuously wound into a roll, the uneven or distorted shapes are transferred between the overlapping films and become secondary defects such as indentation defects. The reason is that there is a problem of reducing product yield. In addition, smoke or dust is emitted from the marking portion due to the heat irradiated by the laser, which may pollute the environment of the manufacturing line.

本發明的目的在於提供一種標記裝置和標記方法,其在藉由雷射照射來對缺陷施加標記時,能夠抑制發生表面的凹凸等而提高生產品質。An object of the present invention is to provide a marking device and a marking method that can suppress the occurrence of surface irregularities and improve production quality when marking defects by laser irradiation.

(用於解決問題的手段) 本發明人經過深入檢討的結果,發現到在用於缺陷標記的雷射照射中,藉由使用可見光雷射,能夠使該可見光雷射被偏光板中的偏光素膜所吸收,而在抑制住標記部周邊的凹凸或扭曲發生等的變形的情況下,使偏光素膜變質來進行標記,而完成了本發明。(means used to solve problems) As a result of in-depth review, the inventor found that by using visible light laser in laser irradiation for defect marking, the visible light laser can be absorbed by the polarizer film in the polarizing plate, thereby suppressing the When deformation such as unevenness or distortion occurs around the marking portion, the present invention was completed by modifying the polarizing film to perform marking.

本發明是一種標記裝置,其在偏光板中對缺陷施加標記,前述偏光板包含使可見光偏光的偏光素膜,該標記裝置包含雷射源,其射出可見光雷射;並且,前述標記裝置使前述偏光素膜吸收來自雷射源的可見光雷射,以使前述偏光素膜變質並且使變質的部分的光學特性變化,藉此進行標記。The present invention is a marking device that marks defects in a polarizing plate. The polarizing plate includes a polarizer film that polarizes visible light. The marking device includes a laser source that emits a visible light laser; and the marking device makes the aforementioned marking device The polarizer film absorbs the visible light laser from the laser source, so that the polarizer film is modified and the optical properties of the modified part are changed, thereby marking.

又,前述偏光板,可包含自兩側包夾前述偏光素膜之可見光透過性的支持膜,且可見光雷射透過支持膜並由前述偏光素膜所吸收。In addition, the polarizing plate may include a visible light-transmissive support film sandwiching the polarizer film from both sides, and the visible light laser transmits through the support film and is absorbed by the polarizer film.

又,前述偏光素膜,可藉由吸收可見光雷射而變質,且藉由以下任一種以上的方法來被標記:(i)色感變化、(ii)偏光特性變化。In addition, the aforementioned polarizing film can be modified by absorbing visible light laser, and can be marked by any one or more of the following methods: (i) color sense change, (ii) polarization characteristic change.

又,前述可見光雷射可為綠光。In addition, the aforementioned visible light laser may be green light.

又,前述偏光素膜可包含碘或染料的二色性色素。Furthermore, the polarizer film may contain a dichroic dye of iodine or dye.

又,前述可見光雷射可為直線偏光;且可將前述可見光雷射的偏光方向在相對於前述偏光板的吸收軸方向為0~90°的範圍中變更。In addition, the visible light laser may be linearly polarized light; and the polarization direction of the visible light laser may be changed in the range of 0 to 90° with respect to the absorption axis direction of the polarizing plate.

又,本發明可為對應如上述之裝置的標記方法。Furthermore, the present invention can be a marking method corresponding to the above-mentioned device.

又,本發明可為包含上述標記方法的偏光板的製造方法,亦可為藉由該偏光板的製造方法所製造出的偏光板。Furthermore, the present invention may be a polarizing plate manufacturing method including the above marking method, or a polarizing plate manufactured by the polarizing plate manufacturing method.

又,前述變質部分亦可不具有偏光性,且以前述基材的表面作為基準的最大深度和最大隆起高度分別在5μm以下。In addition, the modified portion may not have polarization, and the maximum depth and maximum ridge height based on the surface of the base material may be 5 μm or less respectively.

(發明的功效) 根據本發明,能夠使偏光板內部的偏光素膜變質來進行標記。藉此,能夠抑制住伴隨雷射照射的標記部和該周邊的變形。因此,能夠防止變形部分的轉印或壓痕的二次缺陷發生,而提高生產品質。(The effect of the invention) According to the present invention, the polarizer film inside the polarizing plate can be modified to perform marking. Thereby, it is possible to suppress deformation of the marking portion and its periphery caused by laser irradiation. Therefore, it is possible to prevent the occurrence of secondary defects such as transfer of deformed parts or impressions, thereby improving production quality.

進而,因為是可見光雷射,即便在偏光板的支持膜中含有紫外線吸收劑,雷射光也不會被支持膜所吸收而能夠到達偏光素膜並使偏光素膜變質。Furthermore, because it is a visible light laser, even if the support film of the polarizing plate contains an ultraviolet absorber, the laser light will not be absorbed by the support film and can reach the polarizer film and deteriorate the polarizer film.

以下針對本發明的實施型態,基於圖式來加以說明。此外,本發明並不限定於此處所記載的實施型態。The embodiments of the present invention will be described below based on the drawings. In addition, this invention is not limited to the embodiment described here.

(整體構成) 第1圖是表示偏光板製造系統的整體構成的圖,該系統包含一實施型態之標記裝置。(overall composition) FIG. 1 is a diagram showing the overall structure of a polarizing plate manufacturing system, which includes a marking device according to an embodiment.

被形成為長條帶狀構件的偏光素膜10被自輥等拉出(退繞)而被搬送出去。此處,偏光素膜10,例如能夠使用以二色性色素對由聚乙烯醇系樹脂所構成的膜(薄膜)來加以染色過的膜。二色性色素,作為代表性的是碘或偶氮化合物等的染料,其在可見光域中具有偏光特性。例如,在液晶顯示裝置中被配置在液晶的入射側或射出側。此處,二色性色素,較佳為能夠充分吸收後述標記中所使用的可見光雷射。The polarizing film 10 formed into a long strip-shaped member is pulled out (unwinded) from a roller or the like and transported. Here, as the polarizing film 10, for example, a film (film) made of a polyvinyl alcohol-based resin dyed with a dichroic dye can be used. Typical examples of dichroic dyes include dyes such as iodine and azo compounds, which have polarizing properties in the visible light range. For example, in a liquid crystal display device, it is arranged on the incident side or the emitting side of liquid crystal. Here, the dichroic dye is preferably one that can fully absorb visible light laser used for marking described later.

偏光素膜10的厚度,並未特別限定,例如是1μm~100μm程度。若考慮到延伸的容易度或利用雷射的標記性、標記的視認性等,較佳為該膜厚在5μm以上。The thickness of the polarizing film 10 is not particularly limited, but is, for example, about 1 μm to 100 μm. Taking into consideration the ease of stretching, marking properties with laser, visibility of markings, etc., the film thickness is preferably 5 μm or more.

在本例中,以可見光透過性的支持膜12a、12b來夾持偏光素膜10的兩面。亦即,在搬送而來的偏光素膜10的上側和下側,重疊支持膜12a、12b,並以輥14a、14b從上下方向推壓,藉此以支持膜12a、12b來夾持偏光素膜10的兩面而形成偏光板100。In this example, both sides of the polarizing film 10 are sandwiched between visible light-transmitting support films 12a and 12b. That is, the support films 12a and 12b are overlapped on the upper and lower sides of the transported polarizer film 10, and are pressed from the up and down directions by the rollers 14a and 14b, thereby sandwiching the polarizer between the support films 12a and 12b. Both sides of the film 10 form the polarizing plate 100 .

支持膜12a、12b,光學性質上為無色透明,一般而言是用來保護偏光素膜10,該偏光素膜10相對於熱或水分是脆弱的。作為其他的支持膜12的功能之例,還具備補償功能,該功能用來提高液晶顯示裝置中的視角等的顯示性。當將偏光素膜10與支持膜12a、12b積層時,並未特別加以限定,例如可隔著由乙烯醇系樹脂所構成的黏著劑等的黏著劑來將偏光素膜10與支持膜12a、12b積層。作為支持膜12a、12b的材質,可舉出:醋酸纖維素系樹脂、降莰烯樹脂、聚碳酸酯系樹脂、丙烯酸系樹脂等。又,對於支持膜12a、12b,通常使用100μm以下厚度的膜,一般而言是作成80μm以下,而從偏光板100的薄型化的觀點來看可作成60μm以下。在支持膜12a、12b的與黏著面相反的一側的面(外側面)上,可形成適當的表面功能層,如防眩光層、硬塗佈層、反射防止層、帶電防止層等。此外,表面功能層,也不適合使用會吸收可見光的膜,而是無色透明的。The support films 12a and 12b are colorless and transparent in optical properties, and are generally used to protect the polarizer film 10, which is fragile to heat or moisture. As an example of other functions of the support film 12, it also has a compensation function for improving the display performance such as viewing angle in the liquid crystal display device. When the polarizing film 10 and the supporting films 12a and 12b are laminated, the polarizing film 10 and the supporting films 12a and 12b are not particularly limited. For example, the polarizing film 10 and the supporting films 12a and 12b may be laminated through an adhesive such as an adhesive made of vinyl alcohol resin. 12b build-up. Examples of the material of the support films 12a and 12b include cellulose acetate resin, norbornene resin, polycarbonate resin, acrylic resin, and the like. In addition, for the support films 12a and 12b, films with a thickness of 100 μm or less are usually used, and generally the thickness is 80 μm or less. However, from the viewpoint of thinning the polarizing plate 100, the thickness can be 60 μm or less. Appropriate surface functional layers such as an anti-glare layer, a hard coating layer, an anti-reflection layer, and an anti-static layer can be formed on the surface opposite to the adhesive surface (outer surface) of the support films 12a and 12b. In addition, the surface functional layer is not suitable for use with films that absorb visible light, but is colorless and transparent.

又,本實施型態的情況中,由於是用可見光雷射來進行標記,在支持膜12a、12b或表面功能層亦可具有紫外線吸收功能。該紫外線吸收功能,例如可藉由在薄膜或表面功能層中添加紫外線吸收劑來賦予。作為紫外線吸收劑,能夠使用:苯並三唑系、二苯基酮系、水楊酸系、氰基丙烯酸酯系、環狀亞胺酯系等周知的材料。此外,作為市售的偏光板用的支持膜12,作為代表性的有TAC(三醋酸纖維素),在該TAC中一般含有紫外線吸收劑。另一方面,在以TAC或丙烯酸樹脂等作為成分的具有前述補償功能的支持膜中,一般不含有紫外線吸收劑。因此,偏光板100中的具有紫外線吸收功能的層的設置位置,因為是以抑制因太陽光等的紫外線所造成的劣化為目的而賦予,所以要配合使用偏光板100的最終製品的型態來設計。In addition, in the case of this embodiment, since visible light laser is used for marking, the support films 12a and 12b or the surface functional layer may also have an ultraviolet absorbing function. This ultraviolet absorbing function can be provided, for example, by adding an ultraviolet absorber to the film or surface functional layer. As the ultraviolet absorber, well-known materials such as benzotriazole-based, benzophenone-based, salicylic acid-based, cyanoacrylate-based, and cyclic imide-based materials can be used. In addition, TAC (triacetyl cellulose) is a representative example of the commercially available support film 12 for polarizing plates, and this TAC generally contains an ultraviolet absorber. On the other hand, support films having the aforementioned compensating function containing TAC, acrylic resin, etc. as components generally do not contain ultraviolet absorbers. Therefore, the location of the layer with an ultraviolet absorbing function in the polarizing plate 100 is determined for the purpose of suppressing deterioration caused by ultraviolet rays such as sunlight, and therefore must be determined according to the type of final product in which the polarizing plate 100 is used. design.

檢查對象的偏光板100,較佳為上述偏光板100以及具有表面功能層之偏光板100的態樣,但只要是雷射光會到達偏光素膜且被吸收的態樣,則亦可為將保護薄膜(防護薄膜)、相位差薄膜、視角補償薄膜、黏著層、脫模薄膜(分離薄膜)等的薄膜和層等積層了1層或2層以上的態樣。The polarizing plate 100 to be inspected is preferably in the form of the above-mentioned polarizing plate 100 or the polarizing plate 100 having a surface functional layer. However, as long as the laser light reaches the polarizing film and is absorbed, it can also be a protective film. Films and layers such as films (protective films), retardation films, viewing angle compensation films, adhesive layers, release films (separation films), etc. are formed by laminating one or more layers.

此外,本實施型態中,是將在偏光素膜10的兩側配置了支持膜12a、12b的型態作為標記的對象,但亦可如後述對偏光素膜10單體進行標記。另外,亦有著僅在偏光素膜10的單側設置支持膜12的情況。該等構成,是配合例如液晶顯示裝置或偏光太陽眼鏡用透鏡等的最終製品的用途來設計。在後者的構成的情況中,較佳為是自支持膜側照射雷射光,藉此能夠獲得本發明的功效。此外,偏光板100的缺陷中,由於有著如後述會因積層或夾持支持膜而顯著化的缺陷,或是反而藉由黏著層填埋起來而消失的缺陷,因此就缺陷檢測的效率性的觀點來看,更佳為對偏光素膜10賦予支持膜12的構成。In addition, in this embodiment, the pattern in which the support films 12a and 12b are arranged on both sides of the polarizer film 10 is targeted for marking. However, the polarizer film 10 alone may be marked as described below. In addition, the support film 12 may be provided only on one side of the polarizer film 10 in some cases. These structures are designed to suit the use of the final product, such as a liquid crystal display device or a lens for polarized sunglasses. In the case of the latter configuration, it is preferable to irradiate the self-supporting film side with laser light, thereby achieving the effects of the present invention. In addition, among the defects of the polarizing plate 100 , there are defects that become conspicuous by laminating or sandwiching support films as described later, or defects that disappear by being filled with an adhesive layer, so there is a problem with the efficiency of defect detection. From this point of view, it is more preferable to provide the support film 12 to the polarizer film 10 .

在偏光素膜10的兩面重疊了支持膜12a、12b之偏光板100,藉由檢測裝置16來加以檢查。該例中,檢測裝置16,由光照射裝置16b與攝影裝置16a所構成。來自光照射裝置16b的光透過偏光板100,且由攝影裝置16a拍攝下該透過影像。光照射裝置16b,可為雷射光源亦可為各種LED(發光二極體),攝影裝置16a可採用CCD(電荷耦合元件:Charge-Coupled Device)或C-MOS(互補式金氧半導體)照相機。The polarizing plate 100 in which the supporting films 12a and 12b are stacked on both sides of the polarizing film 10 is inspected by the detection device 16. In this example, the detection device 16 is composed of a light irradiation device 16b and a photographing device 16a. The light from the light irradiation device 16b is transmitted through the polarizing plate 100, and the transmitted image is captured by the photographing device 16a. The light irradiation device 16b can be a laser light source or various LEDs (Light Emitting Diodes). The photography device 16a can be a CCD (Charge-Coupled Device) or C-MOS (Complementary Metal Oxide Semiconductor) camera. .

來自攝影裝置16a的影像訊號,被供給至控制裝置18。控制裝置18,具有影像處理功能,對影像訊號進行解析並檢測傷痕、異物混入等的缺陷。該缺陷的檢測,可藉由周知的手法來進行,例如將拍攝下來的影像與預先記憶的正常影像加以比較來檢測異常等。The image signal from the photography device 16a is supplied to the control device 18. The control device 18 has an image processing function, analyzes the image signal, and detects defects such as scratches and foreign matters. The defect can be detected by well-known techniques, such as comparing the photographed image with a pre-memorized normal image to detect abnormalities.

此外,所謂被稱為傷痕、異物的偏光板製造步驟中的缺陷,可舉出薄膜搬送時由於輥表面的凹凸對薄膜造成的壓痕或摩擦痕、原材料中本來就有的缺陷、因薄膜彼此的摩擦或切斷而發生的粉塵、因支持膜對附著於偏光素膜中的微小粉塵加以夾持而發生的光學扭曲(knick,裂點)等,是否為缺陷是以在最終製品也就是液晶顯示裝置或太陽眼鏡等之中使用時是否會對品質造成影響來判別。該等缺陷,是1~100μm以上的大小,並且以點狀或線狀等的形狀來被觀察到。In addition, defects in the polarizing plate manufacturing process called scratches and foreign matter include indentations or friction marks on the film due to unevenness on the surface of the roller when the film is transported, inherent defects in the raw materials, and differences between the films. Dust generated by friction or cutting, optical distortion (knick, crack point) caused by the support film clamping tiny dust attached to the polarizer film, etc., are defects in the final product, that is, liquid crystal Determine whether the quality will be affected when used in display devices or sunglasses. These defects have a size of 1 to 100 μm or more, and are observed in shapes such as dots and lines.

並且,在檢測裝置16的下游側,配置有標記裝置20。該標記裝置,搭載有可見光雷射源,將可見光雷射照射至偏光板100上。亦即,若在控制裝置18中檢測到缺陷,便將可見光雷射照射至該缺陷位置(缺陷正上方)或其附近等的能夠在之後認知缺陷位置的位置中,來對缺陷加以標記。Furthermore, the marking device 20 is arranged on the downstream side of the detection device 16 . The marking device is equipped with a visible light laser source, which irradiates the visible light laser onto the polarizing plate 100 . That is, when a defect is detected in the control device 18, the defect is marked by irradiating visible light laser to the defect position (right above the defect) or its vicinity, etc., at a position where the defect position can be recognized later.

此處,可見光的範圍,一般是380~780nm。另一方面,有著在支持膜12a、12b中含有上述紫外線吸收劑的情況,在此情況中可認為380nm以下的光幾乎都會被支持膜12a、12b所吸收,且在390nm附近也會受到支持膜12a、12b的紫外線吸收劑的影響。因此,若考慮到可見光雷射的實用範圍,認為該波長適合為400~780nm。Here, the range of visible light is generally 380 to 780nm. On the other hand, there are cases where the above-mentioned ultraviolet absorber is contained in the support films 12a and 12b. In this case, it is considered that most of the light below 380 nm is absorbed by the support films 12a and 12b, and that light in the vicinity of 390 nm is also absorbed by the support film. The influence of ultraviolet absorbers in 12a and 12b. Therefore, considering the practical range of visible light laser, it is considered that the wavelength is suitable to be 400~780nm.

作為具備可見光雷射之標記裝置,作為代表性的,可舉出照射紅光(635~690nm)和綠光(532nm)的裝置,且能夠取得市售的裝置來使用。特別是,在可見光域具有偏光特性的偏光板,一般被設置成在視感度較高的550nm具備高光學特性,因此較佳為配合這樣的偏光板來使用綠光的可見光雷射。藉此,能夠對染料系和碘系偏光板的各種光學特性廣泛地應用本發明。Typical examples of marking devices equipped with visible light laser include devices that irradiate red light (635 to 690 nm) and green light (532 nm), and commercially available devices can be obtained and used. In particular, a polarizing plate with polarizing properties in the visible light range is generally set to have high optical properties at 550 nm, which has a high visual sensitivity. Therefore, it is preferable to use a green visible light laser with such a polarizing plate. Thereby, the present invention can be widely applied to various optical properties of dye-based and iodine-based polarizing plates.

又,如上述,偏光板的支持膜12中的紫外線吸收劑的有無,會根據使用偏光板100的最終製品的型態而有所不同。因此,藉由使用可見光雷射,能夠泛用性地施加根據本發明而產生的標記而不用顧慮支持膜12中是否有紫外線吸收劑。Furthermore, as mentioned above, the presence or absence of the ultraviolet absorber in the support film 12 of the polarizing plate varies depending on the type of final product using the polarizing plate 100 . Therefore, by using a visible light laser, the mark produced according to the present invention can be applied universally without worrying about whether there is an ultraviolet absorber in the support film 12 .

所謂本發明的可見光雷射的照射所造成的偏光板100內部的偏光素膜10的「變質」,是指因吸收了雷射光的熱效果而造成偏光素膜產生化學或物理變化的情形。具體而言,認為會發生以下情形:因延伸PVA的軟化而造成二色性色素的配向緩和、所含有的二色性色素的變化或分解、PVA層的破壞等。因此,該標記痕,在目視下作為色感的變化而被觀察到,且在光學性質上作為偏光特性的消失或劣化而被觀察到。The so-called "deterioration" of the polarizer film 10 inside the polarizer 100 caused by the irradiation of visible light laser in the present invention refers to the situation where the polarizer film undergoes chemical or physical changes due to the absorption of the thermal effect of the laser light. Specifically, it is considered that the softening of stretched PVA may cause the alignment of the dichroic dye to be relaxed, the dichroic dye contained may be changed or decomposed, and the PVA layer may be damaged. Therefore, the mark mark is visually observed as a change in color perception, and optically, it is observed as a disappearance or deterioration of polarization characteristics.

標記結束的偏光板100,貼上保護薄膜並由捲繞輥22來捲繞起來,作為製品而出貨。作為其他製品出貨的型態的例子,前述偏光板100,貼上保護薄膜並且保持這樣的狀況連續切割成薄板狀或片狀。作為更進一步的其他例子還有以下的型態:捲繞起來的偏光板100,貼上保護薄膜,積層上黏著層或相位差薄膜,並分別切割成薄板狀或片狀後作為製品來出貨。薄板狀或片狀製品的情況中,具有標記之偏光板,作為不良製品而由檢查步驟被剔除。此外,上述所謂薄板,是指較大形狀的製品,例如製品的一邊具有0.5~1m程度,且所謂片狀,是指較小形狀的製品,例如製品的對角線為0.1~10吋程度的大小。The polarizing plate 100 with the mark completed is affixed with a protective film, wound up by the winding roller 22, and shipped as a product. As an example of another type of product shipment, the polarizing plate 100 described above is affixed with a protective film and continuously cut into a thin plate or sheet shape while being kept in this state. As a further example, there are the following types: the polarizing plate 100 is rolled up, a protective film is affixed, an adhesive layer or a retardation film is laminated, and the polarizing plate 100 is cut into thin plates or sheets and shipped as products. . In the case of thin plate or sheet-like products, the polarizing plate with the mark is rejected by the inspection step as a defective product. In addition, the above-mentioned thin plate refers to a relatively large-shaped product, for example, one side of the product is about 0.5 to 1 m, and the so-called sheet shape refers to a smaller-shaped product, for example, the diagonal of the product is about 0.1 to 10 inches. size.

例如,在液晶顯示裝置的製造產線中,自捲筒狀的偏光板捲繞出偏光板100,並根據需要裁斷來使用。此時,藉由目視或感測器來檢測表示缺陷的標記,並將對應的部分廢棄,便能夠以避免去使用到缺陷存在的部分的方式來使用偏光板100。For example, in a manufacturing line of a liquid crystal display device, the polarizing plate 100 is rolled out of a roll-shaped polarizing plate and cut as needed for use. At this time, by detecting marks indicating defects visually or with a sensor and discarding the corresponding parts, the polarizing plate 100 can be used in a manner that avoids using the parts where the defects exist.

「標記的具體例」 以下基於實施型態來說明本實施型態之標記裝置。"Specific examples of marking" The following describes the marking device of this embodiment based on the embodiment.

(實施例1) 進行以下的試驗:使用具備射出綠光之可見光雷射的功能的雷射照射裝置(YAG雷射的二次諧波,波長532nm),向染料系的偏光板100SHC-125U (Polatechno公司製造)的偏光板100施加標記。(Example 1) The following test was conducted: using a laser irradiation device (second harmonic of YAG laser, wavelength 532nm) capable of emitting green light as a visible light laser, the dye-based polarizing plate 100SHC-125U (manufactured by Polatechno Co., Ltd.) was irradiated. The polarizing plate 100 is marked.

染料系的偏光板100SHC-125U,是由以下各要素所構成:作為偏光素膜的以PVA作為基材之染料系偏光素膜、配置於偏光素膜兩側的作為支持膜的TAC膜、配置於其中一方的TAC層上之PET(聚對苯二甲酸乙二酯)保護薄膜、以及隔著黏著層而配置於另一方的TAC層上之脫模薄膜。The dye-based polarizing plate 100SHC-125U is composed of the following elements: a dye-based polarizing film using PVA as a base material as a polarizing film, TAC films as supporting films placed on both sides of the polarizing film, and A PET (polyethylene terephthalate) protective film on one of the TAC layers, and a release film placed on the other TAC layer via an adhesive layer.

此外,該偏光板100的光學特性,為視感度校正透過率39.5%,視感度校正偏光度99.5%。自偏光板100將PET保護薄膜剝離後,將雷射光照射至偏光板100表面(TAC層)。此時,雷射光的偏光方向與偏光板100的吸收軸的關係是以0°來進行,且雷射照射的輸出為51%(100%時的能量密度為4.8×103 W/mm2 ),照射時間為每1標記0.1秒,到偏光板100為止的照射距離為30cm,藉此施加的標記尺寸是以直徑約2mm來進行。In addition, the optical properties of the polarizing plate 100 are a visual sensitivity-corrected transmittance of 39.5% and a visual sensitivity-corrected polarization degree of 99.5%. After peeling off the PET protective film from the polarizing plate 100, laser light is irradiated to the surface of the polarizing plate 100 (TAC layer). At this time, the relationship between the polarization direction of the laser light and the absorption axis of the polarizing plate 100 is 0°, and the laser irradiation output is 51% (the energy density at 100% is 4.8×10 3 W/mm 2 ). The irradiation time is 0.1 seconds per mark, the irradiation distance to the polarizing plate 100 is 30 cm, and the mark size applied thereby is about 2 mm in diameter.

此處,第2圖表示標記裝置所造成的標記痕的形狀例(形狀不限定於該等形狀)。自左側起為(i)圓形:4×4的網格、(ii)圓形:9×9的網格、(iii)圓形:有邊緣的點狀、(iv)圓形:同心圓(等高線)、(v)正方形:橫條紋。Here, FIG. 2 shows an example of the shape of the marking mark produced by the marking device (the shape is not limited to these shapes). From the left: (i) circle: 4×4 grid, (ii) circle: 9×9 grid, (iii) circle: dots with edges, (iv) circle: concentric circles (contour lines), (v) square: horizontal stripes.

此處,雖然印刷量越多越容易看得見,但印刷時間也隨之變長且對基材的損傷增加。可由生產步驟的產線速度、後續步驟中的視認性的觀點來選擇較佳的形狀。又,標記,不需要作成特定形狀,亦可作成整體均勻的照射。Here, although the larger the printing amount, the easier it is to see, but the printing time also becomes longer and the damage to the substrate increases. The optimal shape can be selected from the viewpoint of line speed in the production step and visibility in subsequent steps. Furthermore, the mark does not need to be formed into a specific shape, and the mark can be irradiated uniformly throughout.

根據目視觀察,將已藉由該雷射照射標記過的部分的外觀的結果表示於表1。觀察到的標記部的評價是對以下各要素來進行:(1)標記的視認性、(2)標記部和標記部周邊的扭曲、(3)被視認到的標記的色感,其中針對(1)、(2)的判定如以下所述。此外,針對(1),是由6位實際的偏光板100製造中的製品檢查員來進行識別判定。Table 1 shows the results of the appearance of the portion marked by the laser irradiation based on visual observation. The evaluation of the observed marking portion is based on the following factors: (1) visibility of the marking, (2) distortion of the marking portion and the periphery of the marking portion, (3) color sense of the visible marking, among which ( The determination of 1) and (2) is as follows. In addition, regarding (1), identification and judgment were performed by six product inspectors who were actually manufacturing the polarizing plate 100 .

(1)標記痕的視認性 A:6位檢查員全都識別到; B:識別到標記的檢查員在5人以下; C:識別到標記的檢查員在2人以下。(1) Visibility of marking marks A: All 6 inspectors identified it; B: The number of inspectors who recognized the mark is less than 5; C: The number of inspectors who recognized the mark is less than 2.

(2)標記痕和標記痕周邊的扭曲等 ○:幾乎沒有凹凸或扭曲; ╳:有凹凸或扭曲。(2) Marking marks and distortion around marking marks, etc. ○: Almost no unevenness or distortion; ╳: There are bumps or distortions.

(實施例2) 將前述雷射照射的輸出設成30%,除此以外與實施例1的記載內容相同。(Example 2) The output of the laser irradiation was set to 30%, and the content was the same as that of Example 1 except that it was set to 30%.

(實施例3) 使用碘系的偏光板100JET-12PU(Polatechno公司製造),將雷射照射的輸出設成51%,除此以外與實施例1的記載內容相同。偏光板100由PET保護薄膜、偏光板100、黏著層及脫模薄膜所構成,光學特性為視感度校正透過率40.4%、視感度校正偏光度99.99%。(Example 3) The contents were the same as those described in Example 1 except that iodine-based polarizing plate 100JET-12PU (manufactured by Polatechno Co., Ltd.) was used and the output of laser irradiation was set to 51%. The polarizing plate 100 is composed of a PET protective film, the polarizing plate 100, an adhesive layer and a release film. The optical properties are a visual sensitivity corrected transmittance of 40.4% and a visual sensitivity corrected polarization degree of 99.99%.

(實施例4) 使用碘系的偏光板100JET-12PU(Polatechno公司製造),將雷射照射的輸出設成30%,除此以外與實施例1的記載內容相同。(Example 4) The contents were the same as those described in Example 1 except that iodine-based polarizing plate 100JET-12PU (manufactured by Polatechno Co., Ltd.) was used and the output of laser irradiation was set to 30%.

(比較例1) 使用具備CO2 雷射光照射的雷射照射裝置(波長10.6μm),將雷射照射的輸出設成70%(100%時的能量密度為1.9×103 W/mm2 ),除此以外與實施例1的記載內容相同。(Comparative Example 1) A laser irradiation device (wavelength 10.6 μm) equipped with CO 2 laser light irradiation was used, and the output of laser irradiation was set to 70% (energy density at 100% is 1.9×10 3 W/mm 2 ) , otherwise it is the same as described in Example 1.

(比較例2) 將前述雷射照射的輸出設成15%,除此以外與比較例1的記載內容相同。對於雷射標記部分的外觀的觀察結果表示於表1。(Comparative example 2) The content described in Comparative Example 1 was the same except that the output of the laser irradiation was set to 15%. Table 1 shows the results of observation of the appearance of the laser-marked portion.

(比較例3) 使用具備UV雷射光照射的雷射照射裝置(波長355nm),將雷射照射的輸出設成70%(100%時的能量密度為3.5×103 W/mm2 ),除此以外與實施例1的記載內容相同。(Comparative Example 3) A laser irradiation device (wavelength 355nm) equipped with UV laser light irradiation was used, and the output of laser irradiation was set to 70% (energy density at 100% is 3.5×10 3 W/mm 2 ), except Otherwise, it is the same as the description of Example 1.

(比較例4) 將前述雷射照射的輸出設成15%,除此以外與比較例3的記載內容相同。(Comparative example 4) The content described in Comparative Example 3 was the same except that the output of the laser irradiation was set to 15%.

[表1] [Table 1]

[雷射標記的顯微鏡觀察] 為了要詳細觀察已藉由雷射照射標記過的層,針對已藉由雷射標記過的偏光板100的標記部,以薄片切片(Microtome)法來製作切片。使用光學顯微鏡(Micro Support公司製造APS-004)來進行該切片的剖面觀察。該剖面的影像表示於第3~5圖。第3圖為實施例1的標記部,第4圖為比較例1的標記部,第5圖為比較例3的標記部。[Microscopic observation of laser markers] In order to observe the layer that has been marked by laser irradiation in detail, a microtome method is used to make a slice of the marked portion of the polarizing plate 100 that has been marked by laser irradiation. The section was observed using an optical microscope (APS-004 manufactured by Micro Support). Images of this section are shown in Figures 3 to 5. Figure 3 shows the marking part of Example 1, Figure 4 shows the marking part of Comparative Example 1, and Figure 5 shows the marking part of Comparative Example 3.

[標記痕的凹凸形狀的觀察] 表1中,實施例1~4是使用綠光之可見光雷射來進行標記的結果。在對於偏光板100使用染料系的偏光板的實施例1、2的情況中,當雷射輸出為51%時,(1)和(2)皆為良好的結果。將實施例1中的偏光板100的剖面表示於第3圖。相對於比較例的白色,實施例1的標記痕的輪廓的色感呈現黑色,由此也能夠確認到僅有偏光板100內部的偏光素膜因雷射光而變質。又,將實施例1、2的標記後的偏光板設置於白色LED背光模組上,並且自該偏光板上以與偏光軸正交的方式設置同種的無標記偏光板並加以觀察。在已被標記的面朝向視認側來設置,或是已被標記的面朝向背光模組側來設置的任一種情況中,標記痕皆呈現亮點狀。由此可確認到,標記位置處具有透光性,且不具有偏光性。[Observation of concave and convex shapes of marking marks] In Table 1, Examples 1 to 4 are the results of marking using green visible light laser. In the case of Examples 1 and 2 in which a dye-based polarizing plate is used as the polarizing plate 100, when the laser output is 51%, both (1) and (2) are good results. The cross section of the polarizing plate 100 in Example 1 is shown in FIG. 3 . Compared to the white color of the comparative example, the outline of the marking mark in Example 1 appears black. From this, it can also be confirmed that only the polarizing film inside the polarizing plate 100 is deteriorated by the laser light. In addition, the marked polarizing plates of Examples 1 and 2 were placed on the white LED backlight module, and the same type of unmarked polarizing plate was placed orthogonally to the polarizing axis from the polarizing plate and observed. In either case where the marked surface is placed toward the viewing side, or the marked surface is placed toward the backlight module side, the marking marks appear as bright spots. From this, it can be confirmed that the marked position is translucent and does not have polarization.

又,在對於偏光板100使用碘系偏光板的實施例3、4的情況中,(1)和(2)皆判定為良好的結果。然而,在雷射輸出為51%的情況中,雖然支持膜表面的形狀沒有變化,但標記痕周邊的偏光板100的膜厚增加。這點根據標記痕剖面的觀察結果推測是因為,在偏光板100內部吸收雷射光而急速發生的熱,使水分等氣化而造成偏光素膜膨脹。在任一條件中,標記痕的輪廓的色感均呈現紅褐色,因此推測因吸收雷射光的熱而使得偏光素膜中的碘發生變質。又,與實施例1、2同樣的,將實施例3、4的標記後的偏光板100設置於白色LED背光模組上並加以觀察。在已被標記的面朝向視認側來設置,或是已被標記的面朝向背光模組側來設置的任一種情況中,標記痕均呈現亮點狀。由此可確認到,標記位置處具有透光性,且不具有偏光性。In addition, in the cases of Examples 3 and 4 in which an iodine-based polarizing plate was used as the polarizing plate 100, both (1) and (2) were judged to be good results. However, when the laser output is 51%, although the shape of the support film surface does not change, the film thickness of the polarizing plate 100 around the mark mark increases. This is presumed based on the observation of the cross section of the mark mark because the heat generated rapidly by absorbing the laser light inside the polarizing plate 100 vaporizes moisture and the like, causing the polarizing film to expand. Under any condition, the outline of the marking mark has a reddish-brown color. Therefore, it is presumed that the iodine in the polarizer film is deteriorated by absorbing the heat of the laser light. In addition, similarly to Examples 1 and 2, the marked polarizing plates 100 of Examples 3 and 4 were placed on the white LED backlight module and observed. In either case where the marked surface is placed toward the viewing side, or the marked surface is placed toward the backlight module side, the marking marks appear as bright spots. From this, it can be confirmed that the marked position is translucent and does not have polarization.

由該等結果可知,藉由配合偏光板100的透過率或所含有的二色性色素的種類來對雷射光輸出進行最適當的設定,在染料系和碘系的任一種偏光板100中皆能夠在不伴隨扭曲或變形的情況下對偏光板100內部進行雷射標記。又,因為具有標記痕的視認性,在由檢查員或檢測裝置來進行的缺陷檢查等後續加工步驟中,能夠不拖慢生產效率地對偏光板100進行加工。From these results, it can be seen that by optimally setting the laser light output according to the transmittance of the polarizing plate 100 or the type of dichroic dye contained in the polarizing plate 100, both the dye-based and iodine-based polarizing plates 100 can be used. The inside of the polarizing plate 100 can be laser marked without distortion or deformation. In addition, since the mark mark is visible, the polarizing plate 100 can be processed without slowing down production efficiency in subsequent processing steps such as defect inspection by an inspector or a detection device.

比較例1、2是使用CO2 雷射光來對偏光板100進行標記的結果。第4圖是比較例1中的標記痕的剖面觀察的結果,偏光板100的支持膜的表面因雷射光而大幅變形所造成的該變形,不僅有標記痕的凹凸,更在該中心產生偏光板100的扭曲,而難以作為製品來重疊成捲筒狀或薄板狀。藉由將雷射輸出自70%降低至15%雖然可以縮小該變形量,但難以兼顧標記痕的視認性。Comparative Examples 1 and 2 are the results of marking the polarizing plate 100 using CO 2 laser light. Figure 4 is the result of cross-sectional observation of the mark mark in Comparative Example 1. The deformation caused by the large deformation of the surface of the support film of the polarizing plate 100 due to laser light not only causes unevenness of the mark mark, but also generates polarized light at the center. Due to the distortion of the plate 100, it is difficult to stack it into a roll shape or a thin plate shape as a product. Although the amount of deformation can be reduced by reducing the laser output from 70% to 15%, it is difficult to maintain the visibility of the mark marks.

又,與實施例1、2同樣的,將比較例1、2的標記後的偏光板100設置於白色LED背光模組上並加以觀察。在已被標記的面朝向視認側來設置的情況中,標記痕呈現亮點狀,但在已被標記的面朝向背光模組側來設置的情況中,無法觀察到標記痕。由此可確認到,根據該雷射光來進行的標記,如上述剖面觀察結果所示,偏光板100的支持膜的表面發生變形,且無法到達偏光素膜10因此偏光素膜10並未變質。In addition, similarly to Examples 1 and 2, the marked polarizing plates 100 of Comparative Examples 1 and 2 were placed on the white LED backlight module and observed. When the marked surface is placed toward the viewing side, the marking marks appear as bright spots. However, when the marked surface is placed toward the backlight module side, the marking marks cannot be observed. From this, it was confirmed that the marking by the laser light deformed the surface of the support film of the polarizing plate 100 and could not reach the polarizing film 10 as shown in the cross-sectional observation results. Therefore, the polarizing film 10 did not deteriorate.

比較例3、4是使用UV雷射光來對偏光板100進行標記的結果。第5圖是比較例3中的標記痕的剖面觀察的結果,偏光板100的支持膜的表面的變形小於比較例1、2。藉由將雷射輸出自70%降低至15%雖然可以進一步縮小該變形量,但難以兼顧標記痕的視認性。Comparative Examples 3 and 4 are the results of marking the polarizing plate 100 using UV laser light. Figure 5 is the result of cross-sectional observation of the mark mark in Comparative Example 3. The deformation of the surface of the support film of the polarizing plate 100 is smaller than that of Comparative Examples 1 and 2. Although the amount of deformation can be further reduced by reducing the laser output from 70% to 15%, it is difficult to maintain the visibility of the mark marks.

又,與實施例1、2同樣的,將比較例3、4的標記後的偏光板100設置於白色LED背光模組上並加以觀察。在已被標記的面朝向視認側來設置的情況中,標記痕呈現亮點狀,但在已被標記的面朝向背光模組側來設置的情況中,無法觀察到標記痕。由此可確認到,根據該雷射光來進行的標記,如上述剖面觀察結果所示,偏光板100的支持膜的表面發生變形,且無法到達偏光素膜10因此偏光素膜10並未變質。此外,在此情況中,由於支持膜12含有紫外線吸收劑,因此該雷射光被支持膜12所吸收。In addition, similarly to Examples 1 and 2, the marked polarizing plates 100 of Comparative Examples 3 and 4 were placed on the white LED backlight module and observed. When the marked surface is placed toward the viewing side, the marking marks appear as bright spots. However, when the marked surface is placed toward the backlight module side, the marking marks cannot be observed. From this, it was confirmed that the marking by the laser light deformed the surface of the support film of the polarizing plate 100 and could not reach the polarizing film 10 as shown in the cross-sectional observation results. Therefore, the polarizing film 10 did not deteriorate. Furthermore, in this case, since the support film 12 contains an ultraviolet absorber, the laser light is absorbed by the support film 12 .

[表2] [Table 2]

表2是針對實施例1和比較例2、3的試驗中所得到的標記痕,使用光學顯微鏡(基恩斯(KEYENCE)公司製造的數位顯微鏡VHX-6000)來詳細分析標記痕的形狀之狀態的結果。表2中的凹部,是藉由前述裝置的三維測量的尺寸量測功能所得到的偏光板的支持膜上之標記痕的凹部的最大深度(μm),其表示雷射光正下方的部分。同樣的,凸部是標記痕隆起的最大高度(μm),其表示被照射到雷射光的周邊部。凹部和凸部的值,是將被照射雷射之側的支持膜中,沒有標記痕的正常部分的表面(基材的表面)作為基準(0μm)來算出。Table 2 shows the results of detailed analysis of the shape and state of the mark marks obtained in the tests of Example 1 and Comparative Examples 2 and 3 using an optical microscope (digital microscope VHX-6000 manufactured by Keyence Corporation). . The recess in Table 2 is the maximum depth (μm) of the recess of the mark on the support film of the polarizing plate obtained by the three-dimensional measurement function of the aforementioned device, and represents the portion directly under the laser light. Similarly, the convex portion is the maximum height (μm) of the mark bulge, which represents the peripheral portion irradiated with laser light. The values of the recessed portions and the convex portions were calculated using the surface of the normal portion (surface of the base material) without marking marks on the side of the support film irradiated with laser as a reference (0 μm).

實施例1中,標記痕未被形成在支持膜表面上,且因吸收雷射光的偏光膜的變質而在支持膜面上有扭曲的情形。伴隨該情形的凹部和凸部的值為0.1、1.0μm,這表示與目視觀察同樣的幾乎沒有因標記造成的偏光板的變形。此處,根據檢證實驗,若凹部和凸部相對於基準的深度、高度超過5μm,則變形會變得顯眼而不佳。因此,以基材的表面作為基準的最大深度(凹部)、最大隆起(凸部)較佳為分別在5μm以下。In Example 1, the marking mark was not formed on the surface of the support film, and was distorted on the surface of the support film due to the deterioration of the polarizing film that absorbs laser light. The values of the concave portions and the convex portions accompanying this situation are 0.1 and 1.0 μm, which means that there is almost no deformation of the polarizing plate due to the mark, as in visual observation. Here, according to verification experiments, if the depth and height of the concave portion and the convex portion exceed 5 μm relative to the reference, the deformation becomes conspicuous, which is undesirable. Therefore, it is preferable that the maximum depth (concave portion) and the maximum ridge (convex portion) based on the surface of the base material are each 5 μm or less.

另一方面,在比較例1和3的情況中,凹部和凸部的值比實施例1的情況大了5~20μm以上,更詳言之,標記痕中有著因雷射照射的熱而使得支持體膜的表面熔化的痕跡,或是熔化的支持膜的成分成為飛散的形狀。根據該等結果可知,在實施例1的使用綠光來對偏光板進行的雷射標記中,由於幾乎不發生因標記痕所造成的凹凸,在偏光板製品的捲筒保管或層層重疊中,能夠抑制因標記痕造成的壓痕缺陷的發生。進而,本發明的情況中,由於幾乎沒有標記痕的凹凸,即便在將保護薄膜等積層於已被標記過的偏光板上的情況中,仍然能夠使薄膜間緊密接合,因此能夠抑制因標記痕的凹凸造成的氣泡缺陷(薄膜浮起而存在空氣層的狀態)。On the other hand, in the cases of Comparative Examples 1 and 3, the values of the concave portions and the convex portions were 5 to 20 μm larger than in Example 1. More specifically, the mark marks contained heat due to laser irradiation. Traces of melting on the surface of the support film, or components of the melted support film becoming scattered. From these results, it can be seen that in the laser marking of the polarizing plate using green light in Example 1, almost no unevenness caused by the marking marks occurs, and the polarizing plate products are stored in rolls or stacked layer by layer. , can suppress the occurrence of indentation defects caused by marking marks. Furthermore, in the case of the present invention, since there are almost no unevenness of marking marks, even when a protective film or the like is laminated on a polarizing plate that has been marked, the films can still be tightly bonded, so that the occurrence of marking marks can be suppressed. Bubble defects caused by unevenness (a state in which the film floats and an air layer exists).

[變化例1] 變化例1的構成表示於第6圖。該例中,將檢測裝置16配置於積層支持膜12a、12b的上游側。因此,在檢測裝置16處是觀察偏光素膜10。藉此,能夠檢測偏光素膜10中的缺陷,且在標記裝置20中進行缺陷的標記。[Modification 1] The structure of variation 1 is shown in FIG. 6 . In this example, the detection device 16 is arranged on the upstream side of the laminated support films 12a and 12b. Therefore, the polarizing film 10 is observed at the detection device 16 . Thereby, defects in the polarizing film 10 can be detected, and the defects can be marked in the marking device 20 .

[變化例2] 變化例2的構成表示於第7圖。該例中,在偏光素膜10上積層了支持膜12a、12b後,藉由3個輥24使偏光板100蛇行。亦即,以第1個輥將進行方向改變將近90°,然後以第2個輥將進行方向改變180°來使進行方向折返。並且,在第3個輥24中,將進行方向改變將近90°,藉此回到原本的進行方向。並且,藉由反射方式的檢測裝置16對在第2個輥24中折返狀態的偏光板100加以檢查。亦即,藉由光照射裝置16b對折返狀態的偏光板100照射光線,並以攝影裝置16a拍攝下反射光。[Modification 2] The structure of variation 2 is shown in FIG. 7 . In this example, after the support films 12a and 12b are laminated on the polarizing film 10, the polarizing plate 100 is meandered by three rollers 24. That is, the first roller changes the traveling direction by nearly 90°, and then the second roller changes the traveling direction by 180° to turn back the traveling direction. Furthermore, in the third roller 24, the traveling direction is changed by nearly 90°, thereby returning to the original traveling direction. Then, the polarizing plate 100 in the folded state on the second roller 24 is inspected by the reflection detection device 16 . That is, the light irradiation device 16 b irradiates the polarizing plate 100 in the folded state with light, and the photographing device 16 a captures the reflected light.

如此,藉由使偏光板100折返,能夠對偏光板100施加規定的張力,且由於偏光板100的兩端部成為由輥所支持的狀態,因此在偏光板100的寬度方向上消除了扭曲而能夠高精準度地進行檢查。此外,由反射方式來進行檢查的情況中,因偏光板100的捲曲(彎曲)等而產生的該扭曲,會成為檢查光源的基準線不穩定的主要因素。又,藉由在前述第2個輥的表面上施加黑色化或是霧面化等的處理來使得對於檢查光源成為低反射率,能夠使基準線穩定且改善檢測精準度。In this way, by folding back the polarizing plate 100 , a predetermined tension can be applied to the polarizing plate 100 , and since both ends of the polarizing plate 100 are supported by the rollers, distortion is eliminated in the width direction of the polarizing plate 100 . Able to perform inspections with high accuracy. In addition, when inspection is performed by the reflection method, the distortion caused by curling (bending) of the polarizing plate 100 or the like may become a major factor that makes the reference line of the inspection light source unstable. In addition, by applying blackening or matte processing to the surface of the second roller to achieve low reflectivity with respect to the inspection light source, the reference line can be stabilized and detection accuracy can be improved.

[標記] 此處,本實施型態中,是在偏光素膜10中吸收可見光來進行標記。偏光素膜10,原本對於可見光便具有吸收軸與透過軸。因此,較佳為將標記裝置20照射出的可見光作成直線偏光,且將該偏光方向作成偏光素膜10的吸收軸的方向。藉此,能夠使來自標記裝置20的可見光的吸收效率上昇,而有效率地進行標記。[mark] Here, in this embodiment, marking is performed by absorbing visible light in the polarizing film 10 . The polarizing film 10 originally has an absorption axis and a transmission axis for visible light. Therefore, it is preferable to linearly polarize the visible light emitted from the marking device 20 and to set the polarization direction in the direction of the absorption axis of the polarizer film 10 . Thereby, the absorption efficiency of visible light from the marking device 20 can be increased, and marking can be performed efficiently.

又,如第8圖所示,若使照射的可見光雷射的偏光軸變化,便能夠改變吸收量。因此,對偏光板100進行標記時,藉由改變相對於偏光板100的吸收軸之自照射裝置出射的偏振光的角度,便能夠改變雷射光的吸收量。藉此,不僅可藉由雷射輸出的調整來調整標記痕的濃度,還能夠藉由控制偏振光的照射角度來進行標記痕的濃度的調整。亦即,針對具有直線偏光性的可見光雷射,可相對於偏光板100的吸收軸而在0~90°的範圍中變更。藉由調整雷射光的偏光方向來照射,能夠以偏光素膜來調整被吸收的光量,而調整標記的照射強度。Furthermore, as shown in Figure 8, if the polarization axis of the irradiated visible light laser is changed, the amount of absorption can be changed. Therefore, when marking the polarizing plate 100, by changing the angle of the polarized light emitted from the irradiation device with respect to the absorption axis of the polarizing plate 100, the amount of laser light absorbed can be changed. Thereby, not only the density of the mark can be adjusted by adjusting the laser output, but also the density of the mark can be adjusted by controlling the irradiation angle of the polarized light. That is, for visible light laser with linear polarization, the absorption axis of the polarizing plate 100 can be changed in the range of 0 to 90°. By adjusting the polarization direction of the laser light for irradiation, the polarizing film can be used to adjust the amount of light absorbed, thereby adjusting the irradiation intensity of the mark.

例如,可藉由使標記裝置20能夠在水平面內旋轉,來控制直線偏光的方向,或是使用液晶偏光旋轉器等來控制偏光方向。For example, the direction of linear polarization can be controlled by enabling the marking device 20 to rotate in a horizontal plane, or using a liquid crystal polarization rotator or the like to control the polarization direction.

此外,偏光素膜10,由於延伸方向成為吸收軸方向,對於偏光板100的進行方向,在與雷射光的偏光方向平行(0°)的方向的光吸收最大,且在正交(90°)的方向的光吸收最小。因此,由於在標記痕的視認性好壞以及標記形成的效率性的觀點中,是由偏光素膜10來對雷射光進行光吸收的態樣較佳,因此前述角度的關係較佳為0~45°,更佳為0~5°。In addition, since the extending direction of the polarizing film 10 becomes the absorption axis direction, the light absorption is maximum in the direction parallel to the polarization direction of the laser light (0°) and orthogonal to the direction of the polarizing plate 100 (90°). The direction in which light absorption is minimal. Therefore, from the viewpoint of the visibility of the mark mark and the efficiency of mark formation, the polarizing film 10 absorbs the laser light. Therefore, the relationship between the above-mentioned angles is preferably between 0 and 0. 45°, preferably 0~5°.

進而,若增大由可見光雷射來進行的標記中的強度(能量密度),則能夠減少用於標記的時間。然而,若增大強度,則亦會影響到支持膜等。另一方面,若縮小強度,則用於標記的時間變長,且會受到偏光板100的移動(搬送速度)的影響。Furthermore, if the intensity (energy density) in marking by visible light laser is increased, the time required for marking can be reduced. However, if the strength is increased, the support film, etc. will also be affected. On the other hand, if the intensity is reduced, the time required for marking becomes longer and is affected by the movement (transportation speed) of the polarizing plate 100 .

於是,亦可在標記時暫時減慢偏光板100的移動,或是使該移動停止。進而,亦能夠使標記裝置配合偏光板100的移動來移動。存在缺陷的偏光板100,一般而言在每隔一定長度便禁止使用,因此標記只要每隔規定長度來進行即可,亦適合使標記裝置的移動距離與一定長度對應。其他適合的作法,作為藉由標記裝置來進行的調整,可配合雷射照射的掃瞄速度(每單位時間的照射速度),跟隨偏光板100的移動以得到適當的標記痕濃度(印刷濃度),或是使用針對一定面積一口氣掃過雷射光來加以標記的功能(區域標記)。Therefore, the movement of the polarizing plate 100 may be temporarily slowed down or stopped during marking. Furthermore, the marking device can also be moved in accordance with the movement of the polarizing plate 100 . Generally speaking, the use of a defective polarizing plate 100 is prohibited at certain lengths. Therefore, marking only needs to be performed at predetermined length intervals. It is also suitable to make the moving distance of the marking device correspond to the certain length. Other suitable methods, as adjustment by the marking device, can be to match the scanning speed of the laser irradiation (irradiation speed per unit time) and follow the movement of the polarizing plate 100 to obtain an appropriate mark mark density (printing density) , or use the function of marking a certain area by scanning the laser light in one go (area marking).

[標記的檢測] 本實施型態中,是使偏光素膜10來吸收可見光雷射並發熱。藉此,偏光素膜10會變質,但在此情況中偏光功能會受到妨礙。因此,要檢測標記時,能夠利用偏光素膜10是否具有偏光功能。[Detection of markers] In this embodiment, the polarizing film 10 absorbs visible light laser and generates heat. As a result, the polarizing film 10 will be deteriorated, but in this case, the polarizing function will be hindered. Therefore, when detecting marks, whether the polarizing film 10 has a polarizing function can be utilized.

第9圖中表示以下的例子:將非偏振光照射至形成有標記的透過軸方向90°的偏光板100,且針對透過光使其通過透過軸方向0°的偏光板後加以檢測。如此,來自光源的光藉由通過偏光板100而成為透過軸方向90°的直線偏光,但標記的部分由於失去了偏光功能而會維持非偏振光。然後,若使透過偏光板100的光通過透過軸方向0°的偏光板,則對於標記的部分會有透過軸方向0°的偏振光穿越出來。因此,能夠將標記作為亮點來檢測到。FIG. 9 shows an example in which unpolarized light is irradiated onto a polarizing plate 100 with a transmission axis direction of 90° on which a mark is formed, and the transmitted light is detected after passing through a polarizing plate with a transmission axis direction of 0°. In this way, the light from the light source becomes linearly polarized light at 90° in the transmission axis direction by passing through the polarizing plate 100. However, the marked portion loses the polarizing function and remains unpolarized light. Then, if the light that has passed through the polarizing plate 100 passes through the polarizing plate with a transmission axis direction of 0°, polarized light with a transmission axis direction of 0° will pass through the marked portion. Therefore, the mark can be detected as a bright spot.

第10圖中,將非偏振光照射至形成有標記的透過軸方向90°的偏光板100,且針對透過光使其通過透過軸方向90°的偏光板後加以檢測。與第9圖同樣的,來自光源的光藉由通過偏光板100而成為透過軸方向90°的直線偏光,但標記的部分由於失去了偏光功能而會維持非偏振光。然後,若使透過光通過透過軸方向90°的偏光板,則標記以外的部分是以原本的90°的直線偏光穿越,但對於標記的部分,僅有非偏振光中的透過軸方向90°的偏振光穿越過。因此,能夠將標記作為暗點來檢測到。In FIG. 10 , unpolarized light is irradiated to a polarizing plate 100 with a transmission axis direction of 90° on which a mark is formed, and the transmitted light is detected after passing through the polarizing plate with a transmission axis direction of 90°. Similar to Figure 9, the light from the light source becomes linearly polarized light at 90° in the transmission axis direction by passing through the polarizing plate 100. However, the marked portion loses the polarizing function and remains unpolarized light. Then, if the transmitted light passes through a polarizing plate with a transmission axis direction of 90°, the parts other than the mark will pass through with the original linearly polarized light of 90°, but for the part of the mark, only unpolarized light with a transmission axis direction of 90° will pass through. polarized light passes through. Therefore, the mark can be detected as a dark spot.

特別是,上述檢測方法中,將標記作為亮點來檢測的方法,因為視認性良好而能夠易於在目視或機械中加以檢測而較佳。In particular, among the above-mentioned detection methods, a method of detecting the mark as a bright point is preferable because it has good visibility and can be easily detected visually or mechanically.

又,亦可對偏光素膜10照射直線偏光並檢測透過光。亦即,若對偏光素膜10照射偏光方向為透過軸方向的直線偏光,則幾乎所有的光線都會透過。另一方面,在已被標記的位置中失去偏光功能,所以直線偏光的透過較少。因此,能夠藉由暗點表示來檢測標記。相反的,亦可將直線偏光照射至偏光素膜10的吸收軸方向並檢測透過光。藉此,能夠藉由亮點表示來檢測標記。此外,標記的檢測通常是在重疊有支持膜12a、12b的狀態(偏光板100)中進行,但因為支持膜12a、12b能夠使可見光透過所以不會產生問題。Alternatively, the polarizing film 10 may be irradiated with linearly polarized light and the transmitted light may be detected. That is, if the polarizing film 10 is irradiated with linearly polarized light whose polarization direction is the transmission axis direction, almost all the light will be transmitted. On the other hand, the polarizing function is lost in the marked position, so linearly polarized light is transmitted less. Therefore, the mark can be detected by means of dark spot representation. On the contrary, linearly polarized light may be irradiated in the absorption axis direction of the polarizer film 10 and the transmitted light may be detected. Thereby, the mark can be detected by means of bright point representation. In addition, mark detection is usually performed in a state where the support films 12a and 12b are stacked (polarizing plate 100). However, since the support films 12a and 12b can transmit visible light, there is no problem.

此處,針對偏光功能的消失,這被認為是因為由於偏光素膜10是延伸過的PVA,所以若施加150℃前後或是更高的熱便會軟化,而失去由延伸所造成的配向規制力。在調製成灰色的染料系偏光板的情況中,由於配向的色素是以隨機的狀態存在,因此在目視中相較於配向的部分看起來較黑。Here, regarding the disappearance of the polarizing function, it is considered that since the polarizing film 10 is stretched PVA, it will soften if heat is applied around 150°C or higher, and the alignment regulation caused by the stretching will be lost. force. In the case of a dye-based polarizing plate modulated to gray, the aligned pigments exist in a random state, so the aligned portions appear darker to the naked eye.

又,在碘系偏光板的情況中,推測是因為熱而發生昇華以及素膜中的I5 - 錯合物的分解(I3 - 錯合物的存在比例增加)而使得色感變化(變化成偏紅褐色)。又,變化成紅色的情形,也有可能是PVA本身變化而著色。亦即,有可能是伴隨高熱,使得由內含的水分造成加水分解而產生的酸與碘產生觸媒性作用,而使PVA反應成多烯。Furthermore, in the case of the iodine-based polarizing plate, it is estimated that the color feeling changes (changes) due to sublimation due to heat and decomposition of the I 5 -complex in the film (the presence ratio of the I 3 -complex increases). into reddish brown). Also, when it changes to red, it is possible that the PVA itself changes and is colored. That is to say, it is possible that along with high heat, the acid produced by hydrolysis of the contained water may act as a catalyst with iodine, causing PVA to react into polyene.

無論是任一種情形,皆能夠藉由可見光的照射來使偏光素膜10變質,並以光學方式檢測到。In either case, the polarizing film 10 can be modified by irradiation with visible light and detected optically.

此外,標記的檢測,可藉由人的目視來進行,亦可藉由檢測裝置來以機械的方式進行。In addition, the detection of the mark can be carried out by human vision or mechanically by using a detection device.

[標記的種類] 標記能夠採用第2圖所示的種類,亦可單純將相同強度的可見光雷射照射至規定區域來形成。[type of mark] Marks can be of the type shown in Figure 2, or can be formed simply by irradiating visible light lasers of the same intensity to a predetermined area.

此處,由於能夠採用如第2圖的各種標記,因此能夠採用條碼、QR碼(二維條碼)等來作為標記。這樣的碼能夠包含缺陷位置的資訊。因此,能夠將碼寫入至偏光板100的任意位置,並能夠藉由讀取該碼來掌握缺陷位置。在此情況中,適合以與碼(標記)的記載位置的關聯性來對缺陷位置加以特定。Here, since various marks as shown in FIG. 2 can be used, a barcode, a QR code (two-dimensional barcode), etc. can be used as the mark. Such codes can contain information about defect locations. Therefore, a code can be written to any position on the polarizing plate 100, and the defect location can be grasped by reading the code. In this case, it is appropriate to specify the defective position in relation to the recording position of the code (mark).

10:偏光素膜 12a、12b:支持膜 14a、14b:輥 16:檢測裝置 16a:攝影裝置 16b:光照射裝置 18:控制裝置 20:標記裝置 22、24:輥 100:偏光板 10:Polarizing film 12a, 12b: Support film 14a, 14b: roller 16:Detection device 16a: Photographic installation 16b:Light irradiation device 18:Control device 20: Marking device 22, 24: Roller 100:Polarizing plate

第1圖是表示偏光板製造系統的整體構成的圖,該系統包含一實施型態之標記裝置。 第2圖表示標記裝置所造成的標記痕的形狀例。 第3圖是表示使用可見光雷射的實施例1的標記部剖面的照片。 第4圖是表示使用紅外光雷射的比較例1的標記部剖面的照片。 第5圖是表示使用紫外光雷射的比較例3的標記部剖面的照片。 第6圖是表示偏光板製造系統的整體構成的圖,該系統包含變化例1之標記裝置。 第7圖是表示偏光板製造系統的整體構成的圖,該系統包含變化例2之標記裝置。 第8圖是說明使照射的可見光雷射的偏光軸變化來變更吸收量的圖。 第9圖是表示與偏光特性的變化對應的標記檢測(亮點檢測)的圖。 第10圖是表示與偏光特性的變化對應的標記檢測(暗點檢測)的圖。FIG. 1 is a diagram showing the overall structure of a polarizing plate manufacturing system, which includes a marking device according to an embodiment. Figure 2 shows an example of the shape of marking marks produced by the marking device. Fig. 3 is a photograph showing the cross-section of the marking portion of Example 1 using visible light laser. Fig. 4 is a photograph showing the cross-section of the marking portion of Comparative Example 1 using infrared laser. Fig. 5 is a photograph showing the cross section of the marking portion of Comparative Example 3 using ultraviolet laser. FIG. 6 is a diagram showing the overall structure of a polarizing plate manufacturing system including the marking device of Modification 1. FIG. FIG. 7 is a diagram showing the overall structure of a polarizing plate manufacturing system including the marking device of Modification 2. FIG. FIG. 8 is a diagram illustrating changing the absorption amount by changing the polarization axis of the irradiated visible light laser. Fig. 9 is a diagram showing mark detection (bright spot detection) corresponding to changes in polarization characteristics. Fig. 10 is a diagram showing mark detection (dark spot detection) corresponding to changes in polarization characteristics.

國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無Domestic storage information (please note in order of storage institution, date and number) without

國外寄存資訊 (請依寄存國家、機構、日期、號碼順序註記) 無Overseas storage information (please note in order of storage country, institution, date, and number) without

10:偏光素膜 10:Polarizing film

12a、12b:支持膜 12a, 12b: Support film

14a、14b:輥 14a, 14b: roller

16:檢測裝置 16:Detection device

16a:攝影裝置 16a: Photographic installation

16b:光照射裝置 16b:Light irradiation device

18:控制裝置 18:Control device

20:標記裝置 20: Marking device

22:輥 22:Roller

100:偏光板 100:Polarizing plate

Claims (9)

一種偏光板製造系統,其製造偏光板,前述偏光板包含使可見光偏光的偏光素膜,前述偏光板製造系統具備:檢測裝置,其取得前述偏光板的影像訊號;控制裝置,其處理前述影像訊號,並檢測前述偏光板中的缺陷;及,標記裝置,其包含射出可見光雷射的雷射源,並對前述偏光板中的前述缺陷施加標記;並且,前述標記裝置使前述偏光素膜吸收來自前述雷射源的前述可見光雷射,以使前述偏光素膜變質並且使變質的部分的光學特性變化,藉此進行標記。 A polarizing plate manufacturing system that manufactures polarizing plates. The polarizing plate includes a polarizer film that polarizes visible light. The polarizing plate manufacturing system is provided with: a detection device that obtains an image signal of the polarizing plate; a control device that processes the image signal. , and detect defects in the polarizing plate; and, a marking device, which includes a laser source that emits visible light laser, and marks the defects in the polarizing plate; and, the marking device causes the polarizing film to absorb light from The visible light laser of the laser source changes the quality of the polarizer film and changes the optical characteristics of the changed part, thereby marking. 如請求項1所述之偏光板製造系統,其中,前述偏光板,在前述偏光素膜的至少其中一方的面上包含可見光透過性的支持膜,且前述可見光雷射透過前述支持膜並由前述偏光素膜所吸收。 The polarizing plate manufacturing system according to claim 1, wherein the polarizing plate includes a visible light-transmitting supporting film on at least one surface of the polarizing film, and the visible light laser transmits through the supporting film and is emitted by the supporting film. Absorbed by the polarizing film. 如請求項2所述之偏光板製造系統,其中,前述偏光素膜,藉由吸收前述可見光雷射而變質,且藉由以下任一種以上的方法來被標記:(i)色感變化、(ii)偏光特性變化。 The polarizing plate manufacturing system according to claim 2, wherein the polarizing film is modified by absorbing the visible light laser, and is marked by any one or more of the following methods: (i) color sense change, ( ii) Changes in polarization characteristics. 如請求項1~3中任一項所述之偏光板製造系統,其中,前述可見光雷射是綠光。 The polarizing plate manufacturing system according to any one of claims 1 to 3, wherein the visible light laser is green light. 如請求項1~3中任一項所述之偏光板製造系統,其中,前述偏光素膜包含碘或染料的二色性色素。 The polarizing plate manufacturing system according to any one of claims 1 to 3, wherein the polarizing film contains a dichroic pigment of iodine or dye. 如請求項1~3中任一項所述之偏光板製造系統,其中,前述可見光雷射是直線偏光;可將前述可見光雷射的偏光方向在相對於前述偏光板的吸收軸方向為0~90°的範圍中變更。 The polarizing plate manufacturing system according to any one of claims 1 to 3, wherein the visible light laser is linearly polarized; the polarizing direction of the visible light laser can be set to be 0 to 0 with respect to the absorption axis direction of the polarizing plate. Change within the range of 90°. 一種標記方法,其具有以下步驟:取得偏光板的影像訊號,前述偏光板包含使可見光偏光的偏光素膜;處理前述影像訊號,並檢測前述偏光板中的缺陷;藉由包含射出可見光雷射的雷射源之標記裝置,來對偏光板中的前述缺陷進行標記;其中,前述標記裝置使前述偏光素膜吸收來自前述雷射源的前述可見光雷射,以使前述偏光素膜變質並且使變質的部分的光學特性變化,藉此進行標記。 A marking method, which has the following steps: obtaining an image signal from a polarizing plate, the polarizing plate including a polarizer film that polarizes visible light; processing the image signal, and detecting defects in the polarizing plate; by including a device that emits a visible light laser A laser source marking device is used to mark the aforementioned defects in the polarizing plate; wherein the aforementioned marking device causes the aforementioned polarizer film to absorb the aforementioned visible light laser from the aforementioned laser source, so as to cause the aforementioned polarizer film to deteriorate and deteriorate the Changes in the optical properties of parts are used to mark them. 一種偏光板的製造方法,其具有以下步驟:在偏光素膜的至少其中一方的面上積層支持膜,形成偏光板;藉由請求項7所述之標記方法,對前述偏光板中的前述缺陷進行標記;及對標記結束的前述偏光板貼上保護薄膜。 A method for manufacturing a polarizing plate, which has the following steps: laminating a supporting film on at least one surface of the polarizing film to form a polarizing plate; using the marking method described in claim 7 to correct the aforementioned defects in the polarizing plate. Mark; and affix a protective film to the polarizing plate that has been marked. 一種偏光板,其是藉由請求項8所述之偏光 板的製造方法所製造出,其中,前述變質部分不具有偏光性,且以前述基材的表面作為基準的最大深度和最大隆起高度分別在5μm以下。 A polarizing plate, which is made of polarized light according to claim 8 The plate is manufactured by a method of manufacturing a plate, wherein the modified portion does not have polarizing properties, and the maximum depth and maximum ridge height based on the surface of the base material are each 5 μm or less.
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