TW202012940A - Conductive sheet for electrical test - Google Patents
Conductive sheet for electrical test Download PDFInfo
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- TW202012940A TW202012940A TW108126225A TW108126225A TW202012940A TW 202012940 A TW202012940 A TW 202012940A TW 108126225 A TW108126225 A TW 108126225A TW 108126225 A TW108126225 A TW 108126225A TW 202012940 A TW202012940 A TW 202012940A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Abstract
Description
本發明係關於一種用於檢查被檢查器件之導電薄片。The present invention relates to a conductive sheet for inspecting a device under inspection.
為了檢查被檢查器件,將被檢查器件與檢查裝置電性連接之連接器配置於被檢查器件與檢查裝置之間。連接器將檢查裝置之電性測試信號傳輸至被檢查器件,將被檢查器件之響應信號傳輸至檢查裝置。作為此種連接器,正在使用彈簧針測試插座(pogo pin test socket)與導電性橡膠薄片(conductive rubber socket)。In order to inspect the device under inspection, a connector electrically connected between the device under inspection and the inspection device is disposed between the device under inspection and the inspection device. The connector transmits the electrical test signal of the inspection device to the device under inspection, and transmits the response signal of the device under inspection to the inspection device. As such connectors, pogo pin test sockets and conductive rubber sockets are being used.
彈簧針測試插座具有響應施加於被檢查器件之外力而沿垂直方向按壓之彈簧針。彈簧針測試插座必需收容彈簧針之零件,因此難以具有較薄之厚度,難以適用於被檢查器件之端子之微小間距。The pogo pin test socket has a pogo pin pressed in a vertical direction in response to an external force applied to the device under inspection. The pogo pin test socket must contain pogo pin parts, so it is difficult to have a thin thickness and it is difficult to apply to the fine pitch of the terminals of the device under inspection.
導電性橡膠薄片可響應施加於被檢查器件之外力而彈性變形。與彈簧針測試插座相比,導電性橡膠薄片於能夠以較少之製造費用製造、不使被檢查器件之端子受損且具有非常薄之厚度的方面有利。因此,正於被檢查器件之檢查領域內進行由導電性橡膠薄片代替彈簧針測試插座之各種嘗試。The conductive rubber sheet can elastically deform in response to a force applied to the device under inspection. Compared with the pogo pin test socket, the conductive rubber sheet is advantageous in that it can be manufactured with less manufacturing cost, does not damage the terminal of the device under inspection, and has a very thin thickness. Therefore, various attempts are being made to replace the spring pin test sockets with conductive rubber sheets in the inspection field of the device under inspection.
彈簧針測試插座具有厚於導電性橡膠薄片之厚度。因此,無法藉由將一個彈簧針測試插座更換為一個導電性橡膠薄片之方式以導電性橡膠薄片來代替彈簧針測試插座。為了實現代替,需進行再設計以使將彈簧針測試插座附著至檢查裝置之零件適於導電性橡膠薄片。亦可考慮厚度為彈簧針測試插座之厚度之導電性橡膠薄片。然而,導電性橡膠薄片之厚度越厚,則導電性橡膠薄片之電阻越增加且導電性能越低,因此導電性橡膠薄片難以製成規定厚度以上。The pogo pin test socket is thicker than the conductive rubber sheet. Therefore, it is impossible to replace the pogo pin test socket with a conductive rubber sheet by replacing a pogo pin test socket with a conductive rubber sheet. In order to achieve the replacement, a redesign is needed to make the part that attaches the pogo pin test socket to the inspection device suitable for the conductive rubber sheet. A conductive rubber sheet with a thickness equal to the thickness of the spring pin test socket can also be considered. However, as the thickness of the conductive rubber sheet is thicker, the electrical resistance of the conductive rubber sheet increases and the conductivity becomes lower. Therefore, it is difficult to make the conductive rubber sheet more than a predetermined thickness.
關於以導電性橡膠薄片代替彈簧針測試插座,於韓國公開專利公報第10-2006-0123910號中提出於一個導電性橡膠薄片之下方配置與其相似之導電薄片。然而,簡單地上下配置兩個導電薄片係無法解決如導電性能下降、上下配置之構件之相對位置變更之不利影響。Regarding the replacement of the spring pin test socket with a conductive rubber sheet, it is proposed in Korean Patent Publication No. 10-2006-0123910 to arrange a conductive sheet similar to it under one conductive rubber sheet. However, simply arranging two conductive sheets up and down cannot solve the adverse effects such as a decrease in conductivity and a change in the relative position of the components arranged up and down.
[發明所欲解決之問題][Problems to be solved by the invention]
本發明之一實施例提供一種具有增加之厚度之積層型導電薄片。本發明之一實施例提供一種於垂直方向上對準彈性導電部之積層型導電薄片。本發明之一實施例提供一種對準之彈性導電部之位置不會變更的積層型導電薄片。 [解決問題之技術手段]An embodiment of the present invention provides a laminated conductive sheet having an increased thickness. An embodiment of the present invention provides a laminated conductive sheet that is aligned with an elastic conductive portion in a vertical direction. An embodiment of the present invention provides a laminated conductive sheet in which the position of the aligned elastic conductive portion does not change. [Technical means to solve the problem]
本發明之實施例係關於一種配置於檢查裝置與被檢查器件之間而用於檢查被檢查器件之導電薄片。於導電薄片之一實施例中,導電薄片包括沿垂直方向積層之第1薄片與第2薄片。An embodiment of the present invention relates to a conductive sheet disposed between an inspection device and an inspected device and used to inspect the inspected device. In one embodiment of the conductive sheet, the conductive sheet includes a first sheet and a second sheet stacked in the vertical direction.
於一實施例中,第1薄片包括垂直方向之複數個第1彈性導電部、及使複數個第1彈性導電部於水平方向上隔開且絕緣之第1彈性絕緣部。至少一個第1彈性導電部具有相對於第1彈性絕緣部沿垂直方向突出之突出部。第2薄片包括垂直方向之複數個第2彈性導電部、及使複數個第2彈性導電部於水平方向上隔開且絕緣之第2彈性絕緣部。至少一個第2彈性導電部具有相對於第2彈性絕緣部沿垂直方向凹陷之凹陷部,以便第1彈性導電部之突出部於垂直方向上嵌合於至少一個第2彈性導電部。In one embodiment, the first sheet includes a plurality of first elastic conductive portions in the vertical direction, and a first elastic insulating portion that isolates and insulates the plurality of first elastic conductive portions in the horizontal direction. At least one first elastic conductive portion has a protruding portion that protrudes in a vertical direction relative to the first elastic insulating portion. The second sheet includes a plurality of second elastic conductive portions in the vertical direction, and a second elastic insulating portion that isolates and insulates the plurality of second elastic conductive portions in the horizontal direction. At least one second elastic conductive portion has a recessed portion that is recessed in the vertical direction relative to the second elastic insulating portion, so that the protruding portion of the first elastic conductive portion is fitted into the at least one second elastic conductive portion in the vertical direction.
於一實施例中,第1彈性絕緣部具有沿水平方向延伸之第1水平面,第2彈性絕緣部具有沿水平方向延伸且與第1水平面對向之第2水平面。突出部相對於第1水平面突出,凹陷部相對於第2水平面凹陷,第1水平面與第2水平面彼此接合。In one embodiment, the first elastic insulating portion has a first horizontal plane extending in the horizontal direction, and the second elastic insulating portion has a second horizontal plane extending in the horizontal direction and facing the first horizontal surface. The protruding portion protrudes with respect to the first horizontal plane, the recessed portion is recessed with respect to the second horizontal plane, and the first horizontal plane and the second horizontal plane are joined to each other.
於一實施例中,導電薄片更包括第3薄片,上述第3薄片包括垂直方向之複數個第3彈性導電部、及使複數個第3彈性導電部於水平方向上隔開且絕緣之第3彈性絕緣部,且配置於第1薄片與第2薄片之間。至少一個第3彈性導電部於沿垂直方向對向之一端及另一端中之一者具有嵌合第1薄片之突出部的凹陷部,且於一端及另一端中之另一者具有嵌合至第2薄片之凹陷部之突出部。In one embodiment, the conductive sheet further includes a third sheet, the third sheet includes a plurality of third elastic conductive portions in the vertical direction, and a third insulating third plurality of elastic conductive portions that are horizontally separated and insulated The elastic insulating portion is arranged between the first sheet and the second sheet. At least one third elastic conductive portion has a recessed portion that fits the protrusion of the first sheet at one of the one end and the other end facing in the vertical direction, and the other one of the one end and the other end has a The protruding part of the concave part of the second sheet.
於一實施例中,第3彈性絕緣部具有沿垂直方向隔開之一對第3水平面。至少一個第3彈性導電部之凹陷部位於一對第3水平面中之一者,至少一個第3彈性導電部之突出部位於一對第3水平面中之另一者。第1水平面與一對第3水平面中之一者接合,第2水平面與一對第3水平面中之另一者接合。In one embodiment, the third elastic insulating portion has a pair of third horizontal planes spaced apart in the vertical direction. The concave portion of at least one third elastic conductive portion is located in one of the pair of third horizontal planes, and the protruding portion of at least one third elastic conductive portion is located in the other of the pair of third horizontal planes. The first level is joined to one of the pair of third levels, and the second level is joined to the other of the pair of third levels.
於一實施例中,突出部具有相對於突出部之中心軸傾斜之傾斜部,凹陷部具有相對於凹陷部之中心軸傾斜且與突出部之傾斜部接觸之傾斜部。In one embodiment, the protruding portion has an inclined portion inclined with respect to the central axis of the protruding portion, and the recessed portion has an inclined portion that is inclined with respect to the central axis of the recessed portion and is in contact with the inclined portion of the protruding portion.
於一實施例中,複數個第1彈性導電部具有突出部,複數個第2彈性導電部具有凹陷部。In one embodiment, the plurality of first elastic conductive parts have protrusions, and the plurality of second elastic conductive parts have depressions.
於一實施例中,凹陷部具有突出部之高度之10%至100%之深度。In one embodiment, the concave portion has a depth of 10% to 100% of the height of the protrusion.
於一實施例中,第1彈性絕緣部具有與至少一個第1彈性導電部之突出部鄰接之突出部,第2彈性絕緣部具有與至少一個第2彈性導電部之凹陷部鄰接且嵌合第1彈性絕緣部之突出部之凹陷部。In one embodiment, the first elastic insulating portion has a protruding portion adjacent to at least one protruding portion of the first elastic conductive portion, and the second elastic insulating portion has a protruding portion adjacent to and recessed by at least one second elastic conductive portion 1 The concave part of the protruding part of the elastic insulating part.
於導電薄片之又一實施例中,第1薄片之第1彈性絕緣部具有相對於複數個第1彈性導電部沿垂直方向突出之至少一個突出部。第2薄片之第2彈性絕緣部具有相對於複數個第2彈性導電部沿垂直方向凹陷且供第1彈性絕緣部之突出部沿垂直方向嵌合之至少一個凹陷部。In yet another embodiment of the conductive sheet, the first elastic insulating portion of the first sheet has at least one protruding portion that protrudes in the vertical direction relative to the plurality of first elastic conductive portions. The second elastic insulating portion of the second sheet has at least one recessed portion which is recessed in the vertical direction with respect to the plurality of second elastic conductive portions and in which the protruding portion of the first elastic insulating portion is fitted in the vertical direction.
於一實施例中,第1彈性絕緣部具有沿水平方向延伸之第1水平面,第2彈性絕緣部具有沿水平方向延伸且與第1水平面對向之第2水平面。突出部自第1水平面突出,凹陷部自第2水平面凹陷,第1水平面與第2水平面彼此接合。In one embodiment, the first elastic insulating portion has a first horizontal plane extending in the horizontal direction, and the second elastic insulating portion has a second horizontal plane extending in the horizontal direction and facing the first horizontal surface. The protruding portion protrudes from the first horizontal surface, the recessed portion is recessed from the second horizontal surface, and the first and second horizontal surfaces are joined to each other.
於一實施例中,第3薄片之第3彈性絕緣部於沿垂直方向對向之一端及另一端中之一者具有嵌合第1薄片的突出部之至少一個凹陷部,且於一端及另一端中之另一者具有嵌合至第2薄片之凹陷部之至少一個突出部。In one embodiment, the third elastic insulating portion of the third sheet has at least one recessed portion that fits into the protrusion of the first sheet at one of the one end and the other end facing in the vertical direction, and at one end and the other The other of the one ends has at least one protruding portion fitted into the concave portion of the second sheet.
於一實施例中,第1彈性絕緣部之突出部之水平方向之橫截面形狀可呈圓形、橢圓形、長橢圓形、四邊形中的任一者。第2彈性絕緣部之凹陷部可具有與突出部之橫截面形狀互補之橫截面形狀。In one embodiment, the horizontal cross-sectional shape of the protruding portion of the first elastic insulating portion may be any of a circle, an ellipse, an oval, and a quadrangle. The concave portion of the second elastic insulating portion may have a cross-sectional shape complementary to the cross-sectional shape of the protruding portion.
於一實施例中,突出部具有陷部之深度之90%至100%之高度。In one embodiment, the protrusion has a height of 90% to 100% of the depth of the recess.
於一實施例中,至少一個第1彈性導電部具有與第1彈性絕緣部之突出部鄰接之突出部,至少一個第2彈性導電部具有與第2彈性絕緣部之凹陷部鄰接且嵌合至少一個第1彈性導電部之突出部之凹陷部。In one embodiment, at least one first elastic conductive portion has a protruding portion adjacent to the protruding portion of the first elastic insulating portion, and at least one second elastic conductive portion has a recessed portion adjacent to the second elastic insulating portion and fits at least A recessed portion of the protruding portion of the first elastic conductive portion.
於一實施例中,第1彈性導電部及第2彈性導電部包括沿垂直方向排列之多個導電性粒子。In one embodiment, the first elastic conductive portion and the second elastic conductive portion include a plurality of conductive particles arranged in a vertical direction.
於一實施例中,第1彈性絕緣部及第2彈性絕緣部包括聚矽氧橡膠材料。In one embodiment, the first elastic insulating portion and the second elastic insulating portion include silicone rubber material.
於一實施例中,可藉由接著劑接合第1薄片之第1水平面與第2薄片之第2水平面。 [發明之效果]In one embodiment, the first horizontal plane of the first sheet and the second horizontal plane of the second sheet can be joined by an adhesive. [Effect of invention]
根據本發明之一實施例,可提供一種具有增加之厚度之積層型導電薄片。根據本發明之一實施例,對準元件間之匹配使彈性導電部沿垂直方向對準,因此可提供一種於構造上容易地進行彈性導電部間之對準之積層型導電薄片。又,因藉由匹配之對準元件對準之彈性導電部而可不增加積層型導電薄片之電阻,不降低積層型導電薄片之導電性,且穩定地保持積層型導電薄片之積層構造。根據本發明之一實施例,所匹配之對準元件防止彈性導電部發生位置變更,因此可提供一種可長期以高可靠性保持導電性之積層型導電薄片。According to an embodiment of the present invention, a laminated conductive sheet having an increased thickness can be provided. According to an embodiment of the present invention, the matching between the alignment elements aligns the elastic conductive portions in the vertical direction, and thus it is possible to provide a laminated conductive sheet that can easily align the elastic conductive portions in structure. In addition, the elastic conductive portions aligned by the matching alignment elements do not increase the resistance of the laminated conductive sheet, do not reduce the conductivity of the laminated conductive sheet, and stably maintain the laminated structure of the laminated conductive sheet. According to an embodiment of the present invention, the matching alignment element prevents the position of the elastic conductive portion from being changed, and thus a laminated conductive sheet that can maintain conductivity with high reliability for a long period of time can be provided.
本發明之實施例係以說明本發明之技術思想為目的而例示。本發明之權利範圍並不限定於以下提出之實施例或該等實施例之具體說明。The embodiments of the present invention are exemplified for the purpose of explaining the technical idea of the present invention. The scope of rights of the present invention is not limited to the embodiments presented below or the specific descriptions of these embodiments.
只要無其他定義,則本發明中使用之所有技術用語及科學用語具有於本發明所屬之技術領域內具有常識者通常理解之含義。本發明中使用之所有用語係以更明確地說明本發明為目的而選擇者,並非係為了限制本發明之權利範圍而選擇者。As long as there is no other definition, all technical and scientific terms used in the present invention have the meanings generally understood by those of ordinary knowledge in the technical field to which the present invention belongs. All terms used in the present invention are selected for the purpose of more clearly explaining the present invention, and are not selected to limit the scope of rights of the present invention.
本發明中使用之如“包括”、“具備”、“具有”等之表達係只要未於包括相應之表達的語句或句子中提及其他含義,則應理解為具有包括其他實施例之可能性之開放型用語(open-ended terms)。Expressions such as "include", "have", "have", etc. used in the present invention are understood as having the possibility of including other embodiments as long as other meanings are not mentioned in the sentence or sentence including the corresponding expression Open-ended terms.
只要未提及其他含義,則本發明中所記述之單數型表達可包括複數型含義,此種情形亦相同地適用於發明申請專利範圍中所記載之單數型表達。As long as other meanings are not mentioned, the singular expressions described in the present invention may include plural meanings, and this case also applies to the singular expressions described in the patent application scope of the invention.
本發明中使用之“第1”、“第2”等表達用於相互區分複數個構成要素,並非限定相應構成要素之順序或重要度。Expressions such as "first" and "second" used in the present invention are used to distinguish a plurality of constituent elements from each other, and do not limit the order or importance of the corresponding constituent elements.
於本發明中,於記載為某個構成要素“連接”或“連結”於另一構成要素之情形時,應理解為上述某個構成要素可直接連接或連結於上述另一構成要素,或者能夠以嶄新之又一構成要素為媒介而連接或連結。In the present invention, when it is described that a certain constituent element is “connected” or “connected” to another constituent element, it should be understood that one of the above constituent elements may be directly connected or connected to the other constituent element, or may Connected or connected with a brand-new yet another constituent element.
本發明中使用之“上方”之方向指示語係基於導電薄片相對於檢查裝置而定位之方向,“下方”之方向指示語係指上方之相反方向。本發明中使用之“垂直方向”之方向指示語包括上方方向與下方方向,但應理解為並非係指上方方向與下方方向中之特定之一方向。The "upper" direction indicator used in the present invention is based on the direction in which the conductive sheet is positioned relative to the inspection device, and the "lower" direction indicator refers to the opposite direction from above. The direction indicator of “vertical direction” used in the present invention includes an upward direction and a downward direction, but it should be understood that it does not refer to a specific one of the upward direction and the downward direction.
以下,參照隨附圖式,對實施例進行說明。於隨附圖式中,對相同或對應之構成要素賦予相同之參照符號。又,於以下之實施例之說明中,可省略重複記述相同或對應之構成要素。然而,即便省略關於構成要素之記述,亦不意味著此種構成要素不包括於某個實施例。Hereinafter, the embodiments will be described with reference to the accompanying drawings. In the accompanying drawings, the same or corresponding constituent elements are given the same reference symbols. In addition, in the description of the following embodiments, repeated description of the same or corresponding constituent elements may be omitted. However, even if the description of the constituent elements is omitted, it does not mean that such constituent elements are not included in a certain embodiment.
以下說明之實施例與隨附圖式所示之示例係關於一種用於檢查被檢查器件之導電薄片。實施例之導電薄片可於被檢查器件之製造步驟中之後續步驟中用於最終檢查被檢查器件。然而,應用實施例之導電薄片之檢查之示例並不限定於上述示例。The embodiment described below and the example shown in the accompanying drawings relate to a conductive sheet for inspecting a device under inspection. The conductive sheet of the embodiment can be used for final inspection of the device under inspection in a subsequent step in the manufacturing step of the device under inspection. However, the example of inspection of the conductive sheet of the application embodiment is not limited to the above example.
圖1係表示本發明之第1實施例之導電薄片。參照圖1,一實施例之導電薄片(conductive sheet)1000配置於檢查裝置10與被檢查器件20之間而用於檢查被檢查器件20。Fig. 1 shows a conductive sheet according to a first embodiment of the present invention. Referring to FIG. 1, a
為了檢查被檢查器件20,收容被檢查器件20之插座30能夠以可去除之方式安裝於檢查裝置10。插座30將藉由測試把手之搬運裝置搬運於檢查裝置10之被檢查器件20收容於內部而使被檢查器件20定位於檢查裝置10。導電薄片1000能夠以可更換之方式結合於插座30。In order to inspect the device under
作為一例,被檢查器件20可為半導體封裝體,但並不限定於此。半導體封裝體係使用樹脂材料將半導體IC(Integrated Circuit,積體電路)晶片、多個引線框架(lead frame)與多個端子封裝為六面體形態之半導體器件。作為上述端子,可使用接腳、焊球(solder ball)等。圖1所示之半導體器件20包括焊球之端子。因此,半導體器件20於其下表面具有半球形之多個端子21。又,半導體器件之半導體IC晶片可為記憶體IC晶片或非記憶體IC晶片。As an example, the device under
檢查裝置10可檢查被檢查器件20之電特性、功能特性、動作速度等。檢查裝置10可於執行檢查之測試板中具有可施加電性測試信號且可接收響應信號之多個導電墊11。導電薄片1000可藉由插座30定位於檢查裝置10之導電墊11上而與導電墊11接觸。被檢查器件20之端子21藉由導電薄片1000與對應之導電墊11電性連接。即,導電薄片1000以可沿垂直方向VD導電之方式連接被檢查器件20之端子21與對應於端子21之導電墊11,藉此藉由檢查裝置10檢查被檢查器件20。The
一實施例之導電薄片1000包括沿垂直方向VD積層之第1薄片1100與第2薄片1200。導電薄片1000因積層之第1薄片1100與第2薄片1200而具有增加之厚度及增加之按壓量。若下方方向LD之外力施加於第1薄片1100與第2薄片1200,則第1薄片1100與第2薄片1200可向下方方向LD與水平方向HD彈性變形。可藉由測試把手之推頂裝置向檢查裝置10側按壓被檢查器件20而產生上述外力。藉由此種外力而被檢查器件20與導電薄片1000可沿垂直方向VD接觸,導電薄片1000與導電墊11可沿垂直方向VD接觸。若去除上述外力,則導電薄片1000可恢復成其原來之形狀。The
第1薄片1100與第2薄片1200具有相似之構成。第1薄片1100包括垂直方向VD之複數個第1彈性導電部1110、及使複數個第1彈性導電部1110於水平方向HD上隔開且使複數個第1彈性導電部1110彼此絕緣之第1彈性絕緣部1120。第2薄片1200包括垂直方向VD之複數個第2彈性導電部1210、及使複數個第2彈性導電部1210於水平方向HD上隔開且使複數個第2彈性導電部1210彼此絕緣之第2彈性絕緣部1220。於導電薄片1000中,第1彈性導電部1110與第2彈性導電部1210係沿垂直方向VD定位。又,第1彈性導電部1110與第2彈性導電部1210沿垂直方向VD對準且各自之端部以可導電之方式接觸。The
於圖1所示之示例中,第1彈性導電部1110係其上端與第2彈性導電部1210之下端(第2彈性導電部之一端)接觸,其下端與檢查裝置10之導電墊11接觸。第2彈性導電部1210係其上端與被檢查器件20之端子21接觸,其下端與第1彈性導電部1110之上端(第1彈性導電部之一端)接觸。因此,於導電薄片1000中,沿垂直方向VD對準且接觸之第1彈性導電部1110與第2彈性導電部1210於與其等對應之端子21與導電墊11之間形成垂直方向之導電路徑。第1彈性導電部1110之上端及下端可與第1彈性絕緣部1120之上表面及下表面形成同一平面或較其略微突出。第2彈性導電部1210之上端及下端可與第2彈性絕緣部1220之上表面及下表面形成同一平面或較其略微凹陷。In the example shown in FIG. 1, the upper end of the first elastic
於實施例之導電薄片中,為了固定第1薄片1100與第2薄片1200之水平方向HD上之位置且使第1彈性導電部1110與第2彈性導電部1210於垂直方向VD上對準,於第1薄片1100中提供至少一個對準元件,於第2薄片1200中提供具有與第1薄片1100之對準元件互補之形狀且可與第1薄片1100之對準元件相互匹配的另一對準元件。如上所述之一對對準元件可實現為突出部與凹陷部,可容許垂直方向VD上之嵌合。In the conductive sheet of the embodiment, in order to fix the position of the
於在水平方向HD上截取上述突出部之橫截面時,上述突出部之橫截面形狀可呈圓形,但並不限定於此。上述凹陷部可呈與上述突出部之橫截面形狀互補之橫截面形狀,以便上述突出部嵌合至上述凹陷部。When the cross-section of the protruding portion is taken in the horizontal direction HD, the cross-sectional shape of the protruding portion may be circular, but it is not limited thereto. The recessed portion may have a cross-sectional shape complementary to the cross-sectional shape of the projected portion, so that the projected portion fits into the recessed portion.
可由第1薄片1100之第1彈性導電部1110中之至少一者提供上述突出部,可由與上述第1彈性導電部對應之第2薄片1200之第2彈性導電部1210提供上述凹陷部。於該情形時,上述突出部與上述凹陷部可形成彈性導電部之垂直方向VD之端部。或者,可由第1薄片1100之第1彈性絕緣部1120提供上述突出部,可由第2薄片1200之第2彈性絕緣部1220提供上述凹陷部。於該情形時,上述突出部與上述凹陷部可自彈性絕緣部之表面突出或自彈性絕緣部之表面凹陷。或者,可由第1薄片1100之第1彈性導電部1100與第1彈性絕緣部1120提供上述突出部,可由第2薄片1200之第2彈性導電部1210與第2彈性絕緣部1220提供上述凹陷部。The protruding portion may be provided by at least one of the first elastic
參照圖1所示之導電薄片1000,第1彈性導電部1110具有形成垂直方向VD之上端部之突出部1112,第2彈性導電部1210具有形成垂直方向VD之下端部之凹陷部1212。突出部1112與凹陷部1212以突出部1112於垂直方向VD上嵌合於凹陷部1212之方式形成。因此,於第1薄片1100與第2薄片1200積層時,因突出部1112與凹陷部1212間於垂直方向VD上嵌合而第1彈性導電部1110與第2彈性導電部1210於垂直方向VD上對準且接觸。Referring to the
為了說明實施例而概略性地表示圖1所示之被檢查器件之形狀、檢查裝置之形狀、插座之形狀。圖1中之第1薄片1100與第2薄片1200之配置僅為例示。另一實施例之導電薄片可包括配置於第2薄片1200上之第1薄片1100。In order to explain the embodiment, the shape of the device to be inspected, the shape of the inspection device, and the shape of the socket shown in FIG. 1 are schematically shown. The arrangement of the
圖2a及圖2b係概略性地表示實施例之導電薄片所採用之第1薄片中之彈性導電部及彈性絕緣部的平面排列。第2薄片可具有與圖2a及圖2b所示之平面排列相同之平面排列。參照圖2a及圖2b,第1薄片1100包括第1彈性導電部1110與第1彈性絕緣部1120。第1彈性導電部1110於第1薄片1100中之平面排列可根據被檢查器件之端子之排列而實現各種排列。參照圖2a,於第1薄片1100中,第1彈性導電部1110可排列為一對矩陣形態。參照圖2b,於第1薄片1100中,第1彈性導電部1110可沿四邊形之各邊排列成複數行。2a and 2b are schematic diagrams showing the planar arrangement of elastic conductive portions and elastic insulating portions in the first sheet used in the conductive sheet of the embodiment. The second sheet may have the same plane arrangement as that shown in FIGS. 2a and 2b. 2a and 2b, the
參照圖3至圖15,詳細地對導電薄片之實施例進行說明。圖3至圖15所示之薄片之形狀、彈性導電部之形狀、對準元件之形狀及位置僅係為了說明實施例而選擇之示例。3 to 15, an embodiment of the conductive sheet will be described in detail. The shape of the sheet shown in FIGS. 3 to 15, the shape of the elastic conductive portion, and the shape and position of the alignment element are only examples selected for the purpose of explaining the embodiment.
為了對一實施例之導電薄片進行說明,參照圖3至圖5所示之示例。圖3係表示積層前之圖1所示之導電薄片,圖4係表示圖3所示之第1薄片,圖5係表示圖3所示之第2薄片。To explain the conductive sheet of an embodiment, refer to the examples shown in FIGS. 3 to 5. FIG. 3 shows the conductive sheet shown in FIG. 1 before lamination, FIG. 4 shows the first sheet shown in FIG. 3, and FIG. 5 shows the second sheet shown in FIG.
參照圖3,第1彈性導電部1110與第2彈性導電部1210可呈沿垂直方向VD延伸之圓柱形狀。於此種圓柱形狀中,中間部分之直徑可小於上端及下端之直徑。或者,為了防止積層之導電薄片1000之導電性下降,與被檢查器件之端子或檢查裝置接觸之端部之直徑可等於或小於位於此種端部的相反側之端部之直徑。Referring to FIG. 3, the first elastic
於一實施例中,第1彈性導電部1110包括沿垂直方向VD排列之多個導電性粒子1111,第2彈性導電部1210包括沿垂直方向VD排列之多個導電性粒子1211。於各彈性導電部中,導電性粒子沿垂直方向VD彼此接觸。因此,各彈性導電部之上端與下端能夠以沿垂直方向VD導電之方式連接。構成第1彈性絕緣部1120之材料可將多個導電性粒子1111保持為圖3所示之第1彈性導電部1110之形狀。構成第2彈性絕緣部1220之材料可將多個導電性粒子1211保持為圖3所示之第2彈性導電部1210之形狀。In one embodiment, the first elastic
作為一例,可利用高導電性金屬被覆核心粒子之表面而構成上述導電性粒子。核心粒子可包括作為磁性體之鐵、鎳、鈷等金屬材料,或者使用具有彈性之樹脂等粒子。作為被覆於核心粒子之表面之高導電性金屬,可使用金、銀、銠、鉑、鉻等。As an example, the surface of the core particles may be coated with a highly conductive metal to constitute the conductive particles. The core particles may include metallic materials such as iron, nickel, and cobalt as magnetic bodies, or particles such as resins having elasticity. As the highly conductive metal coated on the surface of the core particles, gold, silver, rhodium, platinum, chromium, etc. can be used.
參照圖3,複數個第1彈性導電部1110藉由第1彈性絕緣部1120而彼此隔開且絕緣。第1彈性絕緣部1120可形成第1薄片1100之四邊形之彈性區域,可使多個導電性粒子1111保持為上述第1彈性導電部1110之形狀。複數個第2彈性導電部1210藉由第2彈性絕緣部1220而彼此隔開且絕緣。第2彈性絕緣部1220可形成第2薄片1200之四邊形之彈性區域,可使多個導電性粒子1211保持為上述第2彈性導電部1210之形狀。Referring to FIG. 3, the plurality of first elastic
上述彈性絕緣部包括彈性高分子材料。詳細而言,上述彈性絕緣部包括硬化之聚矽氧橡膠材料。例如,液態聚矽氧橡膠注入至用以成形第1薄片1100或第2薄片1200之模具內並硬化,藉此可形成上述彈性絕緣部。作為用以成形上述彈性絕緣部之液態聚矽氧橡膠材料,可使用加成型液態聚矽氧橡膠、縮合型液態聚矽氧橡膠、包括乙烯基或羥基之液態聚矽氧橡膠等。作為具體例,上述液態聚矽氧橡膠材料可包括二甲基聚矽氧生橡膠、甲基乙烯基聚矽氧生橡膠、甲基苯基乙烯基聚矽氧生橡膠等。The elastic insulating portion includes an elastic polymer material. In detail, the elastic insulating portion includes a hardened silicone rubber material. For example, liquid silicone rubber is injected into the mold for forming the
作為一例,可藉由如下方式形成上述彈性導電部:於分散有上述導電性粒子之液態聚矽氧橡膠注入於用以成形第1薄片1100或第2薄片1200之模具內後,藉由施加於彈性導電部之各位置之磁場而對準導電性粒子。作為又一例,可藉由如下方式形成上述彈性導電部:於不包括導電性粒子之液態聚矽氧橡膠硬化而成形之薄片中,在彈性導電部之各位置形成貫通孔,以導電性粒子填充此種貫通孔。As an example, the elastic conductive portion may be formed by injecting liquid silicone rubber dispersed with the conductive particles into a mold for forming the
參照圖3及圖4,第1彈性絕緣部1120使相鄰之第1彈性導電部1110於水平方向HD1上以第1水平間隔D1隔開。又,第1彈性絕緣部1120使相鄰之第1彈性導電部1110於垂直於水平方向HD1之又一水平方向HD2上以第2水平間隔D2隔開。第1水平間隔D1與第2水平間隔D2可設定為彼此相同之尺寸、或可設定為不同之尺寸。Referring to FIGS. 3 and 4, the first elastic insulating
參照圖3及圖5,第2彈性絕緣部1220使相鄰之第2彈性導電部1210於水平方向HD1上以第3水平間隔D3隔開。又,第2彈性絕緣部1220使相鄰之第2彈性導電部1210於水平方向HD2上以第4水平間隔D4隔開。第3水平間隔D3與第4水平間隔D4可設定為彼此相同之尺寸、或可設定為不同之尺寸。Referring to FIGS. 3 and 5, the second elastic insulating
於一實施例中,參照圖3及圖4,第1薄片1100之複數個第1彈性導電部1110中之至少一者具有相對於第1彈性絕緣部1120沿垂直方向VD突出之突出部1112。參照圖3及圖5,第2薄片1200之複數個第2彈性導電部1210中之至少一者具有相對於第2彈性絕緣部1220沿垂直方向VD凹陷之凹陷部1212。突出部1112與凹陷部1212以突出部1112沿垂直方向VD嵌合至凹陷部1212之方式形成。由在垂直方向VD上與具有突出部1112之第1彈性導電部1110對應之第2彈性導電部1210提供凹陷部1212。圖3至圖5係僅以例示之目的表示提供突出部之第1彈性導電部與提供凹陷部之第2彈性導電部。可由位於一行之複數個第1彈性導電部中之至少一者、或位於不同行之複數個第1彈性導電部中之至少一者提供突出部1112。或者,可由位於圖2a及圖2b所示之薄片之各角隅之第1彈性導電部提供突出部1112。可由與提供突出部1112之第1彈性導電部1110對應之第2彈性導電部1210提供凹陷部1212。In one embodiment, referring to FIGS. 3 and 4, at least one of the plurality of first elastic
突出部1112沿垂直方向VD位於第1彈性導電部1110,凹陷部1212沿垂直方向VD位於第2彈性導電部1210。於第1薄片1100與第2薄片1200積層時,突出部1112及凹陷部1212係作為用以於垂直方向VD上對準複數個第1彈性導電部1110與複數個第2彈性導電部1210之基準點發揮功能。於第1薄片1100與第2薄片1200積層時,突出部1112嵌合至凹陷部1212。因突出部1112與凹陷部1212間嵌合而第1彈性導電部1110與第2彈性導電部1210於垂直方向VD上對準,第1彈性導電部1110之一端(例如,圖3所示之第1彈性導電部之上端)與第2彈性導電部1210之一端(例如,圖3所示之第2彈性導電部之下端)於垂直方向VD上接觸。如上所述,於第1薄片1100與第2薄片1200積層時,因突出部與凹陷部嵌合而於構造上達成位於上側之彈性導電部與位於下側之彈性導電部間之對準。因此,導電薄片1000因積層型構造而具有較厚之厚度,並且不因對準之彈性導電部而引起電阻之增加或導電性之下降。又,沿垂直方向VD嵌合之突出部1112與凹陷部1212於水平方向HD上固定第1薄片1100與第2薄片1200之位置。因此,即便為了檢查被檢查器件而反覆按壓導電薄片1000,第1薄片1100與第2薄片1200亦不彼此相對性地移動。因此,導電薄片1000具有可長期以高可靠性保持導電性之穩定之積層型構造。The protruding
參照圖3至圖5,於一實施例中,第1薄片1100之第1彈性絕緣部1120具有沿水平方向HD延伸之第1水平面1121,第2薄片1200之第2彈性絕緣部1220具有沿水平方向HD延伸之第2水平面1221。第1水平面1121與第2水平面1221於垂直方向VD上對向。第1彈性導電部之突出部1112相對於第1水平面1121沿垂直方向VD突出,第2彈性導電部之凹陷部1212相對於第2水平面1221沿垂直方向VD凹陷。Referring to FIGS. 3 to 5, in one embodiment, the first elastic insulating
參照圖3及圖4,突出部1112為相對於第1水平面1121突出之第1彈性導電部1110之部分,形成第1彈性導電部1110之上端部。突出部1112呈錐台形。因此,突出部1112具有相對於突出部之中心軸CA1(或者,第1彈性導電部1110之垂直方向VD之中心軸)傾斜之傾斜部1113。傾斜部1113沿突出部1112之外圍方向延伸成環狀而形成突出部1112之外周部。傾斜部1113相對於突出部1112之中心軸CA1之傾斜角IA1可為0度以上30度以下。Referring to FIGS. 3 and 4, the protruding
參照圖3及圖5,凹陷部1212為相對於第2水平面1221凹陷之第2彈性導電部1210之部分,形成第2彈性導電部1210之下端部。凹陷部1212呈與突出部1112之形狀對應之錐台形。因此,凹陷部1212具有相對於凹陷部之中心軸CA2(或者,第2彈性導電部1210之垂直方向VD之中心軸)傾斜之傾斜部1213。傾斜部1213沿凹陷部1212之外圍方向延伸成環狀而形成凹陷部1212之內周部。傾斜部1213相對於凹陷部1212之中心軸CA2之傾斜角IA2可為0度以上30度以下。又,傾斜角IA2可等於或小於突出部之傾斜部之傾斜角。突出部1112嵌合至凹陷部1212,因此突出部1112之傾斜部1113與凹陷部1212之傾斜部1213彼此接觸。Referring to FIGS. 3 and 5, the recessed
突出部1112與凹陷部1212係為了使第1彈性導電部1110與第2彈性導電部1210於垂直方向VD上對準且使第1彈性導電部1110之一端(圖3所示之第1彈性導電部之上端)與第2彈性導電部1210之一端(圖3所示之第2彈性導電部之下端)沿垂直方向VD接觸而形成。作為一例,於將第1薄片1100之整體高度稱為T時,突出部1112之高度可為0.05T至0.15T。The protruding
根據實施例,凹陷部1212可於突出部1112略微嵌合於凹陷部1212之深度至突出部1112完全嵌合於凹陷部1212之深度之範圍內具有適當的深度。於一實施例中,凹陷部1212可具有突出部1112之高度之10%至100%之深度。如上所述,凹陷部1212可具有等於或小於突出部1112之高度之深度。因此,於第1薄片1100與第2薄片1200積層時,第1彈性導電部1110與第2彈性導電部1210可沿垂直方向VD確實地對準且接觸。又,若凹陷部1212具有小於突出部1112之高度之深度,則可於第1彈性絕緣部1120與第2彈性絕緣部1220間沿垂直方向VD確保微小之間隔。因此,於藉由被檢查器件之端子沿垂直方向按壓彈性導電部時,彈性絕緣部順利地容許彈性導電部之水平方向之膨脹,從而可提高彈性導電部之彈性力及導電薄片之彈性力。According to an embodiment, the recessed
圖6a至圖6g係表示上述第1實施例中之突出部與凹陷部之各種示例。6a to 6g show various examples of the protruding portion and the recessed portion in the first embodiment described above.
參照圖6a,僅複數個第1彈性導電部1110中之一個第1彈性導電部可具有突出部1112,僅與具有突出部1112之第1彈性導電部1110對應之第2彈性導電部1210可具有凹陷部1212。Referring to FIG. 6a, only one of the plurality of first elastic
參照圖6b,複數個第1彈性導電部1110可具有突出部1112。可由位於一行之第1彈性導電部1110、或可由所有第1彈性導電部1110提供突出部1112。與此種第1彈性導電部1110對應之第2彈性導電部1210可具有凹陷部1212。Referring to FIG. 6b, the plurality of first elastic
參照圖6c,彈性導電部能夠以鄰接之方式位於圖2a及圖2b所例示之薄片之端部,可由此種彈性導電部提供突出部1112與凹陷部1212。Referring to FIG. 6c, the elastic conductive portion can be located adjacent to the end of the sheet illustrated in FIGS. 2a and 2b, and the protruding
參照圖6d,第1薄片1100之突出部1112可呈圓柱形狀,第2薄片1200之凹陷部1212可呈圓筒形狀。Referring to FIG. 6d, the
參照圖6e,凹陷部1212亦能夠以沿垂直方向VD向第2彈性導電部1210之內側凹陷之方式形成。Referring to FIG. 6e, the recessed
參照圖6f及圖6g,第1彈性絕緣部1120可具有與突出部1112鄰接之突出部1122,第2彈性絕緣部1220可具有與凹陷部1212鄰接之凹陷部1222。突出部1122自第1水平面1121突出,凹陷部1222自第2水平面1221凹陷。突出部1122能夠以等於或小於突出部1112之高度之高度突出,凹陷部1222能夠以等於或小於凹陷部1212之深度之深度凹陷。突出部1122能夠以於垂直方向VD上與凹陷部1222嵌合之方式形成。參照圖6f,突出部1122可與突出部1112鄰接,凹陷部1222可與凹陷部1212鄰接。參照圖6g,突出部1122可沿位於一行之複數個突出部1112形成為直線形,可與各突出部1112鄰接。突出部1112與突出部1222可形成以規定長度延伸之突出部。又,凹陷部1222可沿位於一行之複數個凹陷部1212形成為直線形,可與各凹陷部1212鄰接。凹陷部1212與凹陷部1222可形成以規定長度延伸之凹陷部。6f and 6g, the first elastic insulating
於一實施例中,第1薄片與第2薄片可彼此接合。因此,具有彼此接合之第1薄片與第2薄片之導電薄片可作為具有較厚之厚度的一個積層構造物而配置於被檢查器件與檢查裝置之間。參照圖3及圖7,可於第1水平面1121與第2水平面1221執行第1薄片與第2薄片之接合。因此,導電薄片1000於第1薄片1100與第2薄片1200之間具有接合層BL,接合層BL形成於第1水平面1121與第2水平面1221之間。圖7係為了例示第1薄片1100與第2薄片1200間之接合而以誇大之尺寸表示接合層BL。In one embodiment, the first sheet and the second sheet can be joined to each other. Therefore, the conductive sheet having the first sheet and the second sheet bonded to each other can be disposed between the device to be inspected and the inspection device as a laminated structure having a relatively thick thickness. 3 and 7, the bonding of the first sheet and the second sheet can be performed on the first
於一實施例中,第1水平面1121與第2水平面1221可藉由接著劑接合。作為上述接著劑,可使用聚矽氧系接著劑,接合層BL可包括此種接著劑。參照圖4及圖7,接著劑除第1彈性導電部1110之上端以外,可塗佈於第1彈性絕緣部1120之第1水平面1121。或者,參照圖5及圖7,接著劑除第2彈性絕緣部1220之下端以外,可塗佈於第2彈性絕緣部1220之第2水平面1221。不於第1彈性導電部1110與第2彈性導電部1210塗佈接著劑而上述第1彈性導電部與上述第2彈性導電部不彼此接合。因此,彼此接觸之第1彈性導電部1110與第2彈性導電部1210之交界面不存在使電阻增加或使導電性下降之接著劑。關於使用上述接著劑之接合,第1薄片1100與第2薄片1200中之一者可於規定條件下沿垂直方向VD向另一者加壓。In one embodiment, the first
根據實施例,第1彈性導電部1110與第2彈性導電部1210亦可接著。於該情形時,只要聚矽氧接著劑之厚度較薄而可確保導電性,則亦可使用聚矽氧接著劑。又,亦可視需要而使用導電性接著劑。作為又一實施例,圖7所示之接合層BL亦可形成於突出部1112之傾斜部與凹陷部1212之傾斜部。According to the embodiment, the first elastic
於一實施例中,導電薄片可包括配置於第1薄片與第2薄片之間之一個以上之第3薄片。圖8係表示本發明之第2實施例之導電薄片,圖9係表示積層前之圖8所示之導電薄片。In one embodiment, the conductive sheet may include one or more third sheets disposed between the first sheet and the second sheet. Fig. 8 shows a conductive sheet according to a second embodiment of the present invention, and Fig. 9 shows a conductive sheet shown in Fig. 8 before lamination.
參照圖8,導電薄片2000包括配置於第1薄片1100與第2薄片1200之間之第3薄片2300。因第3薄片2300而導電薄片2000可具有更厚之厚度且可具有更大之垂直方向之按壓量。第3薄片2300包括沿垂直方向VD延伸之複數個第3彈性導電部2310、及使複數個第3彈性導電部2310於水平方向HD上隔開且使複數個第3彈性導電部2310絕緣之第3彈性絕緣部2320。第3彈性導電部2310係其上端與第2彈性導電部1210之下端(第2彈性導電部之一端)接觸,其下端與第1彈性導電部1110之上端(第1彈性導電部之一端)接觸。Referring to FIG. 8, the
參照圖9,第3彈性導電部2310包括多個導電性粒子2311。多個導電性粒子2311可與上述導電性粒子1111、1211相同。導電性粒子2311可藉由構成第3彈性絕緣部2320之材料而保持為第3彈性導電部2310之形狀。第3彈性絕緣部2320使相鄰之第3彈性導電部2310於水平方向HD1上以第5水平間隔D5隔開,且使相鄰之第3彈性導電部2310於水平方向HD2上以第6水平間隔隔開。第3彈性絕緣部2320可與上述第1彈性絕緣部或上述第2彈性絕緣部相同地構成。Referring to FIG. 9, the third elastic
參照圖8及圖9,第3薄片2300之複數個第3彈性導電部2310中之至少一者於沿垂直方向VD對向之一端及另一端中的一者具有凹陷部2312,於一端及另一端中之另一者具有突出部2313。凹陷部2312可位於第3彈性導電部2310之下端。凹陷部2312可與第2薄片1200之凹陷部1212相同地構成。凹陷部2312以於第1薄片1100與第3薄片2300積層時第1薄片1100之突出部1112嵌合至凹陷部2312之方式形成。突出部2313可位於第3彈性導電部2310之上端。突出部2313可與第1薄片1100之突出部1112相同地構成。突出部2313以於第3薄片2300與第2薄片1200積層時嵌合至第2薄片1200之凹陷部1212之方式形成。圖8及圖9係僅以例示之目的表示提供凹陷部2312與突出部2313之第3彈性導電部2310。可由與具有突出部1112之第1彈性導電部1110及具有凹陷部1212之第2彈性導電部1210對應之第3彈性導電部2310提供第3薄片2300的凹陷部2312與突出部2313。8 and 9, at least one of the plurality of third elastic
第3彈性絕緣部2320具有沿垂直方向VD隔開且沿水平方向HD延伸之一對第3水平面2321、2322。位於下方方向UD之第3水平面2321與第1薄片1100之第1水平面1121對向。凹陷部2312位於第3水平面2321,凹陷部2312相對於第3水平面2321凹陷。位於上方方向LD之第3水平面2322與第2薄片1100之第2水平面1221對向。凸出部2313位於第3水平面2322,凸出部2313相對於第3水平面2322凸出。The third elastic insulating
如圖8所示,於導電薄片2000中,以於第1薄片1100上配置第3薄片2300且於第3薄片2300上配置第2薄片1200之方式沿垂直方向VD積層第1薄片1100、第2薄片1200及第3薄片2300。於積層第1薄片至第3薄片1100、1200、2300之狀態下,藉由第1薄片1100之突出部1112與第3薄片2300之凹陷部2322間之垂直方向VD的嵌合而第1彈性導電部1110與第3彈性導電部2310沿垂直方向VD對準且接觸,藉由第3薄片2300之突出部2313與第2薄片1200之凹陷部1212間之垂直方向VD的嵌合而第3彈性導電部2310與第2彈性導電部1210沿垂直方向VD對準且接觸。因此,於導電薄片2000中,第1彈性導電部1110、與上述第1彈性導電部對應之第3彈性導電部2310、及與上述第3彈性導電部對應之第2彈性導電部1210沿垂直方向VD對準,從而形成沿垂直方向延伸之導電路徑。As shown in FIG. 8, in the
於一實施例中,導電薄片2000係第1薄片1100與第3薄片2300接合且第3薄片2300與第2薄片1200接合,藉此可作為一個積層構造物而配置於被檢查器件與檢查裝置之間。於該情形時,第3薄片2300之第3水平面2322可與第1薄片1100之第1水平面1121接合,第3薄片2300之第3水平面2321可與第2薄片1200之第2水平面1221接合。可藉由使用上述接著劑之方式執行此種接合。In one embodiment, the
圖8所示之導電薄片包括一個第3薄片。另一實施例之導電薄片可包括具有相同之構成之兩個以上的第3薄片。因此,可實現具有更厚之厚度之作為積層構造物之導電薄片。The conductive sheet shown in FIG. 8 includes a third sheet. The conductive sheet of another embodiment may include two or more third sheets having the same configuration. Therefore, a conductive sheet having a thicker thickness as a laminated structure can be realized.
為了對本發明之第3實施例之導電薄片進行說明,參照圖10及圖11所示之示例。圖10係表示第3實施例之導電薄片,圖11係表示積層前之圖10所示之導電薄片。In order to explain the conductive sheet of the third embodiment of the present invention, refer to the examples shown in FIGS. 10 and 11. Fig. 10 shows the conductive sheet of the third embodiment, and Fig. 11 shows the conductive sheet shown in Fig. 10 before lamination.
參照圖10,一實施例之導電薄片3000包括沿垂直方向VD積層之第1薄片3100與第2薄片3200,因此具有增加之厚度及增加之按壓量。圖10所示之第1薄片3100與第2薄片3200之位置僅為例示,第1薄片3100可配置於第2薄片3200上。Referring to FIG. 10, the
第1薄片3100具有與上述第1薄片1100之構成相似之構成。第1薄片3100包括垂直方向VD之複數個第1彈性導電部1110、及使複數個第1彈性導電部1110於水平方向HD上隔開且使複數個第1彈性導電部1110彼此絕緣之第1彈性絕緣部1120。第2薄片3200具有與上述第2薄片1200之構成相似之構成。第2薄片3200包括垂直方向VD之複數個第2彈性導電部1210、及使複數個第2彈性導電部1210於水平方向HD上隔開且使複數個第2彈性導電部1210彼此絕緣之第2彈性絕緣部1220。於第1薄片3100與第2薄片3200沿垂直方向VD積層之導電薄片3000中,第1彈性導電部1110與第2彈性導電部1210沿垂直方向VD對準且各自之端部接觸。The
為了固定第1薄片3100與第2薄片3200之位置且使第1彈性導電部1110與第2彈性導電部1210於垂直方向VD上對準,分別由第1薄片3100之第1彈性絕緣部1120與第2薄片3200之第2彈性絕緣部1220提供與上述突出部及凹陷部相似之對準元件。能夠以於垂直方向VD上彼此嵌合之方式形成包括突出部與凹陷部之對準元件。In order to fix the positions of the
參照圖11,於一實施例中,第1薄片3100之第1彈性絕緣部1120具有至少一個突出部3122,突出部3122相對於第1彈性導電部1110向垂直方向VD突出。突出部3122可於圖2a及圖2b所示之薄片中位於第1彈性絕緣部1120。第2薄片3200之第2彈性絕緣部1220具有至少一個凹陷部3222,凹陷部3222相對於第2彈性導電部1210沿垂直方向VD凹陷。凹陷部3222以第1薄片3100之突出部3122於垂直方向VD上嵌合至凹陷部3222之方式形成。凹陷部3222於第2薄片3200之第2彈性絕緣部1220形成於與突出部3122之位置對應之位置。於藉由突出部3122與凹陷部3222間之垂直方向VD之嵌合而複數個第1彈性導電部1110與複數個第2彈性導電部1210於垂直方向VD上接觸且對準之狀態下,第1薄片3100與第2薄片3200沿垂直方向VD積層。Referring to FIG. 11, in one embodiment, the first elastic insulating
參照圖11,於一實施例中,第1薄片3100之第1彈性絕緣部1120具有沿水平方向HD延伸之第1水平面1121,第2薄片3200之第2彈性絕緣部1220具有沿水平方向HD延伸之第2水平面1221。第1水平面1121與第2水平面1221於垂直方向VD上對向。突出部3122自第1水平面1121沿垂直方向VD突出,凹陷部3222自第2水平面1221沿垂直方向VD凹陷。Referring to FIG. 11, in an embodiment, the first elastic insulating
突出部3122與凹陷部3222沿垂直方向VD實現嵌合。若第1薄片3100與第2薄片3200積層,則因突出部3122與凹陷部3222間嵌合而第1彈性導電部1110與第2彈性導電部1210於垂直方向VD上對準,且第1彈性導電部1110之一端(例如,圖11所示之第1彈性導電部之上端)與第2彈性導電部1210之一端(例如,圖11所示之第2彈性導電部之下端)於垂直方向VD上接觸。如上所述,於第1薄片3100與第2薄片3200積層時,藉由突出部3122與凹陷部3222而於構造上實現彈性導電部之垂直方向VD之對準。因此,導電薄片3000因積層型構造而具有較厚之厚度,並且不因對準之彈性導電部引起電阻之增加或導電性之下降。又,沿垂直方向VD嵌合之突出部3122與凹陷部3222於水平方向HD上固定第1薄片3100及第2薄片3200之位置。因此,即便為了檢查被檢查器件而反覆按壓積層之導電薄片3000,第1薄片3100與第2薄片3200亦不彼此相對性地移動。因此,導電薄片3000具有可長期以高可靠性保持導電性之穩定之積層型構造。The protruding
於第1薄片3100與第2薄片3200積層時,突出部3122與凹陷部3222係作為用以使複數個第1彈性導電部1110與複數個第2彈性導電部1210於垂直方向VD上對準之基準點發揮功能。突出部3122與凹陷部3222係為了使第1彈性導電部1110與第2彈性導電部1210於垂直方向VD上對準且沿垂直方向VD接觸而形成。作為一例,於將第1薄片3200之整體高度稱為T時,突出部3122之高度可為0.05T至0.15T。When the
根據實施例,突出部3122可於突出部3122較多地嵌合至凹陷部3222之高度至突出部3122完全嵌合至凹陷部3222之高度之範圍內具有適當的高度。於一實施例中,突出部3122可具有凹陷部3222之深度之90%至100%之高度。如上所述,突出部3122可具有等於或小於凹陷部3222之深度之高度。因此,於第1薄片3100與第2薄片3200積層時,凹陷部3222係整個突出部3122可嵌合至凹陷部3222,第1水平面1121與第2水平面1221完全接觸,所有第1彈性導電部1110與所有第2彈性導電部1210可沿垂直方向VD接觸。According to the embodiment, the protruding
於一實施例中,參照圖10及圖11,突出部3122具有相對於突出部之中心軸CA1傾斜之傾斜部3123。傾斜部3123沿突出部3122之外圍方向延伸成環狀而形成突出部3122之外周部。傾斜部3123相對於中心軸CA1之傾斜角可為上述傾斜角IA1。凹陷部3222具有與突出部3122之形狀對應之形狀。因此,凹陷部3222具有相對於凹陷部之中心軸CA2傾斜之傾斜部3223。傾斜部3223沿凹陷部3222之外圍方向延伸成環狀而形成凹陷部3222之內周部。傾斜部3223相對於中心軸CA2之傾斜角可為上述傾斜角IA2。於第1薄片3100與第2薄片3200積層時,突出部3122嵌合至凹陷部3222,因此傾斜部3123與傾斜部3223彼此接觸。In one embodiment, referring to FIGS. 10 and 11, the protruding
於一實施例中,第1薄片3100與第2薄片3200可彼此接合。具有彼此接合之第1薄片3100與第2薄片3200之導電薄片3000可作為具有較厚之厚度的一個積層構造物而配置於被檢查器件與檢查裝置之間。參照圖11,可於第1水平面1121與第2水平面1221執行第1薄片3100與第2薄片3200之接合。因此,導電薄片3000可於第1薄片3100與第2薄片3200之間具有與圖7所示之接合層相似之接合層BL。可藉由使用上述接著劑之方式接合第1薄片3100之第1水平面1121與第2薄片3200之第2水平面1221。接著劑可塗佈於除第1彈性導電部1110之上端以外之第1水平面1121。或者,接著劑可塗佈於除第2彈性絕緣部1220之下端以外之第2水平面1221。In one embodiment, the
圖12a至圖12d係表示上述第3實施例中之突出部與凹陷部之各種示例。12a to 12d show various examples of the protruding portion and the recessed portion in the third embodiment described above.
參照圖12a,第1薄片3100之第1彈性絕緣部1120可具有一個突出部3122,第2薄片3200之第2彈性絕緣部1220可具有形成於與第1薄片3100之突出部3122之位置對應的位置之一個凹陷部3222。Referring to FIG. 12a, the first elastic insulating
參照圖12b,突出部3122可位於圖2a及圖2b所示之薄片之中央,凹陷部3222能夠以與突出部3122之位置對應之方式定位。或者,第1彈性絕緣部之突出部可位於圖2a及圖2b所示之薄片之各角隅,第2彈性絕緣部可於與此種突出部對應之位置具有凹陷部。Referring to FIG. 12b, the protruding
參照圖12c及圖12d,第1彈性導電部1110可具有與突出部3122鄰接之突出部3112,第2彈性導電部1210可具有與凹陷部3222鄰接之凹陷部3212。突出部3112相對於第1水平面1121突出,凹陷部3212相對於第2水平面1221凹陷。突出部3112與凹陷部3212可分別與上述第1實施例之突出部與凹陷部相似地構成。突出部3112能夠以於垂直方向VD上與凹陷部3212嵌合之方式形成。參照圖12c,第1彈性絕緣部1120之突出部3122可延伸至突出部3112,突出部3122可與突出部3122鄰接。又,第2彈性絕緣部1220之凹陷部3222可延伸至凹陷部3212,凹陷部3212可與凹陷部3222鄰接。參照圖12d,第1彈性絕緣部1120之突出部3122可沿位於一行之複數個突出部3112形成為直線形。又,第2彈性絕緣部1220之凹陷部3222可沿位於一行之複數個凹陷部3212形成為直線形。12c and 12d, the first elastic
圖13a至圖13g係表示由彈性導電部提供之突出部之多種形狀。於在水平方向上截取突出部3122之橫截面時,突出部3122之水平方向之橫截面形狀可呈圓形、橢圓形、長橢圓形、四邊形中之任一者。如圖13a及圖13b所示,突出部3122之水平方向之橫截面形狀可呈圓形。如圖13c所示,突出部3122之水平方向之橫截面形狀可呈橢圓形。如圖13d所示,突出部3122之水平方向之橫截面形狀可呈長橢圓形(oblong shape)。上述長橢圓形係指略微長於橢圓形且具有彼此平行之一對直線及彼此面對之一對圓弧形曲線之形狀。如圖13e至圖13g所示,突出部3122之水平方向之橫截面形狀可呈長方形或正方形。凹陷部3222呈與上述突出部3122之橫截面形狀互補之橫截面形狀,從而突出部3122與凹陷部3222可沿垂直方向VD嵌合。於圖13c至圖13g所示之長形突出部及與此種形狀對應之凹陷部之情形時,亦可藉由一個突出部與一個凹陷部達成彈性導電部間之對準。13a to 13g show various shapes of the protrusion provided by the elastic conductive portion. When the cross-section of the
圖14及圖15係表示本發明之第4實施例之導電薄片。圖14係表示本發明之第4實施例之導電薄片之剖視圖,圖15係表示積層前之圖14所示之導電薄片之剖視圖。14 and 15 show a conductive sheet according to a fourth embodiment of the present invention. 14 is a cross-sectional view of a conductive sheet according to a fourth embodiment of the present invention, and FIG. 15 is a cross-sectional view of the conductive sheet shown in FIG. 14 before lamination.
參照圖14及圖15,導電薄片4000包括提供突出部3122之第1薄片3100、及凹陷部3222配置於第2薄片3200之間之第3薄片4300。藉由第3薄片4300而導電薄片4000可具有更厚之厚度,可具有更大之垂直方向之按壓量。14 and 15, the
除由第3薄片4300之第3彈性導電部提供用以實現彈性導電部之垂直方向VD之對準的對準元件以外,第3薄片4300具有與上述第3薄片2300之構成相似之構成。第3薄片4300包括沿垂直方向VD定向之複數個第3彈性導電部2310、及使複數個第3彈性導電部2310於水平方向HD上彼此隔開且絕緣之第3彈性絕緣部2320。第3薄片4300之第3彈性導電部2310包括圖9所示之多個導電性粒子2311。The
參照圖15,第3薄片4300之第3彈性絕緣部2320於沿垂直方向VD對向之一端及另一端中之一者至少具有凹陷部4323,於一端及另一端中之另一者具有至少一個突出部4324。凹陷部4323可位於第3彈性絕緣部2320之下側。凹陷部4323可與第2薄片3200之凹陷部3222相同地構成。於第1薄片3100與第3薄片4300積層時,第1薄片3100之突出部3122嵌合於凹陷部4323。突出部4324可位於第3彈性絕緣部2320之上側。突出部4324可與第1薄片3100之突出部3122相同地構成。於第3薄片2300與第2薄片1200積層時,突出部4324嵌合於第2薄片3200之凹陷部3222。Referring to FIG. 15, the third elastic insulating
第3彈性絕緣部2320具有沿垂直方向VD隔開之一對第3水平面2321、2322。下方方向LD之第3水平面2321與第1薄片3100之第1水平面1121對向。凹陷部4323位於第3水平面2321,凹陷部4323自第3水平面2321凹陷。上方方向UD之第3水平面2322與第2薄片3200之第2水平面1221對向。突出部4324位於第3水平面2322,突出部4324自第3水平面2322凸出。The third elastic insulating
如圖14所示,以於第1薄片3100上配置第3薄片4300且於第3薄片4300上配置第2薄片3200之方式沿垂直方向VD積層第1薄片3100、第2薄片3200及第3薄片4300。於第1薄片至第3薄片3100、3200、4300積層之狀態下,藉由第1薄片3100之突出部3122與第3薄片4300之凹陷部4323間之垂直方向VD的嵌合而第1彈性導電部1110與第3彈性導電部2310沿垂直方向VD對準且接觸,藉由第3薄片4300之突出部4324與第2薄片3200之凹陷部3222間之垂直方向VD的嵌合而第3彈性導電部2310與第2彈性導電部1210沿垂直方向VD對準且接觸。As shown in FIG. 14, the
於一實施例中,第1薄片3100與第3薄片4300接合,第3薄片4300與第2薄片3200接合,藉此導電薄片4000可作為一個積層構造物而配置於被檢查器件與檢查裝置之間。於該情形時,第3薄片4300之第3水平面2321可與第1薄片3100之第1水平面1121接合,第3薄片4300之第3水平面2322可與第2薄片3200之第2水平面1221接合。可藉由使用上述接著劑之方式執行此種接合。In one embodiment, the
圖14所示之導電薄片包括一個第3薄片4300。另一實施例之導電薄片可包括具有相同之構成之兩個以上之第3薄片4300。藉此,可實現具有更厚之厚度之作為積層構造物之導電薄片。The conductive sheet shown in FIG. 14 includes a
以上,藉由一部分實施例及隨附圖式所示之示例對本發明之技術思想進行了說明,但應瞭解,可於不脫離於本發明所屬之技術領域內具有常識者可理解之本發明之技術思想及範圍的範圍內進行各種置換、變化及變更。又,此種置換、變化及變更應視為屬於隨附之發明申請專利範圍內。In the above, the technical idea of the present invention has been described through a part of the embodiments and the examples shown in the accompanying drawings, but it should be understood that the present invention can be understood without departing from the common understanding of those skilled in the technical field to which the present invention belongs Various replacements, changes and changes are made within the scope of technical ideas and scope. In addition, such replacements, changes, and alterations shall be deemed to fall within the scope of the accompanying patent application for invention.
10:檢查裝置 11:導電墊 20:被檢查器件 21:端子 30:插座 1000:導電薄片 1100:第1薄片 1110:第1彈性導電部 1111:導電性粒子 1112:突出部 1113:傾斜部 1120:第1彈性絕緣部 1121:第1水平面 1122:突出部 1200:第2薄片 1210:第2彈性導電部 1211:導電性粒子 1212:凹陷部 1213:傾斜部 1220:第2彈性絕緣部 1221:第2水平面 1222:凹陷部 2000:導電薄片 2300:第3薄片 2310:第3彈性導電部 2321:第3水平面 2312:凹陷部 2322:第3水平面 2313:突出部 2320:第3彈性絕緣部 2321:第3水平面 2322:第3水平面 3000:導電薄片 3100:第1薄片 3112:突出部 3122:突出部 3123:傾斜部 3200:第2薄片 3212:凹陷部 3222:凹陷部 3223:傾斜部 4000:導電薄片 4300:第3薄片 4323:凹陷部 4324:突出部 BL:接合層 CA1:中心軸 CA2:中心軸 D1:第1水平間隔 D2:第2水平間隔 D3:第3水平間隔 D4:第4水平間隔 D5:第5水平間隔 HD:水平方向 HD1:水平方向 HD2:水平方向 IA1:傾斜角 IA2:傾斜角 LD:下方方向 UD:上方方向 VD:垂直方向10: Check the device 11: conductive pad 20: Device under inspection 21: Terminal 30: socket 1000: conductive sheet 1100: 1st slice 1110: The first elastic conductive part 1111: Conductive particles 1112: protrusion 1113: Inclined part 1120: The first elastic insulation part 1121: 1st level 1122: protrusion 1200: 2nd slice 1210: The second elastic conductive part 1211: conductive particles 1212: Depression 1213: Inclined part 1220: Second elastic insulation part 1221: 2nd level 1222: Depression 2000: conductive sheet 2300: 3rd slice 2310: The third elastic conductive part 2321: 3rd level 2312: Depression 2322: Level 3 2313: protrusion 2320: The third elastic insulation part 2321: 3rd level 2322: Level 3 3000: conductive sheet 3100: 1st slice 3112: protrusion 3122: protrusion 3123: Inclined part 3200: 2nd slice 3212: Depression 3222: Depression 3223: Inclined part 4000: conductive sheet 4300: 3rd slice 4323: Depression 4324: protrusion BL: junction layer CA1: Central axis CA2: Central axis D1: 1st horizontal interval D2: 2nd horizontal interval D3: 3rd horizontal interval D4: 4th horizontal interval D5: 5th horizontal interval HD: horizontal HD1: horizontal HD2: horizontal IA1: Tilt angle IA2: Tilt angle LD: downward direction UD: Upward direction VD: vertical direction
圖1係概略性地表示本發明之第1實施例之導電薄片之剖視圖。FIG. 1 is a schematic cross-sectional view of a conductive sheet according to a first embodiment of the present invention.
圖2a係表示實施例之導電薄片中之彈性導電部及彈性絕緣部之平面排列之概略性示例。2a is a schematic example showing the planar arrangement of the elastic conductive portions and the elastic insulating portions in the conductive sheet of the embodiment.
圖2b係表示實施例之導電薄片中之彈性導電部及彈性絕緣部之平面排列的概略性示例。2b is a schematic example showing the planar arrangement of the elastic conductive portions and the elastic insulating portions in the conductive sheet of the embodiment.
圖3係表示積層前之圖1所示之導電薄片之剖視圖。FIG. 3 is a cross-sectional view of the conductive sheet shown in FIG. 1 before lamination.
圖4係圖3所示之第1薄片之剖面立體圖。4 is a cross-sectional perspective view of the first sheet shown in FIG. 3.
圖5係圖3所示之第2薄片之剖面立體圖。FIG. 5 is a cross-sectional perspective view of the second sheet shown in FIG. 3.
圖6a係表示第1實施例中之突出部與凹陷部之示例。Fig. 6a shows an example of the protruding portion and the recessed portion in the first embodiment.
圖6b係表示第1實施例中之突出部與凹陷部之示例。Fig. 6b shows an example of the protruding portion and the recessed portion in the first embodiment.
圖6c係表示第1實施例中之突出部與凹陷部之示例。Fig. 6c shows an example of the protruding portion and the recessed portion in the first embodiment.
圖6d係表示第1實施例中之突出部與凹陷部之示例。Fig. 6d shows an example of the protruding portion and the recessed portion in the first embodiment.
圖6e係表示第1實施例中之突出部與凹陷部之示例。Fig. 6e shows an example of the protruding portion and the recessed portion in the first embodiment.
圖6f係表示第1實施例中之突出部與凹陷部之示例。FIG. 6f shows an example of the protruding portion and the recessed portion in the first embodiment.
圖6g係表示第1實施例中之突出部與凹陷部之示例。Fig. 6g shows an example of the protruding portion and the recessed portion in the first embodiment.
圖7係表示第1薄片與第2薄片間之接合之一例之剖視圖。7 is a cross-sectional view showing an example of the bonding between the first sheet and the second sheet.
圖8係表示本發明之第2實施例之導電薄片之剖視圖。8 is a cross-sectional view showing a conductive sheet of a second embodiment of the present invention.
圖9係表示積層前之圖8所示之導電薄片之剖視圖。9 is a cross-sectional view of the conductive sheet shown in FIG. 8 before lamination.
圖10係表示第3實施例之導電薄片之剖視圖。10 is a cross-sectional view showing a conductive sheet of the third embodiment.
圖11係表示積層前之圖10所示之導電薄片之剖視圖。FIG. 11 is a cross-sectional view of the conductive sheet shown in FIG. 10 before lamination.
圖12a係表示第3實施例中之突出部與凹陷部之示例。Fig. 12a shows an example of the protruding portion and the recessed portion in the third embodiment.
圖12b係表示第3實施例中之突出部與凹陷部之示例。Fig. 12b shows an example of the protruding portion and the recessed portion in the third embodiment.
圖12c係表示第3實施例中之突出部與凹陷部之示例。Fig. 12c shows an example of the protruding portion and the recessed portion in the third embodiment.
圖12d係表示第3實施例中之突出部與凹陷部之示例。Fig. 12d shows an example of the protruding portion and the recessed portion in the third embodiment.
圖13a係表示提供於彈性導電部之突出部之形狀之示例。FIG. 13a shows an example of the shape of the protrusion provided on the elastic conductive portion.
圖13b係表示由彈性導電部提供之突出部之形狀之示例。Fig. 13b shows an example of the shape of the protruding portion provided by the elastic conductive portion.
圖13c係表示由彈性導電部提供之突出部之形狀之示例。Fig. 13c shows an example of the shape of the protrusion provided by the elastic conductive portion.
圖13d係表示由彈性導電部提供之突出部之形狀之示例。Fig. 13d shows an example of the shape of the protrusion provided by the elastic conductive portion.
圖13e係表示由彈性導電部提供之突出部之形狀之示例。Fig. 13e shows an example of the shape of the protruding portion provided by the elastic conductive portion.
圖13f係表示由彈性導電部提供之突出部之形狀之示例。Fig. 13f shows an example of the shape of the protrusion provided by the elastic conductive portion.
圖13g係表示由彈性導電部提供之突出部之形狀之示例。Fig. 13g shows an example of the shape of the protruding portion provided by the elastic conductive portion.
圖14係表示本發明之第4實施例之導電薄片之剖視圖。14 is a cross-sectional view showing a conductive sheet of a fourth embodiment of the present invention.
圖15係表示積層前之圖14所示之導電薄片之剖視圖。15 is a cross-sectional view of the conductive sheet shown in FIG. 14 before being laminated.
10:檢查裝置 10: Check the device
11:導電墊 11: conductive pad
20:被檢查器件 20: Device under inspection
21:端子 21: Terminal
30:插座 30: socket
1000:導電薄片 1000: conductive sheet
1100:第1薄片 1100: 1st slice
1110:第1彈性導電部 1110: The first elastic conductive part
1112:突出部 1112: protrusion
1120:第1彈性絕緣部 1120: The first elastic insulation part
1200:第2薄片 1200: 2nd slice
1210:第2彈性導電部 1210: The second elastic conductive part
1212:凹陷部 1212: Depression
1220:第2彈性絕緣部 1220: Second elastic insulation part
HD:水平方向 HD: horizontal
HD1:水平方向 HD1: horizontal
HD2:水平方向 HD2: horizontal
LD:下方方向 LD: downward direction
UD:上方方向 UD: Upward direction
VD:垂直方向 VD: vertical direction
Claims (21)
Applications Claiming Priority (2)
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KR1020180086717A KR101985445B1 (en) | 2018-07-25 | 2018-07-25 | Conductive sheet for electrical test |
KR10-2018-0086717 | 2018-07-25 |
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TW202012940A true TW202012940A (en) | 2020-04-01 |
TWI753277B TWI753277B (en) | 2022-01-21 |
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TW108126225A TWI753277B (en) | 2018-07-25 | 2019-07-24 | Conductive sheet for electrical test |
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KR (1) | KR101985445B1 (en) |
CN (1) | CN112470012A (en) |
TW (1) | TWI753277B (en) |
WO (1) | WO2020022745A1 (en) |
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KR101985445B1 (en) * | 2018-07-25 | 2019-06-04 | 주식회사 아이에스시 | Conductive sheet for electrical test |
KR102220168B1 (en) * | 2020-01-23 | 2021-02-25 | (주)티에스이 | Data signal transmission connector and manufacturing method for the same |
KR102179457B1 (en) * | 2020-03-25 | 2020-11-16 | (주)티에스이 | Test socket and test apparatus having the same, manufacturing method for the test socket |
KR20230163660A (en) * | 2022-05-24 | 2023-12-01 | 주식회사 아이에스시 | Connector for test |
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JP2000304772A (en) * | 1999-04-16 | 2000-11-02 | Nissin Kohki Co Ltd | Terminal device for inspection and its manufacture |
JP2001068179A (en) * | 1999-08-30 | 2001-03-16 | Jsr Corp | Anisotropic conductive connection member |
JP4288783B2 (en) * | 1999-09-24 | 2009-07-01 | Jsr株式会社 | Anisotropic conductive sheet and electrical inspection device for circuit device |
JP2004227828A (en) * | 2003-01-21 | 2004-08-12 | Jsr Corp | Testing device of anisotropic conductive connector device and circuit device |
KR20060123910A (en) | 2005-05-30 | 2006-12-05 | 삼성전자주식회사 | Conductive rubber test socket assembly having thickness compensatory member |
JP4793203B2 (en) * | 2006-09-28 | 2011-10-12 | Jsr株式会社 | Anisotropic conductive connector and method for inspecting test object using this anisotropic conductive connector |
KR100970571B1 (en) * | 2008-06-24 | 2010-07-16 | 이용준 | Semiconductor device test contactor and manufacturing method thereof |
KR101000672B1 (en) * | 2008-12-15 | 2010-12-10 | 이용준 | Contactor manufacturing method |
US9547023B2 (en) * | 2010-07-02 | 2017-01-17 | Isc Co., Ltd. | Test probe for test and fabrication method thereof |
KR101246301B1 (en) * | 2012-01-18 | 2013-03-22 | 이재학 | Socket for electrical test with micro-line |
KR101284212B1 (en) * | 2012-04-27 | 2013-07-09 | 주식회사 아이에스시 | Test socket which can be aligned easily |
KR101357535B1 (en) * | 2012-06-25 | 2014-02-05 | 주식회사 유니세트 | Interposer socket |
KR20150079255A (en) * | 2013-12-31 | 2015-07-08 | 주식회사 아이에스시 | Sheet-form connector and electrical connector apparatus |
KR101532392B1 (en) * | 2014-06-18 | 2015-06-30 | 주식회사 아이에스시 | Test socket |
KR101573450B1 (en) * | 2014-07-17 | 2015-12-11 | 주식회사 아이에스시 | Test socket |
KR101606284B1 (en) * | 2014-10-29 | 2016-03-25 | 주식회사 아이에스시 | Electrical connection device having porous insulating sheet with through hole and test socket |
KR101985445B1 (en) * | 2018-07-25 | 2019-06-04 | 주식회사 아이에스시 | Conductive sheet for electrical test |
-
2018
- 2018-07-25 KR KR1020180086717A patent/KR101985445B1/en active IP Right Grant
-
2019
- 2019-07-23 WO PCT/KR2019/009081 patent/WO2020022745A1/en active Application Filing
- 2019-07-23 CN CN201980049553.7A patent/CN112470012A/en active Pending
- 2019-07-24 TW TW108126225A patent/TWI753277B/en active
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CN112470012A (en) | 2021-03-09 |
TWI753277B (en) | 2022-01-21 |
KR101985445B1 (en) | 2019-06-04 |
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