TW505684B - A method of forming coatings - Google Patents
A method of forming coatings Download PDFInfo
- Publication number
- TW505684B TW505684B TW088118391A TW88118391A TW505684B TW 505684 B TW505684 B TW 505684B TW 088118391 A TW088118391 A TW 088118391A TW 88118391 A TW88118391 A TW 88118391A TW 505684 B TW505684 B TW 505684B
- Authority
- TW
- Taiwan
- Prior art keywords
- coating
- solvent
- resin
- patent application
- water
- Prior art date
Links
- 238000000576 coating method Methods 0.000 title claims abstract description 91
- 238000000034 method Methods 0.000 title claims abstract description 37
- 239000011248 coating agent Substances 0.000 claims abstract description 78
- 239000011347 resin Substances 0.000 claims abstract description 49
- 229920005989 resin Polymers 0.000 claims abstract description 49
- 239000002904 solvent Substances 0.000 claims abstract description 45
- 239000003054 catalyst Substances 0.000 claims abstract description 43
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 35
- 239000000758 substrate Substances 0.000 claims abstract description 28
- 238000000151 deposition Methods 0.000 claims abstract description 8
- 238000009833 condensation Methods 0.000 claims abstract description 5
- 230000005494 condensation Effects 0.000 claims abstract description 5
- 238000001704 evaporation Methods 0.000 claims abstract description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 15
- 229910052710 silicon Inorganic materials 0.000 claims description 15
- 239000010703 silicon Substances 0.000 claims description 14
- 230000007062 hydrolysis Effects 0.000 claims description 5
- 238000006460 hydrolysis reaction Methods 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 3
- 230000008020 evaporation Effects 0.000 claims description 2
- 230000008021 deposition Effects 0.000 abstract description 4
- 239000000243 solution Substances 0.000 description 31
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 24
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 21
- BGHCVCJVXZWKCC-UHFFFAOYSA-N tetradecane Chemical compound CCCCCCCCCCCCCC BGHCVCJVXZWKCC-UHFFFAOYSA-N 0.000 description 17
- 239000010410 layer Substances 0.000 description 16
- -1 saturated alkyl hydrocarbon Chemical class 0.000 description 16
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- 238000011049 filling Methods 0.000 description 14
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- 238000009835 boiling Methods 0.000 description 8
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- 238000010438 heat treatment Methods 0.000 description 7
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- 125000003118 aryl group Chemical group 0.000 description 4
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- 125000004122 cyclic group Chemical group 0.000 description 1
- 125000004210 cyclohexylmethyl group Chemical group [H]C([H])(*)C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- SQIFACVGCPWBQZ-UHFFFAOYSA-N delta-terpineol Natural products CC(C)(O)C1CCC(=C)CC1 SQIFACVGCPWBQZ-UHFFFAOYSA-N 0.000 description 1
- 150000004985 diamines Chemical class 0.000 description 1
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 1
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 1
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 description 1
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- 229940069096 dodecene Drugs 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
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- 150000002170 ethers Chemical class 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- OXZOLXJZTSUDOM-UHFFFAOYSA-N fluoro 2,2,2-trifluoroacetate Chemical compound FOC(=O)C(F)(F)F OXZOLXJZTSUDOM-UHFFFAOYSA-N 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 235000008397 ginger Nutrition 0.000 description 1
- 239000008236 heating water Substances 0.000 description 1
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000000623 heterocyclic group Chemical group 0.000 description 1
- 125000004836 hexamethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[*:1] 0.000 description 1
- 150000007857 hydrazones Chemical class 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 239000003350 kerosene Substances 0.000 description 1
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- 239000010985 leather Substances 0.000 description 1
- XMGQYMWWDOXHJM-UHFFFAOYSA-N limonene Chemical compound CC(=C)C1CCC(C)=CC1 XMGQYMWWDOXHJM-UHFFFAOYSA-N 0.000 description 1
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- 150000002632 lipids Chemical class 0.000 description 1
- 239000006210 lotion Substances 0.000 description 1
- OKKJLVBELUTLKV-UHFFFAOYSA-N methanol Substances OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- YQYUUNRAPYPAPC-UHFFFAOYSA-N n,n-diethyl-2-methylaniline Chemical compound CCN(CC)C1=CC=CC=C1C YQYUUNRAPYPAPC-UHFFFAOYSA-N 0.000 description 1
- SMBYUOXUISCLCF-UHFFFAOYSA-N n-ethyl-n-methylpropan-1-amine Chemical compound CCCN(C)CC SMBYUOXUISCLCF-UHFFFAOYSA-N 0.000 description 1
- 125000003136 n-heptyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
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- 239000013557 residual solvent Substances 0.000 description 1
- 230000005070 ripening Effects 0.000 description 1
- CVHZOJJKTDOEJC-UHFFFAOYSA-N saccharin Chemical compound C1=CC=C2C(=O)NS(=O)(=O)C2=C1 CVHZOJJKTDOEJC-UHFFFAOYSA-N 0.000 description 1
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- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
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- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
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- 239000010409 thin film Substances 0.000 description 1
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- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- YFNKIDBQEZZDLK-UHFFFAOYSA-N triglyme Chemical compound COCCOCCOCCOC YFNKIDBQEZZDLK-UHFFFAOYSA-N 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
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- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/50—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials
- C04B41/5025—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials with ceramic materials
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02203—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being porous
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- H—ELECTRICITY
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- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02214—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen
- H01L21/02216—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02359—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment to change the surface groups of the insulating layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S428/00—Stock material or miscellaneous articles
- Y10S428/901—Printed circuit
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24917—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including metal layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24926—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including ceramic, glass, porcelain or quartz layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31652—Of asbestos
- Y10T428/31663—As siloxane, silicone or silane
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Materials Engineering (AREA)
- Structural Engineering (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Formation Of Insulating Films (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Paints Or Removers (AREA)
- Coating Of Shaped Articles Made Of Macromolecular Substances (AREA)
Description
A7
505684 五、發明說明(1 ) 本發明係關於一種藉由沈積含有Si-H基團之樹脂與溶劑 (溶液,於基材上形成塗層之方法,其方式其巾溶劑仍然 留在塗層中,接著使此塗層曝露至鹼性觸媒與水,然後自 塗層蒸發溶劑。本發明之方法特別可用於塗敷低介電常數 塗層在電子裝置上。 於電子裝置上之薄膜介電塗層、,係爲此項技藝中已知的 。例如,美國專利4,749,631與4,756,977,揭示以矽石爲基料 之塗層,藉由將矽烷氧化物或氫矽倍半氧烷之溶液個^塗 敷至基材’然後將已塗覆之基材加熱至2〇〇_1〇〇〇t之溫度而 製成。但是,此等塗層之介電常數,對某些電子裝電 路而言經常過高。 美國專利4,847,162與4,842,888亦陳述藉由將氫矽倍半氧燒 樹脂與矽酸酯,於氨存在下,個別加熱至2〇〇與1〇〇〇τ間之 溫度,以形成氮化矽石塗層。此等參考資料陳述使用無水 氨’因此所形成之塗層具有1至2重量%之氮摻入其中。 在非結晶性固體期刊,64 (1984)第209-221頁中,係陳述在 氨存在下,藉由加熱四乙氧基矽烷,形成g瓷塗層。但是 ,與上文,162 —樣,此參考資料亦陳述氨應爲無水,且所 形成之矽石塗層係經氮化。 美國專利4,636,440揭示一種使溶膠-凝膠所塗覆基材之乾 燥時間降低之方法,其包括使基材曝露至含水氫氧化四級 銨及/或烷醇胺化合物。但是,此參考資料之方法與本文 中所揭示者,不同之處在於’此塗層需要在加熱之前經乾 燥,且特別受限於經水解或經部份水解之矽垸氧化物,及 -4- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閲讀背面之注意事項再填寫本頁) MMW--------tr-------ΙΛ9. 經濟部智慧財產局員工消費合作社印製 DID ⑽ 4 A7 B7 五、發明說明(2 未陳述此方法在具有Sl_H键結之塗層上之利用性。 美國專利5,262,201與5,116,637陳述使用鹼性觸媒,以降低 ,種=陶瓷材料(包括氫矽倍半氧烷)轉化成陶瓷塗層所必 乃、心恤度。但疋,此等參考資料係陳述在使塗 性觸媒之前移除溶劑。 驗 美國專利5,547,703陳述一種在基、材上形成低介電常數之含 ΙΟ塗層之方法,纟包括連續在潮濕氨、無水氨及氧之下 ,加熱氫矽倍半氧垸樹脂。所形成之塗層具有在1}_下 之介電常數低達2·42。但是,再一次,此參考資料陳述在 使塗層轉化成陶瓷之前移除溶劑,且所形成塗層之介電常 數並未如本文中所揭示者一樣低。 、吴國專利5,523,163陳述一種在基材上形成含&_〇塗層之方 法,其包括將氫石夕倍半氧燒樹脂加,以使其轉化成含仏 〇陶瓷塗層,然後使此塗層曝愈至含有氫氣之回火氣層。 所形成之塗層具有介電常數低達2773。但是,此參考資料 陳述在使塗層轉化成陶瓷之前移除溶劑,且所形成塗層之 介電常數並未如本文中所揭示者一樣低。一 、美國專利5,618,878陳述已溶於飽和烷基烴中之含有氫矽倍 半氧烷樹脂之塗料組合物,其可用於形成厚陶瓷塗層。所 揭不I烷基烴係爲高達十二烷者。但是,此參考資料並未 陳述在溶劑移除之前,使已塗覆之基材曝露至鹼性觸媒。 消 訂 本案發明人目前已發現,在完全移除溶劑之前,經由使 含Si-H之樹脂曝露至鹼性觸媒,則可產生具有低 之多孔網狀組織塗層。 一 5- 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公爱) 經濟部智慧財產局員工消費合作社印製 )05684 五、發明說明(3 ) 一方面,本發明係關於一種在基材上形成塗層之方法。 此方法包括在基材上,以包含具有至少2個Si-H基團之樹脂 與溶劑之溶液,沈積塗層,其方式爲其中至少5體積%之 >谷劑於沈積後仍然留在塗層中。然後使此塗層曝露至包含 鹼性觸媒與水之環境中。最後,使溶劑自塗層蒸發,以形 成多孔網狀組織。若需要,可將、塗層加熱以形成陶瓷。 在其他方面’本發明·係關於藉上述方法製成之塗層,以 及使用於此方法中之塗料溶液。 本發明係基於發現鹼性觸媒與水可用以自含&_Η之樹脂 形成新穎多孔網狀組織塗層。此種塗層可用於電子基材上 ,因其具有低介電常數。 本發明之方法特別可應用於諸塗層在電子裝置或電子電 路上足沈積,其可於其中充作層間介電層,經摻雜之介電 層以產生電晶體裝置,含矽之裝填顏料黏合劑系統,以產 生電容器與電容器裝置,多層裝置,3①裝置,絕緣體外 延矽裝置及超晶格裝置。但是,欲被本發明塗覆之基材與 裝置(選擇,僅受限於基材在本發明中使g之溫度鱼氣声 下需要具有熱與化學安定性。因此,本發明之塗射使^ 於基材上,譬如塑膠,包括例如聚酿亞胺、環氧樹脂 四氟乙晞及其共聚物、聚碳酸酯、丙缔酸系樹脂 〆 陶瓷材料,皮革,纺織品及金屬〇 9 當在本發明中使用時,"陶瓷"之措辭係包括陶瓷 譬如非晶質石夕石,及似陶资材料,譬如非晶質似石夕料 ,其並未完全不含碳及/或氫,但在其他方面於特徵上爲 -----*6- ‘紙張尺度適用中國國家標準(CNS)A4規格(210 ------—^---------. (請先閱讀背面之注意事項再填寫本頁〕 505684 A7 B7 五、發明說明(4 陶瓷^且"電子裝置”或,,電子電路"措辭係包括但不限於矽 爲基料之裝置,砷化鎵爲基料之裝置,碳化矽爲基料之裝 置,焦平面陣列,光電子裝置,光生伏打電池及光學裝置。 可用於本發明之含有至少2個&_Η基團之樹脂,並不特別 爻到限制,只要Si_H键結可被水解,且被鹼性觸媒與水至 少邵份縮合以形成交聯網狀組織、即可,其係充作多孔網狀 、、且織之結構。一般·而言,此種材料具有下式: %si(j1/2UR2Si〇2/2}b{RSi〇3/2}c{si〇4/2}d,其中各反係 ^ 選自氫、烷基、烯基或芳基,或被雜原子取代之烷基、烯 基或芳基/該雜原子譬如自素.、氮,硫、氧或矽,以及 a,b,c及d爲特定單位之莫耳分率,且其總合爲ι,其附帶 條件是每分子至少2個&基圏爲氫,且該材料在結構上爲 足夠樹脂性,以形成所要之網狀組織。燒基之實例爲甲基 、乙基、丙基及丁基,其中以Γ_6個碳原子之烷基較佳。 基(實例包括乙烯基、烯丙基及己晞基。芳基之實例包括 苯基。經取代基團之實例’包括CF3(CF2)nCH2CH2(其中㈣〇 〇 * 經濟部智慧財產局員工消費合作社印製 -----------1 (請先閱讀背面之注意事項再填寫本頁) 於本發明中特佳者爲各種氫切氧燒樹脂,稱爲氣抑 半氧烷樹脂,其包含式HSi(OH)x(OR)y〇z/2單位。在此式中7 各R係如上文定義《當此等尺基團經過氧原子結合至矽 ,其係形成可水解之取代基。在上式中,; Η 至2 ; Z=1至3,且x + y + z = 3。此等樹脂基本上可 人 縮合之(HSi03/2)n,其中…或較大’或其可爲僅經部:: 解(意即,含有一些Si_〇R)及/或部份縮合(意即,含有一 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(5 ) 些 Si-OH) 〇 此樹脂之結構並未特別爭| 付刎又到限制。此樹脂之結構可 般在梯型、籠型或其混合物中 支二山I链η 物中所已知者。此寺樹脂可含有 禾峰基,譬如歹坐基、三右嬙访ρ^ 一 一有機矽烷氧基、二有機氫矽烷氧基 、三烷氧基矽烷氧基及签甘a 乳丞及一烷虱基矽烷氧基。雖然並未以此 結構表示,但此等樹脂亦可本女^ - 了0免少數(例如低於約10% )且 有0或2個氫原子連接至並上夕 . 八 妖芋八上疋矽原子,及/或少數Sic基 團,譬如 CH3Si03/24HCH3Si〇2/2 基團。 丞 上述含有至少2個Si-H基團之樹脂,及其製造方法,係得 知自美國專利3,615,272,其係陳.述藉以下方法製造基本上 完全縮合之氫矽倍半氧烷樹脂(其可含有高達1〇〇_3〇〇 ppm之 夕k醇)4方法包括使二氣基珍燒在苯續酸水合物水解 媒質中水解,然後以水或硫酸水溶液洗滌所形成之樹脂。 同樣地’在美國專利5,〇1〇,159中係陳述一種方法,包括使 氫化矽烷在芳基磺酸水合物水解媒質中水解,以形成樹脂 ’然後使其與中和劑接觸。 其他氳化矽氧烷樹脂,譬如由美國專利4,^99,397所述者; 由美國專利5,210,160所述者,經由使貌氧基或醯氧基石夕燒 在酸性、醇性水解媒質中水解所製成者;於日本公開專利 案59-178749、60-86017及63-10:7122中所述者;或任何其他等 效氫化矽氧烷,亦將於此處發揮功用。 在本發明之一項較佳具體實施例中,上述氫矽倍半氧烷 樹脂之特定分子量部份,亦可使用於此方法中。此種部份 及其製法,係陳述於美國專利5,063,267與5,416,190中。較佳 -8 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) >1— .—I—^--------- (請先閲讀背面之注意事項再填寫本頁) A7
川5684 五、發明說明(6 ) 郅份包括其中至少75%聚合物種具有分子量高於12〇〇之材 料,及更佳部份包括其中至少75%聚合物種具有數目平均 分子量在1200與1〇〇,〇〇〇間之材料。 氫矽倍半氧烷樹脂可含有其他成份,只要此等成份不會 干擾塗層之完整性即可。但是,應注意的是,某些物質可 増加塗層t介電常數。已知之添、加劑,包括觸媒,譬如鉑 、鍺或銅觸媒,其會增加樹脂熟化之速率及/或程度,如 在美國專利4,822,697中所述者。 陶瓷氧化物先質亦可與氫矽倍半氧烷樹脂合併使用。可 用於此處之陶瓷氧化物先質,包括各種金屬,譬如鋁、鈦 、锆、钽、鈮及/或釩之化合物,以及各種非金屬化合物 ,譬如硼或磷之化合物,可使其溶於溶液中,水解及接著 在相對較低溫度下熱解,以形成陶资氧化物。可用於此處 之陶资氧化物先冑,係肖述於美國專利4 808,653、5,娜,32〇 及 5,290,394 中。 上述含&-H之樹脂,係以溶劑分散液塗敷至基材。可使 用之溶劑,包括將溶解或分散樹脂以形成均勾液體混合物 ’而不會影嚮所形成之塗層或基材之任何作用劑或作用劑 之混合物。此等溶劑可包括醇類,譬如乙醇或異丙醇;芳 族^類,#如苯或甲$ ;分枝狀或線性燒類,#如正-庚 烷、十二烷或壬烷;分枝狀或線性烯類,譬如正-庚缔、 十二晞或十四m譬如甲基異τ基酮m酸類 ,,如二醇醚類,·或矽氧烷類,譬如線性(例如六甲基二 梦氧;^ '八甲基二碎氧垸及其混合物)、環狀二甲基聚矽 _ ........... ... - 9 - 本紙張尺度刺帽國祕4 (Usjs)A4祕咖χ挪公髮) --------^. (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 A7 A7
五、發明說明(7 ) (請先閱讀背面之注意事項再填寫本頁) 氧燒’或任何上述溶劑之混合物。溶劑通常係以足以溶解 /分散樹脂至塗敷所要濃度之量存在。典型上,以樹脂與 落劑之重量爲基準,此溶劑係以2〇至99 9重量。/。,較佳爲 70至9S重量%之量存在。 若需要可將其他物質加入樹脂分散液中。例如,此分散 液ΤΓ包含填料、著色劑、黏著促進劑等。 塗敷樹脂分散液至基材之特定方法,包括但不限於旋轉 塗覆、浸塗、噴塗、流動塗覆、網版印刷或其他。較彳與塗 敷方法爲旋轉塗覆。 對本發明重要的是,至少5體.積%之溶劑仍然留在塗層 中’直到樹脂與鹼性觸媒及水接觸爲止。當使Si_H鍵結水 解及縮合時,此溶劑會形成多孔網狀組織塗層之孔隙。在 一些具體實施例中,可較佳地爲至少1〇體積0/。溶劑留下。 在其他具體實施例中,可較隹地爲至少15體積%溶劑留下 。於又其他具體實施例中,可較佳地爲至少25體積0/。溶劑 留下。 經濟部智慧財產局員工消費合作社印製 保持各劑之方法並未特別受到限制。在一較佳具體實施 例中,高沸點溶劑係單獨使用,或與其中一種上述溶劑作 爲共溶劑。依此方式,在正常條件下處理如上述之樹脂分 散液’使得至少5%殘留溶劑留下。欲被使用於本發明之 此項具體實施例中之較佳高沸點溶劑,係爲具有沸點高於 175°C者。此種溶劑之實例包括烴類、芳族烴類、酯類及醚 類。可使用於本發明此項具體實施例中之特定溶劑,其實 例包括飽和烴類,譬如十二烷、十四烷、十六烷,不飽和 _ -10 - 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱)'' ------ 州(>84 五、 發明說明(8 ) 烴類,譬如十二烯、十四烯,二甲苯類、13,^三甲苯、1 庚醇、二戊晞、d_檸檬油精、四氫呋喃甲醇、礦油精、2 辛醇、Stoddard溶劑、IsoparH^、草酸乙酯、二戊醚、四气 唆喃-2-甲醇、乳酸丁酯、異辛醇、丙二醇、二丙二醇單= 基醚、二乙二醇二乙基醚、二甲亞颯、2,孓己燒二酮、醋 酸2- 丁氧基乙醇酯、二乙二醇單、甲基醚、i辛醇、乙二^ 、Is〇ParLtm、二丙二醇單甲基醚醋酸酯、二乙二醇單乙美 酸、N-甲基四氫吡咯酮、乙二醇二丁基醚、厂丁内脂二 1,3- 丁二醇、二乙二醇單甲基醚醋酸酯、三亞甲基二醇、 三乙二醇二甲基醚、二乙二醇單乙基醚醋酸酯、…萜品醇 、正.己基醚、煤油、2-(2_正_ 丁氧基乙氧基)乙醇、草酸二 丁酯、碳酸丙烯酯、丙二醇單苯基醚、二乙二醇、兒茶酚 、二乙二醇單丁基醚醋酸酯、乙二醇單苯基醚、二乙二醇 二丁基醚、二苯基醚、乙二醇車苄基醚、對苯二酚、環丁 石風及三乙二醇。烴溶劑係爲特佳的。 經 濟 部 智 慧 財 產 局 員 工 消 費 合 作 社 印 製 在本發明之第二個較佳具體實施例中,上述處理(意即 主要是塗料落液之沈積)係在與鹼性觸媒及水接觸之前, 糸抑制蒸發之環境中完成。例如,旋轉塗覆可在密閉 裱境中施行,以致本發明之後續步驟(意即,與鹼性觸媒 及水接觸)可在溶劑完全蒸發之前發生。 …:後,使含有至少5體積。/。溶劑之塗層,與驗性觸媒及 水接觸。鹼性觸媒之實例,包括氨、氫氧化銨以及胺類。 可用於此處之胺類,可爲一級胺類、二級胺類(R2NH) 及/或二級胺類(R^N),其中R係獨立爲⑴飽和或不飽和脂 Α7 Β7 五、發明說明(9 族’譬如甲基、乙基、丙基、乙烯基、烯丙基及乙炔基, (2)脂環族,譬如環己基甲基,(3)芳族,譬如苯基,⑷經 取代心雜原子,譬如氧、氮及硫,或(5)其中氮原子爲雜環 <一個成員之化合物,譬如喹啉、四氫吡咯或吡啶。此外 ,任何上述胺化合物可被其他烴及/或含雜原子之基團取 代:以形成譬如二胺與醯胺之化、合物。最後,亦意欲涵蓋 的是,在所使用之反應條件下被轉化成胺類之化合物,將· .以相當万式發揮功用。例如,會在溶解時產生胺之化合物 ’譬如銨鹽,將提供所要之催化作用。 可使用於本文中之特定胺類之實例,包括甲胺、乙胺、 丁胺、烯丙基胺、環己胺、苯胺、二甲胺、二乙胺、二辛 胺一丁胺、甲基乙胺、糖精、六氫P比淀、三甲胺、三乙 胺”比症、二乙基甲苯胺、乙基甲基丙胺、味峻、膽驗醋 酸鹽、三苯磷苯胺、三甲基矽烷基咪唑、乙二胺、二乙基 胺、二乙二胺及甲基四氫p比洛g同。 鹼性觸媒通常可於任何濃度下使用,以催化汾屯鍵結之 :解作用。—般而言,鹼性觸媒之濃度可ilPPm至⑽重 量%,以樹脂之重量爲基準,依鹼性觸媒而定。 被使用於本發明中之水,可爲存在於周園環境之中者( 例=>251。相對濕度),周圍環境可補充其他水蒸汽(例如相 對微度问達100〇/〇 ),水可作爲液體使用,或可 备 應條件下產生水之化合物。 曰在反 、塗層與鹼性觸媒及水之接觸,可藉任何實用或所想要之 方式達成。例如,此塗層可與鹼性觸媒及水蒸汽之蒸氣接 -12- I______—___- I匕麵 本紙張尺度賴巾目國家標準(CNS)A^ i格(210 X 297公爱) 505684 經濟部智慧財產局員工消費合作社印製 A7 五、發明說明(1〇 觸或者,塗層可與呈液態之鹼性觸媒及水接觸。例如, 可將塗層浸沒在含水之鹼性觸媒溶液中。 在本發明之-項較佳具體實施例中,係使樹脂塗層曝露 至包含驗性觸媒與水而呈其氣態之環境中。可藉任何實用 万式,曝露至上述狀態。在一項更佳具體實施例中,係使 樹脂塗層曝露至氨與水蒸汽。、 - 在此較佳具體實施例中,例如可將已塗覆之基材簡單地 放置在容器中,並於其中引進適當環境,或者,可地 將驗性觸媒與水之氣流,導向塗層。 、在此項較佳具體實施例中,甩以產生驗性觸媒與水環境 、方法通g亦不重要。一些方法,譬如使驗性觸媒(例 如氨氣)起泡經過水或氫氧化銨溶液(以控制水蒸氣存在量) ,將鹼性觸媒與水加熱,或將水加熱並引進鹼性觸媒氣體 (例如氨氣),於此處均可發生功用。亦意欲涵蓋的是,^ 當場產生鹼性觸媒蒸氣之方法,譬如添加水至胺鹽,或添 加水至矽氮烷,譬如六甲基二矽氮烷,亦有效。 h 使用於此項較佳具體實施例中之鹼性觸i,可在所要之 任何濃度下。例如,此濃度可爲0·01至高達飽和氣層。 在本發明之此項較佳具體實施例中,曝露可在所要之任 何溫度下,從室溫至高達3〇〇°C。一般而言,此溫度係在2〇 至高達20(TC之範圍内,其中以20至高達i〇(TC之範圍較佳。 在本發明之此項較佳具體實施例中,應使樹脂塗層曝露 至鹼性觸媒與水環境,歷經使Si-Η基團水解以形成矽烷醇 (Si-OH),及使此矽烷醇至少部份縮合以形成Si_〇_Si鍵結, 13 - 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂 505684 A7 B7 五、發明說明(11 ) 所必須之時間。一般而言,古 甘士 宜 至同20分鐘之曝露,係爲較佳 ,其中以曝露至少1秒至合、去^、 乃竿乂佳 若本發明之塗層欲作dn圭。應注意的是, 時間之曝露,因較長時間之佳係具有較短 傾向。 暴路有增加塗層之介電常數之 在本發明之一項替代具體告 - 访铲、认以, 、私灵施例中,係使塗層曝露至呈 性觸媒然後是-水。在-項更佳具體實施例中,液 肢鹼性觸媒與水,係爲氫氧化銨溶液。 4 在此具體實施例中’驗性觸 觸媒與水曝露,通常僅藉由將 已塗復i基材浸沒在溶液中推 成中進仃<。、但是,其他等效方法 ’巨如以驗性觸媒與水溶液德鋒由 履運續冲洗塗層,亦發揮其功能 。此外,*空滲入亦可用以増加鹼性觸媒與水之浸透至塗 層中。 使用於此項具體實施例中之鹼性觸媒溶液,可在所要之 任何濃度下。-般而言,當使用氫氧化銨時,濃水溶液讲 3〇%)係爲較佳的,因爲曝露時間於是被縮短。當欲使用稀 溶液時,稀釋劑通常爲水。 ·- 在此具體實施例中,曝露至鹼性觸媒與水溶液,可於所 要之任何溫度與大氣壓力下進行。溫度從室溫(2〇_3〇ec')至 高達鹼性觸媒溶液之沸點,及氣層從低於至高於大氣壓力 ,均意欲涵蓋於本文中。但是,自實用觀點看來,曝露較 佳係發生在室溫下及大氣壓力下。 在本發明之此項具體實施例中,係使樹脂塗層曝露至驗 性觸媒溶液,歷經使Si-H基團水解以形成矽垸醇(si_〇H)及 14- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) · tmmmm n mmmmmm emmam tmmmm Mmm§ tmMB J ,_ amm· a··· ·μ·μ *···ι wn··肅 * 言 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明(12 少::縮合以形成,所必須之時 露至少=高 體體實施例中,係使塗層曝露至液 水蒸汽環境(氨氣 中,曝露可爲相繼或:同,)且明之此項具體實施例 下。 、· 且通吊係在與上述相同之條件 脂塗層曝露至其中一個上述環境後 塗 和除洛劑。這可藉任何所要方 熱’以完成所形成錢醇之縮合。⑴了 W層加 在ί谷劑移除之前、期間沐 #技典、4、 或(後,若需要,則使所形成之 皿度《作用’以使塗層轉化成陶瓷…般而+, 此溫度係高於室溫,其中以_域之::而“ 溫度通常會造成更快速且更完全轉化成陶 :; 對於各種對溫度敏感之基材,亦可能W作用ϋ又 =塗層,等溫度,歷經足以使塗層陶资化之時間, Λ局至间6小時’其中以5分鐘與6小時間之範圍較佳, 而以10分鐘與2小時間之範圍更佳。 及可在眞空至超大氣壓之任何有效大氣壓力下, 及在任何有效氣態環境,譬如惰性氣 是,尤佳係在氮大氣下加熱。 亦意欲被上述説明涵蓋在内的是,樹脂塗層可同時曝露 至驗性觸媒與水環境(液體或氣體),並接受足以使其轉化 15- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ------------f (請先閱讀背面之注意事項再填寫本頁) n n n n —--------- 經濟部智慧財產局員工消費合作社印製 505684
五、發明說明(13) 成陶瓷之溫度。該曝露以及該陶瓷化所必須之時 w (請先閱讀背面之注意事項再填寫本頁) ,通常係與上述相同。 /、/皿又 任何加熱方法,譬如利用對流烘箱或輻射或微波能,通 常可於此處發揮功用。再者,加熱速率亦不重要,但最實 用且較佳係儘可能迅速地加熱。 ' 在一典型程序中,係將基材以、含si_H之樹脂與溶劑塗覆 ,其方式係確保至少5體積%之溶劑仍然留在塗層中,然 後,使已塗覆之基材曝露至鹼性觸媒與水,蒸發溶劑並將 已塗覆足基材置於對流烘箱中。此烘箱環境係充滿惰性氣 體,譬如氮。然後,提升烘箱中之溫度至所要之程度(譬 如450°C ),並在惰性大氣下保持所要之時間(譬如5分鐘_ 2 小時)。 藉由上述方法,在基材上產生薄(低於5微米)陶瓷塗層 。此塗層係使各種基材之不規則·表面平滑化,並具有優越 黏著性。此外,此塗層可被其他塗層覆蓋,譬如其他si〇2 塗層、Si〇2 /改質陶瓷氧化物層、含矽塗層、含秒碳塗層 、含秒氮塗層、含矽氮碳塗層及/或似金剛石之碳塗層。 經濟部智慧財產局員工消費合作社印製 雜本發明製成之塗層,具有低缺陷密度,並可用於電子 裝置上,作爲在例如多層裝置中之介電層。 加入下述非限制性實例,因此熟諳此藝者可更易於瞭解 本發明。 實哲』 將籍由美國專利3,615,272之方法製成之H-樹脂,在甲基異 丁基_中稀釋至26重量百分比之固體。以十四烷稀釋此沁 _____-16-_ 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -- 505684 A7 五、發明說明(14) 樹脂/甲基異丁基酮溶液,以形成列示於表1中之一系列 溶液。將4英吋直徑1亳歐姆_公分〜型矽晶圓,以表1中列 不之各溶液塗覆,其方式是在3〇〇〇 φΠ1下旋轉2〇秒。 將已塗覆之矽晶圓曝露至具有環境水份之氨氣層,歷經 3〇秒,然後在氮氣中,於45〇°C下加熱1〇分鐘。表2顯示留 在薄膜中之十四烷含量,對於所造成介電常數之作用。> • 表1 每百份中所添加 十四烷在溶液 十四烷之份數 中之重量%, 溶液編號 1 2 3 4 5 6 10 15 20 30 9.09 13.04 16.67 23.07 溶液編號 表 2、 所度量之十四十四烷之最大 經濟部智慧財產局員工消費合作社印製 1 2 3 4 5 6 實例2 烷體積% 0 15.9 24.4 44.7 52.8 60.5 理論體積% 0 21.1 36.4 48.0 57.0 70.2 介電常數 3.0 2.97 2.49 2.16 1.91 1.71 將藉由美國專利3,615,272之方法製成之h_樹脂·,在甲基姜 2财稀釋至26重量百分比之固體。以每百㈣份或2: 重-百分比之十四燒,稀釋此脂/甲基異丁基刪 以此洛敗塗覆兩個4英吋直徑〗毫歐姆-公分n_型矽日 -17- 本紙張尺度· 家鮮祕(21G X 297讀 ϋ n ϋ —κ ϋ n an n n n · «I n ·1 n f— ϋ n 一一0, t n d n n n n n I (請先閱讀背面之注意事項再填寫本頁) A7 五、發明說明(15) (請先閱讀背面之注意事項再填寫本頁) ’其方式是在3_聊下旋轉2〇秒。然後,使晶圓之一曝露 至具有環境水份之氨氣層,歷經3Q秒,然後在氮氣及赋 下加熱1G分鐘。此薄膜在晶圓上之介電常數,經測定係爲 1.71。使用第二個晶圓作爲比較實例。將其在8〇。。之眞空 烘箱中放置10分鐘,以移除薄膜中殘留之十四垸溶劑。在 溶劑移除後,使晶®轉至具有、環境水份之氨氣層歷經% 秒,然後在氮氣及45(TC下加熱10分鐘。第二個晶圓之介電 常數,經測定係爲2.97。 實例3 ’ 將藉由美國專利3,615,272之方法製成之H_樹脂,在甲基異 丁基酮中稀釋至26重量百分比之固體。將H_樹脂/甲基異 。丁基酮溶液,以不同之高沸點溶劑稀釋,以形成列示於表 ^中足一系列溶液。將4英吋直徑丨毫歐姆_公分〜型矽晶圓 ,以列7F於表3中之各溶液塗覆,其方式是在3〇〇〇印㈤下旋 轉20秒。 使已塗覆之矽晶圓曝露至具有環境水份之氨氣層歷經3〇 秒,然後在氮氣及450°C下加熱1〇分鐘。表4顯示各種沸點 之溶劑,對於所形成薄膜介電常數之作用。 經濟部智慧財產局員工消費合作社印製 表3 落液編號 溶劑(重量% ) 沸點 1 100% ΜΓΒΚ 117.4 2 丙二醇甲基醚(16.6% ) 120 3 丙二醇正-丁基醚(16.6% ) 171 4 十四烷(16.6% ) 254 •18- 本紙張尺度適用中國國家標準(CNS)A4 i格(210 X 297公髮) 505684 A7 B7 五、發明說明(16 ) 表4 溶液編號 介電常數 1 3.0 2 3.3 3 3.2 4 1.91 實例4 ‘ 、 將藉由美國專利3,615,272之方法製成之H_樹脂,按表5中‘ 所列7F,以甲基異丁基酮或八甲基四矽氧燒稀釋至表5中 所列不之濃度。然後,使用十四烷,以表5中列示之‘, 稀釋此樹脂/甲基異丁基酮或矽氧烷溶液。將*英吋直 徑1毫歐姆-公分n•型矽晶圓,以列示於表5中之各溶液塗 復,其方式是在表5中所列示之速度與時間下旋轉。 '' ,已塗覆之妙晶圓曝露至具有環境水份之氨氣層,歷妹 A6:所指不之時間,然後在氮氣及喊下加熱1。分鐘Γ 表6頒示不同沸點溶劑對於所形成膜 〇 々电吊數之作用 (請先閱讀背面之注意事項再填寫本頁) .MMW--------^—------ΜΨ. 經濟部智慧財產局員工消費合作社印製 19 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 χ 297公釐) 505684 A7 _B7 五、發明說明(17 ) 經濟部智慧財產局員工消費合作社印製 表5 溶液 溶 液 旋轉 NH3 Tx # 樹脂 MIBK1 OMTS2 C14H30 速度 時間 時間 (克) (克) (克) (克) (rpm) (秒) (秒) 1 1.8 8.2 - 2 2000 20 15 2 - 2.5 2000 20 15 3 - 3 2000 20 IS 4 2.6 7.4 - X 3000 20 IS 5 - 2.5 3000 20 15 6 •篇 3 3000 20 15 7 2.6 7.4 - 2 3000 20 3Q 8 - 2.5 3000 20 30 9 - 3 3000 20 30 10 3.3 麵 6.7 •2 -3000 20 30 11 - 2.5 3000 25 30 12 麵 3 3000 30 30 I甲基異丁基酮 2 -八甲基四石夕氧貌 n 1- I ϋ n «ϋ n ·ϋ 11 · 1·— ί ϋ n n n ϋ .1 _,> 1· ϋ ϋ n I n «ϋ I (請先閲讀背面之注意事項再填寫本頁) -20- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 505684 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(18) 表6 性質 晶圓 溶液 # 厚度(A) 平均標準偏差 折射率 平均 標準偏差 介電常數 平均 標準偏差 1-1 1 10101 72 1.148 0.002 1.85 0.08 1-2 1 9548 52 1.157 0.003 1.94 0.11 2-1 2 10871 113 1.121 0.001 1.69 0.02 2-2 2 10699 119 1.124 、 0.001 1.63 0.03 3-1 3 11189 80 1.107 0.007 1.5β 0.04 3-2 3 11586 105 _ 1.105 0.001 1.54 0.04 4-1 4 11416 728 1.19 0.065 2.24 0.02 4-2 4 11323 290 1.185 0.01 2.04 0.02 5-1 5 11283 188 1.161 0.005 2.18 0,04 5-2 5 11503 253 1.159 . 0.005 1.85 0.04 6-1 6 11844 268 1.14 0.003 1.75 0 6-2 6 11508 200 1.14 0.04 1.88 0.08 7-1 7 11101 429 1.203 0.059 2.23 0.09 7-2 7 11360 322 1.212 0.081 2.23 0.04 8-1 8 11452 207 1.185 0.066 2.17 ,0.06 8-2 8 11626 143 1.159 . 0.004 2.25 0 9-1 9 11544 137· 1.142 0.002 1.69 0.01 9-2 9 11894 121 1.139 0.002 1.75 0.02 10-1 10 11019 235 1.212 0.009 2.12 0.03 10-2 10 11210 134 1.214 0.004 1.99 0.02 11-1 11 11727 153 1.196 0.004 2.1 0.07 11-2 11 11474 160 1.188 0.003 2.01 0.04 12-1 12 11198 185 1.178 0.005 2.06 0.03 12-2 12 11296 335 1.177 0.011 1.83 0.03 -21 - (請先閱讀背面之注意事項再填寫本頁) 訂---------AW, 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)
Claims (1)
- 505684 W η}、 第088118391號專利申請案 中文申請專利範圍修正本(Μ年7月)申請專利範圍 1· 一種在基材上形成塗層之方法,其包括: 以包含具有至少2個Si_H基團之樹脂與溶劑之溶液 在基材上沈積塗層,其方式為其中至少5體積%之溶 於沈積後仍然留在塗層中 / 使此塗層曝露至包含鹼性觸媒與水之環境,其濃度 會造成Si-H基團水解及至少部份縮合;及 自此塗層蒸發溶劑,以形成多孔網狀組織塗層。 2·如申請專利範圍第丨項之方法,其中所形成之多孔網狀 組織塗層具有介電常數為U至24 ^ 3· —種塗層,其係藉由根據申請專利範園第1項之方法製 成0 方 4. 一種矽晶圓,其含有藉由根據申請專利範圍第1項之 法製成之塗層。 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐)
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JP3415741B2 (ja) * | 1997-03-31 | 2003-06-09 | 東レ・ダウコーニング・シリコーン株式会社 | 電気絶縁性薄膜形成用組成物および電気絶縁性薄膜の形成方法 |
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US6503850B1 (en) | 1997-04-17 | 2003-01-07 | Alliedsignal Inc. | Process for producing nanoporous dielectric films at high pH |
US6048804A (en) | 1997-04-29 | 2000-04-11 | Alliedsignal Inc. | Process for producing nanoporous silica thin films |
-
1998
- 1998-11-20 US US09/197,249 patent/US6231989B1/en not_active Expired - Fee Related
-
1999
- 1999-10-25 TW TW088118391A patent/TW505684B/zh not_active IP Right Cessation
- 1999-11-05 EP EP99308828A patent/EP1003210A3/en not_active Withdrawn
- 1999-11-17 SG SG9905766A patent/SG87856A1/en unknown
- 1999-11-18 JP JP11328597A patent/JP2000164589A/ja not_active Withdrawn
- 1999-11-19 KR KR1019990051442A patent/KR20000047675A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR20000047675A (ko) | 2000-07-25 |
EP1003210A2 (en) | 2000-05-24 |
JP2000164589A (ja) | 2000-06-16 |
SG87856A1 (en) | 2002-04-16 |
US6231989B1 (en) | 2001-05-15 |
EP1003210A3 (en) | 2000-06-14 |
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