TW342545B - Semiconductor laser element and method for designing same - Google Patents
Semiconductor laser element and method for designing sameInfo
- Publication number
- TW342545B TW342545B TW086103662A TW86103662A TW342545B TW 342545 B TW342545 B TW 342545B TW 086103662 A TW086103662 A TW 086103662A TW 86103662 A TW86103662 A TW 86103662A TW 342545 B TW342545 B TW 342545B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- claded
- conductive type
- opening portion
- refractive index
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/223—Buried stripe structure
- H01S5/2231—Buried stripe structure with inner confining structure only between the active layer and the upper electrode
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
- G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
- G11B7/1372—Lenses
- G11B7/1378—Separate aberration correction lenses; Cylindrical lenses to generate astigmatism; Beam expanders
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/223—Buried stripe structure
- H01S5/2232—Buried stripe structure with inner confining structure between the active layer and the lower electrode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/204—Strongly index guided structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2206—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on III-V materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2206—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on III-V materials
- H01S5/221—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on III-V materials containing aluminium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2218—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special optical properties
- H01S5/222—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special optical properties having a refractive index lower than that of the cladding layers or outer guiding layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32316—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm comprising only (Al)GaAs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34313—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs
- H01S5/3432—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs the whole junction comprising only (AI)GaAs
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Geometry (AREA)
- Nanotechnology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7473796 | 1996-03-28 | ||
JP25964896 | 1996-09-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW342545B true TW342545B (en) | 1998-10-11 |
Family
ID=26415922
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086103662A TW342545B (en) | 1996-03-28 | 1997-03-24 | Semiconductor laser element and method for designing same |
Country Status (6)
Country | Link |
---|---|
US (1) | US5960019A (zh) |
EP (1) | EP0798832B1 (zh) |
KR (1) | KR100468170B1 (zh) |
CN (2) | CN1096729C (zh) |
DE (1) | DE69727608T2 (zh) |
TW (1) | TW342545B (zh) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6075802A (en) * | 1998-03-12 | 2000-06-13 | Telefonaktiebolaget L, Ericsson | Lateral confinement laser |
US7072373B2 (en) * | 1998-11-30 | 2006-07-04 | The Furukawa Electric Co., Ltd. | Ridge waveguide semiconductor laser diode |
EP1069659A4 (en) | 1999-02-03 | 2003-03-05 | Furukawa Electric Co Ltd | SEMICONDUCTOR LASERS AND SEMICONDUCTOR LASER MODULES USING THEM |
US6810063B1 (en) * | 1999-06-09 | 2004-10-26 | The Furukawa Electric Co., Ltd. | Semiconductor laser device |
DE60031819T2 (de) * | 1999-09-27 | 2007-09-13 | Sanyo Electric Co., Ltd., Moriguchi | Halbleiterlaservorrichtung und Herstellungsverfahren |
DE60033369T2 (de) | 1999-12-28 | 2007-11-29 | Sanyo Electric Co., Ltd., Moriguchi | Halbleiterlaservorrichtung |
US6614822B2 (en) | 2000-02-03 | 2003-09-02 | The Furukawa Electric Co., Ltd. | Semiconductor laser devices, and semiconductor laser modules and optical communication systems using the same |
US6870871B2 (en) | 2000-02-03 | 2005-03-22 | The Furukawa Electric Co., Ltd. | Semiconductor laser devices, and semiconductor laser modules and optical communication systems using the same |
US6432735B1 (en) * | 2000-06-23 | 2002-08-13 | Agere Systems Guardian Corp. | High power single mode laser and method of fabrication |
JP2002111135A (ja) | 2000-10-02 | 2002-04-12 | Furukawa Electric Co Ltd:The | 半導体レーザ素子、それを用いた光ファイバ増幅器用励起光源 |
JP2002134827A (ja) * | 2000-10-27 | 2002-05-10 | Tdk Corp | 半導体レーザ及びその製造方法並びにこれを用いた近接場光ヘッド |
US6517296B2 (en) * | 2001-06-21 | 2003-02-11 | Vernon Devices, Inc. | Hole finishing tool |
US6977953B2 (en) * | 2001-07-27 | 2005-12-20 | Sanyo Electric Co., Ltd. | Nitride-based semiconductor light-emitting device and method of fabricating the same |
JP4105857B2 (ja) * | 2001-08-13 | 2008-06-25 | ローム株式会社 | 半導体レーザ素子 |
JP2003273467A (ja) * | 2002-03-15 | 2003-09-26 | Toshiba Corp | 半導体レーザおよびその製造方法 |
JP2003347677A (ja) * | 2002-05-29 | 2003-12-05 | Sony Corp | 半導体レーザ素子 |
JP2004119817A (ja) * | 2002-09-27 | 2004-04-15 | Sharp Corp | 半導体レーザ素子およびその製造方法 |
KR100495220B1 (ko) | 2003-06-25 | 2005-06-14 | 삼성전기주식회사 | 고차모드 흡수층을 갖는 반도체 레이저 다이오드 |
ZA200603349B (en) * | 2003-11-17 | 2008-09-25 | Vesuvius Crucible Co | Multi-outlet casting nozzle |
JP2005217255A (ja) * | 2004-01-30 | 2005-08-11 | Sharp Corp | 半導体レーザおよびその製造方法 |
JP2006059316A (ja) * | 2004-07-21 | 2006-03-02 | Hitachi Kiden Kogyo Ltd | 搬送装置の設計支援システム |
JP2009152330A (ja) * | 2007-12-20 | 2009-07-09 | Panasonic Corp | 半導体装置、半導体装置の製造方法、半導体装置の製造装置および光ピックアップ装置ならびに光ディスクドライブ装置 |
DE102017122032A1 (de) * | 2017-09-22 | 2019-03-28 | Osram Opto Semiconductors Gmbh | Laserdiode |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0644661B2 (ja) * | 1985-08-23 | 1994-06-08 | 株式会社東芝 | 半導体レ−ザ装置 |
JPS6273687A (ja) * | 1985-09-26 | 1987-04-04 | Mitsubishi Electric Corp | 半導体レ−ザ装置 |
US4893313A (en) * | 1988-03-14 | 1990-01-09 | Kabushiki Kaisha Toshiba | Semiconductor laser device which has a double-hetero structure having an optimal layer thickness |
US4961197A (en) * | 1988-09-07 | 1990-10-02 | Hitachi, Ltd. | Semiconductor laser device |
US5065404A (en) * | 1989-07-12 | 1991-11-12 | Kabushiki Kaisha Toshiba | Transverse-mode oscillation semiconductor laser device |
US5386429A (en) * | 1992-03-31 | 1995-01-31 | Matsushita Electric Industrial Co., Ltd. | Low operating current and low noise semiconductor laser device for optical disk memories |
US5383214A (en) * | 1992-07-16 | 1995-01-17 | Matsushita Electric Industrial Co., Ltd. | Semiconductor laser and a method for producing the same |
US5416790A (en) * | 1992-11-06 | 1995-05-16 | Sanyo Electric Co., Ltd. | Semiconductor laser with a self-sustained pulsation |
JPH06196820A (ja) * | 1992-12-24 | 1994-07-15 | Matsushita Electric Ind Co Ltd | 半導体レーザおよびその製造方法 |
JPH08148752A (ja) * | 1994-11-22 | 1996-06-07 | Mitsubishi Electric Corp | 半導体レーザ装置の製造方法、及び半導体レーザ装置 |
-
1997
- 1997-03-24 TW TW086103662A patent/TW342545B/zh not_active IP Right Cessation
- 1997-03-26 DE DE69727608T patent/DE69727608T2/de not_active Expired - Lifetime
- 1997-03-26 EP EP97302080A patent/EP0798832B1/en not_active Expired - Lifetime
- 1997-03-27 KR KR1019970010911A patent/KR100468170B1/ko not_active IP Right Cessation
- 1997-03-27 US US08/828,034 patent/US5960019A/en not_active Expired - Lifetime
- 1997-03-28 CN CN97109946A patent/CN1096729C/zh not_active Expired - Lifetime
-
2002
- 2002-07-05 CN CNB021406162A patent/CN1255913C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1427516A (zh) | 2003-07-02 |
CN1255913C (zh) | 2006-05-10 |
EP0798832A3 (en) | 1999-05-26 |
KR100468170B1 (ko) | 2005-06-23 |
DE69727608D1 (de) | 2004-03-25 |
EP0798832A2 (en) | 1997-10-01 |
KR970068066A (ko) | 1997-10-13 |
CN1169047A (zh) | 1997-12-31 |
CN1096729C (zh) | 2002-12-18 |
EP0798832B1 (en) | 2004-02-18 |
DE69727608T2 (de) | 2004-09-23 |
US5960019A (en) | 1999-09-28 |
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Legal Events
Date | Code | Title | Description |
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MM4A | Annulment or lapse of patent due to non-payment of fees |