TWI620618B - 研磨裝置及研磨方法 - Google Patents
研磨裝置及研磨方法 Download PDFInfo
- Publication number
- TWI620618B TWI620618B TW106131228A TW106131228A TWI620618B TW I620618 B TWI620618 B TW I620618B TW 106131228 A TW106131228 A TW 106131228A TW 106131228 A TW106131228 A TW 106131228A TW I620618 B TWI620618 B TW I620618B
- Authority
- TW
- Taiwan
- Prior art keywords
- polishing
- buckle
- ring
- load
- wafer
- Prior art date
Links
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/10—Single-purpose machines or devices
- B24B7/16—Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/16—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Inorganic Chemistry (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012-124663 | 2012-05-31 | ||
| JP2012124663 | 2012-05-31 | ||
| JP2012279751A JP5976522B2 (ja) | 2012-05-31 | 2012-12-21 | 研磨装置および研磨方法 |
| JP2012-279751 | 2012-12-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201808532A TW201808532A (zh) | 2018-03-16 |
| TWI620618B true TWI620618B (zh) | 2018-04-11 |
Family
ID=48578772
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW106131228A TWI620618B (zh) | 2012-05-31 | 2013-05-28 | 研磨裝置及研磨方法 |
| TW102118743A TWI602649B (zh) | 2012-05-31 | 2013-05-28 | Grinding device and grinding method |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102118743A TWI602649B (zh) | 2012-05-31 | 2013-05-28 | Grinding device and grinding method |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9403255B2 (enExample) |
| EP (4) | EP2700474B1 (enExample) |
| JP (2) | JP5976522B2 (enExample) |
| KR (2) | KR101990648B1 (enExample) |
| CN (2) | CN103447939B (enExample) |
| TW (2) | TWI620618B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI819138B (zh) * | 2018-12-21 | 2023-10-21 | 日商荏原製作所股份有限公司 | 研磨裝置及研磨構件的修整方法 |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE112012002493T8 (de) * | 2011-06-29 | 2014-06-12 | Shin-Etsu Handotai Co., Ltd. | Polierkopf und Poliervorrichtung |
| US9199354B2 (en) * | 2012-10-29 | 2015-12-01 | Wayne O. Duescher | Flexible diaphragm post-type floating and rigid abrading workholder |
| JP6121795B2 (ja) | 2013-05-15 | 2017-04-26 | 株式会社荏原製作所 | ドレッシング装置、該ドレッシング装置を備えた研磨装置、および研磨方法 |
| JP6232297B2 (ja) | 2014-01-21 | 2017-11-15 | 株式会社荏原製作所 | 基板保持装置および研磨装置 |
| JP6344950B2 (ja) * | 2014-03-31 | 2018-06-20 | 株式会社荏原製作所 | 研磨装置及び研磨方法 |
| JP6445924B2 (ja) * | 2014-05-14 | 2018-12-26 | 株式会社荏原製作所 | 研磨装置 |
| TWI656944B (zh) * | 2014-05-14 | 2019-04-21 | 日商荏原製作所股份有限公司 | 研磨裝置 |
| JP2015217445A (ja) * | 2014-05-14 | 2015-12-07 | 株式会社荏原製作所 | 研磨装置 |
| JP6181622B2 (ja) * | 2014-09-17 | 2017-08-16 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
| KR102181101B1 (ko) * | 2014-09-23 | 2020-11-23 | 주식회사 케이씨텍 | 화학 기계적 연마 장치용 캐리어 헤드 |
| JP6592355B2 (ja) * | 2015-01-30 | 2019-10-16 | 株式会社荏原製作所 | 連結機構および基板研磨装置 |
| JP6449194B2 (ja) * | 2015-05-25 | 2019-01-09 | 株式会社荏原製作所 | 研磨装置、研磨ヘッド、およびリテーナリング |
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| JP6394569B2 (ja) * | 2015-11-06 | 2018-09-26 | 信越半導体株式会社 | ウェーハの研磨方法及び研磨装置 |
| KR102424495B1 (ko) * | 2015-11-09 | 2022-07-26 | 주식회사 케이씨텍 | 화학 기계적 연마 장치용 연마 헤드 |
| US10428425B2 (en) * | 2016-01-26 | 2019-10-01 | Tokyo Electron Limited | Film deposition apparatus, method of depositing film, and non-transitory computer-readable recording medium |
| JP6625442B2 (ja) * | 2016-02-08 | 2019-12-25 | 株式会社ディスコ | 研磨装置 |
| JP6508123B2 (ja) | 2016-05-13 | 2019-05-08 | 信越半導体株式会社 | テンプレートアセンブリの選別方法及びワークの研磨方法並びにテンプレートアセンブリ |
| KR102642988B1 (ko) * | 2016-11-09 | 2024-03-06 | 삼성디스플레이 주식회사 | 기판 연마 장치 및 방법 |
| JP6927560B2 (ja) * | 2017-01-10 | 2021-09-01 | 不二越機械工業株式会社 | ワーク研磨ヘッド |
| JP6823541B2 (ja) | 2017-05-30 | 2021-02-03 | 株式会社荏原製作所 | キャリブレーション方法およびキャリブレーションプログラム |
| KR102352534B1 (ko) * | 2017-09-13 | 2022-01-19 | 캐논 세미컨덕터 이큅먼트 가부시키가이샤 | 가공 장치 |
| CN107717718B (zh) * | 2017-09-29 | 2019-05-31 | 清华大学 | 化学机械抛光设备及其操作方法 |
| JP7287761B2 (ja) * | 2018-07-31 | 2023-06-06 | 株式会社荏原製作所 | 球面軸受の軸受半径決定方法 |
| CN109406555B (zh) * | 2018-10-15 | 2021-12-07 | 上海华力微电子有限公司 | 一种样品去层次方法 |
| KR102627543B1 (ko) * | 2018-11-07 | 2024-01-24 | 주식회사 케이씨텍 | 기판 캐리어 및 이를 포함하는 기판 연마 장치 |
| KR102599888B1 (ko) * | 2018-12-06 | 2023-11-08 | 주식회사 케이씨텍 | 기판 캐리어 및 이를 포함하는 기판 연마 장치 |
| JP7178259B2 (ja) * | 2018-12-27 | 2022-11-25 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
| JP7049984B2 (ja) | 2018-12-27 | 2022-04-07 | 株式会社荏原製作所 | 研磨装置および静止リングの傾きを制御する方法 |
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| US11691241B1 (en) * | 2019-08-05 | 2023-07-04 | Keltech Engineering, Inc. | Abrasive lapping head with floating and rigid workpiece carrier |
| US11623320B2 (en) | 2019-08-21 | 2023-04-11 | Applied Materials, Inc. | Polishing head with membrane position control |
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| US11511390B2 (en) * | 2019-08-30 | 2022-11-29 | Applied Materials, Inc. | Pivotable substrate retaining ring |
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| KR102719957B1 (ko) * | 2020-07-08 | 2024-10-22 | 어플라이드 머티어리얼스, 인코포레이티드 | 다치형, 자기 제어 리테이닝 링 |
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| US20240066658A1 (en) | 2022-08-31 | 2024-02-29 | Ebara Corporation | Polishing head system and polishing method |
| US20240231220A9 (en) * | 2022-10-24 | 2024-07-11 | Canon Kabushiki Kaisha | Planarization process, apparatus and method of manufacturing an article |
| CN115502882B (zh) * | 2022-10-27 | 2025-06-17 | 华海清科股份有限公司 | 一种用于化学机械抛光的承载头和化学机械抛光设备 |
| CN119369284B (zh) * | 2024-12-05 | 2025-10-10 | 西安奕斯伟材料科技股份有限公司 | 一种研磨设备 |
| CN119704044B (zh) * | 2024-12-31 | 2025-10-24 | 华海清科股份有限公司 | 保持环修整装置、化学机械抛光单元及其控制方法和化学机械抛光设备 |
| CN120190703B (zh) * | 2025-05-26 | 2025-09-26 | 北京特思迪半导体设备有限公司 | 上研磨抛光盘系统 |
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Also Published As
| Publication number | Publication date |
|---|---|
| KR20190071646A (ko) | 2019-06-24 |
| EP2700474A3 (en) | 2017-10-18 |
| JP2016196086A (ja) | 2016-11-24 |
| TWI602649B (zh) | 2017-10-21 |
| JP6154944B2 (ja) | 2017-06-28 |
| KR102225140B1 (ko) | 2021-03-09 |
| EP3950227B1 (en) | 2025-11-19 |
| EP2700474A2 (en) | 2014-02-26 |
| US20130324012A1 (en) | 2013-12-05 |
| EP3954502B1 (en) | 2024-11-13 |
| EP3950227A1 (en) | 2022-02-09 |
| EP4663345A2 (en) | 2025-12-17 |
| CN107962492A (zh) | 2018-04-27 |
| JP2014004675A (ja) | 2014-01-16 |
| CN103447939A (zh) | 2013-12-18 |
| TW201410382A (zh) | 2014-03-16 |
| EP3954502A1 (en) | 2022-02-16 |
| CN103447939B (zh) | 2018-01-23 |
| EP2700474B1 (en) | 2021-10-27 |
| KR20130135086A (ko) | 2013-12-10 |
| KR101990648B1 (ko) | 2019-06-18 |
| CN107962492B (zh) | 2019-09-27 |
| TW201808532A (zh) | 2018-03-16 |
| US9403255B2 (en) | 2016-08-02 |
| JP5976522B2 (ja) | 2016-08-23 |
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