TWI588225B - 半導體裝置製造用暫時接著劑、以及使用其的接著性支持體及半導體裝置的製造方法 - Google Patents

半導體裝置製造用暫時接著劑、以及使用其的接著性支持體及半導體裝置的製造方法 Download PDF

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Publication number
TWI588225B
TWI588225B TW102134654A TW102134654A TWI588225B TW I588225 B TWI588225 B TW I588225B TW 102134654 A TW102134654 A TW 102134654A TW 102134654 A TW102134654 A TW 102134654A TW I588225 B TWI588225 B TW I588225B
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group
adhesive
semiconductor device
compound
polymer compound
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TW102134654A
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Chinese (zh)
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TW201418390A (zh
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岩井悠
小山一郎
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富士軟片股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J4/00Adhesives based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; adhesives, based on monomers of macromolecular compounds of groups C09J183/00 - C09J183/16
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J101/00Adhesives based on cellulose, modified cellulose, or cellulose derivatives
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J101/00Adhesives based on cellulose, modified cellulose, or cellulose derivatives
    • C09J101/08Cellulose derivatives
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J101/00Adhesives based on cellulose, modified cellulose, or cellulose derivatives
    • C09J101/08Cellulose derivatives
    • C09J101/10Esters of organic acids
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J101/00Adhesives based on cellulose, modified cellulose, or cellulose derivatives
    • C09J101/08Cellulose derivatives
    • C09J101/10Esters of organic acids
    • C09J101/12Cellulose acetate
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J101/00Adhesives based on cellulose, modified cellulose, or cellulose derivatives
    • C09J101/08Cellulose derivatives
    • C09J101/10Esters of organic acids
    • C09J101/14Mixed esters, e.g. cellulose acetate-butyrate
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J101/00Adhesives based on cellulose, modified cellulose, or cellulose derivatives
    • C09J101/08Cellulose derivatives
    • C09J101/26Cellulose ethers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J125/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring; Adhesives based on derivatives of such polymers
    • C09J125/02Homopolymers or copolymers of hydrocarbons
    • C09J125/04Homopolymers or copolymers of styrene
    • C09J125/06Polystyrene
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J201/00Adhesives based on unspecified macromolecular compounds
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/20Dry etching; Plasma etching; Reactive-ion etching
    • H10P50/28Dry etching; Plasma etching; Reactive-ion etching of insulating materials
    • H10P50/286Dry etching; Plasma etching; Reactive-ion etching of insulating materials of organic materials
    • H10P50/287Dry etching; Plasma etching; Reactive-ion etching of insulating materials of organic materials by chemical means
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices
    • H10P52/40Chemomechanical polishing [CMP]
    • H10P52/402Chemomechanical polishing [CMP] of semiconductor materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7402Wafer tapes, e.g. grinding or dicing support tapes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7412Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7416Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7422Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used to protect an active side of a device or wafer
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/744Details of chemical or physical process used for separating the auxiliary support from a device or a wafer
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/28Web or sheet containing structurally defined element or component and having an adhesive outermost layer

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Polymerisation Methods In General (AREA)
  • Graft Or Block Polymers (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
TW102134654A 2012-09-28 2013-09-26 半導體裝置製造用暫時接著劑、以及使用其的接著性支持體及半導體裝置的製造方法 TWI588225B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012218585 2012-09-28
JP2013097784A JP5909460B2 (ja) 2012-09-28 2013-05-07 半導体装置製造用仮接着剤、並びに、それを用いた接着性支持体、及び、半導体装置の製造方法。

Publications (2)

Publication Number Publication Date
TW201418390A TW201418390A (zh) 2014-05-16
TWI588225B true TWI588225B (zh) 2017-06-21

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TW102134654A TWI588225B (zh) 2012-09-28 2013-09-26 半導體裝置製造用暫時接著劑、以及使用其的接著性支持體及半導體裝置的製造方法

Country Status (5)

Country Link
US (1) US20150184032A1 (https=)
JP (1) JP5909460B2 (https=)
KR (1) KR101678873B1 (https=)
TW (1) TWI588225B (https=)
WO (1) WO2014050455A1 (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9496164B2 (en) * 2014-01-07 2016-11-15 Brewer Science Inc. Cyclic olefin polymer compositions and polysiloxane release layers for use in temporary wafer bonding processes
US9865490B2 (en) * 2014-01-07 2018-01-09 Brewer Science Inc. Cyclic olefin polymer compositions and polysiloxane release layers for use in temporary wafer bonding processes
JP6330346B2 (ja) * 2014-01-29 2018-05-30 日立化成株式会社 接着剤組成物、接着剤組成物を用いた電子部材、及び半導体装置の製造方法
JP5678228B1 (ja) * 2014-06-27 2015-02-25 積水化学工業株式会社 回路基板の処理方法及び硬化型接着剤組成物
JP2016044222A (ja) * 2014-08-21 2016-04-04 日立化成株式会社 接着剤組成物及び接続構造体
CN104559852B (zh) * 2014-12-31 2018-02-27 深圳市化讯半导体材料有限公司 一种用于薄晶圆加工的临时键合胶及其制备方法
KR102021302B1 (ko) * 2015-05-08 2019-09-16 후지필름 가부시키가이샤 디바이스 기판 및 반도체 디바이스의 제조 방법
MX2018006900A (es) * 2015-12-07 2018-09-06 Acetate Int Llc Composiciones de relleno de madera de acetato de celulosa.
TWI627251B (zh) * 2017-04-10 2018-06-21 台虹科技股份有限公司 暫時性接著用組成物、暫時性接著用溶液以及暫時性接著用膜材
WO2019106846A1 (ja) * 2017-12-01 2019-06-06 日立化成株式会社 半導体装置の製造方法、仮固定材用樹脂組成物、及び仮固定材用積層フィルム
KR102470448B1 (ko) * 2017-12-15 2022-11-24 주식회사 엘지화학 의류용 수성 아크릴계 점착제 및 이의 제조 방법
JP2019026851A (ja) * 2018-09-19 2019-02-21 日立化成株式会社 接着剤組成物及び接続構造体
US20210353302A1 (en) * 2018-11-02 2021-11-18 Zeon Corporation Fixing member and laminated body
JP2020111760A (ja) * 2020-04-07 2020-07-27 日立化成株式会社 接着剤組成物及び接続構造体
US11996384B2 (en) 2020-12-15 2024-05-28 Pulseforge, Inc. Method and apparatus for debonding temporarily bonded wafers in wafer-level packaging applications

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200714686A (en) * 2005-07-04 2007-04-16 Denki Kagaku Kogyo Kk Curable composition and method for temporal fixation of structural member using the same
TW200801155A (en) * 2006-05-12 2008-01-01 Nitto Denko Corp Pressure-sensitive adhesive sheet and method for processing semiconductor wafer or semiconductor substrate

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3483161B2 (ja) 1994-08-11 2004-01-06 リンテック株式会社 粘接着テープおよびその使用方法
JP3146888B2 (ja) 1994-10-31 2001-03-19 松下電器産業株式会社 電子部品の仮止め用ボンド
JP4072927B2 (ja) * 1997-08-28 2008-04-09 リンテック株式会社 エネルギー線硬化型親水性粘着剤組成物およびその利用方法
US20040248382A1 (en) * 2001-08-03 2004-12-09 Munehiro Hatai Pressure sensitive adhesive double coated tape and method for producing ic chip using it
JP4485165B2 (ja) 2002-10-22 2010-06-16 株式会社クラレ 粘・接着剤組成物
US6920159B2 (en) * 2002-11-29 2005-07-19 Optitune Plc Tunable optical source
JP2007291394A (ja) * 2004-05-31 2007-11-08 Sumitomo Bakelite Co Ltd 樹脂組成物、接着フィルムおよび樹脂ワニス
US8187411B2 (en) * 2005-03-18 2012-05-29 Denki Kagaku Kogyo Kabushiki Kaisha Adherent composition and method of temporarily fixing member therewith
JP4643360B2 (ja) 2005-05-24 2011-03-02 株式会社イーテック 粘着性樹脂組成物、並びに粘着シートおよびその製造方法
JP2007045939A (ja) 2005-08-10 2007-02-22 Jsr Corp 粘着フィルムの粘着力低減方法
US8911583B2 (en) 2006-03-01 2014-12-16 Thin Materials Ag Method for processing, in particular, thin rear sides of a wafer, wafer-carrier arrangement and method for producing said type of wafer-carrier arrangement
KR101073153B1 (ko) * 2006-08-10 2011-10-12 덴끼 가가꾸 고교 가부시키가이샤 접착성 조성물 및 그것을 이용한 부재의 가고정 방법
JP2008063463A (ja) 2006-09-07 2008-03-21 Tokyo Ohka Kogyo Co Ltd 接着剤組成物、接着フィルム及び当該接着剤組成物の製造方法
JP2008063464A (ja) 2006-09-07 2008-03-21 Tokyo Ohka Kogyo Co Ltd 接着剤組成物、接着フィルム及び当該接着剤組成物の製造方法
US20080200011A1 (en) 2006-10-06 2008-08-21 Pillalamarri Sunil K High-temperature, spin-on, bonding compositions for temporary wafer bonding using sliding approach
KR100773634B1 (ko) * 2006-10-26 2007-11-05 제일모직주식회사 아크릴 바인더 수지조성물를 포함하는 광경화형 점착조성물및 이를 이용한 점착테이프
JP5016296B2 (ja) 2006-11-22 2012-09-05 東京応化工業株式会社 接着剤組成物、及び接着フィルム
JP4976829B2 (ja) 2006-11-29 2012-07-18 東京応化工業株式会社 接着剤組成物、及び接着フィルム
JP2009185197A (ja) 2008-02-07 2009-08-20 Tokyo Ohka Kogyo Co Ltd 接着剤組成物及びその利用、並びに接着剤組成物の製造方法
JP5499454B2 (ja) * 2008-03-11 2014-05-21 日立化成株式会社 感光性接着剤組成物、接着シート、接着剤パターン、接着剤層付半導体ウェハ、並びに半導体装置及びその製造方法
JP5497276B2 (ja) * 2008-07-08 2014-05-21 東京応化工業株式会社 接着剤組成物の製造方法
JP4920097B2 (ja) * 2009-06-01 2012-04-18 アイカ工業株式会社 接着剤組成物
TWI479259B (zh) 2009-06-15 2015-04-01 住友電木股份有限公司 A temporary fixing agent for a semiconductor wafer, and a method of manufacturing the semiconductor device using the same
JP2011052142A (ja) 2009-09-03 2011-03-17 Jsr Corp 接着剤組成物、それを用いた基材の加工または移動方法および半導体素子
JP5010668B2 (ja) 2009-12-03 2012-08-29 信越化学工業株式会社 積層型半導体集積装置の製造方法
JP5691538B2 (ja) 2010-04-02 2015-04-01 Jsr株式会社 仮固定用組成物、仮固定材、基材の処理方法、および半導体素子
JP5674332B2 (ja) * 2010-04-14 2015-02-25 電気化学工業株式会社 接着剤組成物及びそれを用いた部材の仮固定方法
JP5624908B2 (ja) * 2010-08-09 2014-11-12 東京応化工業株式会社 接着剤組成物
JP5545239B2 (ja) * 2011-02-21 2014-07-09 Jnc株式会社 接着した部材からの光硬化性接着剤の除去方法、及び二部材の接着方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200714686A (en) * 2005-07-04 2007-04-16 Denki Kagaku Kogyo Kk Curable composition and method for temporal fixation of structural member using the same
TW200801155A (en) * 2006-05-12 2008-01-01 Nitto Denko Corp Pressure-sensitive adhesive sheet and method for processing semiconductor wafer or semiconductor substrate

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Publication number Publication date
US20150184032A1 (en) 2015-07-02
TW201418390A (zh) 2014-05-16
KR20150047535A (ko) 2015-05-04
JP2014080570A (ja) 2014-05-08
KR101678873B1 (ko) 2016-11-23
WO2014050455A1 (ja) 2014-04-03
JP5909460B2 (ja) 2016-04-26

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