TWI382099B - 有機材料汽化之控制 - Google Patents
有機材料汽化之控制 Download PDFInfo
- Publication number
- TWI382099B TWI382099B TW094139065A TW94139065A TWI382099B TW I382099 B TWI382099 B TW I382099B TW 094139065 A TW094139065 A TW 094139065A TW 94139065 A TW94139065 A TW 94139065A TW I382099 B TWI382099 B TW I382099B
- Authority
- TW
- Taiwan
- Prior art keywords
- organic material
- heating
- vaporization
- temperature
- temperature control
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/543—Controlling the film thickness or evaporation rate using measurement on the vapor source
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/12—Organic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/246—Replenishment of source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/26—Vacuum evaporation by resistance or inductive heating of the source
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Physical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/984,095 US20060099344A1 (en) | 2004-11-09 | 2004-11-09 | Controlling the vaporization of organic material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200624577A TW200624577A (en) | 2006-07-16 |
| TWI382099B true TWI382099B (zh) | 2013-01-11 |
Family
ID=35892418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW094139065A TWI382099B (zh) | 2004-11-09 | 2005-11-08 | 有機材料汽化之控制 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US20060099344A1 (enExample) |
| EP (1) | EP1834364B1 (enExample) |
| JP (1) | JP5144268B2 (enExample) |
| KR (1) | KR101172410B1 (enExample) |
| CN (1) | CN101057349B (enExample) |
| DE (1) | DE602005025695D1 (enExample) |
| TW (1) | TWI382099B (enExample) |
| WO (1) | WO2006053017A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7989021B2 (en) | 2005-07-27 | 2011-08-02 | Global Oled Technology Llc | Vaporizing material at a uniform rate |
| JP5325471B2 (ja) * | 2007-07-06 | 2013-10-23 | 株式会社半導体エネルギー研究所 | 発光装置の作製方法 |
| KR20110050690A (ko) * | 2008-09-24 | 2011-05-16 | 이데미쓰 고산 가부시키가이샤 | 복합 유기 전계 발광 재료 |
| US8425801B2 (en) * | 2009-04-10 | 2013-04-23 | Idemitsu Kosan Co., Ltd. | Composite organic electroluminescent material and production method thereof |
| DE102010007111B4 (de) * | 2010-02-05 | 2012-02-16 | Von Ardenne Anlagentechnik Gmbh | Verfahren und Pulvermischung zur Beschichtung von Substraten aus der Dampfphase |
| CN104711514B (zh) * | 2015-04-07 | 2017-05-31 | 合肥京东方光电科技有限公司 | 一种成膜装置及方法 |
| CN117051361B (zh) * | 2023-08-14 | 2025-10-28 | 兰州空间技术物理研究所 | 一种真空卷绕有机物蒸镀防护装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003293121A (ja) * | 2002-04-05 | 2003-10-15 | Cluster Ion Beam Technology Kk | 蒸着材料供給手段を備えた蒸着用坩堝 |
| CN1487116A (zh) * | 2002-07-19 | 2004-04-07 | Lg������ʽ���� | 有机场致发光膜蒸镀用蒸镀源 |
Family Cites Families (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2447789A (en) * | 1945-03-23 | 1948-08-24 | Polaroid Corp | Evaporating crucible for coating apparatus |
| GB1253124A (enExample) | 1969-02-28 | 1971-11-10 | ||
| DE3200848C2 (de) * | 1982-01-14 | 1984-09-27 | GfO Gesellschaft für Oberflächentechnik mbH, 7070 Schwäbisch Gmünd | Vorrichtung zum Beschicken von Verdampfern in Aufdampfanlagen |
| JPS59177365A (ja) * | 1983-03-24 | 1984-10-08 | Matsushita Electric Ind Co Ltd | 蒸発方法とその装置 |
| JPH0743322B2 (ja) | 1985-07-19 | 1995-05-15 | 株式会社日立製作所 | 検査方法および装置 |
| US4885211A (en) * | 1987-02-11 | 1989-12-05 | Eastman Kodak Company | Electroluminescent device with improved cathode |
| US4769292A (en) * | 1987-03-02 | 1988-09-06 | Eastman Kodak Company | Electroluminescent device with modified thin film luminescent zone |
| US5041719A (en) * | 1990-06-01 | 1991-08-20 | General Electric Company | Two-zone electrical furnace for molecular beam epitaxial apparatus |
| JPH05117864A (ja) | 1991-06-25 | 1993-05-14 | Anelva Corp | Cvd装置 |
| JPH0530761U (ja) | 1991-09-30 | 1993-04-23 | 京セラ株式会社 | 欠陥観察装置 |
| JPH09219289A (ja) | 1996-02-09 | 1997-08-19 | Chisso Corp | 有機薄膜電界発光素子とその製造方法 |
| US5849089A (en) * | 1997-03-14 | 1998-12-15 | Kabushiki Kaisha Toshiba | Evaporator for liquid raw material and evaporation method therefor |
| CN1144198C (zh) * | 1997-05-08 | 2004-03-31 | 松下电器产业株式会社 | 光记录媒体制造装置和制造方法 |
| JPH1161386A (ja) * | 1997-08-22 | 1999-03-05 | Fuji Electric Co Ltd | 有機薄膜発光素子の成膜装置 |
| US6337102B1 (en) * | 1997-11-17 | 2002-01-08 | The Trustees Of Princeton University | Low pressure vapor phase deposition of organic thin films |
| JPH11251067A (ja) * | 1998-03-02 | 1999-09-17 | Junji Kido | 有機エレクトロルミネッセント素子 |
| EP1034899B1 (en) * | 1998-06-09 | 2011-03-30 | Sony Corporation | Robot and method of its attitude control |
| JP2000068055A (ja) | 1998-08-26 | 2000-03-03 | Tdk Corp | 有機el素子用蒸発源、この有機el素子用蒸発源を用いた有機el素子の製造装置および製造方法 |
| JP3610837B2 (ja) | 1998-09-18 | 2005-01-19 | 株式会社日立製作所 | 試料表面の観察方法及びその装置並びに欠陥検査方法及びその装置 |
| US6123993A (en) * | 1998-09-21 | 2000-09-26 | Advanced Technology Materials, Inc. | Method and apparatus for forming low dielectric constant polymeric films |
| JP2000248358A (ja) | 1999-03-01 | 2000-09-12 | Casio Comput Co Ltd | 蒸着装置および蒸着方法 |
| TW521303B (en) * | 2000-02-28 | 2003-02-21 | Semiconductor Energy Lab | Electronic device |
| US6237529B1 (en) | 2000-03-03 | 2001-05-29 | Eastman Kodak Company | Source for thermal physical vapor deposition of organic electroluminescent layers |
| US6660328B1 (en) * | 2000-03-31 | 2003-12-09 | Florida State University Research Foundation | Powder precursor delivery system for chemical vapor deposition |
| EP1167566B1 (en) * | 2000-06-22 | 2011-01-26 | Panasonic Electric Works Co., Ltd. | Apparatus for and method of vacuum vapor deposition |
| JP4153652B2 (ja) | 2000-10-05 | 2008-09-24 | 株式会社東芝 | パターン評価装置及びパターン評価方法 |
| US6467427B1 (en) | 2000-11-10 | 2002-10-22 | Helix Technology Inc. | Evaporation source material supplier |
| JP4906018B2 (ja) | 2001-03-12 | 2012-03-28 | 株式会社半導体エネルギー研究所 | 成膜方法、発光装置の作製方法及び成膜装置 |
| US20030015140A1 (en) * | 2001-04-26 | 2003-01-23 | Eastman Kodak Company | Physical vapor deposition of organic layers using tubular sources for making organic light-emitting devices |
| KR20040078643A (ko) | 2001-12-04 | 2004-09-10 | 프라이맥스 인코포레이티드 | 증기를 증착실에 공급하는 방법 및 화학 증착 기화기 |
| AU2003217530A1 (en) * | 2002-04-01 | 2003-10-13 | Ans Inc | Apparatus and method for depositing organic matter of vapor phase |
| US7643137B2 (en) | 2003-03-26 | 2010-01-05 | Nikon Corporation | Defect inspection apparatus, defect inspection method and method of inspecting hole pattern |
| JP4901090B2 (ja) | 2004-10-06 | 2012-03-21 | 株式会社ニコン | 欠陥検査方法及び欠陥検出装置 |
| US6837939B1 (en) * | 2003-07-22 | 2005-01-04 | Eastman Kodak Company | Thermal physical vapor deposition source using pellets of organic material for making OLED displays |
| TWI242463B (en) | 2003-08-28 | 2005-11-01 | Ind Tech Res Inst | Apparatus and process for vacuum sublimation |
| US7339139B2 (en) * | 2003-10-03 | 2008-03-04 | Darly Custom Technology, Inc. | Multi-layered radiant thermal evaporator and method of use |
| TW200519373A (en) | 2003-10-27 | 2005-06-16 | Nikon Corp | Surface inspection device and method |
| US7232588B2 (en) | 2004-02-23 | 2007-06-19 | Eastman Kodak Company | Device and method for vaporizing temperature sensitive materials |
| US7364772B2 (en) | 2004-03-22 | 2008-04-29 | Eastman Kodak Company | Method for coating an organic layer onto a substrate in a vacuum chamber |
| US7501151B2 (en) | 2004-09-21 | 2009-03-10 | Eastman Kodak Company | Delivering particulate material to a vaporization zone |
| US7501152B2 (en) | 2004-09-21 | 2009-03-10 | Eastman Kodak Company | Delivering particulate material to a vaporization zone |
-
2004
- 2004-11-09 US US10/984,095 patent/US20060099344A1/en not_active Abandoned
-
2005
- 2005-11-08 TW TW094139065A patent/TWI382099B/zh active
- 2005-11-09 JP JP2007540188A patent/JP5144268B2/ja not_active Expired - Lifetime
- 2005-11-09 DE DE602005025695T patent/DE602005025695D1/de not_active Expired - Lifetime
- 2005-11-09 EP EP05818811A patent/EP1834364B1/en not_active Expired - Lifetime
- 2005-11-09 KR KR1020077010468A patent/KR101172410B1/ko not_active Expired - Lifetime
- 2005-11-09 WO PCT/US2005/040539 patent/WO2006053017A1/en not_active Ceased
- 2005-11-09 CN CN2005800383864A patent/CN101057349B/zh not_active Expired - Lifetime
-
2010
- 2010-05-24 US US12/786,182 patent/US8012537B2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003293121A (ja) * | 2002-04-05 | 2003-10-15 | Cluster Ion Beam Technology Kk | 蒸着材料供給手段を備えた蒸着用坩堝 |
| CN1487116A (zh) * | 2002-07-19 | 2004-04-07 | Lg������ʽ���� | 有机场致发光膜蒸镀用蒸镀源 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2008519904A (ja) | 2008-06-12 |
| KR20070074616A (ko) | 2007-07-12 |
| EP1834364B1 (en) | 2010-12-29 |
| CN101057349A (zh) | 2007-10-17 |
| US8012537B2 (en) | 2011-09-06 |
| CN101057349B (zh) | 2010-06-23 |
| TW200624577A (en) | 2006-07-16 |
| DE602005025695D1 (de) | 2011-02-10 |
| US20100233367A1 (en) | 2010-09-16 |
| JP5144268B2 (ja) | 2013-02-13 |
| US20060099344A1 (en) | 2006-05-11 |
| KR101172410B1 (ko) | 2012-08-09 |
| WO2006053017A1 (en) | 2006-05-18 |
| EP1834364A1 (en) | 2007-09-19 |
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