TW201422855A - 載持鍍覆處理用觸媒粒子之基板之處理方法 - Google Patents
載持鍍覆處理用觸媒粒子之基板之處理方法 Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 112
- 239000002245 particle Substances 0.000 title claims abstract description 98
- 238000000034 method Methods 0.000 title claims abstract description 44
- 238000007747 plating Methods 0.000 title claims abstract description 32
- 230000003197 catalytic effect Effects 0.000 title description 5
- 230000008569 process Effects 0.000 title description 5
- 239000010410 layer Substances 0.000 claims abstract description 36
- 239000012044 organic layer Substances 0.000 claims abstract description 18
- 239000002923 metal particle Substances 0.000 claims abstract description 17
- 239000003054 catalyst Substances 0.000 claims abstract description 13
- 239000000084 colloidal system Substances 0.000 claims abstract description 11
- 238000012545 processing Methods 0.000 claims abstract description 11
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 claims description 12
- -1 polyethylene terephthalate Polymers 0.000 claims description 10
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 claims description 7
- 239000011112 polyethylene naphthalate Substances 0.000 claims description 7
- 229920000139 polyethylene terephthalate Polymers 0.000 claims description 7
- 239000005020 polyethylene terephthalate Substances 0.000 claims description 7
- 239000004642 Polyimide Substances 0.000 claims description 5
- 239000007822 coupling agent Substances 0.000 claims description 5
- 229920001721 polyimide Polymers 0.000 claims description 5
- 239000000126 substance Substances 0.000 claims description 5
- 238000003672 processing method Methods 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 abstract description 31
- 239000002184 metal Substances 0.000 abstract description 31
- 230000015572 biosynthetic process Effects 0.000 abstract description 10
- 229910052763 palladium Inorganic materials 0.000 abstract description 7
- 239000010419 fine particle Substances 0.000 abstract description 3
- 239000013545 self-assembled monolayer Substances 0.000 abstract description 3
- 239000002094 self assembled monolayer Substances 0.000 abstract 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 127
- 239000000243 solution Substances 0.000 description 48
- 239000010408 film Substances 0.000 description 24
- 238000007772 electroless plating Methods 0.000 description 20
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 14
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 13
- PIBWKRNGBLPSSY-UHFFFAOYSA-L palladium(II) chloride Chemical compound Cl[Pd]Cl PIBWKRNGBLPSSY-UHFFFAOYSA-L 0.000 description 12
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 10
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 9
- 239000003638 chemical reducing agent Substances 0.000 description 8
- 150000002500 ions Chemical class 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 7
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 6
- 238000005229 chemical vapour deposition Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- 238000001179 sorption measurement Methods 0.000 description 6
- 229910004298 SiO 2 Inorganic materials 0.000 description 5
- 238000002441 X-ray diffraction Methods 0.000 description 5
- 230000004888 barrier function Effects 0.000 description 5
- 230000009467 reduction Effects 0.000 description 5
- 150000003839 salts Chemical class 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- 239000007864 aqueous solution Substances 0.000 description 4
- 125000004429 atom Chemical group 0.000 description 4
- 239000003223 protective agent Substances 0.000 description 4
- 239000012266 salt solution Substances 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 125000003277 amino group Chemical group 0.000 description 3
- 239000012295 chemical reaction liquid Substances 0.000 description 3
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- 238000007796 conventional method Methods 0.000 description 3
- 125000000524 functional group Chemical group 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 229910000510 noble metal Inorganic materials 0.000 description 3
- GPNDARIEYHPYAY-UHFFFAOYSA-N palladium(ii) nitrate Chemical compound [Pd+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O GPNDARIEYHPYAY-UHFFFAOYSA-N 0.000 description 3
- 239000002243 precursor Substances 0.000 description 3
- 239000011780 sodium chloride Substances 0.000 description 3
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- 238000000108 ultra-filtration Methods 0.000 description 3
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- 108010038083 amyloid fibril protein AS-SAM Proteins 0.000 description 2
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- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
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- YPTUAQWMBNZZRN-UHFFFAOYSA-N dimethylaminoboron Chemical compound [B]N(C)C YPTUAQWMBNZZRN-UHFFFAOYSA-N 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
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- 238000005240 physical vapour deposition Methods 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 239000012279 sodium borohydride Substances 0.000 description 2
- 229910000033 sodium borohydride Inorganic materials 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- QEMXHQIAXOOASZ-UHFFFAOYSA-N tetramethylammonium Chemical compound C[N+](C)(C)C QEMXHQIAXOOASZ-UHFFFAOYSA-N 0.000 description 2
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 1
- ZXVONLUNISGICL-UHFFFAOYSA-N 4,6-dinitro-o-cresol Chemical group CC1=CC([N+]([O-])=O)=CC([N+]([O-])=O)=C1O ZXVONLUNISGICL-UHFFFAOYSA-N 0.000 description 1
- SXPGQGNWEWPWQZ-UHFFFAOYSA-N 4-(triethoxymethyl)dodecan-1-amine Chemical compound NCCCC(C(OCC)(OCC)OCC)CCCCCCCC SXPGQGNWEWPWQZ-UHFFFAOYSA-N 0.000 description 1
- 229910020674 Co—B Inorganic materials 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- XJDCHDFUMGSEHD-UHFFFAOYSA-N NCCCC(C(OC)(OC)OC)CCCCCCCC Chemical compound NCCCC(C(OC)(OC)OC)CCCCCCCC XJDCHDFUMGSEHD-UHFFFAOYSA-N 0.000 description 1
- 229910018104 Ni-P Inorganic materials 0.000 description 1
- 229910018536 Ni—P Inorganic materials 0.000 description 1
- 101150003085 Pdcl gene Proteins 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 229920002125 Sokalan® Polymers 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- CZPONYHBMZVWTM-UHFFFAOYSA-N azane;nitric acid Chemical compound N.N.O[N+]([O-])=O CZPONYHBMZVWTM-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- RJTANRZEWTUVMA-UHFFFAOYSA-N boron;n-methylmethanamine Chemical compound [B].CNC RJTANRZEWTUVMA-UHFFFAOYSA-N 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 1
- 238000005119 centrifugation Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 125000001309 chloro group Chemical group Cl* 0.000 description 1
- 230000015271 coagulation Effects 0.000 description 1
- 238000005345 coagulation Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910000361 cobalt sulfate Inorganic materials 0.000 description 1
- 229940044175 cobalt sulfate Drugs 0.000 description 1
- KTVIXTQDYHMGHF-UHFFFAOYSA-L cobalt(2+) sulfate Chemical compound [Co+2].[O-]S([O-])(=O)=O KTVIXTQDYHMGHF-UHFFFAOYSA-L 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000000192 extended X-ray absorption fine structure spectroscopy Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- GPRLSGONYQIRFK-UHFFFAOYSA-N hydron Chemical compound [H+] GPRLSGONYQIRFK-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 150000002736 metal compounds Chemical class 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 230000000877 morphologic effect Effects 0.000 description 1
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 1
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000005063 solubilization Methods 0.000 description 1
- 230000007928 solubilization Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 125000000101 thioether group Chemical group 0.000 description 1
- 125000003396 thiol group Chemical group [H]S* 0.000 description 1
- CMPGARWFYBADJI-UHFFFAOYSA-L tungstic acid Chemical compound O[W](O)(=O)=O CMPGARWFYBADJI-UHFFFAOYSA-L 0.000 description 1
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- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/18—Pretreatment of the material to be coated
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- C23C18/1872—Pretreatment of the material to be coated of surfaces of non-metallic or semiconducting in organic material by chemical pretreatment
- C23C18/1886—Multistep pretreatment
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- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
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- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
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- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
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Abstract
本發明之基板的處理方法,其係為在基板上載持成為形成鍍覆層用之觸媒的金屬粒子,使前述基板、與含有前述金屬粒子的膠體溶液接觸的基板之處理方法,其特徵係前述膠體溶液包含粒徑0.6nm至4.0nm,且(111)面的面間距離為2.254Å以上的Pd之金屬粒子。對於此處理前的基板表面係形成SAM等有機層,以提高Pd粒子的鍵結力。若依照本發明,在各種基板載持對電路圖案或TSV形成鍍覆層用的金屬粒子之際,可比習知法更細微處理,而得到安定的鍍覆層。
Description
本發明係有關藉由在LSI基板等基板上鍍覆障壁層或電極層等之金屬層所形成時的處理方法。詳而言之,係有關使在基板上作用為形成鍍覆層用之觸媒的金屬粒子載持於基板上的處理方法。
在可封裝在各種電子機器的印刷基板、LSI基板等之製程中,係可形成構成配線或電極等的導電金屬層。此等之導電金屬層係可使用以蒸鍍法、濺鍍法等之物理蒸鍍法或CVD法等之化學蒸鍍法所形成之金屬薄膜形成步驟、與光微影蝕刻或蝕刻等之圖案化步驟的組合。
又,隨著近年之電子機器的高密度化,使用TVS(貫通孔(through via)電極)的多層LSI基板或3D-IC之適用例正在增加。在此等所使用的TSV係在設於基板的貫通孔(via hole)依次積層障壁層、晶種層、填充材層所形成。此時亦在各金屬層的形成上適用物理蒸鍍法或化學蒸鍍法。
然而,在上述的金屬薄膜形成步驟中,物
理蒸鍍法係除了必須要有大規模的真空設備之外,尚有階梯覆蓋(step coverage)差的問題。階梯覆蓋的問題係尤其對於TSV的應用造成障礙。另一方面,若觀察視有關化學蒸鍍法,因成為原料的金屬化合物昂貴,又製程自身成本高且必須高溫,故有擔心薄膜製造成本高漲之問題。又,化學蒸鍍法若與物理蒸鍍法比較,雖然階梯覆蓋較為良好,但常很難對於在高的寬高比(aspect ratio)的貫通孔而通過至其底部而進行均勻的成膜。
因此,就以低成本形成高品質的金屬膜的
方法而言,鍍覆法的利用已被研究。尤其,用以製作成微細化及複雜化的金屬配線之方法,亦可應付精密加工的無電解鍍覆倍受矚目。例如,在專利文獻1中係已揭示一種使Ag及Pd的金屬觸媒粒子附著於基板上,再形成鍍覆用之核而進行無電解鍍覆的方法。此方法係也可適用於TSV基板的埋入步驟。
又,在專利文獻2中係係已揭示一種使用貴
金屬粒子作為形成電路圖案之觸媒粒子的方法。在此方法中,係在吸附貴金屬粒子之前,在基板上塗布特定的化合物而形成自我組織化單分子膜(Self-Assembled Monolayers:以下稱為SAM),使貴金屬粒子吸附於其上。
適用SAM係為了使貴金屬粒子於基板上所希望的位置‧圖案吸附,同時並可維持安定的吸附狀態。
[專利文獻1]日本特開2000-087248號公報
[專利文獻2]日本特開2007-84850號公報
將如上述的金屬微粒子載持在基板上,再形成鍍覆層作為觸媒的習知技術,雖然大致上已確立,但在各種基板的電路圖案或TSV之複雜化、細微化的進行係至今尚未瞭解,對於其等而習知的方法可應付到何種程度備受關心。因此本發明係對於用以對基板形成鍍覆層而載持金屬粒子作為觸媒的基板之處理方法,提供比以往更可微細處理,並且可形成安定的鍍覆層者。
解決上述問題的本發明,係一種基板的處理方法,係為在基板上載持成為形成鍍覆層用之觸媒的金屬粒子,使前述基板、與含有前述金屬粒子的膠體溶液接觸的基板之處理方法,其特徵在於:前述膠體溶液係包含粒徑0.6nm至4.0nm,且(111)面的面間距離為2.254Å以上的Pd之金屬粒子。
本發明係就成為形成鍍覆層用的觸媒之金屬粒子而言,以Pd作為構成金屬,且使其粒徑為0.6nm至4.0nm。選擇Pd係因即使使之載持於一般基板所使用的Si(表面係形成SiO2)上亦不產生擴散的問題。此點,雖然Au微粒子係可期待鍍覆層用的觸媒作用,但會在與SiO2
之間產生擴散的問題。又,使Pd粒子的粒徑為0.6nm至4.0nm,係使觸媒粒子的Pd粒子形成微細,俾可顯現適當的分布狀態。又,為了其觸媒作用亦成為更強烈,故其後的鍍覆層成為均勻且牢固者。
繼而,在本發明中,使用Pd的(111)面之面
間距離為2.254Å以上的Pd粒子亦作為必要條件。對於此面間距離,係一般的Pd之(111)面的面間距離為2.249Å至2.244Å。亦即,本發明係使Pd之(111)面的面間距離朝長距離側移位者。使面間距離在此範圍的Pd粒子,係可作用為具有高的觸媒活性之核,並提升其後所形成的鍍覆層之密著性。進一步,使面間距離為適當,即使將鍍覆層的膜厚設定在比較薄的範圍中,也可形成連續膜。藉此,亦可對於更微細、高寬高比的貫通孔鍍覆處理。對於此Pd粒子的(111)面之面間距離,係考量可調整的範圍後,宜使其上限為2.388Å。
又,Pd粒子的粒徑係可以電子顯微鏡圖像
(TEM、SEM)直接量測、或測定X線繞射分析的繞射線之半值幅,從Scherrer式計算等而測定。又,Pd粒子的(111)面之面間距離係可從X線繞射分析的波峰位置以Bragg式計算而測定,又,也可藉由廣域X線吸收微細構造(EXAFS)分析而測定。
如上述,本發明之Pd粒子載持的處理,係
使用含有Pd粒子的膠體溶液。此處,膠體溶液之溶劑,係可適用水、醇類等的有機溶劑。又,Pd粒子係為了防止其
凝聚,亦可鍵結保護劑。保護劑係宜為聚乙烯基四氫吡咯酮(PVP)、聚乙烯亞胺(PEI)、聚丙烯酸(PAA)、四甲基銨(TMA)、檸檬酸。但,保護劑的適用並非必要。
金屬膠體溶液與基板的接觸處理,宜使基
板浸漬在金屬膠體溶液中。此時的條件,宜為浸漬時間在1分鐘至60分鐘。又,金屬膠體溶液的溫度,宜為5℃至80℃。浸漬金屬膠體溶液後的基板,雖然也可進行乾燥處理,但如上述,對於預先形成SAM的基板,也可直接進行鍍覆處理。
藉由金屬膠體溶液與基板的接觸處理,而
載持在基板上的Pd粒子之個數,宜使4.0×103至1.0×105個/μm2作為目標範圍。繼而,為載持此範圍的Pd粒子,膠體溶液中的金屬粒子之濃度宜為9.3×10-6至3.8×10-1mol/L。
在本發明之基板的處理方法中,雖然可使
以上說明之含有Pd粒子的膠體溶液接觸於基板而使Pd粒子載持於基板,但也可使用形成適當的有機層作為基板者。此有機層係可提高Pd粒子與基板的鍵結力。藉此,可從濕式處理的Pd粒子之載持步驟,迅速地移動至相同濕式處理的鍍覆步驟。
有機層係對於Pd粒子具有吸附能的有機化
合物膜,其較佳者,首先可舉出自我組織化單分子膜(SAM)。SAM的具體例,有使用矽烷偶合劑的SAM,例如宜使用於末端具有胺基、硫醇基、硫醚基、氯基、羰基、
羧基的矽烷偶合劑。矽烷偶合劑係可列舉如3-胺基丙基三乙氧基矽烷、3-胺基丙基三甲氧基矽烷、N-2-(胺基乙基)-3-胺基丙基三乙氧基矽烷、3-硫醇基丙基三甲氧基矽烷。
又,就SAM以外的有機層而言,也可適用
如PI(聚醯亞胺)、PET(聚對苯二甲酸乙二酯)、PEN(聚萘二甲酸乙二酯)的有機物。存在於此等有機物表面的羧基或胺基等之官能基係與SAM相同地,可使Pd粒子有效地吸附、鍵結。由此等有機物所構成的有機層,係可在無機物基板的表面以蒸鍍等形成。又,就有機層而言,亦可在基板表面形成由有機物所構成之有機層,在其上形成具有SAM的2層構造之有機層。
不過,對基板形成有機層並非必要。即使
對於Si晶圓等一般的無機物基板,本發明係也可適用。例如,適用如PI基板、PET基板、PEN基板的有機物基板作為基板時,藉由基板表面的官能基而即使無有機層亦可期望與Pd粒子之鍵結。使用有機物基板時,因以蒸氣等改質表面,可增加表面上的官能基而使用。
本發明中,對於作為處理對象的基板形
狀,並無特別的限定,亦可適用於平面基板。此時,可適當地使形成遮罩或SAM的基板浸漬於金屬膠體溶液中,再鍍覆處理以形成任意圖案的金屬層。
不過,本發明的特別有用之處,係形成用
以形成上述的TSV電極之貫通孔的基板。可形成微細且密著性優異的Pd粒子層之本發明,係對於以往很難之微細貫
通孔的基板,可容易地形成均勻且平滑的金屬薄膜。本發明尤其對於高寬高比的貫通孔也有效,也可應付例如3至50的寬高比之貫通孔填充。
又,對於與本發明之基板的處理步驟之後所進行的鍍覆處理,可依照所形成的金屬薄膜之組成等而任意選擇,並無特別限定。例如,在TSV電極中,可在貫通孔內部形成障壁層。構成障壁層的金屬係可適用Co-B、Ni-B、Co-W-B、Ni-W-B、Co-P、Ni-P、Co-W-P、Ni-W-P等。可藉由此等的無電解鍍覆處理來形成障壁層。
在本發明的處理步驟中使用的金屬膠體溶液,係製造具有上述粒徑及(111)面間距離的Pd粒子,再分散於溶劑中而製得。此Pd粒子的基本製造步驟,係依據公知的Pd膠體的製造步驟。亦即,在Pd鹽的溶液中混合還原劑及視需要的保護劑,還原Pd鹽溶液中的Pd離子而形成Pd粒子。
但,在本發明中係必須使Pd粒子的粒徑微小化,尚且適當控制(111)面間距離。因此,在本發明中,在Pd鹽溶液的調整階段需要特別的考量。詳而言之,首先係使用固體(粉末狀)的氯化鈀(PdCl2)作為Pd鹽的前驅體(原料)。然後,於水中投入氯化鈀,再添加氯化物。氯化鈀係不能直接溶解於水中,但藉添加氯化物離子而進行溶解以成為Pd粒子之核的Pd離子(在溶液中係以[PdCl4]2-存在)。此現象本身係已公知,但在本發明中,係利用此特性,同時藉由添加的氯化物之最適化及Pd原子與氯化物離子
之莫耳比的調整,俾生成含有較佳狀態的Pd離子之Pd鹽溶液。
此處,可添加於含氯化鈀之溶液的氯化
物,係宜為NaCl、KCl、CaCl2、MgCl2(MgCl2‧6H2O)。若依本發明人等,在伴隨氯化鈀溶解的Pd離子之生成過程中,係宜溶液的氫子濃度無變動。前述的氯化物係不使氫離子濃度上昇,而可溶解氯化鈀,以較佳的狀態生成Pd離子。然後,在添加前述氯化物時的Pd原子與氯化物離子之莫耳比,係宜相對於Pd原子1莫耳而氯化物離子為2至5莫耳。此Pd原子與氯化物離子之莫耳比的調整亦為了生成安定的Pd離子所要求的。
對於如上述做法所製造的Pd鹽溶液添加還
原劑,可還原Pd離子並生成Pd粒子。在此還原劑中,雖可使用醇、氫化硼鈉、二甲基胺硼烷等,但宜為醇。Pd粒子之粒徑係可藉還原溫度來調整,但因以醇做為還原劑,故容易控制此粒徑。又,宜使還原溫度為60至140℃。
對於含有藉還原所合成的Pd粒子之反應液,係可適宜地進行過濾及濃縮而回收Pd粒子。此處,如上述般在本發明中係使用氯化鈀,故在所合成的膠體溶液中係Pd的相對離子(counter ion)之氯化物離子以離子或鹽的形式殘留。此氯化物離子係藉由膠體溶液而成為不純物,故宜去除。此去除方法係可舉例超過濾或離心分離等。進行膠體溶液化時的Pd粒子之最適的氯化物離子濃度,係相對於Pd為1.7至3.5mol%。但,於還原後的Pd粒子所
含有之鹽,未必要全部去除,亦有時可提高適度殘留者經溶液化時之膠體的安全性。前述濃度範圍係考量此點者。
經回收的Pd粒子,因以水(純水)等適宜的
溶劑進行稀釋,可形成基板處理用的Pd膠體溶液。即使對於上述的Pd粒子之較佳濃度,也可容易地以溶劑之量調整。又,在調整此Pd膠體溶液之時,有時添加用以調整膠體之安定性用的鹽。
如以上說明,本發明係使用含有較佳的Pd粒子之金屬膠體溶液,為在基板上載持鍍覆處理用的觸媒粒子之基板的處理方法。若依本發明,可適當地分散觸媒活性高的Pd粒子,並可使其後的鍍覆層之密著性形成良好者。
第1圖(a)及(b)係第1實施形態的Pd粒子之TEM觀察圖像及X線繞射的分析結果。
第2圖係第1實施形態中載持Pd粒子後的基板貫通孔之剖面照片。
第3圖係第1實施形態中的Ni-B無電解鍍覆處理後之基板貫通孔的剖面照片。
第4圖係表示第2實施形態中的基板表面及貫通孔內面的Pd粒子吸附密度之圖。
第5圖係第2實施形態中的Co-W-B無電解鍍覆處理
後之基板貫通孔的剖面照片。
以下,說明有關本發明的較佳實施形態。
第1實施形態:在本實施形態中,係製造Pd粒子及金屬膠體溶液,再浸漬形成有TSV的基板而進行處理,以無電解鍍覆形成鍍覆層。
[Pd粒子之製造]
在容量5L的分離式燒瓶中加入純水1,500mL,再投入氯化鈀粉末5.87g(Pd含有量:32.89mmol)。此時的氯化鈀係不溶於水,且溶液呈混濁的狀態。此處,一邊添加使氯化鈉9.61g(成為Pd的5倍mol等量)溶解於純水1,000mL中之氯化鈉溶液,一邊攪拌。在此過程溶液係一邊增加透明度一邊變成褐色,攪拌50分鐘後成為橙色透明的水溶液。
在此氯化鈀水溶液中,添加PVP水溶液(使PVP 10.5g溶解於純水1,000mL者),進一步添加乙醇875mL作為還原劑。然後,以110℃的恆溫槽攪拌反應液,以90℃迴流3小時。
還原後的反應液,係在冷卻後進行過濾,以旋轉式蒸發器濃縮而除去乙醇,進行過濾及超過濾。超過濾係使用區份分子量10,000的過濾器。然後,再次進行過濾而回收Pd粒子。對於此Pd粒子,藉由TEM(穿透型電子顯微鏡)進行觀察而測定粒徑。又,以X線繞射(線源:CuK α線)進行Pd(111)面之面間距離的測定。
第1圖係表示Pd粒子之TEM圖像(第1圖
(a))及X線繞射之繞射線(2 θ:35至45°,第1圖(b))。從依據TEM圖像之測定,Pd粒子之平均粒徑為2.2nm。又,從X線繞射之繞射線的波峰位置所算出的(111)面之面間距離為2.293Å。
[Pd膠體溶液之製作]
上述所回收之Pd粒子係以純水稀釋而形成Pd膠體溶液。Pd膠體溶液之Pd濃度為0.1wt%。
[基板]
在本實施形態中,係使用厚度100μm的Si基板。於此基板上,係以Bosch法之反應性蝕刻形成貫通孔(孔徑2μm,深度30μm,寬高比15)。於此基板係形成貫通孔後,藉熱氧化以形成SiO2層(200nm)。又,在形成SAM前,進行基板的清洗、脫脂。
[形成SAM]
將上述的基板浸漬在3-胺基丙基三乙氧基矽烷溶液(溶劑:甲苯)而形成SAM。此處理係以60℃進行1小時。此矽烷偶合處理後,以乙醇清洗,進一步,以110℃進行煅燒處理1小時,使SAM活性化。
[以Pd膠體溶液的基板處理]
於上述所製造的Pd膠體溶液中浸漬已形成SAM的基板。此時的處理溫度係設定為25℃,浸漬時間為10分鐘。藉此處理,Pd粒子係與SAM末端的胺基鍵結。
第2圖,係載持Pd粒子後的基板貫通孔的
剖面照片。從第2圖可確認Pd粒子並非全部遍佈地被載持於貫通孔的入口部及底部。又,從SEM照片算出基板上之Pd粒子的鍵結數之後,為2.0×104個/μm2。
[以無電解鍍覆形成金屬膜]
對於載持Pd粒子後的基板,以無電解鍍覆法形成Ni-B膜。Ni-B鍍覆係使用由0.17mol/L的硫酸鎳、0.049mol/L的二甲基胺基硼烷與0.63mol/L的檸檬酸(還原劑、錯化劑)所構成之無電解鍍覆液。無電解鍍覆處理係在形成70℃以上的上述無電解鍍覆液中浸漬基板1小時。
第3圖係Ni-B無電解鍍覆處理後之基板貫
通孔的剖面照片。從第3圖可確認即使被高密度載持的Pd粒子很少作用為觸媒,也可形成連續的Ni-B薄膜。而且,可知Ni-B薄膜在貫通孔的底部也以充分的厚度形成。
第2實施形態:在此處係使用以第1實施形
態所製造的Pd膠體溶液,對於與第1實施形態相同的基板進行處理,更詳細地確認出Pd粒子的鍵結狀態。而且,以無電解鍍覆形成Co-W-B膜作為金屬膜。
所使用的基板係已形成貫通孔(孔徑2.5μ
m,深度63μm:寬高比25)的Si基板。在此基板中,係在事前與第1形態相同地形成SiO2層及SAM。將此基板浸漬在Pd膠體溶液中。此時的處理溫度係設為25℃,浸漬時間設為10分鐘。
以此浸漬處理載持Pd粒子後,從SEM照片
計算出基板表面及貫通孔內面的Pd粒子吸附密度(鍵結
數)。將此結果表示於第4圖中。從第4圖可確認藉由第1實施形態的Pd膠體溶液,至貫通孔內部可載持均勻密度之Pd粒子。
接著,對於載持Pd粒子後的基板,以無電
解鍍覆法形成Co-W-B膜。Co-W-B鍍覆係使用由0.17mol/L的硫酸鈷、0.049mol/L的二甲基胺基硼烷、0.005mol/L的鎢酸與0.63mol/L的檸檬酸(還原劑、錯化劑)所構成之無電解鍍覆液。無電解鍍覆處理係在形成45℃的上述無電解鍍覆液中浸漬基板15分鐘。
第5圖係無電解鍍覆處理後的基板貫通孔
之剖面照片。從第5圖可確認即使在Co-W-B鍍覆中也形成連續的金屬薄膜。
第3實施形態:此處,係製造粒徑及Pd(111)
面的面間距離相異的Pd粒子。在分離式燒瓶中放入純水2,000mL,再投入氯化鈀粉末5.87g(Pd含有量:32.89mmol)。
然後,一邊添加與第1實施形態相同的氯化鈉溶液,一邊攪拌。在此氯化鈀水溶液中,添加PVP水溶液(使PVP8.75g溶解於純水1,500mL中的水溶液),添加甲醇875mL。然後,與第1實施形態相同地,加熱、攪拌反應液而進行迴流,濃縮、超過濾、過濾,而回收Pd粒子。以此步驟所得到的Pd粒子,係平均粒徑4nm且Pd(111)面的面間距離為2.254Å。
比較例1:對於上述實施形態的比較例,係
依習知的方法製造Pd粒子。使用二硝基二胺硝酸鈀作為
Pd粒子的前驅體而製造Pd粒子。第1實施形態中,使二硝基二胺硝酸鈀76.67g(Pd含量:32.89mmol)溶解於純水2,000mL中。此時,二硝基二胺硝酸鈀係容易溶解於水中。
然後,以與第1實施形態相同的條件添加PVP水溶液、還原劑,加熱、迴流,回收Pd粒子。此時的Pd粒子係平均粒徑4nm且Pd(111)面的面間距離為2.251Å。
比較例2:與比較例1相同地,使用二硝基
二胺硝酸鈀作為Pd粒子的前驅體而製造Pd粒子。在比較例1中,添加氫化硼鈉4.98g作為還原劑。其後,以與第1實施形態相同地進行加熱、迴流,回收Pd粒子。此時的Pd粒子係平均粒徑15.0nm且Pd(111)面的面間距離為2.243Å。
使以上所製造的第3實施形態及比較例1、
2的Pd膠體粒子作為膠體溶液,進行基板的處理及以無電解鍍覆之Co-W-B膜的形成,並進行評估。所使用的基板係使用已形成孔徑2μm且深度6至100μm(寬高比3至50)的貫通孔之10種Si基板。又,於其等係與第1實施形態相同做法而形成SAM。又,基板處理中的膠體溶液之Pd濃度為0.1wt%。Co-W-B膜之無電解鍍覆的條件係與第2實施形態相同。
在此評估中,對於以Pd膠體溶液進行的處理後之基板,測定貫通孔底部的Pd粒子之吸附密度,同時並調查無電解鍍覆後可否形成貫通孔內部連續之金屬膜。將此結果表示於表1中。又,此評估試驗係也對於第2實
施形態的Pd膠體溶液進行。
從表1的結果可確認出,含有第1、3實施
形態的Pd粒子之膠體溶液係使Pd粒子吸附至高寬高比的貫通孔之底部。繼而,可確認出即使在形成金屬膜中也形成無缺陷的連續膜。另一方面,可知以比較例之習知的Pd
膠體溶液進行處理係可謂,貫通孔的寬高比低(3至5)的基板有效,但對於寬高比為40至50的基板則幾乎無作用。
又,對於第3實施形態係貫通孔的寬高比為30以上且粒子吸附密度為8,000個/μm2以下。第3實施形態係鍍覆處理用之目標載持密度係可達到,又,於此次試驗中在連續膜形成時未產生阻礙,故可謂能適用於幾乎所有的用途中。但,例如,使鍍覆膜的目標膜厚極薄時,恐形成部份的貫通孔。如此之情形下,預測可使Pd粒子的粒徑形成微細(例如3nm以下)來應付。
如以上的說明,若依本發明,可適當地分散觸媒活性高的Pd粒子,並可使其後的鍍覆層之密著性為良好者。本發明係當然可用於平面基板,亦可使用於形成寬高比高的TSV的基板用之鍍覆處理。又,藉由與SAM等有機層之形成組合而成為有效者。
Claims (12)
- 一種基板的處理方法,係為在基板上載持成為形成鍍覆層用之觸媒的金屬粒子,使前述基板、與含有前述金屬粒子的膠體溶液接觸的基板之處理方法,其特徵係:前述膠體溶液係包含粒徑0.6nm至4.0nm且(111)面的面間距離為2.254Å以上的Pd之金屬粒子。
- 如申請專利範圍第1項中所述之基板的處理方法,其中,包含如下步驟:在與膠體溶液接觸前的基板表面,形成由有機物所構成之有機層。
- 如申請專利範圍第2項中所述之基板的處理方法,其中,形成自我組織化單分子膜(SAM)作為有機層。
- 如申請專利範圍第1項所述之基板的處理方法,其中,形成自我組織化單分子膜的步驟係在基板上塗布矽烷偶合劑。
- 如申請專利範圍第2項所述之基板的處理方法,其中,形成自我組織化單分子膜的步驟係在基板上塗布矽烷偶合劑。
- 如申請專利範圍第2項所述之基板的處理方法,其中,形成由聚醯亞胺、聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯所構成之膜作為有機層。
- 如申請專利範圍第3項所述之基板的處理方法,其中,形成由聚醯亞胺、聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯所構成之膜作為有機層。
- 如申請專利範圍第4項所述之基板的處理方法,其中,形成由聚醯亞胺、聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯所構成之膜作為有機層。
- 如申請專利範圍第5項所述之基板的處理方法,其中,形成由聚醯亞胺、聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯所構成之膜作為有機層。
- 如申請專利範圍第1至9項中任一項所述之基板的處理方法,其中,使膠體溶液中的金屬粒子之濃度為9.3×10-6至3.8×10-1mol/L。
- 如申請專利範圍第1至9項的任一項中所述之基板的處理方法,其中,基板係已形成1個以上的貫通孔之基板,前述貫通孔的至少一個之寬高比為3至50。
- 如申請專利範圍第10項所述之基板的處理方法,其中,基板係已形成1個以上的貫通孔之基板,前述貫通孔的至少一個之寬高比為3至50。
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