TWI280368B - Inspection apparatus - Google Patents
Inspection apparatus Download PDFInfo
- Publication number
- TWI280368B TWI280368B TW094109696A TW94109696A TWI280368B TW I280368 B TWI280368 B TW I280368B TW 094109696 A TW094109696 A TW 094109696A TW 94109696 A TW94109696 A TW 94109696A TW I280368 B TWI280368 B TW I280368B
- Authority
- TW
- Taiwan
- Prior art keywords
- inspection
- display panel
- panel
- stage
- carrier
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Nonlinear Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004136092A JP2005315798A (ja) | 2004-04-30 | 2004-04-30 | 検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200535424A TW200535424A (en) | 2005-11-01 |
TWI280368B true TWI280368B (en) | 2007-05-01 |
Family
ID=35352961
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094109696A TWI280368B (en) | 2004-04-30 | 2005-03-29 | Inspection apparatus |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2005315798A (ko) |
KR (1) | KR100693715B1 (ko) |
CN (1) | CN1693902A (ko) |
TW (1) | TWI280368B (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101166839B1 (ko) * | 2005-12-29 | 2012-07-19 | 엘지디스플레이 주식회사 | 액정패널 검사 장치 |
JP5364240B2 (ja) * | 2007-03-20 | 2013-12-11 | 株式会社日本マイクロニクス | プローブユニット及び検査装置 |
KR101827313B1 (ko) * | 2017-09-19 | 2018-02-08 | 주식회사 에이치비테크놀러지 | AOI θ축 얼라인 조정이 가능한 이송장치를 갖는 인라인 스테이지 |
TWI692644B (zh) | 2019-06-18 | 2020-05-01 | 旺矽科技股份有限公司 | 電子元件針測裝置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR970075969A (ko) * | 1996-05-22 | 1997-12-10 | 엄길용 | 칼라필터를 구비하는 액정기판의 평활도 검사장치 및 검사방법 |
-
2004
- 2004-04-30 JP JP2004136092A patent/JP2005315798A/ja not_active Withdrawn
-
2005
- 2005-03-29 TW TW094109696A patent/TWI280368B/zh active
- 2005-04-11 KR KR1020050029972A patent/KR100693715B1/ko active IP Right Grant
- 2005-04-29 CN CNA200510068003XA patent/CN1693902A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
TW200535424A (en) | 2005-11-01 |
KR20060047174A (ko) | 2006-05-18 |
JP2005315798A (ja) | 2005-11-10 |
CN1693902A (zh) | 2005-11-09 |
KR100693715B1 (ko) | 2007-03-13 |
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