TW201143984A - Organic particulate loaded polishing pads and method of making and using the same - Google Patents
Organic particulate loaded polishing pads and method of making and using the same Download PDFInfo
- Publication number
- TW201143984A TW201143984A TW099146709A TW99146709A TW201143984A TW 201143984 A TW201143984 A TW 201143984A TW 099146709 A TW099146709 A TW 099146709A TW 99146709 A TW99146709 A TW 99146709A TW 201143984 A TW201143984 A TW 201143984A
- Authority
- TW
- Taiwan
- Prior art keywords
- polishing
- elements
- polishing pad
- pad
- layer
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/02—Backings, e.g. foils, webs, mesh fabrics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
- B24D7/06—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor with inserted abrasive blocks, e.g. segmental
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29118209P | 2009-12-30 | 2009-12-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201143984A true TW201143984A (en) | 2011-12-16 |
Family
ID=44227136
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW099146709A TW201143984A (en) | 2009-12-30 | 2010-12-29 | Organic particulate loaded polishing pads and method of making and using the same |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20130102231A1 (https=) |
| JP (1) | JP5671554B2 (https=) |
| KR (1) | KR20120112662A (https=) |
| CN (1) | CN102686361A (https=) |
| SG (1) | SG181889A1 (https=) |
| TW (1) | TW201143984A (https=) |
| WO (1) | WO2011082156A2 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI743156B (zh) * | 2016-08-04 | 2021-10-21 | 美商羅門哈斯電子材料Cmp控股公司 | 低缺陷多孔拋光墊 |
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| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
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| KR20240015167A (ko) | 2014-10-17 | 2024-02-02 | 어플라이드 머티어리얼스, 인코포레이티드 | 애디티브 제조 프로세스들을 이용한 복합 재료 특성들을 갖는 cmp 패드 구성 |
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| KR101600393B1 (ko) * | 2015-05-20 | 2016-03-07 | 에프엔에스테크 주식회사 | 연마 패드 및 이의 제조 방법 |
| TWI754275B (zh) * | 2015-10-16 | 2022-02-01 | 美商應用材料股份有限公司 | 拋光墊及形成其之方法 |
| JP6940495B2 (ja) | 2015-10-30 | 2021-09-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 所望のゼータ電位を有する研磨用物品を形成するための装置及び方法 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| CN106272034A (zh) * | 2016-08-10 | 2017-01-04 | 盐城工学院 | 一种用于加工软脆性晶体材料的研磨垫及其制备方法 |
| JP6888476B2 (ja) * | 2016-08-23 | 2021-06-16 | 信越化学工業株式会社 | 基板の製造方法 |
| KR20200014364A (ko) * | 2017-06-01 | 2020-02-10 | 도쿄엘렉트론가부시키가이샤 | 게터링층 형성 장치, 게터링층 형성 방법 및 컴퓨터 기억 매체 |
| CN107344336B (zh) * | 2017-07-24 | 2023-04-11 | 东莞金太阳研磨股份有限公司 | 一种复合基材抛光磨具及其制备方法 |
| CN107433525B (zh) * | 2017-07-24 | 2023-05-02 | 东莞金太阳研磨股份有限公司 | 用于抛光磨具的双层高分子复合基材及其制备方法 |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| WO2020050932A1 (en) | 2018-09-04 | 2020-03-12 | Applied Materials, Inc. | Formulations for advanced polishing pads |
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| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
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| US11689912B2 (en) | 2021-05-12 | 2023-06-27 | Oracle International Corporation | Methods, systems, and computer readable media for conducting a velocity check for outbound subscribers roaming to neighboring countries |
| KR20240061651A (ko) * | 2021-09-29 | 2024-05-08 | 엔테그리스, 아이엔씨. | 양면 패드 컨디셔너 |
| CN113977453B (zh) * | 2021-11-08 | 2023-01-13 | 万华化学集团电子材料有限公司 | 提高抛光平坦度的化学机械抛光垫及其应用 |
| KR102679468B1 (ko) * | 2021-12-17 | 2024-06-28 | 케이피엑스케미칼 주식회사 | 균일하게 분포된 액상 포어를 포함하는 연마 패드 및 이의 제조방법 |
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| US5578098A (en) * | 1990-10-09 | 1996-11-26 | Minnesota Mining And Manufacturing Company | Coated abrasive containing erodible agglomerates |
| US6099954A (en) * | 1995-04-24 | 2000-08-08 | Rodel Holdings, Inc. | Polishing material and method of polishing a surface |
| US6126532A (en) * | 1997-04-18 | 2000-10-03 | Cabot Corporation | Polishing pads for a semiconductor substrate |
| US6121143A (en) * | 1997-09-19 | 2000-09-19 | 3M Innovative Properties Company | Abrasive articles comprising a fluorochemical agent for wafer surface modification |
| US6117000A (en) * | 1998-07-10 | 2000-09-12 | Cabot Corporation | Polishing pad for a semiconductor substrate |
| JP2000301450A (ja) * | 1999-04-19 | 2000-10-31 | Rohm Co Ltd | Cmp研磨パッドおよびそれを用いたcmp処理装置 |
| JP3615134B2 (ja) * | 2000-08-24 | 2005-01-26 | 三共理化学株式会社 | 研磨材 |
| US6645624B2 (en) * | 2000-11-10 | 2003-11-11 | 3M Innovative Properties Company | Composite abrasive particles and method of manufacture |
| US6632129B2 (en) * | 2001-02-15 | 2003-10-14 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
| JP3762943B2 (ja) * | 2001-04-17 | 2006-04-05 | 株式会社ユニバーサルエアー | サスペンション |
| JP2003136397A (ja) * | 2001-11-01 | 2003-05-14 | Roki Techno Co Ltd | 研磨パッド |
| US7160173B2 (en) * | 2002-04-03 | 2007-01-09 | 3M Innovative Properties Company | Abrasive articles and methods for the manufacture and use of same |
| KR100465649B1 (ko) * | 2002-09-17 | 2005-01-13 | 한국포리올 주식회사 | 일체형 연마 패드 및 그 제조 방법 |
| US20060258276A1 (en) * | 2005-05-16 | 2006-11-16 | Chien-Min Sung | Superhard cutters and associated methods |
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| WO2006057714A2 (en) * | 2004-11-29 | 2006-06-01 | Rajeev Bajaj | Method and apparatus for improved chemical mechanical planarization pad with uniform polish performance |
| US7846008B2 (en) * | 2004-11-29 | 2010-12-07 | Semiquest Inc. | Method and apparatus for improved chemical mechanical planarization and CMP pad |
| CN101137463A (zh) * | 2005-05-16 | 2008-03-05 | 宋健民 | 超硬切割装置及其制造方法 |
| US20070128991A1 (en) * | 2005-12-07 | 2007-06-07 | Yoon Il-Young | Fixed abrasive polishing pad, method of preparing the same, and chemical mechanical polishing apparatus including the same |
| JP2008290197A (ja) * | 2007-05-25 | 2008-12-04 | Nihon Micro Coating Co Ltd | 研磨パッド及び方法 |
| KR20100082770A (ko) * | 2007-09-03 | 2010-07-19 | 세미퀘스트, 인코포레이티드 | 폴리싱 패드 |
| CN102089122A (zh) * | 2008-05-15 | 2011-06-08 | 3M创新有限公司 | 具有终点窗口的抛光垫以及使用其的系统和方法 |
| JP5596030B2 (ja) * | 2008-06-26 | 2014-09-24 | スリーエム イノベイティブ プロパティズ カンパニー | 多孔質エレメントを有する研磨パッド及びその製造方法と使用方法 |
-
2010
- 2010-12-28 US US13/517,367 patent/US20130102231A1/en not_active Abandoned
- 2010-12-28 JP JP2012547232A patent/JP5671554B2/ja not_active Expired - Fee Related
- 2010-12-28 KR KR1020127019846A patent/KR20120112662A/ko not_active Ceased
- 2010-12-28 WO PCT/US2010/062205 patent/WO2011082156A2/en not_active Ceased
- 2010-12-28 CN CN201080060309XA patent/CN102686361A/zh active Pending
- 2010-12-28 SG SG2012046538A patent/SG181889A1/en unknown
- 2010-12-29 TW TW099146709A patent/TW201143984A/zh unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI743156B (zh) * | 2016-08-04 | 2021-10-21 | 美商羅門哈斯電子材料Cmp控股公司 | 低缺陷多孔拋光墊 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102686361A (zh) | 2012-09-19 |
| WO2011082156A2 (en) | 2011-07-07 |
| SG181889A1 (en) | 2012-07-30 |
| US20130102231A1 (en) | 2013-04-25 |
| JP2013516328A (ja) | 2013-05-13 |
| KR20120112662A (ko) | 2012-10-11 |
| WO2011082156A3 (en) | 2011-11-17 |
| JP5671554B2 (ja) | 2015-02-18 |
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