TW201144835A - Transferring mechanism for probe card, method for transferring probe card, and probe device - Google Patents

Transferring mechanism for probe card, method for transferring probe card, and probe device

Info

Publication number
TW201144835A
TW201144835A TW100104495A TW100104495A TW201144835A TW 201144835 A TW201144835 A TW 201144835A TW 100104495 A TW100104495 A TW 100104495A TW 100104495 A TW100104495 A TW 100104495A TW 201144835 A TW201144835 A TW 201144835A
Authority
TW
Taiwan
Prior art keywords
probe card
transferring
probe
card
head
Prior art date
Application number
TW100104495A
Other languages
English (en)
Other versions
TWI506287B (zh
Inventor
Daisuke Inoue
Shuji Akiyama
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW201144835A publication Critical patent/TW201144835A/zh
Application granted granted Critical
Publication of TWI506287B publication Critical patent/TWI506287B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
TW100104495A 2010-02-12 2011-02-11 A probe card conveying mechanism, a probe card conveying method and a probe device TWI506287B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010028521A JP5517344B2 (ja) 2010-02-12 2010-02-12 プローブカードの搬送機構、プローブカードの搬送方法及びプローブ装置

Publications (2)

Publication Number Publication Date
TW201144835A true TW201144835A (en) 2011-12-16
TWI506287B TWI506287B (zh) 2015-11-01

Family

ID=44596307

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100104495A TWI506287B (zh) 2010-02-12 2011-02-11 A probe card conveying mechanism, a probe card conveying method and a probe device

Country Status (4)

Country Link
JP (1) JP5517344B2 (zh)
KR (1) KR101272449B1 (zh)
CN (1) CN102193059B (zh)
TW (1) TWI506287B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI576589B (zh) * 2012-03-26 2017-04-01 Tokyo Electron Ltd Probe device
TWI756428B (zh) * 2017-06-05 2022-03-01 日商東京威力科創股份有限公司 檢查裝置、檢查系統及位置對準方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102507996B (zh) * 2011-09-27 2014-02-26 沈玉良 探针卡升降机构
JP6054150B2 (ja) * 2012-11-22 2016-12-27 日本電子材料株式会社 プローブカードケース及びプローブカードの搬送方法
KR101503143B1 (ko) * 2013-01-31 2015-03-18 세메스 주식회사 프로브 카드의 반송 방법
JP6220596B2 (ja) * 2013-08-01 2017-10-25 東京エレクトロン株式会社 プローバ
JP6271257B2 (ja) * 2014-01-08 2018-01-31 東京エレクトロン株式会社 基板検査装置及びプローブカード搬送方法
KR102335827B1 (ko) 2014-12-24 2021-12-08 삼성전자주식회사 프로브 카드 로딩 장치, 그를 포함하는 프로브 카드 관리 시스템
JP6523838B2 (ja) * 2015-07-15 2019-06-05 東京エレクトロン株式会社 プローブカード搬送装置、プローブカード搬送方法及びプローブ装置
CN106873195B (zh) * 2015-12-11 2020-10-30 De&T株式会社 探针单元更换装置
JP7186647B2 (ja) * 2019-03-22 2022-12-09 東京エレクトロン株式会社 搬送装置
KR102480726B1 (ko) * 2020-12-31 2022-12-26 주식회사 쎄믹스 프로브 카드 체인저가 구비된 프로버 시스템

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161173A (ja) * 1987-12-16 1989-06-23 Tokyo Electron Ltd プローブ装置のプローブカード自動交換方法
JP2575074B2 (ja) * 1991-08-13 1997-01-22 東京エレクトロン株式会社 ウエハプローバ
JP2606554Y2 (ja) * 1992-01-17 2000-11-27 株式会社東京精密 プロービング装置
JPH10308424A (ja) * 1997-05-08 1998-11-17 Tokyo Electron Ltd プローブカードクランプ機構及びプローブ装置
JP4104099B2 (ja) * 1999-07-09 2008-06-18 東京エレクトロン株式会社 プローブカード搬送機構
JP4798595B2 (ja) * 2001-08-07 2011-10-19 東京エレクトロン株式会社 プローブカード搬送装置及びプローブカード搬送方法
JP4123408B2 (ja) * 2001-12-13 2008-07-23 東京エレクトロン株式会社 プローブカード交換装置
JP4875332B2 (ja) * 2005-09-21 2012-02-15 東京エレクトロン株式会社 プローブカード移載補助装置及び検査設備
CN101346635A (zh) * 2005-12-27 2009-01-14 株式会社爱德万测试 Tcp处理装置以及tcp处理装置中的连接端子的对位方法
US20080016676A1 (en) * 2006-07-18 2008-01-24 Jones Robert M Automatic winder for an inside brushless stator
KR100847577B1 (ko) * 2006-12-27 2008-07-21 세크론 주식회사 프로빙 검사장치
JP5049419B2 (ja) * 2007-07-25 2012-10-17 東京エレクトロン株式会社 プローブカード用台車及びこの台車を用いるプローブカードの取り扱い方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI576589B (zh) * 2012-03-26 2017-04-01 Tokyo Electron Ltd Probe device
TWI756428B (zh) * 2017-06-05 2022-03-01 日商東京威力科創股份有限公司 檢查裝置、檢查系統及位置對準方法

Also Published As

Publication number Publication date
JP5517344B2 (ja) 2014-06-11
KR20110093712A (ko) 2011-08-18
TWI506287B (zh) 2015-11-01
CN102193059A (zh) 2011-09-21
CN102193059B (zh) 2015-03-25
JP2011165995A (ja) 2011-08-25
KR101272449B1 (ko) 2013-06-07

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