|
TWI232357B
(en)
|
2002-11-12 |
2005-05-11 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
US10503084B2
(en)
|
2002-11-12 |
2019-12-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US9482966B2
(en)
|
2002-11-12 |
2016-11-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7372541B2
(en)
*
|
2002-11-12 |
2008-05-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
CN100568101C
(zh)
|
2002-11-12 |
2009-12-09 |
Asml荷兰有限公司 |
光刻装置和器件制造方法
|
|
DE10257766A1
(de)
*
|
2002-12-10 |
2004-07-15 |
Carl Zeiss Smt Ag |
Verfahren zur Einstellung einer gewünschten optischen Eigenschaft eines Projektionsobjektivs sowie mikrolithografische Projektionsbelichtungsanlage
|
|
DE10261775A1
(de)
|
2002-12-20 |
2004-07-01 |
Carl Zeiss Smt Ag |
Vorrichtung zur optischen Vermessung eines Abbildungssystems
|
|
KR101381538B1
(ko)
*
|
2003-02-26 |
2014-04-04 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
JP4353179B2
(ja)
|
2003-03-25 |
2009-10-28 |
株式会社ニコン |
露光装置、露光方法、及びデバイス製造方法
|
|
ATE426914T1
(de)
|
2003-04-07 |
2009-04-15 |
Nikon Corp |
Belichtungsgerat und verfahren zur herstellung einer vorrichtung
|
|
JP4488004B2
(ja)
*
|
2003-04-09 |
2010-06-23 |
株式会社ニコン |
液浸リソグラフィ流体制御システム
|
|
EP2667253B1
(en)
*
|
2003-04-10 |
2015-06-10 |
Nikon Corporation |
Environmental system including vacuum scavenge for an immersion lithography apparatus
|
|
JP4656057B2
(ja)
*
|
2003-04-10 |
2011-03-23 |
株式会社ニコン |
液浸リソグラフィ装置用電気浸透素子
|
|
KR101745223B1
(ko)
*
|
2003-04-10 |
2017-06-08 |
가부시키가이샤 니콘 |
액침 리소그래피 장치용 운반 영역을 포함하는 환경 시스템
|
|
WO2004093160A2
(en)
*
|
2003-04-10 |
2004-10-28 |
Nikon Corporation |
Run-off path to collect liquid for an immersion lithography apparatus
|
|
JP4582089B2
(ja)
|
2003-04-11 |
2010-11-17 |
株式会社ニコン |
液浸リソグラフィ用の液体噴射回収システム
|
|
SG10201603067VA
(en)
|
2003-04-11 |
2016-05-30 |
Nikon Corp |
Apparatus having an immersion fluid system configured to maintain immersion fluid in a gap adjacent an optical assembly
|
|
SG189557A1
(en)
|
2003-04-11 |
2013-05-31 |
Nikon Corp |
Cleanup method for optics in immersion lithography
|
|
ATE542167T1
(de)
*
|
2003-04-17 |
2012-02-15 |
Nikon Corp |
Lithographisches immersionsgerät
|
|
TWI295414B
(en)
*
|
2003-05-13 |
2008-04-01 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
JP4552853B2
(ja)
*
|
2003-05-15 |
2010-09-29 |
株式会社ニコン |
露光装置及びデバイス製造方法
|
|
TWI503865B
(zh)
*
|
2003-05-23 |
2015-10-11 |
尼康股份有限公司 |
A method of manufacturing an exposure apparatus and an element
|
|
TW201515064A
(zh)
|
2003-05-23 |
2015-04-16 |
尼康股份有限公司 |
曝光方法及曝光裝置以及元件製造方法
|
|
KR20150036794A
(ko)
*
|
2003-05-28 |
2015-04-07 |
가부시키가이샤 니콘 |
노광 방법, 노광 장치, 및 디바이스 제조 방법
|
|
US7213963B2
(en)
|
2003-06-09 |
2007-05-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7684008B2
(en)
|
2003-06-11 |
2010-03-23 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
TW200511388A
(en)
|
2003-06-13 |
2005-03-16 |
Nikon Corp |
Exposure method, substrate stage, exposure apparatus and method for manufacturing device
|
|
TWI433212B
(zh)
|
2003-06-19 |
2014-04-01 |
尼康股份有限公司 |
An exposure apparatus, an exposure method, and an element manufacturing method
|
|
WO2005006026A2
(en)
*
|
2003-07-01 |
2005-01-20 |
Nikon Corporation |
Using isotopically specified fluids as optical elements
|
|
EP2466382B1
(en)
*
|
2003-07-08 |
2014-11-26 |
Nikon Corporation |
Wafer table for immersion lithography
|
|
KR20060026883A
(ko)
*
|
2003-07-09 |
2006-03-24 |
가부시키가이샤 니콘 |
결합장치, 노광장치 및 디바이스 제조방법
|
|
EP1646075B1
(en)
|
2003-07-09 |
2011-06-15 |
Nikon Corporation |
Exposure apparatus and device manufacturing method
|
|
KR101296501B1
(ko)
*
|
2003-07-09 |
2013-08-13 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
SG109000A1
(en)
*
|
2003-07-16 |
2005-02-28 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
EP3346485A1
(en)
|
2003-07-25 |
2018-07-11 |
Nikon Corporation |
Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method
|
|
EP1503244A1
(en)
*
|
2003-07-28 |
2005-02-02 |
ASML Netherlands B.V. |
Lithographic projection apparatus and device manufacturing method
|
|
KR101641011B1
(ko)
*
|
2003-07-28 |
2016-07-19 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법, 그리고 노광 장치의 제어 방법
|
|
US7779781B2
(en)
|
2003-07-31 |
2010-08-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
TWI263859B
(en)
*
|
2003-08-29 |
2006-10-11 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
EP2804048A1
(en)
*
|
2003-08-29 |
2014-11-19 |
Nikon Corporation |
Exposure apparatus and device fabricating method
|
|
KR101371917B1
(ko)
*
|
2003-09-03 |
2014-03-07 |
가부시키가이샤 니콘 |
액침 리소그래피용 유체를 제공하기 위한 장치 및 방법
|
|
JP4444920B2
(ja)
*
|
2003-09-19 |
2010-03-31 |
株式会社ニコン |
露光装置及びデバイス製造方法
|
|
EP2320273B1
(en)
|
2003-09-29 |
2015-01-21 |
Nikon Corporation |
Exposure apparatus, exposure method, and method for producing a device
|
|
JP2005136364A
(ja)
*
|
2003-10-08 |
2005-05-26 |
Zao Nikon Co Ltd |
基板搬送装置、露光装置、並びにデバイス製造方法
|
|
EP1672681B8
(en)
|
2003-10-08 |
2011-09-21 |
Miyagi Nikon Precision Co., Ltd. |
Exposure apparatus, substrate carrying method, exposure method, and method for producing device
|
|
WO2005036623A1
(ja)
|
2003-10-08 |
2005-04-21 |
Zao Nikon Co., Ltd. |
基板搬送装置及び基板搬送方法、露光装置及び露光方法、デバイス製造方法
|
|
TW201738932A
(zh)
*
|
2003-10-09 |
2017-11-01 |
Nippon Kogaku Kk |
曝光裝置及曝光方法、元件製造方法
|
|
US7411653B2
(en)
*
|
2003-10-28 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
JP4295712B2
(ja)
|
2003-11-14 |
2009-07-15 |
エーエスエムエル ネザーランズ ビー.ブイ. |
リソグラフィ装置及び装置製造方法
|
|
WO2005055296A1
(ja)
|
2003-12-03 |
2005-06-16 |
Nikon Corporation |
露光装置、露光方法及びデバイス製造方法、並びに光学部品
|
|
KR101119813B1
(ko)
*
|
2003-12-15 |
2012-03-06 |
가부시키가이샤 니콘 |
스테이지 장치, 노광 장치, 및 노광 방법
|
|
US20070081133A1
(en)
*
|
2004-12-14 |
2007-04-12 |
Niikon Corporation |
Projection exposure apparatus and stage unit, and exposure method
|
|
JPWO2005057635A1
(ja)
*
|
2003-12-15 |
2007-07-05 |
株式会社ニコン |
投影露光装置及びステージ装置、並びに露光方法
|
|
WO2005071491A2
(en)
*
|
2004-01-20 |
2005-08-04 |
Carl Zeiss Smt Ag |
Exposure apparatus and measuring device for a projection lens
|
|
US7589822B2
(en)
|
2004-02-02 |
2009-09-15 |
Nikon Corporation |
Stage drive method and stage unit, exposure apparatus, and device manufacturing method
|
|
US7990516B2
(en)
|
2004-02-03 |
2011-08-02 |
Nikon Corporation |
Immersion exposure apparatus and device manufacturing method with liquid detection apparatus
|
|
JP5167572B2
(ja)
*
|
2004-02-04 |
2013-03-21 |
株式会社ニコン |
露光装置、露光方法及びデバイス製造方法
|
|
KR101309428B1
(ko)
*
|
2004-02-04 |
2013-09-23 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
TWI402893B
(zh)
*
|
2004-03-25 |
2013-07-21 |
尼康股份有限公司 |
曝光方法
|
|
US7034917B2
(en)
*
|
2004-04-01 |
2006-04-25 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and device manufactured thereby
|
|
EP1747499A2
(en)
*
|
2004-05-04 |
2007-01-31 |
Nikon Corporation |
Apparatus and method for providing fluid for immersion lithography
|
|
US7616383B2
(en)
|
2004-05-18 |
2009-11-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7486381B2
(en)
*
|
2004-05-21 |
2009-02-03 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
CN101833247B
(zh)
|
2004-06-04 |
2013-11-06 |
卡尔蔡司Smt有限责任公司 |
微光刻投影曝光系统的投影物镜的光学测量的测量系统
|
|
KR101433496B1
(ko)
*
|
2004-06-09 |
2014-08-22 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US7463330B2
(en)
|
2004-07-07 |
2008-12-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101433491B1
(ko)
|
2004-07-12 |
2014-08-22 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US8654308B2
(en)
*
|
2004-07-12 |
2014-02-18 |
Nikon Corporation |
Method for determining exposure condition, exposure method, exposure apparatus, and method for manufacturing device
|
|
US7304715B2
(en)
*
|
2004-08-13 |
2007-12-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US8305553B2
(en)
*
|
2004-08-18 |
2012-11-06 |
Nikon Corporation |
Exposure apparatus and device manufacturing method
|
|
US7701550B2
(en)
|
2004-08-19 |
2010-04-20 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7411657B2
(en)
*
|
2004-11-17 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7256121B2
(en)
*
|
2004-12-02 |
2007-08-14 |
Texas Instruments Incorporated |
Contact resistance reduction by new barrier stack process
|
|
US7446850B2
(en)
*
|
2004-12-03 |
2008-11-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7397533B2
(en)
*
|
2004-12-07 |
2008-07-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7196770B2
(en)
*
|
2004-12-07 |
2007-03-27 |
Asml Netherlands B.V. |
Prewetting of substrate before immersion exposure
|
|
US7365827B2
(en)
*
|
2004-12-08 |
2008-04-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7352440B2
(en)
*
|
2004-12-10 |
2008-04-01 |
Asml Netherlands B.V. |
Substrate placement in immersion lithography
|
|
US7403261B2
(en)
|
2004-12-15 |
2008-07-22 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7880860B2
(en)
|
2004-12-20 |
2011-02-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7528931B2
(en)
*
|
2004-12-20 |
2009-05-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7491661B2
(en)
*
|
2004-12-28 |
2009-02-17 |
Asml Netherlands B.V. |
Device manufacturing method, top coat material and substrate
|
|
US7405805B2
(en)
|
2004-12-28 |
2008-07-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US20060147821A1
(en)
*
|
2004-12-30 |
2006-07-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
SG124351A1
(en)
*
|
2005-01-14 |
2006-08-30 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
DE602006012746D1
(de)
*
|
2005-01-14 |
2010-04-22 |
Asml Netherlands Bv |
Lithografische Vorrichtung und Herstellungsverfahren
|
|
KR20180125636A
(ko)
*
|
2005-01-31 |
2018-11-23 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US8692973B2
(en)
*
|
2005-01-31 |
2014-04-08 |
Nikon Corporation |
Exposure apparatus and method for producing device
|
|
CN102360170B
(zh)
|
2005-02-10 |
2014-03-12 |
Asml荷兰有限公司 |
浸没液体、曝光装置及曝光方法
|
|
US8018573B2
(en)
|
2005-02-22 |
2011-09-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7378025B2
(en)
|
2005-02-22 |
2008-05-27 |
Asml Netherlands B.V. |
Fluid filtration method, fluid filtered thereby, lithographic apparatus and device manufacturing method
|
|
US7224431B2
(en)
*
|
2005-02-22 |
2007-05-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7428038B2
(en)
|
2005-02-28 |
2008-09-23 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and apparatus for de-gassing a liquid
|
|
US7282701B2
(en)
|
2005-02-28 |
2007-10-16 |
Asml Netherlands B.V. |
Sensor for use in a lithographic apparatus
|
|
US7324185B2
(en)
*
|
2005-03-04 |
2008-01-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7684010B2
(en)
*
|
2005-03-09 |
2010-03-23 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method, seal structure, method of removing an object and a method of sealing
|
|
US7330238B2
(en)
*
|
2005-03-28 |
2008-02-12 |
Asml Netherlands, B.V. |
Lithographic apparatus, immersion projection apparatus and device manufacturing method
|
|
US7411654B2
(en)
*
|
2005-04-05 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
USRE43576E1
(en)
|
2005-04-08 |
2012-08-14 |
Asml Netherlands B.V. |
Dual stage lithographic apparatus and device manufacturing method
|
|
US7291850B2
(en)
*
|
2005-04-08 |
2007-11-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US8089608B2
(en)
*
|
2005-04-18 |
2012-01-03 |
Nikon Corporation |
Exposure apparatus, exposure method, and device manufacturing method
|
|
US7433016B2
(en)
|
2005-05-03 |
2008-10-07 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US8248577B2
(en)
|
2005-05-03 |
2012-08-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7317507B2
(en)
*
|
2005-05-03 |
2008-01-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7751027B2
(en)
|
2005-06-21 |
2010-07-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7652746B2
(en)
*
|
2005-06-21 |
2010-01-26 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP2007005571A
(ja)
*
|
2005-06-24 |
2007-01-11 |
Nikon Corp |
露光装置及びデバイス製造方法
|
|
US7468779B2
(en)
*
|
2005-06-28 |
2008-12-23 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7474379B2
(en)
|
2005-06-28 |
2009-01-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7834974B2
(en)
|
2005-06-28 |
2010-11-16 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US8054445B2
(en)
*
|
2005-08-16 |
2011-11-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7357768B2
(en)
*
|
2005-09-22 |
2008-04-15 |
William Marshall |
Recliner exerciser
|
|
US7411658B2
(en)
*
|
2005-10-06 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7656501B2
(en)
*
|
2005-11-16 |
2010-02-02 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
US7864292B2
(en)
*
|
2005-11-16 |
2011-01-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7804577B2
(en)
|
2005-11-16 |
2010-09-28 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
US7633073B2
(en)
*
|
2005-11-23 |
2009-12-15 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP4765580B2
(ja)
*
|
2005-11-28 |
2011-09-07 |
株式会社ニコン |
液浸観察方法、液浸顕微鏡装置、及び検査装置
|
|
US20070124987A1
(en)
*
|
2005-12-05 |
2007-06-07 |
Brown Jeffrey K |
Electronic pest control apparatus
|
|
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(ko)
*
|
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|
|
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(ja)
*
|
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|
|
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(en)
|
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|
|
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(ja)
*
|
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|
|
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(en)
|
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|
|
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|
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|
|
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|
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|
|
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(en)
*
|
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|
|
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(de)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
|
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|
|
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(en)
*
|
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|
|
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(en)
|
2007-05-04 |
2010-11-30 |
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|
|
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(en)
*
|
2007-05-04 |
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|
|
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(en)
|
2007-05-04 |
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|
|
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(en)
*
|
2007-05-04 |
2011-01-11 |
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(zh)
|
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|
|
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(en)
*
|
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|
|
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(ja)
|
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|
|
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(ko)
*
|
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|
|
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(nl)
*
|
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|
|
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(en)
|
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|
|
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(en)
*
|
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|
|
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(es)
*
|
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(zh)
|
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|
|
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(ja)
|
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|
|
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|
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|
|
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(ja)
*
|
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|
|
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*
|
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|
|
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*
|
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|