TW360926B - Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film - Google Patents

Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film

Info

Publication number
TW360926B
TW360926B TW083112117A TW83112117A TW360926B TW 360926 B TW360926 B TW 360926B TW 083112117 A TW083112117 A TW 083112117A TW 83112117 A TW83112117 A TW 83112117A TW 360926 B TW360926 B TW 360926B
Authority
TW
Taiwan
Prior art keywords
wirings
wiring
formation
thin film
target
Prior art date
Application number
TW083112117A
Other languages
English (en)
Inventor
Yasuo Kohsaka
Yoshiharu Fukasawa
Yoshiko Tsuji
Mitsushi Ikeda
Michio Sato
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of TW360926B publication Critical patent/TW360926B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40Capacitors
    • H01L28/60Electrodes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F1/00Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
    • B22F1/09Mixtures of metallic powders
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C27/00Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
    • C22C27/04Alloys based on tungsten or molybdenum
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136286Wiring, e.g. gate line, drain line
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/53204Conductive materials
    • H01L23/53209Conductive materials based on metals, e.g. alloys, metal silicides
    • H01L23/53257Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being a refractory metal
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78606Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
    • H01L29/78618Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136286Wiring, e.g. gate line, drain line
    • G02F1/136295Materials; Compositions; Manufacture processes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12014All metal or with adjacent metals having metal particles
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12493Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
    • Y10T428/12771Transition metal-base component
    • Y10T428/12806Refractory [Group IVB, VB, or VIB] metal-base component
    • Y10T428/12826Group VIB metal-base component
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12493Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
    • Y10T428/12771Transition metal-base component
    • Y10T428/12806Refractory [Group IVB, VB, or VIB] metal-base component
    • Y10T428/12826Group VIB metal-base component
    • Y10T428/1284W-base component
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/29Coated or structually defined flake, particle, cell, strand, strand portion, rod, filament, macroscopic fiber or mass thereof
    • Y10T428/2913Rod, strand, filament or fiber
    • Y10T428/2933Coated or with bond, impregnation or core
    • Y10T428/294Coated or with bond, impregnation or core including metal or compound thereof [excluding glass, ceramic and asbestos]
    • Y10T428/2951Metal with weld modifying or stabilizing coating [e.g., flux, slag, producer, etc.]

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Nonlinear Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Physical Vapour Deposition (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
TW083112117A 1993-12-14 1994-12-23 Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film TW360926B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31293693 1993-12-14

Publications (1)

Publication Number Publication Date
TW360926B true TW360926B (en) 1999-06-11

Family

ID=18035262

Family Applications (1)

Application Number Title Priority Date Filing Date
TW083112117A TW360926B (en) 1993-12-14 1994-12-23 Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film

Country Status (8)

Country Link
US (3) US5913100A (zh)
EP (2) EP0947593A3 (zh)
JP (1) JP3445276B2 (zh)
KR (1) KR100210525B1 (zh)
AT (1) ATE216436T1 (zh)
DE (1) DE69430439T2 (zh)
TW (1) TW360926B (zh)
WO (1) WO1995016797A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI831456B (zh) * 2021-11-09 2024-02-01 南韓商三星電子股份有限公司 積體電路裝置

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100471773B1 (ko) * 1997-09-19 2005-07-07 삼성전자주식회사 몰리브덴또는몰리브덴합금을이용한배선의제조방법및이를이용한박막트랜지스터의제조방법
KR100508036B1 (ko) * 1997-02-26 2005-11-21 삼성전자주식회사 몰리브덴또는몰리브덴합금을이용한반도체장치의제조방법
US6445004B1 (en) 1998-02-26 2002-09-03 Samsung Electronics Co., Ltd. Composition for a wiring, a wiring using the composition, manufacturing method thereof, a display using the wiring and a manufacturing method thereof
JP2000311611A (ja) * 1999-02-25 2000-11-07 Canon Inc 画像形成装置の製造方法および、該製造方法により製造された画像形成装置
US6614083B1 (en) 1999-03-17 2003-09-02 Semiconductor Energy Laboratory Co., Ltd. Wiring material and a semiconductor device having wiring using the material, and the manufacturing method
TW444257B (en) 1999-04-12 2001-07-01 Semiconductor Energy Lab Semiconductor device and method for fabricating the same
JP4527069B2 (ja) * 1999-04-12 2010-08-18 株式会社半導体エネルギー研究所 表示装置
US7245018B1 (en) 1999-06-22 2007-07-17 Semiconductor Energy Laboratory Co., Ltd. Wiring material, semiconductor device provided with a wiring using the wiring material and method of manufacturing thereof
US6661096B1 (en) * 1999-06-29 2003-12-09 Semiconductor Energy Laboratory Co., Ltd. Wiring material semiconductor device provided with a wiring using the wiring material and method of manufacturing thereof
US7411211B1 (en) 1999-07-22 2008-08-12 Semiconductor Energy Laboratory Co., Ltd. Contact structure and semiconductor device
JP3721014B2 (ja) 1999-09-28 2005-11-30 株式会社日鉱マテリアルズ スッパタリング用タングステンターゲットの製造方法
JP2001295035A (ja) * 2000-04-11 2001-10-26 Toshiba Corp スパッタリングターゲットおよびその製造方法
WO2002020865A1 (fr) * 2000-09-07 2002-03-14 Kabushiki Kaisha Toshiba Cible de pulverisation au tungstene et son procede de fabrication
JP4905618B2 (ja) * 2001-05-31 2012-03-28 株式会社東芝 配線形成用材料、配線形成用スパッタリングターゲット、配線薄膜及び電子部品
JP4574949B2 (ja) * 2003-01-14 2010-11-04 株式会社東芝 スパッタリングターゲットとその製造方法
JP2004356616A (ja) * 2003-05-28 2004-12-16 Samsung Electronics Co Ltd 配線用エッチング液及びこれを利用した薄膜トランジスタ表示板の製造方法
JP4110533B2 (ja) * 2004-02-27 2008-07-02 日立金属株式会社 Mo系ターゲット材の製造方法
US20050230244A1 (en) 2004-03-31 2005-10-20 Hitachi Metals, Ltd Sputter target material and method of producing the same
WO2006001976A2 (en) * 2004-06-15 2006-01-05 Tosoh Smd, Inc. High purity target manufacturing methods
JP4492877B2 (ja) * 2005-09-27 2010-06-30 日本新金属株式会社 スパッタリングターゲット用原料粉末として用いられる高純度モリブデン−タングステン合金粉末の製造方法
AT8697U1 (de) 2005-10-14 2006-11-15 Plansee Se Rohrtarget
DE102005050424B4 (de) * 2005-10-19 2009-10-22 W.C. Heraeus Gmbh Sputtertarget aus mehrkomponentigen Legierungen
US20080170959A1 (en) * 2007-01-11 2008-07-17 Heraeus Incorporated Full density Co-W magnetic sputter targets
WO2008084863A1 (ja) * 2007-01-12 2008-07-17 Nippon Steel Materials Co., Ltd. Mo系スパッタリングターゲット板,および,その製造方法
JP4919162B2 (ja) * 2007-04-10 2012-04-18 日立金属株式会社 Fe−Co系合金スパッタリングターゲット材およびFe−Co系合金スパッタリングターゲット材の製造方法
US8016705B2 (en) 2007-04-19 2011-09-13 Shimano Inc. Bicycle component positioning device
AT10578U1 (de) * 2007-12-18 2009-06-15 Plansee Metall Gmbh Dunnschichtsolarzelle mit molybdan-haltiger ruckelektrodenschicht
JP5327651B2 (ja) * 2008-03-28 2013-10-30 日立金属株式会社 電子部品用薄膜配線および薄膜配線形成用スパッタリングターゲット材
JP5808066B2 (ja) 2011-05-10 2015-11-10 エイチ.シー.スターク インク. 複合ターゲット
JP6677875B2 (ja) * 2015-03-23 2020-04-08 三菱マテリアル株式会社 多結晶タングステン及びタングステン合金焼結体並びにその製造方法
WO2019107816A1 (ko) 2017-11-29 2019-06-06 엔에이티엠 주식회사 텅스텐-몰리브덴 합금 제조방법
JP2020047702A (ja) * 2018-09-18 2020-03-26 キオクシア株式会社 半導体装置およびその製造方法
CN115233175A (zh) * 2022-08-08 2022-10-25 新加坡先进薄膜材料私人有限公司 一种钌旋转溅射靶材的制备方法
US20240229225A1 (en) * 2023-01-06 2024-07-11 Honeywell International Inc. Diffusion bonded tungsten containing target to copper alloy backing plate

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3778654A (en) * 1972-11-02 1973-12-11 Gen Electric Molybdenum alloy target for mammographic usage in x-ray tubes
JPS6011479B2 (ja) * 1977-09-20 1985-03-26 富士通株式会社 セラミツク多層回路基板の製造方法
JPS587864A (ja) * 1981-07-06 1983-01-17 Hitachi Ltd 半導体装置及びその製造方法
JPS6011479A (ja) * 1983-06-30 1985-01-21 Showa Denko Kk チアゾリルカ−バメ−ト系化合物及び農園芸用殺菌剤
JPS63241164A (ja) 1987-03-30 1988-10-06 Toshiba Corp スパッタリングターゲットおよび電気配線用合金膜
JPH0196348A (ja) * 1987-10-08 1989-04-14 Tokyo Tungsten Co Ltd 耐腐食性材料
JPH0810299B2 (ja) 1988-03-11 1996-01-31 株式会社精工舎 薄膜トランジスタアレイ
JP2670295B2 (ja) * 1988-04-27 1997-10-29 株式会社東芝 スパッタリングターゲット
EP0374931B1 (en) * 1988-12-21 1994-03-02 Kabushiki Kaisha Toshiba Sputtering target and method of manufacturing the same
US4913182A (en) * 1989-03-24 1990-04-03 Sloan Valve Company Plumbing fixture check stop
JP2757287B2 (ja) * 1989-11-02 1998-05-25 日立金属株式会社 タングステンターゲットの製造方法
US5824004A (en) * 1990-06-18 1998-10-20 The Procter & Gamble Company Stretchable absorbent articles
JPH05194064A (ja) * 1992-01-21 1993-08-03 Nisshin Steel Co Ltd 金属コーティングしたセラミックス粒及びその製造方法
JP3573778B2 (ja) 1993-03-12 2004-10-06 株式会社東芝 液晶表示装置
US5738948A (en) * 1994-09-29 1998-04-14 Kabushiki Kaisha Toshiba Electrode-wiring material and electrode-wiring substrate using the same
JP3072714B2 (ja) * 1995-09-04 2000-08-07 株式会社デンソー 減速機構付スタータ
US5835177A (en) * 1995-10-05 1998-11-10 Kabushiki Kaisha Toshiba Array substrate with bus lines takeout/terminal sections having multiple conductive layers

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI831456B (zh) * 2021-11-09 2024-02-01 南韓商三星電子股份有限公司 積體電路裝置

Also Published As

Publication number Publication date
US7153589B1 (en) 2006-12-26
EP0735152A4 (en) 1997-02-26
ATE216436T1 (de) 2002-05-15
KR100210525B1 (ko) 1999-07-15
EP0947593A3 (en) 1999-12-15
JP3445276B2 (ja) 2003-09-08
KR960706570A (ko) 1996-12-09
US5913100A (en) 1999-06-15
EP0735152B1 (en) 2002-04-17
DE69430439T2 (de) 2003-02-06
US6200694B1 (en) 2001-03-13
WO1995016797A1 (en) 1995-06-22
DE69430439D1 (de) 2002-05-23
EP0735152A1 (en) 1996-10-02
EP0947593A2 (en) 1999-10-06

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