JPWO2022003850A1 - - Google Patents
Info
- Publication number
- JPWO2022003850A1 JPWO2022003850A1 JP2022532907A JP2022532907A JPWO2022003850A1 JP WO2022003850 A1 JPWO2022003850 A1 JP WO2022003850A1 JP 2022532907 A JP2022532907 A JP 2022532907A JP 2022532907 A JP2022532907 A JP 2022532907A JP WO2022003850 A1 JPWO2022003850 A1 JP WO2022003850A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/309—Accessories, mechanical or electrical features support of sample holder
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2024095686A JP7679908B2 (ja) | 2020-07-01 | 2024-06-13 | Ｘ線分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2020/025763 WO2022003850A1 (ja) | 2020-07-01 | 2020-07-01 | Ｘ線分析装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024095686A Division JP7679908B2 (ja) | 2020-07-01 | 2024-06-13 | Ｘ線分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2022003850A1 true JPWO2022003850A1 (https=) | 2022-01-06 |
| JPWO2022003850A5 JPWO2022003850A5 (https=) | 2023-03-08 |
Family
ID=79315789
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022532907A Pending JPWO2022003850A1 (https=) | 2020-07-01 | 2020-07-01 | |
| JP2024095686A Active JP7679908B2 (ja) | 2020-07-01 | 2024-06-13 | Ｘ線分析装置 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024095686A Active JP7679908B2 (ja) | 2020-07-01 | 2024-06-13 | Ｘ線分析装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20230236142A1 (https=) |
| EP (1) | EP4177600B1 (https=) |
| JP (2) | JPWO2022003850A1 (https=) |
| CN (1) | CN115715365A (https=) |
| TW (1) | TWI787821B (https=) |
| WO (1) | WO2022003850A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2026039749A (ja) * | 2024-08-23 | 2026-03-09 | 日本電子株式会社 | 試料容器、蛍光ｘ線分析装置、および測定方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04331349A (ja) * | 1991-05-03 | 1992-11-19 | Horiba Ltd | 蛍光ｘ線分析装置 |
| JPH04355355A (ja) * | 1991-05-31 | 1992-12-09 | Rigaku Denki Kogyo Kk | 蛍光ｘ線分析装置における窓材の汚染検出方法 |
| US5703927A (en) * | 1993-04-15 | 1997-12-30 | Angelo M. Torrisi | Safety ring for double open-ended sample holder cell for spectroscopic analysis |
| JP2006317153A (ja) * | 2005-05-10 | 2006-11-24 | Rigaku Industrial Co | 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置 |
| JP2011013027A (ja) * | 2009-06-30 | 2011-01-20 | Horiba Ltd | 蛍光ｘ線分析装置 |
| JP2011089794A (ja) * | 2009-10-20 | 2011-05-06 | Rigaku Corp | 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4974244A (en) * | 1988-08-04 | 1990-11-27 | Angelo M. Torrisi | Sample positioning method and system for X-ray spectroscopic analysis |
| JP3525188B2 (ja) * | 2001-06-06 | 2004-05-10 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| JP3629539B2 (ja) * | 2002-03-04 | 2005-03-16 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| JP3726161B2 (ja) * | 2003-03-28 | 2005-12-14 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| JP5517506B2 (ja) * | 2009-06-30 | 2014-06-11 | 株式会社堀場製作所 | 蛍光ｘ線分析装置 |
| JP5907375B2 (ja) * | 2011-12-28 | 2016-04-26 | 株式会社テクノエックス | 蛍光ｘ線分析装置及び蛍光ｘ線分析方法 |
| DE102014115383A1 (de) * | 2014-08-01 | 2016-02-04 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Handgerät sowie mobile Einrichtung zur Röntgenfluoreszenzanalyse |
| JP6642372B2 (ja) | 2016-10-14 | 2020-02-05 | 株式会社島津製作所 | Ｘ線分析装置 |
| CN108956672B (zh) * | 2018-05-15 | 2021-12-17 | 江苏天瑞仪器股份有限公司 | 使用食品快检仪专用样品杯进行重金属检测的检测方法 |
-
2020
- 2020-07-01 US US18/013,198 patent/US20230236142A1/en not_active Abandoned
- 2020-07-01 CN CN202080102470.2A patent/CN115715365A/zh active Pending
- 2020-07-01 EP EP20943512.2A patent/EP4177600B1/en active Active
- 2020-07-01 WO PCT/JP2020/025763 patent/WO2022003850A1/ja not_active Ceased
- 2020-07-01 JP JP2022532907A patent/JPWO2022003850A1/ja active Pending
-
2021
- 2021-05-17 TW TW110117615A patent/TWI787821B/zh active
-
2024
- 2024-06-13 JP JP2024095686A patent/JP7679908B2/ja active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04331349A (ja) * | 1991-05-03 | 1992-11-19 | Horiba Ltd | 蛍光ｘ線分析装置 |
| JPH04355355A (ja) * | 1991-05-31 | 1992-12-09 | Rigaku Denki Kogyo Kk | 蛍光ｘ線分析装置における窓材の汚染検出方法 |
| US5703927A (en) * | 1993-04-15 | 1997-12-30 | Angelo M. Torrisi | Safety ring for double open-ended sample holder cell for spectroscopic analysis |
| JP2006317153A (ja) * | 2005-05-10 | 2006-11-24 | Rigaku Industrial Co | 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置 |
| JP2011013027A (ja) * | 2009-06-30 | 2011-01-20 | Horiba Ltd | 蛍光ｘ線分析装置 |
| JP2011089794A (ja) * | 2009-10-20 | 2011-05-06 | Rigaku Corp | 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7679908B2 (ja) | 2025-05-20 |
| JP2024107407A (ja) | 2024-08-08 |
| US20230236142A1 (en) | 2023-07-27 |
| TWI787821B (zh) | 2022-12-21 |
| EP4177600B1 (en) | 2025-10-08 |
| TW202202834A (zh) | 2022-01-16 |
| WO2022003850A1 (ja) | 2022-01-06 |
| CN115715365A (zh) | 2023-02-24 |
| EP4177600A1 (en) | 2023-05-10 |
| EP4177600A4 (en) | 2024-03-06 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20221221 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20221221 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240130 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240329 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240416 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20241008 |