TW392288B - Thermally stable dielectric coatings - Google Patents
Thermally stable dielectric coatings Download PDFInfo
- Publication number
- TW392288B TW392288B TW087108334A TW87108334A TW392288B TW 392288 B TW392288 B TW 392288B TW 087108334 A TW087108334 A TW 087108334A TW 87108334 A TW87108334 A TW 87108334A TW 392288 B TW392288 B TW 392288B
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- 238000000576 coating method Methods 0.000 title claims abstract description 110
- 239000011248 coating agent Substances 0.000 claims abstract description 94
- 239000011347 resin Substances 0.000 claims abstract description 58
- 229920005989 resin Polymers 0.000 claims abstract description 58
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 38
- 239000000758 substrate Substances 0.000 claims abstract description 19
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 18
- 235000012239 silicon dioxide Nutrition 0.000 claims abstract description 17
- 238000004519 manufacturing process Methods 0.000 claims abstract description 14
- 229920003209 poly(hydridosilsesquioxane) Polymers 0.000 claims abstract 4
- 238000000034 method Methods 0.000 claims description 32
- 239000002904 solvent Substances 0.000 claims description 18
- 229910052760 oxygen Inorganic materials 0.000 claims description 13
- 239000001301 oxygen Substances 0.000 claims description 12
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 11
- 239000000203 mixture Substances 0.000 claims description 10
- 238000005336 cracking Methods 0.000 claims description 4
- 239000000945 filler Substances 0.000 claims description 3
- 238000005229 chemical vapour deposition Methods 0.000 claims description 2
- 239000008186 active pharmaceutical agent Substances 0.000 claims 1
- 238000005520 cutting process Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 abstract description 27
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 abstract description 11
- 238000000151 deposition Methods 0.000 abstract description 10
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- 238000001723 curing Methods 0.000 description 15
- -1 nitride nitride Chemical class 0.000 description 13
- 239000002243 precursor Substances 0.000 description 13
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- 239000002184 metal Substances 0.000 description 7
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- 229910052757 nitrogen Inorganic materials 0.000 description 6
- 239000012298 atmosphere Substances 0.000 description 5
- 230000008021 deposition Effects 0.000 description 5
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- 150000001875 compounds Chemical class 0.000 description 4
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- 239000004065 semiconductor Substances 0.000 description 4
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 3
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- 239000003054 catalyst Substances 0.000 description 3
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- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 125000003545 alkoxy group Chemical group 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
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- 229940120693 copper naphthenate Drugs 0.000 description 2
- SEVNKWFHTNVOLD-UHFFFAOYSA-L copper;3-(4-ethylcyclohexyl)propanoate;3-(3-ethylcyclopentyl)propanoate Chemical compound [Cu+2].CCC1CCC(CCC([O-])=O)C1.CCC1CCC(CCC([O-])=O)CC1 SEVNKWFHTNVOLD-UHFFFAOYSA-L 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 2
- SNRUBQQJIBEYMU-UHFFFAOYSA-N dodecane Chemical compound CCCCCCCCCCCC SNRUBQQJIBEYMU-UHFFFAOYSA-N 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
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- 230000003301 hydrolyzing effect Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 239000008267 milk Substances 0.000 description 2
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- 235000013336 milk Nutrition 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- MWUXSHHQAYIFBG-UHFFFAOYSA-N nitrogen oxide Inorganic materials O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 2
- BKIMMITUMNQMOS-UHFFFAOYSA-N nonane Chemical compound CCCCCCCCC BKIMMITUMNQMOS-UHFFFAOYSA-N 0.000 description 2
- 229910052755 nonmetal Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000003973 paint Substances 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
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- 229910000077 silane Inorganic materials 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 2
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- LITSBNREXIFYBV-UHFFFAOYSA-N 3-oxobutanoic acid platinum Chemical compound [Pt].CC(=O)CC(O)=O.CC(=O)CC(O)=O LITSBNREXIFYBV-UHFFFAOYSA-N 0.000 description 1
- 239000005749 Copper compound Substances 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 241001175904 Labeo bata Species 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 229910021604 Rhodium(III) chloride Inorganic materials 0.000 description 1
- 229910008051 Si-OH Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910006358 Si—OH Inorganic materials 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 125000003668 acetyloxy group Chemical group [H]C([H])([H])C(=O)O[*] 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
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- 238000007605 air drying Methods 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 150000001335 aliphatic alkanes Chemical class 0.000 description 1
- 150000004703 alkoxides Chemical class 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- MVIOINXPSFUJEN-UHFFFAOYSA-N benzenesulfonic acid;hydrate Chemical compound O.OS(=O)(=O)C1=CC=CC=C1 MVIOINXPSFUJEN-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
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- 239000001273 butane Substances 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- KOPOQZFJUQMUML-UHFFFAOYSA-N chlorosilane Chemical compound Cl[SiH3] KOPOQZFJUQMUML-UHFFFAOYSA-N 0.000 description 1
- 150000001845 chromium compounds Chemical class 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
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- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 239000004205 dimethyl polysiloxane Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
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- 150000002148 esters Chemical class 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 1
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- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 125000003707 hexyloxy group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])O* 0.000 description 1
- 230000036571 hydration Effects 0.000 description 1
- 238000006703 hydration reaction Methods 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- OFBQJSOFQDEBGM-UHFFFAOYSA-N n-pentane Natural products CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 1
- 229910052605 nesosilicate Inorganic materials 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 239000001272 nitrous oxide Substances 0.000 description 1
- 150000002843 nonmetals Chemical class 0.000 description 1
- 235000012149 noodles Nutrition 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 150000004762 orthosilicates Chemical class 0.000 description 1
- 150000002923 oximes Chemical class 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- SONJTKJMTWTJCT-UHFFFAOYSA-K rhodium(iii) chloride Chemical compound [Cl-].[Cl-].[Cl-].[Rh+3] SONJTKJMTWTJCT-UHFFFAOYSA-K 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 150000004756 silanes Chemical class 0.000 description 1
- SCPYDCQAZCOKTP-UHFFFAOYSA-N silanol Chemical compound [SiH3]O SCPYDCQAZCOKTP-UHFFFAOYSA-N 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H01L21/02134—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material comprising hydrogen silsesquioxane, e.g. HSQ
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/022—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being a laminate, i.e. composed of sublayers, e.g. stacks of alternating high-k metal oxides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H01L21/02274—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/312—Organic layers, e.g. photoresist
- H01L21/3121—Layers comprising organo-silicon compounds
- H01L21/3122—Layers comprising organo-silicon compounds layers comprising polysiloxane compounds
- H01L21/3124—Layers comprising organo-silicon compounds layers comprising polysiloxane compounds layers comprising hydrogen silsesquioxane
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
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- H01L21/31604—Deposition from a gas or vapour
- H01L21/31608—Deposition of SiO2
- H01L21/31612—Deposition of SiO2 on a silicon body
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Description
kl B7 五、發明説明(i ) 本發明係關於製造耐熱性介電塗層之方法,含由氫梦倍 半氧燒樹脂(H-樹脂)厚1.25至2.25 的第一塗層與含二氧 化石夕(Si〇2)厚至少1〇〇 nm的第二塗層。經發現當厚度至少 '1〇〇 nm的二氧化矽塗層塗在H_樹脂層外時該塗層在其後熱 處理中能抗碎裂。於是合宜製造耐熱介電塗層。 技術上已知中階介電與鈍化在半導體裝置上之有限厚度 多層塗層之製作法。在美國專利5,145,723内所述流行方法 下H-樹脂吐絲於半導體裝置上,脱除一切溶劑在該裝置上 產生一H-樹脂膜。此膜隨後經將半導體裝置置於加熱板 (l5〇°C至35〇。〇上加熱軟化使h-樹脂流動,最後在斗⑼^至 450 C烘爐内加熱使膜熟化。不過此法僅有效製造有薄層 (<1·2 //ιη)Η-樹脂陶瓷之不裂塗層。此薄層不充分覆蓋金屬 層,故必須在孩Η-樹脂陶瓷上塗敷一厚層si〇2製成適當的 中階介電。 美國專利4,756,977内發表由樹脂在集體電路上製造多 層塗層I另一種方法。根據此專利一第一層係由裝置上塗 敷H-樹脂的溶劑溶液製成,然後脱除溶劑,加熱至15〇。(:與 1000 C間溫度使塗層陶瓷化。由1977方法製得之H_樹脂基 塗層厚度3,000至5,000埃(03至〇5 隨後在沁樹脂塗層 上塗敷一鈍化塗層。此鈍化塗層可係Si,siN,Sic或sicN。 希望自Η-樹脂製造較厚塗層以適當覆蓋敷金屬作用。但 用現行加工法製造厚塗層時其中含不合要求的破裂。 技術上已知熟化Η-樹脂的其他方法;但此等方法並不提 示或建議如何便行製作U5 以上的厚塗層。舉例,美國 -4-
私紙張尺度適用中國國家標準(CNS ;|裝------訂------線 (請先閱讀背面之;k意事項寫本頁) 丨、 經濟部中央標準局員工消費合作社印製 經濟部中央標準局員工消費合作社印製 Μ 五、發明説明( 專利5,380,567 ’ 5,370,904及5,370,903提出在惰性氣氛内熟 化H-樹脂。美國專利5,38〇,567透露H_樹脂在惰性氣氛内於 500 C至1000 c之溫度熟化(塗層厚度〇 2 。美國專利 5,370,904提供一種方法以製作厚二氧化矽膜其中方法包括 在表面上作一H-樹脂膜,然後在惰性氣氛内於自25〇;>c至 5〇〇°c溫度將膜加熱直到二氧化矽產物内siH含量達到原來 H-樹脂(塗覆厚度1(M 2S "m)内含量之g 8〇%。美國專利 5,370,903爲厚二氧化矽之另—製法,其中方法包括在表面 上作一㈣脂膜,然後將該膜在混合氣氛團%體積A) 中以自250 C至500。。溫度加熱以迄二氧化矽製品内siH達 到起始Η·樹脂(塗層厚度1剔·1〇細)的SiH含量之謂%。 此外美國專利5,059,448結合利用快速熱處理製造ι _以 :(〇.13至0.945㈣)之塗層。,憎中&樹脂膜曝露於高強度 輻射於50C至1000X:溫度迅速加 加填料於H-樹脂亦曾製得動:戶,备a # ;塗層。但因填料存在與填 科對塗層性質之影響,此等塗 „ 宁1層不必项作中階介電。舉例 ,美國專利5,458,912主張一種在雷子费 層在該裝置上塗敷一本石夕m裝置上作防回火的塗 敷σ矽石則身與填料之塗層;隨後於一 足以化此梦石前身成—本於 身成。矽石的陶瓷底質之溫度加埶。 所製塗層具厚度20至48 Am。 … 兹意外發現熟化條件(時間 „ ,,L 度與银境)經控制時可自 树如順利製得厚度1.25 以上的血 、入 m ^ Ατχ ^ 的,·、、破衣不洛塗層。亦發 見田在Η-树脂塗層上塗敷至少ι η & 塗〜 子之一氧化矽層時所產 …曝露於其後熱處理時保持無破裂。
、:"訂 鎳----- (請先Μ讀背面之注意事項导4寫本夏) • - - -I 1 . 經濟部中央標準局員工消費合作社印製 kl B7 五、發明説明(3 ) 本發明係關一種熱安定性多層塗層之製法及用以製得之 塗層。此多層塗層含一厚1.25至2.25 yin由H-樹脂製造之第 一塗層與一含二氧化石夕(Si02)至少厚100 nm的第二塗層。 第一塗層之製法包括在底質上塗敷一無填料的H-樹脂組 合物,然後將該樹脂於150°C至500°C溫度加熱足夠時期製 成厚1.25 至2.25 之無破裂塗層。第二塗層係在第一 塗層上澱積至少厚1 〇〇 nm之二氧化矽較佳經PECVD製得。 此多層塗層曝露於其後熱處理時異常安定(保持無破裂)。 本發明係關一種熱安定性多層塗層之製法及其所製的塗 層。多層塗層適用於任何底質如金屬或陶瓷,但在電子基 底上特別有效。"熱安定性"係謂塗層於曝露其後熱處理(溫 度S 450°C )時包括熟化處理(多達4循環)與退火(02與八 二者)不發展裂破。所謂"電子基底"意指製造半導體組件 包括焦平面陣列、光電子裝置、光電伏打電池、光學裝置 、電晶體類裝置、3-D裝置、絕緣體上矽裝置,及超晶格 裝置等。 文内所製多層塗層可於實施任何敷金屬法之前塗敷於晶 片。亦可塗敷於敷金屬法上作中階介電或塗敷作頂部鈍化 塗層以完成集體電路製作。 此外,電子基底能裸露(即無鈍化作用)或者能有初步鈍 化。此項初步'純化典型係陶堯塗料如沙石、氮化欢、碳化 矽、氧氮化矽、氧碳化矽、PSG、BPSG及其他,經CVD、 PVD、PECVD或溶膠-凝膠方式澱積。其初步鈍化及澱積方 法爲技術上所知。較佳電子基底有厚度達3 00 nm、較佳30 一 6- 本纸張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) --------U衣------1T------1 - (請先閱讀背面之I意事項各4寫本頁) 五、發明説明(4 ) —- nm至300 rnn碎石组成之初步鈍化層。 本發明多層塗層〈第—層係將-含H·樹脂的無填料组合 物塗敷在基嚴上製得。此樹脂含HSi(QH)x(OR)yC)z/2式單位 组成的氫化石夕氧燒樹脂,其中絲係獨立有機基或一取代 的有機基,當經氧原子連接至石夕時形成—能水解的取代基 ,x=0至2,y=〇至2,2=1至3,x+y+z=3。尺之實例包括燒基 如甲、乙、丙及丁基;芳基如苯基;及缔煙基如缔丙或乙 烯基。此等樹月旨可係本質上充分縮合的⑽i〇w丄其中係8 或更大或者可僅部分水解(即含多少si0R)&/或部分縮合(即 含夕少Si-OH)。雖非由此結構代表,此等樹脂亦可含少數( 例如少於1〇%)之矽原子有隨意〇或2氫原子連接其上或少數 Sic键由於有關其形成或處理之多種因數。 以上H-樹脂及其製法爲技術上所知。舉例,美國專利 3,615,272表tf —種幾乎完全縮合的H_樹脂(可含多達ι〇〇_ 300 PPm矽烷醇)的製法,包括在苯磺酸水合物水解介質内 水解一氯矽烷,随後用水或硫酸水液洗滌所得樹脂。同樣 美國專利5,010,159提供另一方法包括在芳基磺酸水合物水 解A貝内水解氫化石夕氧規形成樹脂,然後與一中性用劑接 觸。 八他風化碎乳娱^樹脂諸如經美國專利4,"9,397與 5,210,160説明者,其由—虎氧基或醯氧基矽燒在酸性、醇 土水解介貝内水解產生者;其在Jp_As 59_178749, 及63-1 07122中説明者;或任何其他同等氫化矽氧烷亦能在 此適當作用。 讀 先 閱 讀 背 之 注— 意 事 項 i 裝
1T 線 經濟部中央標準局員工消費合作社印製 \ -7- 經濟部中央標準局員工消費合作社印製 Λ7 B7 五、發明説明(5 ) 特定分子量部分之上述H-樹脂亦可用於本發明。此等部 分及其製法在美國專利5,063,267與5,416,190内指示。較佳 部分所含材料内至少75%聚合型物類有至少1200之數均分 子量,一更佳部分所含材料内至少有75%聚合型物類有 1 200與100,000間的數均分子量。 H-樹脂可另含一鉑、鍺或銅觸媒以提升該樹脂熟化速率 及深度。一般言之能增溶的任何鉑、铑或銅化合物或鉻合 物在此有效。舉例,得自 Dow Corning Cora, Midland, Mich 之乙醯基醋酮酸鉑、铑觸媒RhCl3[S(CH2CH2CH2CH3)2]3,或 環烷酸銅適宜。此等觸媒通常添加量以Η-樹脂重量基計在5 至1000 ppm銘、錄或銅。此處有效的銘與錢觸媒在美國專 利4,822,697中詳述。 陶瓷氧化物先質亦可與此處H-樹脂組合使用。預期的陶 资氧化物先質包括多種金屬如銘、妓、錯、麵、叙及/或鈒 ,以'及各種非金屬化合物諸如或鱗可溶於溶液者,水解 然後於較低溫熱解形成陶瓷氧化物。 以上陶瓷氧化物先質一般有一或多個能水解的基結合於 上述金屬或非金屬,視金屬之價數而定。此等化合物内所 含能水解基之數目並無嚴限、只要其化合物能溶解或分散 於溶劑。同樣,選擇正確能水解的取代基不嚴格,由於取 代基在系統外隨意被水解或熱解。典型能水解的基爲烷氧 基諸如甲氧、丙氧、丁氧及己氧;醯氧基諸如乙醯氧;經 過氧連接於該金屬或非金屬的其他有機基諸如乙酿基醋酮 酸鹽或胺基等。因此,明確化合物包括四乙醯基醋酮酸锆 一 8- 本紙張尺度適用中國國家標準(CNS ) A4規格(2丨OX 297公釐) --------丨裝-------訂----^---諫 一 * (請先閲讀背面之注意事項具^寫本1) Λ7 B7 五、發明説明(6 ) 一乙酿基醋酮酸鈇,三乙酸基醋酮酸銘,四異丁氧鈇與 Ti[N(CH3)2]4。此處適用的陶瓷氧化物先質經美國專利 4,808,653、5,〇〇8,32〇及5,290,354中指示進—步説明與製造。 陶瓷氧化物先質與H-樹脂组合時通常用量在使最後塗層 含0.1至3〇%重量比的陶瓷氧化物先質。 H-樹脂正常成一溶劑分散液塗敷於基底。溶劑包括任何 能溶解該樹脂生成均勻液態混合物而不影響所製塗層之用 鈉或混合用劑。此等溶劑包括醇類諸如乙醇或異丙醇;芳 烴類諸如苯或曱苯;鏈烷類如正庚烷、十二碳烷或壬烷; 酮類諸如曱基異丁基酮;酯類;二醇醚類及矽氧烷類諸如 裒一甲基^秒氧;k及線形二甲基多硬氧燒(例如六甲基乙石夕 氧烷、八曱基丙矽氧烷及其等混合物)。溶劑含量足夠溶解 H-樹脂至塗敷適宜濃度。溶劑以該樹脂與溶劑之總重量基 計典型含量20至99wt%,較佳自5〇至8〇%,最好在乃至乃 wt%。. H-樹脂之特定塗敷法包括自轉塗覆、沉浸塗覆、噴霧塗 覆、流動塗覆及網印等。較佳塗敷法爲自轉塗覆。用溶劑 時任由基底上所得H-樹脂膜澱積的塗層基底中溶劑蒸發。 於是用任何適當蒸發措施,諸如暴露於周園環境簡單風乾 ,施加減壓或適度加熱(s 5(rc)或在熟化過程的早期階叛 。應汪思用自轉塗覆時儘量減少附加乾燥方法以自轉驅除 溶劑。 基底塗敷後於150Ό至50(rc溫度,較佳2〇〇。(:至4〇〇。(:, 更好300T:至38(rc將H-樹脂膜熟化加熱該膜—定時間成無 本纸張尺lit用悄準(CNS) 請 先 閱 讀 背 之 注- 意 事 項 至裝 1 訂 經濟部中央榡準局員工消費合作社印製 2不溶性塗層。所謂”不溶性塗層"係指塗層本質上不溶 =樹脂自其中殿積生成該膜之溶劑或上述有助於文内塗 放H-樹脂之任何溶劑。”無破細 衣思喷塗層在一光學顯微鏡 下以ιοοοχ放大檢查時不本人~日鈿π a 1 σ人六員目視可見的任何破裂。 此處可用任何方法加熱,例如梏 1 j如使用對流爐、快速熱處理 、加熱板及輻射或微波能,以埶妬 ,^ 热扳車乂佳。用法必須能快速 加熱此膜至所須溫度。 加熱塗層熟化之時期久暫視加熱期間環境、加熱時溫度( 浸=溫度)、升溫熟m樹職厚度而定。熟化環境内浸 入溫度較高及/或氧濃度較高時熟化時間可較短。塗層典型 加熱自1秒至2小時,較佳自5秒至3〇分鐘。 若塗層在浸入溫度加熱不夠久或加熱太久,將產生破裂 。基本上在設定塗層厚度能產生無破裂塗層之指定浸入溫 度與環境=面有-空窗時間。浸人溫度愈低、&窗口愈大 。溫度升高時此窗π減小。又環境内含氧量增多時此窗降 低。舉例膜厚2 "m之膜於32crc時在惰氣氛(<5〇ppm〇2)内 熟化、熟化空窗爲2分至120分鐘。38〇r時熟化空窗自〇〇1 分至5分鐘。 塗層加熱欠久、塗層冷至室溫時將顯現裂破。相信經再 將塗層加熱充分時期可能修理/復原裂破。塗層加熱過久 時冷却塗層至室溫將再出現破裂。但此等後破裂不能再修 復。 樹脂膜熟化環境典型爲惰性環境諸如氮、氬、氦、或 含氧環境(例如空氣)。周園環境内氧含量加多時熟化H_ 經濟部中央標準局員工消費合作社印製 Λ7 B7 五、發明説明(8 ) 脂至無破裂塗層所須最少時間將縮短。而且無破裂塗層產 生期間之時間空窗將變窄。在較低溫(例如S 330°C )加熱時 較佳有氧存在以加速熟化。但當於較高溫(例如δ 340°C )加 熱時宜用惰性環境。 H-樹脂可在大氣壓、超大氣壓或眞空計壓力下進行熟化 ,較佳在大氣壓。溫度較低時用較高壓以加速熟化。眞空 可在任何溫度使用。 塗層加熱至浸入溫度之速度對製造無破裂塗層任務重要 。若加熱速度快則製造無破裂塗層之空窗時間將較長或者 浸入溫度較高及/或較高塗層厚度可達成無破裂。反之若加 熱速度缓慢則產生無破裂塗層之空窗時間能較短或者必要 較低浸入溫度與/或降低塗層厚度以獲致無破裂塗層。 此處厚塗層可藉製作單一厚H-樹脂膜隨後在吾人控制條 件下熟化製成。此處亦可藉.製作一薄H-樹脂膜然後在吾人 控制條件下熟化並重複製程直到獲得所須厚度產生厚層。 本發明第一層塗層有厚度至少1.25 //m,較佳1.25至2.25 //m,最’好 1.5至 2.2 //m。 文内所製不溶性塗料之化學成分與分子結構不完全了解 。但相信成分與用已知熟化方法以用吾人申請的熟化方法 獲得根據獨特性質(厚度、無破裂等)所製之不溶性塗料不 同0 本發明吾人多層塗層之第二層係由含矽料經澱積(即CVD, PECVD,等)所產生二氧化矽组成,厚度至少100 nm至2 ,較佳至少170 nm,更佳至少200 nm,最後至少300 nm。 -11- 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) --------1¾衣------,tT------Λ (請先閱讀背面之:'/£-意事項各^寫本頁) 392288 Μ Β7 五、發明説明(9 ) 第二層之塗敷法不嚴格,此項塗層係用任何化學蒸汽澱 積技術諸如熱化學蒸汽澱積法(TCVD),光化學蒸汽澱積, 電漿促進的化學蒸汽澱積(PECVD),電子迴旋加速機共鳴 (ECR)及噴射蒸汽澱積作用等塗敷。用物理蒸汽澱積技術諸 如噴鍍或電子束蒸發等亦便利塗敷。此等方法包含隨意添 加熱或電漿式能量於蒸發的物類引起所須反應或者集中能 量於材料之固態試樣上使其澱積。用CVD製造二氧化碳層 之方法在美國專利4,981,724中更完全敘述。 舉例,在熱化學蒸汽澱積作用中將所須先質氣流送過已 加熱的底質上澱析塗層。先質氣體接觸熱表面時反應而析 積塗層。底質溫度在25°C至1,000°C範圍内在幾分鐘至數小' 時内形成此等塗層視先質氣體及塗層厚度而定。此項製法 中亦能用反應性金屬以促進澱積。 在PECVD法中將先質氣體送過電漿場使反應。生成反應 性物類,聚集於易附著的底質處。PECVD法勝過熱CVD法 之優點爲前者用較低基底及處理溫度,即25°C至600°C。 PECVD法中所用電漿能係自放電、無線電頻或微波範圍 内電磁場、雷射或粒子束中衍生的能量。多數電漿澱積法 中較佳用無線電頻(即10 kHz至102 MHz)或中等能力密度(即 0.1-5瓦特/cm2)之微波能量(即O.l-lOGHz或109Hz)。頻率、 能力及壓力經調適配合先質氣體與所用設備。 欲製二氧化矽層典型有一含矽先質氣體與一氧源反應。 用以生產二氧化矽層之先質氣體包括矽烷;烷氧基矽烷諸 如原矽酸酯如原矽酸四乙酯(TEOS);自化矽烷諸如三氯矽 -12- 本纸張尺度適用中國國家標準(CNS ) A4規格(210'乂 297.公釐) --------—装—-----ir------1 (請先閱讀背面之>£-意事項f寫本頁) 經濟部中央標隼局員工消费合作社印製 經濟部-6-央操準局貝工消贽合作社印製 以 392288 五、發明説明(10 ) 烷;矽環丁烷及其他。 乳源包括2氣、氧、臭氧、氧化亞氮、及氧化氮之類。 —亦可含其他物^諸如氦或氬之载劑氣體;添加劑如鱗化 氫或㈣;自素或能添加第二層適宜性質之任何其他材料。 經發現-厚度至少_ nm的二氧化碎層澱積於中請之H- 樹脂塗層上時吾人之多層塗層對其後熱處理具安定性。 實驗程序 根據美國專利3,615,272製備—種氫切倍半氧燒樹脂 (札樹脂)組合物含4〇 wt% H_樹脂(Hsi〇3,丄,其數均分子量 在MOO與13,900間,溶於低分子量多二甲基矽氧烷中,在 以下實例中使用。 头個10.2 cm(4忖)式樣晶片用—HeadwayTM自轉塗覆器於 〇啊、塗覆該㈣脂歷爾鐘。本實驗所用晶片隨意係 裸晶片或有ioo nm層之PECVD二氧化矽("Si〇2")晶片。 所用熟化系統包括一加熱板、貝悌氏培養皿、帶氮入口 的改良玻璃漏斗與一紅外溫度讀出機。加熱板先預熱至比 表1中所列溫度高2〇。〇至3CTC之溫度。然後舉高破璃漏斗 將自轉晶片f丨入貝悌氏皿,其時氮氣流爲熟化製程期間所 用之2-3倍。加熱晶片表面至所須溫度(典型須川至%秒” 減少氮流,在(表1内報告的)溫度加熱晶片適宜時間。塗層 在空氣中熟化時用上述熟化製程但不用氮沖洗。 熟化後移出加熱板表面之含晶片的貝悌氏皿與漏斗益迅 速冷却。保持氮流以迄塗層表面溫度低於3 (TC。 於是用10% SiH#在He與'Ο内經PECVD塗覆一層二氧化 -13- 本紙張尺度適用中國國家標準(CNS ) A4規格(2丨〇χ 297公兹) --------1¾衣-- (請先閲讀背面之注意事項4填寫本頁) 、νβ
---------------- · 1 I -I -1. I 經濟部中央標準局員工消費合作社印製 392288 五、發明説明(11 ) 矽於晶片。澱積期間晶片溫度爲350°C,壓力爲400 kPa (3000 Torr) ° 結果與明確處理條件顯示於表1。 其上有170 nm二氧化矽塗層的晶片非在潔淨室内製造, 塗層含粒子。破裂較小且限於粒子四周諸區。因此,相信 其中二氧化矽塗層有厚度至少100 nm之多層塗層能耐熱。 表 1 熟化條件 塗層厚 度〇 m) 1¾2庚 蓋厚度 (nm) 熱處理(破裂?是/否) 溫度 (C) 時間 (分) 氣氛 熟化循環 4 5 0 °C退火 1 4 n2 02 350 0.33 n2 1.906 100 300 N N N N 350 0.42 N2 1.916 100 300 N N N N 350 0.5 N2 1.901 100 300 N N N N 350 0.75 N2 1.926 100 300 N N N N 350 1 N2 1.922 100 300 N N N . 350 0.5 空氣 1.521 100 300 N N N . 350 1 空氣 1.502 100 300 N N N 350 2 空氣 1.522 100 300 N N N 250 1.5 空氣 1.537 100 300 N N N N 250 2 空氣 1.502 100 300 N N N N 250 1.5 空氣 1.966 100 300 N N . _ 250 1.5 空氣 2.023 100 300 N N __ -14- 本纸張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) --------1¾衣—— (請先閲讀背面之注意事項;填寫本頁) 、\=口 镍 392288 Λ7 B7 五、發明説明(12 ) 經濟部中央標準局員工消費合作社印製 250 2 空氣 1.986 100 300 N N 360 1 n2 1.963 100 1000 N N N 360 1 n2 1.877 100 1000 N N N 360 1 n2 1.916 100 1000 N N N 360 1 N2 2.035 100 1000 N N N 340 2 n2 1.987 100 1000 N N N 340 2 n2 2.007 100 1000 N N N 340 2 n2 2.056 100 1000 N N N 340 2 N2 1.947 100 1000 N N N 320 2 n2 1.971 100 1000 N N N 320 3 n2 2.009 100 1000 N N N _ 350 0.33 n2 1.955 100 無 N N Y 350 1 N2 1.922 100 無 N N Y 250 2 空氣 1.986 100 N N Y 350 2 空氣 1.522 100 N N Y 340 2 N2 1.987 100 170 N N Y 340 2 N2 2.007 100 170 N N Y 360 N2 1.963 100 170 N N Y 360 N2 1.877 100 170 N N Y _ 意指無法取得資料 -15- 本纸張尺度適用中獨國家標準(CNS ) A4規格(210X 297公釐) ---------批衣------ir-------線 -丨 (請先閲讀背面之注意事項鼻4寫本頁)
Claims (1)
- AS Βδ cs DS ’其中二氧化矽有厚 其中電子基底上有— 392288 7、申請專利範圍 L —種製造多層塗層之方法,包括: 塗敷含氫矽倍半氧烷樹脂之無填料組合物於基底上 形成厚度1·25 "m至2.25 之膜; 八於150 C至50(TC溫度在惰性或含氧環境中將膜加熱充 刀時間製成厚1.25至2.25厂111無破裂的不溶性塗層; 在不落性塗層外澱積一層至少厚1〇〇 nm的二氧化矽。 2·根據申請專利範園第1項之方法,其中無填料组合物亦含 —溶劑,脱除溶劑形成膜。 3·根據申請專利範圍第2項之方法,朴無填料組合物含分 至80 wt%溶劑。 - 4.根據申請專利範圍第巧之方法,其中不溶性塗料有厚度 1.5 Am至 2.2 。 又 5·«中請專利範圍第巧之方法,其中:氧切係經化取 蒸汽澱積作用澱積。 予 6. 根據申請專利範圍第1項之方法 300 nm至 2 jum。 7. 根據申請專利範圍第1項之方法, 步鈍化層厚30 nm至300 nm。 Ί 6" 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) ------、玎!------.線 -.:: /, (請先閔讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印製
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US6440895B1 (en) * | 1998-07-27 | 2002-08-27 | Battelle Memorial Institute | Catalyst, method of making, and reactions using the catalyst |
JP3125781B2 (ja) * | 1999-03-03 | 2001-01-22 | ヤマハ株式会社 | 半導体装置の製法 |
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US5607773A (en) * | 1994-12-20 | 1997-03-04 | Texas Instruments Incorporated | Method of forming a multilevel dielectric |
US5684356A (en) * | 1996-03-29 | 1997-11-04 | Texas Instruments Incorporated | Hydrogen-rich, low dielectric constant gate insulator for field emission device |
-
1998
- 1998-05-28 TW TW087108334A patent/TW392288B/zh not_active IP Right Cessation
- 1998-06-01 SG SG1998001161A patent/SG70637A1/en unknown
- 1998-06-01 EP EP98304290A patent/EP0883164A3/en not_active Withdrawn
- 1998-06-01 CA CA002239347A patent/CA2239347A1/en not_active Abandoned
- 1998-06-05 KR KR1019980020820A patent/KR19990006686A/ko not_active Application Discontinuation
- 1998-06-05 JP JP10156531A patent/JPH1116899A/ja not_active Withdrawn
-
2000
- 2000-03-01 US US09/516,087 patent/US6210749B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
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CA2239347A1 (en) | 1998-12-06 |
JPH1116899A (ja) | 1999-01-22 |
US6210749B1 (en) | 2001-04-03 |
KR19990006686A (ko) | 1999-01-25 |
EP0883164A2 (en) | 1998-12-09 |
EP0883164A3 (en) | 2000-08-09 |
SG70637A1 (en) | 2000-02-22 |
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