TW312763B - - Google Patents

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Publication number
TW312763B
TW312763B TW085102428A TW85102428A TW312763B TW 312763 B TW312763 B TW 312763B TW 085102428 A TW085102428 A TW 085102428A TW 85102428 A TW85102428 A TW 85102428A TW 312763 B TW312763 B TW 312763B
Authority
TW
Taiwan
Prior art keywords
row
column
clock signal
memory
selection device
Prior art date
Application number
TW085102428A
Other languages
English (en)
Chinese (zh)
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of TW312763B publication Critical patent/TW312763B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/86—Masking faults in memories by using spares or by reconfiguring in serial access memories, e.g. shift registers, CCDs, bubble memories
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Detection And Correction Of Errors (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
  • Dram (AREA)
TW085102428A 1995-04-05 1996-02-29 TW312763B (show.php)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19512791 1995-04-05

Publications (1)

Publication Number Publication Date
TW312763B true TW312763B (show.php) 1997-08-11

Family

ID=7758876

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085102428A TW312763B (show.php) 1995-04-05 1996-02-29

Country Status (7)

Country Link
US (1) US5751742A (show.php)
EP (1) EP0738974B1 (show.php)
JP (1) JP3850484B2 (show.php)
KR (1) KR100409113B1 (show.php)
AT (1) ATE217987T1 (show.php)
DE (1) DE59609221D1 (show.php)
TW (1) TW312763B (show.php)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE59603505D1 (de) * 1995-09-13 1999-12-02 Siemens Ag Einrichtung zum sprungweisen adressieren bestimmter leitungen eines seriell arbeitenden digitalen speichers
TW399219B (en) * 1997-09-26 2000-07-21 Siemens Ag Pointer-circuit with small space requirement, higher speed and smaller power loss
KR20060019553A (ko) * 2003-05-22 2006-03-03 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 전자 회로 테스트 방법 및 장치

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3812336A (en) * 1972-12-18 1974-05-21 Ibm Dynamic address translation scheme using orthogonal squares
JPS58139399A (ja) * 1982-02-15 1983-08-18 Hitachi Ltd 半導体記憶装置
EP0189699B1 (en) * 1984-12-26 1992-09-30 STMicroelectronics, Inc. Interdigitated bit line rom
KR910009588B1 (ko) * 1987-05-06 1991-11-21 니뽄 덴끼 가부시끼가이샤 직렬 어드레싱 회로를 갖는 직렬 억세스 메모리 회로
JP2816512B2 (ja) * 1992-07-27 1998-10-27 三菱電機株式会社 半導体記憶装置

Also Published As

Publication number Publication date
ATE217987T1 (de) 2002-06-15
EP0738974A2 (de) 1996-10-23
JPH08287699A (ja) 1996-11-01
JP3850484B2 (ja) 2006-11-29
EP0738974A3 (de) 1999-06-02
KR960038976A (ko) 1996-11-21
DE59609221D1 (de) 2002-06-27
US5751742A (en) 1998-05-12
KR100409113B1 (ko) 2004-03-18
EP0738974B1 (de) 2002-05-22

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