TW376448B - Scanning near-field optical microscope - Google Patents

Scanning near-field optical microscope

Info

Publication number
TW376448B
TW376448B TW087103580A TW87103580A TW376448B TW 376448 B TW376448 B TW 376448B TW 087103580 A TW087103580 A TW 087103580A TW 87103580 A TW87103580 A TW 87103580A TW 376448 B TW376448 B TW 376448B
Authority
TW
Taiwan
Prior art keywords
optical waveguide
means consisting
waveguide probe
sample
quartz oscillator
Prior art date
Application number
TW087103580A
Other languages
English (en)
Inventor
Eisuke Tomita
Original Assignee
Sii Nanotechnology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sii Nanotechnology Inc filed Critical Sii Nanotechnology Inc
Application granted granted Critical
Publication of TW376448B publication Critical patent/TW376448B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/08—Means for establishing or regulating a desired environmental condition within a sample chamber
    • G01Q30/10—Thermal environment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/862—Near-field probe

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
TW087103580A 1997-03-12 1998-03-11 Scanning near-field optical microscope TW376448B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05801397A JP3249419B2 (ja) 1997-03-12 1997-03-12 走査型近接場光学顕微鏡

Publications (1)

Publication Number Publication Date
TW376448B true TW376448B (en) 1999-12-11

Family

ID=13072095

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087103580A TW376448B (en) 1997-03-12 1998-03-11 Scanning near-field optical microscope

Country Status (7)

Country Link
US (1) US6194711B1 (zh)
EP (1) EP0864899B1 (zh)
JP (1) JP3249419B2 (zh)
KR (1) KR100534039B1 (zh)
CA (1) CA2229221A1 (zh)
DE (1) DE69817239T2 (zh)
TW (1) TW376448B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI449915B (zh) * 2010-12-15 2014-08-21 Nat Applied Res Laboratoires 近場光學顯微裝置

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3949831B2 (ja) * 1998-11-11 2007-07-25 セイコーインスツル株式会社 光カンチレバーとその製造方法
US7595189B2 (en) * 1999-01-08 2009-09-29 Applied Biosystems, Llc Integrated optics fiber array
US20050026209A1 (en) * 1999-01-08 2005-02-03 Vann Charles S. Optical fiber bundle for detecting binding of chemical species
JP3387846B2 (ja) * 1999-03-04 2003-03-17 セイコーインスツルメンツ株式会社 走査型プローブ顕微鏡
TW424155B (en) * 1999-05-03 2001-03-01 Ind Tech Res Inst Beating mode near-field optical microscope
DE19925431C2 (de) * 1999-06-02 2002-11-07 Ind Tech Res Inst Optisches Nahfeld-Abtastmikroskop
AU6256300A (en) * 1999-07-20 2001-02-05 Dmitri N. Davydov High q-factor micro tuning fork by thin optical fiber for nsom
US6429968B1 (en) * 2000-03-09 2002-08-06 Agere Systems Guardian Corp Apparatus for photoluminescence microscopy and spectroscopy
JP2002190444A (ja) 2000-10-10 2002-07-05 Canon Inc パターン露光装置、パターン作製方法、及びこれらを用いて作製したデバイス
JP4379758B2 (ja) * 2000-11-13 2009-12-09 日本分光株式会社 近接場顕微鏡
JP4009197B2 (ja) * 2001-02-06 2007-11-14 ユニバーシティ・オブ・ブリストル 走査型近接場光学顕微鏡
US7498564B2 (en) 2001-02-06 2009-03-03 University Of Bristol Of Senate House Resonant scanning near-field optical microscope
KR100434542B1 (ko) * 2001-09-18 2004-06-05 삼성전자주식회사 근접장용 광 프로브 개구 측정장치 및 방법
US7473887B2 (en) 2002-07-04 2009-01-06 University Of Bristol Of Senate House Resonant scanning probe microscope
US7454095B2 (en) * 2004-04-27 2008-11-18 California Institute Of Technology Integrated plasmon and dielectric waveguides
US7372013B2 (en) * 2004-04-27 2008-05-13 California Institute Of Technology Near field scanning microscope probe and method for fabricating same
KR100558778B1 (ko) * 2004-04-30 2006-03-10 학교법인 서강대학교 유전체 공진기를 이용한 근접장 현미경
US20070240757A1 (en) * 2004-10-15 2007-10-18 The Trustees Of Boston College Solar cells using arrays of optical rectennas
US7571638B1 (en) * 2005-05-10 2009-08-11 Kley Victor B Tool tips with scanning probe microscopy and/or atomic force microscopy applications
US9423693B1 (en) 2005-05-10 2016-08-23 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
US7043104B1 (en) 2005-06-14 2006-05-09 Hewlett-Packard Development Company, L.P. High gain optical probe
US7149395B1 (en) 2005-08-09 2006-12-12 Instrument Technology Research Center Light-enhancing component and fabrication method thereof
US7649665B2 (en) * 2005-08-24 2010-01-19 The Trustees Of Boston College Apparatus and methods for optical switching using nanoscale optics
US7589880B2 (en) * 2005-08-24 2009-09-15 The Trustees Of Boston College Apparatus and methods for manipulating light using nanoscale cometal structures
WO2007120175A2 (en) * 2005-08-24 2007-10-25 The Trustees Of Boston College Apparatus and methods for solar energy conversion using nanoscale cometal structures
US7623746B2 (en) * 2005-08-24 2009-11-24 The Trustees Of Boston College Nanoscale optical microscope
US7754964B2 (en) * 2005-08-24 2010-07-13 The Trustees Of Boston College Apparatus and methods for solar energy conversion using nanocoax structures
US7397030B1 (en) 2006-06-01 2008-07-08 N&K Technology, Inc. Integrated local and global optical metrology for samples having miniature features
US7784107B2 (en) * 2006-06-02 2010-08-24 Victor B. Kley High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer
WO2007149534A2 (en) * 2006-06-21 2007-12-27 University Of Dayton Methods of polarization engineering and their applications
JP4825697B2 (ja) * 2007-01-25 2011-11-30 株式会社ミツトヨ デジタル式変位測定器
KR20090117881A (ko) * 2007-01-30 2009-11-13 솔라스타, 인코포레이티드 광전지 및 광전지를 제조하는 방법
EP2115784A2 (en) * 2007-02-12 2009-11-11 Solasta, Inc. Photovoltaic cell with reduced hot-carrier cooling
TW200919751A (en) * 2007-07-03 2009-05-01 Solasta Inc Distributed coax photovoltaic device
JP4899162B2 (ja) * 2007-07-17 2012-03-21 独立行政法人産業技術総合研究所 走査型プローブ顕微鏡用プローブ及びそれを用いた走査型プローブ顕微鏡
GB0809768D0 (en) * 2008-05-29 2008-07-09 Univ Sheffield Hallam Improvements to mass spectrometry
US9778572B1 (en) 2013-03-15 2017-10-03 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
KR101466807B1 (ko) * 2013-07-29 2014-11-28 포항공과대학교 산학협력단 분광 측정을 위한 튜닝포크 기반의 근접장 탐침 및 이를 이용한 근접장 현미경, 근접장 현미경을 이용한 분광 분석 방법
CN103528798A (zh) * 2013-10-22 2014-01-22 中国科学院半导体研究所 一种对光波导通光性能进行测试的方法
WO2016142214A2 (en) 2015-03-11 2016-09-15 Asml Netherlands B.V. Method and apparatus for inspection and metrology
CN109682995A (zh) * 2019-01-21 2019-04-26 仪晟科学仪器(嘉兴)有限公司 一种散射式低温扫描近场光学显微镜
KR20220067593A (ko) 2020-11-16 2022-05-25 삼성전자주식회사 근접장 검출용 프로브 및 이를 포함하는 근접장 검출 시스템
CN113252947B (zh) * 2021-04-21 2022-05-03 上海交通大学 基于多探针的无光源式近场热辐射扫描显微镜系统
CN113341180B (zh) * 2021-05-24 2023-07-18 西安交通大学 一种基于近场无孔式探针的多模式测量方法及测量系统
CN116168996B (zh) * 2023-04-24 2023-06-27 合肥晶合集成电路股份有限公司 一种电子显微镜及其工作方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH650605A5 (de) * 1980-10-24 1985-07-31 Cerberus Ag Infrarot-einbruchdetektor.
EP0290647B1 (en) 1987-05-12 1991-07-24 International Business Machines Corporation Oscillating quartz atomic force microscope
US4738562A (en) * 1987-05-15 1988-04-19 Jmk International, Inc. Apparatus for inserting backing rod into concrete expansion joints
JPH02297003A (ja) * 1989-05-12 1990-12-07 Canon Inc 検出部位置決機構、圧電素子微動機構およびこれらを用いた走査型トンネル顕微鏡
US5636035A (en) * 1991-09-30 1997-06-03 The Trustees Of The Stevens Institute Of Technology Method and apparatus for dual modulation laser spectroscopy
US5254854A (en) * 1991-11-04 1993-10-19 At&T Bell Laboratories Scanning microscope comprising force-sensing means and position-sensitive photodetector
JPH05180616A (ja) * 1992-01-08 1993-07-23 Canon Inc プローブ保持機構
JPH06251435A (ja) * 1993-03-01 1994-09-09 Canon Inc 記録再生装置
GB2289759B (en) * 1994-05-11 1996-05-22 Khaled Karrau Coupled oscillator scanning imager
GB2290656B (en) * 1994-06-23 1998-03-25 Grongar Wynn Lloyd A scanning probe and an approach mechanism therefor
JPH0894650A (ja) * 1994-09-28 1996-04-12 Nikon Corp 近接場走査型顕微鏡の光プローブ保持装置
TW280928B (zh) * 1994-10-24 1996-07-11 At & T Corp
US5574278A (en) * 1995-05-23 1996-11-12 The United States Of America As Represented By The Secretary Of Commerce Atomic force microscope using piezoelectric detection
DE19524907A1 (de) 1995-07-08 1997-01-09 Frieder Mugele Rastersondenmikroskop
JP3290586B2 (ja) * 1996-03-13 2002-06-10 セイコーインスツルメンツ株式会社 走査型近視野光学顕微鏡

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI449915B (zh) * 2010-12-15 2014-08-21 Nat Applied Res Laboratoires 近場光學顯微裝置

Also Published As

Publication number Publication date
EP0864899B1 (en) 2003-08-20
EP0864899A3 (en) 2000-08-02
JP3249419B2 (ja) 2002-01-21
EP0864899A2 (en) 1998-09-16
US6194711B1 (en) 2001-02-27
JPH10253643A (ja) 1998-09-25
KR19980080196A (ko) 1998-11-25
CA2229221A1 (en) 1998-09-12
KR100534039B1 (ko) 2006-03-07
DE69817239T2 (de) 2004-07-01
DE69817239D1 (de) 2003-09-25

Similar Documents

Publication Publication Date Title
TW376448B (en) Scanning near-field optical microscope
TW371717B (en) Scanning probe microscope
US5990477A (en) Apparatus for machining, recording, and reproducing, using scanning probe microscope
EP0388023B1 (en) Atomic force microscope with optional replaceable fluid cell
US5515719A (en) Controlled force microscope for operation in liquids
US5481908A (en) Resonance contact scanning force microscope
US8387161B2 (en) Scanning probe microscope
JPH0650750A (ja) 力検知手段を含む走査型顕微鏡
JPH11108940A (ja) 走査プローブ顕微鏡
US7170054B2 (en) Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder
US6281495B1 (en) Method of producing magnetic force image and scanning probe microscope
US5681987A (en) Resonance contact scanning force microscope
US7038202B2 (en) Conductive transparent probe and probe control apparatus
US5811802A (en) Scanning probe microscope with hollow pivot assembly
JP2000199736A (ja) 走査型近視野顕微鏡
JP4388559B2 (ja) 走査型近視野顕微鏡
TW369603B (en) Apparatus for machining, recording, and reproducing, using scanning probe microscope
JP3398411B2 (ja) 磁気力顕微鏡
Fairbairn Feedback control of the atomic force microscope micro-cantilever for improved imaging
JPH11142105A (ja) フリクション・フォース・プローブ顕微鏡およびフリクション・フォース・プローブ顕微鏡を用いた原子種や材料の同定方法
KR20050102733A (ko) 근접장 레이저 패터닝 장치