TWI421508B - Power supply voltage reduction detection circuit - Google Patents

Power supply voltage reduction detection circuit Download PDF

Info

Publication number
TWI421508B
TWI421508B TW097130437A TW97130437A TWI421508B TW I421508 B TWI421508 B TW I421508B TW 097130437 A TW097130437 A TW 097130437A TW 97130437 A TW97130437 A TW 97130437A TW I421508 B TWI421508 B TW I421508B
Authority
TW
Taiwan
Prior art keywords
voltage
power supply
nmos transistor
transistor
supply voltage
Prior art date
Application number
TW097130437A
Other languages
English (en)
Chinese (zh)
Other versions
TW200921115A (en
Inventor
Fumiyasu Utsunomiya
Original Assignee
Seiko Instr Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instr Inc filed Critical Seiko Instr Inc
Publication of TW200921115A publication Critical patent/TW200921115A/zh
Application granted granted Critical
Publication of TWI421508B publication Critical patent/TWI421508B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
    • H03K17/223—Modifications for ensuring a predetermined initial state when the supply voltage has been applied in field-effect transistor switches
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)
  • Electronic Switches (AREA)
  • Measurement Of Current Or Voltage (AREA)
TW097130437A 2007-08-10 2008-08-08 Power supply voltage reduction detection circuit TWI421508B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007209106 2007-08-10
JP2008201662A JP5203086B2 (ja) 2007-08-10 2008-08-05 電源電圧低下検出回路

Publications (2)

Publication Number Publication Date
TW200921115A TW200921115A (en) 2009-05-16
TWI421508B true TWI421508B (zh) 2014-01-01

Family

ID=40390355

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097130437A TWI421508B (zh) 2007-08-10 2008-08-08 Power supply voltage reduction detection circuit

Country Status (4)

Country Link
JP (1) JP5203086B2 (ja)
KR (1) KR101444465B1 (ja)
CN (1) CN101363878B (ja)
TW (1) TWI421508B (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6619145B2 (ja) * 2014-11-11 2019-12-11 ラピスセミコンダクタ株式会社 半導体回路、電圧検出回路、及び電圧判定回路
CN106249034B (zh) * 2016-08-15 2018-10-02 北京航空航天大学 一种用于协同动态电压频率调整系统的片上电压降报警器
JP7325352B2 (ja) * 2020-02-07 2023-08-14 エイブリック株式会社 基準電圧回路
CN113406509B (zh) * 2021-06-11 2022-05-10 浙江今日阳光新能源车业有限公司 电动车电量显示方法、电动车仪表及计算机存储介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW591800B (en) * 2001-09-13 2004-06-11 Toshiba Corp Constant voltage generation circuit and semiconductor memory device
JP2005278056A (ja) * 2004-03-26 2005-10-06 Matsushita Electric Ind Co Ltd 電源電圧低下検出回路
TW200615732A (en) * 2004-07-05 2006-05-16 Seiko Instr Inc Voltage regulator
US20060261860A1 (en) * 2005-05-17 2006-11-23 Fuji Electric Device Technology Co., Ltd. DC to DC converter and voltage detecting circuit and current detecting circuit thereof

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5888450U (ja) * 1981-12-10 1983-06-15 リコーエレメックス株式会社 イニシヤルリセツト回路
JPH0619686B2 (ja) * 1983-08-29 1994-03-16 日本電信電話株式会社 電源回路
JPS6111839A (ja) * 1984-06-26 1986-01-20 Ricoh Co Ltd パワ−オン・イニシヤライズ回路
JP2972245B2 (ja) * 1989-11-29 1999-11-08 株式会社日立製作所 電圧検出機能付基準電圧出力回路
JPH03218064A (ja) * 1990-01-23 1991-09-25 Sharp Corp 半導体集積回路装置
JP3077072B2 (ja) * 1992-07-14 2000-08-14 三機工業株式会社 廃棄物の管路輸送方法
KR970075931A (ko) * 1996-05-16 1997-12-10 김광호 프로그램어블 저전압검출회로
US5838191A (en) * 1997-02-21 1998-11-17 National Semiconductor Corporation Bias circuit for switched capacitor applications
JP3806011B2 (ja) * 2001-10-05 2006-08-09 セイコーインスツル株式会社 電圧検出回路
JP2005191821A (ja) * 2003-12-25 2005-07-14 Seiko Epson Corp コンパレータ回路及び電源回路
JP2006112906A (ja) * 2004-10-14 2006-04-27 Sanyo Electric Co Ltd 電圧検出回路
US7161861B2 (en) * 2004-11-15 2007-01-09 Infineon Technologies Ag Sense amplifier bitline boost circuit
JP4562638B2 (ja) * 2005-10-27 2010-10-13 三洋電機株式会社 低電圧検出回路

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW591800B (en) * 2001-09-13 2004-06-11 Toshiba Corp Constant voltage generation circuit and semiconductor memory device
JP2005278056A (ja) * 2004-03-26 2005-10-06 Matsushita Electric Ind Co Ltd 電源電圧低下検出回路
TW200615732A (en) * 2004-07-05 2006-05-16 Seiko Instr Inc Voltage regulator
US20060261860A1 (en) * 2005-05-17 2006-11-23 Fuji Electric Device Technology Co., Ltd. DC to DC converter and voltage detecting circuit and current detecting circuit thereof

Also Published As

Publication number Publication date
CN101363878A (zh) 2009-02-11
TW200921115A (en) 2009-05-16
JP5203086B2 (ja) 2013-06-05
CN101363878B (zh) 2012-12-26
KR101444465B1 (ko) 2014-09-24
JP2009065649A (ja) 2009-03-26
KR20090016410A (ko) 2009-02-13

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees