TWI610346B - 製造半導體裝置的方法、基板處理設備、及記錄媒體 - Google Patents
製造半導體裝置的方法、基板處理設備、及記錄媒體 Download PDFInfo
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- TWI610346B TWI610346B TW104142479A TW104142479A TWI610346B TW I610346 B TWI610346 B TW I610346B TW 104142479 A TW104142479 A TW 104142479A TW 104142479 A TW104142479 A TW 104142479A TW I610346 B TWI610346 B TW I610346B
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/36—Carbonitrides
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C16/45534—Use of auxiliary reactants other than used for contributing to the composition of the main film, e.g. catalysts, activators or scavengers
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- H01L21/02337—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment by exposure to a gas or vapour
- H01L21/0234—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment by exposure to a gas or vapour treatment by exposure to a plasma
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
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- Metallurgy (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Inorganic Chemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013186482A JP5788448B2 (ja) | 2013-09-09 | 2013-09-09 | 半導体装置の製造方法、基板処理装置及びプログラム |
| JP2013-186482 | 2013-09-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201611100A TW201611100A (zh) | 2016-03-16 |
| TWI610346B true TWI610346B (zh) | 2018-01-01 |
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Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103111746A TWI524389B (zh) | 2013-09-09 | 2014-03-28 | 製造半導體裝置的方法、基板處理設備、及記錄媒體 |
| TW104142479A TWI610346B (zh) | 2013-09-09 | 2014-03-28 | 製造半導體裝置的方法、基板處理設備、及記錄媒體 |
Family Applications Before (1)
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI783238B (zh) * | 2019-06-27 | 2022-11-11 | 日商國際電氣股份有限公司 | 隔熱構造體、基板處理裝置及半導體裝置之製造方法 |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5384291B2 (ja) * | 2008-11-26 | 2014-01-08 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法及び基板処理装置 |
| JP6524753B2 (ja) * | 2015-03-30 | 2019-06-05 | 東京エレクトロン株式会社 | プラズマ処理装置、プラズマ処理方法及び記憶媒体 |
| JP6479560B2 (ja) * | 2015-05-01 | 2019-03-06 | 東京エレクトロン株式会社 | 成膜装置 |
| KR102412614B1 (ko) * | 2015-10-22 | 2022-06-23 | 삼성전자주식회사 | 물질막, 이를 포함하는 반도체 소자, 및 이들의 제조 방법 |
| US9786491B2 (en) | 2015-11-12 | 2017-10-10 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
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| US20180033614A1 (en) * | 2016-07-27 | 2018-02-01 | Versum Materials Us, Llc | Compositions and Methods Using Same for Carbon Doped Silicon Containing Films |
| CN106282967B (zh) * | 2016-08-23 | 2019-03-26 | 深圳市国创新能源研究院 | 一种制备SiO/C复合材料的设备 |
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| JP6602332B2 (ja) * | 2017-03-28 | 2019-11-06 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
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| JP6980624B2 (ja) * | 2018-09-13 | 2021-12-15 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
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| JP7072012B2 (ja) | 2020-02-27 | 2022-05-19 | 株式会社Kokusai Electric | 基板処理方法、半導体装置の製造方法、基板処理装置、及びプログラム |
| TWI867267B (zh) * | 2021-02-24 | 2024-12-21 | 日商國際電氣股份有限公司 | 基板處理裝置、半導體裝置之製造方法、程式及排氣系統 |
| KR20240119078A (ko) * | 2021-12-24 | 2024-08-06 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 방법, 반도체 장치의 제조 방법, 기판 처리 장치, 및 프로그램 |
| JP7462065B2 (ja) * | 2022-03-29 | 2024-04-04 | 株式会社Kokusai Electric | 基板処理方法、半導体装置の製造方法、プログラム、および基板処理装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201137951A (en) * | 2009-09-28 | 2011-11-01 | Hitachi Int Electric Inc | Manufacturing method of semiconductor device and substrate processing apparatus |
| CN103168344A (zh) * | 2010-11-03 | 2013-06-19 | 应用材料公司 | 用于沉积碳化硅和碳氮化硅膜的设备和方法 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4001960B2 (ja) * | 1995-11-03 | 2007-10-31 | フリースケール セミコンダクター インコーポレイテッド | 窒化酸化物誘電体層を有する半導体素子の製造方法 |
| US6087229A (en) * | 1998-03-09 | 2000-07-11 | Lsi Logic Corporation | Composite semiconductor gate dielectrics |
| KR100505668B1 (ko) | 2002-07-08 | 2005-08-03 | 삼성전자주식회사 | 원자층 증착 방법에 의한 실리콘 산화막 형성 방법 |
| US7084076B2 (en) | 2003-02-27 | 2006-08-01 | Samsung Electronics, Co., Ltd. | Method for forming silicon dioxide film using siloxane |
| KR100564609B1 (ko) | 2003-02-27 | 2006-03-29 | 삼성전자주식회사 | 실록산 화합물을 이용한 이산화실리콘막 형성 방법 |
| US20050268848A1 (en) * | 2004-04-28 | 2005-12-08 | Nanodynamics, Inc | Atomic layer deposition apparatus and process |
| JP4607637B2 (ja) * | 2005-03-28 | 2011-01-05 | 東京エレクトロン株式会社 | シリコン窒化膜の形成方法、シリコン窒化膜の形成装置及びプログラム |
| JP2008071894A (ja) | 2006-09-13 | 2008-03-27 | Tokyo Electron Ltd | 成膜方法 |
| JP2009206312A (ja) | 2008-02-28 | 2009-09-10 | Mitsui Eng & Shipbuild Co Ltd | 成膜方法および成膜装置 |
| JP5384852B2 (ja) * | 2008-05-09 | 2014-01-08 | 株式会社日立国際電気 | 半導体装置の製造方法及び半導体製造装置 |
| JP5384291B2 (ja) | 2008-11-26 | 2014-01-08 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法及び基板処理装置 |
| JP5421736B2 (ja) | 2009-11-13 | 2014-02-19 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、及びプログラム |
| JP5374638B2 (ja) | 2010-04-09 | 2013-12-25 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法および基板処理装置 |
| US8329599B2 (en) | 2011-02-18 | 2012-12-11 | Asm Japan K.K. | Method of depositing dielectric film by ALD using precursor containing silicon, hydrocarbon, and halogen |
| JP5722450B2 (ja) | 2011-08-25 | 2015-05-20 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置および記録媒体 |
| US8569184B2 (en) * | 2011-09-30 | 2013-10-29 | Asm Japan K.K. | Method for forming single-phase multi-element film by PEALD |
| JP6049395B2 (ja) * | 2011-12-09 | 2016-12-21 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| US9643844B2 (en) | 2013-03-01 | 2017-05-09 | Applied Materials, Inc. | Low temperature atomic layer deposition of films comprising SiCN or SiCON |
| US20140273524A1 (en) | 2013-03-12 | 2014-09-18 | Victor Nguyen | Plasma Doping Of Silicon-Containing Films |
| JP6155063B2 (ja) * | 2013-03-19 | 2017-06-28 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置及びプログラム |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201137951A (en) * | 2009-09-28 | 2011-11-01 | Hitachi Int Electric Inc | Manufacturing method of semiconductor device and substrate processing apparatus |
| CN103168344A (zh) * | 2010-11-03 | 2013-06-19 | 应用材料公司 | 用于沉积碳化硅和碳氮化硅膜的设备和方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI783238B (zh) * | 2019-06-27 | 2022-11-11 | 日商國際電氣股份有限公司 | 隔熱構造體、基板處理裝置及半導體裝置之製造方法 |
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| TWI524389B (zh) | 2016-03-01 |
| TW201611100A (zh) | 2016-03-16 |
| JP2015053445A (ja) | 2015-03-19 |
| TW201511088A (zh) | 2015-03-16 |
| KR101670182B1 (ko) | 2016-10-27 |
| US20150332916A1 (en) | 2015-11-19 |
| CN104425313A (zh) | 2015-03-18 |
| KR20150099501A (ko) | 2015-08-31 |
| CN104425313B (zh) | 2017-12-05 |
| US9793107B2 (en) | 2017-10-17 |
| US9698007B2 (en) | 2017-07-04 |
| KR101624395B1 (ko) | 2016-05-25 |
| JP5788448B2 (ja) | 2015-09-30 |
| KR20150029517A (ko) | 2015-03-18 |
| US20150072537A1 (en) | 2015-03-12 |
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