TW501197B - Polishing compound for chemical mechanical polishing and method for polishing substrate - Google Patents

Polishing compound for chemical mechanical polishing and method for polishing substrate Download PDF

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Publication number
TW501197B
TW501197B TW089116550A TW89116550A TW501197B TW 501197 B TW501197 B TW 501197B TW 089116550 A TW089116550 A TW 089116550A TW 89116550 A TW89116550 A TW 89116550A TW 501197 B TW501197 B TW 501197B
Authority
TW
Taiwan
Prior art keywords
polishing
compound
chemical mechanical
substrate
less
Prior art date
Application number
TW089116550A
Other languages
English (en)
Chinese (zh)
Inventor
Akiko Igarashi
Yasuo Kamigata
Yasushi Kurata
Hiroki Terasaki
Takeshi Uchida
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Application granted granted Critical
Publication of TW501197B publication Critical patent/TW501197B/zh

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Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1454Abrasive powders, suspensions and pastes for polishing
    • C09K3/1463Aqueous liquid suspensions
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23FNON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F3/00Brightening metals by chemical means
    • C23F3/04Heavy metals
    • C23F3/06Heavy metals with acidic solutions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices
    • H10P52/40Chemomechanical polishing [CMP]
    • H10P52/403Chemomechanical polishing [CMP] of conductive or resistive materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/01Manufacture or treatment
    • H10W20/031Manufacture or treatment of conductive parts of the interconnections
    • H10W20/062Manufacture or treatment of conductive parts of the interconnections by smoothing of conductive parts, e.g. by planarisation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
TW089116550A 1999-08-17 2000-08-16 Polishing compound for chemical mechanical polishing and method for polishing substrate TW501197B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP23093099 1999-08-17
JP30866599 1999-10-29

Publications (1)

Publication Number Publication Date
TW501197B true TW501197B (en) 2002-09-01

Family

ID=26529617

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089116550A TW501197B (en) 1999-08-17 2000-08-16 Polishing compound for chemical mechanical polishing and method for polishing substrate

Country Status (8)

Country Link
US (2) US7744666B2 (https=)
EP (1) EP1211717B1 (https=)
JP (3) JP3954383B2 (https=)
KR (1) KR100510977B1 (https=)
CN (1) CN101792655B (https=)
AU (1) AU6594200A (https=)
TW (1) TW501197B (https=)
WO (1) WO2001013417A1 (https=)

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Also Published As

Publication number Publication date
KR20020021408A (ko) 2002-03-20
US7744666B2 (en) 2010-06-29
CN101792655B (zh) 2013-05-01
EP1211717B1 (en) 2016-04-13
JP2011082537A (ja) 2011-04-21
US20060124597A1 (en) 2006-06-15
EP1211717A4 (en) 2007-03-28
WO2001013417A1 (fr) 2001-02-22
AU6594200A (en) 2001-03-13
US20060037251A1 (en) 2006-02-23
JP2012182473A (ja) 2012-09-20
EP1211717A1 (en) 2002-06-05
US7319072B2 (en) 2008-01-15
JP5472049B2 (ja) 2014-04-16
CN101792655A (zh) 2010-08-04
JP3954383B2 (ja) 2007-08-08
KR100510977B1 (ko) 2005-08-31

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