TWI654088B - 用於聚合物表面與載具之受控接合之物件及方法 - Google Patents

用於聚合物表面與載具之受控接合之物件及方法

Info

Publication number
TWI654088B
TWI654088B TW104102736A TW104102736A TWI654088B TW I654088 B TWI654088 B TW I654088B TW 104102736 A TW104102736 A TW 104102736A TW 104102736 A TW104102736 A TW 104102736A TW I654088 B TWI654088 B TW I654088B
Authority
TW
Taiwan
Prior art keywords
carrier
glass
bonding
sheet
plasma
Prior art date
Application number
TW104102736A
Other languages
English (en)
Chinese (zh)
Other versions
TW201545887A (zh
Inventor
貝爾曼羅伯特艾倫
曼利羅伯喬治
瑪贊德普蘭汀
席蒙頓克斯提林
Original Assignee
美商康寧公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 美商康寧公司 filed Critical 美商康寧公司
Publication of TW201545887A publication Critical patent/TW201545887A/zh
Application granted granted Critical
Publication of TWI654088B publication Critical patent/TWI654088B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/80Manufacture or treatment specially adapted for the organic devices covered by this subclass using temporary substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/1218Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition or structure of the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/1259Multistep manufacturing methods
    • H01L27/1262Multistep manufacturing methods with a particular formation, treatment or coating of the substrate
    • H01L27/1266Multistep manufacturing methods with a particular formation, treatment or coating of the substrate the substrate on which the devices are formed not being the final device substrate, e.g. using a temporary substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78603Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the insulating substrate or support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/466Lateral bottom-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • H10K10/471Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising only organic materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K77/00Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
    • H10K77/10Substrates, e.g. flexible substrates
    • H10K77/111Flexible substrates
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/549Organic PV cells

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Electromagnetism (AREA)
  • Laminated Bodies (AREA)
  • Joining Of Glass To Other Materials (AREA)
  • Surface Treatment Of Glass (AREA)
TW104102736A 2014-01-27 2015-01-27 用於聚合物表面與載具之受控接合之物件及方法 TWI654088B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201461931924P 2014-01-27 2014-01-27
US61/931,924 2014-01-27

Publications (2)

Publication Number Publication Date
TW201545887A TW201545887A (zh) 2015-12-16
TWI654088B true TWI654088B (zh) 2019-03-21

Family

ID=53682040

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104102736A TWI654088B (zh) 2014-01-27 2015-01-27 用於聚合物表面與載具之受控接合之物件及方法

Country Status (6)

Country Link
JP (2) JP2017506204A (ja)
KR (1) KR20160114687A (ja)
CN (1) CN106104778A (ja)
SG (1) SG11201606059WA (ja)
TW (1) TWI654088B (ja)
WO (1) WO2015113020A1 (ja)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10543662B2 (en) 2012-02-08 2020-01-28 Corning Incorporated Device modified substrate article and methods for making
US10014177B2 (en) 2012-12-13 2018-07-03 Corning Incorporated Methods for processing electronic devices
TWI617437B (zh) 2012-12-13 2018-03-11 康寧公司 促進控制薄片與載體間接合之處理
US10086584B2 (en) 2012-12-13 2018-10-02 Corning Incorporated Glass articles and methods for controlled bonding of glass sheets with carriers
US9340443B2 (en) 2012-12-13 2016-05-17 Corning Incorporated Bulk annealing of glass sheets
US10510576B2 (en) 2013-10-14 2019-12-17 Corning Incorporated Carrier-bonding methods and articles for semiconductor and interposer processing
JP6770432B2 (ja) 2014-01-27 2020-10-14 コーニング インコーポレイテッド 薄いシートの担体との制御された結合のための物品および方法
KR20160145062A (ko) 2014-04-09 2016-12-19 코닝 인코포레이티드 디바이스 변경된 기판 물품 및 제조 방법
JP2018524201A (ja) 2015-05-19 2018-08-30 コーニング インコーポレイテッド シートをキャリアと結合するための物品および方法
JP7106276B2 (ja) 2015-06-26 2022-07-26 コーニング インコーポレイテッド シート及び担体を有する物品及び方法
CN108353507B (zh) 2015-10-30 2020-11-27 康宁股份有限公司 用于加工与第二基材粘结的第一基材的方法
TW201737766A (zh) 2016-01-21 2017-10-16 康寧公司 處理基板的方法
TW201825623A (zh) 2016-08-30 2018-07-16 美商康寧公司 用於片材接合的矽氧烷電漿聚合物
TWI810161B (zh) * 2016-08-31 2023-08-01 美商康寧公司 具以可控制式黏結的薄片之製品及製作其之方法
CN106847862A (zh) * 2016-12-28 2017-06-13 深圳市华星光电技术有限公司 一种柔性显示器基板及其制备方法,柔性显示器制备方法
CN107098606B (zh) * 2017-04-24 2020-07-07 京东方科技集团股份有限公司 玻璃贴合方法、制造显示器件的方法和显示器件
KR20200081496A (ko) 2017-11-20 2020-07-07 코닝 인코포레이티드 양이온성 계면활성제 및/또는 유기염을 사용한 유리 쌍의 임시 접합
CN111615567B (zh) 2017-12-15 2023-04-14 康宁股份有限公司 用于处理基板的方法和用于制备包括粘合片材的制品的方法
CN110718453B (zh) * 2019-11-15 2021-08-20 武汉新芯集成电路制造有限公司 半导体器件及其制造方法
CN112701058B (zh) * 2020-12-30 2022-09-02 长春长光圆辰微电子技术有限公司 晶圆键合力的测试方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2542750B2 (ja) * 1985-12-09 1996-10-09 益弘 小駒 プラスチックの表面エネルギ―制御方法
US4810326A (en) * 1987-08-31 1989-03-07 International Business Machines Corporation Interlaminate adhesion between polymeric materials and electrolytic copper surfaces
AU5914994A (en) * 1993-04-21 1994-10-27 Bend Research, Inc. Plasma polymerization and surface modification inside hollow micro-substrates
JP4497154B2 (ja) * 1997-12-15 2010-07-07 セイコーエプソン株式会社 固体接合方法
JP2001048591A (ja) * 1999-08-03 2001-02-20 Kyodo Kumiai Ibaraki Kinosei Glass Kenkyukai 表面撥水性ガラス及びその製造方法
DE10256247A1 (de) * 2002-11-29 2004-06-09 Andreas Jakob Schichtverbund aus einer Trennschicht und einer Schutzschicht zum Schutze und zum Handling eines Wafers beim Dünnen, bei der Rückseitenbeschichtung und beim Vereinzeln
JP4030897B2 (ja) * 2003-03-07 2008-01-09 株式会社クラレ プラスチックの接着方法
US6969166B2 (en) * 2003-05-29 2005-11-29 3M Innovative Properties Company Method for modifying the surface of a substrate
WO2008156055A1 (ja) * 2007-06-18 2008-12-24 Seiko Epson Corporation 接合方法、接合体、液滴吐出ヘッドおよび液滴吐出装置
JP4710897B2 (ja) * 2007-11-28 2011-06-29 セイコーエプソン株式会社 接合体の剥離方法
US9847243B2 (en) * 2009-08-27 2017-12-19 Corning Incorporated Debonding a glass substrate from carrier using ultrasonic wave
CN102596565B (zh) * 2009-08-27 2014-09-10 旭硝子株式会社 挠性基材-支撑体的层叠结构体、带有支撑体的电子装置用面板、以及电子装置用面板的制造方法
JP5602529B2 (ja) * 2010-07-29 2014-10-08 日本合成化学工業株式会社 積層体の製法、ガラス基板付き偏光板の製法、およびそれにより得られたガラス基板付き偏光板
US8846499B2 (en) * 2010-08-17 2014-09-30 Taiwan Semiconductor Manufacturing Company, Ltd. Composite carrier structure
US8822306B2 (en) * 2010-09-30 2014-09-02 Infineon Technologies Ag Method for manufacturing a composite wafer having a graphite core, and composite wafer having a graphite core
KR101918284B1 (ko) * 2011-03-03 2019-01-30 엘지디스플레이 주식회사 플렉시블 표시장치의 제조 방법
SG11201402622YA (en) * 2011-11-29 2014-06-27 Univ Arizona Method of providing an electronic device structure and related electronic device structures
JP6003883B2 (ja) * 2012-02-01 2016-10-05 東洋紡株式会社 積層体とその製造方法及びそれを用いたデバイス構造体の製造方法
KR20140129153A (ko) * 2012-02-08 2014-11-06 코닝 인코포레이티드 캐리어로 플렉시블 유리를 가공하는 방법
KR20130095605A (ko) * 2012-06-22 2013-08-28 코스텍시스템(주) 디바이스 웨이퍼와 캐리어 웨이퍼의 본딩과 디본딩 장치
US10510576B2 (en) * 2013-10-14 2019-12-17 Corning Incorporated Carrier-bonding methods and articles for semiconductor and interposer processing

Also Published As

Publication number Publication date
WO2015113020A1 (en) 2015-07-30
SG11201606059WA (en) 2016-08-30
JP2017506204A (ja) 2017-03-02
TW201545887A (zh) 2015-12-16
CN106104778A (zh) 2016-11-09
JP2020037513A (ja) 2020-03-12
KR20160114687A (ko) 2016-10-05

Similar Documents

Publication Publication Date Title
TWI654088B (zh) 用於聚合物表面與載具之受控接合之物件及方法
TWI671200B (zh) 用於薄片與載體之受控制接合的物件及方法
TW201529511A (zh) 用於受控接合薄板與載具的表面改質層的處理
US20150329415A1 (en) Glass and methods of making glass articles
JP6353461B2 (ja) Oledデバイスの加工方法
JP6310479B2 (ja) シートとキャリアとの間の結合を制御するための促進された加工
KR102237812B1 (ko) 캐리어와 유리 시트의 결합을 제어하기 위한 유리 물품 및 방법
TW201529298A (zh) 用於玻璃片與載具的受控接合的玻璃物件及方法
EP2969997A1 (en) Bulk annealing of glass sheets

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees