TW591057B - Siloxane resins - Google Patents

Siloxane resins Download PDF

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TW591057B
TW591057B TW091114016A TW91114016A TW591057B TW 591057 B TW591057 B TW 591057B TW 091114016 A TW091114016 A TW 091114016A TW 91114016 A TW91114016 A TW 91114016A TW 591057 B TW591057 B TW 591057B
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Taiwan
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group
resin
siloxane
carbon atoms
patent application
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TW091114016A
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John Dean Albaugh
Ronald Paul Boisvert
Duane Ray Bujalski
Pierre Maurice Chevalier
Katsuya Eguchi
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Dow Corning
Dow Corning Sa
Dow Corning Asia Ltd
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    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L83/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
    • C08L83/04Polysiloxanes
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    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
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    • C09D183/00Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
    • C09D183/04Polysiloxanes
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    • C09D4/00Coating compositions, e.g. paints, varnishes or lacquers, based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; Coating compositions, based on monomers of macromolecular compounds of groups C09D183/00 - C09D183/16
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02123Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
    • H01L21/02126Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02203Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being porous
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02205Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
    • H01L21/02208Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
    • H01L21/02214Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen
    • H01L21/02216Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02282Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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    • C08G77/00Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
    • C08G77/04Polysiloxanes
    • C08G77/12Polysiloxanes containing silicon bound to hydrogen
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    • C08G77/00Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
    • C08G77/04Polysiloxanes
    • C08G77/14Polysiloxanes containing silicon bound to oxygen-containing groups
    • C08G77/16Polysiloxanes containing silicon bound to oxygen-containing groups to hydroxyl groups
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G77/00Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
    • C08G77/04Polysiloxanes
    • C08G77/14Polysiloxanes containing silicon bound to oxygen-containing groups
    • C08G77/18Polysiloxanes containing silicon bound to oxygen-containing groups to alkoxy or aryloxy groups
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G77/00Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
    • C08G77/04Polysiloxanes
    • C08G77/22Polysiloxanes containing silicon bound to organic groups containing atoms other than carbon, hydrogen and oxygen
    • C08G77/24Polysiloxanes containing silicon bound to organic groups containing atoms other than carbon, hydrogen and oxygen halogen-containing groups

Abstract

This invention pertains to a siloxane resin composition comprising R1SiO3/2 siloxane units, R2SiO3/2 siloxane units and (R3O)bSiO(4-b)/2 siloxane units wherein R1 is an alkyl group having 1 to 5 carbons, hydrogen, or mixtures thereof; R2 is a monovalent organic group having 6 to 30 carbons; R3 is a branched alkyl group having 3 to 30 carbons, b is from 1 to 3; and the siloxane resin contains from 2.5 to 85 mole percent R1SiO3/2 units, 2.5 to 50 mole percent R2SiO3/2 units and 5 to 95 mole percent (R3O)bSiO(4-b)/2 units. The siloxane resin is useful to make insoluble porous resin and insoluble porous coatings. Heating a substrate coated with the siloxane resin at a sufficient temperature effects removal of the R2 and R3O groups to form an insoluble porous coating having a porosity of 1 to 60 volume percent and a dielectric constant in the range of 1.5 to 3.0.

Description

591057 五、發明説明( 發明領域 ⑽本毛月,關於包括尺丨⑽川矽氧烷單元、r2s丨ο%矽氧烷 單兀及(R OhSiO^M/2矽氧烷單元之矽氧烷樹脂組合物,其 中之Rl係獨立選自包含具有1至5個碳原子之烷基、氫或其 此。物,R係獨立選自包含具有6至3 〇個碳原子之單價有機 基及具有6至30個碳原子之單價經取代有機基;r3係獨立選 自包含具有⑴0個碳原子之支㈣基及具有3至3g個碳原 子之經取代支鏈烷基,13為丨至3。本發明尚關於不可溶多孔 性樹脂及由矽氧烷樹脂組合物製備之不可溶多孔性塗料。 發明背景 半導體裝置通常具有一或多種可用於電耦合單獨之電路 元件,开> 成積體電路(1C)之圖案化連接層之陣列。連接層 一般係以絕緣或介電塗料分離。先前,使用化學蒸氣沉^ (CVD)或電漿蝕刻技術(PECVD)形成之氧化矽為該介電塗 料最通用之材料。然而,當電路元件及該元件間之空間下 降時,該氧化矽塗料之相對高介電常數(亦即約4)並不適於 提供適當之電絕緣。 為獲彳于比氧化石夕低之介電常數’發現可使用以石夕氧烧為 主之樹脂形成之介電塗料。該塗料之實例為如c〇Uins等人 之美國專利第3,615,272號及Haluska等人之美國專利第 4,7 56,977號中所述般’由氫矽倍半氧烷樹脂形成者。雖然 該塗料可提供i^CVD或PECVD氧化矽塗料低之介電常數, 亦可提供其他效益,如提昇之間隙充填及表面平整性,但 通常該塗料之介電常數均限制在約3或更大。 -5- 適用中國國家標箏(CNS) A4規格(210X297公釐) 0751 591057591057 V. Description of the Invention (Field of the Invention: this month, about the silicone resin including the ruler, the sichuan siloxane unit, r2s, ο% siloxane unit, and (R OhSiO ^ M / 2 siloxane unit) A composition wherein R1 is independently selected from the group consisting of an alkyl group having 1 to 5 carbon atoms, hydrogen or the like, and R is independently selected from the group consisting of a monovalent organic group having 6 to 30 carbon atoms and having 6 A monovalent substituted organic group of 30 to 30 carbon atoms; r3 is independently selected from the group consisting of a branched fluorenyl group having ⑴0 carbon atoms and a substituted branched chain alkyl group having 3 to 3 g carbon atoms, 13 is 丨 to 3. The invention is also related to insoluble porous resins and insoluble porous coatings prepared from siloxane resin compositions. BACKGROUND OF THE INVENTION Semiconductor devices typically have one or more types of integrated circuit components that can be used to electrically couple separate circuit components. 1C) An array of patterned connection layers. The connection layers are generally separated by an insulating or dielectric coating. Previously, silicon oxide formed using chemical vapor deposition (CVD) or plasma etching technology (PECVD) was the most dielectric coating. Common materials. However, when circuit components and When the space between the elements decreases, the relatively high dielectric constant of the silicon oxide coating (ie, about 4) is not suitable for providing proper electrical insulation. In order to obtain a dielectric constant lower than that of stone oxide, 'it can be used Dielectric coatings based on resins based on oxidant firing. Examples of such coatings are described in US Patent No. 3,615,272 to CoUins et al. And US Patent No. 4,7,56,977 to Haluska et al. ' Formed by hydrogen silsesquioxane resin. Although this coating can provide low dielectric constant of i ^ CVD or PECVD silicon oxide coatings, it can also provide other benefits, such as improved gap filling and surface flatness, but usually the coating The dielectric constant is limited to about 3 or more. -5- Applicable to China National Standard Kit (CNS) A4 specification (210X297 mm) 0751 591057

AT B7 五、發明説明(2 已知絕緣塗料之介電常數為低電力消耗、_訊、及訊號 延遲之1C所需之重要因子。當iC尺寸持續縮小時,該因子 之重要性增力α。因A ’期望可對電絕緣塗料提供介電常數 低於3之以矽氧烷為主之樹脂材料及製造該材料之方法。另 外,希望可對塗料提供高龜裂抗性之以石夕氧烧為主之樹脂 及製造該樹脂之方法。而且,對該以矽氧烷為主之樹脂希 望可以以標準製成技術獲得塗料,如旋轉塗佈。已知固態 塗料之介電常數隨著塗料材料密度下降而下降。多孔性塗 料之密度一般比相對應之固態塗料低。AT B7 V. Description of the invention (2 The dielectric constant of the insulating coating is known to be an important factor for low power consumption, 1C, and 1C of signal delay. When the size of iC continues to shrink, the importance of this factor increases. Because of A ', it is expected to provide a resin material mainly based on siloxane with a dielectric constant lower than 3 and a method for manufacturing the material. In addition, it is hoped that it can provide high crack resistance to the coating. Oxygen-firing resin and method for manufacturing the same. Moreover, it is hoped that the silicone-based resin can be obtained by standard manufacturing techniques such as spin coating. The dielectric constant of known solid coatings is The density of coating materials decreases and decreases. The density of porous coatings is generally lower than that of corresponding solid coatings.

Haluska之美國專利第5,446 〇88號敘述一種使式 HSi(OR)3及Si(〇R)4之矽烷共水解,形成塗料形成中所用共 水解物之方法。R基為含丨-20個碳原子之有機基,當其經過 氧原子與矽鍵結時,形成可水解之取代基。最佳之可水解 基為甲氧基及乙氧基。以水水解係在含酸化氧之極性溶劑 中進行。溶劑中之共水解物塗佈於基材上,溶劑蒸發且將 塗料加熱至50至1〇〇〇。(:,將塗料轉化成氧化矽。Haiuska& 未揭示具有分支烧氧基之石夕烧。U.S. Patent No. 5,446,088 to Haluska describes a method for co-hydrolyzing silanes of the formula HSi (OR) 3 and Si (OR) 4 to form a co-hydrolysate used in coating formation. The R group is an organic group containing -20 carbon atoms. When it is bonded to silicon through an oxygen atom, it forms a hydrolyzable substituent. The most hydrolyzable groups are methoxy and ethoxy. Hydrolysis is carried out in a polar solvent containing acidified oxygen. The co-hydrolysate in the solvent is applied to the substrate, the solvent is evaporated and the coating is heated to 50 to 10,000. (:, The coating is converted into silicon oxide. Haiuska & does not disclose stone yaki with branched oxy groups.

Chung等人之美國專利第6,231,989號敘述一種由氫石夕倍 半氧烷樹脂形成多孔性塗料之方法。多孔網路係藉由以包 括氫矽倍半氧烷樹脂及溶劑之溶液,以沉積後至少^體積% 之溶劑留在塗料中之方式,將塗料沉積在基材上。接著使 塗料暴露於包括鹼性觸媒及水之環境中;溶劑自塗料蒸發 形成介電常數在1.5至2.4間之多孔性網路。Chung et al. U.S. Patent No. 6,231,989 describes a method for forming a porous coating material from a hydrospar resin. The porous network is a method of depositing a coating on a substrate by using a solution including a hydrosilsesquioxane resin and a solvent so that at least ^ vol% of the solvent remains in the coating after deposition. The coating is then exposed to an environment including alkaline catalysts and water; the solvent evaporates from the coating to form a porous network with a dielectric constant between 1.5 and 2.4.

Smith等人之WO 98/4972 1號敘述一種在基材上形成奈米 时鮮(CNS) Λ4規格(21(}x 297公發) 591057Smith et al. WO 98/4972 No. 1 describes a method for forming nanometers on a substrate. Freshness (CNS) Λ4 size (21 () x 297) 591057

孔隙介電塗料之方法。該方法包括之步驟為使烷氧基矽烷 與溶劑組合物及視情況之水摻合;將混合物沉積在基材上 ,同時使至少一部分溶劑蒸發;將基材置於密閉室中,且 對室抽真空使壓力低於大氣壓;在壓力低於大氣壓下將基 材暴露於水蒸氣中,接著使基材暴露於鹼蒸氣中。Method of porous dielectric coating. The method includes the steps of blending an alkoxysilane with a solvent composition and optionally water; depositing the mixture on a substrate while evaporating at least a portion of the solvent; placing the substrate in a closed chamber, and opposing the chamber. Vacuum is applied to lower the pressure to atmospheric pressure; the substrate is exposed to water vapor at a pressure lower than atmospheric pressure, and then the substrate is exposed to alkali vapor.

Mikoshiba等人之美國專利第6,022,814號敘述一種由氫 及具有可在250 C至樹脂玻璃轉移點間之溫度下移除之有 機取代基之甲基矽氧烷為主之樹脂,在基材上形成氧化矽 膜之方法。記錄之氧化矽膜性質包含密度為〇.8至14 g/cm3 ’平均孔隙直徑為1至3奈米,表面積為6〇〇至1500 m2/g, 且介電常數為2·0至3.0。揭示之可在250°C或更高溫下氧化 所用之有機取代基包含經取代及未經取代之烷基或烷氧基 ,列舉者為3,3,3-三氟丙基、鄰_苯乙基、第三丁基、2•氰 基乙基、_基、及乙烯基。U.S. Patent No. 6,022,814 to Mikoshiba et al. Describes a resin based on hydrogen and methylsiloxane with an organic substituent that can be removed at a temperature between 250 C and the temperature of the Plexiglas transition point, formed on a substrate Method of silicon oxide film. The recorded properties of the silicon oxide film include a density of 0.8 to 14 g / cm3 ', an average pore diameter of 1 to 3 nm, a surface area of 600 to 1500 m2 / g, and a dielectric constant of 2.0 to 3.0. The organic substituents disclosed that can be oxidized at 250 ° C or higher include substituted and unsubstituted alkyl or alkoxy groups. Examples include 3,3,3-trifluoropropyl, o-phenylethyl Group, tert-butyl group, 2 • cyanoethyl group, —yl group, and vinyl group.

Mikoskiba 等人 J. Mat· Chem·,1999,9,59 1-598提出在甲 基石夕倍半氧烷中製造埃大小孔隙,以降低塗料之密度及介 電常數之方法。將帶有甲基(三矽氧基矽烷基)單元及烷基 (三碎氧基矽烧基)單元之共聚物旋轉塗佈在基材上,且在 2 5 0 C加熱’獲得硬質矽氧烷基質。接著使塗料在4 5 〇它至 500°C下加熱,以移除對熱不穩定之基,且留下相當於取代 基大小之孔洞,其介電常數約為2·3。可使用三氟丙基、氰 乙基苯基乙基及丙基當作對熱不穩定之取代基。Mikoskiba et al. J. Mat. Chem., 1999, 9, 59 1-598 proposed a method for producing angstrom-sized pores in methylsilsesquioxane to reduce the density and dielectric constant of coatings. Spin-coated a copolymer with a methyl (trisiloxysilyl) unit and an alkyl (trisiloxysilyl) unit on a substrate, and heated at 250 ° C to obtain a hard siloxy Alkyl. The coating is then heated at 450 ° C to 500 ° C to remove the thermally unstable substrate and leave a hole the size of the substituent, with a dielectric constant of about 2.3. Trifluoropropyl, cyanoethylphenylethyl and propyl can be used as the thermally unstable substituent.

Ito等人之日本公開專利(ΗΕΙ) 5-333553號敘述在質子受 體存在下,藉由使二乙醯氧基二(第三丁氧基)矽烷水解製 本0卷國國家標準(CNS> Λ4規格(210Χ297公釐> 591057 A7 B7 五、發明説明( 4 備含院氧基及石夕院醇官能性之石夕氧烧樹脂。樹脂係在光酸 存在下,以後縯之熱處理硬化,形成似以〇2之塗料,且可 用作1C製造之光阻劑材料。 裝 t今發現將具有6至30個碳原子之有機基以及具有3至3〇 個石反原子之分支石夕氧貌基加於石夕氧烧樹脂中,可獲得許多 優點,如改良之儲存安定性、增加硬化樹脂之模數以及孔 隙度。同時可使介電常數維持在15至3 〇之間。因此發明之 -目的係提供-種具有改良儲存安定性之石m组合物。 士發明另一目的亦提供製造矽氧烷樹脂之方法,以及使此 等树月曰硬化製ia介電常數在15至3 〇,孔隙度為^至體積 =,且模數為1.0至10 Gpa之不可溶多孔性塗料之方法。此 專塗料之優點為可使用一般薄膜加工形成。 發明概要 本發明係關於一種矽氧烷樹脂組合物,包括·· (A) 2.5至85莫耳伤之r Si0s/2石夕氧院單元,其中之Ri係獨 立選自包含具有丨至5個碳原子之烷基、氫及其混合物; 線 (8)2.5至50莫耳伤之1^3丨〇3/2石夕氧燒單元,其中之化2係獨 立選自包含具有6至30個碳原子之單價有機基以及具有6至 3〇個碳原子之單價經取代有機基;及 (C) 5至95莫耳份之矽氧烷單元,其中之 R3係獨立選自包含具有3至30個碳原子之分支烷基以及具 有3至30個碳原子之分支經取代烷基,b為1至3。成分(A) 、(B)及(C)之總量為100莫耳份,且成分(A)、(B)及(c)之總 和為樹脂組合物中全部矽氧烷單元之至少5〇%。 -8 々國國家橾準(CNS) A4規格(210X 297公釐) 591057 五、發明説明(5 ) 本發明亦關於一種藉由使式ysiX3之矽烷或矽烷混合物 、式R2SiX3之矽烷或矽烷混合物’及(R30)eSix(4 e)之矽燒 或矽烷混合物,其中R1係獨立選自具有1至5個碳原子之燒 基、氫及其混合物;R2係獨立選自包含具有6至3〇個碳原子 之單價有機基及具有6至3 0個碳原子之經取代單價有機基 ;R3係獨立選自包含具有3至30個碳原子之分支烷基及經取 代分支烷基;c為1至3,且X為可水解之基或羥基。 本發明尚關於一種形成不可溶多孔性樹脂之方法以及在 基材上形成不可溶多孔性塗層之方法。該不可溶多孔性塗 層之介電常數為1.5至3.0,孔隙度為1至6〇體積% ,且模數 在1 ·0至10 Gpa之間。 發明詳細敘述 該矽氧烷樹脂組合物包括: (八)2.5至85莫耳份之汉1§;丨〇3/2石夕氧烧單元,其中之&1係獨 立選自包含具有丨至5個碳原子之烷基、氫及其混合物; (8)2.5至50莫耳份之尺28丨〇3/2石夕氧烷單元其中之尺2係獨 立h自包3具有6至30個碳原子之單價有機基以及具有6至 30個碳原子之單價經取代有機基;及 /〇 5至95莫耳份之妒〇)娜(“)/2石夕氧炫單元,其令之 R1獨立選自包含具有3至3〇個碳原子之分支院基以及具 有3至3〇個碳原子之分支經取代院基,b為1至3。成分⑷ 、(B)及(C)之總量為1〇〇莫耳份,且成分(A卜及γ)之她 和為樹脂組合物中全部矽氧烷單元之至少50%。較好矽氧 院樹脂平均含30至60莫耳份之成分(八),1〇至25莫耳份之: •9- 591057Japanese Patent Publication No. 5-333553 of Ito et al. Describes that in the presence of a proton acceptor, hydrolyzation of diethylfluorenylbis (third-butoxy) silane produces a volume 0 national standard (CNS > Λ4) Specifications (210 × 297 mm > 591057 A7 B7 V. Description of the invention (4 Preparation of Shixiu oxyfiring resin containing the oxygen and Shixuan alcohol functions. The resin is hardened in the presence of photoacid, and then heat-treated in the future to form It looks like a coating of 〇2 and can be used as a photoresist material manufactured by 1C. It has been found that the organic group with 6 to 30 carbon atoms and the branched stone with 3 to 30 stone antiatoms will have oxygen appearance. Based on the sintered resin, many advantages can be obtained, such as improved storage stability, increased modulus and porosity of the hardened resin. At the same time, the dielectric constant can be maintained between 15 and 30. Therefore, it was invented -The purpose is to provide-a stone m composition having improved storage stability. Another object of the invention is to provide a method for producing a siloxane resin, and to make these tree-cured hardened ia dielectric constants of 15 to 30. , Porosity is ^ to volume =, and modulus is 1.0 to 10 Gpa Method for insoluble porous coatings. The advantage of this special coating is that it can be formed using ordinary thin film processing. SUMMARY OF THE INVENTION The present invention relates to a silicone resin composition, including (A) 2.5 to 85 moles of Si. / 2 Shi Xi oxygen hospital unit, wherein Ri is independently selected from the group consisting of alkyl groups having 5 to 5 carbon atoms, hydrogen and mixtures thereof; line (8) 2.5 to 50 mole ears 1 ^ 3 丨 〇3 / 2 Shi Xi oxygen burning unit, wherein Hua 2 is independently selected from the group consisting of a monovalent organic group having 6 to 30 carbon atoms and a monovalent substituted organic group having 6 to 30 carbon atoms; and (C) 5 to 95 A mole fraction of the siloxane unit, wherein R3 is independently selected from the group consisting of a branched alkyl group having 3 to 30 carbon atoms and a branched substituted alkyl group having 3 to 30 carbon atoms, and b is 1 to 3. Ingredients The total amount of (A), (B), and (C) is 100 mol parts, and the sum of the components (A), (B), and (c) is at least 50% of all the siloxane units in the resin composition -8 National Standards (CNS) A4 specification (210X 297 mm) 591057 5. Description of the invention (5) The present invention also relates to a silane or Silane mixtures, silane or silane mixtures of the formula R2SiX3 'and (R30) eSix (4 e) sintered or silane mixtures, where R1 is independently selected from the group consisting of alkane groups having 1 to 5 carbon atoms, hydrogen and mixtures thereof; Is independently selected from the group consisting of monovalent organic groups having 6 to 30 carbon atoms and substituted monovalent organic groups having 6 to 30 carbon atoms; R3 is independently selected from the group consisting of branched alkyl groups having 3 to 30 carbon atoms And substituted branched alkyl; c is 1 to 3, and X is a hydrolyzable group or a hydroxyl group. The present invention also relates to a method for forming an insoluble porous resin and a method for forming an insoluble porous coating on a substrate. The insoluble porous coating has a dielectric constant of 1.5 to 3.0, a porosity of 1 to 60% by volume, and a modulus between 1.0 and 10 Gpa. Detailed description of the invention The silicone resin composition includes: (8) 2.5 to 85 moles of Han 1§; 丨 〇 / 2/2 Shixi oxygen firing unit, wherein & 1 is independently selected from the group consisting of 5 carbon atoms of alkyl, hydrogen and mixtures thereof; (8) 2.5 to 50 moles of ruler 28 丨 〇3 / 2 Shixoxane unit, where ruler 2 is independent, self-contained 3 has 6 to 30 A monovalent organic group of carbon atoms and a monovalent substituted organic group having 6 to 30 carbon atoms; and / 05 to 95 moles of jealousy 0) Na (") / 2 Shi Xixuan units, which makes R1 Independently selected from the group consisting of branched radicals having 3 to 30 carbon atoms and branched substituted radicals having 3 to 30 carbon atoms, b is 1 to 3. The total of components ⑷, (B) and (C) The amount is 100 mol parts, and the sum of the ingredients (Ab and γ) is at least 50% of the total siloxane units in the resin composition. The preferred silicone resin contains 30 to 60 mol parts on average. Ingredients (eight), 10 to 25 moles: • 9- 591057

AT _______ B7__ 五、發明説明(6 ) 分(B)及20至50莫耳份之成分(c),其中成分(A)、(B)及(C) 之總量為100莫耳份,且成分(A)、(8)及(C)之總和為樹脂組 合物中全部石夕氧烧單元之至少7 〇 〇/〇。 石夕氧烷樹脂之結構並沒有特別限制。矽氧烷樹脂基本上 可全部縮合,或可僅部分反應(亦及含低於1〇莫耳%之 Si-OR及/或低於30莫耳%之Si-〇H)。部分反應之矽氧烷樹脂 列舉者為(但不限)如 — )、R2Si(X)dO(3_d/2)及AT _______ B7__ 5. Description of the invention (6) Sub-component (B) and 20 to 50 mol parts (c), wherein the total amount of components (A), (B) and (C) is 100 mol parts, and The sum of the components (A), (8), and (C) is at least 700/0 of all the sintering units in the resin composition. There is no particular limitation on the structure of the oxane resin. The silicone resin may be substantially fully condensed, or may be only partially reacted (also containing Si-OR of less than 10 mole% and / or Si-OH of less than 30 mole%). Partially reactive siloxane resins are listed (but not limited) such as —), R2Si (X) dO (3_d / 2) and

Si(X)d(〇RJ)f〇(4-cUf/2)之矽氧烷單元;其中 、R2&R3 之定 義如上;各X獨立的為可水解基或羥基;且d及f為1至2。可 水解基為經氧原子附接於矽原子(Si-〇R),形成矽鍵結之烷 氧基或矽鍵結之醯氧基之有機基。列舉之r為(但不限)具有 1至6個碳原子之直鏈烷基,如甲基、乙基、丙基、丁基、 戊基、或己基,及具有1至6個碳原子之醯基,如甲醯基、 乙酿基、丙醯基、丁醯基、戊醯基或己醯基。矽氧烷樹脂 亦可含低於約10莫耳%之Si04/2單元。 石夕氧烷樹脂之重量平均分子量在4〇〇至16〇,〇〇〇之間,且 較好在5,000至1〇〇,〇〇〇之間。 R1可為具有1至5個碳原子之直鏈烷基、氫及其混合物。 列舉之烷基為(但不限)甲基、乙基、丙基、丁基及戊基。 較好R1為甲基、氫或其混合物。 R可為具有ό至3 0個碳原子之經取代或未經取代之直鏈 、之鏈或環狀單價有機基。經取代之有機基可經取代基取 代與礙鍵結之氫原子(C-H)。列舉之經取代r2基為(但不限) _素如氣或氟、乙醚、式CH30(CH2)m0)p(CH2)q_(其中之m -10- 本紙,捧亨g國國家標準(CNS) Λ4規格(210><297公I) 591057 A7 B7 五、發明説明(7 ) 、p及q均為正整數,且較好為1至9之正整數)之聚(氧基伸 乙基)、烷氧基、醯氧基、醯基、烷氧基羰基、及三烷基矽 氧基。R2之實例包含(但不限)己基、庚基、辛基、壬基、 癸基、十二烧基、十六烧基、三異丁基、四異丁基、三甲 基矽氧基十六烷基、十八烷基、CI^CHOhOCI^CHk、 CH30(CH2CH20)7.9(CH2)r、(CH3)3CCH2(CH3)2C(CH3)3CCH2CHCH2-、cf3(cf2)5ch2ch2-、苯基乙基、對-甲基苯基乙基、對-甲氧基苯基乙基、及對-溴苯基乙基,R2較好為具有10至20 個碳原子之經取代或未經取代烷基。 R3為具有3至30個碳原子之經取代或未經取代分支烷基 。經取代之分支烷基可以以取代與碳鍵結之氫原子(C_H) 之取代基取代。列舉之經取代R2基為(但不限)鹵素如氣及 氟、如式-(CH2)aC(0)0(CH2)bCH3所述之烷氧基羰基、如式 -(CH2)aO(CH2)bCH3所樹脂烧氧基取代基、及式 -(CH2)aC(0)(CH2)bCH3所述之羰基取代基,其中且b2〇 。列舉之未經取代R3基為(但不限)異丙基、異丁基、第二 丁基、第三丁基、異戊基、新戊基、第三戊基、2-甲基丁 基、2-甲基戊基、2-甲基己基、2-乙基丁基、2-乙基戊基、 2 -乙基己基等。較佳之R/為具有4至18個碳原子之三級烧基 ,且更好之R3為第三丁基。 製備矽氧烷樹脂之方法包括: 使下列成分合併足夠之時間及溫度,進行矽氧烷樹脂之 調配: (a)式R^SiX]之矽烷或矽烷混合物,其中R1係獨立選自 11 - 國家標準(CNS) A4规格(210X297公爱) 591057 A7 B7 五、發明説明(8 包含具有1至5個碳原子之炫基、氫或其混合物,X係獨立 為可水解基或羥基; (b) 式R2SiXs之矽烷或矽烷混合物,其中之R2係獨立選 自包含具有6至30個碳原子之單價有機基及具有6至30個碳 原子之經取代單價有機基,X獨立為可水解基或羥基; (c) 式(R/OhSiX^q之石夕炫或石夕烧混合物,其中之r3係 獨立選自包含具有3至30個碳原子之分支烷基及具有3至30 個碳原子之分支經取代烷基,c為1至3(含),X獨立為可水 解基或經基;及 (d) 水。 矽烷(a)為式R^SiXs之矽烷或矽烷混合物,其中Ri係獨立 選自包含上述具有1至5個碳原子之烷基、氫或其混合物。 較佳者為R1為甲基、氫或其混合物。X為可水解之基或羥 基。π可水解之基”意指超過80莫耳%之X與水在形成矽氧烷 樹脂之反應條件下反應(水解)。羥基為可縮合基,其中至 少70莫耳%與鍵結於不同矽原子之另一 X基反應,縮合且形 成矽氧烷鍵(Si-0-Si)。可水解基為!|化物基,如氯化物、 胺基、或經氧原子附接於於矽原子上(Si-〇R),形成矽鍵結 之烷氧基或矽鍵結之醯氧基之有機基。當X為胺基時,其 一般受限於其中之R1為烷基或含低於1 〇莫耳。/。氫之組合物 ,因為胺基對於含氫之矽氧烷樹脂不利。而且,當X為胺 基時,其一般用量低於約3 0莫耳%,因為所得矽氧烷樹脂 可含大於30莫耳%之SiOH。列舉之r為(但不限)具有1至6個 碳原子之直鏈烷基’如甲基、乙基、丙基、丁基、戊基或Si (X) d (〇RJ) f〇 (4-cUf / 2); wherein R2 & R3 is as defined above; each X is independently a hydrolyzable group or a hydroxyl group; and d and f are 1 To 2. A hydrolyzable group is an organic group attached to a silicon atom (Si-OR) via an oxygen atom to form a silicon-bonded alkoxy group or a silicon-bonded fluorenyloxy group. R is listed as (but not limited to) a linear alkyl group having 1 to 6 carbon atoms, such as methyl, ethyl, propyl, butyl, pentyl, or hexyl, and a group having 1 to 6 carbon atoms. Fluorenyl, such as formamyl, ethynyl, propionyl, butylamyl, pentamyl, or hexamethylene. The siloxane resin may also contain less than about 10 mole% Si04 / 2 units. The weight-average molecular weight of the oxane resin is between 4,000 and 16,000, and preferably between 5,000 and 100,000. R1 may be a linear alkyl group having 1 to 5 carbon atoms, hydrogen, and a mixture thereof. Examples of the alkyl group are, but are not limited to, methyl, ethyl, propyl, butyl, and pentyl. Preferably, R1 is methyl, hydrogen or a mixture thereof. R may be a substituted or unsubstituted straight chain, chain or cyclic monovalent organic group having from 6 to 30 carbon atoms. The substituted organic group may be substituted with a hydrogen atom (C-H) which hinders bonding. The substituted r2 group is listed as (but not limited to) _ such as gas or fluorine, diethyl ether, formula CH30 (CH2) m0) p (CH2) q_ (of which m -10- this paper, National Standard (CNS) ) Λ4 specification (210 > < 297 male I) 591057 A7 B7 V. Description of the invention (7), p and q are positive integers, and preferably a positive integer of 1 to 9) poly (oxyethylene) , Alkoxy, fluorenyl, fluorenyl, alkoxycarbonyl, and trialkylsiloxy. Examples of R2 include (but are not limited to) hexyl, heptyl, octyl, nonyl, decyl, dodecyl, hexadecyl, triisobutyl, tetraisobutyl, trimethylsilyl Hexyl, octadecyl, CI ^ CHOhOCI ^ CHk, CH30 (CH2CH20) 7.9 (CH2) r, (CH3) 3CCH2 (CH3) 2C (CH3) 3CCH2CHCH2-, cf3 (cf2) 5ch2ch2-, phenylethyl , P-methylphenylethyl, p-methoxyphenylethyl, and p-bromophenylethyl, R2 is preferably a substituted or unsubstituted alkyl group having 10 to 20 carbon atoms. R3 is a substituted or unsubstituted branched alkyl group having 3 to 30 carbon atoms. The substituted branched alkyl group may be substituted with a substituent which replaces a carbon atom-bonded hydrogen atom (C_H). The substituted R2 groups are (but not limited to) halogens such as gas and fluorine, alkoxycarbonyl groups as described in the formula-(CH2) aC (0) 0 (CH2) bCH3, and formulas as-(CH2) aO (CH2 ) bCH3 resin oxy substituent and carbonyl substituent according to formula-(CH2) aC (0) (CH2) bCH3, and b2O. The unsubstituted R3 groups listed are (but not limited to) isopropyl, isobutyl, second butyl, third butyl, isopentyl, neopentyl, third pentyl, 2-methylbutyl , 2-methylpentyl, 2-methylhexyl, 2-ethylbutyl, 2-ethylpentyl, 2-ethylhexyl, and the like. A preferred R / is a tertiary alkyl group having 4 to 18 carbon atoms, and a more preferred R3 is a third butyl group. The method for preparing the siloxane resin includes: combining the following components for a sufficient time and temperature to prepare the siloxane resin: (a) a silane or silane mixture of the formula R ^ SiX], wherein R1 is independently selected from 11-country Standard (CNS) A4 specification (210X297 public love) 591057 A7 B7 V. Description of the invention (8 Contains a cyano group having 1 to 5 carbon atoms, hydrogen or a mixture thereof, X is independently a hydrolyzable group or a hydroxyl group; (b) Silane or silane mixture of the formula R2SiXs, wherein R2 is independently selected from the group consisting of a monovalent organic group having 6 to 30 carbon atoms and a substituted monovalent organic group having 6 to 30 carbon atoms, and X is independently a hydrolyzable group or a hydroxyl group ; (C) Shi Xixuan or Shi Xiyan mixture of formula (R / OhSiX ^ q, wherein r3 is independently selected from the group consisting of branched alkyl groups having 3 to 30 carbon atoms and branches having 3 to 30 carbon atoms A substituted alkyl group, c is 1 to 3 (inclusive), X is independently a hydrolyzable group or a vial group; and (d) water. Silane (a) is a silane or a mixture of silanes of the formula R ^ SiXs, where Ri is independently selected Self-contained alkyl, hydrogen or mixtures thereof having 1 to 5 carbon atoms as described above. Preferred is R1. Methyl, hydrogen, or a mixture thereof. X is a hydrolyzable group or a hydroxyl group. Π hydrolyzable group means that more than 80 mole% of X reacts with water under the reaction conditions to form a siloxane resin (hydrolysis). Hydroxyl Is a condensable group, of which at least 70 mol% reacts with another X group bonded to a different silicon atom to condense and form a siloxane bond (Si-0-Si). The hydrolyzable group is a! | Chloride, amine, or an organic group attached to a silicon atom (Si-OR) via an oxygen atom to form a silicon-bonded alkoxy group or a silicon-bonded fluorenyl group. When X is an amine group It is generally limited to compositions in which R1 is an alkyl group or contains less than 10 moles of hydrogen because amine groups are not good for hydrogen-containing siloxane resins. Moreover, when X is an amine group, It is generally used in an amount of less than about 30 mole% because the resulting siloxane resin may contain more than 30 mole% of SiOH. R is listed as (but not limited to) a linear alkyl group having 1 to 6 carbon atoms' Such as methyl, ethyl, propyl, butyl, pentyl or

____-12-____- 12-

家標準(CNS) A4規格(210X297公釐I 591057Home Standard (CNS) A4 Specification (210X297 mm I 591057

AT B7 五、發明説明(9 ) 己基,及具有1至6個碳原子之醯基,如甲醯基、乙醯基、 丙醯基、丁醯基、戊酿基或己醯基。較佳之石夕烧(a)為三氣 矽烷、甲基三氣矽烷、三甲氧基矽烷、三乙氧基矽烷、甲 基三曱氧基矽烷、或甲基三乙氧基矽烷,因為此等均容易 購得。通常,矽烷(a)之含量為每100莫耳份合併矽烷(心、 矽烷(b)及矽烷(c)之總量2.5至85莫耳份,且較好為30至60 莫耳份(相同基礎)。 石夕烧(b)為是R S iX3之石夕烧或石夕烧之混合物,其中之r2係 如上述般獨立選自包含具有6至30個碳原子之單價有機基 ,及具有6至30個碳原子之經取代單價有機基。X如上述獨 立為可水解之基或羥基。較佳之矽烷(b)為R2SiCl3、 R2Si(OMe)3及R2Si(OEt)3,其中Me代表甲基,且Et代表乙基 ’因為其均容易購得。通常,矽烷(b)之含量為每1〇〇莫耳 份合併矽烷(a)、矽烷(b)及矽烷(c)之總量之2.5至50莫耳份 ’且較好為10至25莫耳份(相同基礎)。 石夕烧(c)為式(R3〇)eSiX(4-c)之矽烷或矽烷混合物,其中R3 係如上述般獨立選自包含具有3至3〇個碳原子之分支烷基 及具有3至30個碳原子之經取代分支烷基,c為1至3,且X 獨立為如上述之可水解之基或羥基。較好矽烷為二第三 丁氧基二氣矽烷、二第三丁氧基二羥基矽烷、二第三丁氧 基二f氧基石夕烷、二第三丁氧基二乙氧基矽烷、及二第三 丁氧基二乙酿氧基矽烷,因為其容易購得。通常,矽烷(c) 之含量為每100莫耳份合併矽烷、矽烷(b)及矽烷(c)總量 之)至95莫耳份,且較好為2〇至50莫耳份(相同基礎)。 本紙張尺度適用笮國國參標準(CNS) A4規格(210X297公货) 591057 A7 B7 五、發明説明( 水之含量為可使可水解基X進行水解之量。通常水之含 量為矽烷(a)、(b)及(C)中每莫耳之X為0.5至2.0莫耳之水, 且更好為0.8至1.2莫耳(相同基準)。 形成矽氧烷樹脂之反應可在液態中,含溶劑或不含溶劑 下進行。若使用溶劑’則可包含為含有參與反應之官能基 ’且為矽烷(a)、(b)及(c)之溶劑之適用有機溶劑。列舉之溶 劑為(但不限)飽和脂肪系如正戊烷、己烷、正庚烷、異辛 烧及十二烷;環脂系如環戊烷及環己烷;芳系如苯、甲苯 '一甲本及二甲本,環狀驗如四氯咬喃(THF)及二17号 烧;_如甲基異丁基酮(MIBK);鹵素取代之烷如三氣乙烷 ’ _化方糸如>臭本及氣本,及醇如甲醇、乙醇、丙醇、丁 醇。另外,上述之溶劑可結合二種或多種當作共溶劑使用 。較佳之溶劑為芳系化合物及環狀醚,且最佳者為甲苯、 1,3,5-二甲苯及四氫呋喃。當使用溶劑時,以溶劑及矽烷(a) 、(b)及(c)之總重為準’其用量一般為4〇至95重量%之溶劑 。最好為70至90重量%溶劑(相同基準)。 將成分(a)、(b)、(c)、(d)及選用之溶劑(若使用)合併可以 以任何順序進行,只要任何水解基(χ)及水間有接觸即可。 通常係將矽烷溶於溶劑中,接著將水加於溶液中。部分反 應通常係在上述成分合併時發生。然而,為增加反應速率 及程度,可使用各種輔助測量如溫度控制及/或攪拌。 反應進行之溫度並未受限,只要不造成明顯膠凝或造成 矽氧烷樹脂產物硬化即可。通常溫度可在2〇t至i 5〇t之間 ,較佳之溫度為20°C至100°C。當X為醯氧基如乙醯氧基時AT B7 V. Description of the Invention (9) Hexyl, and fluorenyl having 1 to 6 carbon atoms, such as methyl, ethyl, propyl, butyl, pentyl or hexamyl. The preferred stone yaki (a) is trigas silane, methyltrigas silane, trimethoxysilane, triethoxysilane, methyltrimethoxysilane, or methyltriethoxysilane, because of these Both are easily available. Generally, the content of silane (a) is 2.5 to 85 mol parts per 100 mol parts of combined silane (heart, silane (b) and silane (c), and preferably 30 to 60 mol parts (same Basic). Shibuki-yaki (b) is a mixture of Shiyaki-yaki or Shiyaki-yaki of RS iX3, where r2 is independently selected from the group consisting of a monovalent organic group having 6 to 30 carbon atoms as described above, and having 6 Substituted monovalent organic groups of 30 carbon atoms. X is independently a hydrolyzable group or a hydroxyl group as described above. Preferred silanes (b) are R2SiCl3, R2Si (OMe) 3, and R2Si (OEt) 3, where Me represents a methyl group. And Et represents ethyl 'because they are easily available. Generally, the content of silane (b) is 2.5 times the total amount of combined silane (a), silane (b), and silane (c) per 100 mol parts. To 50 mol parts' and preferably 10 to 25 mol parts (on the same basis). Ishigaki (c) is a silane or silane mixture of formula (R3〇) eSiX (4-c), where R3 is as described above Is generally independently selected from the group consisting of branched alkyl groups having 3 to 30 carbon atoms and substituted branched alkyl groups having 3 to 30 carbon atoms, c is 1 to 3, and X is independently hydrolyzable as described above Or hydroxy. The preferred silanes are the second and third butoxydioxysilanes, the second and third butoxydihydroxysilanes, the second and third butoxydioxysilanes, and the second and third butoxydiethoxylates. Silane, and second and third butoxydiethyloxysilane, because they are easily available. Generally, the content of silane (c) is 100 mol parts combined of silane, silane (b) and silane (c). Amount) to 95 mol parts, and preferably 20 to 50 mol parts (on the same basis). The size of this paper is applicable to the National Ginseng Standard (CNS) A4 specification (210X297 public goods) 591057 A7 B7 V. Description of the invention (The content of water is the amount that can hydrolyze the hydrolyzable group X. Usually the content of water is silane (a ), (B) and (C) are 0.5 to 2.0 moles per mole of water, and more preferably 0.8 to 1.2 moles (same basis). The reaction to form the siloxane resin can be in a liquid state, It is carried out with or without a solvent. If a solvent is used, it may include a suitable organic solvent that is a solvent containing functional groups participating in the reaction and is a silane (a), (b), and (c). The solvents listed are ( (But not limited to) saturated fats such as n-pentane, hexane, n-heptane, isooctane and dodecane; cyclolipids such as cyclopentane and cyclohexane; aromatics such as benzene and toluene; Dimethyl form, such as tetrachlorobenzene (THF) and No. 17 burn; _ such as methyl isobutyl ketone (MIBK); halogen-substituted alkane such as trigas ethane '_ chemical formula such as > Odor and gas, and alcohols such as methanol, ethanol, propanol, butanol. In addition, the above solvents can be used as a co-solvent in combination of two or more. Are aromatic compounds and cyclic ethers, and the best are toluene, 1,3,5-xylene and tetrahydrofuran. When using a solvent, the total weight of the solvent and silanes (a), (b), and (c) As the standard, the amount of the solvent is generally 40 to 95% by weight. Preferably, the solvent is 70 to 90% by weight (the same basis). The components (a), (b), (c), (d) and selected Solvents (if used) can be combined in any order, as long as there is contact between any hydrolyzable group (χ) and water. Usually, the silane is dissolved in the solvent, and then water is added to the solution. Part of the reaction is usually based on the above Occurs when the ingredients are combined. However, to increase the rate and extent of the reaction, various auxiliary measurements such as temperature control and / or stirring can be used. The temperature at which the reaction proceeds is not limited as long as it does not cause significant gelation or harden the silicone resin product That is, usually the temperature may be between 20t and i 50t, and the preferred temperature is 20 ° C to 100 ° C. When X is an ethoxy group such as ethoxy group

591057 Λ 7 Β7591057 Λ 7 Β7

,反應㈣在5m進行。形切w㈣之時間依因 子之數量而定,如(但不限)所用之特殊矽氧烷、溫度及反 應之石夕氧燒樹脂產物中所需之Rl、r2ar3莫耳比而定。通 常,反應時間由數分鐘至數小時。為增加製備之石夕氧燒樹 脂之分子量且改善矽氧烷樹脂之儲存安定性,較好進行主 體步驟,接著進行上述反應或其部分。"主體'意指反應係 在40t至溶劑之回流溫度下進行數小時,以增加重量^均 刀子里較好,反應化合物係將加熱,使加熱後之石夕氧院 樹脂之重量平均分子量在約5,〇〇〇至ι〇〇,〇〇〇之間。 當X為醯氧基如乙醯氧基時,產生如反應副產物之相當 酸如乙酸。因為乙酸之存在會對矽氧烷樹脂產物之安定性 造成負面影響,因此需要中和任何乙酸。副產物乙酸之中 和可藉由使反應混合物與中和劑接觸或以蒸餾移除進行。 蒸餾通常係藉由添加溶劑如甲苯(若尚未存在),且減壓及 加熱(如高至50°C )與溶劑共沸移除乙酸。若使用中和劑, 則需足夠之驗以中和留下之乙酸,以及不足之驗,因此不 會使矽氧烷樹脂產物催化性重排。適當鹼之實例包含碳酸 鈣、碳酸鈉、碳酸氫鈉、碳酸銨、氨、氧化鈣或氫氧化舞 。中和作用可以以任一適當之分式達成,如於粉末狀中和 劑中攪拌,接著過濾或使反應混合物及任何額外之溶劑通 過或經過其尺寸不會影響流動之粒狀中和劑床。上述之主 體步驟一般係在中和後進行,及/或移除副產物乙酸後進 行。 當X·為_化物基時’形成HX反應副產物。因為存在之Ηχ _-15- 本紙#國家標準(CNS) A4规格(210M97公石 12 五、發明説明( 會對矽氧烷產物之安定性產生負面影響,因此需要使用中 和或移除技藝中已知之方法中和或移除Ηχ。例如當產生 HC1副產物時,可對反應槽提供氣體清除移除。或HQ可使 用上述製程中和。或可藉由以水洗滌矽氧烷樹脂溶液直到 中和,移除HC1。 當形成足量之HX時(亦即矽烷(a)、(b)&(c),全部均含χ ,其中之X為齒化物基),可能矽烷(c)中所有〇R基均在形成 矽氧烷樹脂之過程中移除,使得矽氧烷樹脂組合物包括(A) 及(B)矽氧烷單元,及額外之Si〇4/2單元。 矽氧烷樹脂可以藉由移除溶劑(若使用溶劑)以固態收集 。移除溶劑之方法並不限,且許多方法均為技藝中習知。 例如,可使用在真空及加熱(5〇。(:至12〇。(:)下,以蒸餾移除 溶劑之方法。另外,若矽氧烷樹脂需在特殊溶劑中,則可 藉由添加第二種溶劑,且蒸餾掉第一種溶劑進行溶劑交換 。含超過10重量%與矽鍵結之氫(Si-H)之矽氧烷樹脂均以溶 液態維持,且較少Si-H者可以以固態儲存。 不可溶多孔性樹脂可藉由在足夠之時間及溫度下使矽氧 院樹脂加熱,使矽氧烷樹脂硬化且移除R2&R3〇基,因此 形成不可溶多孔性樹脂製備”移除’’ 一詞意指超過8 〇莫耳% 之鍵結於矽原子之R2及R3〇基已經以在塗層中產生孔隙之 揮發煙及煙部分移除,因此形成不可溶多孔隙樹脂。該加 熱可在單一步驟製程中進行或在二步驟製程令魏行。依二 步驟加熱製程,矽氧烷樹脂先在足夠之溫度下加熱足夠之 時間,進行硬化而沒有明顯移除R2及R3〇基。通常,該溫 -16- 591057 13 五、發明説明( 度可為超過2 0 C至3 5 0它數分鐘至數小時。接著使硬化之矽 氧烧樹脂在超過3 50。(:至比矽氧烷樹脂主鏈或鍵結於矽原 子之R基(如上述)分解低之溫度下進一步加熱,以自矽原 子移除R-及R/0基。通常,移除步驟係在溫度超過35〇。〇至 6〇〇C下進行,且較佳之溫度為400°C至5 50°C。硬化及加熱 步驟之過程中’超過9〇莫耳%之含Ri基之烷基留在矽氧烷 樹脂中’且超過70莫耳%之含氫之卜基留在矽氧烷樹脂中 。最終不可溶多孔隙樹脂之孔隙度控制可經矽氧烷樹脂中 之R2及R/0基及矽氧烷樹脂加熱方式控制。由含有在矽氧 烷樹脂中加入R2基及R3〇基二者之矽氧烷樹脂形成之不可 溶多孔性樹脂與含有在相同組合物(亦即R2或R30離去基之 2〇莫耳%大約相同)之矽氧烷樹脂中僅加入以或r3〇基,且 在相同條件下硬化之矽氧烷樹脂比較,一般會使孔隙度增 加,且通常增加約丨〇體積〇/〇。 單一步驟製程中,矽氧烷樹脂之硬化以及R2及r3〇基之 移除係藉由在超過201至低於矽氧烷樹脂主鏈或本文中所 述與矽原子鍵結之Ri基之分解低之溫度下加熱同時進行, 以自硬化之矽氧烷樹脂移除R2及R3〇基。通常,較好硬化/ 移除步驟係在溫度超過35(TC至6〇〇。(:下進行,且最佳之溫 度範圍為400°C至550°C。 較好加熱係在惰性氣體中進行,但亦可使用其他氣體。 本文令所用之惰性氣體包含(但不限)含氧量低於5〇 ppm, 且較好低於15 ppm之氮氣、氦氣及氬氣。加熱亦可在真空 至上述氣體之有效大氣壓力下,及在任何有效之氧化或非 -17 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐) 591057 A 7 ______B7 五、發明説明(14 ) 氧化氣態環境中,如包括空氣、〇2、氧電漿、臭氧、氨、 胺、水氣、Νβ及氫等之環境中進行。 不可溶多孔性樹脂可用作具有可控制孔隙度及達6〇〇 南溫安定性之多孔性材料,如成型之選擇性氣體或液體滲 透膜、觸媒支撐材、能量儲存系統如電池及分子之分離及 單離。’’多孔性”一詞意指孔隙度在1至6〇體積%之不可溶多 孔性樹脂。較佳之孔隙度為10至6〇體積%。不可溶多孔性 樹脂之模數在1·〇至lOGpa之間。 石夕氧烧樹脂可如下列般在基材上製備多孔性塗層: (A) 以包括含下列成分之矽氧烷樹脂組合物之塗料組合 物塗佈基材: (壮)2.5至85莫耳份之11%〇3/2矽氧烷單元,其中之尺1 係獨立選自包含具有1至5個碳原子之烷基、氫及其混 合物; (b) 2·5至50莫耳份之R2Si〇3/2矽氧烷單元,其中之r2 , 係獨立選自包含具有6至30個碳原子之單價有機基以及 具有6至3 0個碳原子之單價經取代有機基;及 (c) 5至95莫耳份之(RJ〇)bsi〇(4 b)/2矽氧烷單元,其中之 RM系獨立選自包含具有3至3〇個碳原子之分支烷基以及 具有3至30個碳原子之分支經取代烷基,b為1至3。成分 (a)、(b)及(c)之總量為100莫耳份,且成分⑷、及⑷ 之總和為樹脂組合物中全部矽氧烷單元之至少5〇0/〇 ; (B) 使經塗佈之基材加熱至足以使塗料組合物進行硬化 之溫度,及 _____ 18 本國 113 家標ijl(CNS) A4規格(21()x 297公着)The reaction was carried out at 5m. The time for the shape cut depends on the number of factors, such as (but not limited to) the special siloxane used, the temperature, and the Rl, r2ar3 molar ratios required in the reaction product. Usually, the reaction time is from minutes to hours. In order to increase the molecular weight of the prepared oxox resin and improve the storage stability of the siloxane resin, it is preferable to perform the main step, followed by the above reaction or a part thereof. " Main body 'means that the reaction is carried out at 40t to the reflux temperature of the solvent for several hours to increase the weight. It is better to use the knife. The reaction compound is heated to make the weight average molecular weight of the heated resin in the Shixi Oxygen Institute between Between about 5,000 and 500,000. When X is a fluorenyloxy group such as ethenyloxy group, a considerable acid such as acetic acid is produced as a by-product of the reaction. Since the presence of acetic acid can adversely affect the stability of the siloxane resin product, any acetic acid needs to be neutralized. Neutralization of the by-product acetic acid can be carried out by contacting the reaction mixture with a neutralizing agent or by removal by distillation. Distillation usually removes acetic acid by adding a solvent such as toluene (if not already present), and azeotroping with the solvent under reduced pressure and heating (such as up to 50 ° C). If a neutralizing agent is used, sufficient tests are required to neutralize the remaining acetic acid and insufficient tests, so that the silicone resin product will not be catalytically rearranged. Examples of suitable bases include calcium carbonate, sodium carbonate, sodium bicarbonate, ammonium carbonate, ammonia, calcium oxide or hydroxide. Neutralization can be achieved by any suitable fraction, such as stirring in a powdered neutralizer, followed by filtration or passing the reaction mixture and any additional solvents through or through a granular neutralizer bed that does not affect flow . The above main steps are generally performed after neutralization, and / or after removing by-product acetic acid. When X · is an oxide group, H 'reaction by-product is formed. Because of the existence of Ηχ _-15- 本 纸 # National Standard (CNS) A4 specification (210M97 male stone 12 V. Description of the invention (It will have a negative impact on the stability of the siloxane product, so it needs to be neutralized or removed.) Known methods to neutralize or remove Ηχ. For example, when HC1 by-products are generated, the reaction tank can be provided with gas removal and removal. Or HQ can be neutralized using the above process. Or the siloxane resin solution can be washed with water until Neutralize and remove HC1. When a sufficient amount of HX is formed (ie, silane (a), (b) & (c), all of which contain χ, where X is a dentate group), it is possible that silane (c) All OR groups in the resin are removed during the formation of the siloxane resin, so that the siloxane resin composition includes (A) and (B) siloxane units, and additional Si04 / 2 units. Alkane resin can be collected in a solid state by removing the solvent (if a solvent is used). The method of removing the solvent is not limited, and many methods are known in the art. For example, it can be used under vacuum and heating (50. (: To 120. (:), remove the solvent by distillation. In addition, if the siloxane resin In special solvents, the solvent can be exchanged by adding the second solvent and distilling off the first solvent. Siloxane resins containing more than 10% by weight of silicon-bonded hydrogen (Si-H) are used in solution The state is maintained, and those with less Si-H can be stored in a solid state. The insoluble porous resin can be heated by the silicone resin at a sufficient time and temperature to harden the silicone resin and remove R2 & R3. The term "removed" means that more than 80 mole% of the R2 and R30 groups bonded to the silicon atom have been used to generate volatile fumes and fumes in the coating. Partially removed, thus forming an insoluble porous resin. This heating can be performed in a single-step process or ordered in a two-step process. According to the two-step heating process, the siloxane resin is first heated at a sufficient temperature for a sufficient time , Hardening without obvious removal of R2 and R30 groups. Generally, the temperature -16- 591057 13 V. Description of the invention (degrees can be more than 20 C to 3 50 0 minutes to hours. Then harden it Silicone fired resin at more than 3 50. (: to ratio The main chain of the silicone resin or the R group bonded to the silicon atom (as described above) is further heated at a low temperature to remove the R- and R / 0 groups from the silicon atom. Generally, the removal step is performed at a temperature exceeding It is carried out at 35.0 to 600 ° C, and the preferred temperature is 400 ° C to 5 50 ° C. During the hardening and heating steps, more than 90 mol% of the Ri group-containing alkyl group is left in the silicon In the siloxane resin, more than 70 mol% of hydrogen-containing hydrogen groups remain in the siloxane resin. The final porosity control of the insoluble porous resin can be controlled by the R2 and R / 0 groups in the siloxane resin and The heating method of the siloxane resin is controlled. The insoluble porous resin formed by the siloxane resin containing both R2 group and R30 group is added to the siloxane resin and the same is contained in the same composition (that is, R2 or R30). 20 mol% of deradicalized is about the same). Siloxane resin added with only or r30 group, and hardened under the same conditions, will generally increase the porosity, and usually increase about 丨〇Volume 0 / 〇. In a single step process, the hardening of the siloxane resin and the removal of R2 and r30 groups are caused by the decomposition of the siloxane group that is more than 201 to less than the siloxane resin main chain or the silicon atom-bound Ri group described herein. Heating at a low temperature is performed simultaneously to remove the R2 and R30 groups from the hardened siloxane resin. Generally, the better hardening / removal step is performed at a temperature exceeding 35 ° C. to 600 ° C., and the optimal temperature range is 400 ° C. to 550 ° C. The better heating is performed in an inert gas. However, other gases can also be used. The inert gas used in this article includes (but is not limited to) nitrogen, helium, and argon with an oxygen content of less than 50 ppm, and preferably less than 15 ppm. Heating can also be performed under vacuum To the effective atmospheric pressure of the above gases, and at any effective oxidation or non-17, this paper size applies the Chinese National Standard (CNS) A4 specification (210X 297 mm) 591057 A 7 ______B7 V. Description of the invention (14) Oxidation gaseous state Environment, such as air, 02, oxygen plasma, ozone, ammonia, amines, water vapor, Nβ and hydrogen, etc. Insoluble porous resin can be used to have controllable porosity and up to 600. South Wen's stable porous materials, such as formed selective gas or liquid permeable membranes, catalyst support materials, energy storage systems such as battery and molecular separation and isolation. The term "porosity" means that the porosity is within 1 to 60% by volume of insoluble porous tree . The preferred porosity is 10 to 60% by volume. The modulus of the insoluble porous resin is between 1.0 and 10 Gpa. The sintered resin can prepare a porous coating on the substrate as follows: ( A) The substrate is coated with a coating composition including a silicone resin composition containing the following components: (Strong) 11% of 2.5 to 85 mol parts of a 3/2 siloxane unit, wherein the ruler 1 is independent Selected from the group consisting of alkyl groups having 1 to 5 carbon atoms, hydrogen and mixtures thereof; (b) 2.5 to 50 mol parts of R2Si03 / 2 siloxane units, wherein r2 is independently selected from the group consisting of Monovalent organic groups having 6 to 30 carbon atoms and monovalent substituted organic groups having 6 to 30 carbon atoms; and (c) 5 to 95 mol parts (RJ〇) bsi〇 (4 b) / 2 Siloxane units, wherein RM is independently selected from the group consisting of branched alkyl groups having 3 to 30 carbon atoms and branched substituted alkyl groups having 3 to 30 carbon atoms, and b is 1 to 3. Ingredient (a) The total amount of (b) and (c) is 100 mol parts, and the sum of the components ⑷ and ⑷ is at least 50,000 / 〇 of all the siloxane units in the resin composition; (B) the coated The substrate is heated to Temperature sufficient to harden the coating composition, and _____ 18 national standards 113 ijl (CNS) A4 specifications (21 () x 297)

ATAT

(C)進一步使經塗佈之基材加熱至足以自硬化之塗料組 合物移除R2及r3〇基之溫度,因此在基材上形成不可溶多 =性塗層。較好矽氧烷樹脂每1〇〇莫耳份之(a)、(b)及(c)總 里各平^均3〇至60莫耳份之⑷、10至25莫耳份之⑻及20至50 莫耳伤之(c),且樹脂組合物中全部之及至少為 全部矽氧烷單元之70%。 夕氧烷樹脂一般係以溶劑分散液加於基材上。可用之溶 d I 3可使矽氧烷樹脂溶解或分散,形成均勻液體混合物 ’而不會影響所得塗層或基材之劑類或劑類之混合物。溶 劑一般可為不含可參與矽氧烷樹脂反應之官能基如羥基之 任何有;[幾,合劑,±述討冑中針對石夕烧混合物反應列舉者為 水。 /谷劑之含t 以使石夕氧烧樹脂溶解至特殊用途所需之 濃度之量。一般溶劑之含量以矽氧烷樹脂及溶劑之重量為 準為40至95重量%,較好為7G至崎量%。若錢㈣脂已 經留$本文上述之溶劑中,則在基材塗佈中可使用溶劑, 或若需要,可藉由添加第二種溶劑,1蒸除第一種溶劑進 行簡易溶劑交換。 將矽氧烷樹脂塗佈於基材上之特殊方法包含(但不限)旋 轉塗佈、浸潰塗佈、噴塗、力動塗佈、網印或其他。較佳 之塗佈方法為旋轉塗佈。當使用溶劑時,係使溶劑自塗佈 之基材蒸發,使矽氧烷樹脂塗料沉積在基材上。蒸發^之 任一適當之裝置均可使用,如暴露於週遭環境令之簡易空 氣乾燥,抽真空或中溫加熱(達到5〇ΐ )或硬化過程中之早(C) The coated substrate is further heated to a temperature sufficient to remove the R2 and r30 groups from the hardened coating composition, thereby forming an insoluble polytropic coating on the substrate. (A), (b), and (c) of each 100 mol parts of the preferred siloxane resin are averaged at 30 to 60 mol parts, 10 to 25 mol parts, and (C) 20 to 50 moles, and all and at least 70% of the total siloxane units in the resin composition. The epoxy resin is generally added to a substrate as a solvent dispersion. The available solvent d I 3 can dissolve or disperse the siloxane resin to form a homogeneous liquid mixture 'without affecting the coatings or substrates or the mixture of agents. The solvent may generally be free of functional groups that can participate in the reaction of the siloxane resin, such as any of the hydroxyl groups; The amount of t / cereal that is used to dissolve the oxidized sintered resin to the concentration required for special applications. The content of the general solvent is 40 to 95% by weight, preferably 7G to 70% by weight based on the weight of the siloxane resin and the solvent. If Qian Zhizhi has been left in the solvents mentioned above, a solvent can be used in the coating of the substrate, or if necessary, a simple solvent exchange can be performed by adding the second solvent and distilling off the first solvent. Special methods for applying a siloxane resin to a substrate include, but are not limited to, spin coating, dip coating, spray coating, dynamic coating, screen printing, or other. The preferred coating method is spin coating. When a solvent is used, the solvent is evaporated from the coated substrate to deposit a siloxane resin coating on the substrate. Evaporation ^ Any suitable device can be used, such as simple air drying caused by exposure to the surrounding environment, vacuum or medium temperature heating (up to 50ΐ) or early in the hardening process

16W1057 五、發明説明( 期階段。當使用旋轉塗佈時,額外之乾燥方法為最小,因 為旋轉會去除溶液。 塗佈於基材之後,使矽氧烷樹脂塗層在足以使矽氧烷樹 月曰進行硬化且移除鍵結於石夕原子之R2及R3 〇基之溫度下加 熱,因此形成不可溶多孔隙塗層。”硬化塗層組合物"一詞 思&塗層基本上不溶於使矽氧烷樹脂沉積在基材上之溶劑 中,或上述用於矽氧烷樹脂塗佈之任何溶劑。”移除,,意指 超過80莫耳%之與矽原子鍵結之R2及r3〇基已經以塗佈過 耘中產生之揮發物烴及烴部分移除,使之形成多孔隙樹脂 。加熱可在單一步驟製程中進行,或在二步驟製程中進行 。依二步驟加熱製程,矽氧烷樹脂先在足夠之溫度下加熱 進行硬化,而沒有明顯移除R2及R3〇基。通常,該溫度可 為超過20C至350C。接著使硬化之石夕氧烧樹脂在超過35〇 C至比矽氧烷樹脂主鏈或鍵結於矽原子之Rl基(如上述)分 解低之溫度下進一步加熱,以自矽原子移除R2及R3〇基(離 去基)。通常,較好移除步驟係在溫度超過35〇t至6〇〇t下 進行,且較佳之溫度為400°C至550°C。硬化及加熱步驟之 過程中,超過90莫耳%之含Ri基烷基留在矽氧烷樹脂中, 且超過70莫耳%之含氫Ri基留在矽氧烷樹脂中。 單一步驟製程中,矽氧烧樹脂之硬化以及R2及R3〇基之 移除係藉由在超過20°C至低於矽氧烷樹脂主鏈或本文中所 述與矽原子鍵結之Ri基之分解溫度低之溫度下加熱同時進 行’以自硬化之塗料組合物移除R2及r3〇基。通常,較好 硬化/移除步驟係在溫度超過35(rc至6〇〇艽下進行,且最佳 裝 線 本紙張尺度 _-20- 『家標準(CNS) A4規格(210X297公釐) 17 五、發明説明( 之溫度範圍為400°C至550。(: 隙度控制可以以硬氧院樹脂 加熱方式控制。 最終不可溶多孔隙樹脂之孔 中R及R 〇基以及矽氧烷樹脂 較好加熱係在惰性氣體中進行,但亦可使用其他氣體。 本文中所用之惰性氣體包含(但不限)含氧量低於5—, 且較好低於15 ppm之氮氣、氦氣及氬氣。加埶亦可在直命 至上述氣II之有效大氣壓力了,及在任何有效之氧化或: 乳化氣態環境中,如包括空氣、〇2、氧電漿、臭氧、氨、 胺、水氣、N2〇及氫等之環境中進行。 糟由上述方法,可在基材上製備薄(低於5微米)之不可溶 多孔性塗層。較好不可溶多孔性塗層之厚度狀3至25微米 ’且厚度更好為0.5M.2微米。該塗層可使各種基材之表面 平整化,且具有極佳黏性。 任-種加熱法如使用石英管爐、對流爐或㈣或微波能 均可提供本文之功能。同樣的,加熱之速率_般並非重要 之因子,但最實際且最好塗佈基材之加熱盡可能的快。 本文中製備之不可溶多孔性塗層可在任何基材上製備。 然而,該塗料對於電子基材特別有用。”電子基材,,意指包 含用於製造半導體組件之以矽為主之裝置及以鎵砷為主之 裝置,包含聚焦平面陣列、光電裝置、光電流電池、光學 裝置、如電晶體之裝置、3-D裝置、絕緣材上之矽之裝置、 超晶袼裝置等。 右需要可將額外之塗料塗佈在絕緣多孔隙塗層之上。此 等可包含例如S i〇2塗料、含矽之塗料、含矽碳之塗料、含 591057 A? _______B7 五、發明説明^ ~~' ~16W1057 V. Description of the invention (phase). When spin coating is used, the extra drying method is minimal, because the spin will remove the solution. After coating on the substrate, the silicone resin coating is sufficient to make the silicone tree It is hardened and heated at a temperature that removes the R2 and R3o groups bonded to the Shi Xi atom, thereby forming an insoluble porous coating. "The hard coating composition " the word think " the coating is basically Insoluble in the solvent that deposits the siloxane resin on the substrate, or any of the solvents described above for coating the siloxane resin. "Removed, means more than 80 mole% of R2 bonded to the silicon atom And r30 groups have been removed with the volatile hydrocarbons and hydrocarbons produced during coating to form a porous resin. Heating can be performed in a single step process or in a two step process. Heating in two steps In the manufacturing process, the siloxane resin is first heated at a sufficient temperature to be hardened without significantly removing the R2 and R30 groups. Generally, the temperature can be more than 20C to 350C. Then the hardened stone oxy-fired resin is cured at more than 35 〇C to specific silicone resin The main chain or bond is further heated at a temperature where the Rl group of the silicon atom (as described above) decomposes to remove the R2 and R30 groups (leaving groups) from the silicon atom. Generally, the better removal step is at temperature It is carried out at a temperature of more than 350,000 to 600, and the preferred temperature is 400 ° C to 550 ° C. During the hardening and heating steps, more than 90 mol% of the Ri group-containing alkyl group is left in the siloxane resin And more than 70 mol% of hydrogen-containing Ri groups remain in the siloxane resin. In a single step process, the curing of the siloxane resin and the removal of the R2 and R30 groups are carried out at temperatures in excess of 20 ° C to Heating is performed at a temperature lower than the decomposition temperature of the siloxane resin main chain or the Ri group bonded to the silicon atom as described herein to perform the 'removal of the R2 and r30 groups from the hardened coating composition. The hardening / removing step is performed at a temperature exceeding 35 ° C to 600 ° C, and the optimal size of the paper is _-20- "Home Standard (CNS) A4 Specification (210X297mm) 17 V. Invention Note (The temperature range is from 400 ° C to 550. (: Gap control can be controlled by hard-oxygen resin heating method. In the end it is not possible The R and R 0 groups in the pores of the porous resin and the siloxane resin are preferably heated in an inert gas, but other gases can also be used. The inert gas used herein includes (but is not limited to) an oxygen content lower than 5—, and preferably less than 15 ppm of nitrogen, helium and argon. It can also be added directly to the effective atmospheric pressure of the above-mentioned gas II, and in any effective oxidation or emulsification gaseous environment, such as Including air, 02, oxygen plasma, ozone, ammonia, amine, water vapor, N20 and hydrogen, etc. By the above method, thin (less than 5 microns) insoluble can be prepared on the substrate. Porous coating. The thickness of the insoluble porous coating is preferably 3 to 25 microns and the thickness is more preferably 0.5M.2 microns. This coating flattens the surface of various substrates and has excellent adhesion. Any type of heating method, such as the use of a quartz tube furnace, convection furnace, or radon or microwave energy, can provide the functions of this article. Similarly, the rate of heating is generally not an important factor, but the most practical and best way to heat the coated substrate is as fast as possible. The insoluble porous coatings prepared herein can be prepared on any substrate. However, this coating is particularly useful for electronic substrates. "Electronic substrate" means silicon-based devices and gallium-arsenic-based devices used in the manufacture of semiconductor components, including focusing planar arrays, photovoltaic devices, photocurrent cells, optical devices, such as transistors , 3-D devices, silicon-on-insulator devices, supercrystalline silicon devices, etc. On the right, additional coatings can be applied on top of the insulating porous coating. These can include, for example, Si02 coatings, Coating of silicon, coating containing silicon carbon, containing 591057 A? _______B7 V. Description of the invention ^ ~~ '~

矽II之塗料、含矽氧氮之塗料、含矽氮碳之塗料、及/或由 揲疋型SiC· H、鑽石、氮化矽之沉積(亦即CVD、pEcvD 等)製備之似鑽石塗料。塗佈該塗料之方法為技藝中已知。 塗佈額外塗料之方法並沒有限制,且該塗層一般係以化學 蒸氣沉積技術塗佈,如熱化學蒸氣沉積(TCVD)、光化學蒸 氣沉積、電漿提昇之化學蒸氣沉積(pECVD)、電子迴旋加 速器共振(ECR)及喷射蒸氣沉積。額外之塗料亦可以物理蒸 氣沉積技術如濺射或電子束蒸發塗佈。此等製程包含以加 熱或電漿形式將能量加於蒸發之物種中,產生所需之輻射 ,或將能量聚焦於材料之固態樣品上,造成其沉積。 以本方法形成之不可溶多孔性塗層在電子裝置如積體電 路上當作塗層特別有用。以該方法製備之不可溶多孔性塗 層之介電常數在1.5至3之間,對於層間之介電塗層更好為 1·5至2.5。”多孔性”一詞意指孔隙度為1至6〇體積%之不可 溶多孔性塗層。較好孔隙度在丨〇至6〇體積%之間。不可溶 多孔性塗層之模數在i 〇至1〇 Gpa之間。 實例 下列所提供之非限制用實例使熟習本技藝者可更輕易了 解本發明。實例中之重量以克(g)表示。分子量為以凝膠滲 透層析測定之重量平均分子量(Mw)級數平均分子量(Mn) 。石夕氧院樹脂組合物之分析係使用29Si核磁共振(NMR)進行 。但吸收之多孔性測量係使用QuantaChrome Autosorb 1 MP 系統進行。硬化之矽氧烷樹脂在置於樣品電池之前研磨成 細微粉末’除氣數小時,且加於分析站中。表面積係以 1 007nQQ -22- 本紙張尺中"^標_NS^4規格(2ι〇 χ挪公fSilicon II coatings, siloxane-containing coatings, silicon-nitrogen-carbon-containing coatings, and / or diamond-like coatings prepared from 揲 疋 -type SiC · H, diamond, silicon nitride deposition (ie, CVD, pEcvD, etc.) . The method of applying the coating is known in the art. The method of applying additional coatings is not limited, and the coating is generally applied by chemical vapor deposition techniques, such as thermochemical vapor deposition (TCVD), photochemical vapor deposition, plasma enhanced chemical vapor deposition (pECVD), electronics Cyclotron resonance (ECR) and jet vapor deposition. Additional coatings can also be applied by physical vapor deposition techniques such as sputtering or e-beam evaporation. These processes include adding energy to the evaporated species in the form of heat or plasma to generate the required radiation, or focusing the energy on a solid sample of the material, causing its deposition. The insoluble porous coating formed by this method is particularly useful as a coating on electronic devices such as integrated circuits. The dielectric constant of the insoluble porous coating layer prepared by this method is between 1.5 and 3, and more preferably between 1.5 and 2.5 for the dielectric coating layer. The term "porosity" means an insoluble porous coating having a porosity of 1 to 60% by volume. The preferred porosity is between 0 and 60% by volume. The modulus of the insoluble porous coating is between 10 and 10 Gpa. Examples The following non-limiting examples are provided to make the present invention easier for those skilled in the art. The weights in the examples are expressed in grams (g). The molecular weight is the weight average molecular weight (Mw) series average molecular weight (Mn) measured by gel permeation chromatography. The analysis of the resin composition of Shixi Oxygen Institute was performed using 29Si nuclear magnetic resonance (NMR). However, the measurement of the porosity of the absorption was performed using the QuantaChrome Autosorb 1 MP system. The hardened siloxane resin was ground to a fine powder ' for several hours before being placed in the sample cell, and added to the analysis station. Surface area is based on 1 007nQQ -22- in this paper rule " ^ 标 _NS ^ 4 specifications (2ι〇 χ Norwegian public f

裝 訂Binding

k 591057 A7 ___ B7 明説明7 19 ) " "~~k 591057 A7 ___ B7 Note 7 19) " " ~~

Br*unauer-Emmett-Teller法測定。總孔隙體積係在相對壓力 接近1 (P/P〇= 0.995)下,由孔隙中吸收之蒸氣量,加上充 填吸收劑之孔隙測定。骨幹之密度係使用氦氣比重瓶測量 。骨幹密度代表測量中不含任何内部空洞、龜裂或孔隙之 矽氧烷樹脂固體結構之實際密度。百分比孔隙度係由骨幹 密度及總孔隙體積計算。折射係數(RI)及塗層厚度係使用 Wo oil am M-88分光橢圓計測量。 下列實例中,Me代表甲基,且tBu代表第三丁基,AcO 代表乙酸氧基’ Et代表乙基。下表中,n.m•代表未測量之 特殊性質。 實例1 該實例說明石夕氧烧樹脂組合物之形成,其中R 1為氫、R2 為具有8至22個碳原子之有機基,且R3為第三丁基。將 HSi(OEt)3(A),(AcO)2Si(OtBu)2(B)及 R2Si(〇Me)3(C)依表 1 中所述之量’在氬氣下加於75克於瓶中之四氫唉喃(thf) 中。將去離子水(D)加於瓶中,且使混合物在室溫攪拌1小 時。接著將7 5克甲苯添加於混合物中。使用旋轉蒸發器移 除溶劑’獲得黏稠油狀石夕氧烧樹脂,接著立即溶於1 5 〇克甲 苯中。藉由減壓加熱至38t ’與甲笨共沸移除副產物乙酸 。再將樹脂溶於甲苯中,且在回流甲苯中共沸乾燥及加熱1 小時。過濾溶液且蒸發去除溶劑,獲得矽氧烷樹脂產物。 Μ脂合成之概要列於表1中r 2 S i (Ο M e) 3 (C)中之R2列於表2 中。樹脂結構及分子量之分析列於表3中。Br * unauer-Emmett-Teller method. The total pore volume is determined by the amount of vapor absorbed in the pores at a relative pressure close to 1 (P / P0 = 0.995), plus the pores filled with the absorbent. Backbone density is measured using a helium pycnometer. Backbone density represents the actual density of the siloxane resin solid structure without any internal voids, cracks or pores in the measurement. Percent porosity is calculated from backbone density and total pore volume. The refractive index (RI) and coating thickness were measured using a Wo oil am M-88 spectroscopic ellipsometer. In the following examples, Me represents methyl, tBu represents third butyl, and AcO represents acetoxyoxy 'Et represents ethyl. In the table below, n.m • stands for special properties that have not been measured. Example 1 This example illustrates the formation of a sintered oxygen fired resin composition in which R 1 is hydrogen, R 2 is an organic group having 8 to 22 carbon atoms, and R 3 is a third butyl group. Add HSi (OEt) 3 (A), (AcO) 2Si (OtBu) 2 (B), and R2Si (〇Me) 3 (C) in the amounts described in Table 1 to 75 g under argon in a bottle Tetrahydropyran (thf). Deionized water (D) was added to the bottle, and the mixture was stirred at room temperature for 1 hour. 75 grams of toluene was then added to the mixture. The solvent was removed using a rotary evaporator to obtain a viscous oily sintered resin, which was then immediately dissolved in 150 g of toluene. The by-product acetic acid was removed by heating to 38t ' with azeotrope under reduced pressure. The resin was dissolved in toluene and azeotropically dried and heated in refluxing toluene for 1 hour. The solution was filtered and the solvent was removed by evaporation to obtain a siloxane resin product. The summary of M lipid synthesis is listed in Table 1 and R2 in r 2 S i (0 M e) 3 (C) is listed in Table 2. The analysis of the resin structure and molecular weight is shown in Table 3.

本纸張>〇定適角ψ -23- Γ家標準(CNS) A4規格(210X297公着) 591057 AT B7 五、發明説明(20 表1樹脂合成概要 實例 編说 (A) (克) (B) (克) (C) (克) (D) (克) 回流步驟 中之甲苯 (克) 產率 (克) 外觀 Μ 25.3 40.0 19.3 14.4 250 43.6 Oil 1-2 22.5 40.0 25.7 14.4 250 46.7 Oil 1-3 36.5 20.0 25.6 16.4 250 44.4 Oil 1-4 12.4 10.0 10.3 6.7 110 19.6 Wax 1-5 29.0 40.8 10.3 14.0 120 37.0 Wax 1-6 40.0 25.0 11.8 13.2 250 41.0 Oil 1-7 40.0 25.0 25.5 15.1 250 47.4 Oil 1-8 40.0 25.0 21.3 14.8 250 49.2 Oil 1-9 40.0 25.0 16.0 13.1 250 42.9 Oil 表2 實例編號 R- group in (C) 1-1 CH3(CH2)i7- 1-2 CH3(CH2)i7- 1-3 ch3(ch2)17- 1-4 CH3(CH2)i7- i 1 ! 1-5 ch3(ch2)17- - ! ! 1 1-0 ! CH3〇(CH2CH2〇)7_9(CH2)3- 丨 C’ f.丨;(V H 2)}丨(X’ H,C H,- 1 ί-Ν (CM3 )3CCH2(^.'M3 C'ihCi-iCH2- 1 (:卜'丨 CF'sCT 卜 CTi,- ΙΠ7^α.ο_1—--- ί家標準(CNS) A4規格(210X297公釐) 591057 A7B7 五、發明説明(21 表3(則丨03/2)〖,(1123丨〇3/2以冲11〇)1)8丨044/2)樹脂之分析 實例 以反應物為準 之f/g/h之莫耳比 Pg/h之莫耳比 (29SiNMR) Μη Mvv i j 1 1 1 ! 1-1 0.45/0.15/0.40 0.46/0.13/0.41 9360 72.100 1-2 0.40/0.20/0.40 0.41/0.19/0.40 5660 80,200 1-3 0.65/0.20/0.15 n.m. n.m. >100,00 1-4 0.55/0.20/0.25 0.54/0.18/0.24 8270 35,900 1-5 0.50/0.10/0.40 n.m. n.m. n.m. 1-6 0.48/0.09/0.43 0.42/0.04/0.54 n.m. n.m. 1-7 0.43/0.18/0.39 0.43/0.14/0.43 2880 72,200 1-8 0.43/0.18/0.39 0.55/0.23/0.22 1450 19,700 1-9 0.48/0.083/0.44 0.47/0.05/0.48 9040 158,100 實例2a 該實例說明矽氧院樹脂組合物之說明,其中之R 1為氫, R2為十八烷基且R3為第三丁基。(MeO)2SiCM$藉由使256.0 克(1.51 莫耳)SiCl4、228.0 克(1.46 莫耳)Si(OMe)4及 13.5 克 (10 1.3毫莫耳)A1C13在氮氣中,於以鋁箔覆蓋之瓶中混合製 備’以保護反應免於照射UV光。使混合物在室溫及氮氣中 攪拌1 7天,同時持續免受UV光照射。抽真空自反應混合物 洛館未反應氣石夕烧’且留在浸在液氣中之Schlenk管中。留 下之產物在760 mmHg下蒸餾,獲得許多特性為29Si NMR, 且包含富含Cl2Si(OMe)2之餾份: 餾份 1 (b.p· 95°C,70 mmHg) 87.0克’含44.0重量 % Cl3Si(OMe) -25- 本 (CNS) A4規格(210X297公釐) 591057This paper> 〇 Set the appropriate angle ψ -23- Γ family standard (CNS) A4 specifications (210X297) 591057 AT B7 V. Description of the invention (20 Table 1 Resin synthesis example edited (A) (g) ( B) (g) (C) (g) (D) (g) Toluene (g) in the reflux step Yield (g) Appearance M 25.3 40.0 19.3 14.4 250 43.6 Oil 1-2 22.5 40.0 25.7 14.4 250 46.7 Oil 1 -3 36.5 20.0 25.6 16.4 250 44.4 Oil 1-4 12.4 10.0 10.3 6.7 110 19.6 Wax 1-5 29.0 40.8 10.3 14.0 120 37.0 Wax 1-6 40.0 25.0 11.8 13.2 250 41.0 Oil 1-7 40.0 25.0 25.5 15.1 250 47.4 Oil 1 -8 40.0 25.0 21.3 14.8 250 49.2 Oil 1-9 40.0 25.0 16.0 13.1 250 42.9 Oil Table 2 Example number R- group in (C) 1-1 CH3 (CH2) i7- 1-2 CH3 (CH2) i7- 1- 3 ch3 (ch2) 17- 1-4 CH3 (CH2) i7- i 1! 1-5 ch3 (ch2) 17--!! 1 1-0! CH3〇 (CH2CH2〇) 7_9 (CH2) 3- 丨 C 'f. 丨; (VH 2)} 丨 (X' H, CH,-1 ί-Ν (CM3) 3CCH2 (^. 'M3 C'ihCi-iCH2- 1 (: 卜' 丨 CF'sCT 卜 CTi, -ΙΠ7 ^ α.ο_1 —--- ί Standard (CNS) A4 specification (210X297 mm) 591057 A7B7 V. Description of the invention (21 Table 3 (then 丨 03/2) 〖, (1123 丨 〇3 / 2 to 1111) 1) 8 丨 044/2) Resin analysis example based on reactant Molar ratio of f / g / h Molar ratio of Pg / h (29SiNMR ) Μη Mvv ij 1 1 1! 1-1 0.45 / 0.15 / 0.40 0.46 / 0.13 / 0.41 9360 72.100 1-2 0.40 / 0.20 / 0.40 0.41 / 0.19 / 0.40 5660 80,200 1-3 0.65 / 0.20 / 0.15 nmnm > 100 , 00 1-4 0.55 / 0.20 / 0.25 0.54 / 0.18 / 0.24 8270 35,900 1-5 0.50 / 0.10 / 0.40 nmnmnm 1-6 0.48 / 0.09 / 0.43 0.42 / 0.04 / 0.54 nmnm 1-7 0.43 / 0.18 / 0.39 0.43 / 0.14 / 0.43 2880 72,200 1-8 0.43 / 0.18 / 0.39 0.55 / 0.23 / 0.22 1450 19,700 1-9 0.48 / 0.083 / 0.44 0.47 / 0.05 / 0.48 9040 158,100 Example 2a This example illustrates the description of a silicone resin composition, where Wherein R 1 is hydrogen, R 2 is octadecyl and R 3 is third butyl. (MeO) 2SiCM $ By making 256.0 grams (1.51 moles) of SiCl4, 228.0 grams (1.46 moles) of Si (OMe) 4 and 13.5 grams (10 1.3 millimoles) of A1C13 in nitrogen, in a bottle covered with aluminum foil Medium-mixed to protect the reaction from UV light. The mixture was stirred at room temperature under nitrogen for 17 days while continuously protected from UV light. The reaction mixture was evacuated and the unreacted gas stone burned in Luoguan 'was left in a Schlenk tube immersed in liquid gas. The remaining product was distilled at 760 mmHg to obtain a number of characteristics of 29Si NMR and a fraction rich in Cl2Si (OMe) 2: Fraction 1 (bp · 95 ° C, 70 mmHg) 87.0 g '44 .0% by weight Cl3Si (OMe) -25- (CNS) A4 size (210X297 mm) 591057

AT B7 五、發明説明(22 ) ,43.2重量 % Cl2Si(OMe)2& 12.8重量 % CISi(〇IV[e)3。 德份 2 (b.p. 102°C ,7〇 mmHg) 119.0 克含 8.5 重量 % Cl3Si(OMe)、58.7 重量 % C12Si(OMe)2 及 32.8 重量 % ClSi(OMe)3 〇 實例2b 藉由在氮氣及0°C下,將Π9·0克上述餾份2添加於1.5升 (1·5莫耳,過量)之1Μ第三丁氧化鉀/THF溶液中製備 (MeO)2Si(OtBu)2。接著將500毫升無水THF添加於反應混合 物中,同時在回流(65 °C )下攪拌4小時。溶劑在20 °C之100 mmHg真空中蒸發。反應產物以戊烷/乙醚混合物洗條數次 ,經過濾、且蒸發(92°C,75 mmHg),獲得79.5克以29Si NMR 、13C NMR、GC及GC-MS特性化之無色液體,含go」重量 % (MeO)2Si(OtBu)2、3.8重量% (MeO)3Si(OtBu)及 5.9重量% (MeO)Si(OtBu)3。 實例2c 將5·48克實例2b之反應產物、8.70克CH3(CH2)17Si(〇Me)3 及7·62克HSi(OEt)3之混合物添加於40毫升MIBK中,接著在 氮氣下滴加於包括80毫升MIBK、40毫升甲苯及60毫升去離 子水之混合物中。反應混合物在120°C下回流隔夜。冷卻後 ,將反應混合物分離成兩相,水/不可溶物質及有機相。使有 機相與水/不可溶物質相分離,且使用dean stark盤乾燥。使 用旋轉蒸發器蒸發溶劑,獲得7·2克蠟狀固體,其以 識為 CH3SiO3/2)0.55(CH3(CH2)17SiO3/2)0.24((tBnO)bSi〇4.b/2)()” ,Μη 為 3030且 Mw 為 4410。 26- 本紙S 【國國家標準(CNS) A4規格(210X297公釐) 591057 23 五、發明説明( 實例3 该實例說明在與實例丨相似之條件下製備矽氧烷樹脂 組合物,其中Ri為氫,R2為經取代之苯基乙基,且r3為 第二丁基。將 HSl(〇Et)3(A)、(Ac〇)2Si(〇tBu)2(B)及對 -ZC^hCt^CHeKOEtWC)依表4中所述之量,於氬氣下添 加於37克在瓶中之四氫呋喃(thf)中。接著將去離子水(D) 加於溶液中,且使混合物在室溫攪拌隔夜。將5〇克之甲笨 加於反應混合物中。使用旋轉蒸發器,在3 5至4(rc下移除 溶劑’獲得黏稠液體,且立即將其溶於80克甲苯中。與曱 笨共彿移除殘留之乙酸(共沸沸點為3 8 °C )。將黏稠液體加 於120克甲苯中,獲得10重量〇/〇黏稠液體(以甲笨及黏稠液體 之總重為準),其於回流下加熱30分鐘,且共沸乾燥及回流 1小時。過濾溶液且以蒸發移除溶劑,獲得最終樹脂產物。 樹脂合成之彙整列於表4中。樹脂之分析列於表5中。 表4樹脂合成之彙整 實例編號 ㈧ (克) (Β) (克) (C)對- zc6h,ch2ch2- Si(OEt)3 ——-. (D) (克) —---- 產率 (克) 3-1 5.6 5 9.6 (Z=Me) ! 3.1 ^^ Ύο 3-2 5.6 5 10.2 (Z=MeO) 3.1〜 9.6 Λ , 5.6 5 11.8 (Z=Br) TP^ 1〇8 3-4 5.6 5 9.2 (Z=H) Ί 6.7 u— 各紙段國家標準 27- (CNS) A4規格(210X297公釐) 591057 Λ7 B7 五、發明説明(24 表 5 (HSi03/2)f(ZC6H4CH2CH2)Si03/2)g((tBu0)bSi04.b/2)h 樹脂之分析 實例 以反應物為準 之%1ι之莫耳比 fg/h之莫耳比 (29Si NMR) Μη Mw 3-1 0.25/0.5/0.25 0.27/0.5/0.23 580 1.400 3-2 0.25/0.5/0.25 0.21/0.51/0.28 480 930 j-j 0.25/0.5/0.25 0.25/0.47/0.28 n.m. 460 — 3-4 0.25/0.5/0.25 0.24/0.53/0.23 n.m. 600 — 實例4 該實例說明不可溶多孔性樹脂之製備,其中Ri為氫,R2 為具有8至2 2個碳原子之有機基,且R3為第三丁基。將實例 1及實例2中製備之樹脂(2至3克)稱重於氧化鋁坩堝中,且 移入石英管爐中。將爐抽真空至<20 mmHg (<2666 Pa),且 以氬氣回充填。在速率為50至60°C/分鐘下將樣品加熱至表 6中所示之溫度,且於冷卻至室溫前於該溫度下維持2小時 ’同時沖氬氣。所得硬化物質為透明狀或稍不透明薄膜。 氮吸收測量之熱解條件,焦炭產率,TGA(熱比重分析)產 率及孔隙度數據均列於表6及7中。焦炭產率及TGA產率係 以在特定溫度下分析後留下之重量%表示。 _ -28- 1家標本(CNS)A4規格(210 X 297公釐) 591057 Λ7 B7 五、發明説明(25 表6硬化樹脂之分析 實例 編號 樹脂 樣品 編號 焦炭 產率 '450〇C (重量%) TGA 產率 450〇C (重量%) TGA 產率 500°C 1 (重量%) 孔隙1體積 cm"克 表面積 BET, m2/克 4-1 1-1 51.9 73.8 56.4 0.701 1213 4-2 1-2 53.0 75.2 53.2 0.678 1123 4-3 1-3 53.9 77.5 57.9 0.623 1007 4-4 1-4 61.8 80.2 58.2 0.349 534 4-5 1-5 60.8 70.8 62.6 0.515 882 4-6 1-6 48.5 49.8 483 0.297 528 4-7 1-7 52.1 52.5 46.4 0.430 723 4-8 1-8 40.1 38.8 36.2 0.452 770 4-9 1-9 60.6 54.3 52.7 0.246 417 4-10 2c n.m. n.m. n.m. 0.457 752 表7硬化樹脂之分析 實例 編號 1 樹脂 樣品 編號 Skeletal 密度 克/cm3 孔隙體積 cm3/克 孔隙度 丨重量% ! | i表面積 j 丨 BET, ! m2/克 ! ! 4-1 Μ : 1.669 ! 0.701 1 53.9 "213 : 4-2 1.638 : 0.678 52.0 1123 4-3 :-3 1.337 : 0.623 ,45.4 :1007 4-4 1.346 0.349 :32.U ^34 : 4-5 ]-5 1.751 0.515 47.4 | S8: 實例5 該實例說明在基材上形成不可溶多孔性塗層,其中之R1 007?;〇7____ 本紙張尺度適用中Η國家標準(CNS) A4規格(210X297公釐) 591057AT B7 V. Description of the invention (22), 43.2% by weight Cl2Si (OMe) 2 & 12.8% by weight CISi (〇IV [e) 3. Defen 2 (bp 102 ° C, 70mmHg) 119.0 g containing 8.5% by weight Cl3Si (OMe), 58.7% by weight C12Si (OMe) 2 and 32.8% by weight ClSi (OMe) 3 〇Example 2b by nitrogen and 0 At a temperature of 9 ° C, Π9 · 0 g of the above-mentioned fraction 2 was added to 1.5 liters (1.5 mol, excess) of a 1M solution of potassium third butoxide / THF to prepare (MeO) 2Si (OtBu) 2. Then, 500 ml of anhydrous THF was added to the reaction mixture while stirring at reflux (65 ° C) for 4 hours. The solvent was evaporated in a vacuum of 100 mmHg at 20 ° C. The reaction product was washed with a pentane / ether mixture several times, filtered, and evaporated (92 ° C, 75 mmHg) to obtain 79.5 g of a colorless liquid characterized by 29Si NMR, 13C NMR, GC, and GC-MS, containing go "% By weight (MeO) 2Si (OtBu) 2, 3.8% by weight (MeO) 3Si (OtBu), and 5.9% by weight (MeO) Si (OtBu) 3. Example 2c A mixture of 5.48 g of the reaction product of Example 2b, 8.70 g of CH3 (CH2) 17Si (〇Me) 3, and 7.62 g of HSi (OEt) 3 was added to 40 ml of MIBK, followed by dropwise addition under nitrogen. In a mixture comprising 80 ml of MIBK, 40 ml of toluene and 60 ml of deionized water. The reaction mixture was refluxed overnight at 120 ° C. After cooling, the reaction mixture was separated into two phases, water / insoluble matter and organic phase. The organic phase was separated from the water / insoluble material phase and dried using a dean stark tray. The solvent was evaporated using a rotary evaporator to obtain 7.2 g of a waxy solid, which was identified as CH3SiO3 / 2) 0.55 (CH3 (CH2) 17SiO3 / 2) 0.24 ((tBnO) bSi〇4.b / 2) () " , Mη is 3030 and Mw is 4410. 26- This paper S [National National Standard (CNS) A4 specification (210X297 mm) 591057 23 V. Description of the invention (Example 3 This example illustrates the preparation of silicon oxide under similar conditions to Example 丨Alkane resin composition, wherein Ri is hydrogen, R2 is a substituted phenylethyl group, and r3 is a second butyl group. HS1 (〇Et) 3 (A), (Ac〇) 2Si (〇tBu) 2 ( B) and p-ZC ^ hCt ^ CHeKOEtWC) were added to 37 g of tetrahydrofuran (thf) in a bottle under argon in the amounts described in Table 4. Next, deionized water (D) was added to the solution. And the mixture was stirred at room temperature overnight. 50 grams of methylbenzyl was added to the reaction mixture. Using a rotary evaporator, the solvent was removed at 35 to 4 (rc) to obtain a viscous liquid, and it was immediately dissolved in 80 G of toluene. Residual acetic acid (azeotropic boiling point: 3 8 ° C) was removed with cobenfos. The viscous liquid was added to 120 g of toluene to obtain 10 weight 0 / 〇 viscous liquid (with methylbenzyl and viscous The total weight of the liquid is based), it is heated under reflux for 30 minutes, and azeotropically dried and refluxed for 1 hour. The solution is filtered and the solvent is removed by evaporation to obtain the final resin product. The summary of the resin synthesis is shown in Table 4. Resin The analysis is shown in Table 5. Table 4 Resin Synthesis Example No. ㈧ (g) (B) (g) (C) Pair-zc6h, ch2ch2- Si (OEt) 3 ——-. (D) (g) —---- Yield (g) 3-1 5.6 5 9.6 (Z = Me)! 3.1 ^^ Ύο 3-2 5.6 5 10.2 (Z = MeO) 3.1 ~ 9.6 Λ, 5.6 5 11.8 (Z = Br) TP ^ 1〇8 3-4 5.6 5 9.2 (Z = H) Ί 6.7 u— National standard for each paper section 27- (CNS) A4 specification (210X297 mm) 591057 Λ7 B7 V. Description of the invention (24 Table 5 (HSi03 / 2) f (ZC6H4CH2CH2) Si03 / 2) g ((tBu0) bSi04.b / 2) h Resin analysis example Based on the reactant% 1 Molar ratio fg / h Molar ratio (29Si NMR) Μη Mw 3-1 0.25 / 0.5 / 0.25 0.27 / 0.5 / 0.23 580 1.400 3-2 0.25 / 0.5 / 0.25 0.21 / 0.51 / 0.28 480 930 jj 0.25 / 0.5 / 0.25 0.25 / 0.47 / 0.28 nm 460 — 3-4 0.25 / 0.5 / 0.25 0.24 / 0.53 / 0.23 nm 600 — Example 4 This example illustrates the preparation of an insoluble porous resin Wherein Ri is hydrogen, R2 is an organic group having 8-2 carbon atoms 2, and R3 is tert-butyl. The resins (2 to 3 g) prepared in Examples 1 and 2 were weighed into an alumina crucible and transferred to a quartz tube furnace. The furnace was evacuated to < 20 mmHg (< 2666 Pa) and backfilled with argon. The sample was heated to a temperature shown in Table 6 at a rate of 50 to 60 ° C / min, and maintained at that temperature for 2 hours while cooling to room temperature while flushing argon. The obtained hardened substance is a transparent or slightly opaque film. The pyrolysis conditions, coke yield, TGA (thermal specific gravity analysis) yield and porosity data for nitrogen absorption measurements are listed in Tables 6 and 7. Coke yield and TGA yield are expressed as weight percent remaining after analysis at a specific temperature. _ -28- One specimen (CNS) A4 size (210 X 297 mm) 591057 Λ7 B7 V. Description of the invention (25 Table 6 Analysis example of hardened resin No. Resin sample No. Coke yield '450 ° C (wt%) TGA yield 450 ° C (wt%) TGA yield 500 ° C 1 (wt%) Pore 1 volume cm " gram surface area BET, m2 / g 4-1 1-1 51.9 73.8 56.4 0.701 1213 4-2 1-2 53.0 75.2 53.2 0.678 1123 4-3 1-3 53.9 77.5 57.9 0.623 1007 4-4 1-4 61.8 80.2 58.2 0.349 534 4-5 1-5 60.8 70.8 62.6 0.515 882 4-6 1-6 48.5 49.8 483 0.297 528 4 -7 1-7 52.1 52.5 46.4 0.430 723 4-8 1-8 40.1 38.8 36.2 0.452 770 4-9 1-9 60.6 54.3 52.7 0.246 417 4-10 2c nmnmnm 0.457 752 Table 7 Analysis example of hardened resin No. 1 Resin sample No. Skeletal density g / cm3 pore volume cm3 / g porosity 丨 weight%! | I surface area j 丨 BET,! M2 / g!! 4-1 Μ: 1.669! 0.701 1 53.9 " 213: 4-2 1.638: 0.678 52.0 1123 4-3: -3 1.337: 0.623, 45.4: 1007 4-4 1.346 0.349: 32.U ^ 34: 4-5] -5 1.751 0.515 47.4 | S8: Example 5 This example illustrates the formation of an insoluble porous coating on a substrate, of which R1 007 ?; 〇7 ____ This paper size applies to the China National Standard (CNS) A4 specification (210X297 mm) 591057

為氫,R2為具有8至22個碳原子之有機基,R3為第三丁美 將依實例卜2及3製備之樹脂(2至3克)溶於Μΐβκ中一,开^ 含25重量%樹脂之透明溶液。溶液經1〇微米注射器薄膜過 濾器過濾,接著經0.2微米注射器薄膜過濾器過濾,移除任 何大的顆粒。藉由在2000 rpm下之旋轉塗佈將溶液塗佈於 矽晶圓上20秒鐘。將經塗佈之矽晶圓置於石英管爐中,且 對該爐沖氮氣。使爐快速加熱至45〇〇c(5〇£>c至6〇它/分梦 ^維持在450t下2小時,接著冷卻至室溫,同時維 氮氣。經塗佈之晶圓於測量性質前儲存於氮氣中。薄祺性 表8矽晶圓上之薄膜性質,450。〇 實例 編號 樹脂 樣品 編號 Dk 「模數, GPa ί硬度, GPa 丨厚度 ,埃 ~RI 5-1 1-1 2.30 3.4 0.53 9396 1.186^^ 1-2 1.97 2.1 0.36 ll 795 T3 1.70 Τδ ΎΤ\ ' 15020~一 ^TTl78^^ 5-4 1-4 2.55 4.7 0.80 4921 5-5 1-5 2.25 4.4 0.36 14,532 ΎΤβΓ'^ 5-6 1-6 2.67 f 6.9 0.63 7478 Τ233^〜 5-7 ί ! : 1-7 ! 2.58 6.3 0.56 | _ _ ~L 5737 j Τ23Ϊ— ! 5-8 : 1-8 ~| 2.72 ! 8.0 0.66 ; 4048 1 Τ23ΤΠ ! 5-Q ; 1-9 ; 2.8:: ΙΟ.5 0.94 ! 4244 ;5-;0 2c :.i8 : 2.0 : 0.39 3295 Τ3ΊΤ—! ! 5-i 1 : 3-1 2.56 : 3.7 丨 0.5: ί 7697 5-;:— :.89 ()·η ΟΛΜ 7355 ΐ-4ΰ(Γ^; 5- i > 丨 n.m. 5 Λ.) O.cSM 6〇74 7.433 1 ' --L Λ 1 一 — 5.1 (i.SO ' /、; 一 007598 _善 本紙張尺度適用中國國家標準(CNS) Λ4規格(210X297公釐) B7 27 五、發明説明( 實例6 奈該實例說明在各種溫度下,於基材上形成不可溶多孔性 塗3層,其中之Rl為氫,R2為具有8至22個碳原子之有機基, V為第三丁基。將依實例1製備之樹脂(2至3克)溶於MIBK :一开> 成含25重量%樹脂之透明溶液。溶液經丨〇微米注射 器薄膜過濾器過濾,接著經〇·2微米注射器薄膜過濾器過濾 移除任何大的顆粒。藉由在2〇〇〇 下之旋轉塗佈將溶 液塗佈於矽晶圓上20秒鐘。將經塗佈之矽晶圓置於石英管 爐中’且對該爐沖氮氣。使爐加熱至250、390及450°C,且 刀別在各溫度下維持丨小時,接著冷卻至室溫,同時維持沖 氮氣。經塗佈之晶圓於測量性質前儲存於氮氣中。薄膜性 質列於表9中。 表9矽晶圓上之薄膜性質 編號 樹脂 樣品 編號 r"1 ·ι Dk —模數,~~ GPa GPa 厚度 ,埃 RI Tyger 6-1 r λ " 1-1 ^17 2.3 0.24 11.580 1.215 6-2 ί 1-3 1.80 1.2 0.14 11.749 i 1.206 實例7 該貫例說明矽氧烷樹脂組合物之製備,其中R1為甲基, R2為十八烷基且R3為第三丁基。將MeSi(0Me)3(A)、 (AcO)2Si(〇tBu)2(B)及 CH3(CH2)17Si(〇Me)3(C)依表 9 中所述 之量’在氬氣下添加於75克在瓶中之THF中。接著將去離 -31 - 本紙張尺、3 9家標準 (CNS) Α4規格(210X297公釐) 591057Is hydrogen, R2 is an organic group having 8 to 22 carbon atoms, and R3 is a third butyl group. The resin prepared according to Examples 2 and 3 (2 to 3 g) is dissolved in Mΐβκ, containing 25% by weight. Transparent resin solution. The solution was filtered through a 10 micron syringe membrane filter and then through a 0.2 micron syringe membrane filter to remove any large particles. The solution was applied on a silicon wafer by spin coating at 2000 rpm for 20 seconds. The coated silicon wafer was placed in a quartz tube furnace, and the furnace was flushed with nitrogen. The furnace was rapidly heated to 4500c (50 £> c to 60 ° C / min dream) maintained at 450t for 2 hours, and then cooled to room temperature while maintaining nitrogen. The coated wafers were measured for properties Before being stored in nitrogen. Thinness Table 8 Properties of thin films on silicon wafers, 450. Example number Resin sample number Dk "Modulus, GPa ί hardness, GPa 丨 thickness, Angstrom ~ RI 5-1 1-1 2.30 3.4 0.53 9396 1.186 ^^ 1-2 1.97 2.1 0.36 ll 795 T3 1.70 Τδ ΎΤ \ '15020 ~ 一 ^ TTl78 ^^ 5-4 1-4 2.55 4.7 0.80 4921 5-5 1-5 2.25 4.4 0.36 14,532 ΎΤβΓ' ^ 5-6 1-6 2.67 f 6.9 0.63 7478 Τ233 ^ ~ 5-7 ί!: 1-7! 2.58 6.3 0.56 | _ _ ~ L 5737 j Τ23Ϊ—! 5-8: 1-8 ~ | 2.72! 8.0 0.66 4048 1 Τ23ΤΠ! 5-Q; 1-9; 2.8 :: 100.5 0.94! 4244; 5-; 0 2c: .i8: 2.0: 0.39 3295 Τ3ΊΤ—!! 5-i 1: 3-1 2.56: 3.7 丨 0.5: ί 7697 5- ;:-: .89 () · η ΟΛΜ 7355 ΐ-4ΰ (Γ ^; 5- i > 丨 nm 5 Λ.) O.cSM 6〇74 7.433 1 '--L Λ 1 — 5.1 (i.SO '/ ,; 007598 _ Rare book paper standards apply Chinese national standards (CNS) Λ4 specification (210X297 mm) B7 27 V. Description of the invention (Example 6) This example illustrates the formation of three layers of insoluble porous coating on the substrate at various temperatures, where R1 is hydrogen and R2 is An organic group of 8 to 22 carbon atoms, V is a third butyl. The resin (2 to 3 g) prepared according to Example 1 was dissolved in MIBK: One Kelvin> to form a transparent solution containing 25% by weight of resin.丨 0 micron syringe membrane filter, then filtered through a 0.2 micron syringe membrane filter to remove any large particles. The solution was coated on a silicon wafer by spin coating at 2000 for 20 seconds Bell. Place the coated silicon wafer in a quartz tube furnace and flush the furnace with nitrogen. The furnace is heated to 250, 390, and 450 ° C, and the knife is maintained at each temperature for 丨 hours, and then cooled to At room temperature while maintaining a flush of nitrogen. The coated wafers were stored under nitrogen before the properties were measured. The film properties are listed in Table 9. Table 9 Film properties on silicon wafers. Resin sample number r " 1 · ι Dk — modulus, ~~ GPa GPa thickness, RI Tyger 6-1 r λ " 1-1 ^ 17 2.3 0.24 11.580 1.215 6- 2 1-3 1.80 1.2 0.14 11.749 i 1.206 Example 7 This example illustrates the preparation of a siloxane resin composition in which R1 is a methyl group, R2 is an octadecyl group, and R3 is a third butyl group. MeSi (0Me) 3 (A), (AcO) 2Si (〇tBu) 2 (B) and CH3 (CH2) 17Si (〇Me) 3 (C) were added in the amount described in Table 9 'under argon In 75 g of THF in a bottle. Then leave -31-This paper ruler, 39 standard (CNS) A4 size (210X297 mm) 591057

AT B7 五、發明説明(28 ) 子水(D)加於溶液中,且使混合物在室溫攪拌1小時。將75 克甲笨加於反應混合物中。使用旋轉蒸發器移除溶劑,獲 得黏稠由狀產物,且立即將其溶於150克甲笨中。在減壓下 加熱至38°C,與甲笨共沸移除殘留之乙酸溶液樹脂再溶於 2 5 0克甲苯中及並沸脫水及回流1小時。溶液經過濾且蒸發 移除溶劑,獲得最終樹脂產物。樹脂合成之彙整列於表i 〇 中。樹脂之分子量資料列於表11中。 表10樹脂合成之彙整 實例 (Α) (Β) (C) (D) 產率 外觀 編就 (克) (克) (克) (克) (克) 7-1 9.3 10.2 12.8 6.1 12.4 Wax 7-2 14.9 40 10.28 11.2 34.4 Oil 7-3 23.4 40.1 ΓΪ2.8 14.4 Uo.i roll 7-4 21.0 40.0 19.3 14.4 45.4 Wax 7〇 27.8 29.9 12.8 15.0 40.0 Oil 表 ll(MeSi03/2)f(CH3(CH2)17Si03/2)g((tBu0)bSi04.b/2)h 樹脂之分析 一 _ -32- 7紙張紅轉辦A4規格(2Ϊ〇 297公釐) 實例 以反應物為準之 沒g/h之莫耳比 Μη Mw 7-1 0.55/0.20/0.25 6730 22.600 7«2 0.40/0.10/0.50 2790 18,300 7-3 0.50/0.10/0.40 1560 9800 7-4 0.45/0· 15/0.40 1830 10.100 7,5 0.60/Ό. 10/0.30 2470 8320 591057AT B7 V. Description of the invention (28) Water (D) is added to the solution, and the mixture is stirred at room temperature for 1 hour. 75 grams of methylbenzyl were added to the reaction mixture. The solvent was removed using a rotary evaporator to obtain a viscous product, and it was immediately dissolved in 150 g of methylben. It was heated to 38 ° C under reduced pressure, and the residual acetic acid solution resin was azeotropically removed with methylbenzyl, and then dissolved in 250 g of toluene, and dehydrated and refluxed for 1 hour. The solution was filtered and evaporated to remove the solvent to obtain the final resin product. A summary of the resin synthesis is shown in Table i 〇. The molecular weight information of the resin is shown in Table 11. Table 10 Aggregated Examples of Resin Synthesis (Α) (Β) (C) (D) Yield Appearance Coding (g) (g) (g) (g) (g) (g) 7-1 9.3 10.2 12.8 6.1 12.4 Wax 7- 2 14.9 40 10.28 11.2 34.4 Oil 7-3 23.4 40.1 ΓΪ2.8 14.4 Uo.i roll 7-4 21.0 40.0 19.3 14.4 45.4 Wax 7〇27.8 29.9 12.8 15.0 40.0 Oil Table 11 (MeSi03 / 2) f (CH3 (CH2) 17Si03 / 2) g ((tBu0) bSi04.b / 2) h Analysis of Resin 1--32-7 7 Paper Red Transfer Office A4 Specification (2297297 mm) Mole ratio Mη Mw 7-1 0.55 / 0.20 / 0.25 6730 22.600 7 «2 0.40 / 0.10 / 0.50 2790 18,300 7-3 0.50 / 0.10 / 0.40 1560 9800 7-4 0.45 / 0 · 15 / 0.40 1830 10.100 7,5 0.60 / Ό. 10 / 0.30 2470 8320 591057

實例8 ,該實例說明不可溶多孔性樹脂之製備,其中R1為甲美, R2為十八烧基,且R3為第三丁基。將實例7中製備之^脂 (2至3克)稱重於氧化鋁坩堝中,且移入石英管爐中。將濟 抽真空至<20 mmHg (<2666 Pa),且以氬氣回充填。在^ 率為50至60°C/分鐘下將樣品加熱至表12中所示之溫度, 且於冷卻至室溫前於該溫度下維持2小時,同時沖氮氣。 所得硬化物質為透明狀或稍不透明薄膜。氮吸收測量之熱 解條件,焦炭產率,T G A產率及孔隙度數據均列於表丨2及 13中。 表12硬化樹脂之孔隙度及焦炭產率 • 33- 木紙1國國家標準(CNS) Λ4規格(210 X 297公貧7 實例 編號 樹脂 樣品 編號 焦炭 產率 450〇C (重量%) TGA 產率 450〇C (重量%) TGA 產率 500°C (重量%) 孔隙體積 cm3/克 表面積 BET, m2/克 8-1 7-1 47.0 78.7 49.2 ~〇315~ 719 8-2 7-2 55.1 59.5 51.4 731 8-3 7-3 52.7 60.7 52.5 "^523~ 874 8-4 7-4 51.9 ί 60.8 48.5 0.464 749 8-5 7-5 58.1 64.9 55.8 0.436 711 591057 B7 五、發明説明(3〇 表1 3硬化樹脂之分析 實例 編號 Ο 1 樹脂 樣品 編號 Skeletal 密度 克/cm3 孔隙體積 cm3/克 孔隙度 1重量% 表面積 j BET, m2/克 ---^ 7-1 ____ ] 1.380 0.515 41.5 719 8-2 73 1-— 1.591 ----—-- — 0.451 ------- 41.8 731 8-j Ο Λ 7-3 1.429 — 0.523 42.8 874 8-4 Q C 7-4 1.508 "0.464 ~ 41.2 749 80 1 7〇 —----- 1.447 "α436 _ — 38.7 711 實例9 該實例說明在各種溫度下,於基材上形成不可溶多孔性 塗層’其中之R1為甲基,R2為十八烷基,R3為第三丁基。 將依實例7製備之樹脂(2至3克)溶於MIBK中,形成含25重 $ %樹脂之透明溶液。溶液經丨·〇微米注射器薄膜過濾器過 濾,接著經0.2微米注射器薄膜過濾器過濾,移除任何大的 顆粒。藉由在2000 rpm下之旋轉塗佈將溶液塗佈於矽晶圓 上20秒鐘。將經塗佈之矽晶圓置於石英管爐中,且對該爐 沖氮氣。使爐快速加熱至45〇。(: (50t: s6〇t/分鐘),且在 450°CT維持2小時,接著冷卻至室溫,同時維持沖氮氣。 經塗佈之晶圓於測量性質前儲存於氮氣中。薄膜之模數及 介電常數列於表14中。 本紙 -34 591057 A7Example 8. This example illustrates the preparation of an insoluble porous resin, where R1 is methamyl, R2 is octadecyl, and R3 is third butyl. The grease (2 to 3 g) prepared in Example 7 was weighed into an alumina crucible and transferred to a quartz tube furnace. The vacuum was evacuated to < 20 mmHg (< 2666 Pa) and backfilled with argon. The sample was heated to a temperature shown in Table 12 at a rate of 50 to 60 ° C / minute, and maintained at that temperature for 2 hours before cooling to room temperature while flushing nitrogen. The obtained hardened substance is a transparent or slightly opaque film. Pyrolysis conditions, coke yield, TG A yield and porosity data for nitrogen absorption measurements are listed in Tables 2 and 13. Table 12 Porosity and Coke Yield of Hardened Resin • 33- National Standard for Wood and Paper (CNS) Λ4 Specification (210 X 297 Poor 7) Example No. Resin Sample No. Coke Yield 450 ° C (wt%) TGA Yield 450 ° C (wt%) TGA yield 500 ° C (wt%) Pore volume cm3 / g Surface area BET, m2 / g 8-1 7-1 47.0 78.7 49.2 ~ 〇315 ~ 719 8-2 7-2 55.1 59.5 51.4 731 8-3 7-3 52.7 60.7 52.5 " ^ 523 ~ 874 8-4 7-4 51.9 ί 60.8 48.5 0.464 749 8-5 7-5 58.1 64.9 55.8 0.436 711 591057 B7 V. Description of the invention (Table 30) 1 3 Analysis example of hardened resin No. 0 1 Resin sample No. Skeletal Density g / cm3 Pore volume cm3 / g Porosity 1% by weight Surface area j BET, m2 / g --- ^ 7-1 ____] 1.380 0.515 41.5 719 8- 2 73 1 --- 1.591 ---------0.451 ------- 41.8 731 8-j Λ 7-3 1.429 — 0.523 42.8 874 8-4 QC 7-4 1.508 " 0.464 ~ 41.2 749 80 1 7〇 —----- 1.447 " α436 _ — 38.7 711 Example 9 This example illustrates the formation of an insoluble porous coating on a substrate at various temperatures, where R1 is methyl and R 2 is octadecyl and R3 is third butyl. The resin (2 to 3 g) prepared according to Example 7 was dissolved in MIBK to form a transparent solution containing 25% by weight of the resin. The solution was passed through a micrometer syringe Filter through a membrane filter and then filter through a 0.2 micron syringe membrane filter to remove any large particles. The solution was coated on a silicon wafer by spin coating at 2000 rpm for 20 seconds. The silicon wafer was placed in a quartz tube furnace, and the furnace was flushed with nitrogen. The furnace was quickly heated to 45 °. (: (50t: s60t / min), and maintained at 450 ° C for 2 hours, and then cooled to the chamber Temperature while maintaining nitrogen flushing. The coated wafers were stored in nitrogen before measuring properties. The modulus and dielectric constant of the film are listed in Table 14. Paper -34 591057 A7

Hold

Order

591057 A? B7 五、發明説明(32 Q& 呤q(〇5— Κ) p Η—^ Η Ο — 〇 〇 L) UJ ^ Η ON ρ ▲ T ] o s; 命5 ί ^ 〇 b v〇 b D: 00 ^3 m 〇 L) o to- GO —· c^ O B On iT 3 〇 |5 I- ο O 2 b E 〇 匕〇 — -J u> n m K t· u> 00 > Ο U) S 〇 〇 g I o b t? -a η h—^ *4^ g o 鷂-a H—^ 〇 E o X -^r >15萆藏命绛Λ脖皭 本^紙中國國家標命(CNS) a4規格(2i〇x 297公着〉 591057 A7591057 A? B7 V. Description of the invention (32 Q & qq (〇5— Κ) p Η— ^ Η 〇 — 〇〇L) UJ ^ Η ON ρ ▲ T] os; Life 5 ί ^ 〇bv〇b D : 00 ^ 3 m 〇L) o to- GO — · c ^ OB On iT 3 〇 | 5 I- ο O 2 b E 〇 〇〇--J u > nm K t · u > 00 > 〇 U) S 〇〇g I obt? -A η h— ^ * 4 ^ go a-a H— ^ 〇E o X-^ r > 15 萆 藏 命 绛 Λ 皭 皭 本 ^ paper China National Standards (CNS) a4 specifications (2i〇x 297) 591057 A7

表1 6物質特性 樣品 理論 組合物 M\v Μη 10-1 T 0.36〇0.46丁、0 丨 8 — 10-2 TH〇.5〇Q〇^TT 4,790 ~ 188,800 實例11 依一般程序,將Cl2Si(〇tBu)2、RSicl3&HSicl3 溶於 4〇 宅升MIBK中,且在0 c、氮氣下滴加於在5〇〇亳升瓶中之含 80毫升MIBK及60毫升0.5 M HC1水溶液中。接著使反應混 合物在2 5 °C下混合隔夜。移除水及不溶物質,且使用丁斯 達克(dean stark)盤將有機相烘乾。使用旋轉蒸發器蒸發溶 劑,獲得4.0克白色固體。樹脂合成之彙整列於表丨7中。分 子量資料及組成列於表1 8中。 表17樹脂合成之彙整Table 1 6 Material properties Sample theoretical composition M \ v Mn 10-1 T 0.36〇0.46 D, 0 丨 8 — 10-2 TH 0.55QQ ^ TT 4,790 ~ 188,800 Example 11 According to the general procedure, Cl2Si ( 〇tBu) 2, RSicl3 & HSicl3 was dissolved in 40 liters of MIBK, and added dropwise to 80 ml of MIBK and 60 ml of 0.5 M HC1 solution in a 500 liter bottle under nitrogen at 0 c. The reaction mixture was then mixed at 25 ° C overnight. Remove water and insoluble material and dry the organic phase using a dean stark tray. The solvent was evaporated using a rotary evaporator to obtain 4.0 g of a white solid. The summary of resin synthesis is listed in Table 丨 7. The molecular weight data and composition are listed in Table 18. Table 17 Summary of resin synthesis

樣品 11 1 I 理論 組合物 -Τ' ι * j —y-, W i HsiCl3 克/ Cl2Si(OtBu)2 克 RSiCl3 克 ’外觀 11-1 ! 1 ; ί ! ! j ^ 丁 0.5〇(125丁 0.25 7.8 7.0 CH3(CH2)i7SiCl; 11.2 4. solid 1 I;-: 1 j : ! 6.2 | 10.6 CH3(CH:)rSiCh 10.0 i g- ~~ ;1 i-3 ΤΆ.:::ΊΛ:5 i I 7 8 i _____ 7.0 Ci^Si-triisobutxlene j _ I |8·7 Q 包含 Q(QtBu)b _-37· 本紙伕义度適用中國國家標準(CNS> A4規格(210X297公赞) 591057 Λ 7 Β7 34 五、發明説明( 表1 8物質特徵 樣品 R基 理論樹脂 組合物 nmr之 樹脂組合物 Mvv Μη 11-2 CH3(CH2)i7 T,l〇.4Q〇.575TK〇.225 々\^_ΤΗα6ΐ 14200 3790 11-3 tri-isobutylene ?〇5Q〇.25T"~— ^ "〇.42Q〇.〇6TH〇.53 1870 1380 實例12 將貫例11中製備之樹脂樣品母液稱重於氧化铭財竭中, 且移到管狀爐中。將爐抽真空至< 20 torr,且以氣氣回充 。在充氮氣下’以10 c /分鐘將樣品加熱至預定之溫度,立 在冷卻至至溫則於該溫度下維持2小時。獲得透明或稍不透 明薄膜狀最終硬化物質。氮吸收測量之熱解條件、焦炭彥 率及孔隙度資料均列於表19中。 表19在450°C下熱解之樹脂之孔隙度及焦炭產率 成之彙整 樣品 R基 NMR之樹脂組合物 孔 cc/g 11-1 ch;(ch2)17 —T%wQa2:Thl:)60 0.54 ^ 11-2 CH;,(CH:)r 下'满Άι lU8^ ;11-3 tri-isobut\-leneSample 11 1 I Theoretical composition -T ′ ι * j —y-, W i HsiCl3 g / Cl2Si (OtBu) 2 g RSiCl3 g 'Appearance 11-1! 1; ί!! J ^ 0.5 0.5 (125 0.25 7.8 7.0 CH3 (CH2) i7SiCl; 11.2 4. solid 1 I;-: 1 j:! 6.2 | 10.6 CH3 (CH:) rSiCh 10.0 i g- ~~; 1 i-3 ΤΆ. ::: ΊΛ: 5 i I 7 8 i _____ 7.0 Ci ^ Si-triisobutxlene j _ I | 8 · 7 Q Including Q (QtBu) b _-37 · The paper's meaning is applicable to Chinese national standards (CNS > A4 specification (210X297 praise) 591057 Λ 7 Β7 34 V. Description of the invention (Table 1 8 Material characteristics Sample R-based theoretical resin composition nmr Resin composition Mvv Mη 11-2 CH3 (CH2) i7 T, 10.4Q.575TK〇.225 々 \ ^ _ ΤΗα6ΐ 14200 3790 11-3 tri-isobutylene? 〇5Q〇.25T " ~~ ^ " 〇.42Q〇.〇6TH〇.53 1870 1380 Example 12 The mother liquor of the resin sample prepared in Example 11 was weighed to the oxide Mingcai Exhausted, and moved to a tubular furnace. The furnace was evacuated to < 20 torr, and backfilled with gas. Under nitrogen filling, the sample was heated to a predetermined temperature at 10 c / min, and immediately cooled to The temperature is maintained at this temperature for 2 hours Time. Obtain a transparent or slightly opaque film-like final hardened substance. The pyrolysis conditions, coke porosity, and porosity data for nitrogen absorption measurements are listed in Table 19. Table 19 Porosity and temperature of the resin pyrolyzed at 450 ° C The pores of the resin composition of the aggregate sample of the coke yield based on R-NMR cc / g 11-1 ch; (ch2) 17 —T% wQa2: Thl:) 60 0.54 ^ 11-2 CH ;, (CH:) r '满 Άι lU8 ^; 11-3 tri-isobut \ -lene

(01 B u ) b(01 B u) b

Q包含Q -38 ^國國家標苹(CNS) Λ4規格(210 X 297公聲) ^1057 ^1057Q contains Q -38 ^ National National Standard Apple (CNS) Λ4 specification (210 X 297) ^ 1057 ^ 1057

A7 B7 五、發明説明(35 實例1 3 將實例1 1中製備之述之母液溶於甲基異丁基酮(MIBK) 中’形成25重量%透明溶液。接著經過κο微米及〇.2微米注 射薄膜過濾器過濾溶液’移除任何較大之顆粒。將溶液施 加於矽晶圓上,且使用Karl Suss RC8或Headway旋轉塗佈 器且在2000 rpm下旋轉20秒鐘旋轉塗佈於矽晶圓。旋轉膜 之厚度可以結合溶液濃度及旋轉速度控制,其範圍在2〇〇〇 至20,〇〇〇埃之間。 將Μ爿曰膜加於QTF爐中,且在氮氣下快速加熱至4 5 〇。 使薄膜在4 5 0 C下加熱2小時,接著冷卻至室溫。所有經塗 佈之晶圓在測量性質之前均儲存在氮氣中。由丁^丁Rbh樹 脂製備之薄膜之模數及介電常數均列於表2〇中。 表20丁'丁\(^樹脂之薄膜性質A7 B7 V. Description of the invention (35 Example 1 3 The mother liquor prepared in Example 11 was dissolved in methyl isobutyl ketone (MIBK) to form a 25% by weight transparent solution. Then passed κο microns and 0.2 microns Syringe filter filters the solution to remove any larger particles. The solution is applied to a silicon wafer and spin-coated on a silicon wafer using a Karl Suss RC8 or Headway spin coater and spinning at 2000 rpm for 20 seconds The thickness of the rotating film can be controlled by combining the concentration of the solution and the speed of rotation, and the range is between 2000 and 20,000 Angstroms. Add the film to the QTF furnace and quickly heat it under nitrogen. 4 5 0. The film was heated at 450 C for 2 hours, and then cooled to room temperature. All coated wafers were stored in nitrogen before measuring properties. Molds of thin films made of DbRbh resin The numbers and dielectric constants are shown in Table 20. Table 20

Q 包含 Q(QtBl〇b 比較例1 該實例說明矽氧烷樹脂組合物之形成,其中Rl為氮、rQ contains Q (QtB10b Comparative Example 1 This example illustrates the formation of a siloxane resin composition, where R1 is nitrogen, r

___ -39- 用中國國家標苹(CMS) A4規格(210X297公釐) --—--- 591057 A7 B7 五、發明説明(36 並不存在,且為第三丁基。將HSi(〇Et)3(A)、 (AcOhSKOtBuMB)依表13中所述之量,在氬氣下加於72克 於瓶中之四氫呋喃(THF)中。將去離子水(D)加於瓶中,且 使混合物在室溫攪拌丨小時。接著將75克甲苯添加於混合物 中。使用旋轉条發器蒸發移除溶劑,獲得黏稠油狀矽氧烷 樹脂,接著立即溶於150克甲苯中。藉由減壓加熱至38艺, 與甲笨共沸移除副產物乙酸。再將樹脂溶於1 1 〇克甲笨中, 且在回流甲笨中共沸乾燥及加熱1小時。過濾溶液且蒸發去 除溶劑,獲得矽氧烷樹脂產物。樹脂合成之彙整列於表2 i 中。樹脂之分子量資料列於表22中。 表21樹脂合成之彙整 實例 編號 (Α) (克) (Β) (克) (D) (克) 產率 (克) 外觀 C1-1 (5.67 40.2 6.1 23.7 ~ 膠狀 C1-2 11.23 30.0 6.65 18.7 膠狀 C1-3 26.2 20.0 10.0 19.2 膠狀 表 22 (HSi03/2)f(tBu0)bSi04-b/2)g樹脂之分析 實例 |以反應物為準 之f/h之莫耳比 以 29Si NMR 為 準之fg莫耳比 Μη Mw ' CM 0.20/Ό.80 0.21/0.79 3,040 6.300 ^ C1-2 0.40/0.60 0.43/0.57 6,750 25.800 ' C1-3 0.70/0.30 n.m. n.m. 1 -------- n.m. 〇〇1^θ -40- 本紙張尺度適用中額家標準(CNS) Λ4规格(210X297公I) 591057 Λ7 B7 i、發明説明(37 ) 將樹脂之樣品(2至3克)稱重於氧化鋁坩堝中,且移入石 英管爐中。將爐抽真空至<20 mmHg (<2666 Pa),且以氣氣 回充填。在速率為50至60 °C /分鐘下將樣品加熱至4501, 且於冷卻至室溫前於450°C及充氬氣下維持i小時。獲得透 明或稍不透明薄膜狀硬化之矽氧烷樹脂。熱解溫度,焦、炭 產率,及孔隙度數據均列於表2 3中。焦炭產率係以在特定 溫度下分析後留下之重量%表示。 表23硬化樹脂之孔性度及焦炭產率 隙 孔 積^ _3g C j 度m3 5ke密:g/c 脂品號 樹樣編___ -39- Use Chinese National Standard Ping (CMS) A4 specification (210X297 mm) ------ 591057 A7 B7 V. Description of the invention (36 does not exist and is the third butyl. HSi (〇Et ) 3 (A), (AcOhSKOtBuMB) were added to 72 g of tetrahydrofuran (THF) in a bottle under argon in the amounts described in Table 13. Deionized water (D) was added to the bottle, and The mixture was stirred at room temperature for hr. Then 75 g of toluene was added to the mixture. The solvent was removed by evaporation using a rotary hair dryer to obtain a viscous oily siloxane resin, which was then immediately dissolved in 150 g of toluene. Heat to 38 ° C, remove by-product acetic acid azeotropically with methylbenzyl. Then dissolve the resin in 110 g of methylbenzyl, and azeotropically dry and heat in reflux methylbenzyl for 1 hour. Filter the solution and remove the solvent by evaporation to obtain Siloxane resin products. The aggregates of resin synthesis are listed in Table 2i. The molecular weight information of the resins are listed in Table 22. Table 21 Summary examples of resin synthesis (A) (g) (B) (g) (D) (G) Yield (g) Appearance C1-1 (5.67 40.2 6.1 23.7 ~ Colloidal C1-2 11.23 30.0 6.65 18.7 Colloidal C1-3 26.2 20.0 10.0 19.2 Colloidal Table 22 (HSi03 / 2) f (tBu0) bSi04-b / 2) g resin analysis example | Molar ratio of f / h based on the reactant fg Molar ratio of 29Si NMR Μη Mw 'CM 0.20 / Ό.80 0.21 / 0.79 3,040 6.300 ^ C1-2 0.40 / 0.60 0.43 / 0.57 6,750 25.800' C1-3 0.70 / 0.30 nmnm 1 -------- nm 〇〇1 ^ θ- 40- This paper size applies the CNS standard Λ4 specification (210X297 male I) 591057 Λ7 B7 i. Description of the invention (37) Weigh the resin sample (2 to 3 grams) into the alumina crucible and move it Quartz tube furnace. The furnace was evacuated to < 20 mmHg (< 2666 Pa) and backfilled with gas. The sample was heated to 4501 at a rate of 50 to 60 ° C / minute and cooled to room temperature. It was maintained at 450 ° C and argon for i hours before temperature. A transparent or slightly opaque film-like hardened siloxane resin was obtained. The pyrolysis temperature, coke and carbon yields, and porosity data are listed in Table 23. .Coke yield is expressed as weight% remaining after analysis at a specific temperature. Table 23 Porosity and Coke Yield Pore Product of Hardened Resin ^ _3g C j degree m3 5ke dense: g / c Sample

1.787 65.0 0.224 -¾- 將fef脂之樣品(2至3克)溶於MIBK中,形成含25重量%樹 脂之透明溶液。接著使溶液經過1.0微米注射薄膜過濾器及 0.2微米注射薄膜過濾器過濾,移除任何較大之顆粒。在 2000 rpm下旋轉塗佈20秒中,將溶液施加於矽晶圊上。將 經塗佈之矽晶圓置於石英管爐中,且對該爐沖氮氣。使爐 快速加熱至45(rC(5(TC至6(TC/分鐘),且維持在該溫度下2 小時:接著冷卻至室S,同時維持沖贬氣。經塗佈之晶圓 於測里性質前儲存於氮氣中。薄膜之模數及介電性質(Dk) 列於表24中。 Ό0761Ο___-41- 本紙你尺度適“ _家標率(CNS) μ规掩(彻X 297公慶)------- 591057 Λ/ Β7 38 五、發明説明( 表24矽晶圓上樹脂之薄膜性質 樹脂 樣品 編號 Dk 丨模數 1 GPa 硬度 ! GPa i ! ! 厚度, 埃 T ------^ RI CM 24.3 ] 18.6 0.88 ! 4.180 1.321 C1-2 14.9 ! j — j 16.1 1 0.77 4.120 1~35T^ Cl-3 6.34 | 10.8 ! 1.06 i J_[ 6.590 ! 1 1 1.290 __ __ 該實例說明其中之R1為氫,R2不存在且R3為第三丁基之 石夕氧烷樹脂可獲得極佳之模數,但與實例1及2比較時無法 接受高的Dk。該實例亦顯示與含有^及R3基二者之實例1 及2比較時亦呈現較低之孔隙度。 比較例2 該實例說明矽氧烷樹脂組合物之製備,其中之Ri為甲基 ’ R2不存在且R3為第三丁基。將MeSi(〇Me)3(A)、 (AcO)2Si(〇tBu)2(B)及THF依表17中所示之量,於氬氣下加 於瓶中。AcO代表乙醯氧基,Me代表甲基且tBu代表第三丁 基。接著將去離子水加於瓶中,且使混合物在室溫授拌1 小時。將75克甲苯添加於反應混合物中。使用旋轉蒸發器 以蒸發移除溶劑,獲得黏稠油狀產物,且立即溶於1 5 〇克甲 苯中。殘留之乙酸在減壓(共沸沸點38°C )下與甲苯共彿移 除°樹脂再度溶於丨10克甲苯中,且共沸乾燥及回流1小時 。溶液經過濾且蒸發移除溶劑,獲得最終樹脂產物。樹脂 合成之彙整列於表2 5中。樹脂之分子量資料列於表2 6中。 ύ 07611 -42- 本紙張尺度適用巾咖家標㈤CNS) Μ規格(2ΐΰΧ297公I) 591057 A7 B7 五、發明説明(39 表25樹脂合成之彙整 丨實例 編號 ㈧ (克) (B) (克) ! THF (克) h2o (克) 產率 (克) 外觀~ C2-1 18.6 ; 40.0 i 72.0 11.1 23.6 固體 C2-2 27.9 40.0 80.0 Til 26.0 固體 C3-3 43.5 40.3 90.0 20.0 40.0 固體 C3-4 92.9 39.9 120.3 IsJ~~— 67.3 Wax 表26(1^8丨03/2)心811〇)|58丨04.^)/2)11樹脂之分析 實例 以反應物為準 之之莫耳比 1 以 29SiNMR^~ 準之段莫耳比 Μη Μνν C2-1 0.50/0.50 0.44Ό.56 2,990 17.700 — C2-2 0.00/Ό.40 0.5>0.44 2.010 46.000 ' C2-3 0.70/0.30 0.69.0.31 " n.m. ί >100.000 C2-4 0.85/0.15 —0.83/0.17 ' 3.400 131100 ] -^ 將樹脂樣品(2至3克)稱重於氧化链掛禍中,且移入石英 管爐中。將爐抽真空至<20 mmHg (<2666 Pa),且以氬氣回 充填。在速率為1 0 °C /分鐘下將樣品加熱至4 5 0 °C ,且於冷 卻至室溫前於450°C及充氬氣下維持1小時。獲得透明或稍 不透明薄膜狀硬化之矽氧烷樹脂。熱解溫度,焦炭產率, 及孔隙度數據均列於表27中。焦炭產率係以在特定溫度下 分析後留下之重量%表示。 ^ 43- 007612 5910571.787 65.0 0.224 -¾- A sample of fef resin (2 to 3 g) was dissolved in MIBK to form a transparent solution containing 25% by weight of resin. The solution was then filtered through a 1.0 micron injection membrane filter and a 0.2 micron injection membrane filter to remove any larger particles. The solution was applied on a silicon wafer during spin coating at 2000 rpm for 20 seconds. The coated silicon wafer was placed in a quartz tube furnace, and the furnace was flushed with nitrogen. Quickly heat the furnace to 45 ° C (5 ° C to 6 ° C / min), and maintain it at this temperature for 2 hours: then cool down to chamber S, while maintaining degassing. The coated wafers were tested The properties are stored in nitrogen before. The modulus and dielectric properties (Dk) of the film are listed in Table 24. Ό0761〇 ___- 41- This paper is suitable for your scale "_ House Standard Rate (CNS) μ Regulation (Total X 297 public celebration) ------- 591057 Λ / Β7 38 V. Description of the invention (Table 24 Film properties of resin on silicon wafer Resin sample number Dk 丨 Modulus 1 GPa Hardness! GPa i!! Thickness, Angstrom T ---- -^ RI CM 24.3] 18.6 0.88! 4.180 1.321 C1-2 14.9! J — j 16.1 1 0.77 4.120 1 ~ 35T ^ Cl-3 6.34 | 10.8! 1.06 i J_ [6.590! 1 1 1.290 __ __ R1 is hydrogen, R2 is absent and R3 is a tertiary butyl silica resin. An excellent modulus can be obtained, but high Dk cannot be accepted when compared with Examples 1 and 2. This example also shows that it contains ^ Examples 1 and 2 which are both R3 and R3 groups also exhibit lower porosity when compared. Comparative Example 2 This example illustrates the preparation of a siloxane resin composition where Ri is methyl 'R2 is not present and R3 Is the third butyl. MeSi (〇Me) 3 (A), (AcO) 2Si (〇tBu) 2 (B) and THF were added to the bottle under argon in the amounts shown in Table 17. AcO Represents ethoxyl, Me represents methyl and tBu represents third butyl. Next, deionized water is added to the bottle, and the mixture is allowed to stir at room temperature for 1 hour. 75 grams of toluene is added to the reaction mixture. Use The solvent was removed by evaporation on a rotary evaporator to obtain a viscous oily product, which was immediately dissolved in 150 g of toluene. The residual acetic acid was co-removed with toluene under reduced pressure (azeotropic boiling point 38 ° C). The resin was again It is dissolved in 10 grams of toluene, and azeotropically dried and refluxed for 1 hour. The solution is filtered and evaporated to remove the solvent to obtain the final resin product. The synthesis of the resin is listed in Table 25. The molecular weight information of the resin is listed in Table 2. 6. ύ 07611 -42- This paper size applies to coffee house standard (CNS) Μ specifications (2ΐΰ × 297 male I) 591057 A7 B7 V. Description of the invention (39 Table 25 Summary of resin synthesis 丨 Example number㈧ (g) (B) (G)! THF (g) h2o (g) Yield (g) Appearance ~ C2-1 18.6; 40.0 i 72.0 11.1 23.6 Solid C2-2 27. 9 40.0 80.0 Til 26.0 solid C3-3 43.5 40.3 90.0 20.0 40.0 solid C3-4 92.9 39.9 120.3 IsJ ~~ — 67.3 Wax Table 26 (1 ^ 8 丨 03/2) heart 811〇) | 58 丨 04. ^) / 2) Analytical example of 11 resin Molar ratio based on the reactant 1 Molar ratio Μη Μνν in terms of 29SiNMR ^ ~ C2-1 0.50 / 0.50 0.44Ό.56 2,990 17.700 — C2-2 0.00 / Ό. 40 0.5 > 0.44 2.010 46.000 'C2-3 0.70 / 0.30 0.69.0.31 " nm ί > 100.000 C2-4 0.85 / 0.15 —0.83 / 0.17' 3.400 131100]-^ Weigh the resin sample (2 to 3 g) Heavier than the oxidation chain, and moved into the quartz tube furnace. The furnace was evacuated to < 20 mmHg (< 2666 Pa) and backfilled with argon. The sample was heated to 450 ° C at a rate of 10 ° C / min, and maintained at 450 ° C under argon for 1 hour before cooling to room temperature. A transparent or slightly opaque film-like hardened silicone resin was obtained. Pyrolysis temperature, coke yield, and porosity data are listed in Table 27. Coke yield is expressed as the weight percent remaining after analysis at a specific temperature. ^ 43- 007612 591057

AT B7 五、發明説明(4〇 ) 表2 7硬化樹脂之孔性度及焦炭產率 樹脂 樣品 編號 Skeletal 密度 (g/cm3) 焦炭產 率450°C (重量%) 孔隙 體積 cm3/克 孔隙度 (%) 表面積 bet , m2/克 C2-1 1.693 60.5 0.271 31.4 461 C2-2 1.624 72.5 0.280 31.3 481 C2-3 1.505 78.0 0.249 27.2 425 C2-4 1___ 1.398 76.5 0.125 14.9 168 將樹脂之樣品(2至3克)溶於MIBK中,形成含25重量%樹 脂之透明溶液。接著使溶液經過丨.0微米注射薄膜過濾器及 0.2微米注射薄膜過濾器過濾,移除任何較大之顆粒。在 2000 rpm下旋轉塗佈20秒中,將溶液施加於矽晶圓上。將 經塗佈之矽晶圓置於石英管爐中,且對該爐沖氮氣。使爐 快速加熱至表21中所示之溫度(別它至的它/分鐘),且維持 在該溫度下2小時,接著冷卻至室溫,同時維持沖氮氣。經 塗佈之晶圓於測量性質前儲存於氮氣中。薄膜之模數及介 電性質(Dk)列於表28中。 7613__- 44 - 本紙張尺度適用中國國家標準(CNsTXTi格(210X297公釐) 591057 A7 B7 五、發明説明(41 表28矽晶圓上樹脂之薄膜性質AT B7 V. Description of the invention (40) Table 2 7 Porosity and coke yield of hardened resin Resin sample number Skeletal density (g / cm3) Coke yield 450 ° C (wt%) Pore volume cm3 / g porosity (%) Surface area bet, m2 / g C2-1 1.693 60.5 0.271 31.4 461 C2-2 1.624 72.5 0.280 31.3 481 C2-3 1.505 78.0 0.249 27.2 425 C2-4 1___ 1.398 76.5 0.125 14.9 168 Resin samples (2 to 3 G) Dissolved in MIBK to form a transparent solution containing 25% by weight of resin. The solution was then filtered through a .0 micron injection membrane filter and a 0.2 micron injection membrane filter to remove any larger particles. The solution was applied to a silicon wafer during spin coating at 2000 rpm for 20 seconds. The coated silicon wafer was placed in a quartz tube furnace, and the furnace was flushed with nitrogen. The furnace was rapidly heated to the temperature shown in Table 21 (other than it / minute), and maintained at this temperature for 2 hours, and then cooled to room temperature while maintaining nitrogen flushing. The coated wafers were stored under nitrogen before the properties were measured. The modulus and dielectric properties (Dk) of the film are listed in Table 28. 7613 __- 44-This paper size applies Chinese national standard (CNsTXTi grid (210X297mm) 591057 A7 B7 V. Description of the invention (41 Table 28. Properties of resin film on silicon wafer)

C C2 -2-2 2-2-c ic C C2 c C -4 2-12 C CC C2 -2-2 2-2-c ic C C2 c C -4 2-12 C C

脂品號樹樣編Zhipin number tree

-4 | 22-c C-4 | 22-c C

該實例說明其t之R丨為甲基,R2兀六—, 之矽氧烷樹脂與含R1r3之實例子且R為第三丁基 ,但孔隙度較低。 I Π仏時可獲得極佳之Dk 比較例3 該實例說明砂氧烧樹脂之製備,其中之Ri為氫,R、十 八烷基且V不存在。以Collins等人之美 為 3,6i 5,272號之方法製備,且重量子利絶圍第 於甲笨中之氫矽 -為70,000,溶 τ尽τ轧+氧烷樹脂之溶液在11〇。〇下 10°重量份之與丨3_— #芙 x -乙炔基四甲基二矽氡烷錯合 M7614 591057 Λ 7 —-___ Β7 五、發明説明(42 ) 形式之鉑存在下,與卜十八烷烯反應2小時。將反應後之各 樹脂溶液樣品置於陶瓷坩堝中,在35crc及氮氣中加熱〇.5 小時,接著在500 C之氮氣中加熱卜^時。各樹脂溶液之樣 品以曱苯稀釋至1 7重量%,且以旋轉塗佈施加於矽晶圓上 ,如貫例5中所述般硬化,且測量介電常數。表29顯示每i 重量份氫矽倍半氧烷樹脂中所用溶液及卜十八烷烯基之重 $份,各樣品之孔隙度及介電常數。樣品C3-3為含氫矽倍 半氧烧樹脂之曱苯溶液,其並未與丨_十八烷婦反應。 表 29 (HSi03/2)fCH3(CH2)17Si03/2)g樹脂之分析 比較例 編號 广Λ 1 甲苯之 重量份 十八 院稀之 重量份 以反應物為準 之fg莫耳比 孔隙度% Dk 一 C3-1 12.22 1.60 ~ >0.66/0.34 127.1 2.1 Cj-2 2.72 1.10 0.77/0.23 …… 27.9 2.2 C3-3 4.72 0 Τ〇7〇 "~' 0 3.0~ 該實例說明其中之R1為甲基,R2為十八烷基且R3不存在 之矽氧烷樹脂與含R2及R/0之實例1比較時可獲得極佳之 Dk,但孔隙度較低。 -46- 國國家標準(CNS) Λ‘〖規格(210X297公釐)This example shows that R1 of t is a methyl group, R2 is a hexasiloxane, a siloxane resin and an example containing R1r3 and R is a third butyl group, but the porosity is low. Excellent Dk can be obtained when I Π 仏 Comparative Example 3 This example illustrates the preparation of a sand-fired resin where Ri is hydrogen, R, octadecyl, and V are absent. Prepared by the method of beauty of Collins et al. No. 3,6i 5,272, and the weight of hydrogen silicon in Jiabenzhong is 70,000, and the solution of τ and oxane resin is at 110. 〇Under 10 ° parts by weight with 丨 3_— # 芙 x -ethynyltetramethyldisilaxane M7614 591057 Λ 7 —-___ B7 5. In the presence of platinum in the form of (42), and Octane was reacted for 2 hours. Each sample of the resin solution after the reaction was placed in a ceramic crucible, heated in 35 crc and nitrogen for 0.5 hours, and then heated in nitrogen at 500 ° C for 2 hours. Samples of each resin solution were diluted to 17% by weight with toluene and applied to a silicon wafer by spin coating, hardened as described in Example 5, and the dielectric constant was measured. Table 29 shows the weight of the solution used in the silsesquioxane resin and the weight of the octadecenyl group, and the porosity and dielectric constant of each sample. Sample C3-3 was a toluene solution of hydrogen-containing silsesquioxane resin, which did not react with octadecane. Table 29 Analysis of (HSi03 / 2) fCH3 (CH2) 17Si03 / 2) g resin Comparative Example No. Guang 1 1 parts by weight of toluene, 18 parts by weight of dilute, fg mole ratio porosity based on reactant% Dk C3-1 12.22 1.60 ~ > 0.66 / 0.34 127.1 2.1 Cj-2 2.72 1.10 0.77 / 0.23 ...... 27.9 2.2 C3-3 4.72 0 Τ〇〇〇 " ~ '0 3.0 ~ This example shows that R1 is a When the siloxane resin in which R2 is octadecyl and R3 is absent is compared with Example 1 containing R2 and R / 0, excellent Dk can be obtained, but the porosity is low. -46- National Standards (CNS) Λ ’〖Specifications (210X297 mm)

Claims (1)

591057591057 i 591057 ABC 8 D 、申請專利範圍 .如申請專利範圍第1項之矽氧烷樹脂組合物,其中之樹 脂額外的包含至少一種選自Risi(x)d〇(3d⑺; R2Si(X)dO(3-d/2); si(X)d(〇R3)f〇(nf/2)、si〇4/2&其混合 物之石夕氧烷單元之矽氧烷單元,其中Rl、R2&R3之定義 如上’且各X係獨立為可水解基或羥基,且4及[為1至 2 0 6·種製備包括RlSi〇3/2石夕氧院單元、R2Si03/2石夕氧烧單元 及(R3〇)bSl0(4-b)/2矽氧烷單元之矽氧烷樹脂之方法,其 中該分法包括: 使下列成分合併足夠之時間及溫度,進行矽氧烷樹脂 之調配: (a) 2·5至85莫耳%之式RiSiX3之矽烷或矽烷混合物, 其中R1係獨立選自包含具有1至5個碳原子之烷基、氫或 其混合物,X係獨立為可水解基或羥基; (b) 2.5至50莫耳%之式R2SiX3之矽烷或矽烷混合物, 其中之R係獨立選自包含具有6至3〇個碳原子之單價有 機基及具有6至30個碳原子之經取代單價有機基,χ獨立 為可水解基或羥基; (c) 5至95莫耳%之式(R3〇)cSix(4 c)之石夕烧或石夕烷混合 物,其中之R3係獨立選自包含具有3至3〇個碳原子之分 支烷基及具有3至30個碳原子之分支經取代烷基,(;為1 至3(含),X獨立為可水解基或羥基,㈣⑷,㈨及⑷ 合计100莫耳份;及 (d) 水。 -2 - 本紙張尺度適用中國國家標準(CNS) A4規格(21〇x297公董) 591057 、申請專利範園 :·如申請專利範圍第6項之方法,尚包括溶劑。 •如:凊專利範圍第6項之方法,其中R1係選自包含甲基 :氫及其混合物,R2為具有10至2〇個碳原子之未經取二 :、’’工取代之烷基’且r3為具有4至18個碳原子之三級 基。 如申請專利範圍第6項之方法’其中之r3為第三丁基。 •如申請專利範圍第6項之方法,其中水之含量為钱⑷ 、石夕烧(b)及石夕烧(c)中每莫耳之X為0·5至2·〇莫耳。 h·如申請專利範圍第6項之方法,其中水之含量為錢⑷ 、矽烷(b)及矽烷(c)中每莫耳之χ為〇·8至18莫耳。 12.如申請專利範圍第6項之方法,其中之又為氯原子。 13’ 一種形成介電常數介於丨·5至3 G之間之不可溶多孔性樹 脂之方法,包括: (A)使如申請專利範圍第}項之矽氧烷樹脂在足夠之 溫度下加熱足夠之時間,使矽氧烷樹脂硬化, 士(B)進一步使矽氧烷樹脂在足夠之溫度下加熱足夠之 時間,自硬化之矽氧烷樹脂移除R2&R3〇基,因此形成 不可溶多孔性樹脂。 14. 如申請專利範圍第13項之方法,其中步驟中之加熱係 由超過20t至35〇t,且步驟(B)中之進一步加熱係由35〇 °C 至 600°〇。 15. 如申請專利範圍第13項之方法,其中矽氧烷樹脂之硬化 及自硬化之矽氧烧樹脂移除r3〇基係在單一步驟中進 行0 -3 - 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) 六、申請專利範圍 16.如申請專利範圍第13項之方法,t 之孔1¾、泠连1 祕 /、令不可浴夕孔性樹脂 隙度為丨至的體積%,且模數為丨〇至〗〇 GPa。 π·::在基材上形成介電常數介於15至3 〇之間之多孔性 t層之方法,包括之步驟為·· ⑷以包括含下列成分之矽氧烷樹脂組合物之塗料組 合物塗佈基材·· Ο) 2.5至85莫耳份之尺%〇3/2矽氧烷單元,其中之 R1係獨立選自包含具有⑴個碳原子之烧基、氣及盆 混合物; ^ 2(b) 2.5至50莫耳份之R2Si〇3/2矽氧烷單元,其中之 R2係獨立選自包含具有6至30個碳原子之單價有機基 以及具有6至30個碳原子之單價經取代有機基;及 (c) 5至95莫耳份之(R^cObSiOH,/2矽氧烷單元,其 中之R3係獨立選自包含具有3至30個碳原子之分支燒 基以及具有3至30個碳原子之分支經取代烷基,1^為工 至3 ’成分(a)、(b)及(c)之總量為100莫耳份,且成分 (a)、(b)及(c)之總和為樹脂組合物中全部矽氧燒單元 之至少50% ; (B) 使經塗佈之基材加熱至足以使塗料組合物進行硬 化之溫度,及 (C) 進一步使經塗佈之基材加熱至足以自硬化之塗料 組合物移除R2及R3〇基之溫度,因此在基材上形成不可 溶多孔性塗層。 18.如申請專利範圍第17項之方法,其中步驟(B)中之加熱係 -4 - 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 591057i 591057 ABC 8 D, patent application scope. For example, the siloxane resin composition of the first patent application scope, wherein the resin additionally contains at least one selected from Risi (x) d〇 (3d⑺; R2Si (X) dO ( 3-d / 2); si (X) d (〇R3) f〇 (nf / 2), si〇4 / 2 & a mixture of siloxane units and siloxane units, wherein R1, R2 & R3 The definitions are as above 'and each X is independently a hydrolyzable group or a hydroxyl group, and 4 and [is 1 to 2 06. Preparations include RlSi〇3 / 2 Shixi Oxygen Unit, R2Si03 / 2 Shixi Oxygen Unit, and The method of (R3〇) bSl0 (4-b) / 2 siloxane resin siloxane resin, wherein the division method includes: combining the following components for a sufficient time and temperature to prepare the siloxane resin: (a ) 2.5 to 85 mol% of a silane or silane mixture of the formula RiSiX3, wherein R1 is independently selected from the group consisting of alkyl, hydrogen or a mixture thereof having 1 to 5 carbon atoms, and X is independently a hydrolyzable group or a hydroxyl group (B) 2.5 to 50 mol% of a silane or silane mixture of the formula R2SiX3, wherein R is independently selected from monovalent organic groups containing 6 to 30 carbon atoms and having 6 to 30 carbons Substituted monovalent organic groups, χ is independently a hydrolyzable group or a hydroxyl group; (c) 5 to 95 mol% of a stone syringa or stone oxane mixture of the formula (R3〇) cSix (4c), where R3 Is independently selected from the group consisting of a branched alkyl group having 3 to 30 carbon atoms and a branched substituted alkyl group having 3 to 30 carbon atoms, (; is 1 to 3 (inclusive), and X is independently a hydrolyzable group or a hydroxyl group , ㈣⑷, ㈨ and ⑷ total 100 mol parts; and (d) water. -2-This paper size applies the Chinese National Standard (CNS) A4 specification (21 × 297 public directors) 591057, patent application park: · If you apply The method of the scope of the patent No. 6 includes a solvent. For example, the method of the scope of the patent No. 6 wherein R1 is selected from the group consisting of methyl: hydrogen and mixtures thereof, and R2 is a group of 10 to 20 carbon atoms. After taking two :, "I-substituted alkyl group" and r3 is a tertiary group having 4 to 18 carbon atoms. For example, in the method of applying for the scope of the patent, item 6, wherein r3 is a third butyl group. The method of the sixth item of the patent, wherein the content of water is 0.5 to 2 per mole in Qian Zhi, Shi Xiyao (b) and Shi Xiyao (c) Mol. H. The method according to item 6 of the patent application, wherein the content of water is ⑷, from 18 to 18 mol per mol in ⑷, silane (b) and silane (c). 12. For example, the method in the patent application No. 6 is a chlorine atom. 13 'A method for forming an insoluble porous resin with a dielectric constant between 5 and 3 G, including: (A) using The siloxane resin in the scope of the patent application is heated at a sufficient temperature for a sufficient time to harden the siloxane resin. (B) further heats the siloxane resin at a sufficient temperature for a sufficient time to self-harden. Siloxane resin removes R2 & R30 groups, thus forming an insoluble porous resin. 14. The method according to item 13 of the patent application range, wherein the heating in the step is from more than 20t to 350,000t, and the further heating in the step (B) is from 35 ° C to 600 °. 15. For the method according to item 13 of the scope of patent application, the hardening of the siloxane resin and the removal of the r3o group from the self-hardening siloxane resin are performed in a single step. 0 -3-This paper standard is applicable to Chinese national standards ( CNS) A4 specification (210X297 mm) 6. Application scope of patent 16. If the method of the scope of application for item 13 is applied, the pores of t1, 1 and 2 will be used to make the gap of non-bathable pore resin. % By volume, and the modulus is from 0 to 0 GPa. π ·: Method for forming a porous t layer with a dielectric constant between 15 and 30 on a substrate, including the steps of: ⑷ coating composition including a siloxane resin composition containing the following ingredients Material coating base material ·· 〇) 2.5 to 85 mol% of 〇3 / 2 siloxane unit, wherein R1 is independently selected from the group consisting of a carbon, a carbon and a pot mixture; 2 (b) 2.5 to 50 moles of R2Si〇3 / 2 siloxane units, wherein R2 is independently selected from the group consisting of a monovalent organic group having 6 to 30 carbon atoms and a monovalent group having 6 to 30 carbon atoms Substituted organic groups; and (c) 5 to 95 moles of (R ^ cObSiOH, / 2 siloxane units, wherein R3 is independently selected from the group consisting of branched alkyl groups having 3 to 30 carbon atoms and having 3 A branched substituted alkyl group of 30 to 30 carbon atoms, 1 ^ is a total of 100 mol parts of components (a), (b), and (c), and components (a), (b), and (C) the sum is at least 50% of the total silica firing units in the resin composition; (B) the coated substrate is heated to a temperature sufficient to harden the coating composition, and (C) further The coated substrate is heated to a temperature sufficient to remove the R2 and R30 groups from the hardened coating composition, thereby forming an insoluble porous coating on the substrate. 18. A method as claimed in item 17 of the scope of patent application , Where the heating system in step (B) is -4-This paper size applies to Chinese National Standard (CNS) A4 (210 X 297 mm) 591057 申請專利範圍 超過20C至350C,且步驟(〇之進一步加熱為超過35〇 〇C 至 600〇C 〇 19·如申明專利範圍第17項之方法,其中R2及r3〇基之硬化 及移除係在單一步驟中,且溫度超過2〇。(:至6〇〇^:下進 行。 20.如申印專利範圍第17項之方法’其中r2及基之移除 係在超過35〇t至600t之溫度下進行。 2L如申請專利範圍第17項之方法,其中之不可溶多孔性塗 層之孔隙度為丨至6()體積%,介電常數在15至3〇之間, 且模數在1·〇至10 GPa之間。 22.如申請專利範圍第17項之方法,其中該基材係一電子用 基材。 23· —種在基材上形成介電常數介於15至3〇之間之不可溶 多孔性塗層之方法,包括之步驟為: (A) 以如申請專利範圍第12項巾製備之產物塗佈基材; (B) 使經塗佈之基材在足夠之溫度下加熱,使塗料組 合物硬化,及 (C) 使經塗佈之基材進一步加熱至足夠之溫度,自硬 化之塗料組合物移除任—R2,因此在基材上形成不 多孔性塗層。 24. 如申請專利範圍第23項之方法,其中之硬化及移除步驟 係在超過2(TC至600t之溫度下,於單一步驟中進行。 25. 如申請專利範圍第23項之方法,其中該基材係一電子用 基材。 -5-The scope of patent application is more than 20C to 350C, and the further heating of step (0 is more than 3500C to 600C) 〇19. The method of item 17 of the patent scope is declared, wherein the hardening and removal of R2 and r30 groups are In a single step, and the temperature exceeds 20 ℃. (: To 600 ℃: below. 20. The method of claim 17 of the scope of the patent application, wherein the removal of r2 and radicals is more than 350 to 600t 2L The method according to item 17 of the scope of patent application, wherein the porosity of the insoluble porous coating is 丨 to 6 (% by volume), the dielectric constant is between 15 to 30, and the modulus Between 1.0 and 10 GPa. 22. The method according to item 17 of the scope of patent application, wherein the substrate is an electronic substrate. 23 · —A dielectric constant of 15 to 3 is formed on the substrate A method of insoluble porous coating between 〇, comprising the steps of: (A) coating the substrate with the product prepared as the towel of the patent application No. 12; (B) making the coated substrate sufficient Heating at a temperature to harden the coating composition, and (C) further heating the coated substrate to a sufficient temperature , R2 is removed from the hardened coating composition, so a non-porous coating is formed on the substrate. 24. If the method of the scope of patent application No. 23, the hardening and removal steps are more than 2 (TC At a temperature of up to 600t, it is performed in a single step. 25. The method according to item 23 of the patent application, wherein the substrate is an electronic substrate. -5-
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