TWI777055B - 蒸鍍遮罩、附有框架之蒸鍍遮罩、蒸鍍遮罩準備體、蒸鍍遮罩之製造方法、有機半導體元件之製造方法、有機el顯示器之製造方法及圖案之形成方法 - Google Patents
蒸鍍遮罩、附有框架之蒸鍍遮罩、蒸鍍遮罩準備體、蒸鍍遮罩之製造方法、有機半導體元件之製造方法、有機el顯示器之製造方法及圖案之形成方法 Download PDFInfo
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- TWI777055B TWI777055B TW108110610A TW108110610A TWI777055B TW I777055 B TWI777055 B TW I777055B TW 108110610 A TW108110610 A TW 108110610A TW 108110610 A TW108110610 A TW 108110610A TW I777055 B TWI777055 B TW I777055B
- Authority
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- Prior art keywords
- vapor deposition
- resin
- mask
- metal layer
- deposition mask
- Prior art date
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- 238000007740 vapor deposition Methods 0.000 title claims abstract description 297
- 238000000034 method Methods 0.000 title claims description 84
- 238000004519 manufacturing process Methods 0.000 title claims description 52
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- 239000004065 semiconductor Substances 0.000 title claims description 26
- 230000007261 regionalization Effects 0.000 title description 2
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- 229910052751 metal Inorganic materials 0.000 claims abstract description 375
- 239000002184 metal Substances 0.000 claims abstract description 375
- 239000000463 material Substances 0.000 claims abstract description 63
- 239000007769 metal material Substances 0.000 claims abstract description 28
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- 238000001704 evaporation Methods 0.000 claims description 38
- 230000008020 evaporation Effects 0.000 claims description 37
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- 238000005229 chemical vapour deposition Methods 0.000 description 5
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- DHKHKXVYLBGOIT-UHFFFAOYSA-N 1,1-Diethoxyethane Chemical compound CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 description 1
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- 239000004641 Diallyl-phthalate Substances 0.000 description 1
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- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
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- 229910000831 Steel Inorganic materials 0.000 description 1
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- 238000009825 accumulation Methods 0.000 description 1
- 239000011354 acetal resin Substances 0.000 description 1
- QUDWYFHPNIMBFC-UHFFFAOYSA-N bis(prop-2-enyl) benzene-1,2-dicarboxylate Chemical compound C=CCOC(=O)C1=CC=CC=C1C(=O)OCC=C QUDWYFHPNIMBFC-UHFFFAOYSA-N 0.000 description 1
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- 238000007763 reverse roll coating Methods 0.000 description 1
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- 229920002050 silicone resin Polymers 0.000 description 1
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- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
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Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/04—Coating on selected surface areas, e.g. using masks
- C23C16/042—Coating on selected surface areas, e.g. using masks using masks
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- General Chemical & Material Sciences (AREA)
- Electroluminescent Light Sources (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018080690A JP6658790B2 (ja) | 2018-04-19 | 2018-04-19 | 蒸着マスク、フレーム付き蒸着マスク、蒸着マスク準備体、蒸着マスクの製造方法、有機半導体素子の製造方法、有機elディスプレイの製造方法、及びパターンの形成方法 |
| JP2018-080690 | 2018-04-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202003884A TW202003884A (zh) | 2020-01-16 |
| TWI777055B true TWI777055B (zh) | 2022-09-11 |
Family
ID=68240226
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW108110610A TWI777055B (zh) | 2018-04-19 | 2019-03-27 | 蒸鍍遮罩、附有框架之蒸鍍遮罩、蒸鍍遮罩準備體、蒸鍍遮罩之製造方法、有機半導體元件之製造方法、有機el顯示器之製造方法及圖案之形成方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20210013415A1 (enExample) |
| JP (1) | JP6658790B2 (enExample) |
| KR (1) | KR102728020B1 (enExample) |
| CN (2) | CN115110027B (enExample) |
| TW (1) | TWI777055B (enExample) |
| WO (1) | WO2019202902A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111088474B (zh) * | 2020-01-03 | 2022-07-05 | 京东方科技集团股份有限公司 | 一种掩膜板及其制作方法 |
| KR20210091382A (ko) * | 2020-01-13 | 2021-07-22 | 삼성디스플레이 주식회사 | 마스크, 이의 제조 방법, 및 표시 패널 제조 방법 |
| KR102868771B1 (ko) * | 2020-10-28 | 2025-10-13 | 삼성디스플레이 주식회사 | 마스크 프레임 및 이를 포함하는 증착 장치 |
| TWD215838S (zh) | 2021-05-07 | 2021-12-01 | 景美科技股份有限公司 | 框架之部分 |
| TWI777614B (zh) * | 2021-06-11 | 2022-09-11 | 達運精密工業股份有限公司 | 金屬遮罩及其製造方法 |
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| TW201343943A (zh) * | 2012-01-12 | 2013-11-01 | Dainippon Printing Co Ltd | 蒸鍍遮罩、蒸鍍遮罩裝置的製造方法及有機半導體元件的製造方法 |
| JP2015120961A (ja) * | 2013-12-24 | 2015-07-02 | コニカミノルタ株式会社 | 成膜用マスク、マスク成膜方法、および有機エレクトロルミネッセンス素子の製造方法 |
| TW201608045A (zh) * | 2014-06-06 | 2016-03-01 | Dainippon Printing Co Ltd | 蒸鍍遮罩,附框架蒸鍍遮罩,蒸鍍遮罩預備體,及有機半導體元件之製造方法 |
| TW201728770A (zh) * | 2016-02-10 | 2017-08-16 | 鴻海精密工業股份有限公司 | 蒸鍍遮罩之製造方法、蒸鍍遮罩及有機半導體元件之製造方法 |
| CN107075658A (zh) * | 2014-10-23 | 2017-08-18 | 夏普株式会社 | 蒸镀掩模的制造方法、蒸镀掩模、蒸镀装置、蒸镀方法 |
| TW201805451A (zh) * | 2016-03-23 | 2018-02-16 | 鴻海精密工業股份有限公司 | 蒸鍍遮罩、蒸鍍遮罩之製造方法及有機半導體元件之製造方法 |
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| US4916513A (en) * | 1965-09-28 | 1990-04-10 | Li Chou H | Dielectrically isolated integrated circuit structure |
| JPS5288072U (enExample) | 1975-12-25 | 1977-07-01 | ||
| US5453293A (en) * | 1991-07-17 | 1995-09-26 | Beane; Alan F. | Methods of manufacturing coated particles having desired values of intrinsic properties and methods of applying the coated particles to objects |
| SG115678A1 (en) * | 2003-04-22 | 2005-10-28 | Asml Netherlands Bv | Substrate carrier and method for making a substrate carrier |
| JP2010232163A (ja) * | 2009-03-03 | 2010-10-14 | Fujifilm Corp | 発光表示装置の製造方法、発光表示装置、及び発光ディスプレイ |
| TWI725466B (zh) * | 2013-03-26 | 2021-04-21 | 日商大日本印刷股份有限公司 | 蒸鍍遮罩、附框架的蒸鍍遮罩、蒸鍍遮罩之製造方法、蒸鍍遮罩準備體、圖案之形成方法、及有機半導體元件之製造方法 |
| JP6142388B2 (ja) * | 2013-04-09 | 2017-06-07 | 株式会社ブイ・テクノロジー | 蒸着マスク及び蒸着マスクの製造方法 |
| WO2014167989A1 (ja) * | 2013-04-12 | 2014-10-16 | 大日本印刷株式会社 | 蒸着マスク、蒸着マスク準備体、蒸着マスクの製造方法、及び有機半導体素子の製造方法 |
| JP6078818B2 (ja) * | 2013-07-02 | 2017-02-15 | 株式会社ブイ・テクノロジー | 成膜マスク及び成膜マスクの製造方法 |
| JP6168944B2 (ja) * | 2013-09-20 | 2017-07-26 | 株式会社ブイ・テクノロジー | 成膜マスク |
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| JP6511908B2 (ja) * | 2014-03-31 | 2019-05-15 | 大日本印刷株式会社 | 蒸着マスクの引張方法、フレーム付き蒸着マスクの製造方法、有機半導体素子の製造方法、及び引張装置 |
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2018
- 2018-04-19 JP JP2018080690A patent/JP6658790B2/ja active Active
-
2019
- 2019-03-20 US US17/042,297 patent/US20210013415A1/en not_active Abandoned
- 2019-03-20 WO PCT/JP2019/011768 patent/WO2019202902A1/ja not_active Ceased
- 2019-03-20 KR KR1020207026033A patent/KR102728020B1/ko active Active
- 2019-03-20 CN CN202210638781.1A patent/CN115110027B/zh active Active
- 2019-03-20 CN CN201980019365.XA patent/CN111886357B/zh active Active
- 2019-03-27 TW TW108110610A patent/TWI777055B/zh active
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| TW201343943A (zh) * | 2012-01-12 | 2013-11-01 | Dainippon Printing Co Ltd | 蒸鍍遮罩、蒸鍍遮罩裝置的製造方法及有機半導體元件的製造方法 |
| JP2015120961A (ja) * | 2013-12-24 | 2015-07-02 | コニカミノルタ株式会社 | 成膜用マスク、マスク成膜方法、および有機エレクトロルミネッセンス素子の製造方法 |
| TW201608045A (zh) * | 2014-06-06 | 2016-03-01 | Dainippon Printing Co Ltd | 蒸鍍遮罩,附框架蒸鍍遮罩,蒸鍍遮罩預備體,及有機半導體元件之製造方法 |
| CN107075658A (zh) * | 2014-10-23 | 2017-08-18 | 夏普株式会社 | 蒸镀掩模的制造方法、蒸镀掩模、蒸镀装置、蒸镀方法 |
| TW201728770A (zh) * | 2016-02-10 | 2017-08-16 | 鴻海精密工業股份有限公司 | 蒸鍍遮罩之製造方法、蒸鍍遮罩及有機半導體元件之製造方法 |
| TW201805451A (zh) * | 2016-03-23 | 2018-02-16 | 鴻海精密工業股份有限公司 | 蒸鍍遮罩、蒸鍍遮罩之製造方法及有機半導體元件之製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102728020B1 (ko) | 2024-11-07 |
| CN111886357A (zh) | 2020-11-03 |
| KR20200144091A (ko) | 2020-12-28 |
| WO2019202902A1 (ja) | 2019-10-24 |
| JP2019189888A (ja) | 2019-10-31 |
| CN111886357B (zh) | 2022-06-21 |
| CN115110027B (zh) | 2024-01-02 |
| US20210013415A1 (en) | 2021-01-14 |
| JP6658790B2 (ja) | 2020-03-04 |
| TW202003884A (zh) | 2020-01-16 |
| CN115110027A (zh) | 2022-09-27 |
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