TW343282B - Testing device for a semiconductor device - Google Patents

Testing device for a semiconductor device

Info

Publication number
TW343282B
TW343282B TW086108119A TW86108119A TW343282B TW 343282 B TW343282 B TW 343282B TW 086108119 A TW086108119 A TW 086108119A TW 86108119 A TW86108119 A TW 86108119A TW 343282 B TW343282 B TW 343282B
Authority
TW
Taiwan
Prior art keywords
strobe
semiconductor device
signal
logic comparator
testing
Prior art date
Application number
TW086108119A
Other languages
English (en)
Inventor
Takeo Miura
Original Assignee
Adoban Tesuto Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adoban Tesuto Kk filed Critical Adoban Tesuto Kk
Application granted granted Critical
Publication of TW343282B publication Critical patent/TW343282B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G01R31/31726—Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
TW086108119A 1996-06-14 1997-06-12 Testing device for a semiconductor device TW343282B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15377996 1996-06-14

Publications (1)

Publication Number Publication Date
TW343282B true TW343282B (en) 1998-10-21

Family

ID=15569962

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086108119A TW343282B (en) 1996-06-14 1997-06-12 Testing device for a semiconductor device

Country Status (3)

Country Link
US (1) US6016565A (zh)
KR (1) KR100295702B1 (zh)
TW (1) TW343282B (zh)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6178532B1 (en) * 1998-06-11 2001-01-23 Micron Technology, Inc. On-chip circuit and method for testing memory devices
TWI238256B (en) 2000-01-18 2005-08-21 Advantest Corp Testing method for semiconductor device and its equipment
JP4782271B2 (ja) * 2000-07-06 2011-09-28 株式会社アドバンテスト 半導体デバイス試験方法・半導体デバイス試験装置
US6859902B1 (en) * 2000-10-02 2005-02-22 Credence Systems Corporation Method and apparatus for high speed IC test interface
JP2002196054A (ja) * 2000-12-27 2002-07-10 Ando Electric Co Ltd Ｉｃ測定装置
WO2002103379A1 (fr) * 2001-06-13 2002-12-27 Advantest Corporation Instrument destine a tester des dispositifs semi-conducteurs et procede destine a tester des dispositifs semi-conducteurs
JP4041801B2 (ja) * 2001-11-09 2008-02-06 株式会社アドバンテスト 半導体デバイス試験装置
DE112005000311B4 (de) * 2004-02-05 2011-04-07 Advantest Corp. Messgerät, Messverfahren und Testgerät
JP4451189B2 (ja) * 2004-04-05 2010-04-14 株式会社アドバンテスト 試験装置、位相調整方法、及びメモリコントローラ
KR100639678B1 (ko) 2004-11-16 2006-10-30 삼성전자주식회사 테스트 장치
JP4354452B2 (ja) * 2005-11-18 2009-10-28 シャープ株式会社 半導体集積回路及びその検査方法
US8139697B2 (en) * 2008-01-29 2012-03-20 United Microelectronics Corp. Sampling method and data recovery circuit using the same
KR102278648B1 (ko) * 2020-02-13 2021-07-16 포스필 주식회사 피시험 디바이스를 테스트하기 위한 방법 및 장치

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2813237B2 (ja) * 1990-06-08 1998-10-22 株式会社アドバンテスト Ｉｃ試験用クロック遅延時間の設定方法
JP2937440B2 (ja) * 1990-08-21 1999-08-23 株式会社東芝 集積回路検査装置
JPH0785101B2 (ja) * 1991-03-20 1995-09-13 株式会社東芝 論理信号検査方法及び検査装置
US5579251A (en) * 1992-03-31 1996-11-26 Advantest Corporation IC tester
JP2577120Y2 (ja) * 1993-04-15 1998-07-23 株式会社アドバンテスト 過剰パルス印加の禁止回路
US5646948A (en) * 1993-09-03 1997-07-08 Advantest Corporation Apparatus for concurrently testing a plurality of semiconductor memories in parallel
JPH0778499A (ja) * 1993-09-10 1995-03-20 Advantest Corp フラッシュメモリ試験装置
JP3591657B2 (ja) * 1993-10-13 2004-11-24 株式会社アドバンテスト 半導体ｉｃ試験装置
JP3607325B2 (ja) * 1994-09-22 2005-01-05 株式会社アドバンテスト 半導体試験装置用比較回路
US5732047A (en) * 1995-12-12 1998-03-24 Advantest Corporation Timing comparator circuit for use in device testing apparatus

Also Published As

Publication number Publication date
KR100295702B1 (ko) 2001-08-07
KR980003624A (ko) 1998-03-30
US6016565A (en) 2000-01-18

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