CN110361410A - 样品杯 - Google Patents

样品杯 Download PDF

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CN110361410A
CN110361410A CN201910668743.9A CN201910668743A CN110361410A CN 110361410 A CN110361410 A CN 110361410A CN 201910668743 A CN201910668743 A CN 201910668743A CN 110361410 A CN110361410 A CN 110361410A
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刘家朋
余锦晖
曹阳
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Changzhou Branch Of Sgs Standard Technical Service Co Ltd
Cstc Standards Technical Services Co Ltd guangzhou Branch
SHANGHAI HUI X-IMAGING INFORMATION TECHNOLOGY Co Ltd
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Changzhou Branch Of Sgs Standard Technical Service Co Ltd
Cstc Standards Technical Services Co Ltd guangzhou Branch
SHANGHAI HUI X-IMAGING INFORMATION TECHNOLOGY Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204Specimen supports therefor; Sample conveying means therefore
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/307Accessories, mechanical or electrical features cuvettes-sample holders

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

本发明涉及重金属检测零部件技术领域,公开了一种样品杯,包括主环体,在主环体内套设内杯,所述内杯上口大下口小,呈锥形,内杯的高度小于等于主环体的高度,在主环体的上端口或下端口用于固定覆盖透明薄膜。本发明在杯品杯中设置不同尺寸的内杯,使样品在测量时定位在样品杯的底部中间位置。

Description

样品杯
技术领域
本发明涉及重金属检测零部件技术领域,尤其涉及一种样品杯。
背景技术
在重金属检测领域,如通过EDXRF设备进行放射性重金属检测时,要将待测样品放置于EDXRF设备的射线照射工位,射线从工位向上照射,进行检测。
待测样品一般放置于样品杯内,再放置于照射工位,样品杯的底部是透明薄膜,射线可以透过透明薄膜,对待测样品进行照射测量,EDXRF设备接收样品的反射光,分析后得到样品中各重金属元素的含量值。
由于样品的种类和形状的多样性,有些体积小且不易固定的样品在样品杯中不能定位在样品杯的中间位置,而射线的照射范围是固定的,就无法对样品杯中的样品准确照射测量。
发明内容
本发明的目的是为了解决上述问题,提供一种样品杯,在杯品杯中设置不同尺寸的内杯,使样品在测量时定位在样品杯的底部中间位置。
本发明采取的技术方案是:
一种样品杯,其特征是,包括主环体,在主环体内套设内杯,所述内杯上口大下口小,呈锥形,内杯的高度小于等于主环体的高度,在主环体的上端口或下端口用于固定覆盖透明薄膜。
进一步,所述主环体的下端外表面形成环形下阶梯槽,所述下阶梯槽上设置下套环,所述下套环的高度与下阶梯槽的高度相同,所述下套环与下阶梯槽间隙配合,用于对覆盖在主环体下端口的透明薄膜进行卡设。
进一步,所述阶梯轴上方的主环体上设置卡环,所述卡环与主环体间隙配合,所述卡环用于将露出套环之外的透明薄膜边缘卡住。
进一步,所述主环体的上端外表面形成环形上阶梯槽,所述上阶梯槽和下阶梯槽中间为环形凸缘,所述卡环设置在所述环形凸缘上,所述上阶梯槽上设置上套环,所述上套环与上阶梯槽间隙配合,所述上套环与下套环结构大小相同,所述上阶梯槽与下阶梯槽结构大小相同。
进一步,在环形凸缘上靠近主环体上端一侧设置环突。
进一步,所述内杯上设置卡缘,卡缘外径大于主环体内径,所述内杯的外侧面上环形布置若干个竖筋板,竖筋板在内杯的外侧面上均布,竖筋板外围尺寸与主环体的内孔尺寸相对应。
进一步,所述主环体位于上端口一侧的内孔孔径大于位于下端口一侧的内孔孔径,所述内杯从上端口插入至主环体内时与主环体松配合,所述内杯从下端口插入至主环体内时与主环体紧配合。
进一步,所述内杯内孔为弧形锥孔。
进一步,所述上套环和下套环的孔内中间位置设置环形槽,环形槽的两侧分别形成第一突环和第二突环,所述第一突环的宽度大于第二突环的宽度。
进一步,在所述上阶梯槽与环形凸缘连接处、下阶梯槽与环形凸缘连接处均设置环沟,所述环沟的宽度和深度与第二突环的宽度和高度相对应。
本发明的有益效果是:
(1)内杯使样品固定在样品杯的底部中间;
(2)下套环和卡环使透明薄膜的边缘不会产生翻边,方便机械手抓取;
(3)上套环可以作为下套环的备份;
(4)上下套环的第二突环配合于环沟内固定;
(5)主环体的上端孔径略大,方便内杯放入,主环体的下端孔径略小,可以将透明薄膜包于内标下口放入主环体下端孔内;
(6)内杯的竖筋板不仅可以作为内标的支撑,还可以作为与主环体内孔配合的接触点。
附图说明
附图1是本发明的爆炸图;
附图2是主环体的剖切示意图;
附图3是上套环和下套环的剖切示意图;
附图4是内杯的一个实例的立体示意图;
附图5是内杯另一个实例的立体示意图。
附图中的标号分别为:
1. 主环体; 2. 上端;
3. 下端; 4. 下阶梯槽;
5. 下套环; 6. 上阶梯槽;
7. 上套环; 8. 环形凸缘;
9. 卡环; 10. 环突;
11. 环形槽; 12. 第一突环;
13. 第二突环; 14. 环沟;
15. 内杯; 16. 卡缘;
17. 竖筋板。
具体实施方式
下面结合附图对本发明样品杯的具体实施方式作详细说明。
参见附图1、2,样品杯包括主环体1,主环体1竖直放置时分为上端2和下端3,在下端3外表面形成环形下阶梯槽4。下阶梯槽4上设置下套环5,下套环5的高度与下阶梯槽4的高度相同,下套环5与下阶梯槽4间隙配合。
与下端3结构相同,主环体1的上端2外表面也形成环形上阶梯槽6,上阶梯轴6上间隙配合上套环7,上阶梯槽6和下阶梯槽4中间形成环形凸缘8,在环形凸缘8上设置卡环9,卡环9与环形凸缘8间隙配合。
主环体1位于上端口一侧的内孔孔径大于位于下端口一侧的内孔孔径,孔内部呈现一定的倾斜实现。
参见附图3,在环形凸缘8上靠近主环体1上端2一侧设置环突10。环突10对卡环9形成限位。上阶梯槽6和下阶梯槽4、上套环7和下套环5的结构和尺寸都相同。
上套环7和下套环5的孔内中间位置设置环形槽11,环形槽11的两侧分别形成第一突环12和第二突环13,第一突环12的宽度大于第二突环13的宽度。在上阶梯槽6与环形凸缘8连接处、下阶梯槽4与环形凸缘8连接处均设置环沟14,环沟14的宽度和深度与第二突环13的宽度和高度相对应。
参见附图4、5,在主环体1内套设内杯15,内杯15上口大下口小,呈锥形,内杯15的高度小于等于主环体1的高度。内杯15上设置卡缘16,卡缘16外径大于主环体1内径,内杯15的外侧面上环形布置若干个竖筋板17,竖筋板17在内杯15的外侧面上均布,竖筋板17外围尺寸与主环体1的内孔尺寸相对应。内杯15内孔为弧形锥孔。
内杯15的长度可以不同,但都小于主环体1的长度,用于不同尺寸的样品。
继续参见附图1,样品杯使用时,上套环7套入上阶梯槽6与之配合,上套环7的第二突环13进入上阶梯槽6与环形凸缘8连接处的环沟14内,卡锁完成。上套环7与阶梯槽的固定,只用于将上套环7与样品杯进行固定。上套环7的这种结构也可以不用,做成一体,减少加工工艺,减少成本。这种结构的目的是保留一个上套环7,以便在下套环5出现问题时进行替换。
然后将透明薄膜覆盖在下端口,从下端口处套入卡环9,将透明膜薄基本固定后,下套环5套入下端口处的下阶梯槽4,将透明薄膜紧绷在下端口上,下套环5的第二突环13进入下阶梯槽4与环形凸缘8连接处的环沟14内,完成卡锁。对于稍厚的透明薄膜,可以将下套环5反向套入下阶梯槽4内,第一突环12在前面,与下阶梯槽4的接触面积增大,提高对透明薄膜的夹持力。卡环9的作用是使透明薄膜的边缘紧贴主环体1壁,防止影响机械手对样品杯的抓取。
内杯15从上端口插入至主环体1内,内杯15的卡缘16与上端口配合,内杯15的竖筋板17与主环体1内孔配合,内杯15的下端3与透明薄膜接近或接触。此时内杯15的竖筋板17与主环体1内孔配合可以较松,方便操作。待测样品尺寸较小时,从内杯15的开口处放入后,落入至透明薄膜处,位于内环体下端口的中央,方便对样品进行检测。
此外,还可以通过下面的方法进行透明薄膜的固定和样品的布置,由于主环体1上端口一侧的内孔孔径大于位于下端口一侧的内孔孔径,因此内杯15从上端口插入主环体1时较松,从下端口插入主环体1时较紧。将透明薄膜包覆住内杯15下端3后,一起插入下端口,使上端口向下放置,完成设置。待测样品尺寸较小时,从内杯15的开口处放入后,落入至透明薄膜处,位于内环体上端口的中央,方便对样品进行检测。
如果透明薄膜的厚度较大,将透明薄膜包覆住内杯15下端3后,可以从上端口插入,达至插入后将透明薄膜绷紧即可。
在使用在内杯15上包覆式固定透明薄膜的这种方式时,使用如附图4中较短的内杯15,对于圆珠形样品,由于无法很好地固定在薄膜中央,可以将透明薄膜中间顶压形成兜形,使圆珠样品落入兜内,兜的底部也不会与主环体1最下端3接触,实现对珠形样品的检测。
以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员,在不脱离本发明原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。

Claims (10)

1.一种样品杯,其特征在于:包括主环体,在主环体内套设内杯,所述内杯上口大下口小,呈锥形,内杯的高度小于等于主环体的高度,在主环体的上端口或下端口用于固定覆盖透明薄膜。
2.根据权利要求1所述的样品杯,其特征在于:所述主环体的下端外表面形成环形下阶梯槽,所述下阶梯槽上设置下套环,所述下套环的高度与下阶梯槽的高度相同,所述下套环与下阶梯槽间隙配合,用于对覆盖在主环体下端口的透明薄膜进行卡设。
3.根据权利要求2所述的样品杯,其特征在于:所述阶梯轴上方的主环体上设置卡环,所述卡环与主环体间隙配合,所述卡环用于将露出套环之外的透明薄膜边缘卡住。
4.根据权利要求3所述的样品杯,其特征在于:所述主环体的上端外表面形成环形上阶梯槽,所述上阶梯槽和下阶梯槽中间为环形凸缘,所述卡环设置在所述环形凸缘上,所述上阶梯槽上设置上套环,所述上套环与上阶梯槽间隙配合,所述上套环与下套环结构大小相同,所述上阶梯槽与下阶梯槽结构大小相同。
5.根据权利要求4所述的样品杯,其特征在于:在环形凸缘上靠近主环体上端一侧设置环突。
6.根据权利要求1至4中任一项所述的样品杯,其特征在于:所述内杯上设置卡缘,卡缘外径大于主环体内径,所述内杯的外侧面上环形布置若干个竖筋板,竖筋板在内杯的外侧面上均布,竖筋板外围尺寸与主环体的内孔尺寸相对应。
7.根据权利要求5所述的样品杯,其特征在于:所述主环体位于上端口一侧的内孔孔径大于位于下端口一侧的内孔孔径,所述内杯从上端口插入至主环体内时与主环体松配合,所述内杯从下端口插入至主环体内时与主环体紧配合。
8.根据权利要求1至5中任一项所述的样品杯,其特征在于:所述内杯内孔为弧形锥孔。
9.根据权利要求4所述的样品杯,其特征在于:所述上套环和下套环的孔内中间位置设置环形槽,环形槽的两侧分别形成第一突环和第二突环,所述第一突环的宽度大于第二突环的宽度。
10.根据权利要求9所述的样品杯,其特征在于:在所述上阶梯槽与环形凸缘连接处、下阶梯槽与环形凸缘连接处均设置环沟,所述环沟的宽度和深度与第二突环的宽度和高度相对应。
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