TWI240276B - Voltage generating circuit - Google Patents

Voltage generating circuit Download PDF

Info

Publication number
TWI240276B
TWI240276B TW093109720A TW93109720A TWI240276B TW I240276 B TWI240276 B TW I240276B TW 093109720 A TW093109720 A TW 093109720A TW 93109720 A TW93109720 A TW 93109720A TW I240276 B TWI240276 B TW I240276B
Authority
TW
Taiwan
Prior art keywords
voltage
node
level
internal
control signal
Prior art date
Application number
TW093109720A
Other languages
English (en)
Chinese (zh)
Other versions
TW200426834A (en
Inventor
Youichi Tobita
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of TW200426834A publication Critical patent/TW200426834A/zh
Application granted granted Critical
Publication of TWI240276B publication Critical patent/TWI240276B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408Address circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/30Power supply circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/211Design considerations for internal polarisation

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Dc-Dc Converters (AREA)
  • Dram (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW093109720A 2003-05-19 2004-04-08 Voltage generating circuit TWI240276B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003140079 2003-05-19
JP2003419716A JP4393182B2 (ja) 2003-05-19 2003-12-17 電圧発生回路

Publications (2)

Publication Number Publication Date
TW200426834A TW200426834A (en) 2004-12-01
TWI240276B true TWI240276B (en) 2005-09-21

Family

ID=33455503

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093109720A TWI240276B (en) 2003-05-19 2004-04-08 Voltage generating circuit

Country Status (6)

Country Link
US (2) US20040232974A1 (enExample)
JP (1) JP4393182B2 (enExample)
KR (1) KR100538021B1 (enExample)
CN (1) CN100414644C (enExample)
DE (1) DE102004024612B4 (enExample)
TW (1) TWI240276B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI594249B (zh) * 2012-09-14 2017-08-01 飛思卡爾半導體公司 具有充電泵浦之非揮發性記憶體及其方法

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004038919A1 (ja) * 2002-10-24 2004-05-06 Matsushita Electric Industrial Co., Ltd. 電圧発生回路、電圧発生装置及びこれを用いた半導体装置、並びにその駆動方法
US7248096B2 (en) * 2004-11-22 2007-07-24 Stmicroelectronics S.R.L. Charge pump circuit with dynamic biasing of pass transistors
US7317347B2 (en) * 2004-11-22 2008-01-08 Stmicroelectronics S.R.L. Charge pump circuit with reuse of accumulated electrical charge
JP4957913B2 (ja) 2005-11-17 2012-06-20 日本電気株式会社 半導体集積回路
US7443202B2 (en) * 2006-06-02 2008-10-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic apparatus having the same
KR101230313B1 (ko) 2006-07-05 2013-02-06 재단법인서울대학교산학협력재단 레벨 시프터 및 그의 구동 방법
JP4929999B2 (ja) * 2006-11-17 2012-05-09 セイコーエプソン株式会社 昇圧回路、その制御方法および電圧発生回路。
US7446596B1 (en) * 2007-05-25 2008-11-04 Atmel Corporation Low voltage charge pump
JP4969322B2 (ja) * 2007-06-01 2012-07-04 三菱電機株式会社 電圧発生回路およびそれを備える画像表示装置
US7808301B2 (en) * 2007-07-26 2010-10-05 Macronix International Co., Ltd. Multiple-stage charge pump circuit with charge recycle circuit
JP5142861B2 (ja) * 2008-07-09 2013-02-13 パナソニック株式会社 内部電圧発生回路
JP2011150482A (ja) * 2010-01-20 2011-08-04 Sanyo Electric Co Ltd 電源回路
KR101736453B1 (ko) 2011-01-05 2017-05-16 삼성전자주식회사 플래시 메모리 장치 및 그것의 워드라인 전압 발생 방법
KR101764125B1 (ko) * 2010-12-15 2017-08-02 삼성전자주식회사 음의 고전압 발생기 및 음의 고전압 발생기를 포함하는 비휘발성 메모리 장치
WO2017187553A1 (ja) * 2016-04-27 2017-11-02 東芝三菱電機産業システム株式会社 無停電電源装置
US10672453B2 (en) * 2017-12-22 2020-06-02 Nanya Technology Corporation Voltage system providing pump voltage for memory device and method for operating the same

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2820331B2 (ja) * 1991-06-21 1998-11-05 シャープ株式会社 チャージポンプ回路
KR950008453B1 (ko) * 1992-03-31 1995-07-31 삼성전자주식회사 내부전원전압 발생회로
JP2755047B2 (ja) * 1992-06-24 1998-05-20 日本電気株式会社 昇圧電位発生回路
DE19601369C1 (de) * 1996-01-16 1997-04-10 Siemens Ag Vorrichtung zur Spannungsvervielfachung, insb. verwendbar zur Erzeugung der Löschspannung für ein EEPROM
EP0855788B1 (en) * 1997-01-23 2005-06-22 STMicroelectronics S.r.l. NMOS negative charge pump
JP3853513B2 (ja) * 1998-04-09 2006-12-06 エルピーダメモリ株式会社 ダイナミック型ram
JP3476363B2 (ja) * 1998-06-05 2003-12-10 日本電気株式会社 バンドギャップ型基準電圧発生回路
JP3554497B2 (ja) * 1998-12-08 2004-08-18 シャープ株式会社 チャージポンプ回路
US6208196B1 (en) * 1999-03-02 2001-03-27 Maxim Integrated Products, Inc. Current mode charge pumps
US6501325B1 (en) * 2001-01-18 2002-12-31 Cypress Semiconductor Corp. Low voltage supply higher efficiency cross-coupled high voltage charge pumps
US6661682B2 (en) * 2001-02-16 2003-12-09 Imec (Interuniversitair Microelectronica Centrum) High voltage generating charge pump circuit
TW564434B (en) * 2002-02-22 2003-12-01 Ememory Technology Inc Charge pump circuit without body effects

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI594249B (zh) * 2012-09-14 2017-08-01 飛思卡爾半導體公司 具有充電泵浦之非揮發性記憶體及其方法

Also Published As

Publication number Publication date
CN100414644C (zh) 2008-08-27
DE102004024612A1 (de) 2004-12-23
TW200426834A (en) 2004-12-01
US20060028266A1 (en) 2006-02-09
JP2005006489A (ja) 2005-01-06
JP4393182B2 (ja) 2010-01-06
KR20040100933A (ko) 2004-12-02
US7365591B2 (en) 2008-04-29
US20040232974A1 (en) 2004-11-25
KR100538021B1 (ko) 2005-12-21
CN1551236A (zh) 2004-12-01
DE102004024612B4 (de) 2020-03-05

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Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees