TWI623745B - Magnetic flaw detection device, magnetic flaw detection device tilt correction method, and program - Google Patents

Magnetic flaw detection device, magnetic flaw detection device tilt correction method, and program Download PDF

Info

Publication number
TWI623745B
TWI623745B TW105113118A TW105113118A TWI623745B TW I623745 B TWI623745 B TW I623745B TW 105113118 A TW105113118 A TW 105113118A TW 105113118 A TW105113118 A TW 105113118A TW I623745 B TWI623745 B TW I623745B
Authority
TW
Taiwan
Prior art keywords
unit
distance
magnetic
detection
roller
Prior art date
Application number
TW105113118A
Other languages
English (en)
Chinese (zh)
Other versions
TW201732287A (zh
Inventor
Keisuke Watanabe
Original Assignee
Toshiba Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Kk filed Critical Toshiba Kk
Publication of TW201732287A publication Critical patent/TW201732287A/zh
Application granted granted Critical
Publication of TWI623745B publication Critical patent/TWI623745B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/83—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
TW105113118A 2016-03-08 2016-04-27 Magnetic flaw detection device, magnetic flaw detection device tilt correction method, and program TWI623745B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016044504A JP2017161296A (ja) 2016-03-08 2016-03-08 磁気探傷装置、磁気探傷装置の傾き補正方法、及び、プログラム

Publications (2)

Publication Number Publication Date
TW201732287A TW201732287A (zh) 2017-09-16
TWI623745B true TWI623745B (zh) 2018-05-11

Family

ID=59789100

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105113118A TWI623745B (zh) 2016-03-08 2016-04-27 Magnetic flaw detection device, magnetic flaw detection device tilt correction method, and program

Country Status (3)

Country Link
JP (1) JP2017161296A (ja)
TW (1) TWI623745B (ja)
WO (1) WO2017154225A1 (ja)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1022134C (zh) * 1989-09-25 1993-09-15 日本钢管株式会社 钢带用磁力探伤仪
TW340905B (en) * 1995-10-31 1998-09-21 Nippon Kokan Kk Magnetic sensor, and magnetic flaw detection method and apparatus using the magnetic sensor

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60224059A (ja) * 1984-04-21 1985-11-08 Sumitomo Metal Ind Ltd 追従制御装置
JPH11108899A (ja) * 1997-09-30 1999-04-23 Kawasaki Steel Corp 磁気探傷装置の感度校正方法及び装置
JP3758439B2 (ja) * 1999-12-20 2006-03-22 日本精工株式会社 曲面を有する被検査体の欠陥を曲面に沿って非接触で検出する方法
JP2001296278A (ja) * 2000-04-13 2001-10-26 Nkk Corp 金属体検査装置
JP2011180011A (ja) * 2010-03-02 2011-09-15 Ihi Inspection & Instrumentation Co Ltd 金属薄板の非破壊検査方法及びその非破壊検査装置
JP2012181097A (ja) * 2011-03-01 2012-09-20 Hitachi-Ge Nuclear Energy Ltd 構造物探傷方法及び装置
JP2012184931A (ja) * 2011-03-03 2012-09-27 Kobe Steel Ltd 鋼板における組織分率の測定方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1022134C (zh) * 1989-09-25 1993-09-15 日本钢管株式会社 钢带用磁力探伤仪
TW340905B (en) * 1995-10-31 1998-09-21 Nippon Kokan Kk Magnetic sensor, and magnetic flaw detection method and apparatus using the magnetic sensor

Also Published As

Publication number Publication date
TW201732287A (zh) 2017-09-16
WO2017154225A1 (ja) 2017-09-14
JP2017161296A (ja) 2017-09-14

Similar Documents

Publication Publication Date Title
US20210380372A1 (en) Wire rope inspection device, wire rope inspection system, and wire rope inspection method
KR102518930B1 (ko) 시트 두께 측정 장치
CN109900475B (zh) 轴承检查装置
US7615993B2 (en) Magnetic line-type position-angle detecting device
RU2486979C2 (ru) Измерительный валок для определения дефектов плоскостности ленты (варианты) и способ определения дефектов плоскостности ленты
JP2010164306A (ja) 焼入れ深さ測定方法および焼入れ深さ測定装置
JP2001174441A (ja) 非接触検査装置
JP2016224010A (ja) 渦電流検査装置
JP2007057439A (ja) プローブ装置及び被検査体とプローブとの接触圧の調整方法
JP5418877B2 (ja) ４探針抵抗率測定装置
TWI623745B (zh) Magnetic flaw detection device, magnetic flaw detection device tilt correction method, and program
JP2008122349A (ja) 測定装置
JP2016061709A (ja) アレイ型磁気探傷装置、及びその校正方法
JP2010071778A (ja) 大径管の外径測定装置
KR102428891B1 (ko) 디스크 검사장치
JP5170844B2 (ja) 渦電流探傷装置と渦電流探傷方法
TW200808489A (en) Stage device
JP2006003164A (ja) ロール状物の周面形状測定装置
JP2011108695A (ja) 半導体検査装置、半導体装置の検査方法、及び半導体装置の検査プログラム
JP2017501401A (ja) 鋼板の欠陥探傷装置及び方法
JP2008205339A (ja) 基板搭載テーブルの平面度測定方法
JP6327185B2 (ja) 渦流探傷装置の感度補正方法および感度補正装置
JP2018128450A (ja) 磁気センサを用いた磁性体の漏洩磁束検出装置及び漏洩磁束検出方法
JP2014160020A (ja) 物品の形状測定方法及び測定装置
JP2018044796A (ja) 磁気探傷装置

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees