TW201510295A - 錫或錫合金用電鍍液及其用途 - Google Patents
錫或錫合金用電鍍液及其用途 Download PDFInfo
- Publication number
- TW201510295A TW201510295A TW103118809A TW103118809A TW201510295A TW 201510295 A TW201510295 A TW 201510295A TW 103118809 A TW103118809 A TW 103118809A TW 103118809 A TW103118809 A TW 103118809A TW 201510295 A TW201510295 A TW 201510295A
- Authority
- TW
- Taiwan
- Prior art keywords
- tin
- plating
- plating solution
- hole
- tin alloy
- Prior art date
Links
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 title claims abstract description 53
- 229910001128 Sn alloy Inorganic materials 0.000 title claims abstract description 32
- 238000009713 electroplating Methods 0.000 title abstract description 12
- 238000007747 plating Methods 0.000 claims abstract description 113
- 150000001875 compounds Chemical class 0.000 claims abstract description 15
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 claims abstract description 9
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims abstract description 8
- 238000011049 filling Methods 0.000 claims description 30
- 239000000758 substrate Substances 0.000 claims description 22
- 238000000034 method Methods 0.000 claims description 14
- 238000004519 manufacturing process Methods 0.000 claims description 6
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 claims description 5
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 claims description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 3
- FPYUJUBAXZAQNL-UHFFFAOYSA-N 2-chlorobenzaldehyde Chemical compound ClC1=CC=CC=C1C=O FPYUJUBAXZAQNL-UHFFFAOYSA-N 0.000 claims description 3
- 150000004002 naphthaldehydes Chemical class 0.000 claims description 3
- 229960001716 benzalkonium Drugs 0.000 claims 1
- CYDRXTMLKJDRQH-UHFFFAOYSA-N benzododecinium Chemical compound CCCCCCCCCCCC[N+](C)(C)CC1=CC=CC=C1 CYDRXTMLKJDRQH-UHFFFAOYSA-N 0.000 claims 1
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 9
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 6
- YCIMNLLNPGFGHC-UHFFFAOYSA-N catechol Chemical compound OC1=CC=CC=C1O YCIMNLLNPGFGHC-UHFFFAOYSA-N 0.000 description 6
- -1 silver ions Chemical class 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 5
- 229940098779 methanesulfonic acid Drugs 0.000 description 5
- 238000002156 mixing Methods 0.000 description 5
- 239000002253 acid Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000001211 (E)-4-phenylbut-3-en-2-one Substances 0.000 description 2
- SQAINHDHICKHLX-UHFFFAOYSA-N 1-naphthaldehyde Chemical compound C1=CC=C2C(C=O)=CC=CC2=C1 SQAINHDHICKHLX-UHFFFAOYSA-N 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 229930008407 benzylideneacetone Natural products 0.000 description 2
- JALQQBGHJJURDQ-UHFFFAOYSA-L bis(methylsulfonyloxy)tin Chemical compound [Sn+2].CS([O-])(=O)=O.CS([O-])(=O)=O JALQQBGHJJURDQ-UHFFFAOYSA-L 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000005238 degreasing Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000001556 precipitation Methods 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- BWHOZHOGCMHOBV-BQYQJAHWSA-N trans-benzylideneacetone Chemical compound CC(=O)\C=C\C1=CC=CC=C1 BWHOZHOGCMHOBV-BQYQJAHWSA-N 0.000 description 2
- WHOZNOZYMBRCBL-OUKQBFOZSA-N (2E)-2-Tetradecenal Chemical compound CCCCCCCCCCC\C=C\C=O WHOZNOZYMBRCBL-OUKQBFOZSA-N 0.000 description 1
- VZYDKJOUEPFKMW-UHFFFAOYSA-N 2,3-dihydroxybenzenesulfonic acid Chemical compound OC1=CC=CC(S(O)(=O)=O)=C1O VZYDKJOUEPFKMW-UHFFFAOYSA-N 0.000 description 1
- PKZJLOCLABXVMC-UHFFFAOYSA-N 2-Methoxybenzaldehyde Chemical compound COC1=CC=CC=C1C=O PKZJLOCLABXVMC-UHFFFAOYSA-N 0.000 description 1
- RILZRCJGXSFXNE-UHFFFAOYSA-N 2-[4-(trifluoromethoxy)phenyl]ethanol Chemical compound OCCC1=CC=C(OC(F)(F)F)C=C1 RILZRCJGXSFXNE-UHFFFAOYSA-N 0.000 description 1
- IVKPBNVMLKJSFG-UHFFFAOYSA-N 2-chloronaphthalene-1-carbaldehyde Chemical compound C1=CC=CC2=C(C=O)C(Cl)=CC=C21 IVKPBNVMLKJSFG-UHFFFAOYSA-N 0.000 description 1
- WROUWQQRXUBECT-UHFFFAOYSA-N 2-ethylacrylic acid Chemical compound CCC(=C)C(O)=O WROUWQQRXUBECT-UHFFFAOYSA-N 0.000 description 1
- 229910001369 Brass Inorganic materials 0.000 description 1
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 102000018779 Replication Protein C Human genes 0.000 description 1
- 108010027647 Replication Protein C Proteins 0.000 description 1
- SKZKKFZAGNVIMN-UHFFFAOYSA-N Salicilamide Chemical compound NC(=O)C1=CC=CC=C1O SKZKKFZAGNVIMN-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 239000004676 acrylonitrile butadiene styrene Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000003945 anionic surfactant Substances 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 230000003078 antioxidant effect Effects 0.000 description 1
- FFBHFFJDDLITSX-UHFFFAOYSA-N benzyl N-[2-hydroxy-4-(3-oxomorpholin-4-yl)phenyl]carbamate Chemical compound OC1=C(NC(=O)OCC2=CC=CC=C2)C=CC(=C1)N1CCOCC1=O FFBHFFJDDLITSX-UHFFFAOYSA-N 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 125000002091 cationic group Chemical group 0.000 description 1
- 229910001431 copper ion Inorganic materials 0.000 description 1
- LDHQCZJRKDOVOX-NSCUHMNNSA-N crotonic acid Chemical compound C\C=C\C(O)=O LDHQCZJRKDOVOX-NSCUHMNNSA-N 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- XPPKVPWEQAFLFU-UHFFFAOYSA-N diphosphoric acid Chemical compound OP(O)(=O)OP(O)(O)=O XPPKVPWEQAFLFU-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910001449 indium ion Inorganic materials 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- LLABTCPIBSAMGS-UHFFFAOYSA-L lead(2+);methanesulfonate Chemical compound [Pb+2].CS([O-])(=O)=O.CS([O-])(=O)=O LLABTCPIBSAMGS-UHFFFAOYSA-L 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229940054441 o-phthalaldehyde Drugs 0.000 description 1
- 229940044654 phenolsulfonic acid Drugs 0.000 description 1
- ZWLUXSQADUDCSB-UHFFFAOYSA-N phthalaldehyde Chemical compound O=CC1=CC=CC=C1C=O ZWLUXSQADUDCSB-UHFFFAOYSA-N 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 229940005657 pyrophosphoric acid Drugs 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- GHMLBKRAJCXXBS-UHFFFAOYSA-N resorcinol Chemical compound OC1=CC=CC(O)=C1 GHMLBKRAJCXXBS-UHFFFAOYSA-N 0.000 description 1
- 229960001755 resorcinol Drugs 0.000 description 1
- 229960000581 salicylamide Drugs 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 229910001432 tin ion Inorganic materials 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- MWOOGOJBHIARFG-UHFFFAOYSA-N vanillin Chemical compound COC1=CC(C=O)=CC=C1O MWOOGOJBHIARFG-UHFFFAOYSA-N 0.000 description 1
- FGQOOHJZONJGDT-UHFFFAOYSA-N vanillin Natural products COC1=CC(O)=CC(C=O)=C1 FGQOOHJZONJGDT-UHFFFAOYSA-N 0.000 description 1
- 235000012141 vanillin Nutrition 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/30—Electroplating: Baths therefor from solutions of tin
- C25D3/32—Electroplating: Baths therefor from solutions of tin characterised by the organic bath constituents used
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/60—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of tin
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/54—Electroplating of non-metallic surfaces
- C25D5/56—Electroplating of non-metallic surfaces of plastics
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76898—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics formed through a semiconductor substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/18—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material
- H05K3/181—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating
- H05K3/187—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating means therefor, e.g. baths, apparatus
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/421—Blind plated via connections
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Electroplating Methods And Accessories (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
本發明之課題係解決以過去所使用錫或錫合金鍍敷用鍍液試圖填充貫孔或通孔時,填充本身無法良好地進行,即使填充本身能夠良好地進行,有其為極端長填充時間的問題。解決該課題之錫或錫合金用電鍍液的特徵係含有以下的成分(a)及(b):
(a)含羧基之化合物
(b)含羰基之化合物,且成分(a)為1.3g/L以上,以及成分(b)為0.3g/L以上。
Description
本發明係關於錫或錫合金用電鍍液及使用其之盲孔或通孔的填充方法,以及電子電路基板的製造方法。
至今為止半導體的立體封裝或印刷配線板之盲孔或通孔的填充步驟中使用鍍銅,封裝步驟中使用焊球或錫合金。
然而,以往的步驟中於填充步驟及封裝步驟使用不同金屬種,而有步驟為複雜的問題。
於是,若盲孔或通孔的填充步驟中,與封裝步驟同樣地可使用錫或錫合金,則有可省略封裝步驟的可能性。實際上也有報告於盲孔或通孔的填充步驟予以錫或錫合金的技術(專利文獻1)。
[專利文獻1]特開2012-87393公報
然而,以以往所報告錫或錫合金鍍敷用鍍液填充貫孔或通孔時,填充本身無法良好地進行,即使填充本身可良好地進行,有其為極端長填充時間的問題。
本發明者們為了解決上述課題深入研究的結果,發現藉由在以往熟知的錫或錫合金鍍敷用鍍液使特定化合物以特定濃度含有,可在短時間以高信賴性填充盲孔或通孔,而完成本發明。
亦即,本發明係一種錫或錫合金用電鍍液,
其特徵係含有以下的成分(a)及(b):
(a)含羧基之化合物
(b)含羰基之化合物,且成分(a)為1.3g/L以上,以及成分(b)為0.3g/L以上。
又,本發明之特徵係於具有盲孔或通孔的被鍍敷物以上述錫或錫合金用電鍍液電鍍盲孔或通孔的鍍敷填充方法。
進而,本發明係於具有盲孔或通孔的基板進行包括鍍敷填充步驟之電子電路基板的製造方法中,其特徵為以上述盲孔或通孔的鍍敷填充方法進行鍍敷填充之電
子電路基板的製造方法。
本發明的錫或錫合金用電鍍液,係藉由於具有盲孔或通孔的被鍍敷物電鍍,可在短時間以高信賴性填充盲孔或通孔。
又,本發明的錫或錫合金用電鍍液係可利用於半導體的立體封裝或印刷配線板之盲孔或通孔的填充步驟或直通矽通道的形成。
[圖1]實施例2之電鍍後基板的剖面照片(圖中(a)係使用比較品1之電鍍液以0.075A/dm2進行電鍍15分鐘者,(b)係使用實施品1的電鍍液以0.075A/dm2進行電鍍20分鐘者)。
[圖2]實施例3之電鍍後基板的剖面照片(圖中(a)~(d)係使用比較品2之電鍍液,以0.05A/dm2下進行電鍍,15分鐘後、30分鐘後、60分鐘後、90分鐘後者)。
[圖3]實施例3之電鍍後基板的剖面照片(圖中(a)~(e)係使用實施品1之電鍍液,以0.05A/dm2下進行電鍍、15分鐘後、30分鐘後、60分鐘後、90分鐘後、
120分鐘後者)。
[圖4]實施例6之電鍍後基板的剖面照片(圖中、(a)~(c)係使用實施品2之的電鍍液,以1.5A/dm2下進行電鍍,15分鐘後、25分鐘及35分鐘後者)。
在本發明的錫或錫合金用電鍍液(以下稱為「本發明的電鍍液」)所含有的成分(a)含羧基之化合物係只要是具有羧基的化合物即可,則無特別限定,可列舉例如甲基丙烯酸、丙烯酸、巴豆酸、丙烯-1,2-二羧酸、乙基丙烯酸、丙烯酸甲酯、甲基丙烯酸甲酯等、該等中甲基丙烯酸、丙烯酸為佳。又,該等含羧基之化合物係可使用1種或2種。
本發明的鍍液之成分(a)含羧基之化合物的含有量係1.3g/L以上,佳為1.3~2.5g/L。
本發明的鍍液所含有的成分(b)含羰基之化合物係只要是具有羰基的化合物即可,無特別限定,例如可列舉苄叉丙酮、萘醛、氯苯甲醛、鄰苯二甲醛、水楊醛縮、氯萘醛、甲氧基苯甲醛、香草醛等,該等中苄叉丙酮、萘醛、氯苯甲醛為佳。又,該等含羰基之化合物係可使用1種或2種。另外,在本發明的鍍液使含羰基之化合物包含時,亦使例如甲醇、異丙醇等溶劑包含為佳。
本發明的鍍液之成分(b)含羰基之化合物的含有量係0.3g/L以上,佳為0.3~1.0g/L。
另外,本發明的鍍液中,成分(a)與成分(b)的莫耳比係無特別限定,佳為10以下,更佳為2~9。
作為成為本發明的鍍液之基底的以往熟知的錫或錫合金用電鍍液,無特別限定,例如作為錫離子與合金用金屬離子,可列舉例如銀離子、金離子、銅離子、鉛離子、銻離子、銦離子、鉍離子等,或作為將浴調整為酸性,使穩定化的酸,可列舉例如包含硫酸、甲磺酸、氟硼酸、苯酚磺酸、胺磺酸、焦磷酸等者。作為更具體的錫或錫合金用電鍍浴,可列舉硫酸浴、甲磺酸浴、硼氟化物浴等。該等中硫酸浴、甲磺酸浴為佳。
又,在本發明的鍍液進而亦可將熟知的非離子系、陽離子系、陰離子系表面活性劑、鄰苯二酚、間苯二酚、鄰苯二酚磺酸等的抗氧化劑等添加至以往熟知的錫或錫合金用電鍍液。
以下記載本發明的鍍液之佳態樣。
甲磺酸亞錫(作為錫):25~150g/L,佳為70~125g/L
甲磺酸:10~180g/L,佳為15~120g/L
聚氧乙烯月桂胺:0.1~8g/L,佳為3~6g/L
鄰苯二酚:0.1~5g/L,佳為0.5~2g/L
甲基丙烯酸:0.2~4g/L,佳為1.3~2.5g/L
1-萘醛:0.05~1.5g/L,佳為0.3~1.0g/L
甲醇:0.7~25g/L,佳為3.5~17g/L
甲磺酸亞錫(作為錫):25~150g/L,佳為70~125g/L
甲磺酸鉛(作為鉛):0.1~50g/L,佳為1~30g/L
甲磺酸:10~180g/L,佳為15~120g/L
聚氧乙烯月桂胺:0.1~8g/L,佳為3~6g/L
鄰苯二酚:0.1~5g/L,佳為0.5~2g/L
甲基丙烯酸:0.2~4g/L,佳為1.3~2.5g/L
1-萘醛:0.05~1.5g/L,佳為0.3~1.0g/L
甲醇:0.7~25g/L,佳為3.5~17g/L
本發明的鍍液係可以以往熟知的方法於被鍍敷物電鍍。使用本發明的鍍液之電鍍方法係無特別限定,可列舉例如於被鍍敷物進行鹼性脫脂、親水化處理、酸活性等前處理後、將此浸漬於本發明的鍍液之方法等。
使用本發明的鍍液之電鍍條件係無特別限定,使用通常的錫或錫合金之電鍍條件即可,例如以浴溫10~40℃,在陽極以錫,在陰極以電流密度0.2~3A/dm2進行即可。又,電鍍之際以槳等攪拌為佳。
以本發明的鍍液可電鍍之被鍍敷物係無特別限定,可列舉例如表面為由銅、鎳、黃銅等金屬、ABS、聚醯亞胺、環氧等樹脂等所形成者等。
另外,本發明的鍍液係亦可於如上述通常的
被鍍敷物電鍍,特別是在具有盲孔或通孔的被鍍敷物電鍍,再使用於將盲孔或通孔用錫或錫合金填充為佳。
將本發明的鍍液使用於盲孔填充時,將本發明的鍍液之成分(a)與(b)的莫耳比作為10以下,佳為2~9。又,將本發明的鍍液使用於通孔填充時,本發明的鍍液之成分(a)與(b)的莫耳比作為10以下,佳為3.5~10。
使用本發明的鍍液將盲孔或通孔用錫或錫合金填充時,電鍍條件係無特別限定,例如以浴溫10~40℃,在陽極以錫,在陰極以電流密度0.01~2.5A/dm2進行即可。又,為了縮短鍍敷時間,將電鍍中的電流密度設為較電鍍開始時相對更高即可。將電鍍中的電流密度設為較電鍍開始時相對更高的方法係無特別限定,可列舉例如將電鍍中的電流密度從開始電鍍時至經過所預定時間後逐步提高之方法,將電鍍中的電流密度從開始電鍍時呈線性地提高之方法等。
如上述可將盲孔或通孔用錫或錫合金填充之本發明的鍍液,係包括於具有盲孔或通孔的基板進行鍍敷填充步驟,例如可利用於半導體的立體封裝、印刷配線板之貫孔或通孔的填充步驟或直通矽通道的形成等電子電路基板的製造方法。
以下列舉實施例詳細地說明本發明,但本發
明無任何限定於該等實施例者。
錫用電鍍液的調製:
藉由混合成分1~5、7後,再混合成分6調製下述組成的錫用電鍍液。
藉由錫電鍍之盲孔的填充:
水洗具有長寬比6(10 ×60D)的盲孔之矽晶圓基板,進行前處理。將經前處理的基板浸漬於在實施例1所調製的錫用電鍍液(比較品1、實施品1)1分鐘,以0.075A/dm2的電流密度下進行所預定時間(15分鐘(比較品1)或20分鐘(實施品1))的電鍍。觀察了自電鍍後的基板剖面之貫孔的填充狀況(圖1)。
於比較品1於貫孔底部沒有析出可觀察到空
隙,在實施品1可確認到自貫孔底部的優先析出。
藉由錫電鍍之盲孔的填充:
於與在實施例2所使用為同樣的基板進行前處理後,浸漬於在實施例1所調製的錫用電鍍液(實施品1或比較品2),以0.05A/dm2的電流密度下進行所預定時間(15分鐘、30分鐘、60分鐘、90分鐘、120分鐘(僅實施品1))的電鍍。觀察了自電鍍後的基板剖面之貫孔的填充狀況(圖2及圖3)。
於比較品2即使進行了90分鐘的鍍敷後,亦未進行貫孔內的填充,但實施品1隨著鍍敷時間增加析出量,以120分鐘的鍍敷幾乎可填充100%。
藉由錫電鍍之盲孔的填充:
於與在實施例2所使用為同樣的基板進行前處理後,浸漬於在實施例1所調製的錫用電鍍液(實施品1),改變為以0.075A/dm2的電流密度下20分鐘、以0.15A/dm2的電流密度下10分鐘、以0.3A/dm2的電流密度下10分鐘進行電鍍。
藉此電鍍以40分鐘完全填充了盲孔。藉由較將電流密度設為一定的情形,將電流密度設為逐步提高的情形縮短了約65%之盲孔的填充時間。
錫用電鍍液的調製:
藉由混合成分1~5、7後,再混合成分6調製下述組成的錫用電鍍液。
藉由錫電鍍之盲孔的填充:
於具有長寬比0.57(70 ×40D)的盲孔之印刷配線板以40℃進行鹼性脫脂處理後,藉由酸活性處理以室溫進行前處理10秒鐘。將此經前處理的基板浸漬於在實施例5所調製的錫用電鍍液(實施品2),以1.5A/dm2的電流密度下進行所預定時間(15分鐘、25分鐘或35分鐘)的電鍍。觀察了自電鍍後的基板剖面之貫孔的填充狀況(圖4)。
從開始鍍敷時可確認到自貫孔底部的析出,
以25分鐘幾乎填充了貫孔內,亦確認了以35分鐘完全填充貫孔及析出至表面。又,確認了貫孔填充後之表面的析出膜厚係可任意地控制。
錫用電鍍液的調製:
藉由混合成分1~5、8後,再混合成分6或7調製下述組成的錫用電鍍液
藉由錫電鍍之盲孔的填充:
具有長寬比5(20 ×100D)的盲孔之矽晶圓基板,進行前處理後,浸漬於在實施例7所調製的錫用電鍍液(實施品3或實施品4),以0.2A/dm2的電流密度下進行電鍍至填充了盲孔為止。
使用實施品3之電鍍液進行電鍍的情形,係以100分鐘完全填充了貫孔,使用實施品4之電鍍液進行電鍍的情形,係110分鐘完全填充了貫孔。
錫合金用電鍍液的調製:
藉由混合成分1~6、8後,再混合成分7調製下述組成的錫合金用電鍍液。
藉由錫合金電鍍之盲孔的填充:
於與在實施例6所使用為同樣的基板進行前處理後,浸漬於在實施例9所調製的錫合金用電鍍液(實施品5),以1.5A/dm2的電流密度下進行電鍍30分鐘。
藉此電鍍完全填充了貫孔。另外,關於填充
至盲孔的金屬進行螢光X射線分析時,錫與鉛係分別87%與13%的合金。
根據本發明,可藉由錫或錫合金填充盲孔或通孔。因此,本發明可利用於半導體的立體封裝或印刷配線板之盲孔或通孔的填充步驟或直通矽通道的形成。
Claims (8)
- 一種錫或錫合金用電鍍液,其特徵係含有以下的成分(a)及(b):(a)含羧基之化合物(b)含羰基之化合物,且成分(a)為1.3g/L以上,以及成分(b)為0.3g/L以上。
- 如申請專利範圍第1項之錫或錫合金用電鍍液,其中,成分(a)以及成分(b)的莫耳比為10以下。
- 如申請專利範圍第1項之錫或錫合金用電鍍液,其中,成分(a)的含羧基之化合物係選自甲基丙烯酸及丙烯酸之1種或2種。
- 如申請專利範圍第1項之錫或錫合金用電鍍液,其中,成分(b)的含羰基化合物係選自苄叉丙酮、萘醛及氯苯甲醛之1種或2種。
- 如申請專利範圍第1~4項中任一項之錫或錫合金用電鍍液,其為盲孔或通孔的填充用。
- 一種盲孔或通孔的鍍敷填充方法,其特徵為於具有盲孔或通孔的被鍍敷物以如申請專利範圍第1~5項中任一項之錫或錫合金用電鍍液進行電鍍。
- 如申請專利範圍第6項之盲孔或通孔的鍍敷填充方法,其中,將電鍍中的電流密度設為較電鍍開始時高。
- 一種電子電路基板的製造方法,其特徵為包括於具有盲孔或通孔的基板進行鍍敷填充步驟之電子電路基板的 製造方法中,以如申請專利範圍第6或7項之貫孔或通孔的鍍敷填充方法進行。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013133292A JP6006683B2 (ja) | 2013-06-26 | 2013-06-26 | スズまたはスズ合金用電気メッキ液およびその用途 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201510295A true TW201510295A (zh) | 2015-03-16 |
TWI625428B TWI625428B (zh) | 2018-06-01 |
Family
ID=52141557
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103118809A TWI625428B (zh) | 2013-06-26 | 2014-05-29 | Electroplating bath for tin or tin alloy and use thereof |
Country Status (6)
Country | Link |
---|---|
US (1) | US20160130712A1 (zh) |
JP (1) | JP6006683B2 (zh) |
KR (1) | KR20160024868A (zh) |
CN (1) | CN105308218B (zh) |
TW (1) | TWI625428B (zh) |
WO (1) | WO2014208204A1 (zh) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102233334B1 (ko) * | 2014-04-28 | 2021-03-29 | 삼성전자주식회사 | 주석 도금액, 주석 도금 장치 및 상기 주석 도금액을 이용한 반도체 장치 제조 방법 |
CN105755513A (zh) * | 2016-04-28 | 2016-07-13 | 四川昊吉科技有限公司 | 一种镀锡防腐剂 |
JP6834070B2 (ja) * | 2016-06-13 | 2021-02-24 | 石原ケミカル株式会社 | 電気スズ及びスズ合金メッキ浴、当該メッキ浴を用いて電着物を形成した電子部品の製造方法 |
KR20180024765A (ko) * | 2016-08-31 | 2018-03-08 | 주식회사 호진플라텍 | 전기도금을 이용한 주석-비스무트-납 삼원합금 솔더 조성물 |
JP6620859B2 (ja) | 2017-10-24 | 2019-12-18 | 三菱マテリアル株式会社 | 錫又は錫合金めっき堆積層の形成方法 |
WO2019082884A1 (ja) | 2017-10-24 | 2019-05-02 | 三菱マテリアル株式会社 | 錫又は錫合金めっき液 |
US11268203B2 (en) | 2017-10-24 | 2022-03-08 | Mitsubishi Materials Corporation | Tin or tin alloy plating solution |
JP6620858B2 (ja) | 2017-10-24 | 2019-12-18 | 三菱マテリアル株式会社 | 錫又は錫合金めっき堆積層の形成方法 |
KR20200133330A (ko) | 2018-03-20 | 2020-11-27 | 미쓰비시 마테리알 가부시키가이샤 | 주석 또는 주석 합금의 도금액, 범프의 형성 방법, 회로 기판의 제조 방법 |
TWI754135B (zh) | 2018-03-20 | 2022-02-01 | 日商三菱綜合材料股份有限公司 | 錫或錫合金的鍍敷液、凸塊的形成方法、電路基板的製造方法 |
KR20220132528A (ko) | 2020-01-27 | 2022-09-30 | 미쓰비시 마테리알 가부시키가이샤 | 주석 또는 주석 합금 전해 도금액, 범프의 형성 방법, 및 회로 기판의 제조 방법 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4530741A (en) * | 1984-07-12 | 1985-07-23 | Columbia Chemical Corporation | Aqueous acid plating bath and brightener composition for producing bright electrodeposits of tin |
US6508927B2 (en) * | 1998-11-05 | 2003-01-21 | C. Uyemura & Co., Ltd. | Tin-copper alloy electroplating bath |
JP4077119B2 (ja) * | 1999-06-30 | 2008-04-16 | エヌ・イーケムキャット株式会社 | 錫−ビスマス合金電気めっき浴およびめっき方法 |
JP2001089894A (ja) * | 1999-09-22 | 2001-04-03 | Ishihara Chem Co Ltd | スズ合金メッキを施した表面被覆材料、並びに当該被覆材料を利用した電子部品 |
JP4547583B2 (ja) * | 1999-09-24 | 2010-09-22 | 石原薬品株式会社 | スズ合金メッキを施した表面被覆材料、並びに当該被覆材料を利用した電子部品 |
JP2004193520A (ja) * | 2002-12-13 | 2004-07-08 | Sumitomo Bakelite Co Ltd | プリント配線板の製造方法 |
JP5158303B2 (ja) * | 2006-04-14 | 2013-03-06 | 上村工業株式会社 | 錫電気めっき浴、錫めっき皮膜、錫電気めっき方法及び電子機器構成部品 |
KR20110070987A (ko) * | 2008-10-21 | 2011-06-27 | 아토테크더치랜드게엠베하 | 기판 상에 땜납 용착물을 형성하는 방법 |
JP5574912B2 (ja) * | 2010-10-22 | 2014-08-20 | ローム・アンド・ハース電子材料株式会社 | スズめっき液 |
-
2013
- 2013-06-26 JP JP2013133292A patent/JP6006683B2/ja active Active
-
2014
- 2014-05-08 WO PCT/JP2014/062367 patent/WO2014208204A1/ja active Application Filing
- 2014-05-08 KR KR1020157035631A patent/KR20160024868A/ko not_active Application Discontinuation
- 2014-05-08 CN CN201480033173.1A patent/CN105308218B/zh active Active
- 2014-05-08 US US14/898,288 patent/US20160130712A1/en not_active Abandoned
- 2014-05-29 TW TW103118809A patent/TWI625428B/zh active
Also Published As
Publication number | Publication date |
---|---|
TWI625428B (zh) | 2018-06-01 |
CN105308218A (zh) | 2016-02-03 |
JP2015007276A (ja) | 2015-01-15 |
CN105308218B (zh) | 2018-07-13 |
US20160130712A1 (en) | 2016-05-12 |
KR20160024868A (ko) | 2016-03-07 |
WO2014208204A1 (ja) | 2014-12-31 |
JP6006683B2 (ja) | 2016-10-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI625428B (zh) | Electroplating bath for tin or tin alloy and use thereof | |
JP6133056B2 (ja) | スズまたはスズ合金めっき液 | |
KR100241090B1 (ko) | 주석, 납 또는 주석-납 합금을 무전해 도금하는 방법 | |
US7968444B2 (en) | Lead-free tin alloy electroplating compositions and methods | |
EP3004429B1 (en) | Electroplating baths of silver and tin alloys | |
KR20150108767A (ko) | 주석 또는 주석합금의 전기도금배스, 및 범프의 제조방법 | |
JP2007051358A (ja) | 錫電気めっき液および錫電気めっき方法 | |
JP2006009039A (ja) | ウィスカー成長が抑制されたスズ系めっき皮膜及びその形成方法 | |
CN111356789B (zh) | 锡或锡合金电镀液 | |
CN111279020B (zh) | 锡或锡合金电镀液 | |
JP2009242860A (ja) | 酸性銅用前処理剤およびこれを利用するめっき方法 | |
JP2013093360A (ja) | 半導体チップ搭載用基板及びその製造方法 | |
KR101608072B1 (ko) | 주석-은 전기 도금액, 그 제조방법 및 그를 이용하여 주석-은 솔더 범프를 형성하는 방법 | |
TWI761212B (zh) | 銀/錫電鍍浴及其使用方法 | |
JP2019099895A (ja) | 電気銅亜鉛合金めっき膜の形成方法 | |
WO2019082885A1 (ja) | 錫又は錫合金めっき液 | |
CN117026316A (zh) | 一种填孔镀铜液及其制备方法和填孔镀铜方法 | |
WO2019082884A1 (ja) | 錫又は錫合金めっき液 | |
CN113502512A (zh) | 电镀铜溶液添加剂、电镀铜溶液以及电镀方法 | |
JP2003224347A (ja) | プリント配線板の半田メッキ処理方法 |