CN115715365A - X射线分析装置 - Google Patents

X射线分析装置 Download PDF

Info

Publication number
CN115715365A
CN115715365A CN202080102470.2A CN202080102470A CN115715365A CN 115715365 A CN115715365 A CN 115715365A CN 202080102470 A CN202080102470 A CN 202080102470A CN 115715365 A CN115715365 A CN 115715365A
Authority
CN
China
Prior art keywords
sample
container
opening
sample container
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202080102470.2A
Other languages
English (en)
Chinese (zh)
Inventor
森久祐司
克里恩卡莫尔·坦特拉卡恩
小林宽治
铃木桂次郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN115715365A publication Critical patent/CN115715365A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204—Specimen supports therefor; Sample conveying means therefore
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/309—Accessories, mechanical or electrical features support of sample holder

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN202080102470.2A 2020-07-01 2020-07-01 X射线分析装置 Pending CN115715365A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/025763 WO2022003850A1 (ja) 2020-07-01 2020-07-01 Ｘ線分析装置

Publications (1)

Publication Number Publication Date
CN115715365A true CN115715365A (zh) 2023-02-24

Family

ID=79315789

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080102470.2A Pending CN115715365A (zh) 2020-07-01 2020-07-01 X射线分析装置

Country Status (6)

Country Link
US (1) US20230236142A1 (https=)
EP (1) EP4177600B1 (https=)
JP (2) JPWO2022003850A1 (https=)
CN (1) CN115715365A (https=)
TW (1) TWI787821B (https=)
WO (1) WO2022003850A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2026039749A (ja) * 2024-08-23 2026-03-09 日本電子株式会社 試料容器、蛍光ｘ線分析装置、および測定方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5253280A (en) * 1991-05-03 1993-10-12 Horiba, Ltd. Sample cell support assembly for fluorescent X-ray analysis
JP2011013027A (ja) * 2009-06-30 2011-01-20 Horiba Ltd 蛍光ｘ線分析装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4974244A (en) * 1988-08-04 1990-11-27 Angelo M. Torrisi Sample positioning method and system for X-ray spectroscopic analysis
JP2615279B2 (ja) * 1991-05-31 1997-05-28 理学電機工業株式会社 蛍光ｘ線分析装置における窓材の汚染検出方法
US5351281A (en) * 1993-04-15 1994-09-27 Angelo M. Torrisi Handling support for X-ray spectroscopic analysis
JP3525188B2 (ja) * 2001-06-06 2004-05-10 理学電機工業株式会社 蛍光ｘ線分析装置
JP3629539B2 (ja) * 2002-03-04 2005-03-16 理学電機工業株式会社 蛍光ｘ線分析装置
JP3726161B2 (ja) * 2003-03-28 2005-12-14 理学電機工業株式会社 蛍光ｘ線分析装置
JP4398901B2 (ja) * 2005-05-10 2010-01-13 株式会社リガク 蛍光ｘ線分析用試料ホルダならびにそれを用いる蛍光ｘ線分析方法および装置
JP5517506B2 (ja) * 2009-06-30 2014-06-11 株式会社堀場製作所 蛍光ｘ線分析装置
JP2011089794A (ja) * 2009-10-20 2011-05-06 Rigaku Corp 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置
JP5907375B2 (ja) * 2011-12-28 2016-04-26 株式会社テクノエックス 蛍光ｘ線分析装置及び蛍光ｘ線分析方法
DE102014115383A1 (de) * 2014-08-01 2016-02-04 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Handgerät sowie mobile Einrichtung zur Röntgenfluoreszenzanalyse
JP6642372B2 (ja) 2016-10-14 2020-02-05 株式会社島津製作所 Ｘ線分析装置
CN108956672B (zh) * 2018-05-15 2021-12-17 江苏天瑞仪器股份有限公司 使用食品快检仪专用样品杯进行重金属检测的检测方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5253280A (en) * 1991-05-03 1993-10-12 Horiba, Ltd. Sample cell support assembly for fluorescent X-ray analysis
JP2011013027A (ja) * 2009-06-30 2011-01-20 Horiba Ltd 蛍光ｘ線分析装置

Also Published As

Publication number Publication date
JP7679908B2 (ja) 2025-05-20
JPWO2022003850A1 (https=) 2022-01-06
JP2024107407A (ja) 2024-08-08
US20230236142A1 (en) 2023-07-27
TWI787821B (zh) 2022-12-21
EP4177600B1 (en) 2025-10-08
TW202202834A (zh) 2022-01-16
WO2022003850A1 (ja) 2022-01-06
EP4177600A1 (en) 2023-05-10
EP4177600A4 (en) 2024-03-06

Similar Documents

Publication Publication Date Title
JP2026048652A5 (https=)
JP7679908B2 (ja) Ｘ線分析装置
WO2010035410A1 (ja) 検体ラック
JP2838172B2 (ja) 蛍光ｘ線分析装置
EP3546952B1 (en) Method for unsealing an opening of a laboratory sample container, method for handling a laboratory sample container, laboratory apparatus and laboratory automation system
US7873143B2 (en) Sliding sample cell insertion and removal apparatus for x-ray analyzer
JP5563596B2 (ja) 処理装置から媒質を受け取るための移送ユニットおよび方法
CN100464182C (zh) 荧光x射线分析装置
CN110606455A (zh) 一种样本容器自动开盖装置
US5703927A (en) Safety ring for double open-ended sample holder cell for spectroscopic analysis
US8475044B2 (en) Analyzing apparatus
JP2943063B2 (ja) 蛍光ｘ線分析装置
JP2000230912A (ja) Ｘ線分析用試料ホルダおよびｘ線分析装置
JP4398901B2 (ja) 蛍光ｘ線分析用試料ホルダならびにそれを用いる蛍光ｘ線分析方法および装置
JPWO2022003850A5 (https=)
JP5782154B2 (ja) 蛍光ｘ線分析装置
JP5524521B2 (ja) 蛍光ｘ線分析装置
JP2006200949A (ja) 試験管の検知方法及び検知装置
JP2006518534A (ja) 走査型電子顕微鏡のためのサンプルエンクロージャと、その使用法
JP6448747B1 (ja) 処理装置
JP7649591B1 (ja) 蛍光ｘ線分析装置
JP7525761B2 (ja) 大気遮断装置及び大気非暴露搬送方法
JP2000162161A (ja) 蛍光ｘ線分析装置
CN110361410A (zh) 样品杯
JP2019152622A (ja) Ｘ線分析方法、試料セル及びｘ線分析装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination