TWI715815B - 流體液滴方法及壓印微影設備 - Google Patents

流體液滴方法及壓印微影設備 Download PDF

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Publication number
TWI715815B
TWI715815B TW106139141A TW106139141A TWI715815B TW I715815 B TWI715815 B TW I715815B TW 106139141 A TW106139141 A TW 106139141A TW 106139141 A TW106139141 A TW 106139141A TW I715815 B TWI715815 B TW I715815B
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TW
Taiwan
Prior art keywords
fluid
substrate
fluid distribution
pattern
stroke
Prior art date
Application number
TW106139141A
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English (en)
Chinese (zh)
Other versions
TW201833668A (zh
Inventor
艾德華 芙蘭契
堤墨希 史塔維克
Original Assignee
日商佳能股份有限公司
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Publication date
Priority claimed from US15/375,966 external-priority patent/US10634993B2/en
Priority claimed from US15/375,912 external-priority patent/US10481491B2/en
Application filed by 日商佳能股份有限公司 filed Critical 日商佳能股份有限公司
Publication of TW201833668A publication Critical patent/TW201833668A/zh
Application granted granted Critical
Publication of TWI715815B publication Critical patent/TWI715815B/zh

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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
    • G03F7/2012—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image using liquid photohardening compositions, e.g. for the production of reliefs such as flexographic plates or stamps
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70716—Stages

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Coating Apparatus (AREA)
TW106139141A 2016-12-12 2017-11-13 流體液滴方法及壓印微影設備 TWI715815B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US15/375,966 US10634993B2 (en) 2016-12-12 2016-12-12 Fluid droplet methodology and apparatus for imprint lithography
US15/375,966 2016-12-12
US15/375,912 2016-12-12
US15/375,912 US10481491B2 (en) 2016-12-12 2016-12-12 Fluid droplet methodology and apparatus for imprint lithography

Publications (2)

Publication Number Publication Date
TW201833668A TW201833668A (zh) 2018-09-16
TWI715815B true TWI715815B (zh) 2021-01-11

Family

ID=62634796

Family Applications (1)

Application Number Title Priority Date Filing Date
TW106139141A TWI715815B (zh) 2016-12-12 2017-11-13 流體液滴方法及壓印微影設備

Country Status (5)

Country Link
JP (1) JP7079085B2 (enExample)
KR (1) KR102205141B1 (enExample)
CN (1) CN108227373B (enExample)
SG (1) SG10201709153VA (enExample)
TW (1) TWI715815B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10468247B2 (en) * 2016-12-12 2019-11-05 Canon Kabushiki Kaisha Fluid droplet methodology and apparatus for imprint lithography
US11209730B2 (en) * 2019-03-14 2021-12-28 Canon Kabushiki Kaisha Methods of generating drop patterns, systems for shaping films with the drop pattern, and methods of manufacturing an article with the drop pattern
US11762295B2 (en) 2020-10-28 2023-09-19 Canon Kabushiki Kaisha Fluid droplet methodology and apparatus for imprint lithography
JP7610461B2 (ja) * 2021-04-08 2025-01-08 キヤノン株式会社 インプリント装置、インプリント方法、物品の製造方法、決定方法、およびプログラム
CN120178595B (zh) * 2025-05-20 2025-07-22 普雨科技(苏州)有限公司 一种步进式重复纳米压印设备、控制方法及控制系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5788385A (en) * 1991-09-19 1998-08-04 Canon Kabushiki Kaisha Serial recording system capable of varing resolution
US20060051498A1 (en) * 2002-02-12 2006-03-09 Seiko Epson Corporation Display device having a color filter
US20070035597A1 (en) * 2002-08-20 2007-02-15 Palo Alto Research Center Incorporated Digital lithography using real time quality control
US20080018875A1 (en) * 2006-07-18 2008-01-24 Asml Netherlands B.V. Imprint lithography
US20130120485A1 (en) * 2010-06-30 2013-05-16 Fujifilm Corporation Liquid application device, liquid application method, and nanoimprint system

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6536883B2 (en) 2001-02-16 2003-03-25 Eastman Kodak Company Continuous ink-jet printer having two dimensional nozzle array and method of increasing ink drop density
JP4168788B2 (ja) 2003-03-06 2008-10-22 セイコーエプソン株式会社 成膜方法、カラーフィルタ基板の製造方法、エレクトロルミネッセンス装置用基板の製造方法、表示装置の製造方法
JP4337586B2 (ja) 2004-03-10 2009-09-30 セイコーエプソン株式会社 光学被膜の形成方法及びその方法で製造された光学物品
US8001924B2 (en) 2006-03-31 2011-08-23 Asml Netherlands B.V. Imprint lithography
JP4908369B2 (ja) 2007-10-02 2012-04-04 株式会社東芝 インプリント方法及びインプリントシステム
US8187515B2 (en) * 2008-04-01 2012-05-29 Molecular Imprints, Inc. Large area roll-to-roll imprint lithography
US8586126B2 (en) * 2008-10-21 2013-11-19 Molecular Imprints, Inc. Robust optimization to generate drop patterns in imprint lithography which are tolerant of variations in drop volume and drop placement
NL2003875A (en) * 2009-02-04 2010-08-05 Asml Netherlands Bv Imprint lithography method and apparatus.
JP5495767B2 (ja) 2009-12-21 2014-05-21 キヤノン株式会社 インプリント装置及び方法、並びに物品の製造方法
NL2007633A (en) * 2010-11-22 2012-05-23 Asml Netherlands Bv A positioning system, a lithographic apparatus and a method for positional control.
JP5748291B2 (ja) 2012-02-29 2015-07-15 富士フイルム株式会社 液体吐出装置、ナノインプリントシステム及び液体吐出方法
JP6135119B2 (ja) 2012-12-19 2017-05-31 大日本印刷株式会社 インプリント方法、インプリント樹脂滴下位置決定方法及びインプリント装置
JP6329425B2 (ja) * 2014-05-02 2018-05-23 キヤノン株式会社 インプリント装置、インプリント方法、および物品の製造方法
US10620532B2 (en) * 2014-11-11 2020-04-14 Canon Kabushiki Kaisha Imprint method, imprint apparatus, mold, and article manufacturing method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5788385A (en) * 1991-09-19 1998-08-04 Canon Kabushiki Kaisha Serial recording system capable of varing resolution
US20060051498A1 (en) * 2002-02-12 2006-03-09 Seiko Epson Corporation Display device having a color filter
US20070035597A1 (en) * 2002-08-20 2007-02-15 Palo Alto Research Center Incorporated Digital lithography using real time quality control
US20080018875A1 (en) * 2006-07-18 2008-01-24 Asml Netherlands B.V. Imprint lithography
US20130120485A1 (en) * 2010-06-30 2013-05-16 Fujifilm Corporation Liquid application device, liquid application method, and nanoimprint system

Also Published As

Publication number Publication date
JP2018098506A (ja) 2018-06-21
CN108227373B (zh) 2022-02-08
KR20180067415A (ko) 2018-06-20
CN108227373A (zh) 2018-06-29
SG10201709153VA (en) 2018-07-30
JP7079085B2 (ja) 2022-06-01
KR102205141B1 (ko) 2021-01-20
TW201833668A (zh) 2018-09-16

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