TWI787821B - X射線分析裝置 - Google Patents

X射線分析裝置 Download PDF

Info

Publication number
TWI787821B
TWI787821B TW110117615A TW110117615A TWI787821B TW I787821 B TWI787821 B TW I787821B TW 110117615 A TW110117615 A TW 110117615A TW 110117615 A TW110117615 A TW 110117615A TW I787821 B TWI787821 B TW I787821B
Authority
TW
Taiwan
Prior art keywords
sample
container
opening
film
analysis device
Prior art date
Application number
TW110117615A
Other languages
English (en)
Chinese (zh)
Other versions
TW202202834A (zh
Inventor
森久祐司
克里恩卡莫爾 坦特拉卡恩
小林寛治
鈴木桂次郎
Original Assignee
日商島津製作所股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商島津製作所股份有限公司 filed Critical 日商島津製作所股份有限公司
Publication of TW202202834A publication Critical patent/TW202202834A/zh
Application granted granted Critical
Publication of TWI787821B publication Critical patent/TWI787821B/zh

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204—Specimen supports therefor; Sample conveying means therefore
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/309—Accessories, mechanical or electrical features support of sample holder

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
TW110117615A 2020-07-01 2021-05-17 X射線分析裝置 TWI787821B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP2020/025763 WO2022003850A1 (ja) 2020-07-01 2020-07-01 Ｘ線分析装置
WOPCT/JP2020/025763 2020-07-01

Publications (2)

Publication Number Publication Date
TW202202834A TW202202834A (zh) 2022-01-16
TWI787821B true TWI787821B (zh) 2022-12-21

Family

ID=79315789

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110117615A TWI787821B (zh) 2020-07-01 2021-05-17 X射線分析裝置

Country Status (6)

Country Link
US (1) US20230236142A1 (https=)
EP (1) EP4177600B1 (https=)
JP (2) JPWO2022003850A1 (https=)
CN (1) CN115715365A (https=)
TW (1) TWI787821B (https=)
WO (1) WO2022003850A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2026039749A (ja) * 2024-08-23 2026-03-09 日本電子株式会社 試料容器、蛍光ｘ線分析装置、および測定方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04355355A (ja) * 1991-05-31 1992-12-09 Rigaku Denki Kogyo Kk 蛍光ｘ線分析装置における窓材の汚染検出方法
JP2006317153A (ja) * 2005-05-10 2006-11-24 Rigaku Industrial Co 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置
JP2011013027A (ja) * 2009-06-30 2011-01-20 Horiba Ltd 蛍光ｘ線分析装置
JP2011089794A (ja) * 2009-10-20 2011-05-06 Rigaku Corp 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置
TW201606296A (zh) * 2014-08-01 2016-02-16 黑爾穆特佛雪爾電子學和計量技術公司 用於ｘ射線螢光分析之手持器具及行動裝置
CN107957430A (zh) * 2016-10-14 2018-04-24 株式会社岛津制作所 X射线分析装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4974244A (en) * 1988-08-04 1990-11-27 Angelo M. Torrisi Sample positioning method and system for X-ray spectroscopic analysis
JP2838172B2 (ja) * 1991-05-03 1998-12-16 株式会社 堀場製作所 蛍光ｘ線分析装置
US5351281A (en) * 1993-04-15 1994-09-27 Angelo M. Torrisi Handling support for X-ray spectroscopic analysis
JP3525188B2 (ja) * 2001-06-06 2004-05-10 理学電機工業株式会社 蛍光ｘ線分析装置
JP3629539B2 (ja) * 2002-03-04 2005-03-16 理学電機工業株式会社 蛍光ｘ線分析装置
JP3726161B2 (ja) * 2003-03-28 2005-12-14 理学電機工業株式会社 蛍光ｘ線分析装置
JP5517506B2 (ja) * 2009-06-30 2014-06-11 株式会社堀場製作所 蛍光ｘ線分析装置
JP5907375B2 (ja) * 2011-12-28 2016-04-26 株式会社テクノエックス 蛍光ｘ線分析装置及び蛍光ｘ線分析方法
CN108956672B (zh) * 2018-05-15 2021-12-17 江苏天瑞仪器股份有限公司 使用食品快检仪专用样品杯进行重金属检测的检测方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04355355A (ja) * 1991-05-31 1992-12-09 Rigaku Denki Kogyo Kk 蛍光ｘ線分析装置における窓材の汚染検出方法
JP2006317153A (ja) * 2005-05-10 2006-11-24 Rigaku Industrial Co 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置
JP2011013027A (ja) * 2009-06-30 2011-01-20 Horiba Ltd 蛍光ｘ線分析装置
JP2011089794A (ja) * 2009-10-20 2011-05-06 Rigaku Corp 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置
TW201606296A (zh) * 2014-08-01 2016-02-16 黑爾穆特佛雪爾電子學和計量技術公司 用於ｘ射線螢光分析之手持器具及行動裝置
CN107957430A (zh) * 2016-10-14 2018-04-24 株式会社岛津制作所 X射线分析装置

Also Published As

Publication number Publication date
JP7679908B2 (ja) 2025-05-20
JPWO2022003850A1 (https=) 2022-01-06
JP2024107407A (ja) 2024-08-08
US20230236142A1 (en) 2023-07-27
EP4177600B1 (en) 2025-10-08
TW202202834A (zh) 2022-01-16
WO2022003850A1 (ja) 2022-01-06
CN115715365A (zh) 2023-02-24
EP4177600A1 (en) 2023-05-10
EP4177600A4 (en) 2024-03-06

Similar Documents

Publication Publication Date Title
JP2838172B2 (ja) 蛍光ｘ線分析装置
TWI787821B (zh) X射線分析裝置
CN108401442B (zh) 联机x射线测量设备和方法
EP3029455A1 (en) X-ray fluorescence analyzer
JP4854005B2 (ja) 蛍光ｘ線分析装置
CN107957430B (zh) X射线分析装置
JP3726161B2 (ja) 蛍光ｘ線分析装置
US8475044B2 (en) Analyzing apparatus
JP2943063B2 (ja) 蛍光ｘ線分析装置
JP5782154B2 (ja) 蛍光ｘ線分析装置
JP2000230912A (ja) Ｘ線分析用試料ホルダおよびｘ線分析装置
JPWO2022003850A5 (https=)
JP5458742B2 (ja) 電子線マイクロアナライザ
JP5524521B2 (ja) 蛍光ｘ線分析装置
JP2011013029A (ja) 蛍光ｘ線分析装置
JP2006518534A5 (https=)
JP2011117835A (ja) 試料セル組立具
JP7649591B1 (ja) 蛍光ｘ線分析装置
JP2551757Y2 (ja) 蛍光ｘ線分析用の試料ホルダ
JP3089817B2 (ja) 陽電子消滅法による材料劣化検出装置
JP2006126122A (ja) 放射性試料ホルダ
JPH11160492A (ja) 放射性物質貯蔵容器
JPS6311639Y2 (https=)
JPH10288588A (ja) 使用済み核燃料密封容器の溶接検査装置
JP2019152622A (ja) Ｘ線分析方法、試料セル及びｘ線分析装置