TW466716B - Semiconductor chip device and its packaging method - Google Patents
Semiconductor chip device and its packaging method Download PDFInfo
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- TW466716B TW466716B TW89100578A03A TW466716B TW 466716 B TW466716 B TW 466716B TW 89100578A03 A TW89100578A03 A TW 89100578A03A TW 466716 B TW466716 B TW 466716B
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- Wire Bonding (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
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Description
公告^本_ fcl 期.1j Γ 〇 -^/ I 案號:89 1 005 7 8 _ :_H〇//. _ (以上各攔由本局填註) 追加發明專利說明書46671 g 發明名稱 中文 半導體晶片裝置及其封裝方法追加三 英文 二 發明人 姓名 (中文) 1.陳怡銘 姓名 (英文) 1.I-Ming Chen 國籍 1.中華民國 住、居所 1.台北市内湖區麗山街328巷60號 二 申請人 姓名 (名稱) (中文) 1.陳怡銘 姓名 (名稱) (英文) 1.I-Ming Chen 國籍 1.中華民國 住、居所 〔事務所) 1.台北市内湖區麗山街328巷60號 代表人 姓名 (中文) 1. 代表人 姓名 (英文) 1.
五、發明說明(2) 該感光薄膜層進行曝光處理;在移去光罩之後,以化學沖 洗手段把感光薄膜層之被該光罩覆蓋的部份沖洗去除至少 一部份,俾可至少把導電觸點之頂端部份曝露;以錫膏充 填每一曝露孔;及以紅外線加熱使每一曝露孔的錫膏形成 一適於與該基底或另一半導體晶片裝置之對應之銲點電氣 連接的導電銲點。 根據本發明的另一特徵,一種半導體晶片裝置之封裝 方法追加三係被提供。該半導體晶片裝置係適於安裝至一 基板或另一半導體晶片裝置上。該基板或該半導體晶片裝 置具有一晶片安裝區域。於該晶片安裝區域内係設有數個 銲點。該方法包含如下之步驟:提供一半導體晶元,該半 導體晶元具有一設置有數個銲墊的銲墊安裝表面;形成一 感光薄膜層於該晶元的銲墊安裝表面上;置放一覆蓋該感 光薄膜層之對應於該半導體晶元之銲墊之部份的光罩於該 感光薄膜層上並且對該感光薄膜層進行曝光處理;在移去 光罩之後’以化學沖洗手段把感光薄膜層之被該光罩覆蓋 的部份沖洗去除’以形成將對應之銲墊曝露的曝露孔;及 以電鍍手段’於每一曝露孔的周壁上形成與該晶元之對應 之銲墊電氣連接且延伸至該感光薄膜層之表面的導電連接 體,該等導電連接體係適於與該基板或另一半導體晶片裝 置之對應之銲點電氣連接。 根據本發明的又另一特徵,一種半導體晶片裝置之封 裝方法追加二係被k供’該方法包含如下之步驟:提供一 半導體晶元,該半導體晶元具有一設置有數個銲墊的銲墊
/!- 6 6 7 1 6 五、發明說明(3) ---- 安裝表面’於每一銲墊上係形成有一導電觸點;形 光薄膜層於該晶元的銲墊安裝表面上;置放—覆蓋/二感 薄膜層之對應於該等導電觸點之部份的光罩於該感為,光 層上並且對該感光薄膜層進行曝光處理;在移^ ^ 1薄棋 ,以化學沖洗手段把感光薄膜層之被該光罩覆蓋的邹'^後 洗去除至少一部份’俾可至少把導電觸點之 r知冲 貝知1部份曝# ’以錫膏充填每一曝露孔;以紅外線加熱使每一曝露、路 錫膏形成一導電銲點;及提供一基板,該基板具有=^的 安裝區域’於該晶片安裝區域内係設有數個與該晶元曰日片 應之導電銲點電氣連接的銲點。 a 對 根據本發明的又再一特徵,一種半導體晶片裝置之封 裝方法追加三係被提供,該方法包含如下之步驟:"提供一 半導體晶元,該半導體晶元具有一設置有數個銲墊的銲墊 安裝表面’於每一銲墊上係形成有一導電觸點;形成一感 光薄膜層於s亥晶元的銲塾安裝表面上;置放一覆蓋該感光 薄膜層之對應於該等導電觸點之部份的光罩於該感光薄膜 層上並且對該感光薄膜層進行曝光處理;在移去光軍之後 ’以化學沖洗手段把感光薄膜層之被該光罩覆蓋的部份沖 洗去除至少一部份,俾可至少把導電觸點之頂端部份曝露 ;以錫膏充填每一曝露孔;以紅外線加熱使每一曝露孔的 錫膏形成一導電銲點;及提供一半導體晶片裝置,該半導 體晶片裝置具有一晶片安裝區域,於該晶片安裝區域内係 設有數個與該晶元之對應之導電銲點電氣連接的銲點。 根據本發明之又再另一特徵’一種半導體晶片裝置之
第6頁 4-^671 6 五、發明說明(4) 封裝方法追加三係被提供’ 一半導體晶元,該半導體晶 墊安裝表面;形成一感光薄 上:置放一覆蓋該感光薄膜 墊之部份的光罩於該感光薄 行曝光處理;在移去光罩之 膜層之被該光罩覆蓋的部份 墊曝露的曝露孔;以電鍍手 成與對應之銲墊電氣連接且 導電連接體;及提供一基板 ,於該晶片安裝區域内係設 連接體電氣連接的銲點。 根據本發明之另一特徵 方法追加三係被提供,該方 導體晶元,該半導體晶元具 裝表面;形成一感光薄膜層 置放一覆蓋該感光薄膜層之 部份的光罩於該感光薄膜層 光處理;在移去光罩之後, 之被該光罩覆蓋的部份沖洗 露的曝露孔;以電鍍手段, 對應之銲墊電氣連接且延伸 連接體;及提供一半導體晶 有一晶片安裝區域,於該晶 該 方 法 包 含 如 下 之 步 驟 : 提 供 元 具 有 •__ 設 % 有 數 個 銲 墊 的 銲 膜 層 於 該 晶 元 的 銲 塾 安 裝 表 面 層 之 對 應 於 該 半 導 體 晶 元 之 鲜 膜 層 上 並 對 該 感 光 薄 膜 層 進 後 J 以 化 學 沖 洗 手 段 把 感 光 薄 沖 洗 去 除 以 形 成 將 對 應 之 銲 段 Ϊ 於 每 .—1 爆 露 孔 的 周 壁 上 形 延 伸 至 該 感 光 薄 膜 層 之 表 面 的 Ϊ 該 基 板 具 有 - 晶 片 安 裝 區 域 有 數 個 與 該 晶 元 之 對 應 之 導 電 J 種 半 導 體 晶 片 裝 置 之 封 裝 法 包 含 如 下 步 驟 * 提 供 一 半 有 mt 設 置 有 數 個 銲 墊 的 銲 墊 安 於 該 晶 元 的 銲 墊 安 裝 表 面 上 > 對 應 於 該 半 導 體 晶 元 之 銲 墊 之 上 並 且 對 該 感 光 薄 膜 層 進 行 曝 以 化 學 沖 洗 手段把感 光 薄 膜 層 去 除 ί 以 形 成將 對應 之 銲墊曝 於 每 曝 露 孔 的 周 壁 上 形 成 與 至 該 感 光 薄 m 層 之 表 面 的 導 電 片 裝 t. 該 半 導 體 晶 片 裝 置 具 片 安 裝 區 域 内 係 設 有 數 個 與 該
第7頁 466716 五、發明說明(5) 晶元之對應之導電連接體電氣連接的銲點。 根據本發明之又另一特徵,一種半導體晶片裝置追加 三係被提供。該半導體晶片裝置係適於安裝至一基板或另 —半導體晶片裝置上。該基板或該半導體晶片裝置具有一 晶片安裝區域。於該晶片安裝區域内係設有數個銲點。該 裝置包含:一半導體晶元,該半導體晶元具有一設置有數 個銲墊的銲墊安裝表面,於每一銲墊上係形成有一導電觸 點;一形成於該晶元之銲墊安裝表面上的感光薄膜層,該 感光薄膜層係對應於該等導電觸點形成有數個用以至少曝 露對應之導電觸點之頂端部份的曝露孔;及充填於每一曝 露孔以作為適於與該基板或另一半導體晶>1裝置之對應之 銲點電氣連接之導電銲點的錫膏。 根據本發明之再另一特徵,一種半導體晶裝置追加 三係被提供。該半導體晶片裝置係適於安裝至一基板或另 一半導體晶片裝置上。該基板或該半導體晶片裝置具有一 晶片安裝區域。於該晶片安裝區域内係設有數個銲點。該 裝置包含:一半導體晶元,該半導體晶元具有一設置有數 個銲墊的銲墊安裝表面;一形成於該晶元之銲墊安裝表面 上的感光薄膜層,該感光薄膜層係對應於該半導體晶元的 銲墊形成有數個用以曝露對應之銲墊的曝露孔;及於每一 曝露孔的周壁上形成與對應之銲墊電氣連接且延伸至該感 光薄膜層之表面的導電連接體,該等導電連接體係適於與 該基板或另一半導體晶片裝置之對應的銲點電氣連接。 根據本發明之又再另一特徵,一種半導體晶片裝置追
五、發明說明(6) 一半導體晶元 墊安裝表面, 於該晶元之銲 係對應於該等 電觸點之頂端 電if·點的錫膏 於該晶片安裝 點電氣連接的 一種半導體晶 導體晶元,該 裴表面,於每 晶元之銲墊安 應於該等導電 點之頂端部份 點的錫膏;及 _晶片安裝區 元之對應之導 加三係被提供 元具有一設置 係形成有一導 的感光薄膜層 有數個用以至 ;充填於每一 該基板具有一 數個與該晶元 根據本發 係被提供,該 有一設置有數 成有一導電觸 光薄膜層,該 個用以至少曝 填於每一曝露 裝置,該半導 安裝區域内係 接的銲點。 ’該裝置包含: 有數個銲墊的銲 電觸點;一形成 ’該感光薄膜層 少曝露對應之導 曝露孔以作為導 晶片安裝區域, 之對應之導電銲 明之又一特徵, 裝置包含:一半 個銲墊的銲墊安 點;一形成於該 感光薄膜層係對 露對應之導電觸 孔以作為導電銲 體晶片裝置具有 設有數個與該晶 ’讀半導體晶 於I —銲墊上 #安裝表面上 導電觸點形成 部份的曝露孔 ;及一基板, 區域内係設有 銲點。 片裝置追加三 半導體晶元具 一銲墊上係形 裝表面上的感 觸點形成有數 的曝露孔;充 一半導體晶片 域,於該晶片 電銲點電氣連 根據本發明之再又一特徵,一種半導體晶片裝置追加 三係被提供’該裝置包含:一半導體晶元,該半導體晶元 具有一設置有數個銲墊的銲墊安裝表面;一形成於該晶元 之銲墊安裝表面上的感光薄膜層,該感光薄膜層係對應於 該半導體晶元的銲墊形成有數個用以曝露對應之錄墊的曝 露孔;形成於每一曝露孔之周壁上之與該晶元之對應之銲
第9頁 ^ζ>(〇Ί i 五、發明說明(7) 墊電氣連接且延伸至該感光薄膜層之表面的導電連接體; 及—基板,該基板具有一晶片安裝區域,於該晶片安裝區 域内係設有數個與該晶元之對應之導電連接體電氣連接的 銲點。 根據本發明之又再一特徵,一種半導體晶片裝置追加 三係被提供,該裝置包含:一半導體晶元,該半導體晶元 具有一設置有數個銲墊的銲墊安裝表面;一形成於該晶元 之銲墊 該半導 露孔; 電氣連 一半導 域,於 電連接 有 其功效 第 晶片裝 第 一半導 第 體晶片第 導體晶 安裝表面上 體晶元的銲 於每一曝露 接且延伸至 體晶片裝置 該晶片安裝 體電氣連接 關本發明為 ’茲例舉較 一至六圖是 置之封裝方 七圖是為描 體晶片裝置 八至十一圖 裝置之封裝 十二至十四 片裝置之封 墊形成有數個 孔的周壁上形 該感光薄膜層 ’該半導體晶 區域内係設有 的銲點。 達上述目的、 佳實施例並配 為描繪本發明 法之流程的示 繪本發明第一 結合之例子的 疋為描綠本發 方法之部份流 圖是為描繪本 裝方法之流程 ,該感光薄膜層係對應於 用以曝露對應之銲墊的曝 成與該晶元之對應之銲墊 之表面的導電連接體;及 片裝置具有一晶安裝區 數個與該晶元之對應之導 特徵所採用的技術手段及 合圖式說明如下: 第一較佳貫施例之半導體 意剖視圖; 較佳實施例與一基板或另 示意刮視圖; 明第二較佳實施例之半導 程的示意剖視圖; 發明第三較佳實施例之半 的示意剖視圖;
五、發明說明(8) 第十五圖是為描繪本發明第四較佳實施例的示意剖視 圖, 第十六圖是為描繪本發明第五較佳實施例的示意剖視 圖; 第十七圖是為描緣本發明第六較佳實施例的示意剖視 圖; 第十八圖是為描繪本發明第七較佳實施例的示意剖視 圖; 第 十 九 圖 是 為描繪 本 發 明 第八 較 佳 實 施 例 的 示 意 剖 視 圖, 及 第 二 十 圖 是 為描繪 本發 明 第九 較 佳 實 施 例 的 示 意 剖 視 圖。 元 件 標 號 對照 表 1 晶 元 10 銲 墊 安 裝 表 面 11 銲 墊 2 導 電 觸 點 3 感 光 薄 膜 層 4 光 罩 30 曝 露 孔 5 錫 膏 6 基 板 或 半 導 體晶片 裝 置 61 導 電 體 7 導 電 連 接 體 8 導 電 體 800 觸 點 連 接 部 801 延 伸 部 802 電 氣 連 接 部 9 連 接 觸 點 803 連 接 體 連 接 部 804 延 伸 部 805 電 氣 連 接 部 60 銲 墊 在 本 發 明 被 詳細描 述 之 前 ,應 要 注 意 的 是 5 在 整 個 說
第11頁 466716 五、發明說明(9) ' 一- 明當中’相同的元件係由相同的標號標示。 本發明之半導體晶片裝置係適於安裝至一基板或另/ 半導體晶片裝置(見第七圖所示)上。該基板或該半導體 晶片裝置具有一晶#安裝區域。於該晶片安裝區域内係設 有數個銲點。 ’ ,、請參閱第一圖所示’ 一半導體晶元1首先被提供。該 半導體晶元1具有一設置有數個銲墊11 (圖式中僅顯示一 個)的銲墊安裝表面1 0。接著’籍由習知技術,於每一錄 塾1 1上形成一如導電金屬球般的導電觸點2 。在本實施例 中,該導電觸點2是為金球(gold bal 1)。 接著’如第二圖所顯示般,一感光薄膜層3係形成於 该晶元1的銲墊安裝表面1 0上。然後,請參閱第三圖所示 ’ 一覆蓋該感光薄膜層3之對應於該等導電觸點2之部份 =光罩4係置放於該感光薄膜層3上。然後,係對該感光 薄膜層3進行曝光處理以致於該感光薄膜層3之未被該光 單4覆蓋的部份會硬化。 ± 明參閱第四圖所示’在移去光罩之後,藉由控制沖洗 #間’感光薄膜層3之被該光罩覆蓋的部份係僅被沖洗去 除一 $份,以形成僅將對應之導電觸點2之頂端部份曝露 的^露孔30。然後’再對該感光薄膜層3進行曝光處理俾 使感光薄膜層3之先前未被沖洗去除的部份硬化。 接著’如第五圖所示般’每一曝露孔3 0係以錫膏5充 填。之後,以紅外線加熱使錫膏5形成一導電銲點化〇1(1 bump) ’如第六圖所示般。
第12頁 五、發明說明(10) 請參閱第七圖所示,當本發明之半導體晶片裝置如上 所述製成時,其係適於安裝至一基板或另一丰導體a M號 置6上。該等導電輝點5係透過在該基板或另一半導體晶 月裝置6之輝點(圖中未示)上之預先設置的導電體61來 與該基板或另一半導體晶片裝置6之對應的銲點電氣連接 第八至十一圖是為描繪本發明第二較佳實施例之半導 體晶片裝置之封裝方法之部份流程的示章刹視圖。 請參閱第八圖所示,與第-較佳實施例相$,在該晶 元1的銲塾女裝表面上开》成一感光薄膜層3之後,一覆 蓋該感光薄膜層3之對應於該等導電觸點2之部份的光罩 4係置放於該感光薄膜層3 Λ。然後,係對該感光薄膜層 3進行曝光處理以致於該感光薄膜層3之未被該光 蓋的部份會硬化。 請參閱第九 之後,係以習知 覆蓋的部份沖洗 曝露孔30。每一 觸點2 而不會曝 接著,如第 填。之後,以紅 bump),如第十-應要注意的 如上所述製成時 圖所示,與第一實 的沖洗技術,把感 去除,以形成將對 曝露孔30的大小係 露該晶元1的銲墊 十圖所示般,每一 外線加熱使錫膏5 '圖所示般。 是’當第二較佳實 ’其亦係如第一較 施例不同,在移去光罩 光缚膜層3之被該光罩 應之導電觸點2曝露的 恰好僅曝露對應的導電 安裝表面1〇。 曝露孔3 0係以錫膏5充 形成—導電銲點(gold 施例之半導體晶片裝置 佳貫施例般適於安裝至
4 6 6 7 1 6 五、發明說明(11) 一基板或另一半導體晶片裝置上。由於其安裴至基板或另 一半導體晶片裝置的方式係與第一較佳實施例相同,於此 恕不再贅述。 . 第十二至十四圖是為描繪本發明第三較佳實施例之半 導體晶片裝置之封裝方法之流程的示意剖視圖。 二 請參閒第十二圖所示,一半導體晶元1首先被提供。 α亥半V體晶元1具有一設置有數個銲塾11 (圖式中僅顯示 一個)的銲墊安裝表面10 ^與第一和第二較佳實施例不同 ’於該等銲墊11上係不形成導電觸點。 接著,如第十三圖所示般,在該晶元1的銲墊安裝表 =0上係形成一感光薄膜層3。之後,一覆蓋該感光薄膜 之對應於該等銲墊U之部份的光罩4係置放於該感光 膜層3上。然後,係對該感光薄膜層3進行曝并處理以 致於該感光薄膜層3之未被該光罩4 |蓋的部;2;:以 請參閱第十四圖所示,在移去光罩之後,係以習知的 、技術把感光4膜層3之被該光罩覆蓋的部份沖洗去 ’以形成將對應之銲墊11曝露的曝露孔3〇。接著,係以 知電鍍方式,於每一曝露孔30的周壁上形成與對應之銲 1電氣連接且延伸至該感光薄膜層3之表面的導^連接 應要注意的是,當第三較佳實施例之半導體晶片裝置 h所述製成時1亦係如第—和二較佳實施例:= 或Γ半導體晶片裝置上。由於其安裝至基板 一 丰導體晶片裝置的方式係與第一較佳實施例相同,
第14頁 4 6 6 7 1 6 五、發明說明(12) 於此恕不再贅述。 第十五圖是為描繪本發明第四較佳 > 片裝置的示意剖視圖。本較佳實施例之半細例之半導體晶 適於安裝在一具有數個銲點且該等銲點之導體晶片裝置係 1之銲墊1 1之位置不對應的基板或另—位置係與該晶元 圖中未示)上。與第一較佳實施例不同的f體3曰片裝置( 施例中’在形成導電銲點5之後,係以道疋,在本較佳實 ,於該感光薄膜層3上形成有導電體8 。電金屬膠為材料 該導電金屬膠可以是為摻雜有金、銀、細在本實施例中’ 等等導電金屬材料中之一種的導電金屬跋、鐵、:錫和鋁般 具有一與對應之導電銲點5 f氣連接的銲f :,體8係 一與銲點連接部8 0 0電氣連接且作為舳連接邛800 、 謝、和—位於該延伸部8()1 j = = 部 ^ ^ ^ ^ ^ 由&且其之位置係與該 基板之對應之如點之位置對應的電氣連接部8〇2 〇 應要注意的是,在本實施例中,由於該 以與與,案雷同的印刷手段形成,於此恕不再贅述體8係 姑卞ί ΐ,ί各導電體8的電氣連接部802上,係以習知 技術形成:如導電金屬球般的連接觸點9 。 第十/、圖是為描繪本發明第五較佳實施例之半 片裝置=不忍剖視圖。本較佳實施例之半導體晶片裝置亦 係適於安裝在一具有數個銲點且該等銲點之位置係與該晶 凡1之銲墊11之位置不對應的基板或另一半導體晶片裝置 j圖中未示)上。與第二較佳實施例不同的是,在本較佳 貝施例中,在形成導電銲點5之後,係以導電金屬膠為材
第15頁 4 66 7 1 6 五、發明說明(13) 料,於該感光薄膜層3上形成有導電 ,該導電金屬膠可以是為摻雜有金、在:實::丨: 般等等導電金屬材料中之一種的導$ 錫和銘 係具有-與對應之導電辉點5電氣連導電體8 、一與銲點連接部8。〇 t氣連接且接部8〇° 801 、和一位於该延伸部801之自由端且其之位 : 基板之對應之銲點之位置對應的電氣連接部㈣2 ’’ /、〇 應要注意的是,在本實施例中’由於該 電 以與與,案雷同的印刷手段形成,於此恕*再贅J體8係 接著,在各導電體8的電氣連接部8 〇 2上,係以 技術形成一如導電金屬球般的連接觸點9 〇 第十七圖是為描繪本發明第六較佳實施例之 片裝置的不意剖視圖。本較佳實施例之半導體晶片裝置$ 適於ίί5一具有數個銲點且該等銲點之位置係與該晶元 1之.^墊之位置不對應的基板或另一半導體晶片裝置( 圖中未示)上。與第三較佳實施例不同的是,在本較佳實 施例中,在形成導電連接體7《後,係以導電金屬勝為材 料,於該感光薄膜層3上形成有導電體8 。在本實施例中 ’該導電金屬膠可以是為摻雜有金、銀、銅、鐵、錫和鋁 般等等導電金屬材料中之一種的導電金屬膠。各導電體8 係具有一與對應之導電連接體7電氣連接的連接體連接部 803 、一與連接體連接部803電氣連接且作為電路軌跡的 延伸部804 、和一位於該延伸部80 4之自由端且其之位置 係與該基板之對應之銲點之位置對應的電氣連接部8〇5 。
第16頁 五、發明說明(14) 應要注意的是,在本實施例中,由於該等導電體8係 以與與母案雷同的印刷手段形成,於此恕不再贅述。 接著,在各導電體8的電氣連接部8 0 2上,係以習知 技術形成一如導電金屬球般的連接觸點9 。 請參閱第十八圖所示,其是為描繪本發明第七較佳實 施例的示意剖視圖。與第四較佳實施例不同,連接觸點9 係於導電體8的形成時以與導電體8相同的材質一體地形 成。 請參閱第十九圖所示,其是為描繪本發明第八較佳實 施例的示意剖視圖。與第四較佳實施例不同,連接觸點9 係於導電體8的形成時以與導電體8相同的材質一體地形 成。 請參閱第二十圖所示,其是為描繪本發明第九較佳實 施例的示意剖視圖。與第四較佳實施例不同,連接觸點9 係於導電體8的形成時以與導電體8相同的材質一體地形 成。 綜上所述,本發明之『半導體晶片裝置及其封裝方法 追加三』,確能藉上述所揭露之構造、裝置,達到預期之 目的與功效,且申請前未見於刊物亦未公開使用,符合發 明專利之新穎、進步等要件。 惟,上述所揭之圖式及說明,僅為本發明之實施例而 已,非為限定本發明之實施例;大凡熟悉該項技藝之人仕 ,其所依本發明之特徵範疇,所作之其他等效變化或修飾 ,皆應涵蓋在以下本案之申請專利範圍内。
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Claims (1)
- 4 6 6 ( ] t 六、申請專利範圍 1. 一種半導體晶片裝置之封裝方法追加三,該半導體晶片 裝置係適於安裝至一基板或另一半導體晶片裝置上,該 基板或該半導體晶片裝置具有一晶片安裝區域,於該晶 片安裝區域内係設有數個銲點,該方法包含如下之步 驟: 提供一半導體晶元,該半導體晶元具有一設置有數 個銲墊的銲墊安裝表面,於每一銲墊上係形成有一導電 觸點; 形成一感光薄膜層於該晶元的銲墊安裝表面上; 置放一覆蓋該感光薄膜層之對應於該等導電觸點之 部份的光罩於該感光薄膜層上並且對該感光薄膜層進行 曝光處理; 在移去光罩之後,以化學沖洗手段把感光薄膜層之 被該光罩覆蓋的部份沖洗去除至少一部份,俾可至少把 導電觸點之頂端部份曝露; 以錫膏充填每一曝露孔;及 以紅外線加熱使每一曝露孔的錫膏形成一適於與該 基板或另一半導體晶片裝置之對應之銲點電氣連接的導 電銲點。 2. 如申請專利範圍第1項所述之封裝方法追加三,其中, 在提供半導體晶元的步驟中,該半導體晶元之銲墊的位 置係不對應於該基板或另一半導體晶片裝置之銲點的位 置,且在以紅外線加熱的步驟之後,更包含如下之步驟第18頁 Ί 6 6 b 申請專利範圍 以導 電體,各 風連接的 電路執跡 位置係與 位置對應 3 如申請專 導電體的 在各 4.如申請專 在形成連 六 電金屬膠 導電體係 銲點連接 的延伸部 該基板或 的電氣連 利範圍第 步驟之後 導電體的 利範圍第 接觸點的 另 接郄° 2瑣所 更包含如 電氟連接部 3頊所述之 步鰥中 該 _該感光 晶元之 點連接 該延伸 晶片裝 薄膜層上形成有導 對應之導電銲點電 部電氣連接且作為 部之自由端且其之 置之對應之銲點之 法追加 驟: 在形成 成一連接觸點。 法追加三,其中, 觸點是為導電錫球 5. 如申請 在形成 時以與 6. 如申請 在提供 球。 7. 如申請 在形成 '銀、 導電金 8. 如申請 在該化 專利範圍第3工員所述之封裝方法追加三,其中, 連接觸點的步驟中,導電觸點係於導電體的形成 導電體相同的材質’體地形成。 專利範圍第1項所述之封裝方法追加三,其中, 半導體晶元的步驟中’該等導電觸點是為導電錫 專利範圍第2項所述之封裝方法追加三,其中, 導電體的步驟中,導電金屬膠可以是為摻雜有金 銅、鐵、錫和鋁般等等導電金屬材料中之一者的 屬膠。 專利範圍第1項所述之封裝方法追加三,其中, 學沖洗步驟令,係藉由控制沖洗時間使感光薄膜第19頁 六、申請專利範圍 層之被該光罩覆蓋的部份係僅被沖洗去除一部份,以形 成僅將對應之導電觸點之頂端部份曝露的曝露孔,且其 中,在該化學沖洗步驟之後,該方法更包含再對該感光 薄膜層進行曝光處理的步驟。 9. 一種半導體晶片裝置之封裝方法追加三,該半導體晶片 裝置係適於安裝至一基板或另一半導體晶片裝置上,該 基板或該半導體晶片裝置具有一晶片安裝區域,於該晶 片安裝區域内係設有數個銲點,該方法包含如下之步驟 提供一半導體晶元,該半導體晶元具有一設置有數 個銲墊的銲墊安裝表面; 形成一感光薄膜層於該晶元的銲墊安裝表面上; 置放一覆蓋該感光薄膜層之對應於該晶元之銲墊之 部份的光罩於該感光薄膜層上並且對該感光薄膜層進行 曝光處理; 在移去光罩之後,以化學沖洗手段把感光薄膜層之 被該光罩覆蓋的部份沖洗去除,以形成將該晶元之對應 之銲墊曝露的曝露孔;及 以電鍍手段,於每一曝露孔的周壁上形成與對應之 銲墊電氣連接且延伸至該感光薄膜層之表面的導電連接 體,該等導電連接體係適於與該基板或另一半導體晶片 裝置之對應的銲點電氣連接。 1 0.如申請專利範圍第9項所述之封裝方法追加三,其中 ,在提供半導體晶元的步驟中,該半導體晶元之銲墊第20頁的位置係不對應於該基板或另一半導體晶片裝置之銲 "的位置’且在電鐘的步驟之後,更包含如下之步驟 . 以導電金屬膠為材料,於該感光薄膜層上形成有 導電體’各導電體係具有一與該晶元之對應之導電連 f體電氣連接的連接體連接部、—與連接體連接部電 氣連接且作為電路執跡的延伸部、和一位於該延伸部 之自由端且其之位置係與該基板或另一半導體晶片裝 置之對應之銲點之位置對應的電氣連接部。 1 1 _如申請專利範圍第1 0項所述之封裝方法追加三,在形 成導電體的步驟之後,更包含如下之步驟: 在各導電體的電氣連接部上,形成一連接觸點。 12*如申請專利範圍第1 1項所述之封裝方法追加三,其中 ’在形成連接觸點的步驟中’該等連接觸點是為導電 錫球。 13 ·如申請專利範圍第1 1項所述之封裝方法追加三,其中 ’在形成連接觸點的步驟中,導電觸點係於導電體的 形成時以與導電體相同的材質~體地形成。 1 4.如申請專利範圍第1 0項所述之封裝方法追加三,其中 ’在形成導電體的步驟中’導電金屬膠可以是為摻雜 有金、銀、銅、鐵、錫和鋁般等等導電金屬材料中之 一者的導電金屬膠。 1 5 · 一種半導體晶片裝置之封装方法追加三,該方法包含 如下之步驟:第21頁 6六,申請專利範圍 提供一半導體晶元,該半導體晶元具有一設置有 數個銲墊的銲墊安裝表面,於每一銲墊上係形成有一 導電觸點; 形成一感光薄膜層於該晶元的銲墊安裝表面上; 置放一覆蓋該感光薄膜層之對應於該等導電觸點 之部份的光罩於該感光薄膜層上並且對該感光薄膜層 進行曝光處理; 在移去光罩之後,以化學沖洗手段把感光薄膜層 之被該光罩覆蓋的部份沖洗去除至少一部份,俾可至 少把導電觸點之頂端部份曝露; 以錫膏充填每一曝露孔; 以紅外線加熱使每一曝露孔的錫膏形成一導電銲 點;及 提供一基板,該基板具有一晶片安裝區域,於該 晶片安裝區域内係設有數個與該晶元之對應之導電銲 點電氣連接的銲點。 1 6. —種半導體晶片裝置之封裝方法追加三,該方法包含 如下之步驟: 提供一半導體晶元,該半導體晶元具有一設置有 數個銲墊的銲墊安裝表面,於每一銲墊上係形成有一 導電觸點; 形成一感光薄膜層於該晶元的銲墊安裝表面上; 置放一覆蓋該感光薄膜層之對應於該等導電觸點 之部份的光罩於該感光薄膜層上並且對該感光薄膜層第22頁 六'申請專利範園 進行曝光處理; 在移去光罩之後,以化學沖洗手段把感光薄膜層 之被該光罩覆蓋的部份沖洗去除至少一部份,俾可至 少把導電觸點之頂端部份曝露; 以錫賞充填每一曝露孔; 以紅外線加熱使每一曝露孔的錫膏形成一導電銲 點;及 提供一半導體晶片裝置,該半導體晶片裝置具有 一晶月安裝區域"於該晶片安裝區域内係設有數個與 該晶元之對應之導電銲點電氣連接的銲點。 1 7. —種半導體晶片裝置之封裝方法追加三,該方法包含 如下之步驟: 提供一半導體晶元’該半導體晶元具有一設置有 數個銲墊的銲墊安裝表面; 形成一感光薄膜層於該晶元的銲墊安裝表面上; 置放一覆蓋該感光薄膜層之對應於該半導體晶元 之銲墊之部份的光罩於該感光薄膜層上並且對該感光 薄膜層進行曝光處理; 在移去光罩之後,以化學沖洗手段把感光薄膜層 之被該光罩覆蓋的部份沖洗去除,以形成將對應之銲 墊曝露的曝露孔; 以電鍍手段,於每一曝露孔的周壁上形成與對應 之銲墊電氣連接且延伸至該感光薄膜層之表面的導電 連接體;及第23頁六、申請專利範圍 提供一基板,該基板具有一晶片安裝區域,於該 晶片安裝區域内係設有數個與該晶元之對應之導電連 接體電氣連接的銲點。 1 8. —種半導體晶片裝置之封裝方法追加三,該方法包含 如下之步驟: 提供一半導體晶元,該半導體晶元具有一設置有 數個銲墊的銲墊安裝表面; 形成一感光薄膜層於該晶元的銲墊安裝表面上; 置放一覆蓋該感光薄膜層之對應於該半導體晶元 之銲墊之部份的光罩於該感光薄膜層上並且對該感光 薄膜層進行曝光處理; 在移去光罩之後,以化學沖洗手段把感光薄膜層 之被該光罩覆蓋的部份沖洗去除,以形成將對應之銲 墊曝露的曝露孔; 以電鍍手段,於每一曝露孔的周壁上形成與對應 之銲墊電氣連接且延伸至該感光薄膜層之表面的導電 連接體;及 提供一半導體晶片裝置,該半導體晶片裝置具有 一晶片安裝區域*於該晶片安裝區域内係設有數個與 對應之導電連接體電氣連接的銲點。 1 9 · 一種半導體晶片裝置追加三,該半導體晶片裝置係適 於安裝至一基板或另一半導體晶片裝置上,該基板或 該半導體晶片裝置具有一晶片安裝區域,於該晶片安 裝區域内係設有數個銲點,該裝置包含:第24頁 六、申請專利範圍 一半導體晶元,該半導體晶元具有一設置有數個 銲墊的銲墊安裝表面,於每一銲墊上係形成有—導電 觸點; 一形成於該晶元之銲墊安裝表面上的感光薄膜層 ’該感光薄膜層係對應於該等導電觸點形成有數個用 以至少曝露對應之導電觸點之頂端部份的曝露孔;及 充填於每一曝露孔以作為適於與對應之銲點電氣 連接之導電銲點的錫膏。 2 0.如申請專利範圍第〗9項所述之裝置追加三,其中,該 半導體晶元之鲜塾的位置係不對應於該基板或另一半 導體晶片裝置之銲點的位置,且更包含: 數個形成於該感光薄膜層上的導電體,各導電體 係具有一與對應之導電銲點電氣連接的銲點連接部、 —與銲點連接部電氣連接且作為電路執跡的延伸部、 和一位於該延伸部之自由踹且其之位置係與該基板或 另一半導體晶片裝置之銲點之位置對應的電氣連接部 0 2 1.如申請專利範圍第2 0項所述之裝置追加三’更包含形 成於各導電體之電氣連接部上的連接觸點。 2 2,如申請專利範圍第21項所述之裝置追加三’其中,該 等連接觸點是為導電錫球。 23.如申請專利範圍第21項所述之裝置追加三,其中,導 電觸點係以與導電體相同的材質一體地形成。 2 4.如申請專利範圍第1 9項所述之裝置追加三,其中,該4 6 6 7 16 六、申請專利範圍 等導電觸點是為導電錫球。 25_如申請專利範圍第2〇項所述之裝置追加三,其中,導 電體係由導電金屬膠形成,該導電金屬膠可以是為摻 雜有金、銀、銅、鐵、錫和鋁般等等導電金屬材料中 之一者的導電金屬膠。 2 6. —種半導體晶片裝置追加三,該半導體晶片裝置係適 於安裝至一基板或另—半導體晶片裝置上,該基板或 5哀半導體晶片裝置具有一晶片安裝區域’於該晶片安 裝區域内係設有數個銲點,該裝置包含: —半導體晶元,該半導體晶元具有一設置有數個 鲜墊的銲墊安裝表面; 一形成於該晶元之銲墊安裝表面上的感光薄膜層 ’該感光薄膜層係對應於該半導體晶元的銲墊形成有 數個用以曝露對應之銲墊的曝露孔;及 形成於每一曝露孔之周壁上之與該晶元之對應之 銲墊電氣連接且延伸至該感光薄膜層之表面的導電連 接體’該等導電連接體係適於與對應之銲點電氣連接 〇 2 7.如申請專利範圍第2 6項所述之裝置追加三,其中,該 半導體晶元之銲墊的位置係不對應於該基板或另一半 導體晶片裝置之銲點的位置,該裝置更包含: 數個形成於該感光薄膜層上的導電體,各導電體 係具有一與該晶元之對應之導電連接體電氣連接的速 接體連接部、一與連接體連接部電氣連接且作為電路第26頁 4 66 716 六、申請專利範圍 軌跡的延伸部、和一位於該延伸部之自由端且其之位 置係與該基板或另一半導體晶片裝置之對應之銲點之 位置對應的電氣連接部。 28.如申請專利範圍第27項所述之裝置追加三,更包含形 成於各導電體之電氣連接部上的連接觸點。 2 9 .如申請專利範圍第28項所述之裝置追加三,其中,該 等連接觸點是為導電錫球。 3 0.如申請專利範圍第2 8項所述之裝置追加三,其中,導 電觸點係以與導電體相同的材質一體地形成。 3 1.如申請專利範圍第2 7項所述之裝置追加三,其中,導 電體係由導電金屬膠形成,該導電金屬膠可以是為摻 雜有金、銀、銅、鐵、錫和鋁般等等導電金屬材料中 之一者的導電金屬膠。 32. —種半導體晶>1裝置追加三,包含: 一半導體晶元,該半導體晶元具有一設置有數個 銲墊的銲墊安裝表面,於每一銲墊上係形成有一導電 觸點; 一形成於該晶元之銲墊安裝表面上的感光薄膜層 ,該感光薄膜層係對應於該等導電觸點形成有數個用 以至少曝露對應之導電觸點之頂端部份的曝露孔; 充填於每一曝露孔以作為導電銲點的錫膏;及 一基板,該基板具有一晶片安裝區域,於該晶片 安裝區域内係設有數個與該晶元之對應之導電銲點電 氣連接的銲點。第27頁 六、申請專利範圍 3 3. —種半導體晶片裝置追加三,包含: 一半導體晶元,該半導體晶元具有一設置有數個 銲墊的銲墊安裝表面,於每一銲墊上係形成有一導電 觸點; —形成於該晶元之銲墊安裝表面上的感光薄膜層 ,該感光薄膜層係對應於該等導電觸點形成有數個用 以至少曝露對應之導電觸點之頂端部份的曝露孔;及 充填於每一曝露孔以作為導電銲點的錫膏;及 一半導體晶片裝置,該半導體晶片裝置具有一晶 片安裝區域,於該晶片安裝區域内係設有數個與該晶 元之對應之導電銲點電氣連接的銲點。 3 4. —種半導體晶片裝置追加三,包含: 一半導體晶元,該半導體晶元具有一設置有數個 銲墊的銲墊安裝表面; 一形成於該晶元之銲墊安裝表面上的感光薄膜層 ,該感光薄膜層係對應於該半導體晶元的銲墊形成有 數個用以曝露對應之銲墊的曝露孔; 形成於每一曝露孔之周壁上之與對應之銲墊電氣 連接且延伸至該感光薄膜層之表面的導電連接體;及 一基板,該基板具有一晶片安裝區域,於該晶片 安裝區域内係設有數個與該晶元之對應之導電連接體 電氣連接的銲點° 3 5. —種半導體晶片裝置追加三,包含: —半導體晶元,該半導體晶元具有一設置有數個第28頁 46671ι 六' 申請專利範圍 銲墊的銲墊安裝表面; 一形成於該晶元之銲墊安裝表面上的感光薄膜層 ,該感光薄膜層係對應於該半導體晶元的銲墊形成有 數個用以曝露對應之銲墊的曝露孔; 形成於每一曝露孔之周壁上之與對應之銲墊電氣 連接且延伸至該感光薄膜層之表面的導電連接體;及 一半導體晶片裝置,該半導體晶片裝置具有一晶 片安裝區域*於遠晶片安裝區域内係設有數個與邊晶 元之對應之導電連接體電氣連接的銲點。第29頁
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- 2000-03-15 TW TW89100578A01 patent/TW466715B/zh active
- 2000-05-05 US US09/564,989 patent/US6333561B1/en not_active Expired - Fee Related
- 2000-06-06 DE DE2000127852 patent/DE10027852A1/de not_active Withdrawn
- 2000-07-18 JP JP2000217360A patent/JP3328643B2/ja not_active Expired - Lifetime
- 2000-09-29 TW TW89100578A02 patent/TW495933B/zh active
- 2000-10-21 TW TW89100578A03 patent/TW466716B/zh active
- 2000-12-08 TW TW89100578A04 patent/TW503534B/zh active
- 2000-12-28 JP JP2000400815A patent/JP3443567B2/ja not_active Expired - Fee Related
-
2001
- 2001-01-17 DE DE2001101948 patent/DE10101948B4/de not_active Expired - Fee Related
- 2001-02-23 US US09/792,003 patent/US20020072148A1/en not_active Abandoned
- 2001-03-05 DE DE2001110453 patent/DE10110453A1/de not_active Withdrawn
- 2001-04-06 DE DE2001117239 patent/DE10117239A1/de not_active Ceased
- 2001-04-09 JP JP2001110048A patent/JP2002141438A/ja active Pending
- 2001-04-11 JP JP2001112806A patent/JP2002198464A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
TW503534B (en) | 2002-09-21 |
JP3328643B2 (ja) | 2002-09-30 |
JP2002198464A (ja) | 2002-07-12 |
TW434848B (en) | 2001-05-16 |
TW495933B (en) | 2002-07-21 |
JP3443567B2 (ja) | 2003-09-02 |
JP2001196421A (ja) | 2001-07-19 |
US20020072148A1 (en) | 2002-06-13 |
DE10101948B4 (de) | 2008-01-10 |
JP2002110853A (ja) | 2002-04-12 |
DE10117239A1 (de) | 2002-07-25 |
DE10110453A1 (de) | 2002-05-08 |
US6333561B1 (en) | 2001-12-25 |
TW466715B (en) | 2001-12-01 |
DE10027852A1 (de) | 2001-08-02 |
US6239488B1 (en) | 2001-05-29 |
DE10101948A1 (de) | 2002-04-18 |
JP2002141438A (ja) | 2002-05-17 |
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