TWI401825B - 發光二極體晶片的固晶方法及固晶完成之發光二極體 - Google Patents
發光二極體晶片的固晶方法及固晶完成之發光二極體 Download PDFInfo
- Publication number
- TWI401825B TWI401825B TW098140702A TW98140702A TWI401825B TW I401825 B TWI401825 B TW I401825B TW 098140702 A TW098140702 A TW 098140702A TW 98140702 A TW98140702 A TW 98140702A TW I401825 B TWI401825 B TW I401825B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- metal
- intermetallic
- film layer
- thin film
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 62
- 239000000463 material Substances 0.000 claims description 97
- 229910052751 metal Inorganic materials 0.000 claims description 97
- 239000002184 metal Substances 0.000 claims description 97
- 239000007787 solid Substances 0.000 claims description 84
- 239000013078 crystal Substances 0.000 claims description 71
- 239000010409 thin film Substances 0.000 claims description 54
- 238000006243 chemical reaction Methods 0.000 claims description 46
- 238000007711 solidification Methods 0.000 claims description 37
- 230000008023 solidification Effects 0.000 claims description 37
- 230000008018 melting Effects 0.000 claims description 32
- 238000002844 melting Methods 0.000 claims description 32
- 239000000758 substrate Substances 0.000 claims description 29
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 28
- 239000010931 gold Substances 0.000 claims description 24
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 19
- 229910052737 gold Inorganic materials 0.000 claims description 18
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 17
- 239000010949 copper Substances 0.000 claims description 17
- 238000010438 heat treatment Methods 0.000 claims description 16
- 229910052709 silver Inorganic materials 0.000 claims description 15
- 239000004332 silver Substances 0.000 claims description 15
- 239000010408 film Substances 0.000 claims description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 10
- 229910052802 copper Inorganic materials 0.000 claims description 10
- 229910052759 nickel Inorganic materials 0.000 claims description 10
- QCEUXSAXTBNJGO-UHFFFAOYSA-N [Ag].[Sn] Chemical compound [Ag].[Sn] QCEUXSAXTBNJGO-UHFFFAOYSA-N 0.000 claims description 5
- ZWNQSJPQMSUVSE-UHFFFAOYSA-N [Cu].[Sn].[In] Chemical group [Cu].[Sn].[In] ZWNQSJPQMSUVSE-UHFFFAOYSA-N 0.000 claims description 5
- FLMNRCQDVMYICV-UHFFFAOYSA-N [Ni].[Sn].[In] Chemical compound [Ni].[Sn].[In] FLMNRCQDVMYICV-UHFFFAOYSA-N 0.000 claims description 5
- GPYPVKIFOKLUGD-UHFFFAOYSA-N gold indium Chemical compound [In].[Au] GPYPVKIFOKLUGD-UHFFFAOYSA-N 0.000 claims description 5
- YZASAXHKAQYPEH-UHFFFAOYSA-N indium silver Chemical compound [Ag].[In] YZASAXHKAQYPEH-UHFFFAOYSA-N 0.000 claims description 5
- FEBJSGQWYJIENF-UHFFFAOYSA-N nickel niobium Chemical compound [Ni].[Nb] FEBJSGQWYJIENF-UHFFFAOYSA-N 0.000 claims description 5
- 229910052718 tin Inorganic materials 0.000 claims description 5
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 4
- 229910052738 indium Inorganic materials 0.000 claims description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 4
- 229910052758 niobium Inorganic materials 0.000 claims description 4
- 239000010955 niobium Substances 0.000 claims description 4
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 4
- WGCXSIWGFOQDEG-UHFFFAOYSA-N [Zn].[Sn].[In] Chemical compound [Zn].[Sn].[In] WGCXSIWGFOQDEG-UHFFFAOYSA-N 0.000 claims description 3
- BRMNETVQNQAIKC-UHFFFAOYSA-N [Sn].[In].[Sb] Chemical compound [Sn].[In].[Sb] BRMNETVQNQAIKC-UHFFFAOYSA-N 0.000 claims description 2
- 229910052797 bismuth Inorganic materials 0.000 claims description 2
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 2
- MPZNMEBSWMRGFG-UHFFFAOYSA-N bismuth indium Chemical compound [In].[Bi] MPZNMEBSWMRGFG-UHFFFAOYSA-N 0.000 claims description 2
- AOIFZSXPSAQABB-UHFFFAOYSA-N [In].[Zn].[In] Chemical compound [In].[Zn].[In] AOIFZSXPSAQABB-UHFFFAOYSA-N 0.000 claims 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 claims 1
- 229910045601 alloy Inorganic materials 0.000 description 7
- 239000000956 alloy Substances 0.000 description 7
- 230000005496 eutectics Effects 0.000 description 6
- 230000008646 thermal stress Effects 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910016334 Bi—In Inorganic materials 0.000 description 3
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 3
- PSMFTUMUGZHOOU-UHFFFAOYSA-N [In].[Sn].[Bi] Chemical compound [In].[Sn].[Bi] PSMFTUMUGZHOOU-UHFFFAOYSA-N 0.000 description 3
- 238000005275 alloying Methods 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 229910002601 GaN Inorganic materials 0.000 description 2
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 2
- AJGDITRVXRPLBY-UHFFFAOYSA-N aluminum indium Chemical compound [Al].[In] AJGDITRVXRPLBY-UHFFFAOYSA-N 0.000 description 2
- NWAIGJYBQQYSPW-UHFFFAOYSA-N azanylidyneindigane Chemical compound [In]#N NWAIGJYBQQYSPW-UHFFFAOYSA-N 0.000 description 2
- 239000002178 crystalline material Substances 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 238000004093 laser heating Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 239000002861 polymer material Substances 0.000 description 2
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 229910005540 GaP Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 229910001128 Sn alloy Inorganic materials 0.000 description 1
- 229910020994 Sn-Zn Inorganic materials 0.000 description 1
- 229910009069 Sn—Zn Inorganic materials 0.000 description 1
- ONHLADAAONREIV-UHFFFAOYSA-N [In].[Sn].[In] Chemical compound [In].[Sn].[In] ONHLADAAONREIV-UHFFFAOYSA-N 0.000 description 1
- NABLVPQEFBPJDZ-UHFFFAOYSA-N [Sn].[In].[Sn] Chemical compound [Sn].[In].[Sn] NABLVPQEFBPJDZ-UHFFFAOYSA-N 0.000 description 1
- OEKXFBZCRGGRTO-UHFFFAOYSA-N [Zn].[Sb].[In] Chemical compound [Zn].[Sb].[In] OEKXFBZCRGGRTO-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- QYHNIMDZIYANJH-UHFFFAOYSA-N diindium Chemical compound [In]#[In] QYHNIMDZIYANJH-UHFFFAOYSA-N 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 229910000743 fusible alloy Inorganic materials 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 description 1
- TXFYZJQDQJUDED-UHFFFAOYSA-N germanium nickel Chemical compound [Ni].[Ge] TXFYZJQDQJUDED-UHFFFAOYSA-N 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- NJWNEWQMQCGRDO-UHFFFAOYSA-N indium zinc Chemical compound [Zn].[In] NJWNEWQMQCGRDO-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 229910000765 intermetallic Inorganic materials 0.000 description 1
- DOARWPHSJVUWFT-UHFFFAOYSA-N lanthanum nickel Chemical compound [Ni].[La] DOARWPHSJVUWFT-UHFFFAOYSA-N 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000010532 solid phase synthesis reaction Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53209—Conductive materials based on metals, e.g. alloys, metal silicides
- H01L23/53242—Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being a noble metal, e.g. gold
- H01L23/53247—Noble-metal alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0093—Wafer bonding; Removal of the growth substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0095—Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/29109—Indium [In] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/29111—Tin [Sn] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83193—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed on both the semiconductor or solid-state body and another item or body to be connected to the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/832—Applying energy for connecting
- H01L2224/83201—Compression bonding
- H01L2224/83205—Ultrasonic bonding
- H01L2224/83207—Thermosonic bonding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
- H01L2224/8382—Diffusion bonding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
- H01L2224/8382—Diffusion bonding
- H01L2224/83825—Solid-liquid interdiffusion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
- H01L2224/8382—Diffusion bonding
- H01L2224/8383—Solid-solid interdiffusion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/83909—Post-treatment of the layer connector or bonding area
- H01L2224/83948—Thermal treatments, e.g. annealing, controlled cooling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01019—Potassium [K]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0103—Zinc [Zn]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01049—Indium [In]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0105—Tin [Sn]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01327—Intermediate phases, i.e. intermetallics compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0133—Ternary Alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0134—Quaternary Alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2924/15717—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400 C and less than 950 C
- H01L2924/15724—Aluminium [Al] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2924/15738—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950 C and less than 1550 C
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2924/15738—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950 C and less than 1550 C
- H01L2924/15747—Copper [Cu] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2924/15738—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950 C and less than 1550 C
- H01L2924/1576—Iron [Fe] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15787—Ceramics, e.g. crystalline carbides, nitrides or oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0066—Processes relating to semiconductor body packages relating to arrangements for conducting electric current to or from the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
- H01L33/486—Containers adapted for surface mounting
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Led Device Packages (AREA)
- Die Bonding (AREA)
Description
本發明係關於一種發光二極體晶片的固晶方法及發光二極體,特別是一種能低溫固晶並得到耐高溫的介金屬層的固晶方法及具有此固晶結構的發光二極體。
將發光二極體(LED,Light Emitting Diode)晶片黏著於導線架上之技術已發展多年,依固晶材質的不同,大致上分為二類。第一類為高分子導電膠材,第二類為金屬銲接材料。
前述第一類可見於台灣公告第463394號專利「晶片式發光二極體及其製造方法」。其主要係於一金屬基板表面鍍銀,經蝕刻後形成複數的線架,該線架於一端黏晶,並透過打線連接至相對另端,經進行封膠後並進行切割即構成一晶片式發光二極體,其裸露於底部的線架即構成電氣接點。此種做法,若在接合過程中未能均勻塗膠,將使得晶粒無法被固定在預定的位置,進而影響發光效率。其次,此類固晶方式,由於此高分子材料耐熱性極差,在高溫環境下操作時,銀膠接合層將較易劣化。再者,此高分子材料導熱不佳,LED晶粒也將因其難以導熱(銀膠熱導係數僅1W/M-K)而無法得到良好的散熱效果。LED晶粒的壽命與光電較換效率亦隨之下降。
前述第二類可見於台灣公開第200840079號專利申請案「發光二極體封裝之固晶材料與方法」。該專利申請案所採用的固晶方
法主要是利用基板的金屬材質而採用共晶接合。在封裝結構的金屬基座的上表面首先塗佈一層適當範圍的共晶接著材料。接著,將發光二極體晶粒設置於基座的共晶接著材料上。完成的成品再經由熱板、烤箱或隧道爐提供適當溫度而完成共晶接合。此技術採用共晶接著材料,其所形成的接合層為金屬材料,故在散熱性及耐熱性都較銀膠為佳。此專利技術所採用的部分共晶接著材料的熔點較高,使得在接合時容易在LED晶粒殘留熱應力,而損壞晶粒。而另一部分的共晶接著材料雖為低熔點合金,此類接著材料在接合完成後,若LED使用於70-80度C的環境時,接合層將產生軟化現象,其接點可靠度大打折扣。
除了上述技術外,美國公開第2007/0141749號專利申請案提出了在固晶製程中,導入超音波,以超音波使接合表面離子化,藉以降低加熱溫度,減少熱應力。此方式的需增加超音波設備,製造成本提昇,同時,若超音波動操作不當,可能直接震動到LED晶粒,造成晶粒裂片。
基於上述問題,本發明提出一種發光二極體晶片的固晶方法及應用此固晶方法的發光二極體,本發明的固晶方法可以在110度的低溫下完成固晶,並使固晶完成的接合合金具有高於200度的熔點,因此,得以解決上述各種方法的缺點及問題。
依據發光二極體(LED)晶片的固晶方法的一實施例,此固晶方法適於結合LED晶片及基體。LED晶片具有第一金屬薄膜層,固
晶方法包含:形成第二金屬薄膜層於基體的表面;形成固晶材料層於第二金屬薄膜層,固晶材料的熔點低於攝氏110度;置放LED晶片於固晶材料層上,使第一金屬薄膜層接觸固晶材料;以一液固反應溫度加熱固晶材料層一預固時間,以分別於第一金屬薄膜層、固晶材料層及第二金薄膜層之間形成第一介金屬層及第二介金屬層;以及以一固固反應溫度加熱固晶材料層一固化時間,以進行一固固反應,固固反應後之第一介金屬層及第二介金屬層之熔點高於200度C。
依據一實施例,前述的液固反應溫度係等於或高於該固晶材料熔點。固固反應溫度係低於該固晶材料熔點。前述第一金屬薄膜層之材料及第二金屬薄膜層之材料可為金(Au)、銀(Ag)、銅(Cu)或鎳(Ni)。固晶材料層之材料可為鉍銦、鉍銦鋅、鉍銦錫及鉍銦錫鋅。第一介金屬層及第二介金屬層之材料可選自於由銅銦錫(Cu-In-Sn)介金屬、鎳銦錫(Ni-In-Sn)介金屬、鎳鉍(Ni-Bi)介金屬、金銦(Au-In)介金屬、銀銦(Ag-In)介金屬、銀錫(Ag-Sn)介金屬及金鉍(Au-Bi)介金屬所構成的群組。
依據發光二極體的一實施例,發光二極體包含依序疊置的基體、第二金屬薄膜層、第二介金屬層、第一介金屬層、第一金屬薄膜層及發光二極體晶片。第一金屬薄膜層之材料及第二金屬薄膜層之材料可為金(Au)、銀(Ag)、銅(Cu)或鎳(Ni)。介金屬層的材質可以銅銦錫(Cu-In-Sn)、鎳銦錫(Ni-In-Sn)、鎳鉍(Ni-Bi)、金銦(Au-In)、銀銦(Ag-In)、銀錫(Ag-Sn)或金鉍(Au-Bi)介金屬。
依據上述固晶方法之實施例,可以將LED晶片在低於110度C的溫度先行預固化(液固反應)約0.1至1秒。其後,再於低於80度C的溫度進行約30分鐘到3小時的固固反應,以完成將LED晶片及基體固晶之程序。由於所有固晶程序均在低溫下進行,故無熱應力產生於LED晶片中。其次,藉此固晶方法完成的發光二極體,在LED晶片與基體間的接合材質為金屬材質,其導熱與散熱效果佳。再者,因所生成之介金屬化合物具有高於200度C的熔點溫度,因此,此發光二極體即便工作在70到80度C的環境下,亦不致會有接合合金軟化的問題。
有關本發明的特徵與實作,茲配合圖示及實施例說明如下。
首先,請參閱「第1圖」、「第2A圖」及「第2B圖」。「第1圖」為依據本發明之發光二極體(LED)晶片的固晶方法一實施例的流程示意圖。「第2A圖」為依據本發明之固晶方法一實施例之LED晶片之結構示意圖。「第2B圖」為依據本發明之固晶方法一實施例之基體之結構示意圖。
此LED晶片的固晶方法適於結合LED晶片10及基體20。LED晶片10可以是具有p-i-n結構之LED,例如但不限於氮化鎵(GaN)、氮化鎵銦(GaInN)、磷化鋁銦鎵(AlInGaP)與氮化鋁銦鎵(AlInGaN)、氮化鋁(AlN)、氮化銦(InN)、氮化鎵銦砷(GaInAsN)、磷氮化鎵銦(GaInPN)或其組合。
LED晶片10所發出之光線的光譜可以是任何可見光光譜(380nm(奈米)到760nm),或其他光譜。LED晶片10型態可為水平式結構(Saphhire base)、垂直式結構(Thin-GaN LED)與覆晶(Flip-Chip)型態。
LED晶片10具有第一金屬薄膜層12。第一金屬薄膜層12的材料可以是金、銀、銅與鎳。第一金屬薄膜層12可藉由電鍍、濺鍍或蒸鍍等方式鍍於LED晶片10的表面。第一金屬薄膜層12的厚度可以是但不限於0.2um(微米)到2.0微米。例如厚度為0.5um(微米)到1.0微米。
前述具有第一金屬薄膜層12的LED晶片10通常並非是直接在切割好的晶片上鍍第一金屬薄膜層12,而是先在LED晶圓背面,以上述電鍍等方式鍍上第一金屬薄膜層12後,接著再將晶圓經過切割、分光等步驟而完成的。
前述的基體20可以是導線架、印刷電路板、具有塑膠反射杯的基材、或陶瓷基板。基體20的材質可以是銅(Cu)、鋁(Al)、鐵(Fe)、鎳(Ni)之純元素或添加少量其它元素之合金。基體20的材質亦可以是矽(Si)、氮化鋁(AlN)或低溫共燒多層陶瓷(LTCC,Low-Temperature Cofired Ceramics)。
關於LED晶片10的固晶方法請再參照「第1圖」並搭配「第2B圖」、「第2C圖」、「第2D圖」、「第2E圖」、「第2F圖」、閱覽之。從圖中可以見悉,LED晶片10固晶方法包含:
步驟S50:形成第二金屬薄膜層22於基體20的表面;(請見於「第2B圖」)
步驟S52:形成固晶材料層30於第二金屬薄膜層22,固晶材料層30的熔點低於攝氏100度;(請見於「第2C圖」)
步驟S54:置放LED晶片10於固晶材料層30上,使第一金屬薄膜層12接觸固晶材料層30;(請見於「第2D圖」)
步驟S56:以一液固反應溫度加熱固晶材料層30一預固時間,以分別於第一金屬薄膜層12、固晶材料層30及第二金薄膜層22之間形成第一介金屬層32及第二介金屬層34;以及(請見於「第2E圖」)
步驟S58:以一固固反應溫度加熱固晶材料層30一固化時間,以進行一固固反應,固固反應後之第一介金屬層32’及第二介金屬層34’之熔點高於200度C(請見於「第2F圖」)。
關於步驟S50,請見於「第2B圖」。其中,第二金屬薄膜層22係可採用電鍍、濺鍍或蒸鍍等製程而被形成於基體20上。第二金屬薄膜層22的材料可以是金(Au)、銀(Ag)、銅(Cu)或鎳(Ni)。第二金屬薄膜層22的厚度可以是但不限於0.2um(微米)到2.0um。例如厚度為0.5um到1.0um。
接續步驟S50之後,請參見「第2C圖」,步驟S52係可藉由電鍍、蒸鍍或濺鍍的方式於第二金屬薄膜層22上形成一固晶材料層30。此固晶材料層30的材質可以是鉍銦(Bi-In)、鉍銦錫(Bi-In-Sn)、鉍銦錫鋅(Bi-In-Sn-Zn)與鉍銦鋅(Bi-In-Zn)。其中,Bi-In(鉍銦)的熔點約為110度C、Bi-25In-18Sn(鉍銦錫)的熔點約為82度C,Bi-20In-30Sn-3Zn(鉍銦錫鋅)的熔點約為90度C,Bi-33In-0.5Zn(鉍銦鋅)的熔點約為110度C。固晶材料層30的厚度可以是但不限於0.2um(微米)到2.0um。例如厚度為0.5um到1.0um。
其次,請參考「第2D圖」。步驟S54係將LED晶片10置放於固晶材料層30上,並使第一金屬薄膜層12接觸固晶材料層30。即如「第2D圖」所示。
接著,則進行步驟S56之以一液固反應溫度加熱固晶材料層30一預固時間,以分別於第一金屬薄膜層12、固晶材料層30及第二金薄膜層22之間形成第一介金屬層32及第二介金屬層34(請見於「第2E圖」)。其中,此液固反應溫度可以是等於或高於固晶材料層30的熔化溫度。若固晶材料層30的材質為鉍銦錫,則液固反應溫度可以是82度C或以上。加熱的方式可以採用雷射加熱、熱風加熱、紅外線加熱、熱壓接合、或超音波輔助熱壓接合。
加熱的位置則可以是直接將環境溫度提高到液固反應溫度,亦可以直接加熱於固晶材料層30或直接加熱於基體20再熱傳導至固晶材料層30。例如但不限於以雷射直接加熱於基體20底部(即加熱於「第2E圖」示的基體20的下方)。
加熱的時間(預固時間)則可以是但不限於0.1秒到2秒,例如0.2秒到1秒。此加熱的時間可視液固反應情形而適當調整。加熱時間可以是當第一金屬薄膜層12、固晶材料層30及第二金薄膜層22之間各別形成了第一介金屬層32及第二介金屬層34時所花的時間。此被形成的第一介金屬層32及第二介金屬層34的厚度可以是在非常薄的狀態下即視為完成了步驟S56之動作。意即,只要在第一金屬薄膜層12、固晶材料層30及第二金薄膜層22之間有形成了第一介金屬層32及第二介金屬層34即具有接合的效果,即可停止步驟S56而繼續進行下一步驟(S58)。當然,若在製程中,增加預固時間,使更多的第一介金屬層32及第二介金屬層34被形成,亦屬可實施的方式。
步驟S56之加熱動作亦可稱為是預固程序。其目的在於將LED晶片10與基體20依當前的對位關係(Alignment)進行預先固定,俾利後續製程之進行。由於此預固程序之溫度可以是等於或略高於固晶材料層30之熔點,且預固的時間可以相當短,故前述對位關係將能有效被維持,且不會對LED晶片10產生有任何類似熱應力的影響。
關於所形成的第一介金屬層32及第二介金屬層34的材質係與第一金屬薄膜層12及第二金薄膜層22有關,請容後詳述。
最後,進行步驟S58之以一固固反應溫度加熱固晶材料層30一固化時間,以進行一固固反應。此固固反應溫度係可低於固晶材料層30之熔點,可以是但不限於40度到80度C。前述固化時間可以依固固反應溫度而調整。例如,當固固反應溫度較高時,固化時間可以較短。當固固反應溫度較低時,固化時間可以較長。固化時間可以是30分鐘到3小時。
固固反應之目的在於讓固晶材料層30之合金元素與第一金屬薄膜層12及第二金屬薄膜層22的元素相互擴散。固固反應時間
的決定可以是讓大部分的固晶材料層30中的合金元素完成擴散所需的時間。
步驟S58之執行,在實際應用階段,可以採用批次作業的方式進行。意即,集合完成了步驟S56的多個半成品,統一以熱風式、烤箱、紅外線加熱或熱板加熱方式進行步驟S58。
由於步驟S58的固固反應溫度低於固晶材料層30之熔點,故對於步驟S56已完成之對位關係,並不致會有影響。
步驟S58後所形成之發光二極體之結構,有幾種可能。第一種發光二極體之結構請見於「第2F圖」。從圖中可以見悉,發光二極體包含依序疊置的基體20、第二金屬薄膜層22、第二介金屬層34’、第一介金屬層32’、第一金屬薄膜層12以及LED晶片10。其中第一金屬薄膜層12及第二金屬薄膜層22之材料係選自於由金(Au)、銀(Ag)、銅(Cu)及鎳(Ni)所構成群組。前述二個介金屬層32’,34’的材質包含Cu-In-Sn(銅銦錫)介金屬(熔點至少400℃以上)、Ni-In-Sn(鎳銦錫)介金屬(熔點約700℃以上)、Ni-Bi(鎳鉍)介金屬(熔點至少400℃以上)、Au-In(金銦)介金屬(熔點至少400℃以上)、Ag-In(銀銦)介金屬(熔點至少250℃以上)、Ag-Sn(銀錫)介金屬(熔點至少450℃以上)與Au-Bi(金鉍)介金屬(熔點至少350℃以上)。
其次,必須說明的是在預固程序所形成的第一介金屬層32及第二介金屬層34(即「第2E圖」所示)與固固反應後的第一介金屬層32’及第二介金屬層34’的材質可能並不相同。在預固程序時,雖然液固反應溫度有達到固晶材料層30的熔點,但是由於步驟S56所執行的時間僅需在第一介金屬層32及第二介金屬層34形成後即可停止,因此,固晶材料層30中的部分合金元素並未產生擴散。舉例來說,通常固晶材料層30中若含有銦,則銦較容易在液固反應時先擴散而形成介金屬層。
以下茲列出三個例子顯示「第2E圖」所示的LED在固晶程序中步驟S54、S56到S58的第二金屬薄膜層22、第二介金屬層34’、第一介金屬層32’、及第一金屬薄膜層12的材質。
以前述「第2E圖」LED結構實施例一中的第一介金屬層32’與第二介金屬層34’之熔點均高於200度C以上。即便LED未來長時間被操作在80度C以上的溫度,接合介質亦無軟化之問題,而能持續維持製程中的對位關係,得到良好的出光效率。
關於步驟S58後所形成之發光二極體之另一種結構請見於「第2G圖」。從圖中可以見悉,發光二極體包含依序疊置的基體20、第二金屬薄膜層22、第二介金屬層34’、中介層36、第一介金屬層32’、第一金屬薄膜層12以及LED晶片10。中介層36之材質與固晶材料層30、第二介金屬層34’、及第一介金屬層32’之材質有關。若固晶材料層30的材質為鉍銦錫,則中介層36的材質即可能為錫(Sn)。也就是在固固反應後,固晶材料層30僅留下錫(Sn)。
由於錫(Sn)之熔點約為230度C,亦高於200度C,能夠達到上述不會於LED使用中軟化的目的。也就是說,固晶材料層30在經過固固反應之後,有可能會被反應而消失,也有可能會殘留而形成中介層36。
關於鉍銦錫與銀的結合狀態,請參閱「第3圖」。「第3圖」為依據本發明之固晶方法一實施例中的固晶材料層30與第一金屬薄膜層12接合的合金分析圖。此實驗係將Bi-25In-18Sn的鉍銦錫合金設置於銀板上,施以85度C的溫度一段時間後,再進行合金分析所得到的合金分析圖。圖中可以看出,鉍銦錫與銀板間形成了Ag2
In之接合層。藉此可以得知,本發明所使用之固晶材料層30可與銀在低溫形成接合層。
依據上述固晶方法之實施例及固晶後之LED結構可知,在固晶製程時,可以用低溫及相當短的時間將LED晶片10預固於基體20,且不致有對位偏移的問題。其後再用更低的溫度進行固固反應。反應後的第一介金屬層32’及第二介金屬層34’具有高熔點(大於200度C)。因此,固晶後之LED即便長時間被操作於80度以上的溫度時,仍不致使第一介金屬層32’及第二介金屬層34’軟化,進而影響其對位精確度。再者,由於製程中所使用的溫度均遠低於100度C,故在固晶過程,LED晶片10及其他零組件(如基體20、塑料反射杯等)不會有熱應力殘留或集中問題。得到具有良好可靠度的LED。最後,由於預固程序可採用雷射加熱方式進行,因此預固時間縮短相當多。再加上固固時間則可採批量作業。使得本固晶方法可以有相對於習知技術高出許多的產出(Throughput)。
雖然本發明以前述之較佳實施例揭露如上,然其並非用以限定本發明,任何熟習相像技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。
10...LED晶片
12...第一金屬薄膜層
20...基體
22...第二金屬薄膜層
30...固晶材料層
32,32’...第一介金屬層
34,34’...第二介金屬層
36...中介層
第1圖為依據本發明之發光二極體(LED)晶片的固晶方法一實施例的流程示意圖。
第2A圖為依據本發明之固晶方法一實施例之LED晶片之結構示意圖。
第2B圖為依據本發明之固晶方法一實施例之基體之結構示意圖。
第2C圖為依據本發明之固晶方法一實施例之進行步驟S52的基體的結構示意圖。
第2D圖為依據本發明之固晶方法一實施例之步驟S54之結構示意圖。
第2E圖為依據本發明之固晶方法一實施例之步驟S56之LED結構示意圖。
第2F圖為依據本發明之固晶方法一實施例之步驟S58之LED結構示意圖。
第2G圖為依據本發明之固晶方法一實施例之步驟S58之另一LED結構示意圖。
第3圖為依據本發明之固晶方法一實施例中的固晶材料層與第一金屬薄膜層接合的合金分析圖。
Claims (11)
- 一種發光二極體(LED)晶片的固晶方法,適於結合一LED晶片及一基體,該LED晶片具有一第一金屬薄膜層,該固晶方法包含:形成一第二金屬薄膜層於該基體的一表面;形成一固晶材料層於該第二金屬薄膜層,該固晶材料層的一熔點低於攝氏110度;置放該LED晶片於該固晶材料層上,使該第一金屬薄膜層接觸該固晶材料層;以一液固反應溫度加熱該固晶材料層一預固時間,以分別於該第一金屬薄膜層、該固晶材料層及該第二金薄膜層之間形成一第一介金屬層及一第二介金屬層;以及以一固固反應溫度加熱該固晶材料層一固化時間,以進行一固固反應,該固固反應後之該第一介金屬層及該第二介金屬層之一熔點高於200度C。
- 如請求項1所述之固晶方法,其中該液固反應溫度係等於或高於該固晶材料層之該熔點。
- 如請求項1所述之固晶方法,其中該固固反應溫度係低於該固晶材料層之該熔點。
- 如請求項1所述之固晶方法,其中該以該固固反應溫度加熱該固晶材料層,以進行該固固反應的步驟係為:以該固固反應溫度加熱該固晶材料層,以進行該固固反應,直到該固晶材料與 該第一金屬薄膜層及該第二金薄膜層的該固固反應完畢。
- 如請求項1所述之固晶方法,其中該第一金屬薄膜層之材料選自於由金、銀、銅及鎳所組成的群組,該第二金屬薄膜層之材料選自於由金、銀、銅及鎳所組成的群組。
- 如請求項5所述之固晶方法,其中該固晶材料層之材料選自於由鉍銦、鉍銦鋅、鉍銦錫及鉍銦錫鋅所組成的群組。
- 如請求項6所述之固晶方法,其中該液固反應溫度為攝氏85度,該預固時間為0.1秒到1秒。
- 如請求項6所述之固晶方法,其中該固固反應溫度為攝氏40度到80度,該固化時間為30分鐘到3小時。
- 如請求項6所述之固晶方法,其中該第一介金屬層及該第二介金屬層之材料係選自於由銅銦錫(Cu-In-Sn)介金屬、鎳銦錫(Ni-In-Sn)介金屬、鎳鉍(Ni-Bi)介金屬、金銦(Au-In)介金屬、銀銦(Ag-In)介金屬、銀錫(Ag-Sn)介金屬及金鉍(Au-Bi)介金屬所組成的群組。
- 一種發光二極體,包含:一基體;一第二金屬薄膜層,位於該基體上,該第二金屬薄膜層之材料係選自於金(Au)、銀(Ag)、銅(Cu)及鎳(Ni)所構成群組;一第二介金屬層,位於該第二金屬薄膜層上;一第一介金屬層,位於該第二介金屬層上;一第一金屬薄膜層,位於該第一介金屬層上,該第一金屬 薄膜層之材料係選自於金(Au)、銀(Ag)、銅(Cu)及鎳(Ni)所構成群組,該些介金屬層的材質係選自於由銅銦錫(Cu-In-Sn)介金屬、鎳銦錫(Ni-In-Sn)介金屬、鎳鉍(Ni-Bi)介金屬、金銦(Au-In)介金屬、銀銦(Ag-In)介金屬、銀錫(Ag-Sn)介金屬及金鉍(Au-Bi)介金屬所構成的群組;以及一發光二極體晶片,位於該第一金屬薄膜層上。
- 如請求項10所述之發光二極體,另包含:一中介層,被夾置於該第一介金屬層與該第二介金屬層之間,該中介層之材料係選自於由錫(Sn)、鉍(Bi)、銦(In)及鋅(Zn)所組成的群組。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW098140702A TWI401825B (zh) | 2009-11-27 | 2009-11-27 | 發光二極體晶片的固晶方法及固晶完成之發光二極體 |
US12/854,278 US8236687B2 (en) | 2009-11-27 | 2010-08-11 | Die-bonding method of LED chip and LED manufactured by the same |
EP10172857.4A EP2328192A3 (en) | 2009-11-27 | 2010-08-16 | Die-bonding method of LED chip and LED manufactured by the same |
JP2010181719A JP5415378B2 (ja) | 2009-11-27 | 2010-08-16 | Ledチップのダイボンド方法及びその方法で製造されたled |
KR1020100080822A KR101138306B1 (ko) | 2009-11-27 | 2010-08-20 | Led 칩의 다이-본딩 방법과 이에 의해 제조된 led |
US13/530,396 US8716737B2 (en) | 2009-11-27 | 2012-06-22 | Die-bonded LED |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW098140702A TWI401825B (zh) | 2009-11-27 | 2009-11-27 | 發光二極體晶片的固晶方法及固晶完成之發光二極體 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201119079A TW201119079A (en) | 2011-06-01 |
TWI401825B true TWI401825B (zh) | 2013-07-11 |
Family
ID=43638806
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW098140702A TWI401825B (zh) | 2009-11-27 | 2009-11-27 | 發光二極體晶片的固晶方法及固晶完成之發光二極體 |
Country Status (5)
Country | Link |
---|---|
US (2) | US8236687B2 (zh) |
EP (1) | EP2328192A3 (zh) |
JP (1) | JP5415378B2 (zh) |
KR (1) | KR101138306B1 (zh) |
TW (1) | TWI401825B (zh) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9443903B2 (en) | 2006-06-30 | 2016-09-13 | Cree, Inc. | Low temperature high strength metal stack for die attachment |
US8698184B2 (en) | 2011-01-21 | 2014-04-15 | Cree, Inc. | Light emitting diodes with low junction temperature and solid state backlight components including light emitting diodes with low junction temperature |
TWI401825B (zh) * | 2009-11-27 | 2013-07-11 | Ind Tech Res Inst | 發光二極體晶片的固晶方法及固晶完成之發光二極體 |
TW201250849A (en) * | 2011-06-14 | 2012-12-16 | 3S Silicon Tech Inc | Low-temperature chip bonding method for light-condensing type solar chip, power transistor and field effect transistor |
EP2810307A1 (en) * | 2012-01-30 | 2014-12-10 | Cree, Inc. | Low temperature high strength metal stack for die attachment |
US20130334561A1 (en) * | 2012-06-19 | 2013-12-19 | Hsiu-Jen Lin | Method for bonding led wafer, method for manufacturing led chip and bonding structure |
JP2014007192A (ja) * | 2012-06-21 | 2014-01-16 | Industrial Technology Research Institute | Ledウェハーを接合する方法、ledチップを製造する方法及び接合構造 |
EP2677557A1 (en) * | 2012-06-21 | 2013-12-25 | Industrial Technology Research Institute | Method for bonding LED wafer, method for manufacturing LED chip and bonding structure |
TWI466253B (zh) * | 2012-10-08 | 2014-12-21 | Ind Tech Res Inst | 雙相介金屬接點結構及其製作方法 |
US9676047B2 (en) | 2013-03-15 | 2017-06-13 | Samsung Electronics Co., Ltd. | Method of forming metal bonding layer and method of manufacturing semiconductor light emitting device using the same |
DE102013103081A1 (de) * | 2013-03-26 | 2014-10-02 | Osram Opto Semiconductors Gmbh | Verfahren zum Verbinden von Fügepartnern und Anordnung von Fügepartnern |
TWI654779B (zh) | 2013-04-26 | 2019-03-21 | 新世紀光電股份有限公司 | 發光二極體結構及其製造方法 |
TWI617053B (zh) * | 2013-04-26 | 2018-03-01 | 新世紀光電股份有限公司 | 發光二極體結構 |
JP2015079794A (ja) * | 2013-10-15 | 2015-04-23 | 株式会社東芝 | 半導体発光素子及びその製造方法 |
JP6171912B2 (ja) * | 2013-12-13 | 2017-08-02 | 三菱マテリアル株式会社 | Ag下地層付き金属部材、絶縁回路基板、半導体装置、ヒートシンク付き絶縁回路基板、及び、Ag下地層付き金属部材の製造方法 |
KR101643463B1 (ko) * | 2014-09-29 | 2016-07-27 | 한국광기술원 | 반도체 칩 패키지와 이의 제조 장치 및 방법 |
US9443813B1 (en) * | 2015-03-05 | 2016-09-13 | Advanced Semiconductor Engineering, Inc. | Semiconductor device and method for manufacturing the same |
TWI632701B (zh) * | 2015-04-24 | 2018-08-11 | 國立中興大學 | 固晶結構之製造方法 |
DE102017107961B4 (de) | 2017-04-12 | 2022-10-13 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Verfahren zur Herstellung einer Beleuchtungseinrichtung und Beleuchtungseinrichtung |
DE102018114013A1 (de) | 2018-06-12 | 2019-12-12 | Osram Opto Semiconductors Gmbh | Verfahren zum fixieren eines halbleiterchips auf einer oberfläche, verfahren zur herstellung eines halbleiterbauelements und halbleiterbauelement |
KR102065765B1 (ko) * | 2018-07-02 | 2020-01-14 | 제엠제코(주) | 솔더범프를 이용한 반도체칩의 단자 접합방법 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030010975A1 (en) * | 2001-07-05 | 2003-01-16 | Gelcore Llc | GaN LED with solderable backside metal |
US20040211060A1 (en) * | 2003-04-24 | 2004-10-28 | Tadatomo Suga | Method of mounting an electronic part |
US20060105478A1 (en) * | 2004-11-12 | 2006-05-18 | Lumileds Lighting U.S., Llc | Bonding an optical element to a light emitting device |
TW200835766A (en) * | 2006-11-20 | 2008-09-01 | 3M Innovative Properties Co | Optical bonding composition for LED light source |
CN101501872A (zh) * | 2006-08-08 | 2009-08-05 | 皇家飞利浦电子股份有限公司 | 纳米颗粒基无机粘合材料 |
TW200939526A (en) * | 2008-03-10 | 2009-09-16 | Everlight Electronics Co Ltd | A method for LED die attachment using a patterned photoresist layer |
Family Cites Families (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6286895A (ja) * | 1985-10-14 | 1987-04-21 | 株式会社日立製作所 | 電子部品のはんだ付け方法 |
US5234153A (en) | 1992-08-28 | 1993-08-10 | At&T Bell Laboratories | Permanent metallic bonding method |
JP4135268B2 (ja) * | 1998-09-04 | 2008-08-20 | 株式会社豊田中央研究所 | 無鉛はんだ合金 |
JP4724650B2 (ja) * | 2000-04-17 | 2011-07-13 | 富士通株式会社 | はんだ接合方法およびはんだ接合部 |
TW463394B (en) | 2000-12-19 | 2001-11-11 | Taiwan Oasis Technology Co Ltd | Chip-type light emitting diode and its manufacturing method |
US6791119B2 (en) * | 2001-02-01 | 2004-09-14 | Cree, Inc. | Light emitting diodes including modifications for light extraction |
US6531328B1 (en) | 2001-10-11 | 2003-03-11 | Solidlite Corporation | Packaging of light-emitting diode |
DE10221857A1 (de) * | 2002-05-16 | 2003-11-27 | Osram Opto Semiconductors Gmbh | Verfahren zum Befestigen eines Halbleiterchips in einem Kunststoffgehäusekörper, optoelektronisches Halbleiterbauelement und Verfahren zu dessen Herstellung |
US7168608B2 (en) | 2002-12-24 | 2007-01-30 | Avago Technologies General Ip (Singapore) Pte. Ltd. | System and method for hermetic seal formation |
JP2005032834A (ja) * | 2003-07-08 | 2005-02-03 | Toshiba Corp | 半導体チップと基板との接合方法 |
EP1544923A3 (de) * | 2003-12-19 | 2007-03-14 | Osram Opto Semiconductors GmbH | Strahlungemittierendes Halbleiterbauelement und Verfahren zum Befestigen eines Halbleiterchips auf einem Leiterrahmen |
JP4906256B2 (ja) | 2004-11-10 | 2012-03-28 | 株式会社沖データ | 半導体複合装置の製造方法 |
JP4262672B2 (ja) * | 2004-12-24 | 2009-05-13 | 株式会社ルネサステクノロジ | 半導体装置およびその製造方法 |
JP4344707B2 (ja) | 2005-02-24 | 2009-10-14 | 株式会社ルネサステクノロジ | 半導体装置およびその製造方法 |
DE102005029246B4 (de) * | 2005-03-31 | 2023-06-22 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Halbleiterchip mit einer Lötschichtenfolge und Verfahren zum Löten eines Halbleiterchips |
TW200642113A (en) | 2005-05-26 | 2006-12-01 | Chen jing hao | LED package structure for fixing LED chip and conducting electricity and heat |
EP1748480B1 (en) * | 2005-07-28 | 2009-06-24 | Infineon Technologies AG | Connection structure for attaching a semiconductor chip to a metal substrate, semiconductor chip and electronic component including the connection structure and methods for producing the connection structure |
KR20070039195A (ko) | 2005-10-07 | 2007-04-11 | 주식회사 엘지화학 | 열적 안정성이 개선된 반도체 소자 및 이의 제조방법 |
JP2007109829A (ja) | 2005-10-12 | 2007-04-26 | Dowa Holdings Co Ltd | 半田接合形成方法 |
US20070141749A1 (en) | 2005-12-20 | 2007-06-21 | Yi-Fong Lin | Die attachment method for LED chip and structure thereof |
JP2007300489A (ja) | 2006-05-01 | 2007-11-15 | Alps Electric Co Ltd | カメラモジュールの接続方法 |
JP2008004777A (ja) * | 2006-06-22 | 2008-01-10 | Nfk Lite Mfg Co Ltd | 放熱効果の優れた発光ダイオードの製造方法 |
US8643195B2 (en) * | 2006-06-30 | 2014-02-04 | Cree, Inc. | Nickel tin bonding system for semiconductor wafers and devices |
US7910945B2 (en) * | 2006-06-30 | 2011-03-22 | Cree, Inc. | Nickel tin bonding system with barrier layer for semiconductor wafers and devices |
JP4793169B2 (ja) * | 2006-08-24 | 2011-10-12 | 日立電線株式会社 | 接続体および光送受信モジュール |
DE102007021009A1 (de) * | 2006-09-27 | 2008-04-10 | Osram Opto Semiconductors Gmbh | Leuchtdiodenanordnung und Verfahren zur Herstellung einer solchen |
TW200820455A (en) * | 2006-10-18 | 2008-05-01 | Young Lighting Technology Corp | LED package and manufacture method thereof |
TW200840079A (en) | 2007-03-21 | 2008-10-01 | High Power Lighting Corp | Eutectic bonding material of LED and packaging method |
US7869480B2 (en) * | 2007-05-24 | 2011-01-11 | Sanyo Electric Co., Ltd. | Semiconductor laser device |
JP2009094293A (ja) * | 2007-10-09 | 2009-04-30 | Toyota Motor Corp | 半導体装置 |
JP5028217B2 (ja) | 2007-10-29 | 2012-09-19 | 日立協和エンジニアリング株式会社 | 光素子搭載方法 |
US8211752B2 (en) * | 2007-11-26 | 2012-07-03 | Infineon Technologies Ag | Device and method including a soldering process |
JP5642336B2 (ja) | 2008-02-06 | 2014-12-17 | 富士電機株式会社 | 半導体装置およびその製造方法 |
TW200945506A (en) * | 2008-04-18 | 2009-11-01 | Quan-Cheng Du | Method for combining semiconductor structure and substrate, and high luminous efficiency device manufactured by using the method |
TWI401825B (zh) * | 2009-11-27 | 2013-07-11 | Ind Tech Res Inst | 發光二極體晶片的固晶方法及固晶完成之發光二極體 |
-
2009
- 2009-11-27 TW TW098140702A patent/TWI401825B/zh active
-
2010
- 2010-08-11 US US12/854,278 patent/US8236687B2/en active Active
- 2010-08-16 EP EP10172857.4A patent/EP2328192A3/en not_active Withdrawn
- 2010-08-16 JP JP2010181719A patent/JP5415378B2/ja active Active
- 2010-08-20 KR KR1020100080822A patent/KR101138306B1/ko active IP Right Grant
-
2012
- 2012-06-22 US US13/530,396 patent/US8716737B2/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030010975A1 (en) * | 2001-07-05 | 2003-01-16 | Gelcore Llc | GaN LED with solderable backside metal |
US20040211060A1 (en) * | 2003-04-24 | 2004-10-28 | Tadatomo Suga | Method of mounting an electronic part |
US20060105478A1 (en) * | 2004-11-12 | 2006-05-18 | Lumileds Lighting U.S., Llc | Bonding an optical element to a light emitting device |
CN101501872A (zh) * | 2006-08-08 | 2009-08-05 | 皇家飞利浦电子股份有限公司 | 纳米颗粒基无机粘合材料 |
TW200835766A (en) * | 2006-11-20 | 2008-09-01 | 3M Innovative Properties Co | Optical bonding composition for LED light source |
TW200939526A (en) * | 2008-03-10 | 2009-09-16 | Everlight Electronics Co Ltd | A method for LED die attachment using a patterned photoresist layer |
Non-Patent Citations (1)
Title |
---|
Ervina Efzan Mhd Noor, Ahmad Badri Ismail, et al. "Characteristic of Low Temperature of Bi-In-Sn Solder alloy" 33rd International Electronics Manufacturing Teclmology Conference. 4-6 Nov. 2008。 * |
Also Published As
Publication number | Publication date |
---|---|
US8236687B2 (en) | 2012-08-07 |
US20110127563A1 (en) | 2011-06-02 |
JP5415378B2 (ja) | 2014-02-12 |
KR101138306B1 (ko) | 2012-06-22 |
KR20110059519A (ko) | 2011-06-02 |
JP2011114338A (ja) | 2011-06-09 |
EP2328192A3 (en) | 2013-04-10 |
TW201119079A (en) | 2011-06-01 |
EP2328192A2 (en) | 2011-06-01 |
US8716737B2 (en) | 2014-05-06 |
US20120256228A1 (en) | 2012-10-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI401825B (zh) | 發光二極體晶片的固晶方法及固晶完成之發光二極體 | |
CN102104090B (zh) | 发光二极管芯片固晶方法、固晶的发光二极管及芯片结构 | |
US20140175495A1 (en) | Die bonding method and die bonding structure of light emitting diode package | |
JP5120653B2 (ja) | 半田層及びそれを用いたデバイス接合用基板並びに該デバイス接合用基板の製造方法 | |
WO2005086220A1 (en) | Highly reliable, cost effective and thermally enhanced ausn die-attach technology | |
US20130334561A1 (en) | Method for bonding led wafer, method for manufacturing led chip and bonding structure | |
JP2009290007A (ja) | 接合体、半導体装置および接合体の製造方法 | |
TW200401422A (en) | Method to fix a semiconductor-chip in a plastic-housing body, opto-electronic semiconductor-component and its production method | |
US10046408B2 (en) | Device comprising a connecting component and method for producing a connecting component | |
TWI446577B (zh) | Led晶圓之接合方法、led晶粒之製造方法及led晶圓與基體之接合結構 | |
CN101950782B (zh) | 低温形成反射性发光二极管固晶接合结构的方法 | |
TWI381562B (zh) | 低溫形成反射性發光二極體固晶接合結構之方法 | |
TWI489596B (zh) | 晶片結構 | |
JP5733466B2 (ja) | 半導体装置の製造方法 | |
JP2007109829A (ja) | 半田接合形成方法 | |
JP2008311319A (ja) | Led素子およびその製造方法 | |
TWI531087B (zh) | 發光二極體結構 | |
JP2014007192A (ja) | Ledウェハーを接合する方法、ledチップを製造する方法及び接合構造 | |
TWI632701B (zh) | 固晶結構之製造方法 | |
EP2677557A1 (en) | Method for bonding LED wafer, method for manufacturing LED chip and bonding structure | |
TWI617053B (zh) | 發光二極體結構 | |
TWI578566B (zh) | 發光二極體結構 | |
TWI654779B (zh) | 發光二極體結構及其製造方法 | |
CN104465578A (zh) | 半导体装置及半导体模块 | |
JP2006147847A (ja) | バンプ形成方法およびボンディング用構造体 |